CN105811960A - Level shifting circuit using thin gate oxide MOS tubes - Google Patents

Level shifting circuit using thin gate oxide MOS tubes Download PDF

Info

Publication number
CN105811960A
CN105811960A CN201610120864.6A CN201610120864A CN105811960A CN 105811960 A CN105811960 A CN 105811960A CN 201610120864 A CN201610120864 A CN 201610120864A CN 105811960 A CN105811960 A CN 105811960A
Authority
CN
China
Prior art keywords
gate oxide
capacitor
power
transistor
thin gate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN201610120864.6A
Other languages
Chinese (zh)
Other versions
CN105811960B (en
Inventor
方健
刘力荣
任少东
李晨辰
酒耐霞
辛世杰
姚易寒
张波
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
University of Electronic Science and Technology of China
Original Assignee
University of Electronic Science and Technology of China
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by University of Electronic Science and Technology of China filed Critical University of Electronic Science and Technology of China
Priority to CN201610120864.6A priority Critical patent/CN105811960B/en
Publication of CN105811960A publication Critical patent/CN105811960A/en
Application granted granted Critical
Publication of CN105811960B publication Critical patent/CN105811960B/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K19/00Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
    • H03K19/0175Coupling arrangements; Interface arrangements
    • H03K19/0185Coupling arrangements; Interface arrangements using field effect transistors only
    • H03K19/018507Interface arrangements

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • Computing Systems (AREA)
  • General Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)

Abstract

The invention relates to the technology of electric circuits, more particularly to a level shifting circuit using thin gate oxide MOS tubes. The circuit provided in the invention distinguishes itself from others in that thin gate oxide MOS tubes are used to constitute its driving stage rather than thick gate oxide MOS tubes seen in traditional high-voltage level shifting circuits. The adoption of thin gate oxide MOS tubes reduces the power consumption of the level shifting circuit while increasing the work frequency of a high voltage supply converter. Compared to available level shifting circuits, the level shifting circuit provided by the invention uses capacitance as its load, and utilizes the second capacitance and the third capacitance to protect the gates of the first PMOS tube and the first power PMOS tube so that the voltage at the gates remains to be within 5V and that thin gate oxide MOS tubes can be compatible with the circuit. In this manner, the performances of the circuit improve.

Description

一种用于薄栅氧MOS管的电平位移电路A Level Shift Circuit for Thin Gate Oxide MOS Transistor

技术领域technical field

本发明涉及电子电路技术,特别涉及一种用于薄栅氧MOS管的电平位移电路。The invention relates to electronic circuit technology, in particular to a level shift circuit for thin gate oxide MOS transistors.

背景技术Background technique

电平位移电路是HVIC(高压集成电路)的典型电路之一,由于其高可靠性,面积小,能效高等特点被广泛应用于智能车载电子、可再生能源系统、高亮度LED灯系统等方面。为了提升其功率密度,电平位移电路不得不工作在高开关频率以减少无源器件部分的大小;为了提升其功率效率,就需要实现零电压开关来减少电平位移电路的开关损耗。相比厚栅氧高压功率MOS管而言,薄栅氧高压功率MOS管具有低导通电阻,低亚阈值电压。因此,薄栅氧高压功率MOS管能够减小电平位移电路的功率损耗,提高高压电源转换器的工作频率。Level shifting circuit is one of the typical circuits of HVIC (High Voltage Integrated Circuit). Due to its high reliability, small area, and high energy efficiency, it is widely used in smart vehicle electronics, renewable energy systems, and high-brightness LED lighting systems. In order to improve its power density, the level shift circuit has to work at a high switching frequency to reduce the size of the passive device part; in order to improve its power efficiency, it is necessary to realize zero voltage switching to reduce the switching loss of the level shift circuit. Compared with thick gate oxide high voltage power MOS transistors, thin gate oxide high voltage power MOS transistors have low on-resistance and low sub-threshold voltage. Therefore, the thin gate oxide high voltage power MOS transistor can reduce the power loss of the level shift circuit and increase the operating frequency of the high voltage power converter.

尽管薄栅氧高压功率MOS的源漏极能够耐高压,但是薄栅氧结果却导致其能够承受的栅源电压很小,一般在5V左右。而目前的电平位移电路都需要高压功率MOS管承受很高的栅源电压值,使得薄栅氧高压功率MOS的应用受到阻碍。Although the source and drain of the thin gate oxide high-voltage power MOS can withstand high voltage, the result of the thin gate oxide is that the gate-source voltage it can withstand is very small, generally around 5V. However, the current level-shifting circuits require high-voltage power MOS transistors to withstand high gate-source voltage values, which hinders the application of thin gate oxide high-voltage power MOS.

一种比较经典的高压电平位移电路如图1所示,包括一个接输入信号的施密特触发器、构成电平位移功能的4个MOS管及一个反相器、以及提供分压的BJT管、电容、电阻、齐纳二极管,此电路结构简单,可以良好的实现电平位移功能,但功率PMOS管需要承受较高的栅极电压,无法将薄栅氧功率MOS管应用到此电路中去,从而无法进一步改善电路性能。A relatively classic high-voltage level shift circuit is shown in Figure 1, including a Schmitt trigger connected to the input signal, 4 MOS transistors and an inverter forming the level shift function, and a voltage divider BJT tube, capacitor, resistor, and Zener diode. This circuit has a simple structure and can well realize the level shift function. However, the power PMOS tube needs to withstand a high gate voltage, and it is impossible to apply the thin gate oxide power MOS tube to this circuit. In this way, the circuit performance cannot be further improved.

发明内容Contents of the invention

本发明针对上述问题,提出一种用于薄栅氧MOS管的电平位移电路。Aiming at the above problems, the present invention proposes a level shift circuit for a thin gate oxide MOS transistor.

本发明的技术方案:一种用于薄栅氧MOS管的电平位移电路,包括第一电容C1、第二电容C2、第三电容C3、第一齐纳二极管D1、第二齐纳二极管D2、第一电阻R1、第二电阻R2、NPN三极管NPN1、PMOS管MP1、功率PMOS管PMP1、NMOS管MN1、反相器和施密特触发器;所述施密特触发器的输入端为电平位移电路的输入端;NPN三极管NPN1的集电极接电源,起基极通过第一电阻R1后接电源,其发射极通过第一电容C1后接地;NPN三极管NPN1的基极与第一电阻R1的连接点接第一齐纳二极管D1的阴极,第一齐纳二极管D1的阳极接地;NPN三极管NPN1的发射极与第一电容C1的连接点接施密特触发器的电源输入端;施密特触发器的负输入端接地,其输出端接NMOS管MN1的栅极;PMOS管MP1的源极接电源,其栅极通过第二电阻R2后接电源;PMOS管MP1栅极与第二电阻R2的连接点通过第二电容C2后接施密特触发器的输出端;PMOS管MP1的漏极接第二齐纳二极管D2的正极;功率PMOS管PMP1的源极接电源,其栅极接PMOS管MP1漏极与第二齐纳二极管D2正极的连接点;功率PMOS管PMP1栅极、PMOS管MP1漏极与第二齐纳二极管D2正极的连接点通过第三电容C3后接NMOS管MN1的漏极;NMOS管MN1的源极接地;反相器的输入端接施密特触发器的输出端,反相器的输出端接功率NMOS管PMN1的栅极;功率NMOS管PMN1的源极接地,其漏极接功率PMOS管PMP1的漏极;NMOS管PMN1源极与功率PMOS管PMP1漏极的连接点为电平位移电路的输出端。Technical solution of the present invention: a level shift circuit for thin gate oxide MOS transistors, including a first capacitor C1, a second capacitor C2, a third capacitor C3, a first Zener diode D1, and a second Zener diode D2 , a first resistor R1, a second resistor R2, an NPN transistor NPN1, a PMOS transistor MP1, a power PMOS transistor PMP1, an NMOS transistor MN1, an inverter and a Schmitt trigger; the input end of the Schmitt trigger is an electric The input end of the level displacement circuit; the collector of the NPN transistor NPN1 is connected to the power supply, the base is connected to the power supply after passing through the first resistor R1, and its emitter is grounded after passing through the first capacitor C1; the base of the NPN transistor NPN1 is connected to the first resistor R1 The connection point of the first Zener diode D1 is connected to the cathode of the first Zener diode D1, and the anode of the first Zener diode D1 is grounded; the connection point between the emitter of the NPN transistor NPN1 and the first capacitor C1 is connected to the power supply input end of the Schmitt trigger; The negative input terminal of the special trigger is grounded, and its output terminal is connected to the gate of NMOS transistor MN1; the source of PMOS transistor MP1 is connected to the power supply, and its gate is connected to the power supply after passing through the second resistor R2; the gate of PMOS transistor MP1 is connected to the second resistor The connection point of R2 is connected to the output terminal of the Schmitt trigger after passing through the second capacitor C2; the drain of the PMOS transistor MP1 is connected to the anode of the second Zener diode D2; the source of the power PMOS transistor PMP1 is connected to the power supply, and its gate is connected to The connection point between the drain of the PMOS transistor MP1 and the anode of the second zener diode D2; the connection point between the gate of the power PMOS transistor PMP1, the drain of the PMOS transistor MP1 and the anode of the second zener diode D2 is connected to the NMOS transistor MN1 after passing through the third capacitor C3 The drain of the NMOS transistor MN1 is grounded; the input terminal of the inverter is connected to the output terminal of the Schmitt trigger, and the output terminal of the inverter is connected to the gate of the power NMOS transistor PMN1; the source of the power NMOS transistor PMN1 It is grounded, and its drain is connected to the drain of the power PMOS transistor PMP1; the connection point between the source of the NMOS transistor PMN1 and the drain of the power PMOS transistor PMP1 is the output end of the level shift circuit.

本发明的有益效果为,相比原有的电平位移电路结构,本发明的电平位移电路使用电容做负载,利用第二电容、第三电容来保护第一PMOS管、第一功率PMOS管的栅极,使得栅极电压浮动范围在5V以内,能够将薄栅氧MOS管应用到此电路中,从而改善了电路性能。The beneficial effect of the present invention is that, compared with the original level shift circuit structure, the level shift circuit of the present invention uses a capacitor as a load, and uses the second capacitor and the third capacitor to protect the first PMOS transistor and the first power PMOS transistor The gate makes the floating range of the gate voltage within 5V, and the thin gate oxide MOS tube can be applied to this circuit, thereby improving the circuit performance.

附图说明Description of drawings

图1为现有的一种经典电平位移电路图;Fig. 1 is an existing classic level shift circuit diagram;

图2为实施例的原理框图;Fig. 2 is the functional block diagram of embodiment;

图3为实施例的电路结构示意图;Fig. 3 is the schematic diagram of the circuit structure of embodiment;

图4为实施例的仿真结果逻辑示意图;Fig. 4 is the logic schematic diagram of the simulation result of embodiment;

图5为实施例的仿真结果示意图。Fig. 5 is a schematic diagram of the simulation results of the embodiment.

具体实施方式detailed description

下面结合附图和实施例对本发明进行详细的描述Below in conjunction with accompanying drawing and embodiment the present invention is described in detail

实施例Example

如图3所示,本实施例的适用于薄栅氧MOS管的电平位移电路,包括两个电阻,两个齐纳二极管,一个施密特触发器,三个电容,一个反相器,一个NMOS管,一个PMOS管,一个薄栅氧功率NMOS管,一个薄栅氧功率PMOS管,第一齐纳二极管的耐压值为5.7V,第一齐纳二极管D1为第一NPN管NPN1提供正向偏压,使得第一NPN管NPN1处于开启状态,第一电阻R1提供第一NPN管NPN1基极与集电极之间的偏压,第一电容C1用于提供5V的分压值给施密特触发器做供电电压,施密特触发器用于对输入信号的整形,输入信号为3.3V或5V的TTL信号或CMOS电平信号,施密特触发器输出端接第二电容C2的阴极,第二电容C2的阳极接第二电阻R2的阴极,第二电容C2的阳极接第一PMOS管MP1的栅极,第二电阻的阳极接供电电源VCC,第一PMOS管MP1的源极接供电电源VCC,第一PMOS管MP1的漏极接第二齐纳二极管D2的阳极,第一PMOS管MP1的漏极接第三电容C3的阳极,第一PMOS管MP1的漏级接第一薄栅氧PMOS管PMP1的栅极,第二齐纳二极管D2的阴极接供电电源VCC,第一薄栅氧PMOS管PMP1的源极接供电电源VCC,施密特触发器的输出级接第一NMOS管MN1的栅极,施密特触发器的输出级接第一反相器INV1的输入级,第一NMOS管MN1的漏极接第三电容C3的阴极,第一NMOS管MN1的源极接地,第一反相器INV1的输出级接第一薄栅氧NMOS管PMN1的栅极,第一薄栅氧NMOS管PMN1的源极接地,第一薄栅氧NMOS管PMN1的漏极接第一薄栅氧PMOS管PMP1的漏极,第一薄栅氧PMOS管PMP1的漏极与第一薄栅氧NMOS管PMN1的漏极为输出端。As shown in Figure 3, the level shift circuit suitable for thin gate oxide MOS transistors in this embodiment includes two resistors, two Zener diodes, a Schmitt trigger, three capacitors, and an inverter, One NMOS transistor, one PMOS transistor, one thin gate oxide power NMOS transistor, one thin gate oxide power PMOS transistor, the withstand voltage value of the first Zener diode is 5.7V, and the first Zener diode D1 provides the first NPN transistor NPN1 Forward bias, so that the first NPN transistor NPN1 is in the open state, the first resistor R1 provides the bias voltage between the base and the collector of the first NPN transistor NPN1, and the first capacitor C1 is used to provide a divided voltage value of 5V for the application The Mitte trigger is used as the power supply voltage, and the Schmitt trigger is used to shape the input signal. The input signal is a 3.3V or 5V TTL signal or a CMOS level signal, and the output terminal of the Schmitt trigger is connected to the cathode of the second capacitor C2 The anode of the second capacitor C2 is connected to the cathode of the second resistor R2, the anode of the second capacitor C2 is connected to the gate of the first PMOS transistor MP1, the anode of the second resistor is connected to the power supply VCC, and the source of the first PMOS transistor MP1 is connected to The power supply VCC, the drain of the first PMOS transistor MP1 is connected to the anode of the second Zener diode D2, the drain of the first PMOS transistor MP1 is connected to the anode of the third capacitor C3, and the drain of the first PMOS transistor MP1 is connected to the first thin The gate of the gate oxide PMOS transistor PMP1, the cathode of the second Zener diode D2 is connected to the power supply VCC, the source of the first thin gate oxide PMOS transistor PMP1 is connected to the power supply VCC, and the output stage of the Schmitt trigger is connected to the first NMOS The gate of the transistor MN1, the output stage of the Schmitt trigger is connected to the input stage of the first inverter INV1, the drain of the first NMOS transistor MN1 is connected to the cathode of the third capacitor C3, and the source of the first NMOS transistor MN1 is grounded , the output stage of the first inverter INV1 is connected to the gate of the first thin gate oxide NMOS transistor PMN1, the source of the first thin gate oxide NMOS transistor PMN1 is grounded, and the drain of the first thin gate oxide NMOS transistor PMN1 is connected to the first The drain of the thin gate oxide PMOS transistor PMP1, the drain of the first thin gate oxide PMOS transistor PMP1 and the drain of the first thin gate oxide NMOS transistor PMN1 are the output terminals.

以本实施例为例说明本发明整体电路的工作原理:Taking this embodiment as an example to illustrate the working principle of the overall circuit of the present invention:

本实施例中,电路的供电电源VCC为15V,施密特触发器的供电电源为5V,齐纳二极管耐压5.7V,第一电容C1为1pF,第二电容C2为1pF,第三电容C3为3pF,本电路的输出级采用了薄栅氧MOS管,电平位移电路的功能是将高端电路低压部分的输出传送到高压部分,本电路中,负载电容对薄栅氧MOS管的控制部分是驱动电路的关键部分。In this embodiment, the power supply VCC of the circuit is 15V, the power supply of the Schmitt trigger is 5V, the withstand voltage of the Zener diode is 5.7V, the first capacitor C1 is 1pF, the second capacitor C2 is 1pF, and the third capacitor C3 The output stage of this circuit uses a thin gate oxide MOS tube. The function of the level shift circuit is to transmit the output of the low voltage part of the high-end circuit to the high voltage part. In this circuit, the load capacitor controls the control part of the thin gate oxide MOS tube. It is a key part of the drive circuit.

当输出信号为高电平时,施密特触发器的输出信号为高电平,此时第一PMOS管MP1的栅极为高电平,第一PMOS管MP1关闭,不会对第三电容C3进行充放电,第一NMOS管MN1的栅极为高电平,第一NMOS管MN1导通,第三电容C3阴极接地电平,第三电容C3两端电压不变,第三电容C3阳极电平被拉低5V,第三电容C3阳极电平与供电电源VCC的差值为5V,第一薄栅氧PMOS管PMP1导通,第一反相器INV1的输入级接高电平,输出为低电平,第一薄栅氧PMOS管PMN1的栅极为低电平,第一薄栅氧MOS管PMN1关断,输出信号OUT为低电平;当输入信号由高变低时,施密特触发器输出低电平,第二电容C2阴极电平为0V,第二电容C2阳极电平被拉低,第一PMOS管MP1导通并对第三电容C3进行充电,第一NMOS管MN1的栅极为低电平,第一NMOS管MN1关断,第三电容阳极电平跳高并等于供电电源电压VCC,第一薄栅氧PMOS管PMP1关断,第一反相器INV1输入级为低电平,输出端为高电平,第一薄栅氧NMOS管PMN1的栅极为高电平,第一薄栅氧NMOS管PMN1导通,输出信号OUT为低电平,从而成功完成了电平信号由低到高的转换。When the output signal is at a high level, the output signal of the Schmitt trigger is at a high level, at this time the gate of the first PMOS transistor MP1 is at a high level, the first PMOS transistor MP1 is turned off, and the third capacitor C3 will not be Charging and discharging, the gate of the first NMOS transistor MN1 is at a high level, the first NMOS transistor MN1 is turned on, the cathode of the third capacitor C3 is grounded, the voltage at both ends of the third capacitor C3 remains unchanged, and the level of the anode of the third capacitor C3 is Pull down 5V, the difference between the anode level of the third capacitor C3 and the power supply VCC is 5V, the first thin gate oxide PMOS transistor PMP1 is turned on, the input stage of the first inverter INV1 is connected to a high level, and the output is a low level flat, the gate of the first thin-gate oxide PMOS transistor PMN1 is at low level, the first thin-gate oxide MOS transistor PMN1 is turned off, and the output signal OUT is at low level; when the input signal changes from high to low, the Schmitt trigger Output low level, the cathode level of the second capacitor C2 is 0V, the anode level of the second capacitor C2 is pulled down, the first PMOS transistor MP1 is turned on and charges the third capacitor C3, the gate of the first NMOS transistor MN1 is Low level, the first NMOS transistor MN1 is turned off, the level of the anode of the third capacitor jumps high and is equal to the power supply voltage VCC, the first thin gate oxide PMOS transistor PMP1 is turned off, and the input stage of the first inverter INV1 is low level, The output terminal is at a high level, the gate of the first thin gate oxide NMOS transistor PMN1 is at a high level, the first thin gate oxide NMOS transistor PMN1 is turned on, and the output signal OUT is at a low level, thereby successfully completing the transition of the level signal from low to to high conversion.

图4给出了该实施方式的仿真结果逻辑图,第三电容C3阳极的电位随输入信号的跳变而跳变,第一薄栅氧PMOS管栅极的浮动电平为10V-15V,浮动电平处于安全耐压值以内。Figure 4 shows the logic diagram of the simulation results of this embodiment. The potential of the anode of the third capacitor C3 jumps with the jump of the input signal, and the floating level of the gate of the first thin gate oxide PMOS transistor is 10V-15V. The level is within the safe withstand voltage value.

本实施例的仿真条件为:供电电源VCC=15V;第一齐纳二极管D1耐压5.7V;施密特触发器供电电压为5V;电路输入信号范围:0V~5V(3.3V),输出信号范围:0V-15V。仿真结果如图5所示,达到了高低电平位移的目的。The simulation conditions of the present embodiment are: power supply VCC=15V; the withstand voltage of the first zener diode D1 is 5.7V; the supply voltage of the Schmitt trigger is 5V; the circuit input signal range: 0V~5V (3.3V), the output signal Range: 0V-15V. The simulation result is shown in Fig. 5, and the purpose of high and low level displacement is achieved.

综上所述,本发明所述的一种适用于薄栅氧MOS管的电平位移电路可以作为半导体集成电路功率电子芯片或者驱动芯片中的基本电路,可以实现对HVIC能效的提高。In summary, a level shift circuit suitable for thin gate oxide MOS transistors according to the present invention can be used as a basic circuit in a semiconductor integrated circuit power electronic chip or a driver chip, and can improve the energy efficiency of HVIC.

Claims (1)

1.一种用于薄栅氧MOS管的电平位移电路,包括第一电容(C1)、第二电容(C2)、第三电容(C3)、第一齐纳二极管(D1)、第二齐纳二极管(D2)、第一电阻(R1)、第二电阻(R2)、NPN三极管(NPN1)、PMOS管(MP1)、功率PMOS管(PMP1)、NMOS管(MN1)、反相器和施密特触发器;所述施密特触发器的输入端为电平位移电路的输入端;NPN三极管(NPN1)的集电极接电源,起基极通过第一电阻(R1)后接电源,其发射极通过第一电容(C1)后接地;NPN三极管(NPN1)的基极与第一电阻(R1)的连接点接第一齐纳二极管(D1)的阴极,第一齐纳二极管(D1)的阳极接地;NPN三极管(NPN1)的发射极与第一电容(C1)的连接点接施密特触发器的电源输入端;施密特触发器的负输入端接地,其输出端接NMOS管(MN1)的栅极;PMOS管(MP1)的源极接电源,其栅极通过第二电阻(R2)后接电源;PMOS管(MP1)栅极与第二电阻(R2)的连接点通过第二电容(C2)后接施密特触发器的输出端;PMOS管(MP1)的漏极接第二齐纳二极管(D2)的正极;功率PMOS管(PMP1)的源极接电源,其栅极接PMOS管(MP1)漏极与第二齐纳二极管(D2)正极的连接点;功率PMOS管(PMP1)栅极、PMOS管(MP1)漏极与第二齐纳二极管(D2)正极的连接点通过第三电容(C3)后接NMOS管(MN1)的漏极;NMOS管(MN1)的源极接地;反相器的输入端接施密特触发器的输出端,反相器的输出端接功率NMOS管(PMN1)的栅极;功率NMOS管(PMN1)的源极接地,其漏极接功率PMOS管(PMP1)的漏极;NMOS管(PMN1)源极与功率PMOS管(PMP1)漏极的连接点为电平位移电路的输出端。1. A level shift circuit for thin gate oxide MOS transistors, comprising a first capacitor (C1), a second capacitor (C2), a third capacitor (C3), a first zener diode (D1), a second Zener diode (D2), first resistor (R1), second resistor (R2), NPN transistor (NPN1), PMOS transistor (MP1), power PMOS transistor (PMP1), NMOS transistor (MN1), inverter and Schmitt trigger; the input of the Schmitt trigger is the input of the level shift circuit; the collector of the NPN triode (NPN1) is connected to the power supply, and the base is connected to the power supply after passing through the first resistor (R1). Its emitter is grounded after passing through the first capacitor (C1); the connection point between the base of the NPN transistor (NPN1) and the first resistor (R1) is connected to the cathode of the first Zener diode (D1), and the first Zener diode (D1) ) of the anode is grounded; the connection point between the emitter of the NPN transistor (NPN1) and the first capacitor (C1) is connected to the power input terminal of the Schmitt trigger; the negative input terminal of the Schmitt trigger is grounded, and its output terminal is connected to the NMOS The gate of the tube (MN1); the source of the PMOS tube (MP1) is connected to the power supply, and its gate is connected to the power supply after passing through the second resistor (R2); the connection point between the gate of the PMOS tube (MP1) and the second resistor (R2) After the second capacitor (C2) is connected to the output end of the Schmitt trigger; the drain of the PMOS transistor (MP1) is connected to the anode of the second Zener diode (D2); the source of the power PMOS transistor (PMP1) is connected to the power supply, Its gate is connected to the connection point between the drain of the PMOS transistor (MP1) and the anode of the second Zener diode (D2); the gate of the power PMOS transistor (PMP1), the drain of the PMOS transistor (MP1) and the second Zener diode (D2) The positive connection point is connected to the drain of the NMOS transistor (MN1) through the third capacitor (C3); the source of the NMOS transistor (MN1) is grounded; the input terminal of the inverter is connected to the output terminal of the Schmitt trigger, inverting The output terminal of the device is connected to the gate of the power NMOS transistor (PMN1); the source of the power NMOS transistor (PMN1) is grounded, and its drain is connected to the drain of the power PMOS transistor (PMP1); the source of the NMOS transistor (PMN1) is connected to the power PMOS The connection point of the drain of the tube (PMP1) is the output end of the level shift circuit.
CN201610120864.6A 2016-03-03 2016-03-03 A kind of level displacement circuit using thin grid oxygen metal-oxide-semiconductor Expired - Fee Related CN105811960B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201610120864.6A CN105811960B (en) 2016-03-03 2016-03-03 A kind of level displacement circuit using thin grid oxygen metal-oxide-semiconductor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201610120864.6A CN105811960B (en) 2016-03-03 2016-03-03 A kind of level displacement circuit using thin grid oxygen metal-oxide-semiconductor

Publications (2)

Publication Number Publication Date
CN105811960A true CN105811960A (en) 2016-07-27
CN105811960B CN105811960B (en) 2018-01-09

Family

ID=56466581

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201610120864.6A Expired - Fee Related CN105811960B (en) 2016-03-03 2016-03-03 A kind of level displacement circuit using thin grid oxygen metal-oxide-semiconductor

Country Status (1)

Country Link
CN (1) CN105811960B (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106341119A (en) * 2016-09-06 2017-01-18 珠海全志科技股份有限公司 Level shifting circuit
CN110535459A (en) * 2019-09-30 2019-12-03 安凯(广州)微电子技术有限公司 A kind of digital level conversion circuit based on low voltage CMOS process
CN113014077A (en) * 2021-03-30 2021-06-22 国硅集成电路技术(无锡)有限公司 High-voltage PN bridge gate driving circuit
CN113541676A (en) * 2021-08-10 2021-10-22 宜矽源半导体南京有限公司 A low power consumption high voltage level shift circuit
CN114448215A (en) * 2022-01-25 2022-05-06 深圳市诚芯微科技股份有限公司 Power tube driving circuit

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63105522A (en) * 1986-10-22 1988-05-10 Nec Corp High voltage digital signal output circuit
CN102769454A (en) * 2012-06-30 2012-11-07 东南大学 A high-side gate drive circuit that can resist noise interference
CN102843123A (en) * 2012-08-31 2012-12-26 电子科技大学 High-voltage driving circuit

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63105522A (en) * 1986-10-22 1988-05-10 Nec Corp High voltage digital signal output circuit
CN102769454A (en) * 2012-06-30 2012-11-07 东南大学 A high-side gate drive circuit that can resist noise interference
CN102843123A (en) * 2012-08-31 2012-12-26 电子科技大学 High-voltage driving circuit

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106341119A (en) * 2016-09-06 2017-01-18 珠海全志科技股份有限公司 Level shifting circuit
CN106341119B (en) * 2016-09-06 2019-06-28 珠海全志科技股份有限公司 Level shift circuit
CN110535459A (en) * 2019-09-30 2019-12-03 安凯(广州)微电子技术有限公司 A kind of digital level conversion circuit based on low voltage CMOS process
CN113014077A (en) * 2021-03-30 2021-06-22 国硅集成电路技术(无锡)有限公司 High-voltage PN bridge gate driving circuit
CN113014077B (en) * 2021-03-30 2022-06-28 国硅集成电路技术(无锡)有限公司 High-voltage PN bridge gate driving circuit
CN113541676A (en) * 2021-08-10 2021-10-22 宜矽源半导体南京有限公司 A low power consumption high voltage level shift circuit
CN114448215A (en) * 2022-01-25 2022-05-06 深圳市诚芯微科技股份有限公司 Power tube driving circuit

Also Published As

Publication number Publication date
CN105811960B (en) 2018-01-09

Similar Documents

Publication Publication Date Title
CN104022776B (en) Bootstrapping diode artificial circuit in half-bridge driving circuit
CN105811960B (en) A kind of level displacement circuit using thin grid oxygen metal-oxide-semiconductor
US7667490B2 (en) Voltage shifter circuit
US20180262186A1 (en) Integrated bootstrap high-voltage driver chip and technological structure thereof
KR101387266B1 (en) Level shift device
CN103297034B (en) Voltage level shifter
CN103856205B (en) Level shifting circuit, for driving the drive circuit of high tension apparatus and corresponding method
US10243564B2 (en) Input-output receiver
CN104038209B (en) Level shifting circuit
CN102904565A (en) A Level Shift Circuit for Ultra-low Quiescent Current Driven by DC-DC
CN105187047B (en) A kind of extra-high voltage level displacement circuit for IGBT driving chips
CN105227165B (en) IGBT gate drive circuit, IGBT device and electric vehicle
CN109921779B (en) Half-bridge circuit through protection circuit
CN101312328A (en) Boot strap capacitor charging circuit and driving integrated circuit using same
CN112671393A (en) Level conversion circuit
CN103825434B (en) A kind of IGBT drive circuit
CN103944556A (en) Level transfer circuit
CN105656017B (en) Protection circuit and input circuit suitable for integrated circuit
CN101459424B (en) Output Units, Input Units, and I/O Elements
CN113824437B (en) Gate drive circuit
CN112332812B (en) High-reliability PMOS power switch tube driving circuit
CN111010164B (en) Output buffer circuit based on GaAs technology
CN114640339A (en) Level conversion circuit without power-on unsteady state
CN108206689B (en) Level shift driving circuit
CN113726330A (en) Level conversion circuit and chip

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20180109

Termination date: 20210303

CF01 Termination of patent right due to non-payment of annual fee