CN105793695B - 用相机探头探查物体的方法 - Google Patents

用相机探头探查物体的方法 Download PDF

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Publication number
CN105793695B
CN105793695B CN201480065697.9A CN201480065697A CN105793695B CN 105793695 B CN105793695 B CN 105793695B CN 201480065697 A CN201480065697 A CN 201480065697A CN 105793695 B CN105793695 B CN 105793695B
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China
Prior art keywords
camera probe
interest
feature
probe
camera
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CN201480065697.9A
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English (en)
Chinese (zh)
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CN105793695A (zh
Inventor
蒂莫西·查尔斯·费瑟斯通
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Renishaw PLC
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Renishaw PLC
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/002—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
    • G01B11/005—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates coordinate measuring machines
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
    • G01B21/047—Accessories, e.g. for positioning, for tool-setting, for measuring probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/954—Inspecting the inner surface of hollow bodies, e.g. bores
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N7/00—Television systems
    • H04N7/18—Closed-circuit television [CCTV] systems, i.e. systems in which the video signal is not broadcast
    • H04N7/183—Closed-circuit television [CCTV] systems, i.e. systems in which the video signal is not broadcast for receiving images from a single remote source
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/30—Nc systems
    • G05B2219/37—Measurements
    • G05B2219/37063—Controlled scanning, the head is moved along a given path
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/30—Nc systems
    • G05B2219/37—Measurements
    • G05B2219/37199—Hole location
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/30—Nc systems
    • G05B2219/37—Measurements
    • G05B2219/37572—Camera, tv, vision

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
CN201480065697.9A 2013-10-03 2014-10-02 用相机探头探查物体的方法 Active CN105793695B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP13275242 2013-10-03
EP13275242.9 2013-10-03
PCT/EP2014/071176 WO2015049341A1 (en) 2013-10-03 2014-10-02 Method of inspecting an object with a camera probe

Publications (2)

Publication Number Publication Date
CN105793695A CN105793695A (zh) 2016-07-20
CN105793695B true CN105793695B (zh) 2020-04-14

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
CN201480065697.9A Active CN105793695B (zh) 2013-10-03 2014-10-02 用相机探头探查物体的方法

Country Status (6)

Country Link
US (1) US10260856B2 (enExample)
EP (1) EP3052926B1 (enExample)
JP (1) JP7246127B2 (enExample)
CN (1) CN105793695B (enExample)
CA (1) CA2925301A1 (enExample)
WO (1) WO2015049341A1 (enExample)

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EP3006890A4 (en) * 2013-05-28 2016-11-30 Shinko Denshi Kk DIMENSION MEASURING DEVICE
JP6338069B2 (ja) * 2016-10-31 2018-06-06 ソリッドビジョン株式会社 画像処理システム及び画像処理方法
JP6790861B2 (ja) * 2017-01-20 2020-11-25 オムロン株式会社 検査システム、コントローラ、検査方法、および検査プログラム
EP3583405A4 (en) 2017-02-20 2020-11-11 Yoran Imaging Ltd. METHOD AND SYSTEM FOR DETERMINING THE INTEGRITY OF A PACKAGING
US12430745B2 (en) 2017-02-20 2025-09-30 Yoran Imaging Ltd. Method and system for determining package integrity
US11836908B2 (en) 2017-02-20 2023-12-05 Yoran Imaging Ltd. Method and system for determining package integrity
JP6817893B2 (ja) * 2017-05-18 2021-01-20 Ntn株式会社 外観検査装置
CN107677678A (zh) * 2017-09-20 2018-02-09 广州视源电子科技股份有限公司 基于自动路径规划的外观检测方法和装置
CN107664478B (zh) * 2017-10-26 2023-11-03 成都众鑫聚合科技有限公司 一种立式非接触回转体高精度测量装置及其测量方法
IL276751B2 (en) * 2018-02-21 2025-07-01 Yoran Imaging Ltd Methods and systems for thermal imaging of moving objects
JP6870636B2 (ja) * 2018-03-12 2021-05-12 オムロン株式会社 外観検査システム、画像処理装置、設定装置および検査方法
JP2019158500A (ja) 2018-03-12 2019-09-19 オムロン株式会社 外観検査システム、画像処理装置、撮像装置および検査方法
JP7167453B2 (ja) * 2018-03-12 2022-11-09 オムロン株式会社 外観検査システム、設定装置、画像処理装置、設定方法およびプログラム
JP7073828B2 (ja) * 2018-03-22 2022-05-24 オムロン株式会社 外観検査システム、設定装置および検査方法
CN108696722B (zh) * 2018-05-28 2024-02-20 广东工业大学 一种目标监测方法、系统及设备和存储介质
JP7077807B2 (ja) * 2018-06-12 2022-05-31 オムロン株式会社 画像検査システム及びその制御方法
CN112334763B (zh) * 2018-06-29 2025-09-26 株式会社高迎科技 对象物检查装置及利用其的对象物检查方法
EP3686610B1 (en) * 2019-01-24 2025-03-05 Rohde & Schwarz GmbH & Co. KG Probe, measuring system and method for applying a probe
US11375124B2 (en) * 2019-02-25 2022-06-28 Advanced Semiconductor Engineering, Inc. Optical measurement equipment and method for measuring warpage of a workpiece
CN110445967B (zh) * 2019-08-12 2020-11-13 温州思鸣达工业产品设计有限公司 一种监控范围大的自动清洗式工业摄像头
CN113066132B (zh) * 2020-03-16 2024-06-25 天目爱视（北京）科技有限公司 一种基于多设备采集的3d建模标定方法
JP7346363B2 (ja) * 2020-06-25 2023-09-19 オークマ株式会社 単眼撮像装置による三次元座標測定方法
CN112738463B (zh) * 2020-12-24 2023-02-10 山西海平面智能科技有限公司 一种钻场跟踪监测装置
US20240414439A1 (en) * 2021-10-03 2024-12-12 Kitov Systems Ltd Methods of and systems for robotic inspection

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US20030213868A1 (en) * 2002-04-22 2003-11-20 Brunner Joseph F. Camera systems for tracking objects from an aircraft
US20070073439A1 (en) * 2005-09-23 2007-03-29 Babak Habibi System and method of visual tracking
CN102803893A (zh) * 2009-06-04 2012-11-28 瑞尼斯豪公司 视觉测量探针和操作方法

Also Published As

Publication number Publication date
EP3052926B1 (en) 2021-12-01
WO2015049341A1 (en) 2015-04-09
CA2925301A1 (en) 2015-04-09
US20160238373A1 (en) 2016-08-18
JP7246127B2 (ja) 2023-03-27
US10260856B2 (en) 2019-04-16
CN105793695A (zh) 2016-07-20
JP2016533484A (ja) 2016-10-27
EP3052926A1 (en) 2016-08-10

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