CN105790069A - Semiconductor laser with elliptic annular window - Google Patents

Semiconductor laser with elliptic annular window Download PDF

Info

Publication number
CN105790069A
CN105790069A CN201510396482.1A CN201510396482A CN105790069A CN 105790069 A CN105790069 A CN 105790069A CN 201510396482 A CN201510396482 A CN 201510396482A CN 105790069 A CN105790069 A CN 105790069A
Authority
CN
China
Prior art keywords
oval
elliptic
hollow
layer
oval ring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201510396482.1A
Other languages
Chinese (zh)
Inventor
晏长岭
李鹏
史建伟
李雨霏
冯源
郝永芹
张剑家
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Changchun University of Science and Technology
Original Assignee
Changchun University of Science and Technology
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Changchun University of Science and Technology filed Critical Changchun University of Science and Technology
Priority to CN201510396482.1A priority Critical patent/CN105790069A/en
Publication of CN105790069A publication Critical patent/CN105790069A/en
Pending legal-status Critical Current

Links

Landscapes

  • Semiconductor Lasers (AREA)

Abstract

A traditional vertical cavity surface emission semiconductor laser is in a completely symmetric round shape, output light of the laser is round symmetric light beams, the light beams are not hollow and is in an instable polarization state. The invention provides a semiconductor laser with an elliptic annular window. The structure is shown as figures: the elliptic annular window 1, an upper electrode 2, an ohmic contact layer 3, an upper distributed Bragg reflection mirror 4, an oxide limitation layer 5, a semiconductor material active gain layer 6, a lower distributed Bragg reflection mirror 7, a substrate 8 and a lower electrode 9, the overall structure from the elliptic annular window to the active gain layer is an elliptic cylindrical structure, the ratio selection range between the length of a long shaft and the length of a short shaft of the elliptic structure is 3:2 to 5:4, a central region of the elliptic cylindrical structure is hollow, and an elliptic etching region 10 formed by etching is etched from the ohmic contact layer to the upper distributed Bragg reflection mirror. The semiconductor laser works in an electric pumping mode, elliptic hollow light beams can be emitted under the effect of the elliptic annular window, the emitted elliptic hollow light beams have favorable polarization characteristics, and the polarization is in a stable state.

Description

A kind of oval ring Window Semiconductor Lasers
Technical field
The invention belongs to field of semiconductor lasers, be specifically related to a kind of oval ring Window Semiconductor Lasers.
Background technology
Just energy and the carrier of information, observe at us and play an important role with exploring in the world always.The birth of nineteen sixty laser imparts again the light source that mankind's intensity is high, recognizes for us and utilizes light to start brand-new situation.The formation of laser beam and transmission research are always up the main direction of studying of laser field.In recent years, along with the development of laser technology, a kind of have the novel laser beam that central light strength is zero and gradually form, and develops into special light beam family, hollow laser beam.Hollow laser beam is a kind of central light strength in the propagation direction is the annular beam of zero, in other words, axial intensity be zero light beam be called " hollow beam " or " dark hollow beam ".Series of novel that hollow laser beam has and far-reaching physical attribute, as the studied personnel just gradually such as bread cast light distribution, helicon front, the unusual vortex in center, non-diffraction beam recognize, develop and utilize;These characteristics make hollow laser beam have its unique application in laser trapping with cooling, optical tweezers, the micro-manipulation of optics, Bose-Einstein condensates, optical measurement, calculating holography etc.;Hollow beam, as laser catheter, optical tweezers (light pincers) and optical wrench, has become the powerful realizing microcosmic particle (such as micron particle, nanoparticle and biological cell etc.) accurate manipulation and control at present;Meanwhile, the application of hollow beam also there is a need to the field of the light beam of polarization state ellipsometry distribution, this ellipsometry hollow beam has special focus characteristics, and this characteristic has application widely in guiding and trapped particle, electronics in accelerating high resolution microscope, Metal Cutting, high density storage etc..
The method generally producing hollow laser is utilize one piece of double cone prism to create a branch of hollow beam with double gauss radial intensity distribution on the basis of Gaussian beam, its Beam Transformation principle is: after a Gaussian beam is by first summit refraction of prism, be the hollow beam dispersed by beam splitting;After the second time refraction of prism, produce a branch of approximately parallel bagel annular hollow beam from the other end;Additionally can also produce hollow beam with hollow optic fibre, adopt the experimental provision of micron-scale hollow optical fiber to produce a kind bagel hollow beam;But the method usual optical pathway system of the above tradition hollow laser of generation is extremely complex, manufacture difficulty is big, volume is big, laser pumping mode is also complicated.The system producing oval hollow beam is more complicated, it is usually predominantly and passes through indirect method, method such as optical beam transformation, it is deformed, by known circular hollow light beam, the oval hollow beam obtained through astigmatism, obtained through inclination and distortion by traditional circular hollow light beam, or utilize prism to produce oval hollow Gaussian beam, so the light path complexity of total system is just further increased, manufacture difficulty also increases simultaneously, volume becomes big, can not forming the LASER Light Source directly producing oval hollow beam, the stability of system is also poor.
Vertical cavity surface emitting laser is a kind of Semiconductor Laser, the advantages such as the volume with semiconductor laser is little, efficiency is high, electric pump mode is easy, and there is vertical surface compared with edge-emission semiconductor laser and go out the feature of ray laser, output circular symmetrical beam, and with optical coupling efficiency advantages of higher;Conventional vertical-cavity surface emitting laser structure is as shown in Figure 1: light-emitting window, upper electrode, ohmic contact layer, upper distribution Bragg reflector, oxide confining layer, active gain district, lower distribution Bragg reflector, substrate, bottom electrode, from light-emitting window to the quasiconductor in active gain district generally cylindrical structural;Individual laser package welding time, bottom electrode by solder be welded to heat sink on, in order to improve the radiating effect of device further, it is possible to bottom electrode and heat sink between addition fin, be generally metallized diamond heat sink.The light beam of this structure vertical cavity surface emitting lasers is circle symmetrical Gaussian shape, laser generation output is formed owing to device center region also has electric current to inject, therefore hollow laser beam can not be produced, can not constitute and directly constitute the laser instrument producing oval hollow beam, it is thus desirable to one more preferably semiconductor laser structure, thus form the semiconductor laser that can directly produce oval hollow beam.
Summary of the invention
Oval hollow laser beam can not be directly produced in order to solve prior art, and prior-art devices is complicated, manufacture difficulty is big, volume is big, laser pumping mode is complicated, stablize the problems such as poor, have the advantage of round symmetric figure light beam in conjunction with vertical cavity surface emitting laser, the present invention proposes a kind of oval ring Window Semiconductor Lasers.One has oval ring Window Semiconductor Lasers as shown in Figure 2, including: oval ring window, upper electrode, ohmic contact layer, upper distribution Bragg reflector, oxide confining layer, semi-conducting material active gain layer, lower distribution Bragg reflector, substrate, bottom electrode, from oval ring window to the quasiconductor in active gain district generally elliptical cylinder-shape structure;Electric insulation layer is had between the outer abutment wall and upper electrode of elliptical cylinder-shape structure;Elliptical cylinder-shape architectural feature also reside in the central area of elliptical cylinder-shape structure be hollow by the oval etched area that formed of etching, etch from ohmic contact layer to upper distribution Bragg reflector;The edge of etched area is that hydrion injects the high resistance area, edge formed;Being active increasing layer below etched area, this part active increasing layer is to be injected, by hydrion, the oval high resistance area formed, and high resistance area is from active layer upper surface to its surface lower;It is further characterized in that elliptical cylinder-shape structure, oval ring light-emitting window, oval etched area and oval high resistance area are concentrics, and the ratio selection range of corresponding long axis length and minor axis length is 3:2 to 5:4.The edge of the edge of upper electrode and high resistance area, edge, etched area constitutes oval ring light-emitting window, as shown in Figure 3.
The invention has the beneficial effects as follows: during a kind of oval ring Window Semiconductor Lasers work, electric current is from upper electrode injection, through ohmic contact layer, upper distribution Bragg reflector, oxide current limiting layer enters semiconductor active region, owing to the existence electric current of device center district etch layer and high resistance area can only produce stimulated emission in the oval ring structure that the ovallized column with high resistance area with device is formed, form disc waveguide structure, and upper, go up down the resonator cavity formation laser generation that distribution Bragg reflector is formed, oval hollow laser beam output is formed from upper distribution Bragg reflector outgoing.In oval ring structure, long axis length is 3:2 to 5:4 with the ratio span of minor axis length;When the ratio of long axis length and minor axis length is more than 3:2, difficulty focusing can be caused;When the ratio of long axis length and minor axis length is less than 5:4, causing the elliptical polarization DeGrain of formation, polarization stability is poor simultaneously.By regulate cylindroid size, device center ellipse etched area, oval high resistance area size can produce the oval hollow laser beam of the different oval skin dark stain size of hollow beam, width of light beam, beam radius, annular beam width, to meet the needs of practical application.Meanwhile, a kind of oval ring Window Semiconductor Lasers, this semiconductor laser is owing to forming oval ring etched area in elliptical cylinder-shape structure centre district by etching, and formed high resistance area, edge in edge by hydrion injection, prevent electric current to edge-diffusion, the leakage of injection current is advantageously reduced compared with not processing, it is simultaneously also beneficial to reduce due to the etching abutment wall optical scattering losses caused such as coarse, reduce the threshold current of device more than 20%, improve the electro-optical efficiency of device more than 20%;Etched area by ohmic contact layer until upper distribution Bragg reflector, it is possible to form effective oval ring fiber waveguide;Active increasing layer segment below etched area is injected the oval high resistance area formed by hydrion, make injection current can not enter active area center, laser generation can not be formed in central area, thus creating effective oval ring hollow laser beam, to meet the needs widely of practical application, have that producing method is direct, manufacturing process is simple, volume is little, pumping is easy, reproducible, it is easy to the advantages such as popularization.By at the outer addition electric insulation layer such as silicon dioxide between abutment wall and upper electrode of elliptical cylinder-shape structure in upper electrode, so go up the lead-in wire of electrode by can on the side of elliptical cylinder-shape structure rather than the upper electrode in elliptical cylinder-shape structure, decrease the elliptical cylinder-shape structure caused in contact conductor impaired due to mechanical shock, and the device lattice damage thus caused and performance degradation, so improve device yield and stability more than 50%.
Accompanying drawing explanation
Fig. 1 is conventional vertical-cavity surface emitting laser structure.
Fig. 2 is that one of the present invention has oval ring Window Semiconductor Lasers outside side view.
Fig. 3 is the top view of Fig. 2.
Beneficial effect
During a kind of oval ring Window Semiconductor Lasers work, electric current is from upper electrode injection, semiconductor active region is entered through ohmic contact layer, upper distribution Bragg reflector, oxide current limiting layer, owing to the existence electric current of device center district etch layer and high resistance area can only produce stimulated emission in the oval ring structure that the ovallized column with high resistance area with device is formed, form disc waveguide structure, and the resonator cavity that distribution Bragg reflector is formed on upper and lower forms laser generation, form oval hollow laser beam output from upper distribution Bragg reflector outgoing.In oval ring structure, long axis length is 3:2 to 5:4 with the ratio selection range of minor axis length;When the ratio of long axis length and minor axis length is more than 3:2, difficulty focusing can be caused;When the ratio of long axis length and minor axis length is less than 5:4, causing the elliptical polarization DeGrain of formation, polarization stability is poor simultaneously.By regulate cylindroid size, device center ellipse etched area, oval high resistance area size can produce the oval hollow laser beam of the different oval skin dark stain size of hollow beam, width of light beam, beam radius, annular beam width, to meet the needs of practical application.Meanwhile, a kind of oval ring Window Semiconductor Lasers, this semiconductor laser is owing to forming oval ring etched area in elliptical cylinder-shape structure centre district by etching, and formed high resistance area, edge in edge by hydrion injection, prevent electric current to edge-diffusion, the leakage of injection current is advantageously reduced compared with not processing, it is simultaneously also beneficial to reduce due to the etching abutment wall optical scattering losses caused such as coarse, reduce the threshold current of device more than 20%, improve the electro-optical efficiency of device more than 20%;Etched area by ohmic contact layer until upper distribution Bragg reflector, it is possible to form effective oval ring fiber waveguide;Active increasing layer segment below etched area is injected the oval high resistance area formed by hydrion, make injection current can not enter active area center, laser generation can not be formed in central area, thus creating effective oval ring hollow laser beam, to meet the needs widely of practical application, have that producing method is direct, manufacturing process is simple, volume is little, pumping is easy, reproducible, it is easy to the advantages such as popularization.By at the outer addition electric insulation layer such as silicon dioxide between abutment wall and upper electrode of elliptical cylinder-shape structure in upper electrode, so go up the lead-in wire of electrode by can on the side of elliptical cylinder-shape structure rather than the upper electrode in elliptical cylinder-shape structure, decrease the elliptical cylinder-shape structure caused in contact conductor impaired due to mechanical shock, and the device lattice damage thus caused and performance degradation, so improve device yield and stability more than 50%.
Detailed description of the invention
A kind of oval ring Window Semiconductor Lasers of the present invention includes: oval ring window-1, upper electrode-2 are Ti/Pt/Au, ohmic contact layer-3 is GaAs, upper distribution Bragg reflector-4 is P type 25 cycle Al0.1Ga0.9As/Al0.8Ga0.2As, oxide confining layer-5 are Al2O3, the AlGaAs layer that oxide confining layer is by Al component 0.98 is formed by wet oxidation method, and width is 3-5 micron, active gain district-6 is GaAs/Al0.2Ga0.8As quantum well region, lower distribution Bragg reflector-7 are N-type 40 cycle Al0.1Ga0.9As/Al0.8Ga0.2As, substrate-8 are GaAs, bottom electrode-9 is Au/Ge/Ni, from light-emitting window to the quasiconductor in active gain district generally elliptical cylinder-shape structure, and major axis 120 microns, 90 microns of short axle;It is further characterized in that and adopts in the central area of elliptical cylinder-shape structure dry etching or wet etching technique to form oval etched area-10, its major axis is 90 microns, short axle is 60 microns, the high resistance area-11 formed is injected by hydrion at the edge of oval etched area, width is 3 microns, it is injected, by hydrion, the oval high resistance area-12 formed below oval etched area, its major axis is 90 microns, short axle is 60 microns, and on high resistance area, the lower surface of distribution Bragg reflector layer is up to active layer;Electric insulation layer-13 is had for SiO between elliptical cylinder-shape structure and upper electrode2;The oval ring light-emitting window that the edge of upper electrode is annular with the outward flange composition of etched area, as shown in Figure 3.
It should be noted that the above-mentioned definition to each element is not limited in various concrete material, structure or the shape mentioned in embodiment, those of ordinary skill in the art can replace while it is known simply.

Claims (3)

1. an oval ring Window Semiconductor Lasers, it is characterized in that oval ring window, upper electrode, ohmic contact layer, upper distribution Bragg reflector, oxide confining layer, semi-conducting material active gain layer, lower distribution Bragg reflector, substrate, bottom electrode, from oval ring window to the quasiconductor in active gain district generally elliptical cylinder-shape structure, between the outer abutment wall and upper electrode of elliptical cylinder-shape structure, there is electric insulation layer.
2. an oval ring Window Semiconductor Lasers, its architectural feature is in that the central area of elliptical cylinder-shape structure is hollow, the oval etched area formed by etching, etching is from ohmic contact layer to upper distribution Bragg reflector, the edge of etched area is that hydrion injects the high resistance area, edge formed, and high resistance area is from active layer upper surface to its surface lower.
3. an oval ring Window Semiconductor Lasers, it is further characterized in that elliptical cylinder-shape structure, oval ring light-emitting window, oval etched area and oval high resistance area are concentrics, and long axis length is 3:2 to 5:4 with the ratio span of minor axis length in oval structure, the edge of the edge of upper electrode and high resistance area, edge, etched area constitutes oval ring light-emitting window.
CN201510396482.1A 2015-07-08 2015-07-08 Semiconductor laser with elliptic annular window Pending CN105790069A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201510396482.1A CN105790069A (en) 2015-07-08 2015-07-08 Semiconductor laser with elliptic annular window

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201510396482.1A CN105790069A (en) 2015-07-08 2015-07-08 Semiconductor laser with elliptic annular window

Publications (1)

Publication Number Publication Date
CN105790069A true CN105790069A (en) 2016-07-20

Family

ID=56389870

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201510396482.1A Pending CN105790069A (en) 2015-07-08 2015-07-08 Semiconductor laser with elliptic annular window

Country Status (1)

Country Link
CN (1) CN105790069A (en)

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2018113360A (en) * 2017-01-12 2018-07-19 ローム株式会社 Surface emitting laser element and optical device
CN108333283A (en) * 2017-01-20 2018-07-27 中国科学院上海微系统与信息技术研究所 A kind of microfluidic chromatography column and preparation method thereof containing streamlined oval micro-pillar array
CN108832483A (en) * 2018-06-27 2018-11-16 潍坊华光光电子有限公司 A kind of preparation method of ridged semiconductor laser diode
CN111029903A (en) * 2019-12-25 2020-04-17 长春理工大学 Vertical cavity surface emitting semiconductor laser capable of realizing asymmetric trapping of particles
CN111224319A (en) * 2020-01-20 2020-06-02 常州纵慧芯光半导体科技有限公司 Vertical cavity surface emitting laser with hollow light emitting region, and manufacturing method and application thereof
CN111279563A (en) * 2017-09-18 2020-06-12 菲尼萨公司 VCSEL with elliptical aperture with reduced RIN
WO2021003643A1 (en) * 2019-07-08 2021-01-14 Xiamen Sanan Integrated Circuit Co., Ltd. Vertical-cavity surface-emitting laser device
CN108666867B (en) * 2018-07-31 2023-05-05 西安工业大学 Laser for outputting hollow light beam and manufacturing method thereof

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101039015A (en) * 2006-03-14 2007-09-19 昂科公司 Vcsel semiconductor devices with mode control
CN101714744A (en) * 2009-11-20 2010-05-26 长春理工大学 Non-annular cavity type semiconductor laser
WO2012140544A1 (en) * 2011-04-12 2012-10-18 Koninklijke Philips Electronics N.V. Vcsel with ring-shaped beam profile
CN102810813A (en) * 2011-06-02 2012-12-05 长春理工大学 Semiconductor laser with elliptical ring cavity
CN104377546A (en) * 2014-12-08 2015-02-25 长春理工大学 Elliptic ring microcavity laser with high-resistance area
CN104662750A (en) * 2012-02-28 2015-05-27 康宁股份有限公司 Surface emitting multiwavelength distributed-feedback concentric ring lasers

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101039015A (en) * 2006-03-14 2007-09-19 昂科公司 Vcsel semiconductor devices with mode control
CN101714744A (en) * 2009-11-20 2010-05-26 长春理工大学 Non-annular cavity type semiconductor laser
WO2012140544A1 (en) * 2011-04-12 2012-10-18 Koninklijke Philips Electronics N.V. Vcsel with ring-shaped beam profile
CN102810813A (en) * 2011-06-02 2012-12-05 长春理工大学 Semiconductor laser with elliptical ring cavity
CN104662750A (en) * 2012-02-28 2015-05-27 康宁股份有限公司 Surface emitting multiwavelength distributed-feedback concentric ring lasers
CN104377546A (en) * 2014-12-08 2015-02-25 长春理工大学 Elliptic ring microcavity laser with high-resistance area

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2018113360A (en) * 2017-01-12 2018-07-19 ローム株式会社 Surface emitting laser element and optical device
JP7077500B2 (en) 2017-01-12 2022-05-31 ローム株式会社 Surface emitting laser element, optical device
CN108333283A (en) * 2017-01-20 2018-07-27 中国科学院上海微系统与信息技术研究所 A kind of microfluidic chromatography column and preparation method thereof containing streamlined oval micro-pillar array
CN111279563A (en) * 2017-09-18 2020-06-12 菲尼萨公司 VCSEL with elliptical aperture with reduced RIN
CN108832483A (en) * 2018-06-27 2018-11-16 潍坊华光光电子有限公司 A kind of preparation method of ridged semiconductor laser diode
CN108666867B (en) * 2018-07-31 2023-05-05 西安工业大学 Laser for outputting hollow light beam and manufacturing method thereof
WO2021003643A1 (en) * 2019-07-08 2021-01-14 Xiamen Sanan Integrated Circuit Co., Ltd. Vertical-cavity surface-emitting laser device
CN111029903A (en) * 2019-12-25 2020-04-17 长春理工大学 Vertical cavity surface emitting semiconductor laser capable of realizing asymmetric trapping of particles
CN111224319A (en) * 2020-01-20 2020-06-02 常州纵慧芯光半导体科技有限公司 Vertical cavity surface emitting laser with hollow light emitting region, and manufacturing method and application thereof

Similar Documents

Publication Publication Date Title
CN105790069A (en) Semiconductor laser with elliptic annular window
WO2021109350A1 (en) Energy band inversion and optical field confinement effect-based topological bulk laser and method
CN101667715B (en) Single-mode high-power vertical cavity surface emitting laser and manufacturing method thereof
TWI276273B (en) Surface light emitting semiconductor laser element
JP2019062188A (en) Controlling beam divergence in vertical cavity surface emitting laser
CN104767120B (en) Distribution Bragg reflector vertical-cavity-face emitting semiconductor laser in loop configuration
WO2020113558A1 (en) Vertical-cavity surface-emitting laser
CN105680319B (en) High brightness semiconductor laser based on modal gain loss regulation and control
CN103825194B (en) Single-mode photon crystal edge-emission semiconductor laser
CN106575855B (en) A kind of vertical cavity surface emitting laser VCSEL
CN113381293B (en) Bessel beam emitter and manufacturing method thereof
CN104868359B (en) Single mode High Speed Modulation Fabry Perot semiconductor laser based on coupler
CN110620169A (en) Transverse current limiting high-efficiency light-emitting diode based on resonant cavity
CN102790354A (en) Vertical-cavity surface-emitting laser and production method thereof
CN108233180B (en) 808nm semiconductor laser structure with AlGaInP structure
JPH0555713A (en) Light emitting semiconductor element
CN104300367B (en) Suppress the method for GaAs base laser high-order modes
CN109560460A (en) A kind of large aperture high light beam quality microlaser
TW565975B (en) Oxide confined type vertical cavity surface emitting laser device and the manufacturing method thereof
CN112649925A (en) Direct coupling optical device and packaging method thereof
CN109599743B (en) Conical photonic crystal laser based on photonic crystal defect state mode control
CN1710763A (en) Optical pump high-power vertical external cavity emitting laser
CN110829178A (en) Distributed Bragg reflector vertical cavity surface emitting semiconductor laser under annular structure
CN102623890A (en) Porous defect matching type photonic crystal surface emitting laser
CN104300365B (en) The preparation method of the laser of the angle of divergence and threshold current is reduced simultaneously

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
AD01 Patent right deemed abandoned

Effective date of abandoning: 20190903

AD01 Patent right deemed abandoned