CN105785222A - Plug-in fuse secondary quick screening method - Google Patents
Plug-in fuse secondary quick screening method Download PDFInfo
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- CN105785222A CN105785222A CN201610200494.7A CN201610200494A CN105785222A CN 105785222 A CN105785222 A CN 105785222A CN 201610200494 A CN201610200494 A CN 201610200494A CN 105785222 A CN105785222 A CN 105785222A
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- sample
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/74—Testing of fuses
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- General Physics & Mathematics (AREA)
- Fuses (AREA)
Abstract
The invention discloses a plug-in fuse secondary quick screening method comprising the following steps: (1) installing samples on a test plate and on a fuse automatic measurement system; (2) applying a test current less than 10% of the rated current to the samples, and testing the resistance of each sample at the moment; (3) applying any test current between 50% of the rated current and 100% of the rated current to the samples for 10-60s, and testing the resistance of each sample at the moment; and (4) observing the sample resistance change rate given by a test system, and removing the samples of which the resistance change rate is obviously lower or higher than those of other products. The plug-in fuse secondary quick screening method of the invention has the advantages of quick detection, good product consistency and high reliability.
Description
Technical field
The present invention relates to electronic devices and components field tests, relate in particular to a kind of plug-in type fuse secondary rapid screening method.
Background technology
JF-01/F type plug-in type fuse applies to the military domain such as space flight and aviation, and concordance and reliability requirement for product are higher.Therefore, screening is performed twice at for such product requirement, it is ensured that particular product performance parameters concordance is very good.At present, after JF-01/F type plug-in type fuse primary screening, the main mode using room temperature resistance to measure carries out postsearch screening, ensure that properties of sample is more consistent by the sample screening resistance close, but from test result, the performance parameter being still mixed with about 1%～3% deviates bigger sample, and the concordance of such product and reliability requirement are not up to standard, there is certain hidden danger in the reliability for the military domain product such as space flight, aviation.
Summary of the invention
It is an object of the invention to overcome above-mentioned technological deficiency, it is provided that provide and a kind of detect that speed is fast, concordance and the high plug-in type fuse secondary rapid screening method of reliability.
Realization the technical scheme is that a kind of plug-in type fuse secondary rapid screening method, and the method comprises the steps:
(1) sample it is arranged on test board and is arranged on fuse automatic measurement system；
(2) the test electric current less than 10% rated current, test sample resistance value now are passed to sample；
(3) the arbitrary test electric current 10s～60s between 50%～100% rated current, test sample resistance value now are passed to sample；
(4) the sample resistance varying-ratio that test system provides is observed；The sample being clearly lower or higher than other product resistance varying-ratios is rejected.
Preferably, described plug-in type fuse is JF-01/F type plug-in type fuse.
Preferably, in described step (1), sample size is 30.
The Cleaning Principle of the present invention is as follows:
This method utilizes each several part resistance that product (i.e. JF-01/F type plug-in type fuse) internal structure forms to test the change in resistance under electric current in difference, carries out postsearch screening.
JF-01/F type plug-in type fuse cold conditions resistance R is mainly by melt portion 1 resistance R1, welding portion 2 resistance R2With lead portion 3 resistance R3Composition；That is: R=R1+R2+R3(see Fig. 1).
Cold-state resistance test electric current is generally less than 10%In (rated current)；When within the scope of selection 50%In～100%In, a certain current value is tested, recording resistance value is R`=R1`+R2`+R3`。
Owing to test electric current is less than rated current, therefore sample is not constituted damaging influence；Lead-in wire 3 is solid copper wire, and the impact of its abnormal change ratio can be got rid of；Therefore, when welding portion 2 or melt portion 1 are abnormal, the rate of change of R` correspondence R should be clearly distinguishable from other samples.
The sample producing batch middle recessive defect of melt portion existence and recessive failure welding, the concordance of further raising batch and reliability can be directly rejected based on above method.
Compared with prior art the invention has the beneficial effects as follows: 1, this method can directly reject the sample producing batch middle recessive defect of melt portion existence and recessive failure welding, the concordance of raising batch further and reliability；2, this method is disposable can detect 30 samples, convenient and swift, substantially increases detection efficiency.
Accompanying drawing explanation
Fig. 1 is JF-01/F type plug-in type fuse internal structure schematic diagram of the present invention.
Detailed description of the invention
Below the technical scheme in the embodiment of the present invention is clearly and completely described.Based on the embodiment in the present invention, the every other embodiment that those skilled in the art obtain under not making creative work premise, broadly fall into the scope of protection of the invention.
Embodiment 1
A kind of plug-in type fuse secondary rapid screening method, sample is: JF-01/F-125V-1A identifies batch postsearch screening data, choosing resistance varying-ratio all samples between 5%～7%, indivedual abnormal sample rates of change are all rejected less than 5% or more than 7%, and labelling runic.
The method comprises the steps:
1, sample is arranged on test board (non-solder installation) be arranged on fuse automatic measurement system, (30 samples of every plate)；
2, the test electric current less than 10% rated current, test sample resistance value now are passed to sample；
3, the arbitrary test electric current 10s～60s between 50%～100% rated current, test sample resistance value now are passed to sample；
4, the sample resistance varying-ratio that test system provides is observed；The sample being clearly lower or higher than other product resistance varying-ratios is rejected.
5, then changing next group sample again to test, altogether carry out 4 tests, tested sample amounts to 120, and test result is table one such as.
Batch postsearch screening data identified by table one: JF-01/F-125V-1A
Can being drawn 2 groups of abnormal datas by this table, respectively the 11st group and the 66th group, disqualification rate accounts for the 1.6% of overall measurement.From test result, the performance parameter being still mixed with about 2% deviates bigger sample, the concordance of such product and reliability requirement are not up to standard, illustrate to adopt the method can filter out underproof resistance well, directly reject the sample producing batch middle recessive defect of melt portion existence and recessive failure welding, the concordance of further raising batch and reliability.
Embodiment 2
A kind of plug-in type fuse secondary rapid screening method, sample is: JF-01/F-125V-15A identifies batch postsearch screening data, choosing resistance varying-ratio all samples between 9%～11%, indivedual abnormal sample rates of change are all rejected less than 9% or more than 11%, and mark thick.
The method comprises the steps:
1, sample is arranged on test board (non-solder installation) be arranged on fuse automatic measurement system, (30 samples of every plate)；
2, the test electric current less than 10% rated current, test sample resistance value now are passed to sample；
3, the arbitrary test electric current 10s～60s between 50%～100% rated current, test sample resistance value now are passed to sample；
4, the sample resistance varying-ratio that test system provides is observed；The sample being clearly lower or higher than other product resistance varying-ratios is rejected.
5, then changing next group sample again to test, altogether carry out 4 tests, tested sample amounts to 120, and test result is table two such as.
Batch postsearch screening data identified by table two: JF-01/F-125V-15A
Can being drawn 3 groups of abnormal datas by this table, respectively the 56th group, the 92nd group and the 66th group, disqualification rate accounts for the 2.5% of overall measurement.From test result, the performance parameter being still mixed with about 3% deviates bigger sample, the concordance of such product and reliability requirement are not up to standard, illustrate to adopt the method can filter out underproof resistance well, directly reject the sample producing batch middle recessive defect of melt portion existence and recessive failure welding, the concordance of further raising batch and reliability.
This method is applicable to JF-01/F type plug-in type fuse, and this fuse belongs to midget fuse, carries out its concordance of sample of screening and reliability is obviously improved through the method.This method applies also for the fuse that other structures composition is similar simultaneously.As the product cold conditions resistances such as CF/CFF/JF series chip fuse, JFM3216 type surface-mount type fuse are broadly divided into the product of 2～4 composition parts.
The foregoing is only presently preferred embodiments of the present invention, not in order to limit the present invention, all within the spirit and principles in the present invention, any amendment of making, equivalent replacement, improvement etc., should be included within protection scope of the present invention.
Claims (3)
1. a plug-in type fuse secondary rapid screening method, it is characterised in that: the method comprises the steps:
(1) sample it is arranged on test board and is arranged on fuse automatic measurement system；
(2) the test electric current less than 10% rated current, test sample resistance value now are passed to sample；
(3) the arbitrary test electric current 10s～60s between 50%～100% rated current, test sample resistance value now are passed to sample；
(4) the sample resistance varying-ratio that test system provides is observed；The sample being clearly lower or higher than other product resistance varying-ratios is rejected.
2. plug-in type fuse secondary rapid screening method according to claim 1, it is characterised in that described plug-in type fuse is JF-01/F type plug-in type fuse.
3. plug-in type fuse secondary rapid screening method according to claim 1, it is characterised in that in described step (1), sample size is 30.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610200494.7A CN105785222A (en) | 2016-04-01 | 2016-04-01 | Plug-in fuse secondary quick screening method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610200494.7A CN105785222A (en) | 2016-04-01 | 2016-04-01 | Plug-in fuse secondary quick screening method |
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| Publication Number | Publication Date |
|---|---|
| CN105785222A true CN105785222A (en) | 2016-07-20 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN201610200494.7A Pending CN105785222A (en) | 2016-04-01 | 2016-04-01 | Plug-in fuse secondary quick screening method |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106824833A (en) * | 2017-02-28 | 2017-06-13 | 中国振华集团云科电子有限公司 | Resistor screening technology method |
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| KR20070121869A (en) * | 2006-06-23 | 2007-12-28 | 동해전장 주식회사 | Fuse operation checking device of junction box |
| KR100810503B1 (en) * | 2006-09-13 | 2008-03-07 | 주식회사 티앤에스테크 | Circuit breaker test device |
| CN101776720A (en) * | 2010-01-04 | 2010-07-14 | 苏州热工研究院有限公司 | Multiple-factor detection system for aging condition of fuse and assessment method for aging condition |
| CN101915887A (en) * | 2010-07-05 | 2010-12-15 | 苏州热工研究院有限公司 | Fuse life characteristic data test and evaluation system and evaluation method thereof |
| CN103163421A (en) * | 2013-03-01 | 2013-06-19 | 中国空间技术研究院 | Method and device of testing surge current impact resistant property of fuse |
| CN103558461A (en) * | 2013-09-06 | 2014-02-05 | 电子科技大学 | Method for testing surge pulse current resistance of fuse |
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2016
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| KR20070121869A (en) * | 2006-06-23 | 2007-12-28 | 동해전장 주식회사 | Fuse operation checking device of junction box |
| KR100810503B1 (en) * | 2006-09-13 | 2008-03-07 | 주식회사 티앤에스테크 | Circuit breaker test device |
| CN101776720A (en) * | 2010-01-04 | 2010-07-14 | 苏州热工研究院有限公司 | Multiple-factor detection system for aging condition of fuse and assessment method for aging condition |
| CN101915887A (en) * | 2010-07-05 | 2010-12-15 | 苏州热工研究院有限公司 | Fuse life characteristic data test and evaluation system and evaluation method thereof |
| CN103163421A (en) * | 2013-03-01 | 2013-06-19 | 中国空间技术研究院 | Method and device of testing surge current impact resistant property of fuse |
| CN103558461A (en) * | 2013-09-06 | 2014-02-05 | 电子科技大学 | Method for testing surge pulse current resistance of fuse |
Non-Patent Citations (3)
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| 徐晓艳 等: "《小张学PLC》", 31 October 2015 * |
| 王加祥: "《元器件的识别与选用》", 31 July 2014, 西安电子科技大学出版社 * |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106824833A (en) * | 2017-02-28 | 2017-06-13 | 中国振华集团云科电子有限公司 | Resistor screening technology method |
| CN106824833B (en) * | 2017-02-28 | 2023-07-18 | 中国振华集团云科电子有限公司 | Resistor screening process |
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Application publication date: 20160720 |
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