CN105717395A - Alignment method and device of product to be measured - Google Patents

Alignment method and device of product to be measured Download PDF

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Publication number
CN105717395A
CN105717395A CN201610102045.9A CN201610102045A CN105717395A CN 105717395 A CN105717395 A CN 105717395A CN 201610102045 A CN201610102045 A CN 201610102045A CN 105717395 A CN105717395 A CN 105717395A
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China
Prior art keywords
measured
product
labelling
location information
marker location
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CN201610102045.9A
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Chinese (zh)
Inventor
徐大鹏
罕方平
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Shenzhen Seichitech Technology Co Ltd
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Shenzhen Seichitech Technology Co Ltd
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Priority to CN201610102045.9A priority Critical patent/CN105717395A/en
Publication of CN105717395A publication Critical patent/CN105717395A/en
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/02Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/26Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

The invention discloses an alignment method of a product to be measured. The method comprises the steps of: respectively obtaining position information of a mark on the product to be measured and position information of a preset mark on a crimping tool through a single camera or two cameras; according to the position information of the mark on the product to be measured and the position information of the preset mark on the crimping tool, obtaining a compensation angle between the mark on the product to be measured and the preset mark on the crimping tool, and obtaining relative position deviations in a transverse axis direction and in a longitudinal axis direction; and aligning the product to be measured according to the compensation angle, and the relative position deviations in the transverse axis direction and in the longitudinal axis direction. The invention further discloses an alignment device of the product to be measured. According to the invention, the single camera or the two cameras are utilized to obtain the mark position information so as to align the product to be measured, the hardware cost is lowered, the debugging and operation process is simplified, and the efficiency and the precision of automatic alignment on the product to be measured are simultaneously improved.

Description

The alignment method of product to be measured and device
Technical field
The present invention relates to electronic measuring technology field, particularly relate to alignment method and the device of a kind of product to be measured.
Background technology
At present detection equipment Industry commonly uses crimping jig para-position or uses the mode of the visual manual alignment of camera lens that multiplying power is higher to carry out para-position, and bit rate, aligning accuracy all can not be guaranteed.For Touch-screen testing equipment industry, during touch screen electric performance test, it is necessary to realize measuring the electrical connection of instrument and product to be measured.Carry out Manual-alignment when product to be measured carries out para-position, para-position efficiency and reliability are low.Or carrying out self-aligning mode para-position, debugging and operating process complexity by using four cameras to shoot the mark position on product to be measured, para-position efficiency is low, and image processing hardware cost requirement is high.
Summary of the invention
Present invention is primarily targeted at alignment method and device that a kind of product to be measured is provided, it is intended to improve product to be measured is carried out automatic aligning efficiency and precision, reduce hardware cost simultaneously.
For achieving the above object, the invention provides the alignment method of a kind of product to be measured, including:
The marker location information on product to be measured and marker location information preset on crimping jig is obtained respectively by single or two cameras;
According to the marker location information on described product to be measured and marker location information preset on described crimping jig, obtain the labelling on described product to be measured and the offset angle between labelling preset on described crimping jig and the relative position deviation in X direction and y direction;
According to described offset angle, and on described X direction and y direction, described product to be measured is carried out para-position by relative position deviation.
Alternatively, described according to the marker location information on described product to be measured with marker location information preset on described crimping jig, obtain the labelling on described product to be measured and the offset angle between labelling preset on described crimping jig, and the relative position deviation in X direction and y direction include:
According to the marker location information on described product to be measured and marker location information preset on described crimping jig, obtain the labelling on described product to be measured and the offset angle between labelling preset on described crimping jig;
The new marker location information on described product to be measured is calculated according to described offset angle;
According to marker location information preset on the new marker location information on described product to be measured and described crimping jig, calculate the labelling on described product to be measured and the relative position deviation in X direction and y direction between labelling preset on described crimping jig.
Alternatively, marker location information on described product to be measured includes left marker location information and right marker location information, marker location information preset on described crimping jig includes left marker location information and right marker location information, described according to the marker location information on described product to be measured with marker location information preset on described crimping jig, obtain the labelling on described product to be measured and the offset angle between labelling preset on described crimping jig includes:
According to the marker location information on described product to be measured, obtain the left labelling on described product to be measured and the first angle between right labelling place line and viewing field of camera transverse axis;
According to marker location information preset on described crimping jig, obtain the second angle between left labelling preset on described crimping jig and right labelling place line and viewing field of camera transverse axis;
Obtain described first angle and described second angle obtain between angle difference, using described angle difference as the labelling on described product to be measured and the offset angle between labelling preset on described crimping jig.
Alternatively, described according to marker location information preset on the new marker location information on described product to be measured and described crimping jig, calculate the labelling on described product to be measured and between labelling preset on described crimping jig the relative position deviation in X direction and y direction include:
According to the marker location information that the new marker location information on described product to be measured is preset with on described crimping jig, judge that whether the new left labelling on described product to be measured and new right labelling place line, the left labelling preset with on described crimping jig and right labelling place line be parallel;
If it is parallel, then according to the marker location information that the new marker location information on described product to be measured is preset with on described crimping jig, obtain the new left marker location information on described product to be measured and the first point midway information of new right marker location information place line, and the second point midway information of the preset left marker location information of labelling and right marker location information place line on described crimping jig, labelling on product to be measured according to described first point midway information and described second point midway acquisition of information and the relative position deviation in X direction and y direction between labelling preset on described crimping jig.
Alternatively, described according to described offset angle, and on described X direction and y direction, described product to be measured is carried out para-position and includes by relative position deviation:
According to what described offset angle controlled described product place to be measured, bit platform is rotated described offset angle along default center of rotation, first predeterminable range that bit platform is moved at described product place to be measured is controlled along corresponding X direction according to the relative position deviation in described X direction, and second predeterminable range that bit platform is moved at described product place to be measured is controlled along corresponding y direction according to the relative position deviation on described y direction, so that labelling on the described product to be measured labelling preset with on described crimping jig overlaps, described product to be measured is carried out para-position.
Additionally, for achieving the above object, present invention also offers the alignment device of a kind of product to be measured, including:
Position information acquisition module, for obtaining the marker location information on product to be measured and marker location information preset on crimping jig respectively by single or two cameras;
Position deviation acquisition module, for according to the marker location information on described product to be measured and marker location information preset on described crimping jig, obtain the labelling on described product to be measured and the offset angle between labelling preset on described crimping jig and the relative position deviation in X direction and y direction;
Para-position module, for according to described offset angle, and on described X direction and y direction, described product to be measured is carried out para-position by relative position deviation.
Alternatively, described position deviation acquisition module includes:
Offset angle acquiring unit, for according to the marker location information on described product to be measured and marker location information preset on described crimping jig, obtaining the labelling on described product to be measured and the offset angle between labelling preset on described crimping jig;
Location information acquiring unit, for calculating the new marker location information on described product to be measured according to described offset angle;
Position deviation acquiring unit, for according to marker location information preset on the new marker location information on described product to be measured and described crimping jig, calculate the labelling on described product to be measured and the relative position deviation in X direction and y direction between labelling preset on described crimping jig.
Alternatively, marker location information on described product to be measured includes left marker location information and right marker location information, marker location information preset on described crimping jig includes left marker location information and right marker location information, described offset angle acquiring unit is additionally operable to, according to the marker location information on described product to be measured, obtain the left labelling on described product to be measured and the first angle between right labelling place line and viewing field of camera transverse axis;According to marker location information preset on described crimping jig, obtain the second angle between left labelling preset on described crimping jig and right labelling place line and viewing field of camera transverse axis;Obtain described first angle and described second angle obtain between angle difference, using described angle difference as the labelling on described product to be measured and the offset angle between labelling preset on described crimping jig.
Alternatively, described position deviation acquiring unit is additionally operable to, according to the marker location information that the new marker location information on described product to be measured is preset with on described crimping jig, judge that whether the new left labelling on described product to be measured and new right labelling place line, the left labelling preset with on described crimping jig and right labelling place line be parallel;If it is parallel, then according to the marker location information that the new marker location information on described product to be measured is preset with on described crimping jig, obtain the new left marker location information on described product to be measured and the first point midway information of new right marker location information place line, and the second point midway information of the preset left marker location information of labelling and right marker location information place line on described crimping jig, labelling on product to be measured according to described first point midway information and described second point midway acquisition of information and the relative position deviation in X direction and y direction between labelling preset on described crimping jig.
Alternatively, described para-position module is additionally operable to, according to what described offset angle controlled described product place to be measured, bit platform is rotated described offset angle along default center of rotation, first predeterminable range that bit platform is moved at described product place to be measured is controlled along corresponding X direction according to the relative position deviation in described X direction, and second predeterminable range that bit platform is moved at described product place to be measured is controlled along corresponding y direction according to the relative position deviation on described y direction, so that labelling on the described product to be measured labelling preset with on described crimping jig overlaps, described product to be measured is carried out para-position.
The alignment method of the product to be measured that the embodiment of the present invention provides and device, the marker location information on product to be measured and marker location information preset on crimping jig is obtained respectively by single or two cameras, then the labelling on product to be measured and the offset angle between labelling preset on crimping jig is obtained according to the marker location information obtained, and the relative position deviation in X direction and y direction, product to be measured is carried out para-position.Make to achieve that use is single or two cameras obtain marker location information and product to be measured carries out para-position, reduce hardware cost and simplify debugging operations process, improve product to be measured is carried out automatic aligning efficiency and precision simultaneously.
Accompanying drawing explanation
Fig. 1 is the schematic flow sheet of the alignment method first embodiment of present invention product to be measured;
Fig. 2 is the cross section structure schematic diagram that product to be measured is carried out para-position by the present invention;
Fig. 3 be viewing field of camera of the present invention visual field coordinate system and between the platform coordinate system of bit platform angular deviation process structural representation;
Fig. 4 is the present invention structural representation to bit platform deflection angle error compensation;
Fig. 5 is the schematic flow sheet of alignment method second embodiment of present invention product to be measured;
Fig. 6 is that bit platform is rotated by the present invention along default center of rotation, the structural representation of the marker location information change on product to be measured;
Fig. 7 is the high-level schematic functional block diagram of the alignment device first embodiment of present invention product to be measured;
Fig. 8 is the high-level schematic functional block diagram of alignment device second embodiment of present invention product to be measured.
The realization of the object of the invention, functional characteristics and advantage will in conjunction with the embodiments, are described further with reference to accompanying drawing.
Detailed description of the invention
Should be appreciated that specific embodiment described herein is only in order to explain the present invention, is not intended to limit the present invention.
In describing the invention, it is to be understood that term " first ", " second " etc. only for descriptive purposes, and it is not intended that instruction or hint relative importance.In describing the invention, it is necessary to explanation, unless otherwise clearly defined and limited, term " being connected ", " connection " should be interpreted broadly, for instance, it is possible to it is fixing connection, it is also possible to be removably connect, or connect integratedly;Can be mechanically connected, it is also possible to be electrical connection;Can be joined directly together, it is also possible to be indirectly connected to by intermediary.For the ordinary skill in the art, it is possible to concrete condition understands above-mentioned term concrete meaning in the present invention.Additionally, it will be appreciated that, term " longitudinal direction ", " transverse direction ", " on ", D score, "front", "rear", "left", "right", " vertically ", " level ", " top ", " end ", " interior ", the orientation of the instruction such as " outward " or position relationship be based on orientation shown in the drawings or position relationship, it is for only for ease of the description present invention and simplifies description, rather than instruction or hint indication device or element must have specific orientation, with specific azimuth configuration and operation, be therefore not considered as limiting the invention.
As shown in Figure 1, it is shown that the alignment method first embodiment of a kind of product to be measured of the present invention.The alignment method of the product to be measured of this embodiment includes:
Step S10, obtain the marker location information on product to be measured and marker location information preset on crimping jig respectively by single or two cameras;
In the para-position scheme of product to be measured provided by the invention, the type of product to be measured can be configured according to actual needs, for instance, product to be measured can be touch screen product.When the electrical property of touch screen is tested, it is necessary to realize test instrunment and the electrical connection of touch screen product to be measured, accordingly, it would be desirable to product to be measured is carried out para-position.Electrical connection between test instrunment and product to be measured needs to use crimping jig, and crimping jig is fixing relative to product place to be measured after mounting to bit platform, can move up and down along to the Z axis of bit platform place coordinate system.Crimping jig can use probe, it is possible to use FPC (FlexiblePrintedCircuit, FPC), also known as flexible printed circuit board or flex circuit application.
It should be noted that, crimping jig is provided with labelling, mark position on crimping jig is completely the same with the mark position on product to be measured, and namely the mark position on crimping jig is consistent with the distance of the mark position on product to be measured to pin, mark size and shape.Position and the number of the labelling on crimping jig and the labelling on product to be measured can be arranged as the case may be and flexibly, alternatively, product to be measured each side arrange a labelling, and the left and right sides on crimping jig also respectively arranges a labelling.In order to improve aligning accuracy, the mark part on crimping jig and the mark part on product to be measured can use alternatively non-transparent material, and mark part near zone uses light transmissive material.
In the process that product to be measured is carried out para-position, hardware components except include for drive product to be measured to move or rotate to bit platform with for except crimping jig that test instrunment and test product are electrically connected, also need to use the camera for obtaining marker location information, the hardware such as light source for polishing, as shown in Figure 2.In the present embodiment, camera is arranged on above product to be measured and crimping jig, the labelling that can simultaneously view on product to be measured and crimping jig in camera fields of view need to be ensured, by collected by camera image is processed, the marker location information on product to be measured and crimping jig can be obtained respectively.This marker location information can be marked at pixel coordinate point on image (x, y).Light source is arranged on below camera, in order to improve aligning accuracy, the physical length in kind of light source should select the strip source of the maximum mark spacing that length is slightly longer than between two labellings of product to be measured, light source colour can determine according to actual product to be measured, it is ensured that the labelling on product to be measured and crimping jig clearly can show in viewing field of camera.
Specifically, when marker location information preset in the marker location information obtained by single camera on product to be measured and crimping jig, need to add a camera shifting axle, camera shifting axle should ensure that parallel with to the X-axis of bit platform place coordinate system when installing, the direction being driven two the labelling place lines in single camera left and right along product to be measured by preset shifting axle is moved, so that this single camera can get the marker location information on product to be measured and marker location information preset on crimping jig.When marker location information preset in the marker location information obtained by two cameras on product to be measured and crimping jig, the two camera installing space should meet camera it can be seen that labelling on corresponding product to be measured, and namely two viewing field of camera angles to ensure unanimously as far as possible.
Step S20, according to the marker location information on described product to be measured and marker location information preset on described crimping jig, obtain the labelling on described product to be measured and the offset angle between labelling preset on described crimping jig and the relative position deviation in X direction and y direction;
After marker location information preset in the above-mentioned marker location information acquired on product to be measured and crimping jig, the labelling on product to be measured and the offset angle between labelling preset on crimping jig and the relative position deviation in X direction and y direction is calculated according to the marker location information obtained.Specifically, the labelling on product to be measured and the drift angle between labelling preset on crimping jig are first calculated according to the marker location information on product to be measured and marker location information preset on crimping jig, as to the offset angle rotated needed for bit platform.This offset angle is for controlling along center of rotation, bit platform is rotated this offset angle so that labelling place line on the product to be measured labelling place line preset with on crimping jig is parallel.Then the new marker location information on product to be measured is calculated according to offset angle, the middle point coordinates of labelling place line new on product to be measured is calculated further according to the marker location information that marker location information new on product to be measured is preset with on described crimping jig, and the middle point coordinates of labelling place line preset on crimping jig is calculated according to marker location information preset on crimping jig, middle point coordinates according to both calculates the labelling on product to be measured and the relative position deviation in X direction and y direction between labelling preset on crimping jig, following example will be described in more detail.
It should be noted that, due to camera leading screw be not same system to bit platform, therefore the visual field coordinate system at camera place is likely to the platform coordinate system at bit platform place or there is deviation, produces error when angular deviation between the two can cause bit platform is moved.Such as, causing bit platform center of rotation grid deviation rotating calculating error, when carrying out motion compensation, this deviation is taken into account by needs.In order to improve aligning accuracy, before in the marker location information obtained on product to be measured and described crimping jig, preset marker location information carries out calculating accordingly, it is necessary to carry out error analysis process to camera with to the angle between bit platform.Specifically, carry out obtaining image with two cameras, product to be measured is provided with around each one be labeled as example, as shown in Figure 3, for the structural representation that angular deviation between visual field coordinate system and the platform coordinate system to bit platform of viewing field of camera processes, with visual field coordinate system for benchmark, need when there is angle between visual field coordinate system and platform coordinate system to be corrected.The labelling first passing through image shot by camera acquisition upper left the right of crimping jig obtains left labelling coordinate points Z0(Xz0, Yz0), right labelling coordinate points Z1(Xz1, Yz1), the vector of Z0 Z1 place line should be parallel to the X-axis of visual field coordinate system in theory, by left labelling coordinate points Z0, right labelling coordinate points Z1The two coordinate can calculate the angle theta=arctan [(Yz1-Yz0)/(Xz1-Xz0)] between vector and the X-axis of visual field coordinate system of Z0 Z1 place line, it is assumed that Z is left labelling coordinate points Z0To the distance of initial point, then left labelling coordinate points Z0Actual parameter for visual field coordinate system isYzz0=Z*sin (Φ-θ).Camera can be found out and to bit platform the two system motion axle angular deviation by correcting, camera or to bit platform synchronous translational, measurement markers point Y coordinate offsets, thus skew can calculate camera and to the angular deviation a=arctan [(Ym1-Ym0)/(Xm1-Xm0)] of kinematic axis between bit platform, existence due to a drift angle, have to through transfer algorithm to reduce bit errors between theoretical coordinate and the platform coordinates of motion, move especially for the platform initial stage, scope is relatively big, and the impact that offset error is brought is also big.
It addition, in order to improve aligning accuracy further, in addition it is also necessary to compensate process to bit platform deflection angle error, as shown in Figure 4, for the present invention structural representation to bit platform deflection angle error compensation.Specifically, in Fig. 4, XOY is para-position platform coordinate system, and XmOmYm is theoretical coordinate system, it is assumed that be (Omx, Omy) to bit platform initial point Om theoretical coordinate, and this initial point Om is the coordinate that design and installation is determined.To bit platform coordinates of motion point K1 (Xmk, Ymk), this is the K1 point coordinate relative to para-position platform coordinate system, now needs unified for K1 point to theoretical coordinate K2 (Xk, Yk).K1 (Xmk, Ymk) it is r for the angle of para-position platform coordinate, Om K1 vector length is K, r=arctan (Ymk/Xmk) can be obtained, K=sqrt (Xmk^2+Ymk^2), known para-position platform coordinate system and theoretical coordinate system angle are a, therefore dXmk=K*cos (r-a) can be obtained, dYmk=K*sin (r-a), adds Om (Omx, Omy) offset coordinates, K (Xk can be obtained, Yk), calculating process should be noted that the sign symbol of r and a, and the sign symbol of r and a is relevant with the definition direction of two coordinate systems.
In Fig. 4, para-position flattened disk parameter is converted the processing method to bit platform kinematic parameter and can is: if above-mentioned deflection angle a is sufficiently small, when motion compensation displacement is little, it is possible to need not convert.But when deflection angle a reaches 1 degree, when motion compensation displacement reaches 5mm, in order to improve the reliability of calculating, it is necessary to adopt conversion to process.Reversely conversion is known for dXmk, dYmk, need to obtain the situation of Xmk, Ymk, it is assumed that the drift angle that dXmk, dYmk are formed is w, then have Xmk=K*cos (w+a), Ymk=K*sin (w+a), Xmk and Ymk are namely actual in bit platform kinematic parameter.Certainly, it is necessary to the concrete value carrying out the set deflection angle of conversion process and motion compensation displacement can be configured according to actual needs.
Step S30, according to described offset angle, and on described X direction and y direction, described product to be measured is carried out para-position by relative position deviation.
The offset angle between labelling preset on the above-mentioned labelling obtained on product to be measured and crimping jig, and after the relative position deviation in X direction and y direction, what control product place to be measured rotates this offset angle to bit platform along center of rotation, the labelling place line making the labelling place line on product to be measured preset with on crimping jig is parallel, and control bit platform drives product to be measured mobile corresponding position in X direction, and/or on y direction, move corresponding relative position deviation, labelling on product to be measured and labelling preset on crimping jig are overlapped, complete this product to be measured is carried out para-position, to carry out next step test job.This X direction and y direction are the X-axis corresponding to para-position platform coordinate system difference and Y-axis set up.
The present embodiment can be applicable to the automatic optics inspection (AutomaticOpticInspection based on capacitive touch screen clear mark, AOI) alignment system, can according to the marker location information on the Image Acquisition touch screen product of collected by camera and marker location information preset on crimping jig, calculate the labelling on touch screen product and deviation in angle between labelling, X-direction and in Y direction on crimping jig, and the system that is supplied to carries out automatic aligning, solve manual and that tool is slow to bit rate, precision is low problem.One camera can be used to add the mode of camera shifting axle, relative to other four orders AOI automatic decimal alignment systems, system constructing is simple, it is easy to mechanical engineering personnel design, install, debugging operations simple, being used as double camera and gather image, save 2 or 3 set camera, camera lens, light sources, hardware cost is substantially reduced.
The embodiment of the present invention obtains the marker location information on product to be measured and marker location information preset on crimping jig respectively by single or two cameras, then the labelling on product to be measured and the offset angle between labelling preset on crimping jig is obtained according to the marker location information obtained, and the relative position deviation in X direction and y direction, product to be measured is carried out para-position.Make to achieve that use is single or two cameras obtain marker location information and product to be measured is carried out para-position, para-position does not need manual operation, automaticity is high, reduce hardware cost and simplify debugging operations process, simultaneously relative to other by tool or visual Manual-alignment, improve product to be measured is carried out automatic aligning efficiency and precision.
Further, as it is shown in figure 5, based on the alignment method first embodiment of above-mentioned product to be measured, it is proposed that alignment method second embodiment of present invention product to be measured, in this embodiment, above-mentioned steps S20 comprises the steps that
Step S21, according to the marker location information on described product to be measured and marker location information preset on described crimping jig, obtain the labelling on described product to be measured and the offset angle between labelling preset on described crimping jig;
In the present embodiment, after marker location information preset in the marker location information obtained on product to be measured and crimping jig, the angle 1 between labelling place line and the viewing field of camera transverse axis on product to be measured is calculated according to the marker location information on product to be measured, and calculate on crimping jig the angle 2 between preset labelling place line and viewing field of camera transverse axis according to marker location information preset on crimping jig, compare by angle 1 and angle 2 being carried out work difference, obtain the labelling on product to be measured and the drift angle between labelling preset on crimping jig, as the labelling on product to be measured and the offset angle between labelling preset on crimping jig.
Step S22, the new marker location information calculated according to described offset angle on described product to be measured;
In the present embodiment, in advance controlling bit platform respectively to the right, the direction such as downward, left-handed, dextrorotation is moved, and after moving into place, obtain labelling initial point, move right after right labelling point, move down after lower labelling point, left-handed after hook marker point, five mark positions such as slice marker point after dextrorotation.By the displacement of bit platform and camera are shot obtain mobile before and mobile after be marked on image location of pixels poor, calculate the image pixel positions of labelling poor and to the ratio between bit platform displacement, as the ratio of the physical distance of movement.Such that it is able to by mark position in the angle rotated and image, calculate the position coordinates to bit platform center of rotation, using calculated center of rotation as default center of rotation.
After being compensated angle, calculate the new marker location information on product to be measured according to this offset angle.Specifically, carry out obtaining image with two cameras, product to be measured is provided with around each one be labeled as example and be described in detail, first carry out coordinate definition, it is assumed that to be positioned at the camera C on the left side0Position light shaft core position is that zero O sets up two-dimensional direct angle coordinate system, and on crimping jig, the coordinate of left side labelling is F0(Xf0, Yf0), on product to be measured, the coordinate of left side labelling is T0(Xt0, Yt0), light axle center, the camera C1 position position coordinates being positioned at the right is O', and on crimping jig, the coordinate of right indicia is F1(Xf1, Yf1), on product to be measured, the coordinate of right indicia is T1(Xt1, Yt1), with the O O' X-axis being coordinate system, at a distance of D between zero O and coordinate O', on crimping jig, the vector of left side labelling and right indicia place line is FM [(Xf0, Yf0), (D+Xf1, Yf1)], on product to be measured, the vector of left side labelling and right indicia place line is TM [(Xt0, Yt0), (D+Xt1, Yt1)].As shown in Figure 6, definition vector TM center of rotation coordinate S (Xs, Ys), and calculate T respectively0With S line, T1With the S line angle for X-axis, center of rotation S (Xs, Ys) coordinate can by above-mentioned to bit platform original coordinates and mobile after coordinate calculate.Fig. 6 can obtain, T0With S line angle RT0=arctan [(Ys-Yt0)/(Xs-Xt0)], T for X-axis1With the S line angle RT1=arctan [(Ys-Yt1)/(Xs-Xt1d)] for X-axis, it is noted that Xt1d now should be plus Xt1 coordinate later for D.
Then carrying out the calculating of new marker location information (i.e. new coordinate) on product to be measured, in Fig. 6, the length L of vector T0 TR0 can be expressed as: L=2*L(S-T0)* sin (DR/2), L(S-T0)=sqrt [(Xs-Xt0) ^2+ (Ys-Yt0) ^2], vector T0 TR0 can be expressed as the angle of X-axis: RM=pi/2-RT0-DR/2, therefore, dX and dY is respectively as follows: dX=L*cosRM, dY=L*sinRM, it is hereby achieved that TR0 coordinate, after namely rotating, on product to be measured, the coordinate of new left labelling is (Xt0+ dX, Yt0+ dY), in like manner, it is possible to obtain TR1 coordinate (coordinate of new right labelling), note the sign symbol of dX and dY.
Step S23, according to marker location information preset on the new marker location information on described product to be measured and described crimping jig, calculate the labelling on described product to be measured and the relative position deviation in X direction and y direction between labelling preset on described crimping jig.
After calculating the new marker location information obtaining on product to be measured, the middle point coordinates A of labelling place line new on product to be measured is calculated according to marker location information new on product to be measured, and the middle point coordinates B according to labelling place line preset on marker location information crimping jig preset on crimping jig, then deviation between point coordinates A and X-axis and the Y-axis of middle point coordinates B in calculating respectively, as the labelling on product to be measured and the relative position deviation in X direction and y direction between labelling preset on crimping jig.
The present embodiment obtains the offset angle on product to be measured and crimping jig between labelling by the marker location information on product to be measured and marker location information preset on crimping jig, then according to this offset angle, obtain new marker location information on product to be measured to calculate on product to be measured and the relative position deviation in X direction and y direction between labelling on crimping jig, to control bit platform is moved into row para-position based on this position deviation.Solve manual and that tool is slow to bit rate, precision is low problem, improve product to be measured is carried out automatic aligning efficiency and precision.
Further, alignment method the second embodiment based on above-mentioned product to be measured, propose alignment method the 3rd embodiment of present invention product to be measured, in this embodiment, above-mentioned steps S21 comprises the steps that according to the marker location information on described product to be measured, obtains the left labelling on described product to be measured and the first angle between right labelling place line and viewing field of camera transverse axis;
According to marker location information preset on described crimping jig, obtain the second angle between left labelling preset on described crimping jig and right labelling place line and viewing field of camera transverse axis;
Obtain described first angle and described second angle obtain between angle difference, using described angle difference as the labelling on described product to be measured and the offset angle between labelling preset on described crimping jig.
In the present embodiment, obtain the labelling on product to be measured and the offset angle DR between labelling preset on crimping jig, carry out obtaining image with two cameras, product to be measured is provided with around each one be labeled as example, marker location information on product to be measured includes left marker location information and right marker location information, and marker location information preset on crimping jig includes left marker location information and right marker location information.Specifically, advanced row-coordinate definition, it is assumed that to be positioned at the camera C on the left side0Position light shaft core position is that zero O sets up two-dimensional direct angle coordinate system, and on crimping jig, the coordinate of left side labelling is F0(Xf0, Yf0), on product to be measured, the coordinate of left side labelling is T0(Xt0, Yt0), light axle center, the camera C1 position position coordinates being positioned at the right is O', and on crimping jig, the coordinate of right indicia is F1(Xf1, Yf1), on product to be measured, the coordinate of right indicia is T1(Xt1, Yt1), with the O O' X-axis being coordinate system, at a distance of D between zero O and coordinate O', on crimping jig, the vector of left side labelling and right indicia place line is FM [(Xf0, Yf0), (D+Xf1, Yf1)], on product to be measured, the vector of left side labelling and right indicia place line is TM [(Xt0, Yt0), (D+Xt1, Yt1)]。
Then, according to the marker location information on product to be measured, calculate the left labelling on product to be measured and the first angle R_T between right labelling place line and viewing field of camera transverse axis, namely vector TM and X-axis deflection angle R_T is calculated, by tanR_T=(Yt1-Yt0)/(Xt1-Xt0+D), R_T=arctan [(Yt1-Yt0)/(Xt1-Xt0+D)] can be obtained.According to marker location information preset on crimping jig, calculate the second angle R_F between preset left labelling and right labelling place line and viewing field of camera transverse axis on crimping jig, namely vector F M and X-axis deflection angle R_F is calculated, by tanR_F=(Yf1-Yf0)/(Xf1-Xf0+D), R_F=arctan [(Yf1-Yf0)/(Xf1-Xf0+D)] can be obtained.Calculate the angle difference between the first angle R_T and the second angle R_F acquisition again, using angle difference as the labelling on product to be measured and the offset angle between labelling preset on crimping jig, i.e. required offset angle DR=R_T-R_F.
The present embodiment is according to the marker location information on product to be measured and crimping jig, calculate the first angle between left and right labelling place line and viewing field of camera transverse axis on product to be measured and the second angle between place, left and right line preset on crimping jig and viewing field of camera transverse axis respectively;Angle difference between first angle and the second angle being obtained is as offset angle, to control bit platform is rotated based on offset angle.Achieve that use is single or two cameras obtain marker location information and angle is accurately calculated, improve product to be measured is carried out automatic aligning efficiency and precision.
Further, alignment method the 3rd embodiment based on above-mentioned product to be measured, propose alignment method the 4th embodiment of present invention product to be measured, in this embodiment, above-mentioned steps S23 comprises the steps that the marker location information preset with on described crimping jig according to the new marker location information on described product to be measured, judge that whether the new left labelling on described product to be measured and new right labelling place line, the left labelling preset with on described crimping jig and right labelling place line be parallel;
If it is parallel, then according to the marker location information that the new marker location information on described product to be measured is preset with on described crimping jig, obtain the new left marker location information on described product to be measured and the first point midway information of new right marker location information place line, and the second point midway information of the preset left marker location information of labelling and right marker location information place line on described crimping jig, labelling on product to be measured according to described first point midway information and described second point midway acquisition of information and the relative position deviation in X direction and y direction between labelling preset on described crimping jig.
In the present embodiment, after the above-mentioned new marker location information calculated according to offset angle on product to be measured, can new marker location information on the root product to be measured marker location information preset with on crimping jig, judge that whether the new left labelling on product to be measured and new right labelling place line, the left labelling preset with on crimping jig and right labelling place line be parallel.Specifically, according to above-mentioned with two cameras carry out obtain image, product to be measured is provided with around each one be labeled as the coordinate system that example is defined, for making vector TR parallel with vector F M, obtain T new on product to be measuredR0(XR0, YR0) and TR1(XR1, YR1) after coordinate, vector F M and TR and X-axis deflection angle R_F and R_TR is calculated respectively: by tanR_F=(Yf1-Yf0)/(Xf1-Xf0+D) according to formula, tanR_TR=(Yt1-Yt0)/(Xt1-Xt0+D), R_F=arctan [(Yf1-Yf0)/(Xf1-Xf0+D)] can be obtained, R_TR=arctan [(Yt1-Yt0)/(Xt1-Xt0+D)], new offset angle DRR=R_TR-R_F.If new offset angle DRR is zero, namely R_TR should be equal with R_F, then labelling place, the left and right line that labelling place, the new left and right line on product to be measured is preset with on crimping jig is parallel, otherwise, not parallel.If not parallel, then recalculate offset angle.If it is parallel, then according to the new marker location information on product to be measured, calculate the new left marker location information (Xtr0 on product to be measured, and new right marker location information (Xtr1d Ytr0), Ytr1) the first point midway information (Xmtr of place line, Ymtr) it is: Xmtr=(Xtr0+Xtr1d)/2, Ymtr=(Ytr0+Ytr1)/2.According to marker location information preset on crimping jig, calculate the left marker location information (Xf0 of labelling preset on crimping jig, and right marker location information (Xf1d Yf0), Yf1) the second point midway information (Xmfm of place line, Ymfm) it is: Xmfm=(Xf0+Xf1d)/2, Ymfm=(Yf0+Yf1)/2.Then according to the first point midway information (Xmtr, Ymtr) with the second point midway information (Xmfm, Ymfm), calculate the labelling on product to be measured and the relative position deviation Dy on X direction relative position deviation Dx and y direction between labelling preset on crimping jig, i.e. Dx=| Xmtr-Xmfm |, Dy=| Ymtr-Ymfm |, using Dx, Dy as the compensating parameter that bit platform is moved, to control bit platform is moved accordingly.
If labelling place, the new left and right line on the present embodiment product to be measured is parallel with labelling place, the left and right line on crimping jig, then according to the marker location information that the new marker location information on product to be measured is preset with on crimping jig, calculate the first point midway information of marker location information place, new left and right line on product to be measured, second point midway information of marker location information place, labelling left and right line preset on crimping jig, calculate on product to be measured further according to the first point midway information and the second point midway information and the relative position deviation in X direction and y direction between labelling preset on crimping jig.Achieve that use is single or two cameras obtain marker location information and product to be measured is carried out para-position, reduce hardware cost and simplify debugging operations process, simultaneously relative to other by tool or visual Manual-alignment, improve product to be measured is carried out automatic aligning efficiency and precision.
Further, based on any embodiment in alignment method first to fourth embodiment of above-mentioned product to be measured, propose alignment method the 5th embodiment of present invention product to be measured, in this embodiment, above-mentioned steps S30 comprises the steps that, according to what described offset angle controlled described product place to be measured, along default center of rotation, bit platform is rotated described offset angle, first predeterminable range that bit platform is moved at described product place to be measured is controlled along corresponding X direction according to the relative position deviation in described X direction, and second predeterminable range that bit platform is moved at described product place to be measured is controlled along corresponding y direction according to the relative position deviation on described y direction, so that labelling on the described product to be measured labelling preset with on described crimping jig overlaps, described product to be measured is carried out para-position.
In the present embodiment, the essence that product to be measured carries out para-position is to be overlapped by the labelling that the labelling on product to be measured is preset with on crimping jig, namely makes labelling place, the left and right line coincident that labelling place, the left and right line on product to be measured is preset with on crimping jig.After the offset angle between labelling preset on the above-mentioned labelling obtained on product to be measured and crimping jig, what control product place to be measured rotates this offset angle to bit platform along center of rotation so that labelling place line on the product to be measured labelling place line preset with on crimping jig is parallel.And on the labelling obtained on product to be measured and crimping jig between preset labelling after the relative position deviation in X direction and y direction, control first predeterminable range that bit platform is moved at product place to be measured along corresponding X direction according to the relative position deviation Dx in X direction, this first predeterminable range is Dx;And second predeterminable range that bit platform is moved at product place to be measured is controlled along corresponding y direction according to the relative position deviation Dy on y direction, this second predeterminable range is Dy, so that labelling on the product to be measured labelling preset with on crimping jig overlaps, complete product to be measured is carried out para-position.
The present embodiment controls product place to be measured according to offset angle and along center of rotation, bit platform is rotated this offset angle, and control product place to be measured bit platform is moved along corresponding X direction and/or y direction respectively according to the relative position deviation on transverse axis and y direction, so that labelling on the described product to be measured labelling preset with on described crimping jig overlaps, para-position does not need manual operation, automaticity is high, relative to other by tool or visual Manual-alignment, improve product to be measured is carried out automatic aligning efficiency and precision.
Accordingly, as shown in Figure 7, it is proposed to the alignment device first embodiment of a kind of product to be measured of the present invention.The alignment device of the product to be measured of this embodiment includes:
Position information acquisition module 100, for obtaining the marker location information on product to be measured and marker location information preset on crimping jig respectively by single or two cameras;
In the para-position scheme of product to be measured provided by the invention, the type of product to be measured can be configured according to actual needs, for instance, product to be measured can be touch screen product.When the electrical property of touch screen is tested, it is necessary to realize test instrunment and the electrical connection of touch screen product to be measured, accordingly, it would be desirable to product to be measured is carried out para-position.Electrical connection between test instrunment and product to be measured needs to use crimping jig, and crimping jig is fixing relative to product place to be measured after mounting to bit platform, can move up and down along to the Z axis of bit platform place coordinate system.Crimping jig can use probe, it is possible to use FPC (FlexiblePrintedCircuit, FPC), also known as flexible printed circuit board or flex circuit application.
It should be noted that, crimping jig is provided with labelling, mark position on crimping jig is completely the same with the mark position on product to be measured, and namely the mark position on crimping jig is consistent with the distance of the mark position on product to be measured to pin, mark size and shape.Position and the number of the labelling on crimping jig and the labelling on product to be measured can be arranged as the case may be and flexibly, alternatively, product to be measured each side arrange a labelling, and the left and right sides on crimping jig also respectively arranges a labelling.In order to improve aligning accuracy, the mark part on crimping jig and the mark part on product to be measured can use alternatively non-transparent material, and mark part near zone uses light transmissive material.
In the process that product to be measured is carried out para-position, hardware components except include for drive product to be measured to move or rotate to bit platform with for except crimping jig that test instrunment and test product are electrically connected, also need to use the camera for obtaining marker location information, the hardware such as light source for polishing, as shown in Figure 2.In the present embodiment, camera is arranged on above product to be measured and crimping jig, the labelling that can simultaneously view on product to be measured and crimping jig in camera fields of view need to be ensured, position information acquisition module 100 by collected by camera image is processed, can obtain the marker location information on product to be measured and crimping jig respectively.This marker location information can be marked at pixel coordinate point on image (x, y).Light source is arranged on below camera, in order to improve aligning accuracy, the physical length in kind of light source should select the strip source of the maximum mark spacing that length is slightly longer than between two labellings of product to be measured, light source colour can determine according to actual product to be measured, it is ensured that the labelling on product to be measured and crimping jig clearly can show in viewing field of camera.
Specifically, when being obtained the marker location information on product to be measured and marker location information preset on crimping jig by single camera when position information acquisition module 100, need to add a camera shifting axle, camera shifting axle should ensure that parallel with to the X-axis of bit platform place coordinate system when installing, the direction being driven two the labelling place lines in single camera left and right along product to be measured by preset shifting axle is moved, so that this single camera can get the marker location information on product to be measured and marker location information preset on crimping jig.When position information acquisition module 100 obtains the marker location information on product to be measured and marker location information preset on crimping jig by two cameras, the two camera installing space should meet camera it can be seen that labelling on corresponding product to be measured, and namely two viewing field of camera angles to ensure unanimously as far as possible.
Position deviation acquisition module 200, for according to the marker location information on described product to be measured and marker location information preset on described crimping jig, obtain the labelling on described product to be measured and the offset angle between labelling preset on described crimping jig and the relative position deviation in X direction and y direction;
After marker location information preset in the above-mentioned marker location information acquired on product to be measured and crimping jig, position deviation acquisition module 200 calculates the labelling on product to be measured and the offset angle between labelling preset on crimping jig and the relative position deviation in X direction and y direction according to the marker location information obtained.Specifically, the labelling on product to be measured and the drift angle between labelling preset on crimping jig are first calculated according to the marker location information on product to be measured and marker location information preset on crimping jig, as to the offset angle rotated needed for bit platform.This offset angle is for controlling along center of rotation, bit platform is rotated this offset angle so that labelling place line on the product to be measured labelling place line preset with on crimping jig is parallel.Then compensate for the new marker location information on angle calculation product to be measured, the middle point coordinates of labelling place line new on product to be measured is calculated further according to marker location information new on product to be measured, and the middle point coordinates of labelling place line preset on crimping jig is calculated according to marker location information preset on crimping jig, middle point coordinates according to both calculates the labelling on product to be measured and the relative position deviation in X direction and y direction between labelling preset on crimping jig, and following example will be described in more detail.
It should be noted that, due to camera leading screw be not same system to bit platform, therefore the visual field coordinate system at camera place is likely to the platform coordinate system at bit platform place or there is deviation, produces error when angular deviation between the two can cause bit platform is moved.Such as, causing bit platform center of rotation grid deviation rotating calculating error, when carrying out motion compensation, this deviation is taken into account by needs.In order to improve aligning accuracy, before in the marker location information obtained on product to be measured and described crimping jig, preset marker location information carries out calculating accordingly, it is necessary to carry out error analysis process to camera with to the angle between bit platform.Specifically, carry out obtaining image with two cameras, product to be measured is provided with around each one be labeled as example, as shown in Figure 3, for the structural representation that angular deviation between visual field coordinate system and the platform coordinate system to bit platform of viewing field of camera processes, with visual field coordinate system for benchmark, need when there is angle between visual field coordinate system and platform coordinate system to be corrected.The labelling first passing through image shot by camera acquisition upper left the right of crimping jig obtains left labelling coordinate points Z0(Xz0, Yz0), right labelling coordinate points Z1(Xz1, Yz1), the vector of Z0 Z1 place line should be parallel to the X-axis of visual field coordinate system in theory, by left labelling coordinate points Z0, right labelling coordinate points Z1The two coordinate can calculate the angle theta=arctan [(Yz1-Yz0)/(Xz1-Xz0)] between vector and the X-axis of visual field coordinate system of Z0 Z1 place line, it is assumed that Z is left labelling coordinate points Z0To the distance of initial point, then left labelling coordinate points Z0Actual parameter for visual field coordinate system isCamera can be found out and to bit platform the two system motion axle angular deviation by correcting, camera or to bit platform synchronous translational, measurement markers point Y coordinate offsets, thus skew can calculate camera and to the angular deviation a=arctan [(Ym1-Ym0)/(Xm1-Xm0)] of kinematic axis between bit platform, existence due to a drift angle, have to through transfer algorithm to reduce bit errors between theoretical coordinate and the platform coordinates of motion, move especially for the platform initial stage, scope is relatively big, and the impact that offset error is brought is also big.
It addition, in order to improve aligning accuracy further, in addition it is also necessary to compensate process to bit platform deflection angle error, as shown in Figure 4, for the present invention structural representation to bit platform deflection angle error compensation.Specifically, in Fig. 4, XOY is para-position platform coordinate system, and XmOmYm is theoretical coordinate system, it is assumed that be (Omx, Omy) to bit platform initial point Om theoretical coordinate, and this initial point Om is the coordinate that design and installation is determined.To bit platform coordinates of motion point K1 (Xmk, Ymk), this is the K1 point coordinate relative to para-position platform coordinate system, now needs unified for K1 point to theoretical coordinate K2 (Xk, Yk).K1 (Xmk, Ymk) it is r for the angle of para-position platform coordinate, Om K1 vector length is K, r=arctan (Ymk/Xmk) can be obtained, K=sqrt (Xmk^2+Ymk^2), known para-position platform coordinate system and theoretical coordinate system angle are a, therefore dXmk=K*cos (r-a) can be obtained, dYmk=K*sin (r-a), adds Om (Omx, Omy) offset coordinates, K (Xk can be obtained, Yk), calculating process should be noted that the sign symbol of r and a, and the sign symbol of r and a is relevant with the definition direction of two coordinate systems.
In Fig. 4, para-position flattened disk parameter is converted the processing method to bit platform kinematic parameter and can is: if above-mentioned deflection angle a is sufficiently small, when motion compensation displacement is little, it is possible to need not convert.But when deflection angle a reaches 1 degree, when motion compensation displacement reaches 5mm, in order to improve the reliability of calculating, it is necessary to adopt conversion to process.Reversely conversion is known for dXmk, dYmk, need to obtain the situation of Xmk, Ymk, it is assumed that the drift angle that dXmk, dYmk are formed is w, then have Xmk=K*cos (w+a), Ymk=K*sin (w+a), Xmk and Ymk are namely actual in bit platform kinematic parameter.Certainly, it is necessary to the concrete value carrying out the set deflection angle of conversion process and motion compensation displacement can be configured according to actual needs.
Para-position module 300, for according to described offset angle, and on described X direction and y direction, described product to be measured is carried out para-position by relative position deviation.
The offset angle between labelling preset on the above-mentioned labelling obtained on product to be measured and crimping jig, and after the relative position deviation in X direction and y direction, what para-position module 300 controlled product place to be measured rotates this offset angle to bit platform along center of rotation, the labelling place line making the labelling place line on product to be measured preset with on crimping jig is parallel, and para-position module 300 controls bit platform drives product to be measured mobile corresponding position in X direction, and/or on y direction, move corresponding relative position deviation, labelling on product to be measured and labelling preset on crimping jig are overlapped, complete this product to be measured is carried out para-position, to carry out next step test job.This X direction and y direction are the X-axis corresponding to para-position platform coordinate system difference and Y-axis set up.
The present embodiment can be applicable to the automatic optics inspection (AutomaticOpticInspection based on capacitive touch screen clear mark, AOI) alignment system, can according to the marker location information on the Image Acquisition touch screen product of collected by camera and marker location information preset on crimping jig, calculate the labelling on touch screen product and deviation in angle between labelling, X-direction and in Y direction on crimping jig, and the system that is supplied to carries out automatic aligning, solve manual and that tool is slow to bit rate, precision is low problem.One camera can be used to add the mode of camera shifting axle, relative to other four orders AOI automatic decimal alignment systems, system constructing is simple, it is easy to mechanical engineering personnel design, install, debugging operations simple, being used as double camera and gather image, save 2 or 3 set camera, camera lens, light sources, hardware cost is substantially reduced.
The embodiment of the present invention obtains the marker location information on product to be measured and marker location information preset on crimping jig respectively by single or two cameras, then the labelling on product to be measured and the offset angle between labelling preset on crimping jig is obtained according to the marker location information obtained, and the relative position deviation in X direction and y direction, product to be measured is carried out para-position.Make to achieve that use is single or two cameras obtain marker location information and product to be measured is carried out para-position, para-position does not need manual operation, automaticity is high, reduce hardware cost and simplify debugging operations process, simultaneously relative to other by tool or visual Manual-alignment, improve product to be measured is carried out automatic aligning efficiency and precision.
Further, as shown in Figure 8, based on the alignment device first embodiment of above-mentioned product to be measured, it is proposed that alignment device second embodiment of present invention product to be measured, in this embodiment, above-mentioned position deviation acquisition module 200 includes:
Offset angle acquiring unit 210, for according to the marker location information on described product to be measured and marker location information preset on described crimping jig, obtaining the labelling on described product to be measured and the offset angle between labelling preset on described crimping jig;
In the present embodiment, after marker location information preset in the marker location information obtained on product to be measured and crimping jig, offset angle acquiring unit 210 calculates the angle 1 between labelling place line and the viewing field of camera transverse axis on product to be measured according to the marker location information on product to be measured, and calculate on crimping jig the angle 2 between preset labelling place line and viewing field of camera transverse axis according to marker location information preset on crimping jig, compare by angle 1 and angle 2 being carried out work difference, obtain the labelling on product to be measured and the drift angle between labelling preset on crimping jig, as the labelling on product to be measured and the offset angle between labelling preset on crimping jig.
Location information acquiring unit 220, for calculating the new marker location information on described product to be measured according to described offset angle;
In the present embodiment, in advance controlling bit platform respectively to the right, the direction such as downward, left-handed, dextrorotation is moved, and after moving into place, obtain labelling initial point, move right after right labelling point, move down after lower labelling point, left-handed after hook marker point, five mark positions such as slice marker point after dextrorotation.By the displacement of bit platform and camera are shot obtain mobile before and mobile after be marked on image location of pixels poor, calculate the image pixel positions of labelling poor and to the ratio between bit platform displacement, as the ratio of the physical distance of movement.Such that it is able to by mark position in the angle rotated and image, calculate the position coordinates to bit platform center of rotation, using calculated center of rotation as default center of rotation.
After being compensated angle, location information acquiring unit 220 calculate the new marker location information on product to be measured according to this offset angle.Specifically, carry out obtaining image with two cameras, product to be measured is provided with around each one be labeled as example and be described in detail, first carry out coordinate definition, it is assumed that to be positioned at the camera C on the left side0Position light shaft core position is that zero O sets up two-dimensional direct angle coordinate system, and on crimping jig, the coordinate of left side labelling is F0(Xf0, Yf0), on product to be measured, the coordinate of left side labelling is T0(Xt0, Yt0), light axle center, the camera C1 position position coordinates being positioned at the right is O', and on crimping jig, the coordinate of right indicia is F1(Xf1, Yf1), on product to be measured, the coordinate of right indicia is T1(Xt1, Yt1), with the O O' X-axis being coordinate system, at a distance of D between zero O and coordinate O', on crimping jig, the vector of left side labelling and right indicia place line is FM [(Xf0, Yf0), (D+Xf1, Yf1)], on product to be measured, the vector of left side labelling and right indicia place line is TM [(Xt0, Yt0), (D+Xt1, Yt1)].As shown in Figure 6, definition vector TM center of rotation coordinate S (Xs, Ys), and calculate T respectively0With S line, T1With the S line angle for X-axis, center of rotation S (Xs, Ys) coordinate can by above-mentioned to bit platform original coordinates and mobile after coordinate calculate.Fig. 6 can obtain, T0With S line angle RT0=arctan [(Ys-Yt0)/(Xs-Xt0)], T for X-axis1With the S line angle RT1=arctan [(Ys-Yt1)/(Xs-Xt1d)] for X-axis, it is noted that Xt1d now should be plus Xt1 coordinate later for D.
Then carrying out the calculating of new marker location information (i.e. new coordinate) on product to be measured, in Fig. 6, the length L of vector T0 TR0 can be expressed as: L=2*L(S-T0)* sin (DR/2), L(S-T0)=sqrt [(Xs-Xt0) ^2+ (Ys-Yt0) ^2], vector T0 TR0 can be expressed as the angle of X-axis: RM=pi/2-RT0-DR/2, therefore, dX and dY is respectively as follows: dX=L*cosRM, dY=L*sinRM, it is hereby achieved that TR0 coordinate, after namely rotating, on product to be measured, the coordinate of new left labelling is (Xt0+ dX, Yt0+ dY), in like manner, it is possible to obtain TR1 coordinate (coordinate of new right labelling), note the sign symbol of dX and dY.
Position deviation acquiring unit 230, for according to marker location information preset on the new marker location information on described product to be measured and described crimping jig, calculate the labelling on described product to be measured and the relative position deviation in X direction and y direction between labelling preset on described crimping jig.
After calculating the new marker location information obtaining on product to be measured, position deviation acquiring unit 230 calculates the middle point coordinates A of labelling place line new on product to be measured according to marker location information new on product to be measured, and the middle point coordinates B according to labelling place line preset on marker location information crimping jig preset on crimping jig, then deviation between point coordinates A and X-axis and the Y-axis of middle point coordinates B in calculating respectively, as the labelling on product to be measured and the relative position deviation in X direction and y direction between labelling preset on crimping jig.
The present embodiment obtains the offset angle on product to be measured and crimping jig between labelling by the marker location information on product to be measured and marker location information preset on crimping jig, then according to this offset angle, obtain new marker location information on product to be measured to calculate on product to be measured and the relative position deviation in X direction and y direction between labelling on crimping jig, to control bit platform is moved into row para-position based on this position deviation.Solve manual and that tool is slow to bit rate, precision is low problem, improve product to be measured is carried out automatic aligning efficiency and precision.
Further, alignment device the second embodiment based on above-mentioned product to be measured, propose alignment device the 3rd embodiment of present invention product to be measured, in this embodiment, above-mentioned offset angle acquiring unit 210 is additionally operable to, according to the marker location information on described product to be measured, obtain the left labelling on described product to be measured and the first angle between right labelling place line and viewing field of camera transverse axis;According to marker location information preset on described crimping jig, obtain the second angle between left labelling preset on described crimping jig and right labelling place line and viewing field of camera transverse axis;Obtain described first angle and described second angle obtain between angle difference, using described angle difference as the labelling on described product to be measured and the offset angle between labelling preset on described crimping jig.
In the present embodiment, offset angle acquiring unit 210 obtains the labelling on product to be measured and the offset angle DR between labelling preset on crimping jig, carry out obtaining image with two cameras, product to be measured is provided with around each one be labeled as example, marker location information on product to be measured includes left marker location information and right marker location information, and marker location information preset on crimping jig includes left marker location information and right marker location information.Specifically, advanced row-coordinate definition, it is assumed that to be positioned at the camera C on the left side0Position light shaft core position is that zero O sets up two-dimensional direct angle coordinate system, and on crimping jig, the coordinate of left side labelling is F0(Xf0, Yf0), on product to be measured, the coordinate of left side labelling is T0(Xt0, Yt0), light axle center, the camera C1 position position coordinates being positioned at the right is O', and on crimping jig, the coordinate of right indicia is F1(Xf1, Yf1), on product to be measured, the coordinate of right indicia is T1(Xt1, Yt1), with the O-O' X-axis being coordinate system, at a distance of D between zero O and coordinate O', on crimping jig, the vector of left side labelling and right indicia place line is FM [(Xf0, Yf0), (D+Xf1, Yf1)], on product to be measured, the vector of left side labelling and right indicia place line is TM [(Xt0, Yt0), (D+Xt1, Yt1)]。
Then, offset angle acquiring unit 210 is according to the marker location information on product to be measured, calculate the left labelling on product to be measured and the first angle R_T between right labelling place line and viewing field of camera transverse axis, namely vector TM and X-axis deflection angle R_T is calculated, by tanR_T=(Yt1-Yt0)/(Xt1-Xt0+D), R_T=arctan [(Yt1-Yt0)/(Xt1-Xt0+D)] can be obtained.According to marker location information preset on crimping jig, calculate the second angle R_F between preset left labelling and right labelling place line and viewing field of camera transverse axis on crimping jig, namely vector F M and X-axis deflection angle R_F is calculated, by tanR_F=(Yf1-Yf0)/(Xf1-Xf0+D), R_F=arctan [(Yf1-Yf0)/(Xf1-Xf0+D)] can be obtained.Calculate the angle difference between the first angle R_T and the second angle R_F acquisition again, using angle difference as the labelling on product to be measured and the offset angle between labelling preset on crimping jig, i.e. required offset angle DR=R_T-R_F.
The present embodiment is according to the marker location information on product to be measured and crimping jig, calculate the first angle between left and right labelling place line and viewing field of camera transverse axis on product to be measured and the second angle between place, left and right line preset on crimping jig and viewing field of camera transverse axis respectively;Angle difference between first angle and the second angle being obtained is as offset angle, to control bit platform is rotated based on offset angle.Achieve that use is single or two cameras obtain marker location information and angle is accurately calculated, improve product to be measured is carried out automatic aligning efficiency and precision.
Further, alignment device the 3rd embodiment based on above-mentioned product to be measured, propose alignment device the 4th embodiment of present invention product to be measured, in this embodiment, above-mentioned position deviation acquiring unit 230 is additionally operable to, according to the marker location information that the new marker location information on described product to be measured is preset with on described crimping jig, judge that whether the new left labelling on described product to be measured and new right labelling place line, the left labelling preset with on described crimping jig and right labelling place line be parallel;If it is parallel, then according to the marker location information that the new marker location information on described product to be measured is preset with on described crimping jig, obtain the new left marker location information on described product to be measured and the first point midway information of new right marker location information place line, and the second point midway information of the preset left marker location information of labelling and right marker location information place line on described crimping jig, labelling on product to be measured according to described first point midway information and described second point midway acquisition of information and the relative position deviation in X direction and y direction between labelling preset on described crimping jig.
In the present embodiment, after the above-mentioned new marker location information calculated according to offset angle on product to be measured, position deviation acquiring unit 230 can according to marker location information preset in the new marker location information on product to be measured and crimping jig, judge that whether the new left labelling on product to be measured and new right labelling place line, the left labelling preset with on crimping jig and right labelling place line be parallel.Specifically, according to above-mentioned with two cameras carry out obtain image, product to be measured is provided with around each one be labeled as the coordinate system that example is defined, after making vector TR parallel with vector F M, obtain T new on product to be measuredR0(XR0, YR0) and TR1(XR1, YR1) after coordinate, vector F M and TR and X-axis deflection angle R_F and R_TR is calculated respectively: by tanR_F=(Yf1-Yf0)/(Xf1-Xf0+D) according to formula, tanR_TR=(Yt1-Yt0)/(Xt1-Xt0+D), R_F=arctan [(Yf1-Yf0)/(Xf1-Xf0+D)] can be obtained, R_TR=arctan [(Yt1-Yt0)/(Xt1-Xt0+D)], new offset angle DRR=R_TR-R_F.If new offset angle DRR is zero, namely R_TR should be equal with R_F, then labelling place, the left and right line that labelling place, the new left and right line on product to be measured is preset with on crimping jig is parallel, otherwise, not parallel.If not parallel, then recalculate offset angle.If it is parallel, then position deviation acquiring unit 230 is according to the new marker location information on product to be measured, calculate the new left marker location information (Xtr0 on product to be measured, and new right marker location information (Xtr1d Ytr0), Ytr1) the first point midway information (Xmtr of place line, Ymtr) it is: Xmtr=(Xtr0+Xtr1d)/2, Ymtr=(Ytr0+Ytr1)/2.According to marker location information preset on crimping jig, calculate the left marker location information (Xf0 of labelling preset on crimping jig, and right marker location information (Xf1d Yf0), Yf1) the second point midway information (Xmfm of place line, Ymfm) it is: Xmfm=(Xf0+Xf1d)/2, Ymfm=(Yf0+Yf1)/2.Then according to the first point midway information (Xmtr, Ymtr) with the second point midway information (Xmfm, Ymfm), calculate the labelling on product to be measured and the relative position deviation Dy on X direction relative position deviation Dx and y direction between labelling preset on crimping jig, i.e. Dx=| Xmtr-Xmfm |, Dy=| Ymtr-Ymfm |, using Dx, Dy as the compensating parameter that bit platform is moved, to control bit platform is moved accordingly.
If labelling place, the new left and right line on the present embodiment product to be measured is parallel with labelling place, the left and right line on crimping jig, then according to the marker location information that the new marker location information on product to be measured is preset with on crimping jig, calculate the first point midway information of marker location information place, new left and right line on product to be measured, second point midway information of marker location information place, labelling left and right line preset on crimping jig, calculate on product to be measured further according to the first point midway information and the second point midway information and the relative position deviation in X direction and y direction between labelling preset on crimping jig.Achieve that use is single or two cameras obtain marker location information and product to be measured is carried out para-position, reduce hardware cost and simplify debugging operations process, simultaneously relative to other by tool or visual Manual-alignment, improve product to be measured is carried out automatic aligning efficiency and precision.
Further, based on any embodiment in alignment device first to fourth embodiment of above-mentioned product to be measured, propose alignment device the 5th embodiment of present invention product to be measured, in this embodiment, above-mentioned para-position module 300 is additionally operable to, according to what described offset angle controlled described product place to be measured, bit platform is rotated described offset angle along default center of rotation, first predeterminable range that bit platform is moved at described product place to be measured is controlled along corresponding X direction according to the relative position deviation in described X direction, and second predeterminable range that bit platform is moved at described product place to be measured is controlled along corresponding y direction according to the relative position deviation on described y direction, so that labelling on the described product to be measured labelling preset with on described crimping jig overlaps, described product to be measured is carried out para-position.
In the present embodiment, it is overlapped by the labelling that the labelling on product to be measured is preset with on crimping jig that product to be measured is carried out the essence of para-position by para-position module 300, namely makes labelling place, the left and right line coincident that labelling place, the left and right line on product to be measured is preset with on crimping jig.After the offset angle between labelling preset on the above-mentioned labelling obtained on product to be measured and crimping jig, what para-position module 300 controlled product place to be measured rotates this offset angle to bit platform along center of rotation so that labelling place line on the product to be measured labelling place line preset with on crimping jig is parallel.And on the labelling obtained on product to be measured and crimping jig between preset labelling after the relative position deviation in X direction and y direction, para-position module 300 controls first predeterminable range that bit platform is moved at product place to be measured along corresponding X direction according to the relative position deviation Dx in X direction, and this first predeterminable range is Dx;And second predeterminable range that bit platform is moved at product place to be measured is controlled along corresponding y direction according to the relative position deviation Dy on y direction, this second predeterminable range is Dy, so that labelling on the product to be measured labelling preset with on crimping jig overlaps, complete product to be measured is carried out para-position.
The present embodiment controls product place to be measured according to offset angle and along center of rotation, bit platform is rotated this offset angle, and control product place to be measured bit platform is moved along corresponding X direction and/or y direction respectively according to the relative position deviation on transverse axis and y direction, so that labelling on the described product to be measured labelling preset with on described crimping jig overlaps, para-position does not need manual operation, automaticity is high, relative to other by tool or visual Manual-alignment, improve product to be measured is carried out automatic aligning efficiency and precision.
These are only the preferred embodiments of the present invention; not thereby the scope of the claims of the present invention is limited; every equivalent structure utilizing description of the present invention and accompanying drawing content to make or equivalence flow process conversion; or directly or indirectly it is used in other relevant technical fields, all in like manner include in the scope of patent protection of the present invention.

Claims (10)

1. the alignment method of a product to be measured, it is characterised in that the alignment method of described product to be measured comprises the following steps:
The marker location information on product to be measured and marker location information preset on crimping jig is obtained respectively by single or two cameras;
According to the marker location information on described product to be measured and marker location information preset on described crimping jig, obtain the labelling on described product to be measured and the offset angle between labelling preset on described crimping jig and the relative position deviation in X direction and y direction;
According to described offset angle, and on described X direction and y direction, described product to be measured is carried out para-position by relative position deviation.
2. the alignment method of product to be measured as claimed in claim 1, it is characterized in that, described according to the marker location information on described product to be measured with marker location information preset on described crimping jig, obtain the labelling on described product to be measured and the offset angle between labelling preset on described crimping jig, and the relative position deviation in X direction and y direction include:
According to the marker location information on described product to be measured and marker location information preset on described crimping jig, obtain the labelling on described product to be measured and the offset angle between labelling preset on described crimping jig;
The new marker location information on described product to be measured is calculated according to described offset angle;
According to marker location information preset on the new marker location information on described product to be measured and described crimping jig, calculate the labelling on described product to be measured and the relative position deviation in X direction and y direction between labelling preset on described crimping jig.
3. the alignment method of product to be measured as claimed in claim 2, it is characterized in that, marker location information on described product to be measured includes left marker location information and right marker location information, marker location information preset on described crimping jig includes left marker location information and right marker location information, described according to the marker location information on described product to be measured with marker location information preset on described crimping jig, obtain the labelling on described product to be measured and the offset angle between labelling preset on described crimping jig includes:
According to the marker location information on described product to be measured, obtain the left labelling on described product to be measured and the first angle between right labelling place line and viewing field of camera transverse axis;
According to marker location information preset on described crimping jig, obtain the second angle between left labelling preset on described crimping jig and right labelling place line and viewing field of camera transverse axis;
Obtain described first angle and described second angle obtain between angle difference, using described angle difference as the labelling on described product to be measured and the offset angle between labelling preset on described crimping jig.
4. the alignment method of product to be measured as claimed in claim 3, it is characterized in that, described according to marker location information preset on the new marker location information on described product to be measured and described crimping jig, calculate the labelling on described product to be measured and between labelling preset on described crimping jig the relative position deviation in X direction and y direction include:
According to the marker location information that the new marker location information on described product to be measured is preset with on described crimping jig, judge that whether the new left labelling on described product to be measured and new right labelling place line, the left labelling preset with on described crimping jig and right labelling place line be parallel;
If it is parallel, then according to the marker location information that the new marker location information on described product to be measured is preset with on described crimping jig, obtain the new left marker location information on described product to be measured and the first point midway information of new right marker location information place line, and the second point midway information of the preset left marker location information of labelling and right marker location information place line on described crimping jig, labelling on product to be measured according to described first point midway information and described second point midway acquisition of information and the relative position deviation in X direction and y direction between labelling preset on described crimping jig.
5. the alignment method of the product to be measured as according to any one of Claims 1-4, it is characterised in that described according to described offset angle, and on described X direction and y direction, described product to be measured is carried out para-position and includes by relative position deviation:
According to what described offset angle controlled described product place to be measured, bit platform is rotated described offset angle along default center of rotation, first predeterminable range that bit platform is moved at described product place to be measured is controlled along corresponding X direction according to the relative position deviation in described X direction, and second predeterminable range that bit platform is moved at described product place to be measured is controlled along corresponding y direction according to the relative position deviation on described y direction, so that labelling on the described product to be measured labelling preset with on described crimping jig overlaps, described product to be measured is carried out para-position.
6. the alignment device of a product to be measured, it is characterised in that the alignment device of described product to be measured includes:
Position information acquisition module, for obtaining the marker location information on product to be measured and marker location information preset on crimping jig respectively by single or two cameras;
Position deviation acquisition module, for according to the marker location information on described product to be measured and marker location information preset on described crimping jig, obtain the labelling on described product to be measured and the offset angle between labelling preset on described crimping jig and the relative position deviation in X direction and y direction;
Para-position module, for according to described offset angle, and on described X direction and y direction, described product to be measured is carried out para-position by relative position deviation.
7. the alignment device of product to be measured as claimed in claim 6, it is characterised in that described position deviation acquisition module includes:
Offset angle acquiring unit, for according to the marker location information on described product to be measured and marker location information preset on described crimping jig, obtaining the labelling on described product to be measured and the offset angle between labelling preset on described crimping jig;
Location information acquiring unit, for calculating the new marker location information on described product to be measured according to described offset angle;
Position deviation acquiring unit, for according to marker location information preset on the new marker location information on described product to be measured and described crimping jig, calculate the labelling on described product to be measured and the relative position deviation in X direction and y direction between labelling preset on described crimping jig.
8. the alignment device of product to be measured as claimed in claim 7, it is characterized in that, marker location information on described product to be measured includes left marker location information and right marker location information, marker location information preset on described crimping jig includes left marker location information and right marker location information, described offset angle acquiring unit is additionally operable to, according to the marker location information on described product to be measured, obtain the left labelling on described product to be measured and the first angle between right labelling place line and viewing field of camera transverse axis;According to marker location information preset on described crimping jig, obtain the second angle between left labelling preset on described crimping jig and right labelling place line and viewing field of camera transverse axis;Obtain described first angle and described second angle obtain between angle difference, using described angle difference as the labelling on described product to be measured and the offset angle between labelling preset on described crimping jig.
9. the alignment device of product to be measured as claimed in claim 8, it is characterized in that, described position deviation acquiring unit is additionally operable to, according to the marker location information that the new marker location information on described product to be measured is preset with on described crimping jig, judge that whether the new left labelling on described product to be measured and new right labelling place line, the left labelling preset with on described crimping jig and right labelling place line be parallel;If it is parallel, then according to the marker location information that the new marker location information on described product to be measured is preset with on described crimping jig, obtain the new left marker location information on described product to be measured and the first point midway information of new right marker location information place line, and the second point midway information of the preset left marker location information of labelling and right marker location information place line on described crimping jig, labelling on product to be measured according to described first point midway information and described second point midway acquisition of information and the relative position deviation in X direction and y direction between labelling preset on described crimping jig.
10. the alignment device of the product to be measured as according to any one of claim 6 to 9, it is characterized in that, described para-position module is additionally operable to, according to what described offset angle controlled described product place to be measured, bit platform is rotated described offset angle along default center of rotation, first predeterminable range that bit platform is moved at described product place to be measured is controlled along corresponding X direction according to the relative position deviation in described X direction, and second predeterminable range that bit platform is moved at described product place to be measured is controlled along corresponding y direction according to the relative position deviation on described y direction, so that labelling on the described product to be measured labelling preset with on described crimping jig overlaps, described product to be measured is carried out para-position.
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CN113490406B (en) * 2021-07-07 2022-09-16 广州市爱浦电子科技有限公司 Automatic production method of micro-power module power supply composition structure
CN113490406A (en) * 2021-07-07 2021-10-08 广州市爱浦电子科技有限公司 Automatic production method of micro-power module power supply composition structure
CN114283207A (en) * 2021-12-27 2022-04-05 昆山福拉特自动化设备有限公司 Calibration method for alignment crimping of Flexible Printed Circuit (FPC) and screen cell
CN114459406A (en) * 2022-01-18 2022-05-10 武汉华星光电半导体显示技术有限公司 Alignment mechanism, alignment method based on alignment mechanism and readable storage medium
CN115265941A (en) * 2022-09-22 2022-11-01 深圳市利和兴股份有限公司 Soft package battery testing method and system and storage medium
CN115265941B (en) * 2022-09-22 2023-08-22 深圳市利和兴股份有限公司 Soft package battery testing method, system and storage medium
CN115309196A (en) * 2022-10-11 2022-11-08 季华实验室 Turntable control method, device, equipment and storage medium
CN115309196B (en) * 2022-10-11 2022-12-30 季华实验室 Turntable control method, device, equipment and storage medium

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