CN105699709A - Testing and aging fixture for single-chip laser diode - Google Patents
Testing and aging fixture for single-chip laser diode Download PDFInfo
- Publication number
- CN105699709A CN105699709A CN201610149379.1A CN201610149379A CN105699709A CN 105699709 A CN105699709 A CN 105699709A CN 201610149379 A CN201610149379 A CN 201610149379A CN 105699709 A CN105699709 A CN 105699709A
- Authority
- CN
- China
- Prior art keywords
- laser diode
- base
- panel
- fastening screw
- single die
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0425—Test clips, e.g. for IC's
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
- G01M11/0207—Details of measuring devices
- G01M11/0214—Details of devices holding the object to be tested
Abstract
The invention discloses a testing and aging fixture for a single-chip laser diode, which comprises a base, a control board, two supporting blocks, and a fixing pressing block, wherein the upper surface of the base is provided with a positioning groove and two positioning columns, and the base is also provided with two positioning blocks and a fastening screw hole; the control board is likely door-shaped, one upper side is symmetrically provided with two positioning holes, the two positioning holes are matched with the two positioning columns on the base, the other end of the control board is a wiring column, the lower surface of the control board is provided with two convex cuboid pressing blocks, the lower surface of the control board is also provided with two grooves, and the pressing blocks and the wiring column are connected; the two supporting blocks are fixed at one side of a positioning block on the base; and the fixing pressing block is Z-shaped, an upper arm and a lower arm are provided with fastening screw holes respectively, the fastening screw hole in the lower arm is used for fixing the fixing pressing block in the fastening screw hole in the base via a screw, the fastening screw hole in the upper arm is used for pressing the control board via a screw, and thus, a role of fixing the single-chip laser diode is played.
Description
Technical field
The present invention relates to semiconductor laser diode technical field, particularly relate to the fixture that the test of a kind of single die laser diode is aging。
Background technology
Photoelectric properties test and life-span examination are to develop a step very crucial in semiconductor laser diode process, are also the means whether inspection technical process is qualified。High power single-tube core laser diode is applied widely, such as pumping source, materials processing, armarium, infrared illumination etc.。Single die laser diode volume is little, and the single die laser diode volume being especially sintered in pottery transition heat sink is less, it has not been convenient to fixing, it is necessary to is fixed in and can test and life-span examination by Progressive symmetric erythrokeratodermia on the fixture of particular design。
Summary of the invention
It is an object of the invention to, the test aging clamp of a kind of single die laser diode is provided, this fixture maneuverability, can be fixed on test equipment and carry out performance test, it is completed, can directly be fixed on agingtable to carry out aging, decrease the workload of handling device, particularly with the aging equipment that can not carry out monitoring in real time, it is greatly improved the work efficiency of aging examination, simultaneously, the accurate positioning to device of this fixture, fixed, bottom device is with fixture laminating closely, it is possible to improve the safety and reliability of long-term ageing。
To achieve these goals, the present invention provides a kind of test aging clamp for single die laser diode, including:
One base, its upper surface has a locating slot and two locating dowels, and this locating slot, for single die laser diode is positioned, this base has two locating pieces and a fastening screw nail simultaneously；
One panel, described panel is general like a shape, side symmetry above this panel has hole, two location, hole, these two location matches with two locating dowels on described base, the other end of described panel is binding post, for powering to single die laser diode, the lower surface of described panel has two protruding cuboid briquettings, for fixing described single die laser diode, the lower surface of described panel also has two grooves, for placing wire, described briquetting is connected with described binding post；
Two bracers, the side of the locating piece being fixed on described base, for support and control plate；
One fixing briquetting, described fixing briquetting is Z-shaped, upper and lower two-arm respectively has fastening screw nail, the fastening screw nail of underarm for being fixed by screws in the fastening screw nail on base by described fixing briquetting, the fastening screw nail of upper arm passes through screw in compression panel, to play the effect of fixing single die laser diode。
The invention has the beneficial effects as follows, this fixture maneuverability, it is possible to be fixed on test equipment and carry out performance test, it is completed, can directly be fixed on agingtable to carry out aging, decrease the workload of handling device, particularly with the aging equipment that can not carry out monitoring in real time, it is greatly improved the work efficiency of aging examination, meanwhile, the accurate positioning to device of this fixture, fixed, bottom device is with fixture laminating closely, it is possible to improve the safety and reliability of long-term ageing。
Accompanying drawing explanation
For making the object, technical solutions and advantages of the present invention clearly understand, below in conjunction with specific embodiment, and with reference to accompanying drawing, the present invention is described in further detail, wherein:
Fig. 1 is the single die laser diode structure schematic diagram adopting transition heat sink or heat sink encapsulation；
Fig. 2 is the structural representation of base plate in the present invention；
Fig. 3 is the structural representation of panel in the present invention；
Fig. 4 is the structural representation fixing briquetting in the present invention；
Fig. 5 is that the present invention tests the front view of the structural representation after aging clamp assembles for single die laser diode。
Fig. 6 is that the present invention tests the left view of the structural representation after aging clamp assembles for single die laser diode。
Detailed description of the invention
Referring to shown in Fig. 1 to Fig. 6, the present invention provides a kind of test aging clamp for single die laser diode, and described single die laser diode 1 includes (referring to Fig. 1): a transition heat sink or heat sink 11, a single die laser diode chip 12,
Described test aging clamp includes:
One base 2, for metal material, require that the lower surface of base 2 is as far as possible smooth, so that with testboard or agingtable close contact when using, reach the purpose of good heat radiating, there are a locating slot 21 and two locating dowels 22 in one end of the upper surface of described base 2, locating slot 21 is for positioning single die laser diode 1, the other end of described base 2 has two locating pieces 24, two bracers 5 are positioned by this two locating piece 24, on described base 2, the one end at locating piece 24 place has a fastening screw nail 23 simultaneously, described fastening screw nail 23 is for being fixed fixing briquetting 4 by screw；
Panel 3, described panel 3 is general like a shape, this panel 3 side symmetry above has hole 33, two location, hole, these two location 33 matches with two locating dowels 22 on described base 2, two locating dowels 22 on base 2 are inserted the hole 33, two location on described panel 3, the effect that panel 3 is positioned can be played, the other end of described panel 3 is two binding posts 34, for powering to laser diode 1, the lower surface of described panel 3 has two protruding cuboid briquettings 31, for fixing described single die laser diode 1, the lower surface of described panel 3 also has two grooves 32, for placing wire, described briquetting 31 is connected by described wire with described binding post 34；Panel 3 main part is insulant, and binding post 34 and cuboid briquetting 31 are metal material。
Two bracers 5, material is plastics or rubber, the main purpose adopting plastics or elastomeric material is the elasticity utilizing material, reach conveniently to pick and place and fasten the effect of panel 3, the side of two locating pieces 24 that described two bracers 5 are fixed on described base 2, for support and control plate 3, two bracers 5 are fixed on base 2 side of locating piece 24 with glue；
Fixing briquetting 4, described fixing briquetting is Z-shaped, upper and lower two-arm respectively has fastening screw nail 41,42, the fastening screw nail 42 of underarm is for being fixed by screws in the fastening screw nail 23 on base 2 by described fixing briquetting 4, the fastening screw nail 41 of upper arm is by screw in compression panel 3, to play the effect of fixing single die laser diode 1。
Referring again to shown in Fig. 1 to Fig. 6, the using method of single die laser diode of the present invention test aging clamp is as follows:
First, aging single die laser diode 1 to be tested is put into the locating slot 21 on base 2, the backlight side of described single die laser diode 1 and right flank are close to the sidewall of locating slot 21, press control plate 3 makes the cuboid briquetting 31 that its lower surface is protruding gently, contacts gently with the transition heat sink of single die laser diode 1 or heat sink 11。
Secondly, by screw in compression panel 3, to play the effect of fixing single die laser diode 1, being then placed on by this fixture on test or agingtable can test or aging single die laser diode 1。
The features such as described single die laser diode test aging clamp has simple in construction, handling ease, picks and places conveniently, safe and reliable, it is possible to be effectively ensured the test of single die laser diode and aging reliability。
Particular embodiments described above; the purpose of the present invention, technical scheme and beneficial effect have been carried out further detailed description; it it should be understood that; the foregoing is only the specific embodiment of the invention; it is not limited to the present invention; all within the spirit and principles in the present invention, any amendment of making, equivalent replacement, improvement etc., be all contained within protection scope of the present invention。
Claims (2)
1. for a test aging clamp for single die laser diode, including:
One base, its upper surface has a locating slot and two locating dowels, and this locating slot, for single die laser diode is positioned, this base has two locating pieces and a fastening screw nail simultaneously；
One panel, described panel is general like a shape, side symmetry above this panel has hole, two location, hole, these two location matches with two locating dowels on described base, the other end of described panel is binding post, for powering to single die laser diode, the lower surface of described panel has two protruding cuboid briquettings, for fixing described single die laser diode, the lower surface of described panel also has two grooves, for placing wire, described briquetting is connected with described binding post；
Two bracers, the side of the locating piece being fixed on described base, for support and control plate；
One fixing briquetting, described fixing briquetting is Z-shaped, upper and lower two-arm respectively has fastening screw nail, the fastening screw nail of underarm for being fixed by screws in the fastening screw nail on base by described fixing briquetting, the fastening screw nail of upper arm passes through screw in compression panel, to play the effect of fixing single die laser diode。
2. the test aging clamp for single die laser diode as claimed in claim 1, the material of wherein said bracer is plastics or rubber, is used for supporting fastening panel。
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610149379.1A CN105699709A (en) | 2016-03-16 | 2016-03-16 | Testing and aging fixture for single-chip laser diode |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610149379.1A CN105699709A (en) | 2016-03-16 | 2016-03-16 | Testing and aging fixture for single-chip laser diode |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN105699709A true CN105699709A (en) | 2016-06-22 |
Family
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201610149379.1A Pending CN105699709A (en) | 2016-03-16 | 2016-03-16 | Testing and aging fixture for single-chip laser diode |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN105699709A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107450006A (en) * | 2017-08-14 | 2017-12-08 | 杭州可靠性仪器厂 | A kind of metal-oxide-semiconductor, diode power batch run device |
| CN107643165A (en) * | 2017-11-06 | 2018-01-30 | 吉林省长光瑞思激光技术有限公司 | A kind of linear array diode laser degradation detecting device |
| WO2018059965A1 (en) * | 2016-09-30 | 2018-04-05 | Forschungsverbund Berlin E.V. | Optical pulse generator and method for operating an optical pulse generator |
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| CN102707100A (en) * | 2012-05-25 | 2012-10-03 | 工业和信息化部电子第五研究所 | Bare chip test device for reversing electrical interconnection substrate |
| CN103482879A (en) * | 2013-09-09 | 2014-01-01 | 江西沃格光电科技有限公司 | Clamping jig |
| US20140119394A1 (en) * | 2012-10-29 | 2014-05-01 | Coherent, Inc. | Macro-channel water-cooled heat-sink for diode-laser bars |
| CN104166020A (en) * | 2014-08-26 | 2014-11-26 | 中国科学院半导体研究所 | Laser diode aging testing clamp |
| CN104459223A (en) * | 2014-11-24 | 2015-03-25 | 深圳市佳晨科技有限公司 | Testing fixture |
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2016
- 2016-03-16 CN CN201610149379.1A patent/CN105699709A/en active Pending
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| CN102707100A (en) * | 2012-05-25 | 2012-10-03 | 工业和信息化部电子第五研究所 | Bare chip test device for reversing electrical interconnection substrate |
| US20140119394A1 (en) * | 2012-10-29 | 2014-05-01 | Coherent, Inc. | Macro-channel water-cooled heat-sink for diode-laser bars |
| CN103482879A (en) * | 2013-09-09 | 2014-01-01 | 江西沃格光电科技有限公司 | Clamping jig |
| CN104166020A (en) * | 2014-08-26 | 2014-11-26 | 中国科学院半导体研究所 | Laser diode aging testing clamp |
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| TSO YEE FAN 等: "Diode Laser-Pumped Solid-state Lasers", 《JOURNAL OF QUANTUM ELECTRONICS》 * |
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2018059965A1 (en) * | 2016-09-30 | 2018-04-05 | Forschungsverbund Berlin E.V. | Optical pulse generator and method for operating an optical pulse generator |
| US10802116B2 (en) | 2016-09-30 | 2020-10-13 | Forschungsverbund Berlin E.V. | Optical pulse generator and method for operating an optical pulse generator |
| CN107450006A (en) * | 2017-08-14 | 2017-12-08 | 杭州可靠性仪器厂 | A kind of metal-oxide-semiconductor, diode power batch run device |
| CN107643165A (en) * | 2017-11-06 | 2018-01-30 | 吉林省长光瑞思激光技术有限公司 | A kind of linear array diode laser degradation detecting device |
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Application publication date: 20160622 |