CN220773219U

CN220773219U - Amplifier chip testing device

Info

Publication number: CN220773219U
Application number: CN202322563422.7U
Authority: CN
Inventors: 李美华
Original assignee: Shanghai Benxin Semiconductor Technology Co ltd
Current assignee: Shanghai Benxin Semiconductor Technology Co ltd
Priority date: 2023-09-21
Filing date: 2023-09-21
Publication date: 2024-04-12
Anticipated expiration: 2033-09-21

Abstract

The utility model relates to the technical field of chip testing, in particular to an amplifier chip testing device which can effectively test chips with different sizes, can ensure the stable placement of the chips and is convenient for taking the chips; comprises a workbench; still include testboard, stop gear, accredited testing organization, positioning mechanism and adsorption mechanism, the standing groove has been seted up on the top of testboard, and the testboard passes through stop gear and places on the top of workstation, stop gear includes two L type fixed plates, two extension boards, two sets of threaded rods and two clamp plates, and accredited testing organization installs the top rear portion at the workstation, accredited testing organization includes fixed arm, two electric telescopic links, movable plate, pick-up board, detector and connecting wire, and positioning mechanism installs on accredited testing organization, and adsorption mechanism installs the below at the workstation.

Description

Amplifier chip testing device

Technical Field

The utility model relates to the technical field of chip testing, in particular to an amplifier chip testing device.

Background

With the advent of the internet of things, computers and electronic products have come to be developed in new rounds, but chips in computers or other electronic devices have more important roles in the internet of things, and with the development of technology, chip technology has also been developed sufficiently, and chips are generally called semiconductor element products, in electronics, a circuit is miniaturized, and often manufactured on the surface of a semiconductor wafer, an audio power amplifier chip can amplify weak electric signals of a signal source so as to drive a loudspeaker to make a sound, and in the field of manufacturing chips, after mass production of chips is completed, the chips need to be tested so as to select unqualified chips, thereby retaining qualified chips. By searching, a test device for a chip proposed by prior art publication CN113341299a includes: a base; a first test needle and a second test needle, the first test needle and the second test needle being mounted to the base; the first test needle and the second test needle are different in length, the first test needle is used for testing a first part to be tested of the chip, and the second test needle is used for testing a second part to be tested of the chip. In this application, through set up the first test needle and the second test needle that length is different in testing arrangement for this testing arrangement can be through the first portion to be tested and the second portion to be tested of the difference in height in the two test needles test chip respectively, and this testing arrangement can test the first portion to be tested and the second portion to be tested of chip promptly simultaneously, improves the efficiency of test, and increases testing arrangement's range of application, improves testing arrangement to the accuracy of the test result of chip. But can't carry out effectual test to not unidimensional chip, because the volume of chip is less, and with the plane contact laminating of placing the chip, lead to being inconvenient for take the chip in the test process, the too big fragile chip of exerting oneself, inconvenient use.

Disclosure of Invention

In order to solve the technical problems, the utility model provides the amplifier chip testing device which can effectively test chips with different sizes, can ensure the stable placement of the chips and is convenient for taking the chips.

The utility model relates to an amplifier chip testing device, which comprises a workbench; the test bench is placed at the top end of the workbench through the limiting mechanism, the test mechanism is arranged at the rear part of the top end of the workbench, the positioning mechanism is arranged on the test mechanism, and the adsorption mechanism is arranged below the workbench; the testboard passes through stop gear installs on the top of workstation, is convenient for change different testboards according to the chip, can carry out effectual test to different size chips, tests the chip in the standing card slot through testing mechanism, and accuracy when positioning mechanism can guarantee to be connected with the chip, and adsorption mechanism can guarantee that the chip is stable to be put in the standing card slot, is convenient for take the chip.

Preferably, the limiting mechanism comprises two L-shaped fixing plates, two extending plates, two groups of threaded rods and two pressing plates, wherein the two extending plates are fixedly arranged on the side walls of the left end and the right end of the test table, the two L-shaped fixing plates are respectively fixedly arranged at the top ends of the work tables on the left side and the right side of the test table, the two threaded rods are screwed on the upper parts of the L-shaped fixing plates, a knob is arranged on each threaded rod, and the pressing plates are rotatably connected to the bottom ends of the threaded rods; when the test bench is used, the test bench is placed between the two L-shaped fixing plates, the knob is screwed to drive the threaded rod to rotate, the threaded rod drives the pressing plate to descend, the pressing plate is made to press the extending plate to fix the test bench, the test bench with different sizes can be conveniently replaced according to chips, and the chips with different sizes can be effectively tested.

Preferably, the testing mechanism comprises a fixed arm, two electric telescopic rods, a movable plate, a detection plate, a detector and a connecting wire, wherein the bottom end of the fixed arm is fixedly arranged at the rear part of the top end of the workbench, the two electric telescopic rods are fixedly arranged at the bottom end of the upper part of the fixed arm, the bottom ends of the electric telescopic rods are connected with the movable plate through connecting sleeves, the bottom ends of the movable plate are connected with the detection plate, the detection plate is positioned right above a test table placing clamping groove, the detector is fixedly arranged at the top end of the fixed arm, and the detector is connected with the detection plate through the connecting wire; during the test, start electric telescopic handle and drive the movable plate and descend, make pick-up plate and chip contact, test the chip through the detector, can change the movable plate through the adapter sleeve, change and test bench placement card groove assorted pick-up plate, can carry out effectual test to different sizes chips.

Preferably, the positioning mechanism comprises a plurality of positioning rods, a plurality of springs and a plurality of compression rings, wherein the positioning rods are respectively and fixedly arranged at four corners of the bottom end of the movable plate, the springs are sleeved on the outer wall of the positioning rods, the top ends of the springs are connected with the bottom end of the movable plate, the bottom ends of the springs are fixedly connected with the top ends of the compression rings, the compression rings are slidably arranged on the outer wall of the positioning rods, and positioning grooves corresponding to the positioning rods are formed in four corners of the top end of the test table; when the electric telescopic rod drives the movable plate to descend, the movable plate drives the positioning rod to move downwards, so that the positioning rod enters the positioning groove, the accuracy of the detection plate in connection with the chip is guaranteed, meanwhile, the pressing ring is in contact with the top end of the test bench, the spring is compressed, the detection plate is buffered, and the chip is prevented from being crushed due to overlarge pressing force.

Preferably, the adsorption mechanism comprises a bottom box, a connecting plug, a communicating pipe, an air suction machine, an exhaust pipe, a one-way valve and an air injection assembly, wherein the bottom box is fixedly connected to the bottom end of the workbench, the air suction machine is fixedly installed at the inner bottom end of the bottom box, an adsorption hole communicated with the holding clamping groove is formed in the test bench, the connecting plug is fixedly installed at the top end of the workbench, a slot matched with the connecting plug is formed in the bottom end of the test bench, the communicating pipe is fixedly connected to the middle part of the workbench, the output end of the communicating pipe is connected with the input end of the connecting plug, the input end of the communicating pipe is connected with one end of the exhaust pipe, the other end of the exhaust pipe is connected with the air suction machine, and the one-way valve is installed on the exhaust pipe; the bottom slot of the test board is inserted into the connecting plug, after the chip is placed in the placement card slot, the air suction machine is started to drive the one-way valve, the chip in the placement card slot is adsorbed through the air suction pipe, the communicating pipe, the connecting plug and the adsorption hole, the chip is ensured to be stably placed in the placement card slot, and the chip is prevented from being taken out when the detection plate moves upwards.

Preferably, the air injection assembly comprises an air blower, an air blowing pipe, a second one-way valve and a controller, wherein the air blower is fixedly arranged at the inner bottom end of the bottom box, the output end of the air blower is fixedly connected with the air blowing pipe, the output end of the air blowing pipe is communicated with the communicating pipe, the second one-way valve is arranged on the air blowing pipe, the controller is fixedly arranged on the side wall of the front end of the workbench, and the controller is electrically connected with the air blower and the air blower; after the test is finished, the air blower is started, the second one-way valve is opened, the one-way valve is closed simultaneously, air is blown into the communicating pipe through the air blowing pipe, the air is blown out to the placing clamping groove through the connecting plug and the adsorption hole, the chip is ejected out of the placing clamping groove, the chip is conveniently taken out, and the chip is prevented from being damaged.

Preferably, the novel anti-theft device further comprises two access doors and a plurality of support legs, wherein the front end of the bottom box is provided with an access hole, the access door cover is arranged at the front end access hole of the bottom box, the support legs are respectively and fixedly arranged at four corners of the bottom end of the bottom box, and the side walls of the left end and the right end of the bottom box are provided with heat dissipation holes; the device is convenient to overhaul and replace the setting inside the workbench through the access hole and the access door, improves accuracy, can support equipment through the support legs, improves convenience in use, and is convenient for the heat dissipation inside the bottom box through the heat dissipation holes.

Compared with the prior art, the utility model has the beneficial effects that: the testboard passes through stop gear installs on the top of workstation, is convenient for change different testboards according to the chip, can carry out effectual test to different size chips, tests the chip in the standing card slot through testing mechanism, and accuracy when positioning mechanism can guarantee to be connected with the chip, and adsorption mechanism can guarantee that the chip is stable to be put in the standing card slot, is convenient for take the chip.

Drawings

FIG. 1 is a schematic diagram of the structure of the present utility model;

FIG. 2 is a schematic diagram of the front view of the present utility model;

FIG. 3 is a right side view of the present utility model;

FIG. 4 is a schematic view of a front cross-sectional structure of the present utility model;

the reference numerals in the drawings: 1. a work table; 2. a test bench; 3. an L-shaped fixing plate; 4. an extension plate; 5. a threaded rod; 6. a pressing plate; 7. a fixed arm; 8. an electric telescopic rod; 9. a moving plate; 10. a detection plate; 11. a detector; 12. a connecting wire; 13. connecting sleeves; 14. a positioning rod; 15. a spring; 16. a compression ring; 17. a bottom box; 18. a connection plug; 19. a communicating pipe; 20. a suction machine; 21. an exhaust pipe; 22. a one-way valve; 23. a blowing machine; 24. an air blowing pipe; 25. a second one-way valve; 26. a controller; 27. an access door; 28. and (5) supporting legs.

Detailed Description

In order that the utility model may be readily understood, a more complete description of the utility model will be rendered by reference to the appended drawings. This utility model may be embodied in many different forms and is not limited to the embodiments described herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete.

As shown in fig. 1, 3 and 4, the top end of the test bench 2 is provided with a holding slot, two extension plates 4 are fixedly installed on the side walls of the left and right ends of the test bench 2, two L-shaped fixing plates 3 are respectively and fixedly installed at the top end of the workbench 1 on the left and right sides of the test bench 2, two threaded rods 5 are screwed on the upper parts of the L-shaped fixing plates 3, knobs are arranged on the threaded rods 5, the bottom ends of the threaded rods 5 are rotationally connected with a pressing plate 6, the bottom ends of the fixing arms 7 are fixedly installed at the rear part of the top end of the workbench 1, two electric telescopic rods 8 are fixedly installed at the bottom ends of the upper parts of the fixing arms 7, the bottom ends of the electric telescopic rods 8 are connected with a movable plate 9 through connecting sleeves 13, the bottom ends of the movable plate 9 are connected with a detection plate 10, the detection plate 10 is positioned right above the holding slot of the test bench 2, the detection instrument 11 is fixedly installed at the top end of the fixing arms 7, the detection instrument 11 is connected with the detection plate 10 through connecting wires 12, the positioning rods 14 are respectively and fixedly arranged at the four corners of the bottom end of the movable plate 9, the springs 15 are sleeved on the outer walls of the positioning rods 14, the top ends of the springs 15 are connected with the bottom end of the movable plate 9, the bottom ends of the springs 15 are fixedly connected with the top ends of the pressing rings 16, the pressing rings 16 are slidably arranged on the outer walls of the positioning rods 14, the four corners of the top end of the test bench 2 are provided with positioning grooves corresponding to the positioning rods 14, the bottom box 17 is fixedly connected with the bottom end of the work bench 1, the air suction machine 20 is fixedly arranged at the inner bottom end of the bottom box 17, the test bench 2 is provided with adsorption holes communicated with the positioning grooves, the connecting plug 18 is fixedly arranged at the top end of the work bench 1, the bottom end of the test bench 2 is provided with slots matched with the connecting plug 18, the middle part of the work bench 1 is fixedly connected with the communicating pipe 19, and the output end of the communicating pipe 19 is connected with the input end of the connecting plug 18, the input end of the communicating pipe 19 is connected with one end of the exhaust pipe 21, the other end of the exhaust pipe 21 is connected with the aspirator 20, and the exhaust pipe 21 is provided with a one-way valve 22;

during the use, put into test bench 2 between two L type fixed plates 3, insert connecting plug 18 with the bottom slot of test bench 2 on, twist the knob and drive threaded rod 5 rotation, threaded rod 5 drives clamp plate 6 decline, make clamp plate 6 compress tightly extension board 4 and fix test bench 2, be convenient for change different test bench 2 according to the chip, can carry out effectual test to different size chips, place the chip behind the card slot of placing, start aspirator 20 and drive check valve 22, adsorb the chip in the card slot through exhaust tube 21, communicating pipe 19, connecting plug 18 and adsorption hole, guarantee that the chip is stable to be placed in the card slot of placing, avoid the chip to take out when detecting plate 10 upwards moves, during the test, start electric telescopic handle 8 and drive movable plate 9 decline, make plate 10 and chip contact, test through detector 11, can change movable plate 9 through adapter sleeve 13, change and test bench 2 place card slot assorted detecting plate 10, can carry out effectual test to different size chips, electric telescopic handle 8 drives movable plate 9 and moves down, 14 and the pressure is gone into to the pressure of movable plate 9, the pressure is guaranteed to the pressure is reduced to the pressure is guaranteed to the chip, the pressure is reduced to the pressure is guaranteed to the pressure is reduced to the 14, the pressure is guaranteed to the pressure is reduced to the pressure is increased to the pressure is reduced to the top when the pressure is measured to the chip is measured, and is guaranteed, the pressure is measured to be high-down, and the pressure is measured to be used to be matched with test bench 2, and is used, during the test bench is used, and is used, when the test is used, the test is put in, and after the time, and after the test is.

As shown in fig. 2 and fig. 4, the air injection assembly comprises an air blower 23, an air blower 24, a second one-way valve 25 and a controller 26, wherein the air blower 23 is fixedly installed at the bottom end of the bottom box 17, the output end of the air blower 23 is fixedly connected with the air blower 24, the output end of the air blower 24 is communicated with the communicating pipe 19, the air blower 24 is provided with the second one-way valve 25, the controller 26 is fixedly installed on the front side wall of the workbench 1, the controller 26 is electrically connected with the air blower 20 and the air blower 23, the front end of the bottom box 17 is provided with an access hole, the access door 27 is covered at the front end access hole of the bottom box 17, a plurality of supporting legs 28 are respectively fixedly installed at four corners of the bottom end of the bottom box 17, and the left and right side walls of the bottom box 17 are provided with heat dissipation holes;

after the test is finished, the blower 23 is started, the second one-way valve 25 is opened, the one-way valve 22 is closed simultaneously, air is blown into the communicating pipe 19 through the air blowing pipe 24, the air is blown out to the holding clamping groove through the connecting plug 18 and the adsorption hole, the chip is ejected out of the holding clamping groove, the chip is prevented from being damaged, the maintenance and replacement of the inside arrangement of the workbench 1 are facilitated through the access hole and the access door, the accuracy is improved, the equipment can be supported through the support leg 28, the convenience in use is improved, and the heat dissipation of the inside of the bottom box 17 is facilitated through the heat dissipation hole.

As shown in fig. 1 to 4, in the testing device for the amplifier chip, when the testing device for the amplifier chip is in operation, a proper test bench 2 is selected according to the chip to be tested, a bottom end slot of the test bench 2 is inserted into a connecting plug 18, the test bench 2 is placed between two L-shaped fixing plates 3, a knob is screwed to drive a threaded rod 5 to rotate, the threaded rod 5 drives a pressing plate 6 to descend, the pressing plate 6 compresses the extending plate 4 to fix the test bench 2, after the chip is placed in a placing clamping groove, a suction machine 20 is started to drive a one-way valve 22, the chip in the placing clamping groove is adsorbed through an exhaust pipe 21, a communicating pipe 19, the connecting plug 18 and an adsorption hole, the chip is ensured to be stably placed in the placing clamping groove, an electric telescopic rod 8 is started to drive a moving plate 9 to descend, the detection plate 10 is contacted with the chip, the chip is tested through the detector 11, when the electric telescopic rod 8 drives the movable plate 9 to descend, the movable plate 9 drives the positioning rod 14 to move downwards, the positioning rod 14 enters the positioning groove, the accuracy of the connection of the detection plate 10 and the chip is guaranteed, meanwhile, the compression ring 16 is contacted with the top end of the test bench 2, the compression spring 15 is used for buffering the detection plate 10, the chip is prevented from being crushed due to overlarge pressure, the blower 23 is started after the test is finished, the second one-way valve 25 is opened, the one-way valve 22 is closed, air is blown into the communicating pipe 19 through the air blowing pipe 24, the air is blown out to the placing clamping groove through the connecting plug 18 and the adsorption hole, and the chip is ejected out of the placing clamping groove, so that the chip is conveniently taken out.

The detector 11, the aspirator 20 and the blower 23 of the amplifier chip testing device of the present utility model are commercially available, and those skilled in the art can perform the installation and operation according to the attached instructions without the need for creative efforts of those skilled in the art.

The foregoing is merely a preferred embodiment of the present utility model, and it should be noted that it will be apparent to those skilled in the art that modifications and variations can be made without departing from the technical principles of the present utility model, and these modifications and variations should also be regarded as the scope of the utility model.

Claims

1. An amplifier chip testing device comprises a workbench (1); the test bench is characterized by further comprising a test bench (2), a limiting mechanism, a test mechanism, a positioning mechanism and an adsorption mechanism, wherein a placement clamping groove is formed in the top end of the test bench (2), the test bench (2) is placed on the top end of the workbench (1) through the limiting mechanism, the test mechanism is arranged at the rear part of the top end of the workbench (1), the positioning mechanism is arranged on the test mechanism, and the adsorption mechanism is arranged below the workbench (1).

2. The amplifier chip testing device according to claim 1, wherein the limiting mechanism comprises two L-shaped fixing plates (3), two extending plates (4), two groups of threaded rods (5) and two pressing plates (6), the two extending plates (4) are fixedly installed on the side walls of the left end and the right end of the test table (2), the two L-shaped fixing plates (3) are respectively fixedly installed at the top ends of the work tables (1) on the left side and the right side of the test table (2), the two threaded rods (5) are screwed on the upper portions of the L-shaped fixing plates (3), knobs are arranged on the threaded rods (5), and the pressing plates (6) are rotatably connected to the bottom ends of the threaded rods (5).

3. The amplifier chip testing device according to claim 1, wherein the testing mechanism comprises a fixed arm (7), two electric telescopic rods (8), a movable plate (9), a detection plate (10), a detector (11) and a connecting wire (12), wherein the bottom end of the fixed arm (7) is fixedly arranged at the rear part of the top end of the workbench (1), the two electric telescopic rods (8) are fixedly arranged at the bottom end of the upper part of the fixed arm (7), the bottom ends of the electric telescopic rods (8) are connected with the movable plate (9) through connecting sleeves (13), the bottom ends of the movable plate (9) are connected with the detection plate (10), the detection plate (10) is located right above a holding slot of the testing table (2), the detector (11) is fixedly arranged at the top end of the fixed arm (7), and the detector (11) is connected with the detection plate (10) through the connecting wire (12).

4. An amplifier chip testing device as claimed in claim 3, characterized in that the positioning mechanism comprises a plurality of positioning rods (14), a plurality of springs (15) and a plurality of pressing rings (16), wherein the positioning rods (14) are fixedly arranged at the four corners of the bottom end of the movable plate (9), the springs (15) are sleeved on the outer wall of the positioning rods (14), the top ends of the springs (15) are connected with the bottom end of the movable plate (9), the bottom ends of the springs (15) are fixedly connected with the top ends of the pressing rings (16), the pressing rings (16) are slidably arranged on the outer wall of the positioning rods (14), and positioning grooves corresponding to the positioning rods (14) are formed in the four corners of the top ends of the test table (2).

5. The amplifier chip testing device according to claim 1, wherein the adsorption mechanism comprises a bottom box (17), a connecting plug (18), a communicating pipe (19), an air suction machine (20), an exhaust pipe (21), a one-way valve (22) and an air injection assembly, the bottom box (17) is fixedly connected to the bottom end of the workbench (1), the air suction machine (20) is fixedly installed at the inner bottom end of the bottom box (17), an adsorption hole communicated with a holding clamping groove is formed in the test bench (2), the connecting plug (18) is fixedly installed at the top end of the workbench (1), a slot matched with the connecting plug (18) is formed in the bottom end of the test bench (2), the communicating pipe (19) is fixedly connected to the middle part of the workbench (1), the output end of the communicating pipe (19) is connected with the input end of the connecting plug (18), the input end of the communicating pipe (19) is connected with one end of the exhaust pipe (21), the other end of the exhaust pipe (21) is connected with the air suction machine (20), and the one-way valve (22) is installed on the exhaust pipe (21).

6. An amplifier chip testing apparatus according to claim 5, wherein the air injection assembly comprises an air blower (23), an air blower pipe (24), a second one-way valve (25) and a controller (26), the air blower (23) is fixedly arranged at the inner bottom end of the bottom box (17), the output end of the air blower (23) is fixedly connected with the air blower pipe (24), the output end of the air blower pipe (24) is communicated with the communicating pipe (19), the second one-way valve (25) is arranged on the air blower pipe (24), the controller (26) is fixedly arranged on the side wall of the front end of the workbench (1), and the controller (26) is electrically connected with the air suction machine (20) and the air blower (23).

7. The amplifier chip testing apparatus according to claim 5, further comprising two access doors (27) and a plurality of legs (28), wherein the front end of the bottom case (17) is provided with an access opening, the access doors (27) are covered on the front access opening of the bottom case (17), the plurality of legs (28) are respectively fixedly installed at four corners of the bottom end of the bottom case (17), and the side walls of the left and right ends of the bottom case (17) are provided with heat dissipation holes.