CN1056942A - Digital-transmission multifunctional tester - Google Patents
Digital-transmission multifunctional tester Download PDFInfo
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- CN1056942A CN1056942A CN 90105828 CN90105828A CN1056942A CN 1056942 A CN1056942 A CN 1056942A CN 90105828 CN90105828 CN 90105828 CN 90105828 A CN90105828 A CN 90105828A CN 1056942 A CN1056942 A CN 1056942A
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Abstract
The present invention relates to a kind of digital-transmission multifunctional tester that is applicable to telemechanical work (remote measurement, remote signalling, remote control, remote regulating), form by ten unit such as demodulation frequency measurement, time clock, vibration modulation, counting demonstration, switch transition, level measurement, step-by-step demonstration, shift LD, memory, rectifying and voltage-stabilizing and cabinet, panel, function switching and the various combination of this instrument by the switch transition unit, make complete machine have multiple test function simultaneously, this machine circuit is succinct, volume is little, cost is low, carry, extremely easy to use.
Description
The invention belongs to electronic measuring instrument, be specially adapted to the integrative test of telemechanical and digital information transmission aspect.
Along with the widespread use of integrated circuit and microcomputer, the remote measurement of electric system in recent years, remote signalling, remote control, remote regulating (general name telemechanical) technology have obtained developing rapidly.Yet, some testing tools that this technical work is necessary, exist still that volume is big, cost is high, function singleness, carry, use the deficiency of aspects such as inconvenience as integrated circuit fundamental tester, error rate tester, decibel meter, modulator-demodular unit and various signal generators etc., directly affect the quality and the efficient of telemechanical work.
The objective of the invention is for the professional and technical personnel who is engaged in telemechanical (or digital information transmission) provides that a kind of volume is little, in light weight, perfect in shape and function, cost are lower, carry, use all comprehensive multifunctional testing tool extremely easily.
The present invention has reached above-mentioned purpose by the following technical solutions: it forms (see figure 1) by demodulation frequency measurement (unit 1), time clock (unit 2), vibration modulation (unit 3), counting demonstration (unit 4), switch transition (unit 5), level measurement (unit 6), step-by-step demonstration (unit 7), shift LD (unit 8), memory (unit 9), rectifying and voltage-stabilizing ten unit (or module) such as (unit 10) and cabinet, panel.The digital-transmission multifunctional tester of being made up of above-mentioned ten unit carries out different combinations by the switch transition unit with each unit.Can realize different test functions, its unit combination form and test function are as follows respectively:
1, (5)+(7)+(2) constitute general digital IC sheet functional tester
2, (5)+(8)+(2)+(4) constitute error rate tester
3, (5)+(2)+(4) constitute counter type frequency meter and survey square wave frequency
4, sine wave freuqency can be surveyed in (5)+(2)+(4)+(1)
5, (5)+(3)+(2)+(1)+(4) constitute sine wave or square wave signal generator, have frequency to show, add (10) unit and also can monitor output level, add (5) unit, exportable 16-24 bit parallel sign indicating number
6, (5)+(2)+(4)+(7)+(8)+(9) constitute can edit storage, sends or the tester of reception serial number, and adding (3) can long-rangely send, add (1) but demodulate reception unit (10) can make simple and easy decibel meter.
There is adjustable DC voltage-stabilizing output unit (11).
Below in conjunction with accompanying drawing this digital-transmission multifunctional tester and each several part structure, function are described in detail respectively:
One demodulation frequency senser: (see figure 3)
This unit is made of two four high guaily unit integrated circuit and a small amount of Resistor-Capacitor Unit.Wherein, the Y1 circuit is connected into wien bridge circuit, makes bandpass filter; The Y2 circuit is zero passage detection and amplitude limiter circuit; Y3 is a monostable circuit; The Y4 circuit is connected into sine wave-square wave conversion circuit, makes prime for the counting frequency measurement and handles; Y5, Y6 constitute the 1000HZ low-pass filter; Y7 is a comparer, demodulated output data.In the present embodiment, the four high guaily unit integrated circuit is selected TL084 for use.
Two, vibration, modulating unit (see figure 4)
This unit mainly is made of a slice four high guaily unit and two-way four transmission gates of a slice, and wherein, Y3, Y4 circuit constitute quadrature oscillator, and Y1, Y2 form push-pull amplifier, and four transmission gates are connected between oscillator and the amplifier.Four high guaily unit is selected TL084 for use in the present embodiment, and four transmission gates are selected CD4066 for use.
Three, time clock unit (see figure 5)
This unit is made up of phase-locked clock circuit in position and Second pulse circuit.Wherein, Second pulse circuit is made of the crystal oscillator of binary counter, two J-K flip flop, two decade counter and fo=307.2KC.By the oscillating impulse of crystal oscillator output through binary counter two divided-frequency step by step, the final stage output frequency is the pulse of 300HZ, be barricaded as 300 frequency dividing circuits through two J-K flip flop 3 frequency divisions and two decade counter 100 frequency divisions again, at last by two decade counter output pulse per second (PPS)s, the shell panel T17 connection terminal of meeting sb. at the airport.Binary counter is selected CD4040 for use in the present embodiment, and J-K flip flop is selected CD4027 for use, and two decade counters are selected CD4518 for use.
Four, counting display unit (see figure 6)
This unit is by 4 two-decade counting units, four binary-coded decimal code translators, four charactrons, the two monostable formations of a slice, a CP end ground connection of decade counting unit, the LE end of another CP end and R end and binary-coded decimal code translator is held corresponding linking to each other with a, b, the c of function change-over switch 5K respectively.Switch 5K is 3 * 3 switches, and a 8V stabilivolt is arranged between 5Kb and the decade counter, and 5Ka links to each other with monostable trigger Q end through 10K resistance.5KC links to each other by button AN and monostable trigger Q end, and three of 5K respectively to frequency measurement, and accumulative total and error rate test play the switching effect.In the present embodiment, binary-decade counter is selected CD4518 for use, and the binary-coded decimal code translator is selected CD4511 for use, two monostable CD4098 that select for use, and monostable Q and code translator LE line work the effect of latching, and Q and counter R end line play the zero clearing effect.During measured frequency, the return-to-zero of the latching of CD4511, LE, CD4518, the R pulse obtains the pulse per second (PPS) decomposition by CD4098.And when the measurement count and the bit error rate, make its not return-to-zero of return-to-zero end and open latching by functional switch 5K.
Five, switch transition unit (see figure 8)
This unit is made of 16 way switch 3Kn of the printed-board receptacle transformation of the way of two groups of toggle switches or toggle switch 1Kn, 2Kn, panel connection terminal Tn, each unit interconnector end tn and one 32 line.This unit is that digital-transmission multifunctional tester can have multi-functional key.Respectively have the conversion of the unit of standalone feature through this each switch of unit, one-tenth capable of being combined has the different instruments of complete test function.
In the present embodiment, first group of switch 1Kn selects 1 * 2 toggle switch for use, totally 16, is used for sending high or low level (go up and dial to high, set aside to low).Second group of switch 2Kn is 2 * 2 toggle switches, sets aside on the corresponding pin and panel connection terminal Tn that makes 1Kn be linked to each IC sheet socket; Go up group corresponding pin that then simultaneously makes the IC sheet and connect with the corresponding line of step-by-step display unit, one side is connected the output terminal of panel connection terminal Tn and certain element circuit or incoming line.2Kn is corresponding with 1Kn, is 16 altogether, and its use-pattern has three kinds:
One, sets aside entirely, then the exportable 16 bit parallel numbers of T1-16.
Two, dial on the part, part is set aside, and uses when digital IC sheet functional test.
Three, when doing all other tests, preferably all go up and dial so that each unit of relevant test can process binding post Tn and aerial lug or each unit be coupled to each other.
Among the figure, 12K is one 1 * 2 power change-over switch, and upward dialling is 10V, is used to detect CMOS integrated circuit slice, thin piece, sets aside to be 5V, is used for the detection to the TTL integrated circuit.
Six, step-by-step display unit (see figure 7)
This unit is made up of transistor and LED.Transistor is the driving circuit of LED, and its way is corresponding with the switch way of switch transition unit, and each LED can show one road level.High level is bright, and low level is put out.
3Kn in this unit is corresponding to double-sided metal inserted sheet (printed-board receptacle) switch that shows way (16), when detecting digital IC sheet function, 3K1-16 all disconnects, when 2Kn upward dials, the n pin of IC sheet is just received n position display unit, its output level of decidable is a height or low, and when being used for other functional test, 3K1-16 and switch transition unit are all connected, 16 display units show in the shifting deposit unit current potential of 3K1-16 in the d type flip flop successively, and should not have any IC sheet on the IC sheet socket this moment again.
Seven, shifting deposit unit (see figure 9)
This unit is by three two 4 bit shift register and three 6D triggers, one 6 * 3 function change-over switch 4K, adds the coincidence circuit that two 8 input end rejection gates form with four 4 XOR gate and constitutes.In the present embodiment, two 4 bit shift register adopt CD4015, and the 6D trigger adopts CD40174, and 4 XOR gate adopt CD4030, and 8 input rejection gates adopt CD4078.
As switch 4K during in position 1, form one 24 shift register by three CD4015, use for editor, storage or reception serial code, when 4K pushes 2(or 3) during the position, above-mentioned shift register is divided into the shift register of two 9 (or 3), adds the XOR gate of being introduced by 3 positions of switch, two 511 yards or 7 bit codes formation circuit have just been constituted, one supplies to send, and one for reception relatively, and whether inspection is error code.When error rate test, change-over switch 1K1-8 in the switch transition unit should all set aside, like this, the coincidence circuit of being made up of CD4030 and CD4078 just becomes a zero-detection circuit, promptly as long as A-H is zero entirely, CD4078 just goes out 1, to prevent that 511 yards or 7 bit codes from forming that circuit stops (sending out complete " 0 " sign indicating number) and when receiving serial code, this coincidence circuit has had new purposes again, promptly with 1K1-16 discharge receive in the serial code, (16 of known bytes, as EB90), when the A-P position of shift register and this byte all met, two CD4078 all went out 1, promptly go out 1 with door, claim coincidence impulse.Therefore, the pulse enable storer begins to walk continuously a little, deposits the serial code of receiving by turn in.
Several main applications are not only held a concurrent post in this unit, and it is all more terse than the circuit structure of known any error rate tester that its used reception error code forms circuit.
Eight, storage unit (see figure 10)
P-S parallel-serial conversion circuit, a slice 4K * 1 random access memory that this unit selects a transmission gate to constitute by a slice 16, the address code that 1/2 binary-coded decimal counter and a slice binary counter constitute forms circuit, and two 6 homophase devices constitute.
It is preceding to send serial code (in the 4K position), and switches such as 6K, 7K, 8K, 9K on the panel are placed editor, connect point and deposit the position in.Press the each byte (16) of discharging of signaling order by the 1K1-16 switch, press the AN switch once, pulse control unit just sends continuous 15 pace pulses, and to order about CD4067 be serial code with the parallel code conversion of 1K1-16 discharge, deposits in the random access memory by turn.When needing after depositing in to send continuously, place transmissions, connect and read-out position gets final product being arranged on switch 6K, 7K, switches such as 8K, 9K on the panel.
Nine, level measurement unit (seeing Figure 11)
This unit is one and measures the simple and easy decibel meter that the audible communication electricity is taken by force, is made of a slice four high guaily unit integrated circuit and peripheral circuit.Wherein: Y1 is the backward crossover stream amplifier, and its enlargement factor is less and adjustable, as output calibration; Y2, Y3 are connected into accurate full wave rectifier; Y4 is connected into the homophase follower, and its DC voltage retaining of exporting available common multimeter is read.Under various audio levels, use than the decibel meter and the D.C. voltmeter of standard before using and measure reading simultaneously, make the table of comparisons of Bei Nai and DC voltage so that use later on.In the present embodiment, four high guaily unit is selected TL084 for use.
Ten, rectification stable pressuring unit (seeing Figure 12)
This unit has also added one group of adjustable D.C. regulated power supply except that for each circuit of complete machine provides the dc supply, with the series connection of two groups of voltages can obtain the following unipolarity voltage of 0-24V, 0.5A or ± 10V.The bipolar voltage output of ± 5V.
11, faceplate part (see figure 2)
From top to bottom, first row is 19 binding post T0-18 among the figure, and its content and wiring are as follows:
The output of T0 10V voltage, the 10V of order unit 10.
T1 modulator control input end, through 2K1 connect the vibration modulating unit t1.
T2 error code output terminal meets the t2 of shifting deposit unit through 2K2.
The T3 serial data sends, and meets the t3 of memory unit through 2K3.
The T4 serial data receives, and meets the t4 of memory unit through 2K4.
T5 modulator data are imported, and meet the t5 of vibration modulating unit through 2K5.
T6, T7 modulator passage are exported, and meet t6, the t7 of vibration modulating unit through 2K6,2K7.
T8, the input of T9 detuner passage.Meet t8, the t9 of demodulation frequency senser through 2K8,2K9.
The T10 demodulating data is exported, and meets the t1 of demodulation frequency senser through 2K10.
The phase-locked input of T11 meets the t11 of time clock unit through 2K11.
The T12 synchronous clock is exported, and meets the t12 of time clock unit through 2K12.
T13 frequency measurement square wave is exported, and meets the t13 of demodulation frequency senser through 2K13.
The input of T14 frequency measurement counting meets the t14 that counts display unit through 2K14.
The T15 coincidence impulse is exported, and meets the t15 of shifting deposit unit through 2K15.
The input of T16 gate supplies external survey pulse width through 2K16.
The T17 pulse per second (PPS) is exported, and directly is connected to the T17 of time clock unit.
T18 OV directly is connected to rectification stable pressuring unit OV end, and makes the public ground of output, input signal.
Second row is 16 red light emitting diodes, and the one end connects+5V altogether, and the other end connects 16 transistorized collectors of step-by-step display unit respectively.The right W1 is the 4.7K potentiometer, is used for regulating the output of rectification stable pressuring unit 0-12V voltage.
The 3rd row is 41 * 2 toggle switch 6K, 7K, 8K, 9K, 4 adjustable resistance W2-5,1 * 6 toggle switch 10K and two 1 * 2 toggle switch 11K, 12K successively.6-9K is the storer gauge tap entirely, is connected in the memory cell circuits, and its purposes is as follows:
6K control deposits several sources in, and upward dialling is to deposit external data, and setting aside is to deposit self-editing data (by 1K2 switch pair sign indicating number, coming through P-S parallel-serial conversion) in.
The whereabouts of 7K control read number, on transfer and see off, set aside to stepping back four road rdma reads certainly.
8K control store address.Upward dialling is to advance continuously, and setting aside is to be interrupted to advance, and whenever walks 16 by an AN key.
9K control store duty, upward dialling is to deposit in, sets aside and reads.
Purposes and the wiring of W2-5 are:
W2 regulates the output amplitude of modulator;
Modulating frequency when W3 regulates the input high level " 1 " of modulator;
Modulating frequency when W4 regulates modulator input low level " 0 ";
Above-mentioned three potentiometers all are connected in the vibration modulating unit
W5 regulates 1S frequency " fo " in the detuner frequency discrimination, is connected in the frequency measurement demodulating unit.
10K is a speed selector switch, and totally 6 retainings are connected in the time clock unit.
11K is CMOS and Transistor-Transistor Logic level selector switch, goes up to dial power supply 10V is received 12K, sets aside power supply 5V is received 12K.
12K is power supply (VDD or the Vcc) switch of IC sheet socket, goes up and dials VDD or Vcc and the 11K connection that makes IC sheet socket, sets aside to disconnected.
The 4th row is 6 * 3 switch 4K successively, 16 2 * 2 switch 2K1-16 and 6 * 3 switch 5K.
The 5th row (a promptly bottom row) is 16 1 * 2 toggle switch 1K1-16, and its right has AN button, this button to comprise a normally closed contact and a normal opened contact.Normally closed contact is connected in the counting display unit, plays accumulative total and bit error rate return-to-zero effect.Normal opened contact is connected in the memory cell, with walking a usefulness (clicked away for 15 steps, deposit or read 16 figure places in) when advancing so that storage address is " interruption ".
There are 4 charactrons, 8 green LEDs (be used for 256 address usefulness of display-memory, meet the L1-18 of storer), 14,16,18,24 pin IC sheet sockets and 7 subtest two core consents that are used to test the above IC sheet of 16 pin in panel the right.
The right survey of cabinet has a 3Kn combination hub, when surveying IC sheet function, needs the double-sided metal inserted sheet is inserted the 3Kn socket, socket and display circuit could be connected.Understand whether operate as normal of IC sheet by observation display spare.
Accomplished as far as possible optimization owing to consist of the circuit of each unit of the present invention, make it simple in structure, greatly-little two printed circuit boards, volume is little by (325 * 165 * 60mm3), weight is light (to be connected outer suitcase gross weight and is no more than 3.5 kilograms, the reliability height, again because conversion switch can carry out the switching of multiple test function, it is multiple functional that digital-transmission multifunctional tester of the present invention is had, a tractor serves several purposes, outstanding advantages easy to carry, therefore, appearance of the present invention will produce positive effect to the development of far starting building to do, and will be subjected to the vast very big welcome of being engaged in the technical staff that does of far starting building.
Claims (9)
1, a kind of digital-transmission multifunctional tester, it is characterized in that it is by demodulation frequency measurement (unit 1), time clock (unit 2), vibration modulation (unit 3), counting shows (unit 4), switch transition (unit 5), level measurement (unit 6), step-by-step shows (unit 7), shift LD (unit 8), memory (unit 9), rectification, voltage stabilizing ten unit (or module) such as (unit 10) and cabinet and panel are formed, the input end of each unit and output terminal link to each other with corresponding function change-over switch or connection terminal on the panel respectively, can connect into the combinational circuit of different test functions by the conversion of switch, the input and output connection terminal is arranged on the panel, charactron, light emitting diode, potentiometer, toggle switch, change-over switch and integrated circuit test socket.
2, digital-transmission multifunctional tester as claimed in claim 1, it is characterized in that the demodulation frequency senser is made up of two four high guaily unit integrated circuit and a small amount of Resistor-Capacitor Unit, wherein, the Y1 circuit is connected into wien bridge circuit and makes bandpass filter, Y2 partly is connected into zero passage detection and amplitude limiter circuit, Y3 is connected into monostable circuit, and Y4 and peripheral 100K, 10K, three resistance of 6.8K constitute sine wave-square wave conversion circuit jointly.
3, digital-transmission multifunctional tester as claimed in claim 1, it is characterized in that vibration, demodulating unit is made up of a slice four high guaily unit integrated circuit and a slice four transmission gates, wherein, Y3, Y4 form quadrature oscillator, two 100K potentiometers and a transmission gate are arranged between the two, Y1, Y2 constitute push-pull amplifier, have connected a 10K potentiometer and a transmission gate between amplifier and the oscillator.
4, digital-transmission multifunctional tester as claimed in claim 1, it is characterized in that the time clock unit has comprised the phase-locked synchronous clock pulse two parts of pulse per second (PPS) and position, wherein, Second pulse circuit is by crystal oscillator, a slice binary counter, the two decade counters of a slice J-K flip flop and a slice are formed frequency divider, by two decade counter output pulse per second (PPS)s.
5, digital-transmission multifunctional tester as claimed in claim 1, it is characterized in that counting display unit is made of four decade counting units, four binary-coded decimal code translators, four charactrons, the two function change-over switch 5K monostable and 3 * 3 of a slice, wherein, the R end bridging line of decade counting unit links to each other with the Q end of double single steady circuit by a 10K Ω resistance, the LE bridging line of BCD code translator links to each other with two monostable Q ends, 5Kb has a 5.1K resistor and a 8V stabilivolt to the decade counter branch road, an AN button is arranged between R bridging line and the 5KC.
6, digital-transmission multifunctional tester as claimed in claim 1, it is characterized in that the switch transition unit is by two group of 2 * 2 toggle switch 1Kn, 2Kn, double-sided metal inserted sheet switch 3Kn and level conversion switch 12K form, 1Kn is 1 * 2 switch, one end ground connection, the other end is connected with high level, and cutter links to each other with the end of 2Kn; 2Kn is 2 * 2 switches, one cutter links to each other with connection terminal Tn, another cutter links to each other with IC socket Cn pin, one end links to each other with 1Kn, and the other end connects the instrument internal unit respectively and links tn and display driver circuit, and the 3Kn switch disconnects when surveying IC entirely, and when other is tested full-mesh, have only all-pass, disconnected two states entirely, 12K is 1 * 2 switch, connects 10V and 5V direct supply respectively.
7, digital-transmission multifunctional tester as claimed in claim 1.It is characterized in that shifting deposit unit is by three two 4 bit shift register,, the function change-over switch 4K of three on three slices 6D triggers, six cutter and four 4 XOR gate add the coincidence circuit that two 8 input end rejection gates form and constitute, when switch 4K forms one 24 shift register during in position 1, at position 2(or 3) time, above-mentioned 24 bit shift register are divided into the shift register of two 9 (or 3), this moment, circuit inserted XOR gate, constituted two 511 yards (or 7 bit codes) and formed circuit.
8, digital-transmission multifunctional tester as claimed in claim 1, it is characterized in that memory cell comprises that a slice 16 selects a transmission gate, the address code that a slice 4K * 1 random access memory, 1/2 BCD counter and a slice binary counter constitute forms circuit and two six level-conversion circuits that the homophase device constitutes.
9, digital-transmission multifunctional tester as claimed in claim 1, it is characterized in that the level measurement unit is made of a slice four high guaily unit integrated circuit and peripheral circuit, wherein, Y1 constitutes the backward crossover stream amplifier, between its input and the output potentiometer is arranged, Y3, Y4 are connected into accurate full wave rectifier, and Y2 is connected into the homophase follower.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 90105828 CN1056942A (en) | 1990-05-31 | 1990-05-31 | Digital-transmission multifunctional tester |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 90105828 CN1056942A (en) | 1990-05-31 | 1990-05-31 | Digital-transmission multifunctional tester |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN1056942A true CN1056942A (en) | 1991-12-11 |
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ID=4879629
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 90105828 Pending CN1056942A (en) | 1990-05-31 | 1990-05-31 | Digital-transmission multifunctional tester |
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| Country | Link |
|---|---|
| CN (1) | CN1056942A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102156771A (en) * | 2011-01-20 | 2011-08-17 | 北京中星微电子有限公司 | Method and device for generating data path according to bit value |
| CN112098480A (en) * | 2020-09-03 | 2020-12-18 | 河北地质大学 | Electrochemical sensor change-over switch with adjustable channel quantity |
| CN112904104A (en) * | 2021-01-15 | 2021-06-04 | 欧拓飞科技(珠海)有限公司 | Method for product function test by using graphical interface |
-
1990
- 1990-05-31 CN CN 90105828 patent/CN1056942A/en active Pending
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102156771A (en) * | 2011-01-20 | 2011-08-17 | 北京中星微电子有限公司 | Method and device for generating data path according to bit value |
| CN102156771B (en) * | 2011-01-20 | 2016-08-17 | 北京中星微电子有限公司 | A kind of method and apparatus generating data path according to bit value |
| CN112098480A (en) * | 2020-09-03 | 2020-12-18 | 河北地质大学 | Electrochemical sensor change-over switch with adjustable channel quantity |
| CN112098480B (en) * | 2020-09-03 | 2022-08-09 | 河北地质大学 | Electrochemical sensor change-over switch with adjustable channel quantity |
| CN112904104A (en) * | 2021-01-15 | 2021-06-04 | 欧拓飞科技(珠海)有限公司 | Method for product function test by using graphical interface |
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