CN105675710A - Ionization chamber and photoionization sensor - Google Patents
Ionization chamber and photoionization sensor Download PDFInfo
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- CN105675710A CN105675710A CN201610205460.7A CN201610205460A CN105675710A CN 105675710 A CN105675710 A CN 105675710A CN 201610205460 A CN201610205460 A CN 201610205460A CN 105675710 A CN105675710 A CN 105675710A
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- ionization chamber
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/62—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode
- G01N27/64—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode using wave or particle radiation to ionise a gas, e.g. in an ionisation chamber
- G01N27/66—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode using wave or particle radiation to ionise a gas, e.g. in an ionisation chamber and measuring current or voltage
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J27/00—Ion beam tubes
- H01J27/02—Ion sources; Ion guns
- H01J27/24—Ion sources; Ion guns using photo-ionisation, e.g. using laser beam
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Abstract
The invention discloses an ionization chamber and a photoionization sensor, wherein the ionization chamber is used for the photoionization sensor and comprises an ionization chamber main body (1) provided with an ionization cavity (10), a filter membrane (2) and a circuit board (3) which are respectively and hermetically arranged at two ends of the ionization cavity (10), and an air inlet nozzle (4) and an air outlet nozzle (5) which are communicated with the ionization cavity (10); the air inlet nozzle (4) and the air outlet nozzle (5) are arranged on the same side of the ionization chamber main body (1). The beneficial effects of the implementation of the invention are as follows: the ionization chamber is of a structure that the air inlet nozzle and the air outlet nozzle are arranged on the same side of the main body of the ionization chamber, so that gas to be detected entering the ionization chamber can be retained in the ionization chamber for a long time, and gas molecules to be detected can be fully and uniformly ionized in the ionization chamber, and the performances of the photoionization sensor, such as sensitivity, repeatability, anti-interference capability, response time and the like, can be improved.
Description
Technical field
The present invention relates to gas detection technology field, more particularly, it relates to a kind of ionization chamber and optic ionized sensor.
Background technology
PID (detection of PhotoIonizationDetection photoionization) technology obtains as one accurately and effectively detection means and is increasingly widely applied. The ultimate principle of PID is to utilize ultraviolet produced by noble gas vacuum discharge phenomenon, makes gas molecule to be measured ionize, and by current intensity produced by the gas after measurement ionizing, thus obtaining gas concentration to be measured.
PID sensor (optic ionized sensor) is generally made up of the critical piece such as ultraviolet light source and ionization chamber. Being provided with positive and negative electrode in ion chamber to form electric field, organic volatile molecule, under the exciting of high energy ultraviolet, produces electronics and positively charged ion. The microgranule of these ionization forms electric current between electrode, and device amplifies and output current signal after process after testing, eventually detects the concentration of PPM level. In prior art, gas molecule to be measured often can not get fully and uniformly ionizing in ionization chamber, and makes the key performances such as the sensitivity of whole PID sensor, repeatability, capacity of resisting disturbance, response time poor.
Summary of the invention
The technical problem to be solved in the present invention is in that, for the drawbacks described above of prior art, it is provided that ionization chamber that a kind of gas molecule to be measured can be ionized adequately and uniformly and optic ionized sensor.
The technical solution adopted for the present invention to solve the technical problems is: construct a kind of ionization chamber, for optic ionized sensor, including offering the ionization chamber main body of ionization chamber, the filter coating being sealingly mounted at described ionization chamber two ends respectively and circuit board, and the suction nozzle being connected with described ionization chamber and outlet nozzle; Described suction nozzle and described outlet nozzle are arranged on the same side of described ionization chamber main body.
In ionization chamber of the present invention, described ionization chamber main body offers, away from one end of described filter coating, the air inlet duct and outgassing groove that are connected respectively with described ionization chamber; Described air inlet duct and described outgassing groove are positioned at the same side of described ionization chamber main body; Described suction nozzle is connected with described air inlet duct; Described outlet nozzle is connected with described outgassing groove.
In ionization chamber of the present invention, described filter coating runs through and offers leaky hole.
In ionization chamber of the present invention, described ionization chamber also includes the first electrode slice and the second electrode slice that are inserted on described circuit board; Described first electrode slice is arranged with one end the second electrode slice stacking.
In ionization chamber of the present invention, described first electrode slice runs through and offers the first leaky hole; Described second electrode slice runs through and offers the second leaky hole; Described leaky hole, described first leaky hole and described second leaky hole three are coaxially disposed.
In ionization chamber of the present invention, described circuit board is arranged with the laminating of described ionization chamber main body; Between described circuit board and described ionization chamber main body, sealing ring is installed.
In ionization chamber of the present invention, described ionization chamber main body offers annular mounting groove away from the side of described filter coating; Described sealing ring is arranged in described mounting groove.
In ionization chamber of the present invention, the inwall of described ionization chamber is radially arranged limited location projection; Described filter coating and described spacing preiection support mutually.
In ionization chamber of the present invention, described filter coating is made up of Teflon.
The present invention have also been constructed a kind of optic ionized sensor, including uviol lamp, and the ionization chamber described in example performed as described above; Described uviol lamp and described filter coating are oppositely arranged.
Implement ionization chamber and the optic ionized sensor of the present invention, have the advantages that described ionization chamber adopts and be arranged on the suction nozzle of ionization chamber main body the same side and the structure of outlet nozzle, the gas to be measured entering described ionization chamber is made to be trapped in ionization chamber for a long time, now gas molecule to be measured can obtain fully and uniformly ionizing in described ionization chamber, and then can improve the performances such as the sensitivity of optic ionized sensor, repeatability, capacity of resisting disturbance and response time.
Accompanying drawing explanation
Below in conjunction with drawings and Examples, the invention will be further described, in accompanying drawing:
Fig. 1 is the perspective view of the ionization chamber that present pre-ferred embodiments provides;
Fig. 2 is the explosive view of the ionization chamber shown in Fig. 1;
Fig. 3 is the structure chart of the ionization chamber main body in the ionization chamber shown in Fig. 1;
Fig. 4 is another structure chart of the ionization chamber main body in the ionization chamber shown in Fig. 1;
Fig. 5 is the first electrode slice in the ionization chamber shown in Fig. 1 and the second electrode slice installation structure chart on circuit boards;
Fig. 6 is the perspective view of the optic ionized sensor that present pre-ferred embodiments provides.
Detailed description of the invention
In order to the technical characteristic of the present invention, purpose and effect are more clearly understood from, now comparison accompanying drawing describes the specific embodiment of the present invention in detail. Should be appreciated that specific embodiment described herein is only in order to explain the present invention, is not intended to limit the present invention. It should be noted that the orientation term such as left and right, upper and lower in the embodiment of the present invention, be only relative concept or with the normal operating condition of product for reference each other, and should not be regarded as have restrictive.
As shown in Figure 1, Figure 2, shown in Fig. 3, Fig. 4 and Fig. 5, presently preferred embodiments of the present invention provides a kind of ionization chamber, and it includes ionization chamber main body 1, filter coating 2, circuit board 3, suction nozzle 4, outlet nozzle 5, sealing ring the 6, first electrode slice 7 and the second electrode slice 8.
Specifically, such as Fig. 3, Fig. 4 and consult shown in Fig. 1 and Fig. 2, this ionization chamber main body 1 is rectangular structure, and it offers ionization chamber 10, and the two ends of ionization chamber 10 are packaged with filter coating 2 and circuit board 3 respectively.This ionization chamber 10 is the ionization place that gas to be detected occurs when ionizing, and it runs through the both ends of the surface up and down (direction as shown) being opened in ionization chamber main body 1. In the present embodiment, ionization chamber 10 is cylindrical-shaped structure, namely offers manhole in ionization chamber main body 1 to form this ionization chamber 10. In other embodiments of the invention, ionization chamber main body 1 is not limited to rectangular structure, and it can also be the structure such as cylindric or irregularly shaped; The structure of ionization chamber 10 is also not limited to cylindrical-shaped structure, and it can also be the structure such as square.
Such as Fig. 2 and consult shown in Fig. 1 and Fig. 3, this filter coating 2 is encapsulated in ionization chamber 10 one end away from circuit board 3, and during optic ionized sensor work, ultraviolet enters in ionization chamber 10 through this filter coating 2. In the present embodiment, filter coating 2 adopts Teflon to make, namely filter coating 2 is Teflon filter coating, and it has good corrosion resistance and the performance such as heat-resisting. The inwall of ionization chamber 10 is radially arranged limited location projection 13, and filter coating 2 and spacing preiection 13 support mutually, so that filter coating 2 can be securely encapsulated at one end of ionization chamber 10.
In this embodiment, filter coating 2 runs through and offers leaky hole 21. Preferably, this leaky hole 21 is arranged on the center of filter coating 2. Adopt the structure of this leaky hole 21, make to be arranged on the ultraviolet that the uviol lamp 100 (see Fig. 6) above filter coating 2 sends and enter in ionization chamber 10 only by leaky hole 21, thus effectively limiting the vacuum-ultraviolet light avoiding disordered chain, the irradiation of the components and parts within ionization chamber 10 is corroded, and then ensure the stable running of optic ionized sensor.
Such as Fig. 5 and consult shown in Fig. 1 and Fig. 2, this circuit board 3 is provided with the components and parts such as the first electrode slice 7 and the second electrode slice 8 to form electric field. The profile of this circuit board 3 is suitable with the profile of ionization chamber main body 1, and its laminating is arranged on the ionization chamber main body 1 side away from filter coating 2. In the present embodiment, circuit board 3 is PCBA board, and itself and ionization chamber main body 1 adopt screw element (not shown) to be attached, and arranges with the laminating both realizing.
As shown in Figure 1 and Figure 2, suction nozzle 4 is connected with ionization chamber 10 respectively with outlet nozzle 5, and this suction nozzle 4 is for entering in ionization chamber 10 for gas to be detected, and this outlet nozzle 5 is for discharging from ionization chamber 10 for the gas to be detected after ionization. In the present embodiment, suction nozzle 4 and outlet nozzle 5 are arranged on the same side of ionization chamber main body 1. Ionization chamber main body 1 offers, away from one end of filter coating 2, the air inlet duct 11 and outgassing groove 12 that are connected respectively with ionization chamber 10, and air inlet duct 11 and outgassing groove 12 are positioned at the same side of ionization chamber main body 1. Suction nozzle 4 is connected with air inlet duct 11, and outlet nozzle 5 is connected with outgassing groove 12. Adopt this structure, optic ionized sensor work time, gas to be detected enters in ionization chamber 10 from suction nozzle 4, and along ionization chamber 10 circular arc wall around one circle after, discharging ionization chamber 10 from the outlet nozzle 5 being positioned at the same side, wherein the flow direction of gas to be detected is shown in Figure 4. Adopt said structure, the gas to be measured enabling to enter described ionization chamber can be trapped in ionization chamber 10 for a long time, so that gas molecule to be measured can obtain fully and uniformly ionizing in described ionization chamber, and then the performances such as the sensitivity of optic ionized sensor, repeatability, capacity of resisting disturbance and response time can be improved.
Such as Fig. 3 and consult shown in Fig. 2, in this embodiment, the one side of ionization chamber main body 1 offers air inlet 15 and venthole 16, and this side is disposed adjacent with the end face being provided with circuit board 3 in ionization chamber main body 1.This air inlet 15 is connected with air inlet duct 11, and suction nozzle 4 is arranged in this air inlet 15. This venthole 16 is connected with outgassing groove 12, and outlet nozzle 5 is arranged in this venthole 16. During optic ionized sensor work, gas to be detected sequentially passes through suction nozzle 4, air inlet 15 and air inlet duct 11 and enters in ionization chamber 10, and the gas to be detected after ionization is discharged from outgassing groove 12, venthole 16 and outlet nozzle 5 successively.
As shown in Fig. 2 and Fig. 4, this sealing ring 6 is arranged between circuit board 3 and ionization chamber main body 1, to increase the sealing between circuit board 3 and ionization chamber main body 1, and then is effectively prevented from ionization chamber 10 and produces gas leak phenomenon. In the present embodiment, ionization chamber main body 1 offers annular mounting groove 14 away from the side of filter coating 2, sealing ring 6 is arranged in mounting groove 14, adopt this structure, enable to sealing ring 6 and be firmly mounted between circuit board 3 and ionization chamber main body 1, to guarantee the sealing between circuit board 3 and ionization chamber main body 1. Preferably, sealing ring 6 adopts rubber or silica gel sealing ring.
Such as Fig. 5 and consult shown in Fig. 2, the first electrode slice 7 and the second electrode slice 8 are inserted on circuit board 3, and the first electrode slice 7 and the second electrode slice 8 stacking are arranged. During work, electric field is formed between first electrode slice 7 and the second electrode slice 8, gas to be detected excites lower generation electronics and positively charged ion ultraviolet, the microgranule of these ionization forms electric current between the first electrode slice 7 and the second electrode slice 8, device (not shown) amplifies and output current signal after process after testing, eventually detects the concentration of PPM level.
In the present embodiment, the first electrode slice 7 and the second electrode slice 8 are square laminated structure, and four drift angles of the first electrode slice 7 are all convexly equipped with the first pin 72, and four drift angles of the second electrode slice 8 are all convexly equipped with the second pin 82. Correspondingly, circuit board 3 is provided with four four first slots 31 suitable with the first pin 72 and four four second slots 32 suitable with the second pin 82. When first electrode slice 7 and the second electrode slice 8 are inserted on circuit board 3, both are that stacking is arranged. Preferably, the first electrode slice 7 and the second electrode slice 8 all adopt stainless steel material to make.
In this embodiment, the first electrode slice 7 running through and offers the first leaky hole 71, this first leaky hole 71 is arranged on the center of the first electrode slice 7. Running through on second electrode slice 8 and offer the second leaky hole 81, this second leaky hole 81 is arranged on the center of the second electrode slice 8. Preferably, the first leaky hole 71 in leaky hole the 21, first electrode slice 7 in filter coating 2 and the second leaky hole 81 three in the second electrode slice 8 are coaxially disposed, adopt this structure, the normal operation that ultraviolet direct projection the first electrode slice 7 produces unexpected free electron and disturbs sensor can be effectively prevented from, and then ensure the stable running of optic ionized sensor.
As shown in Figure 6, presently preferred embodiments of the present invention also provides for a kind of optic ionized sensor, and it includes uviol lamp 100, and as above ionization chamber described in any embodiment. Uviol lamp 100 and filter coating 2 are oppositely arranged, and the ultraviolet produced when uviol lamp 100 works enters in ionization chamber 10 through filter coating 2. Use the optic ionized sensor described in example performed as described above, owing to described ionization chamber adopts the structure of the suction nozzle 4 and outlet nozzle 5 being arranged on ionization chamber main body 1 the same side, the gas to be measured entering described ionization chamber can be trapped in ionization chamber 10 for a long time, now gas molecule to be measured can obtain fully and uniformly ionizing in described ionization chamber, and then can improve the performances such as the sensitivity of optic ionized sensor, repeatability, capacity of resisting disturbance and response time.Furthermore, described ionization chamber adopts the leaky hole 21 in filter coating 2, the structure that the first leaky hole 71 in first electrode slice 7 and the second leaky hole 81 in the second electrode slice 8 are all coaxially disposed, the ultraviolet that uviol lamp 100 sends enters in ionization chamber 10 only by leaky hole 21, thus effectively limiting the vacuum-ultraviolet light avoiding disordered chain, the irradiation of the components and parts within ionization chamber 10 is corroded, and the normal operation that ultraviolet direct projection the first electrode slice 7 produces unexpected free electron and disturbs sensor can be effectively prevented from, and then ensure the stable running of optic ionized sensor.
Above in conjunction with accompanying drawing, embodiments of the invention are described; but the invention is not limited in above-mentioned detailed description of the invention; above-mentioned detailed description of the invention is merely schematic; rather than it is restrictive; those of ordinary skill in the art is under the enlightenment of the present invention; without departing under present inventive concept and scope of the claimed protection situation, it may also be made that a lot of form, these belong within the protection of the present invention.
Claims (10)
1. an ionization chamber, for optic ionized sensor, it is characterized in that: the ionization chamber main body (1) that includes offering ionization chamber (10), the filter coating (2) being sealingly mounted at described ionization chamber (10) two ends respectively and circuit board (3), and the suction nozzle (4) being connected with described ionization chamber (10) and outlet nozzle (5); Described suction nozzle (4) and described outlet nozzle (5) are arranged on the same side of described ionization chamber main body (1).
2. ionization chamber according to claim 1, it is characterised in that: described ionization chamber main body (1) offers, away from one end of described filter coating (2), the air inlet duct (11) and outgassing groove (12) that are connected respectively with described ionization chamber (10); Described air inlet duct (11) and described outgassing groove (12) are positioned at the same side of described ionization chamber main body (1); Described suction nozzle (4) is connected with described air inlet duct (11); Described outlet nozzle (5) is connected with described outgassing groove (12).
3. ionization chamber according to claim 1, it is characterised in that: described filter coating (2) runs through and offers leaky hole (21).
4. ionization chamber according to claim 3, it is characterised in that: described ionization chamber also includes the first electrode slice (7) and the second electrode slice (8) that are inserted on described circuit board (3); Described first electrode slice (7) is arranged with described second electrode slice (8) stacking.
5. ionization chamber according to claim 4, it is characterised in that: described first electrode slice (7) is run through and offers the first leaky hole (71); Described second electrode slice (8) is run through and offers the second leaky hole (81); Described leaky hole (21), described first leaky hole (71) and described second leaky hole (81) three are coaxially disposed.
6. ionization chamber according to claim 1, it is characterised in that: described circuit board (3) is arranged with the laminating of described ionization chamber main body (1); Sealing ring (6) is installed between described circuit board (3) and described ionization chamber main body (1).
7. ionization chamber according to claim 6, it is characterised in that: described ionization chamber main body (1) offers annular mounting groove (14) away from the side of described filter coating (2); Described sealing ring (6) is arranged in described mounting groove (14).
8. ionization chamber according to claim 1, it is characterised in that: the inwall of described ionization chamber (10) is radially arranged limited location projection (13); Described filter coating (2) and described spacing preiection (13) support mutually.
9. ionization chamber according to claim 1, it is characterised in that: described filter coating (2) is made up of Teflon.
10. an optic ionized sensor, it is characterised in that: include uviol lamp (100) and the ionization chamber as described in any one of claim 1～9; Described uviol lamp (100) and described filter coating (2) are oppositely arranged.
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| Application Number | Priority Date | Filing Date | Title |
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| CN201610205460.7A CN105675710B (en) | 2016-04-05 | 2016-04-05 | Ionization chamber and photoionization sensor |
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| CN201610205460.7A CN105675710B (en) | 2016-04-05 | 2016-04-05 | Ionization chamber and photoionization sensor |
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Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106092898A (en) * | 2016-08-04 | 2016-11-09 | 深圳市诺安环境安全股份有限公司 | Redundant online photoion analysis system and analysis method thereof |
| WO2018112732A1 (en) * | 2016-12-20 | 2018-06-28 | Honeywell International Inc. | Collection surface for electrodes in photoionization detector |
| CN110082453A (en) * | 2019-05-24 | 2019-08-02 | 北京市劳动保护科学研究所 | Photoionization detector |
| CN110587999A (en) * | 2019-09-18 | 2019-12-20 | 广州瑞多思医疗科技有限公司 | Ionization chamber glue filling technology and auxiliary clamp |
| CN111855850A (en) * | 2020-07-17 | 2020-10-30 | 汉威科技集团股份有限公司 | Portable photoionization detector and micro-chromatography and photoionization detection system |
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| CN106092898A (en) * | 2016-08-04 | 2016-11-09 | 深圳市诺安环境安全股份有限公司 | Redundant online photoion analysis system and analysis method thereof |
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| CN110587999A (en) * | 2019-09-18 | 2019-12-20 | 广州瑞多思医疗科技有限公司 | Ionization chamber glue filling technology and auxiliary clamp |
| CN111855850A (en) * | 2020-07-17 | 2020-10-30 | 汉威科技集团股份有限公司 | Portable photoionization detector and micro-chromatography and photoionization detection system |
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| CN105675710B (en) | 2019-02-01 |
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Address after: 518000 b1-1201, building b1b2, Guangming science and Technology Park, Investment Promotion Bureau, Fenghuang community, Fenghuang street, Guangming District, Shenzhen, Guangdong (business premises are set up in units 5B and 5C, building B6, Guangming science and Technology Park, Investment Promotion Bureau, Fenghuang community, Fenghuang street, Guangming District, Shenzhen to engage in production and business activities) Patentee after: Shenzhen noan intelligent Co.,Ltd. Address before: 518000 floor 5, building 8, zone 2, Zhongguan honghualing Industrial South Zone, No. 1213, Liuxian Avenue, Taoyuan Street, Nanshan District, Shenzhen City, Guangdong Province Patentee before: SHENZHEN NUOAN ENVIRONMENTAL & SAFETY Inc. |
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