CN105675024B - A kind of data read method, the device of resistive sensor array - Google Patents
A kind of data read method, the device of resistive sensor array Download PDFInfo
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Abstract
The invention discloses a kind of data read method of resistive sensor array, belong to sensor technical field.This method includes：Step 1, sharing line and alignment in advanceM×NA line is set up in resistive sensor arrayNMeasuring resistance known to individual resistance value, obtain shared a line and alignment（M+1）×NElectric resistance array；Step 2, by MUX, successively willM×NIn resistive sensor arraykRow ground connection, willM×NOther rows and measuring resistance row of resistive sensor array connect driving voltageV I , measure now the row voltage of the measurement voltage on measuring resistance row and each row, the column voltage respectively arranged；Step 3, the row, column voltage data obtained according to measurement, are calculated in electric resistance arrayM×NThe individual respective resistance value of resistive sensor.The invention also discloses a kind of data readout setup of resistive sensor array and a kind of sensor-based system.The present invention can realize the quick detection to resistive sensor array, and improve measurement accuracy and range.
Description
Technical field
The present invention relates to sensor technical field, more particularly to a kind of data read method of resistive sensor array, dress
Put.
Background technology
Array sensing device is exactly by multiple sensing elements with same performance, is combined according to the structure of two-dimensional array
Together, it can change by detecting the Parameters variation focused on array or generate corresponding form and feature.This is special
Property is widely used in bio-sensing, temperature tactile and thermal imaging based on infrared sensor etc. etc..
Resistive sensor array is widely used in Simulations of Infrared Image system, power tactilely-perceptible and temperature tactilely-perceptible.With
Exemplified by temperature tactile, due to being related to the transmission of heat and the perception of temperature in temperature sensation sensing device, to obtain the heat category of object
Property, device propose higher requirement to temperature measurement accuracy and resolution ratio, and in order to further obtain object diverse location material
The hot attribute that matter is shown, then higher spatial resolving power requirement is proposed to temperature sensation sensing device.
The quality or resolution ratio of resistive sensor array are needed by increasing the quantity of the sensor in array come increased.
However, when the scale of sensor array increases, information gathering and signal transacting to all components just become difficult.General feelings
Under condition, the progress of all sensors of a M N array is accessed one by one, and each sensor has two ports, altogether
Need 2 × M × N root connecting lines.Not only line is complicated for this connected mode, and can only select single testing resistance every time and carry out
Measurement, sweep speed is slow, cycle length, and efficiency is low.To reduce the complexity of device interconnection, shared line and alignment can be introduced
Two-dimensional array, scanning monitor is combined with single operational amplification circuit and MUX, but it necessarily increases circuit
Complexity, therefore how to reduce scanning times, reduce circuit complexity just into the problem for needing to capture together.
Detection on resistance-type sensor array is studied, and R.S.Saxena in 2006 et al. is proposed based on infrared thermal imaging
Array technology, test structure be based on resistance sensing network configure, based on resistance it is linear with it is homogeneity using compensate
Network theorem and stacking network theorem develop the theoretical model of the resistor network.Use 16 × 16 array network bolometer battle arrays
Row checking, using only 32 pins, it has already been proven that, the model can be effective for the minor variations of device failure or device value
Differentiate, it has certain precision, but technological deficiency in detection speed still be present.Y.J.Yang in 2009 et al. is proposed
The temperature and tactile sensing array of one 32 × 32 array, for the artificial skin of mechanical arm, the circuit is in order to ensure to detect
Precision, the interference of non-testing resistance, operational amplification circuit is all introduced in each row of array in mask array, and its circuit is complicated
Degree is greatly increased, and the interference of its internal resistance can not be avoided effectively, detection efficiency, circuit complexity and is avoided in electronic device
The interference of portion's equivalent internal resistance is as maximum technical bottleneck.
There is pertinent literature to propose a kind of to read by establishing sensor array and solving the method for resistor matrix equation
The resistance gone out in array.The first row of resistive array is arranged to measuring resistance by it, is gathered on corresponding column direction using ADC
Column voltage data, the first row is grounded successively to last column in the row direction, remaining row input high level, lead to during each
The voltage of respective column when the corresponding row of ADC extraction is grounded is crossed, matrix equation is listed, obtains resistance and measuring resistance in each column respectively
Relation and solution.Although this method is largely avoided crossfire, while reduce circuit complexity, detection speed
Also it is higher, but the presence of its equivalent internal resistance when exporting low and high level by single-chip microcomputer is not accounted for, while resistance hinders in array
Value scope is confined in a certain section, and the measurement problem for a wide range of resistance is again without solution, so also needing to seek
Seek a kind of method for the interference that can effectively avoid voltage output equivalent internal resistance, at the same be also required in resistance scope into
The expansion of one step.
The content of the invention
The technical problems to be solved by the invention are to overcome prior art insufficient, there is provided a kind of resistive sensor array
Data read method, device, it is possible to achieve to a certain row, multiple row and all physical quantity sensitive resistances in resistive sensor array
Quick detection, improve measurement accuracy and range.
It is of the invention specifically to solve above-mentioned technical problem using following technical scheme：
A kind of data read method of resistive sensor array, the resistive sensor array are classified as common row line and alignment
The resistive sensor arrays of M × N；The data read method is specific as follows：
Step 1, in the resistive sensor array measuring resistance known to row of N resistance value is set up in advance, so as to
Obtain (M+1) × N electric resistance arrays of new shared a line and alignment；
Step 2, by MUX, the row k in the resistive sensor arrays of M × N is grounded successively, k=1,2 ...,
M, other rows of the resistive sensor arrays of M × N and measuring resistance row are met into driving voltage VI, the row of measurement now measuring resistance row
Voltage Vrsk, the row voltage V of the i-th row of the resistive sensor arrays of M × Nrik, the column voltage V of jth rowcjk；Wherein, i=1,2 ...,
M, j=1,2 ..., N；
Step 3, the jth of the resistive sensor array is arranged successively, j=1,2 ..., N, M in the row is obtained using following formula
The individual respective resistance value of resistive sensor：
In formula, RijRepresent the resistance value of resistive sensor arranged in the resistive sensor array positioned at the i-th row, jth, i
=1,2 ..., M；RjRepresent the resistance of the measuring resistance in the jth row of electric resistance array.
A kind of data readout setup of resistive sensor array, the resistive sensor array are classified as common row line and alignment
The resistive sensor arrays of M × N；The data readout setup includes：
Measuring resistance row, it includes measuring resistance known to row of N resistance value, for accessing the resistive sensings of the M × N
Device array, so as to obtain (M+1) × N electric resistance arrays of new shared a line and alignment；
MUX, it is connected with (M+1) × N electric resistance arrays, and can be believed according to received scan control
Number cause should be in (M+1) × N electric resistance arrays any a line ground connection or meet driving voltage VI；
Scanning monitor, it is connected with the control terminal of the MUX, for sending scanning control to MUX
Signal processed；
Voltage sampling unit, can be to the row of the row voltage in (M+1) × N electric resistance arrays per a line and each row electricity
Press sampled measurements；
Computing unit, for the row, column voltage exported according to voltage sampling unit, obtain resistive biography using following formula successively
The M resistive respective resistance values of sensor in the jth row of sensor array, j=1,2 ..., N：
In formula, RijRepresent the resistance value of resistive sensor arranged in the resistive sensor array positioned at the i-th row, jth, i
=1,2 ..., M；RjRepresent the resistance of the measuring resistance in the jth row of electric resistance array；Vrxk、Vcyk、VrskRepresent to pass through institute respectively
MUX is stated to be grounded the row k in the resistive sensor arrays of M × N and other rows and mark of the resistive sensor arrays of M × N
Quasi- resistance row meets driving voltage VIWhen, the row electricity of the xth row of the resistive sensor arrays of M × N measured by voltage sampling unit
Column voltage, the row voltage of measuring resistance row of pressure, y row, x=1,2 ..., M, y=1,2 ..., N, k=1,2 ..., M.
Preferably, the 1st of (M+1) × N electric resistance arrays of shared line and alignment new described in the measuring resistance behavior
Row or M+1 rows.
Preferably, the MUX includes individual with the one-to-one M+1 of M+1 rows of (M+1) × N electric resistance arrays
The row of alternative bilateral analog switch, the public input/output terminal of each alternative bilateral analog switch and the row corresponding to it
Line connect, two independent input/output end respectively with test voltage, be connected, its control terminal is connected with scanning monitor.
Preferably, the voltage sampling unit includes column voltage sampling ADC and row voltage sample ADC, the column voltage are adopted
Sample ADC includes the N number of column voltage sampling channel to be connected one to one with the N bar alignments of (M+1) × N electric resistance arrays, described
Row voltage sample ADC includes adopting with the M+1 row voltage that the M+1 bar lines of (M+1) × N electric resistance arrays connect one to one
Sample passage.
A kind of data readout setup of resistive sensor array, the resistive sensor array are classified as common row line and alignment
The resistive sensor arrays of M × N；The data readout setup includes：
Measuring resistance row, it includes measuring resistance known to row of N resistance value, for accessing the resistive sensings of the M × N
Device array, so as to obtain (M+1) × N electric resistance arrays of new shared a line and alignment, and line where measuring resistance row
With driving voltage VIIt is directly connected to；
MUX, it is connected with the resistive sensor arrays of the M × N, and can be according to received scan control
Signal causes any a line in the resistive sensor arrays of the M × N to be grounded or connect driving voltage VI；
Scanning monitor, it is connected with the control terminal of the MUX, for sending scanning control to MUX
Signal processed；
Voltage sampling unit, can be to every the row voltage of a line and the row of each row in the resistive sensor arrays of the M × N
Voltage sample measures；
Computing unit, for the row, column voltage exported according to voltage sampling unit, obtain resistive biography using following formula successively
The M resistive respective resistance values of sensor in the jth row of sensor array, j=1,2 ..., N：
In formula, RijRepresent the resistance value of resistive sensor arranged in the resistive sensor array positioned at the i-th row, jth, i
=1,2 ..., M；RjRepresent the resistance of the measuring resistance in the jth row of electric resistance array；Vrxk、VcykRepresent respectively by described more
Row k in the resistive sensor arrays of M × N is grounded by road selector and other rows of the resistive sensor arrays of M × N connect excitation electricity
Press VIWhen, row voltage, the column voltage of y row of the xth row of the resistive sensor arrays of M × N measured by voltage sampling unit,
X=1,2 ..., M, y=1,2 ..., N, k=1,2 ..., M.
Preferably, the MUX includes and the one-to-one M of M rows of the resistive sensor arrays of the M × N individual two
Select the line of a bilateral analog switch, the public input/output terminal of each alternative bilateral analog switch and the row corresponding to it
Connection, two independent input/output end respectively with test voltage, be connected, its control terminal is connected with scanning monitor.
Preferably, the voltage sampling unit includes column voltage sampling ADC and row voltage sample ADC, the column voltage are adopted
Sample ADC includes the N number of column voltage sampling channel to be connected one to one with the N bar alignments of (M+1) × N electric resistance arrays, described
Row voltage sample ADC includes the M row voltage sample to be connected one to one with the M bar lines of the resistive sensor arrays of the M × N
Passage.
Following technical scheme can also be obtained according to identical invention thinking：
A kind of sensor-based system, including resistive sensor array and data readout setup, the resistive sensor array are classified as altogether
With the resistive sensor arrays of M × N of line and alignment, the data readout setup is that data described in any of the above technical scheme are read
Go out device.
Compared with prior art, the invention has the advantages that：
(1) the present invention be directed to the detection of resistive sensor array needs, the base of electric resistance array interconnection complexity is not being improved
On plinth, electrode voltage is synchronously fully sampled for key technology to test, and effectively eliminates the dry of switch resistance in MUX
Disturb and crosstalk error, improve measurement accuracy, while expand the Standard resistance range of physical quantity sensitive resistance in resistive sensor array.
(2) data read method of the present invention passes through most (M+1) secondary scannings, you can detects own in resistive sensor array
The resistance of physical quantity sensitive resistance, scanning survey speed are high, and the cycle is short, can effectively reduce the time and resistive sensor array is brought
Influence, if only needed, high-frequency detection is one or more, one or more columns per page resistance, it is not required that changes scanning monitor
Programming.
(3) data readout setup of the present invention only needs two kinds of devices of MUX and ADC, is ensuring measurement accuracy
Under the premise of, reduce the quantity and circuit complexity of line between device.
(4) any one row in the resistive sensor array of two dimension can be arranged to measuring resistance by the present invention, be entered in a column direction
The control of row low and high level input and output, the resistance of resistance in array is solved with behavior unit.
(5) present invention uses the two-dimentional resistive sensor array for sharing line and alignment, and according to (M+1) × N modes two
Line number can be reduced to M+N+1 roots, reduce the complexity of device interconnection by dimension distribution, the method.
Brief description of the drawings
Fig. 1 is the circuit diagram for the two-dimentional resistive sensor array for sharing line and alignment；
Fig. 2 is the circuit diagram of the electric resistance array obtained by addition measuring resistance row in the resistive sensor arrays of Fig. 1；
Fig. 3 is the circuit diagram of one preferred embodiment of sensor-based system of the present invention；
When Fig. 4 is data readout setup scanning the first row of the present invention, the electric current in resistive sensor array on each column column direction
Flow to schematic diagram；
When Fig. 5 is that data readout setup of the present invention scans the first row, first row resistor current rule in resistive sensor array
Rough schematic view；
First row in resistive sensor array when Fig. 6 is data readout setup of the present invention scanning resistive sensor array row k
The rough schematic view of resistor current rule.
Fig. 7 is the circuit diagram of another preferred embodiment of sensor-based system of the present invention；
Each label implication is as follows in figure：
1st, the two-dimentional electric resistance array of line and alignment is shared, 2, MUX, 3, scanning monitor, 4, column voltage sampling
ADC, 5, row voltage sample ADC.
Embodiment
Technical scheme is described in detail below in conjunction with the accompanying drawings：
The present invention is directed to present in the existing resistive sensor array e measurement technology based on solution resistor matrix equation not
Consider the presence of equivalent internal resistance, while resistance scope is confined to the deficiency in a certain section in array, proposes that one kind is based on
Electrode voltage synchronously fully sampled data read method, device are tested, can effectively avoid voltage output equivalent internal resistance to surveying
The interference of amount, it is possible to achieve the quick inspection to a certain row, multiple row and all physical quantity sensitive resistances in resistive sensor array
Survey, so as to improve measurement accuracy and range.
Data read method of the present invention specifically includes following steps：
Step 1, in the resistive sensor arrays of M × N of shared line and alignment to be measured set up row of N resistance in advance
Measuring resistance known to value, so as to obtain (M+1) × N electric resistance arrays of new shared a line and alignment.
Fig. 1 shows the basic circuit of the two-dimentional resistive sensor array of shared line and alignment.As shown in figure 1, the biography
Sensor array includes two groups of orthogonal lines respectively as shared line and shared alignment and is distributed according to M × N two-dimensional structure
Physical quantity sensitive resistance (i.e. resistive sensor) array, each physical quantity sensitive resistance one end in array connects corresponding row
Line, the other end connect corresponding alignment, and each resistance in array has the combination of unique line and alignment, in the i-th row
The resistance R of jth rowijRepresent, wherein, M is line number, and N is columns.Two-dimensional structure according to M × N may be such that using this structure
The array of distribution, it is only necessary to which M+N root line numbers can ensure that any one specific resistive element can be by controlling line
It is accessed with the respective combination of alignment, therefore required session number is greatly decreased.
Fig. 2 shows a tool of the electric resistance array obtained by addition measuring resistance row in the resistive sensor arrays of Fig. 1
Body example.As shown in Fig. 2 measuring resistance known to row of N resistance value is set up in the resistive sensor arrays of M × N, so as to
(M+1) × N electric resistance arrays of the shared line and alignment new to one.Specific set location of the invention to measuring resistance row is simultaneously
Unrestrictedly, certainly, simplest mode is to be disposed at the first row or last column of (M+1) × N electric resistance arrays, this example
In measuring resistance row be arranged at the first row of electric resistance array.
Step 2, by MUX, the row k in the resistive sensor arrays of M × N is grounded successively, k=1,2 ...,
M, other rows of the resistive sensor arrays of M × N and measuring resistance row are met into driving voltage VI, measurement is now on measuring resistance row
Measure voltage Vrsk, the row voltage V of the i-th row of the resistive sensor arrays of M × Nrik, the column voltage V of jth rowcjk；Wherein, i=1,
2 ..., M, j=1,2 ..., N.
Fig. 3 shows a preferred embodiment of sensor-based system of the present invention.As shown in figure 3, sensor-based system of the present invention includes
Share two-dimentional electric resistance array 1 and the corresponding data readout setup of line and alignment.The two-dimentional electric resistance array 1 is by M
Measuring resistance known to row of N the resistance value, (M of resulting shared line and alignment are set up in the resistive sensor arrays of × N
+ 1) × N electric resistance arrays.As shown in figure 3, the measuring resistance row in the present embodiment is arranged at the first row of electric resistance array, for ease of
Connection, as illustrated, each line shared in the electric resistance array, each alignment each test electrode for corresponding one, altogether
There are (M+1) individual row test electrode, N number of row test electrode.The measuring resistance R that jth arranges in the electric resistance arrayjRepresent (1≤j≤
N), positioned at the resistance R of (i+1) row jth rowijRepresent (1≤i≤M, 1≤j≤N).Data readout setup in the present embodiment
Including MUX 2, scanning monitor 3, column voltage sampling ADC 4 and row voltage sample ADC5.Wherein, MUX 2 wraps
Include and the one-to-one M+1 alternative bilateral analog switch of M+1 rows of (M+1) × N electric resistance arrays 1 (such as controllable list
Double-pole double throw switch), each alternative bilateral analog switch includes a public input/output terminal xriAnd two independent inputs/
Output end ari、bri(i=1,2 ..., M+1)；The a of MUX 2r1、ar2、…、ar(M+1)End and driving voltage VIIt is connected, it is more
The b of road selector 2r1、br2、…、br(M+1)End is connected with ground terminal, the control terminal and scan control of each alternative bilateral analog switch
Device 3 connects, and scanning monitor 3 exports scan control signal control MUX 2.The column voltage sampling ADC 4 includes
ADCc1、ADCc2、…、ADCcNAltogether N number of column voltage ADC sampling channels, and each ADC sampling channel respectively with electric resistance array 1
Row test electrode, which corresponds, to be connected, and the row voltage sample ADC5 includes ADCr1、ADCr2、…、ADCr(M+1)(M+1) individual row altogether
Voltage ADC sampling channels, and row test electrode of each row voltage ADC sampling channels respectively with electric resistance array 1 corresponds
It is connected.
Scanning monitor 3 exports scan control signal, controls the connected mode of the inner port of MUX 2, that is, controls it
xriEnd and ariEnd or and briEnd is connected (1≤i≤M+1).Scanning monitor 3 by control signal control MUX 2 according to
Second row of secondary selected (M+1) × N electric resistance arrays selectes the resistive sensings of M × N in addition to measuring resistance row to M+1 rows
The first row of device array is to M rows, when selecting the first row of resistive sensor array, the x of MUX 2r2End and br2Hold phase
Even, br2End is connected with ground terminal, the x of other rowsr1、xr3、…、xr(M+1)End respectively with ar1、ar3、…、ar(M+1)End is connected, ar1、
ar3、…、ar(M+1)End with driving voltage VIIt is connected, when circuit works, column voltage is simultaneously and rapidly read by column voltage sampling ADC 4
Go out, be designated as Vc11、Vc21、…、VcN1, row voltage simultaneously and rapidly read by row voltage sample ADC5, is designated as Vrs1、Vr11、…、
VrM1, wherein, Vrs1、Vcj1And Vrx1When (1≤x≤M) represents to select the first row of resistive sensor array respectively, measuring resistance row
ADC sampled voltages, the ADC sampled voltages of jth row and the ADC sampled voltages of resistive sensor array xth row, then Vc11、
Vc21、…、VcN1And Vrs1、Vr11、…、VrM1As one group select resistive sensor array the first row when N number of column voltage data
(M+1) individual row voltage data；When selecting to the row k of resistive sensor array, the x of MUX 2r(k+1)End and br(k+1)
End is connected, br(k+1)End is connected with ground terminal, the x of other rowsr1、xr2、…、xrk、xr(k+2)、…、xr(M+1)End respectively with ar1、
ar2、…、ark、ar(k+2)、…、ar(M+1)End is connected, ar1、ar2、…、ark、ar(k+2)、…、ar(M+1)End with driving voltage VIPhase
Even, when circuit works, column voltage is simultaneously and rapidly read by column voltage sampling ADC 4, is denoted as Vc1k、Vc2k、…、VcNk, row voltage
Simultaneously and rapidly read by row voltage sample ADC5, be denoted as Vrsk、Vr1k、…、VrMk, wherein, Vrsk、VcjkAnd Vrxk(1≤x≤M)
When representing to select the row k ground connection of resistive sensor array, the ADC sampled voltages of measuring resistance row, the ADC sampling electricity of jth row
The ADC sampled voltages with the xth row of resistive sensor array are pressed, then Vc1k、Vc2k、…、VcNkAnd Vrsk、Vr1k、Vr2k、…、VrMkI.e.
For one group of row k for selecting resistive sensor array when N number of column voltage data and (M+1) individual row voltage data；Select successively
All rows can obtain M group row, column voltage datas altogether.
Step 3, the row, column voltage data obtained according to scanning, it is each to calculate M in electric resistance array 1 × N number of resistive sensor
From resistance value.
For any one row in electric resistance array, its electricity can be obtained according to Kirchhoff's current law (KCL) and M group voltage datas
Flow equation.Arranged in the case of jth, when selecting 1 row of resistive sensor array, driving voltage VIBy the passage of MUX
ar1、ar3、…、ar(M+1)Through switch resistance RsrAfter act on resistance Rj、R2j、…、RMj, then test electrode through j-th of row and act on
R1jAfterwards by the x of MUXr2End is through passage br2Export to ground terminal, the x of MUXr1、xr2、…、xr(M+1)The port at end
Voltage is respectively Vrs1、Vr11、Vr21、…、VrM1, the voltage of j-th of row test electrode is Vcj1, that is, choose first group of voltage data
In row voltage and first column voltage；When selecting the row k of resistive sensor array, driving voltage VIBy MUX
Passage ar1、…、ark、ar(k+2)、…、ar(M+1)Through switch resistance RsrAfter be respectively acting on resistance Rj、R1j、…、R(k-1)j、
R(k+1)j、…、RMj, then test electrode through j-th of row and act on RkjAfterwards by the x of MUXr(k+1)End is through passage br(k+1)It is defeated
Go out to ground terminal, the x of MUXr1、xr2、…、xr(M+1)The port voltage at end is respectively Vrsk、Vr1k、Vr2k、…、VrMk, jth
The voltage of individual row test electrode is Vcjk, that is, choose the row voltage and j-th of column voltage in kth group voltage data；Select successively straight
To the M rows of resistive sensor array.According to Kirchhoff's current law (KCL) and M group voltage datas, M equation is can obtain altogether such as
Under：
Wherein, Rj, it is known that R1j、…、RMjFor unknown quantity.
Solve equation.(1) formula is converted into Matrix division AX=b forms, arranged
Understand, in the case where A is reversible, X=A-1B, X hinder for all physical quantity sensitive resistances of the row (i.e. resistive sensor)
The column vector reciprocal of value, is solved：
From (3), it is quick that the vector that each element in vectorial X obtains after inverted is contained into all physics of the row
The resistance of sensibility reciprocal resistance.
Similarly, obtain the resistance of remaining columns resistance in array one by one as stated above, finally give in electric resistance array 1 and own
The resistance of physical quantity sensitive resistance, and then physical quantity sensitive resistance present position can be obtained by resistance-physical quantity conversion
Physical quantity.
Fig. 4 shows current direction during scanning (M+1) × N electric resistance array the first rows.The figure so that the first row is grounded as an example,
When circuit works, driving voltage VIBy the passage a of MUXr1、ar3、…、ar(M+1)Through switch resistance RsrAct on respectively afterwards
In first row resistance R1、R21、…、RM1, secondary series resistance R2、R22、…、RM2..., Nth column resistance RN、R2N、…、RMN, then through phase
The row test electrode answered acts on R11、R12、…、R1NAfterwards by the x of MUXr2End is through passage br2Export to ground terminal.By scheming
Middle electric current instruction, it can be seen from Kirchhoff's current law (KCL),
The rough schematic view of first row resistor current rule when Fig. 5 is the first row of the scanning resistive sensor arrays of M × N.
For the figure when the first row ground connection of the resistive sensor arrays of M × N exemplified by first row resistance, the row of row voltage sample ADC samplings is electric
Pressure is respectively Vrs1、Vr11、Vr21、…、VrM1, the first row column voltage of column voltage sampling ADC sampling is Vc11, by (4) formula
Knowable to one current equation,
The rough schematic view of first row resistor current rule when Fig. 6 is the row k of the scanning resistive sensor arrays of M × N.OK
The row voltage of voltage sample ADC samplings is respectively Vrsk、Vr1k、Vr2k、…、VrMk, the row of the first row of column voltage sampling ADC sampling
Voltage is Vc1k, can be obtained by k-th of current equation in (4) formula：
From (5), (6) formula, according to M group voltage datas, the M equation that can list first row is as follows：
Known quantity is moved on the right of equation, and is write this M equation group as matrix form equation, it is as follows：
(8) formula is corresponded into AX=b, it is known that, in the case where A is reversible, X=A-1B, X are that all physical quantitys of the row are sensitive
The column vector reciprocal of resistance is as follows：
From (9), each element in vectorial X is inverted, then the vector obtained contains all physics of the row
The resistance of sensitivity amount resistance.
Above-mentioned calculating process can be completed online by the computing unit being connected with row, column voltage sample ADC, can also be offline
Complete.The computing unit can be separately provided, and directly can also be realized using the scanning monitor.
Without loss of generality, for the resistive sensor arrays of M × N of shared line and alignment, row of N is inserted wherein
Measuring resistance known to resistance value (insertion position is unlimited, preferable insertion position for new shared line and alignment (M+1) ×
The 1st row or M+1 rows of N electric resistance arrays), so as to obtain (M+1) × N Resistor Array Projectors of new shared a line and alignment
Row；Formula (9) can be utilized to obtain M resistive respective resistance values of sensor in the jth row of resistive sensor array successively, j=1,
2,…,N.Wherein, RijRepresent the resistance value of resistive sensor arranged in the resistive sensor array positioned at the i-th row, jth, i=
1,2,…,M；RjRepresent the resistance of the measuring resistance in the jth row of electric resistance array；Vrxk、Vcyk、VrskRepresent respectively by described
MUX other rows and standard of the resistive sensor arrays of M × N by the row k ground connection in the resistive sensor arrays of M × N
Resistance row meets driving voltage VIWhen, the row voltage of the xth row of the resistive sensor arrays of M × N measured by voltage sampling unit,
Column voltage, the row voltage of measuring resistance row of y row, x=1,2 ..., M, y=1,2 ..., N, k=1,2 ..., M.
In summary, the present invention can effectively avoid interference of the voltage output equivalent internal resistance to measurement, it is possible to achieve right
The quick detection of a certain row, multiple row and all physical quantity sensitive resistances in resistive sensor array, so as to improve measurement accuracy
And range.
Fig. 7 shows another preferred embodiment of sensor-based system of the present invention.As shown in fig. 7, sensor-based system bag of the present invention
Include the two-dimentional electric resistance array 1 of shared line and alignment and corresponding data readout setup.The two-dimentional electric resistance array 1 be by
Measuring resistance known to row of N resistance value is set up in the resistive sensor arrays of M × N, resulting shared line and alignment
(M+1) × N electric resistance arrays.As shown in fig. 7, for ease of connecting, the measuring resistance row in the present embodiment is arranged at electric resistance array
The first row, and measuring resistance row is fixedly attached to driving voltage VI, it is double so as to reduce alternative all the way compared to a upper embodiment
To analog switch and all the way row sampling ADC, and measuring resistance row magnitude of voltage is fixed as VI；As illustrated, the resistive sensings of the M × N
Each corresponding test electrode, shared (M+1) individual row test electricity to each line, each alignment shared in device array
Pole, N number of row test electrode.The measuring resistance R that jth arranges in the electric resistance arrayjRepresent (1≤j≤N), positioned at the resistive biographies of M × N
The physical quantity sensitive resistance R of the i-th row of sensor array jth rowijRepresent (1≤i≤M, 1≤j≤N).Data in the present embodiment
Read-out device includes MUX 2, scanning monitor 3, column voltage sampling ADC 4 and row voltage sample ADC5.Wherein, multichannel
Selector 2 include with the one-to-one M alternative bilateral analog switch of M rows of the resistive sensor arrays of the M × N (such as
Controllable single-pole double-throw switch (SPDT)), each alternative bilateral analog switch includes a public input/output terminal xriAnd two independences
Input/output terminal ari、bri(i=1,2 ..., M)；The a of MUX 2r1、ar2、…、arMEnd and driving voltage VIIt is connected, it is more
The b of road selector 2r1、br2、…、brMEnd is connected with ground terminal, control terminal and the scanning monitor 3 of each alternative bilateral analog switch
Connection, scanning monitor 3 export scan control signal control MUX 2.The column voltage sampling ADC 4 includes ADCc1、
ADCc2、…、ADCcNN number of column voltage ADC sampling channels altogether, and row of each ADC sampling channel respectively with electric resistance array 1 are surveyed
Try electrode one-to-one corresponding to be connected, the row voltage sample ADC5 includes ADCr1、ADCr2、…、ADCrMCommon M row voltage ADC samplings
Passage, and row test electrode of each row voltage ADC sampling channels respectively with the resistive sensor arrays of M × N corresponds phase
Even.
Scanning monitor 3 exports scan control signal, controls the connected mode of the inner port of MUX 2, that is, controls it
xriEnd and ariEnd or and briEnd is connected (1≤i≤M).Scanning monitor 3 controls MUX 2 successively by control signal
The first row of the selected resistive sensor arrays of M × N is to M rows, when selecting the first row of resistive sensor array, MUX
2 xr1End and br1End is connected, br1End is connected with ground terminal, the x of other rowsr2、xr3、…、xr(M+1)End respectively with ar2、ar3、…、
ar(M+1)End is connected, ar2、ar3、…、ar(M+1)End with driving voltage VIIt is connected, when circuit works, column voltage is adopted by column voltage
Sample ADC4 is simultaneously and rapidly read, and is designated as Vc11、Vc21、…、VcN1, row voltage simultaneously and rapidly read by row voltage sample ADC5, is remembered
For Vr11、…、VrM1, wherein, Vcj1And Vrx1When (1≤x≤M) represents to select the first row of resistive sensor array respectively, jth row
ADC sampled voltages and resistive sensor array xth row ADC sampled voltages, then Vc11、Vc21、…、VcN1And Vr11、…、VrM1
As one group select resistive sensor array the first row when N number of column voltage data and M row voltage data；Select to resistive
During the row k of sensor array, the x of MUX 2rkEnd and brkEnd is connected, brkEnd is connected with ground terminal, the x of other rowsr1、
xr2、…、xr(k-1)、xr(k+1)、…、xrMEnd respectively with ar1、ar2、…、aR (k-1)、ar(k+1)、…、arMEnd is connected, ar1、ar2、…、
aR (k-1)、ar(k+1)、…、arMEnd with driving voltage VIIt is connected, when circuit works, column voltage is synchronous by column voltage sampling ADC 4
It is quick to read, it is denoted as Vc1k、Vc2k、…、VcNk, row voltage simultaneously and rapidly read by row voltage sample ADC5, is denoted as Vr1k、…、
VrMk, wherein, VcjkAnd VrxkWhen (1≤x≤M) represents to select the row k ground connection of resistive sensor array, the ADC samplings of jth row
The ADC sampled voltages of the xth row of voltage and resistive sensor array, then Vc1k、Vc2k、…、VcNkAnd Vr1k、Vr2k、…、VrMkAs
One group select resistive sensor array row k when N number of column voltage data and M row voltage data；All rows are selected successively
M group row, column voltage datas are can obtain altogether.Similarly, resulting M group row, column voltage datas are utilized, you can also according to formula
(9) resistance value of the resistive sensor of each in resistive sensor array is calculated, and then obtains the thing of sensor present position
Reason amount.Because the row voltage of the present embodiment Plays resistance row is fixed as VI, therefore formula (9) can be rewritten as following form：
Two specific embodiments of the present invention are these are only, in order to public understanding, it is emphasized that：Above-mentioned row, column
For relative concept, those skilled in the art completely can exchange it, the part such as MUX and ranks voltage sample
Specific implementation can also use various existing or will have a technology；Those skilled in the art, it should be understood that based on thinking of the present invention it is similar this
Kind simple deformation is still covered by technical solution of the present invention.
Claims (10)
1. a kind of data read method of resistive sensor array, the resistive sensor array are classified as the M of common row line and alignment
The resistive sensor arrays of × N；Characterized in that, the data read method is specific as follows：
Step 1, in the resistive sensor array measuring resistance known to row of N resistance value is set up in advance, so as to obtain
(M+1) × N electric resistance arrays of one new shared line and alignment；
Step 2, by MUX, the row k in the resistive sensor arrays of M × N is grounded successively, k=1,2 ..., M, will
Other rows and measuring resistance row of the resistive sensor arrays of M × N meet driving voltage VI, the row voltage of measurement now measuring resistance row
Vrsk, the row voltage V of the i-th row of the resistive sensor arrays of M × Nrik, the column voltage V of jth rowcjk；Wherein, i=1,2 ..., M, j
=1,2 ..., N；
Step 3, the jth to the resistive sensor array arrange, and j=1,2 ..., N, obtain M resistance in the row using following formula successively
The property respective resistance value of sensor：
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In formula, RijRepresent to be located at the i-th row, the resistance value for the resistive sensor that jth arranges in the resistive sensor array, i=1,
2,…,M；RjRepresent the resistance of the measuring resistance in the jth row of electric resistance array.
2. data read method as claimed in claim 1, it is characterised in that new shared line described in the measuring resistance behavior
With the 1st row or M+1 rows of (M+1) × N electric resistance arrays of alignment.
3. a kind of data readout setup of resistive sensor array, the resistive sensor array are classified as the M of common row line and alignment
The resistive sensor arrays of × N；Characterized in that, the data readout setup includes：
Measuring resistance row, it includes measuring resistance known to row of N resistance value, for accessing the resistive sensor arrays of the M × N
Row, so as to obtain (M+1) × N electric resistance arrays of new shared a line and alignment；
MUX, it is connected with (M+1) × N electric resistance arrays, and can be made according to received scan control signal
Any a line that must be somebody's turn to do in (M+1) × N electric resistance arrays is grounded or connect driving voltage VI；
Scanning monitor, it is connected with the control terminal of the MUX, for sending scan control letter to MUX
Number；
Voltage sampling unit, the row voltage in (M+1) × N electric resistance arrays per a line and the column voltage of each row can be adopted
Sample measures；
Computing unit, for the row, column voltage exported according to voltage sampling unit, obtain resistive sensor using following formula successively
The M resistive respective resistance values of sensor in the jth row of array, j=1,2 ..., N：
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In formula, RijRepresent to be located at the i-th row, the resistance value for the resistive sensor that jth arranges in the resistive sensor array, i=1,
2,…,M；RjRepresent the resistance of the measuring resistance in the jth row of electric resistance array；Vrxk、Vcyk、VrskRepresent respectively by described more
Road selector other rows and standard electric of the resistive sensor arrays of M × N by the row k ground connection in the resistive sensor arrays of M × N
Resistance row meets driving voltage VIWhen, the row voltage of the xth row of the resistive sensor arrays of M × N measured by voltage sampling unit,
Column voltage, the row voltage of measuring resistance row of y row, x=1,2 ..., M, y=1,2 ..., N, k=1,2 ..., M.
4. data readout setup as claimed in claim 3, it is characterised in that new shared line described in the measuring resistance behavior
With the 1st row or M+1 rows of (M+1) × N electric resistance arrays of alignment.
5. data readout setup as claimed in claim 3, it is characterised in that the MUX includes and (the M+1) × N
The one-to-one M+1 alternative bilateral analog switch of M+1 rows of electric resistance array, each alternative bilateral analog switch it is public
Input/output terminal with its corresponding to the line of row be connected, two independent input/output end respectively with test voltage, even
Connect, its control terminal is connected with scanning monitor.
6. data readout setup as claimed in claim 3, it is characterised in that the voltage sampling unit samples including column voltage
ADC and row voltage sample ADC, the column voltage sampling ADC include a pair of the N bars alignment 1 with (M+1) × N electric resistance arrays
The N number of voltage sample passage that should be connected, the row voltage sample ADC include the M+1 bar rows with (M+1) × N electric resistance arrays
The M+1 voltage sample passage that line connects one to one.
7. a kind of data readout setup of resistive sensor array, the resistive sensor array are classified as the M of common row line and alignment
The resistive sensor arrays of × N；Characterized in that, the data readout setup includes：
Measuring resistance row, it includes measuring resistance known to row of N resistance value, for accessing the resistive sensor arrays of the M × N
Row, so as to obtain (M+1) × N electric resistance arrays of new shared a line and alignment, and line where measuring resistance row is with swashing
Encourage voltage VIIt is directly connected to；
MUX, it is connected with the resistive sensor arrays of the M × N, and can be according to received scan control signal
So that any a line in the resistive sensor arrays of the M × N is grounded or connect driving voltage VI；
Scanning monitor, it is connected with the control terminal of the MUX, for sending scan control letter to MUX
Number；
Voltage sampling unit, can be to every the row voltage of a line and the column voltage of each row in the resistive sensor arrays of the M × N
Sampled measurements；
Computing unit, for the row, column voltage exported according to voltage sampling unit, obtain resistive sensor using following formula successively
The M resistive respective resistance values of sensor in the jth row of array, j=1,2 ..., N：
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In formula, RijRepresent to be located at the i-th row, the resistance value for the resistive sensor that jth arranges in the resistive sensor array, i=1,
2,…,M；RjRepresent the resistance of the measuring resistance in the jth row of electric resistance array；Vrxk、VcykRepresent to select by the multichannel respectively
Select device by the resistive sensor arrays of M × N row k ground connection and other rows of the resistive sensor arrays of M × N meet driving voltage VI
When, row voltage, the column voltage of y row of the xth row of the resistive sensor arrays of M × N measured by voltage sampling unit, x=
1,2 ..., M, y=1,2 ..., N, k=1,2 ..., M.
8. data readout setup as claimed in claim 7, it is characterised in that the MUX includes resistive with the M × N
The one-to-one M alternative bilateral analog switch of M rows of sensor array, each alternative bilateral analog switch it is public defeated
Enter/output end with its corresponding to the line of row be connected, two independent input/output end respectively with test voltage, be connected,
Its control terminal is connected with scanning monitor.
9. data readout setup as claimed in claim 7, it is characterised in that the voltage sampling unit samples including column voltage
ADC and row voltage sample ADC, the column voltage sampling ADC include a pair of the N bars alignment 1 with (M+1) × N electric resistance arrays
The N number of voltage sample passage that should be connected, the row voltage sample ADC include the M bar rows with the resistive sensor arrays of the M × N
The M voltage sample passage that line connects one to one.
10. a kind of sensor-based system, including resistive sensor array and data readout setup, it is characterised in that the resistive sensing
Device array is the resistive sensor arrays of M × N for sharing line and alignment, and the data readout setup is that claim 3~9 is any
The item data readout setup.
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| CN106597111B (en) * | 2016-12-12 | 2019-02-12 | 南京工程学院 | High-precision two-dimensional electric resistance array reading circuit |
| CN106841812B (en) * | 2016-12-12 | 2019-02-12 | 南京工程学院 | Anti- power jitter two dimension electric resistance array reading circuit |
| CN106597110B (en) * | 2016-12-12 | 2019-02-12 | 南京工程学院 | The two-dimentional quick reading circuit of electric resistance array |
| CN107063312B (en) * | 2017-01-20 | 2019-08-13 | 东南大学 | Resistive sensor array measuring device and method |
| WO2019140693A1 (en) * | 2018-01-22 | 2019-07-25 | 中国科学院微电子研究所 | Method for realizing logic calculation based on cross array structure of resistive switching device |
| CN109059969A (en) * | 2018-08-13 | 2018-12-21 | 中国科学院电子学研究所 | A kind of resistive sensor array reading circuit and measurement method |
| CN115628761B (en) * | 2022-09-30 | 2023-10-13 | 华南理工大学 | Low-power-consumption anti-disturbance resistance type sensor and wearable equipment |
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