CN105716633A - Test circuit for resistive sensor array based on two-wire system isopotential method - Google Patents
Test circuit for resistive sensor array based on two-wire system isopotential method Download PDFInfo
- Publication number
- CN105716633A CN105716633A CN201610058747.1A CN201610058747A CN105716633A CN 105716633 A CN105716633 A CN 105716633A CN 201610058747 A CN201610058747 A CN 201610058747A CN 105716633 A CN105716633 A CN 105716633A
- Authority
- CN
- China
- Prior art keywords
- resistive sensor
- variable connector
- alignment
- sensor array
- test
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
- G01D5/12—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means
- G01D5/14—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing the magnitude of a current or voltage
- G01D5/16—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing the magnitude of a current or voltage by varying resistance
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
- Measurement Of Resistance Or Impedance (AREA)
Abstract
The invention discloses a test circuit for a resistive sensor array based on a two-wire system isopotential method, and belongs to the technical field of sensors. The test circuit aims at the M*N 2D resistive sensor array in which row and column lines are shared; and the test circuit comprises a current feedback operation amplifier, N column line driving operation amplifiers, an equal current M-to-1 multipath switch, an isopotential M-to-1 multipath switch, N column line 2-to-1 multipath switch, a test current setting resistor, a reference voltage source and two connecting wires, and the connecting wires is used for the row lines and the column lines of the resistive sensor array. The invention also discloses a test method of the test circuit and a sensing system. Compared with the prior art, the test circuit uses the two-wire system isopotential method as key technology, measuring errors caused by lead resistance of connecting cables, contact resistance of cable joints and conduction resistance of multipath switch channels can be eliminated effectively, and the measuring precision of the resistive sensor array is greatly improved.
Description
Technical field
The present invention relates to sensor technical field, particularly relate to a kind of resistive Sensor array circuit.
Background technology
Array sensing device is exactly to have multiple sensing elements of same performance, according to two-dimensional array structural grouping together, it can pass through to detect focus on Parameters variation on array, changes or generates corresponding form and feature.This characteristic is widely used in bio-sensing, temperature sense of touch and the aspect such as thermal imaging based on infrared sensor etc..
Resistive sensor array is widely used in Simulations of Infrared Image system, power tactilely-perceptible and temperature tactilely-perceptible.For temperature sense of touch, owing to thermo aesthesia sensing device relating to the transmission of heat and the perception of temperature, for obtaining the hot attribute of object, temperature measurement accuracy and resolution are proposed higher requirement by device, and in order to obtain the hot attribute that object diverse location material shows further, then thermo aesthesia sensing device is proposed higher spatial resolving power requirement.
The quality of resistive sensor array or resolution are that the quantity requiring over the sensor increased in array increases.But, when the scale of sensor array strengthens, information gathering and signal processing to all components and parts just become difficulty.Generally, the carrying out of all of resistive sensor of a M N array to be accessed one by one, and each resistive sensor has two ports, needs 2 × M × N root connecting line altogether.This connected mode not only line is complicated, and can only select single testing resistance every time, and scanning speed is slow, and the cycle is long, and efficiency is low.For reducing the complexity of device interconnection, researcher is had to propose the two-dimensional array structure of shared line and alignment.Fig. 1 shows the structure of the resistive sensor array of two dimension of shared line and alignment.As shown in Figure 1, this sensor array includes two groups of orthogonal line respectively as shared line and shared alignment and physical quantity sensitive resistance (the i.e. resistive sensor) array being distributed according to the two-dimensional structure of M × N, each physical quantity sensitive resistance one end in array connects corresponding line, the other end connects corresponding alignment, each resistance in array has the combination of unique line and alignment, is in the resistance R of the i-th row jth rowijRepresenting, wherein, M is line number, and N is columns.Adopt this kind of structure can make the array being distributed according to the two-dimensional structure of M × N, it is only necessary to M+N root line number can ensure that any one specific resistive element can be accessed by the respective combination of control line and alignment, and therefore required session number is greatly decreased.
The resistive sensor array of common row alignment typically requires by longer cable connecting test circuit, and there is lead resistance on many of longer connection cable lead-in wires, and its resistance is essentially identical between the lead-in wire of the many materials such as isometric, and increases with length of cable and increase；There is contact resistance in the contact being simultaneously connected with between the plug of cable and socket, for every pair of contact, its contact resistance resistance is different and change (about 0～3 Ω) within the specific limits with its contact condition (contact condition of contact in time, mechanical vibration etc. all can change).The measuring accuracy of resistive sensor array is existed and significantly affects by the contact resistance that the essentially identical lead resistance of resistance is different with resistance.It is based on the resistive sensor array of common row alignment of equipotential method, lead resistance and contact resistance result in the electric potential difference between test drives end and resistive sensor array module drive end, result also in the electric potential difference between test circuit sampling end and resistive sensor array module sampling end simultaneously, thus the ideal destroying test circuit isolates feedback condition, the resistance measurement error of unit under test is made to become big.Therefore essentially identical connection cable tail resistance and different cable connector contact resistances are notable on the impact of the common row alignment resistive Sensor array result based on equipotential method, simultaneously traditional method there is also the channel conductive resistance of variable connector can affect the measurement error of to-be-measured cell, and the impact how eliminating these factors is a problem needed to be studied.
Summary of the invention
The technical problem to be solved is in that to overcome prior art not enough, a kind of resistive Sensor array circuit based on two-wire system equipotential method and method of testing thereof are provided, can effectively eliminate measurement error produced by connection cable tail resistance, cable connector contact resistance and Multiplexer Channel conducting resistance, the certainty of measurement of resistive sensor array is greatly improved.
The present invention specifically solves above-mentioned technical problem by the following technical solutions:
Based on the resistive Sensor array circuit of two-wire system equipotential method, described resistive sensor array is classified as M × N resistive sensor array of two dimension of common row line and alignment；Described test circuit includes: current feedback amplifier, N number of column line drive amplifier, the electric current M such as select a variable connector, an equipotential M to select a variable connector, N number of alignment alternative variable connector, test current setting resistor, reference voltage source, and for two connecting lines that each line and the alignment of described resistive sensor array is respectively provided with；One_to_one corresponding between the N bar alignment of N number of column line drive amplifier, N number of alignment alternative variable connector and resistive sensor array, every alignment is connected by the outfan of a connecting line column line drive amplifier corresponding thereto, this alignment is connected by the inverting input of another root connecting line column line drive amplifier corresponding thereto simultaneously, and the in-phase input end of each column line drive amplifier passes through the common port of the alignment alternative variable connector corresponding thereto outfan with zero potential or with current feedback amplifier and is connected；Equipotential M select a variable connector M separate end, etc. electric current M select M separate end of a variable connector and M bar line one_to_one corresponding, every line selects the corresponding separate end of a variable connector to connect by a connecting line with equipotential M, and by another root connecting line with etc. electric current M select the corresponding separate end of a variable connector to connect；Equipotential M selects the common port of a variable connector to be connected with the inverting input of current feedback amplifier, and the in-phase input end of current feedback amplifier connects zero potential；Selecting the common port of a variable connector to be connected with test current setting resistor one end Deng electric current M, the test current setting resistor other end is connected with reference voltage source.
The method of testing of circuit tested as described above, for the resistive sensor to be measured of any one in described resistive sensor array, first this resistive sensor to be measured of gating, specific as follows: the outfan making the in-phase input end of this resistive sensor place to be measured corresponding column line drive amplifier of alignment connect current feedback amplifier by described N number of alignment alternative variable connector, and the in-phase input end of the corresponding column line drive amplifier of other alignment is all connected with zero potential, and by etc. electric current M select a variable connector and equipotential M to select a variable connector to make the inverting input of this resistive sensor place to be measured line and current feedback amplifier, test current setting resistor connects simultaneously, and other line is unsettled；Then following formula is utilized to calculate the resistance R of this resistive sensor to be measuredxy:
Wherein, VxyFor the electromotive force of current feedback amplifier outfan, VeThe common port of a variable connector is selected to be connected the electromotive force of one end with electric current M such as grade for test current setting resistor, VIFor the reference voltage that reference voltage source provides, RsetFor testing the resistance value of current setting resistor.
Techniques below scheme can also be obtained according to identical invention thinking:
Based on the resistive Sensor array circuit of two-wire system equipotential method, described resistive sensor array is classified as M × N resistive sensor array of two dimension of common row line and alignment；It is characterized in that, described test circuit includes: current feedback amplifier, N number of column line drive amplifier, the electric current M such as select a variable connector, an equipotential M to select a variable connector, N number of alignment alternative variable connector, test current setting resistor, reference voltage source, and for two connecting lines that each line and the alignment of described resistive sensor array is respectively provided with；One_to_one corresponding between the N bar alignment of N number of column line drive amplifier, N number of alignment alternative variable connector and resistive sensor array, every alignment is connected by the outfan of a connecting line column line drive amplifier corresponding thereto, this alignment is connected by the inverting input of another root connecting line column line drive amplifier corresponding thereto simultaneously, and the in-phase input end of each column line drive amplifier passes through the common port of the alignment alternative variable connector corresponding thereto outfan with reference voltage source or with current feedback amplifier and is connected；Equipotential M select a variable connector M separate end, etc. electric current M select M separate end of a variable connector and M bar line one_to_one corresponding, every line selects the corresponding separate end of a variable connector to connect by a connecting line with equipotential M, and by another root connecting line with etc. electric current M select the corresponding separate end of a variable connector to connect；Equipotential M selects the common port of a variable connector to be connected with the inverting input of current feedback amplifier, and the in-phase input end of current feedback amplifier connects reference voltage source；Selecting the common port of a variable connector to be connected with test current setting resistor one end Deng electric current M, the test current setting resistor other end is connected with zero potential.
The method of testing of circuit tested as described above, for the resistive sensor to be measured of any one in described resistive sensor array, first this resistive sensor to be measured of gating, specific as follows: the outfan making the in-phase input end of this resistive sensor place to be measured corresponding column line drive amplifier of alignment connect current feedback amplifier by described N number of alignment alternative variable connector, and the in-phase input end of the corresponding column line drive amplifier of other alignment is all connected with reference voltage source, and by etc. electric current M select a variable connector and equipotential M to select a variable connector to make the inverting input of this resistive sensor place to be measured line and current feedback amplifier, test current setting resistor connects simultaneously, and other line is unsettled；Then following formula is utilized to calculate the resistance R of this resistive sensor to be measuredxy:
Wherein, VxyFor the electromotive force of current feedback amplifier outfan, VeThe common port of a variable connector is selected to be connected the electromotive force of one end with electric current M such as grade for test current setting resistor, VIFor the reference voltage that reference voltage source provides, RsetFor testing the resistance value of current setting resistor.
A kind of sensor-based system, including resistive sensor array and test circuit accordingly, described resistive sensor array is classified as M × N resistive sensor array of two dimension of common row line and alignment, and described test circuit is the resistive Sensor array circuit based on two-wire system equipotential method described above.
Compared to existing technology, the method have the advantages that
1. the present invention be directed to the detection needs of resistive sensor array, do not improving on the basis of array interconnection complexity, with two-wire system Voltage Feedback method for key technology, effectively eliminate the channel conductive resistance of MUX, crosstalk error that the contact resistance of p-wire cable joint, long test cable cause, improve certainty of measurement, expand the Standard resistance range of physical quantity sensitive resistance in resistive sensor array simultaneously；And the present invention also can effectively eliminate the interference of space electromagnetic noise；
2. MUX that make low cost, that channel conductive resistance is bigger can be applied to resistive sensor array, reduces the cost of test circuit；
3. eliminate the impact on resistive sensor array certainty of measurement of cable connector contact that resistance changes in time with contact state, make application system can pass through the plug of convenient plug, resistive sensor array changed by socket or its test circuit, can guarantee that the certainty of measurement of application system simultaneously.
4. eliminating the crosstalk error that long test cable causes so that long test cable can be applied to resistive sensor array, the resistive sensor array of softness being particularly well-suited to test circuit space size is required is measured.
Accompanying drawing explanation
Fig. 1 is the M × N resistive sensor array structure schematic diagram of two dimension sharing line and alignment；
Fig. 2 is the equipotential method test circuit theory diagrams of the existing resistive sensor array of common row alignment；
Fig. 3 is Fig. 2 test philosophy isoboles testing circuit；
Fig. 4 is the schematic diagram that the present invention tests one specific embodiment of circuit；
Fig. 5 is Fig. 4 test philosophy isoboles testing circuit；
Fig. 6 is the schematic diagram that the present invention tests another specific embodiment of circuit；
Fig. 7 is Fig. 6 test philosophy isoboles testing circuit.
Detailed description of the invention
Below in conjunction with accompanying drawing, technical scheme is described in detail:
The equipotential method test circuit theory current unit under test R as in figure 2 it is shown, Fig. 3 is its test philosophy isoboles, in figure of the resistive sensor array of common row alignmentxyFor the R in M × N resistive sensor array of common row alignment11.In the circuit, all only has a connecting line between every line or alignment and the test circuit of array.This circuit under desirable duty, the channel conductive resistance R of all alignment alternative variable connectorssc, drive the cumulative resistance R of the lead resistance of connecting line and connector contacts resistanceLcIt is left in the basket, such RxyThe voltage V of place alignmentcy=Vxy, the voltage of other alignment is 0；Wait electric current M to select the channel conductive resistance R of a variable connector simultaneouslysr, etc. the cumulative resistance R of the lead resistance of electric current connecting line and connector contacts resistanceLrIt is left in the basket, owing to ideal current feeds back the effect of amplifier, unit under test place row line voltage Vrx=0.Simultaneously because the voltage of other alignment and VrxEqual, therefore the electric current on (N-1) of unit under test individual row adjacent cells is 0；Simultaneously because the anti-phase input terminal impedance of current feedback amplifier is very big, its leakage current is left in the basket, such RxyOn electric current IxyWith test current setting resistor RsetOn electric current IsetEqual to Iset=-VI/Rset=Vxy/Rxy.Due to VIAnd RsetIt is known that RxyOn voltage VxyCan measure and obtain, and then R can be calculatedxy。
And this test circuit is in real work situation, due to the channel conductive resistance R of the alignment alternative variable connector of unit under testsc, drive the cumulative resistance R of the lead resistance of connecting line and connector contacts resistanceLcExistence, cause VcyWith VxyUnequal；Simultaneously because the electric current M that waits on the line direction of unit under test selects the channel conductive resistance R of a variable connectorsr, etc. the cumulative resistance R of the lead resistance of electric current connecting line and connector contacts resistanceLrExistence, cause VrxUnequal with 0.The two principal element that the channel conductive resistance of row connection cable, row connection cable and variable connector causes destroys the ideal isolation working condition of equipotential method test circuit so that RxyMeasurement error becomes big.
In order to overcome Fig. 2 to test the shortcoming existing for circuit, eliminate the impact of the channel conductive resistance etc. connecting the lead resistance of cable, the contact resistance of cable connector and variable connector, the present invention proposes a kind of resistive Sensor array circuit based on two-wire system equipotential method, utilizes the equipotential method of doubly-linked wiring to measure the resistive sensor array of common row alignment.Fig. 4 shows that the present invention tests the ultimate principle of one specific embodiment of circuit, the current unit under test R in figurexyFor the R in M × N resistive sensor array of common row alignment11；Fig. 5 is the test philosophy isoboles of test circuit shown in Fig. 4.Compare the existing test circuit of Fig. 2, as shown in Figure 4, the present invention additionally increases a connecting line at every line and the alignment of M × N resistive sensor array of common row alignment, namely all corresponding two connecting lines of each alignment and line are (for the ease of difference, consider from functional perspective, hereafter two connecting lines of same alignment are called driving connecting line, drive sampling to follow connecting line, electric current connecting line, the equipotential connecting line such as the two of same line connecting lines are called)；Increasing an operational amplifier at each row drive end of test circuit, this operational amplifier is used as column line drive amplifier simultaneously.So test in circuit in the equipotential method of doubly-linked wiring and have a current feedback amplifier and N number of column line drive amplifier, in-phase input end correspondence in each column line drive amplifier is connected to an alignment alternative variable connector, between the inverting input and line of current feedback amplifier, it is connected to an equipotential M selects a variable connector, at test current setting resistor RsetAnd be also connected to the electric current M such as between line and select a variable connector；That is, every line selects the corresponding separate end of a variable connector to connect by an equipotential connecting line with equipotential M, and by the electric current connecting lines such as another root with etc. electric current M select the corresponding separate end of a variable connector to connect；Equipotential M selects the common port of a variable connector to be connected with the inverting input of current feedback amplifier, and the in-phase input end of current feedback amplifier connects zero potential；Selecting the common port of a variable connector to be connected with test current setting resistor one end Deng electric current M, the test current setting resistor other end is connected with reference voltage source.
As shown in Figure 4, every alignment of the resistive sensor array module of common row alignment drives connecting line to drive the outfan of amplifier to be connected with its respective column lines by one, and this alignment drives the inverting input that connecting line column line drive amplifier corresponding thereto is followed in sampling to be connected by another root simultaneously；The in-phase input end of each column line drive amplifier passes through common port and zero potential or the feedback voltage V of an alignment alternative variable connector corresponding theretoxyConnect；The in-phase input end gating feedback voltage V of the column line drive amplifier at unit under test placexy, the in-phase input end gating zero potential of other column line drive amplifier.Under the premise that the driving force of column line drive amplifier is enough, due to the short effect of the void of column line drive amplifier, its in-phase input end change in voltage of the voltage follow of its place alignment, thus the column line voltage V at unit under test placecyEqual to Vxy, other column line voltage is 0.Thus achieve the accumulation resistance R of lead resistance and the connector contacts resistance thereof driving connecting lineLcVirtual isolation, thus eliminating RLcImpact on test result.Simultaneously because the resistance R of the input impedance of column line drive amplifier and alignment alternative Multiplexer Channel conducting resistancescCompare very big, due to the disconnected effect of the void of column line drive amplifier, therefore input voltage (zero potential or the feedback voltage V of the in-phase input end voltage of column line drive amplifier and alignment alternative variable connectorxy) equal, R in the equipotential method test circuit of doubly-linked wiring can be eliminatedscTo RxyThe impact of measurement result.
As shown in Figure 4, every line of the resistive sensor array of common row alignment selects a corresponding separate end of a variable connector to be connected by an electric current connecting line such as grade with waiting electric current M, and such electric current M selects the common port connecting test current setting resistor R of a variable connector simultaneouslyset；When test, the line that only unit under test is expert at is waited electric current M to select a variable connector institute gating, and other line is unsettled, thus the line that only unit under test is expert at connects Rset；Every line selects a corresponding separate end of a variable connector to be connected also by another root equipotential connecting line with equipotential M, and this equipotential M selects the common port of a variable connector to connect the inverting input of current feedback amplifier simultaneously；When test, only unit under test place line is selected a variable connector gating by equipotential M, and other line is unsettled, thus only unit under test place line connects the inverting input of current feedback amplifier.From VITest electric current first pass around RsetSecondly, the electric current M such as process selects a variable connector, the electric current connecting line line to unit under test such as again passes by, and then passes through unit under test to its alignment.Owing to the input impedance of current feedback amplifier inverting input is very big, it is far longer than equipotential M and selects a Multiplexer Channel conducting resistance RsrWith the lead resistance of equipotential connecting line and connector contacts resistance R thereofLrCumulative sum, it is believed that voltage and the unit under test place row line voltage of current feedback amplifier inverting input are equal, and its value is 0；And owing to the input impedance of current feedback amplifier inverting input is very big, it is far longer than Rset, etc. electric current M select a Multiplexer Channel conducting resistance RsrWith the lead resistance and the connector contacts resistance R thereof that wait electric current connecting lineLrAccumulative resistance Rer, therefore the leakage current of current feedback amplifier inverting input can be ignored；And other alignment keeps equal zero potential with tested line simultaneously, the leakage current on the row adjacent cells of unit under test is zero.Therefore RsetAnd RxyOn equal by electric current, this electric current also simultaneously by wait electric current M select a Multiplexer Channel conducting resistance, etc. electric current connecting line lead resistance, etc. the accumulation resistance R that jointly causes such as electric current connecting-wire connector contact resistanceer, and current value is constant.Due to RsetAnd RxyOn electric current equal, due to RsetIt is known that if that know RsetThe precise voltage at two ends, it is possible to determine accurate Ixy.And VxyAccurately R can measure and obtain, thus can be calculatedxy。
But due to accumulation resistance RerExistence, cause passing through RsetElectric current be Ireal=-VI/(Rset+Rer)=Vxy/RxyElectric current I is set with idealset=-VI/RsetHave any different, if therefore ignoring RerImpact the test result causing unit under test is produced extra error.Due to Rxy、RsetAnd RerOn the electric current that flows through equal, therefore the present invention adopts Rxy=Vxy×Rset/(Ve-VI) try to achieve RxyResistance.It appeared that there is no R in this formulaerExist, RerImpact thoroughly eliminated.Due to RsetAnd VIIt is known that and VeAnd VxyWe can measure and obtain, and finally realize RxyThe mensuration of true value.Specifically, any one resistive sensor to be measured, first this resistive sensor to be measured of gating, specific as follows: the outfan making the in-phase input end of this resistive sensor place to be measured corresponding column line drive amplifier of alignment connect current feedback amplifier by described N number of alignment alternative variable connector, and the in-phase input end of the corresponding column line drive amplifier of other alignment is all connected with zero potential, and by etc. electric current M select a variable connector and equipotential M to select a variable connector to make the inverting input of this resistive sensor place to be measured line and current feedback amplifier, test current setting resistor connects simultaneously, and other line is unsettled；Then following formula is utilized to calculate the resistance R of this resistive sensor to be measuredxy:
Wherein, VxyFor the electromotive force (i.e. feedback voltage) of current feedback amplifier outfan, VeThe common port of a variable connector is selected to be connected the electromotive force of one end with electric current M such as grade for test current setting resistor, VIFor the reference voltage that reference voltage source provides, RsetFor testing the resistance value of current setting resistor.
Fig. 6 is another specific embodiment that the present invention tests circuit, the current unit under test R in figurexyFor the R in M × N resistive sensor array of common row alignment11；Fig. 7 is the test philosophy isoboles of this test circuit.As shown in Figure 6, the test circuit of the present embodiment is equivalent to the on-position of reference voltage source and the zero potential testing in circuit by Fig. 4 and exchanges, test zero potential position original in circuit by Fig. 4 and be changed to reference voltage source, and original reference voltage source position is changed to zero potential.The method of testing of this test circuit is specific as follows:
For the resistive sensor to be measured of any one in described resistive sensor array, first this resistive sensor to be measured of gating, specific as follows: the outfan making the in-phase input end of this resistive sensor place to be measured corresponding column line drive amplifier of alignment connect current feedback amplifier by described N number of alignment alternative variable connector, and the in-phase input end of the corresponding column line drive amplifier of other alignment is all connected with reference voltage source, and by etc. electric current M select a variable connector and equipotential M to select a variable connector to make the inverting input of this resistive sensor place to be measured line and current feedback amplifier, test current setting resistor connects simultaneously, and other line is unsettled；Then following formula is utilized to calculate the resistance R of this resistive sensor to be measuredxy:
Wherein, VxyFor the electromotive force of current feedback amplifier outfan, VeThe common port of a variable connector is selected to be connected the electromotive force of one end with electric current M such as grade for test current setting resistor, VIFor the reference voltage that reference voltage source provides, RsetFor testing the resistance value of current setting resistor.
The ultimate principle of the crosstalk error that Fig. 6 tests the channel conductive resistance of circuit for eliminating MUX, the contact resistance of p-wire cable joint, long test cable cause is identical with Fig. 4, and those skilled in the art are clearly understood that according to described above and Fig. 6, Fig. 7；For the purpose of saving space, repeat no more herein.Comparing the test circuit of Fig. 4, adopt the test circuit of Fig. 6, all amplifiers can adopt rail-to-rail unipolarity amplifier, now needs only provide for unipolarity reference voltage source, thus reducing power supply cost.
In sum, the present invention is utilized to test circuit, the true resistive value of the arbitrary unit under test in the resistive sensor array of common row alignment can be accurately out, and the impact that the contact resistance of the lead resistance of the alignment of resistive sensor array, line and joint thereof and Multiplexer Channel conducting resistance cause is completely eliminated.
Compared with the equipotential method of traditional monotroded wiring, the resistive sensor array of common row alignment connects a calibrating terminal of every ranks line and becomes two calibrating terminals (N M array test lead subnumber from (N+M) individual to become 2 (N+M) individual)；Connect cable pin count and also correspondingly double (the connection cable lead subnumber needed for N M array is become 2 (N+M) root from (N+M) root)；Corresponding test circuit is also required to increase a M and selects a variable connector and N number of operational amplifier.
In addition it is emphasized that: above-mentioned row, column is relative concept, those skilled in the art completely can by exchange, therefore, similar this kind of simple deformation based on thinking of the present invention is still contained by technical solution of the present invention.
Claims (5)
1., based on the resistive Sensor array circuit of two-wire system equipotential method, described resistive sensor array is classified as M × N resistive sensor array of two dimension of common row line and alignment；It is characterized in that, described test circuit includes: current feedback amplifier, N number of column line drive amplifier, the electric current M such as select a variable connector, an equipotential M to select a variable connector, N number of alignment alternative variable connector, test current setting resistor, reference voltage source, and for two connecting lines that each line and the alignment of described resistive sensor array is respectively provided with；One_to_one corresponding between the N bar alignment of N number of column line drive amplifier, N number of alignment alternative variable connector and resistive sensor array, every alignment is connected by the outfan of a connecting line column line drive amplifier corresponding thereto, this alignment is connected by the inverting input of another root connecting line column line drive amplifier corresponding thereto simultaneously, and the in-phase input end of each column line drive amplifier passes through the common port of the alignment alternative variable connector corresponding thereto outfan with zero potential or with current feedback amplifier and is connected；Equipotential M select a variable connector M separate end, etc. electric current M select M separate end of a variable connector and M bar line one_to_one corresponding, every line selects the corresponding separate end of a variable connector to connect by a connecting line with equipotential M, and by another root connecting line with etc. electric current M select the corresponding separate end of a variable connector to connect；Equipotential M selects the common port of a variable connector to be connected with the inverting input of current feedback amplifier, and the in-phase input end of current feedback amplifier connects zero potential；Selecting the common port of a variable connector to be connected with test current setting resistor one end Deng electric current M, the test current setting resistor other end is connected with reference voltage source.
2. test the method for testing of circuit as claimed in claim 1, it is characterized in that, for the resistive sensor to be measured of any one in described resistive sensor array, first this resistive sensor to be measured of gating, specific as follows: the outfan making the in-phase input end of this resistive sensor place to be measured corresponding column line drive amplifier of alignment connect current feedback amplifier by described N number of alignment alternative variable connector, and the in-phase input end of the corresponding column line drive amplifier of other alignment is all connected with zero potential, and by etc. electric current M select a variable connector and equipotential M to select a variable connector to make the inverting input of this resistive sensor place to be measured line and current feedback amplifier, test current setting resistor connects simultaneously, and other line is unsettled；Then following formula is utilized to calculate the resistance R of this resistive sensor to be measuredxy:
Wherein, VxyFor the electromotive force of current feedback amplifier outfan, VeThe common port of a variable connector is selected to be connected the electromotive force of one end with electric current M such as grade for test current setting resistor, VIFor the reference voltage that reference voltage source provides, RsetFor testing the resistance value of current setting resistor.
3., based on the resistive Sensor array circuit of two-wire system equipotential method, described resistive sensor array is classified as M × N resistive sensor array of two dimension of common row line and alignment；It is characterized in that, described test circuit includes: current feedback amplifier, N number of column line drive amplifier, the electric current M such as select a variable connector, an equipotential M to select a variable connector, N number of alignment alternative variable connector, test current setting resistor, reference voltage source, and for two connecting lines that each line and the alignment of described resistive sensor array is respectively provided with；One_to_one corresponding between the N bar alignment of N number of column line drive amplifier, N number of alignment alternative variable connector and resistive sensor array, every alignment is connected by the outfan of a connecting line column line drive amplifier corresponding thereto, this alignment is connected by the inverting input of another root connecting line column line drive amplifier corresponding thereto simultaneously, and the in-phase input end of each column line drive amplifier passes through the common port of the alignment alternative variable connector corresponding thereto outfan with reference voltage source or with current feedback amplifier and is connected；Equipotential M select a variable connector M separate end, etc. electric current M select M separate end of a variable connector and M bar line one_to_one corresponding, every line selects the corresponding separate end of a variable connector to connect by a connecting line with equipotential M, and by another root connecting line with etc. electric current M select the corresponding separate end of a variable connector to connect；Equipotential M selects the common port of a variable connector to be connected with the inverting input of current feedback amplifier, and the in-phase input end of current feedback amplifier connects reference voltage source；Selecting the common port of a variable connector to be connected with test current setting resistor one end Deng electric current M, the test current setting resistor other end is connected with zero potential.
4. test the method for testing of circuit as claimed in claim 3, it is characterized in that, for the resistive sensor to be measured of any one in described resistive sensor array, first this resistive sensor to be measured of gating, specific as follows: the outfan making the in-phase input end of this resistive sensor place to be measured corresponding column line drive amplifier of alignment connect current feedback amplifier by described N number of alignment alternative variable connector, and the in-phase input end of the corresponding column line drive amplifier of other alignment is all connected with reference voltage source, and by etc. electric current M select a variable connector and equipotential M to select a variable connector to make the inverting input of this resistive sensor place to be measured line and current feedback amplifier, test current setting resistor connects simultaneously, and other line is unsettled；Then following formula is utilized to calculate the resistance R of this resistive sensor to be measuredxy:
Wherein, VxyFor the electromotive force of current feedback amplifier outfan, VeThe common port of a variable connector is selected to be connected the electromotive force of one end with electric current M such as grade for test current setting resistor, VIFor the reference voltage that reference voltage source provides, RsetFor testing the resistance value of current setting resistor.
5. a sensor-based system, including resistive sensor array and test circuit accordingly, it is characterized in that, described resistive sensor array is classified as M × N resistive sensor array of two dimension of common row line and alignment, and described test circuit is the resistive Sensor array circuit described in claim 1 or 3 based on two-wire system equipotential method.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610058747.1A CN105716633B (en) | 2016-01-28 | 2016-01-28 | Resistive Sensor array circuit and its method of testing, sensor-based system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610058747.1A CN105716633B (en) | 2016-01-28 | 2016-01-28 | Resistive Sensor array circuit and its method of testing, sensor-based system |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN105716633A true CN105716633A (en) | 2016-06-29 |
| CN105716633B CN105716633B (en) | 2017-11-14 |
Family
ID=56154219
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201610058747.1A Active CN105716633B (en) | 2016-01-28 | 2016-01-28 | Resistive Sensor array circuit and its method of testing, sensor-based system |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN105716633B (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106370212A (en) * | 2016-09-26 | 2017-02-01 | 东南大学 | Zero potential method-based readout circuit and readout method of two-dimensional resistive sensing array |
| CN106500847A (en) * | 2016-09-26 | 2017-03-15 | 东南大学 | A kind of quick measuring circuit of two-dimentional resistive sensor array |
| CN106813783A (en) * | 2017-01-20 | 2017-06-09 | 东南大学 | Resistive sensor array readout circuit and its reading method based on operational amplifier |
Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4374384A (en) * | 1980-08-28 | 1983-02-15 | Westinghouse Electric Corp. | Matrix encoder for resistive sensor arrays |
| CN1033690A (en) * | 1988-10-29 | 1989-07-05 | 傅加强 | Silo matrix wiring thermometric (wetting) method |
| US6853306B1 (en) * | 1999-03-09 | 2005-02-08 | Robert Bosch Gmbh | Circuit arrangement for measuring the resistance of resistors in a pressure-sensitive resistor mat |
| CN101770309A (en) * | 2009-01-05 | 2010-07-07 | 财团法人工业技术研究院 | Sensing device as well as scanning and driving method thereof |
| CN103575434A (en) * | 2012-07-30 | 2014-02-12 | 环球水泥股份有限公司 | Pressure detection circuit |
| CN103925934A (en) * | 2014-04-30 | 2014-07-16 | 东南大学 | Detection circuit of resistance sensing array strengthening voltage feedback |
| CN104395963A (en) * | 2012-07-27 | 2015-03-04 | 惠普发展公司，有限责任合伙企业 | Dynamic sense circuitry |
-
2016
- 2016-01-28 CN CN201610058747.1A patent/CN105716633B/en active Active
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4374384A (en) * | 1980-08-28 | 1983-02-15 | Westinghouse Electric Corp. | Matrix encoder for resistive sensor arrays |
| CN1033690A (en) * | 1988-10-29 | 1989-07-05 | 傅加强 | Silo matrix wiring thermometric (wetting) method |
| US6853306B1 (en) * | 1999-03-09 | 2005-02-08 | Robert Bosch Gmbh | Circuit arrangement for measuring the resistance of resistors in a pressure-sensitive resistor mat |
| CN101770309A (en) * | 2009-01-05 | 2010-07-07 | 财团法人工业技术研究院 | Sensing device as well as scanning and driving method thereof |
| CN104395963A (en) * | 2012-07-27 | 2015-03-04 | 惠普发展公司，有限责任合伙企业 | Dynamic sense circuitry |
| CN103575434A (en) * | 2012-07-30 | 2014-02-12 | 环球水泥股份有限公司 | Pressure detection circuit |
| CN103925934A (en) * | 2014-04-30 | 2014-07-16 | 东南大学 | Detection circuit of resistance sensing array strengthening voltage feedback |
Non-Patent Citations (1)
| Title |
|---|
| 第1020-1026页: "Design and crosstalk error analysis of the circuit for the 2-D networked resistive sensor array", 《SENSORS》 * |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106370212A (en) * | 2016-09-26 | 2017-02-01 | 东南大学 | Zero potential method-based readout circuit and readout method of two-dimensional resistive sensing array |
| CN106500847A (en) * | 2016-09-26 | 2017-03-15 | 东南大学 | A kind of quick measuring circuit of two-dimentional resistive sensor array |
| CN106370212B (en) * | 2016-09-26 | 2018-08-21 | 东南大学 | The reading circuit and reading method of the resistive sensor array of two dimension based on zero potential method |
| CN106500847B (en) * | 2016-09-26 | 2019-03-12 | 东南大学 | A kind of rapid survey circuit of the resistive sensor array of two dimension |
| CN106813783A (en) * | 2017-01-20 | 2017-06-09 | 东南大学 | Resistive sensor array readout circuit and its reading method based on operational amplifier |
| CN106813783B (en) * | 2017-01-20 | 2019-10-15 | 东南大学 | Resistive sensor array readout circuit and its reading method based on operational amplifier |
Also Published As
| Publication number | Publication date |
|---|---|
| CN105716633B (en) | 2017-11-14 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN105628061A (en) | Resistive sensor array fast readout circuit based on two-wire system isopotential method | |
| CN105606133B (en) | Resistive Sensor array circuit and its method of testing, sensor-based system | |
| CN103925934B (en) | A kind of testing circuit strengthening the resistive sensor array of Voltage Feedback | |
| CN105675024B (en) | A kind of data read method, the device of resistive sensor array | |
| CN102322974B (en) | Array temperature touch sensing device | |
| CN105424095B (en) | The quick reading circuit and its reading method of the resistive sensor array of two dimension | |
| CN101201278A (en) | System for monitoring curved surface interlaminar extrusion pressure based on array type ultra-thin submissive force sensor | |
| CN106813783B (en) | Resistive sensor array readout circuit and its reading method based on operational amplifier | |
| CN105716633A (en) | Test circuit for resistive sensor array based on two-wire system isopotential method | |
| CN106597111B (en) | High-precision two-dimensional electric resistance array reading circuit | |
| CN106500847B (en) | A kind of rapid survey circuit of the resistive sensor array of two dimension | |
| CN107063312B (en) | Resistive sensor array measuring device and method | |
| CN105651315A (en) | Rapid readout circuit for resistance sensor array based on two-wire system isopotential method | |
| CN106370212B (en) | The reading circuit and reading method of the resistive sensor array of two dimension based on zero potential method | |
| CN105716644A (en) | Test circuit for resistive sensor array based on two-wire system isopotential method | |
| CN105698827A (en) | A resistive sensor array reading circuit based on a two-wire system isopotential method | |
| CN106841812B (en) | Anti- power jitter two dimension electric resistance array reading circuit | |
| CN106500736B (en) | A kind of linear reading circuit of the resistive sensor array of two dimension | |
| CN110631610A (en) | Resistive sensor array test circuit based on two-wire system equipotential method | |
| CN106597110A (en) | Rapid reading circuit for two-dimensional resistor array | |
| CN105606132B (en) | A kind of resistive sensor array readout circuit based on two-wire system equipotential method | |
| CN110617842A (en) | Resistive sensor array rapid reading circuit based on two-wire system equipotential method | |
| CN110631609A (en) | Resistive sensor array rapid reading circuit based on two-wire system equipotential method | |
| CN105021919A (en) | Capacitive screen test card and test system | |
| CN110617846A (en) | Resistive sensor array test circuit based on two-wire system equipotential method |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |