CN105590824B - 一种等离子体加工设备 - Google Patents

一种等离子体加工设备 Download PDF

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Publication number
CN105590824B
CN105590824B CN201410557082.XA CN201410557082A CN105590824B CN 105590824 B CN105590824 B CN 105590824B CN 201410557082 A CN201410557082 A CN 201410557082A CN 105590824 B CN105590824 B CN 105590824B
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China
Prior art keywords
material coating
cavity
plasma
permeability material
processing device
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CN201410557082.XA
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Chinese (zh)
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CN105590824A (zh
Inventor
刘季霖
左涛涛
吴狄
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Medium and Micro Semiconductor Equipment (Shanghai) Co., Ltd.
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Advanced Micro Fabrication Equipment Inc Shanghai
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Priority to CN201410557082.XA priority Critical patent/CN105590824B/zh
Priority to TW103145589A priority patent/TW201615887A/zh
Publication of CN105590824A publication Critical patent/CN105590824A/zh
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Publication of CN105590824B publication Critical patent/CN105590824B/zh
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  • Plasma Technology (AREA)
  • Chemical Vapour Deposition (AREA)
CN201410557082.XA 2014-10-20 2014-10-20 一种等离子体加工设备 Active CN105590824B (zh)

Priority Applications (2)

Application Number Priority Date Filing Date Title
CN201410557082.XA CN105590824B (zh) 2014-10-20 2014-10-20 一种等离子体加工设备
TW103145589A TW201615887A (zh) 2014-10-20 2014-12-25 電漿體加工設備

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201410557082.XA CN105590824B (zh) 2014-10-20 2014-10-20 一种等离子体加工设备

Publications (2)

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CN105590824A CN105590824A (zh) 2016-05-18
CN105590824B true CN105590824B (zh) 2017-11-03

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CN (1) CN105590824B (tr)
TW (1) TW201615887A (tr)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106937475A (zh) * 2015-12-31 2017-07-07 中微半导体设备(上海)有限公司 等离子体处理装置
KR102330098B1 (ko) * 2017-04-24 2021-11-23 주성엔지니어링(주) 기판 처리 장치
CN109994359B (zh) * 2017-12-29 2022-11-18 中微半导体设备(上海)股份有限公司 一种等离子体处理腔室
CN108768335A (zh) * 2018-05-25 2018-11-06 张琴 气密性声表面波元件封装结构及制作方法
CN110231063A (zh) * 2019-05-30 2019-09-13 江阴市富仁高科股份有限公司 一种检测油气的气体流量计
CN113808898B (zh) * 2020-06-16 2023-12-29 中微半导体设备(上海)股份有限公司 耐等离子体腐蚀零部件和反应装置及复合涂层形成方法
TWI820374B (zh) * 2020-12-23 2023-11-01 台灣積體電路製造股份有限公司 感應耦合電漿設備及其操作方法

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1117889C (zh) * 1997-04-02 2003-08-13 日本电气株式会社 等离子体增强化学汽相淀积装置
CN1907514A (zh) * 2005-03-22 2007-02-07 巨佰-雪莱公司 具有用于磁起动开关的窗口的磁屏蔽aimd外壳
TW201130033A (en) * 2010-02-25 2011-09-01 Taiwan Semiconductor Mfg Semiconductor manufacturing apparatus and method for manufacturing a semiconductor processing apparatus
CN202164352U (zh) * 2011-06-10 2012-03-14 北京北方微电子基地设备工艺研究中心有限责任公司 一种半导体加工设备

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7573000B2 (en) * 2003-07-11 2009-08-11 Lincoln Global, Inc. Power source for plasma device
US20060075967A1 (en) * 2004-10-12 2006-04-13 Applied Materials, Inc. Magnetic-field concentration in inductively coupled plasma reactors
TW200712236A (en) * 2005-09-23 2007-04-01 Atomic Energy Council Device of generating magnetron RF plasma source
FR2904178B1 (fr) * 2006-07-21 2008-11-07 Centre Nat Rech Scient Dispositif et procede de production et/ou de confinement d'un plasma
TWI456082B (zh) * 2010-03-26 2014-10-11 Univ Nat Sun Yat Sen 磁控式電漿濺鍍機
US20140262044A1 (en) * 2013-03-15 2014-09-18 Applied Materials, Inc. Mu metal shield cover

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1117889C (zh) * 1997-04-02 2003-08-13 日本电气株式会社 等离子体增强化学汽相淀积装置
CN1907514A (zh) * 2005-03-22 2007-02-07 巨佰-雪莱公司 具有用于磁起动开关的窗口的磁屏蔽aimd外壳
TW201130033A (en) * 2010-02-25 2011-09-01 Taiwan Semiconductor Mfg Semiconductor manufacturing apparatus and method for manufacturing a semiconductor processing apparatus
CN202164352U (zh) * 2011-06-10 2012-03-14 北京北方微电子基地设备工艺研究中心有限责任公司 一种半导体加工设备

Also Published As

Publication number Publication date
TWI513856B (tr) 2015-12-21
TW201615887A (zh) 2016-05-01
CN105590824A (zh) 2016-05-18

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Address after: 201201 No. 188 Taihua Road, Jinqiao Export Processing Zone, Pudong New Area, Shanghai

Patentee after: Medium and Micro Semiconductor Equipment (Shanghai) Co., Ltd.

Address before: 201201 No. 188 Taihua Road, Jinqiao Export Processing Zone, Pudong New Area, Shanghai

Patentee before: Advanced Micro-Fabrication Equipment (Shanghai) Inc.

CP01 Change in the name or title of a patent holder