CN105579868A - 半导体放射线检测器、使用其的核医学诊断装置、以及半导体放射线检测器的制造方法 - Google Patents

半导体放射线检测器、使用其的核医学诊断装置、以及半导体放射线检测器的制造方法 Download PDF

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Publication number
CN105579868A
CN105579868A CN201480052242.3A CN201480052242A CN105579868A CN 105579868 A CN105579868 A CN 105579868A CN 201480052242 A CN201480052242 A CN 201480052242A CN 105579868 A CN105579868 A CN 105579868A
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China
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semiconductor
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radiation detector
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Pending
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CN201480052242.3A
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English (en)
Chinese (zh)
Inventor
小南信也
瓮久实
小桥启司
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Hitachi Ltd
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Hitachi Aloka Medical Ltd
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Publication of CN105579868A publication Critical patent/CN105579868A/zh
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    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/42—Arrangements for detecting radiation specially adapted for radiation diagnosis
    • A61B6/4208—Arrangements for detecting radiation specially adapted for radiation diagnosis characterised by using a particular type of detector
    • A61B6/4258—Arrangements for detecting radiation specially adapted for radiation diagnosis characterised by using a particular type of detector for detecting non x-ray radiation, e.g. gamma radiation
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/42—Arrangements for detecting radiation specially adapted for radiation diagnosis
    • A61B6/4266—Arrangements for detecting radiation specially adapted for radiation diagnosis characterised by using a plurality of detector units
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F30/00—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors
    • H10F30/20—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors
    • H10F30/29—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to radiation having very short wavelengths, e.g. X-rays, gamma-rays or corpuscular radiation
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F30/00—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors
    • H10F30/301—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices being sensitive to very short wavelength, e.g. being sensitive to X-rays, gamma-rays or corpuscular radiation
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F71/00—Manufacture or treatment of devices covered by this subclass
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F77/00—Constructional details of devices covered by this subclass
    • H10F77/10—Semiconductor bodies
    • H10F77/12—Active materials
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F77/00—Constructional details of devices covered by this subclass
    • H10F77/95—Circuit arrangements

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  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Medical Informatics (AREA)
  • Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • General Health & Medical Sciences (AREA)
  • Surgery (AREA)
  • Veterinary Medicine (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Optics & Photonics (AREA)
  • Pathology (AREA)
  • Radiology & Medical Imaging (AREA)
  • Biomedical Technology (AREA)
  • Heart & Thoracic Surgery (AREA)
  • Biophysics (AREA)
  • Animal Behavior & Ethology (AREA)
  • Public Health (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Measurement Of Radiation (AREA)
  • Nuclear Medicine (AREA)
  • Light Receiving Elements (AREA)
  • Manufacturing & Machinery (AREA)
CN201480052242.3A 2013-10-03 2014-09-30 半导体放射线检测器、使用其的核医学诊断装置、以及半导体放射线检测器的制造方法 Pending CN105579868A (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2013208107A JP2015072201A (ja) 2013-10-03 2013-10-03 半導体放射線検出器、それを用いた核医学診断装置、および半導体放射線検出器の製造方法
JP2013-208107 2013-10-03
PCT/JP2014/076195 WO2015050141A1 (ja) 2013-10-03 2014-09-30 半導体放射線検出器、それを用いた核医学診断装置、および半導体放射線検出器の製造方法

Publications (1)

Publication Number Publication Date
CN105579868A true CN105579868A (zh) 2016-05-11

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CN201480052242.3A Pending CN105579868A (zh) 2013-10-03 2014-09-30 半导体放射线检测器、使用其的核医学诊断装置、以及半导体放射线检测器的制造方法

Country Status (5)

Country Link
US (1) US20160206257A1 (https=)
EP (1) EP3054321A4 (https=)
JP (1) JP2015072201A (https=)
CN (1) CN105579868A (https=)
WO (1) WO2015050141A1 (https=)

Cited By (1)

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CN112997100A (zh) * 2018-11-12 2021-06-18 浜松光子学株式会社 放射线检测器及其制造方法

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CN105759304B (zh) * 2016-04-22 2018-08-14 西北核技术研究所 一种基于平晶衍射成像的x射线能谱测量方法
JP6242954B1 (ja) 2016-07-11 2017-12-06 浜松ホトニクス株式会社 放射線検出器
WO2019084703A1 (en) * 2017-10-30 2019-05-09 Shenzhen Xpectvision Technology Co., Ltd. Radiation detector with dc-to-dc converter based on mems switches
CN108345026B (zh) * 2018-02-09 2021-06-15 哈尔滨工业大学 一种计算带电粒子防护层后能谱的方法
CN108763758B (zh) * 2018-05-29 2022-05-03 南京航空航天大学 一种非完备环状pet旋转扫描模式的gate仿真方法
JP6970801B2 (ja) * 2018-10-31 2021-11-24 浜松ホトニクス株式会社 放射線検出器製造方法
JP7051928B2 (ja) * 2020-04-06 2022-04-11 浜松ホトニクス株式会社 放射線検出器の製造方法

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JP2005223009A (ja) * 2004-02-03 2005-08-18 Hitachi Ltd 半導体放射線検出器及び放射線検出装置
WO2009022378A1 (ja) * 2007-08-10 2009-02-19 Osaka Electro-Communication University 放射線検出装置
JP2009286856A (ja) * 2008-05-27 2009-12-10 Fukuda Crystal Laboratory シンチレータ材料とその製造方法、及び、電離放射線検出器
DE112010003035B4 (de) * 2009-07-23 2022-09-22 Sumitomo Electric Industries, Ltd. Verfahren und Vorrichtung zum Erzeugen eines Halbleiterkristalls
JP4902759B2 (ja) * 2010-03-10 2012-03-21 株式会社日立製作所 放射線計測装置および核医学診断装置
US9121953B2 (en) * 2010-05-03 2015-09-01 Brookhaven Science Associates, Llc Array of virtual Frisch-grid detectors with common cathode and reduced length of shielding electrodes
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JP5753802B2 (ja) * 2012-01-27 2015-07-22 株式会社日立製作所 半導体放射線検出器および核医学診断装置
JP6120041B2 (ja) * 2012-01-31 2017-04-26 Ｊｘ金属株式会社 放射線検出素子および放射線検出器

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VASILIJ KOZLOV ET AL.: "Improved process for the TlBr single-crystal detector", 《NUCLEAR INSTRUMENTS AND METHODS IN PHYSICS RESEARCH A》 *
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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112997100A (zh) * 2018-11-12 2021-06-18 浜松光子学株式会社 放射线检测器及其制造方法

Also Published As

Publication number Publication date
WO2015050141A1 (ja) 2015-04-09
JP2015072201A (ja) 2015-04-16
EP3054321A1 (en) 2016-08-10
EP3054321A4 (en) 2017-05-31
US20160206257A1 (en) 2016-07-21

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