CN105576081A - Manufacturing method for black silicon double-face cell - Google Patents

Manufacturing method for black silicon double-face cell Download PDF

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Publication number
CN105576081A
CN105576081A CN201610115909.0A CN201610115909A CN105576081A CN 105576081 A CN105576081 A CN 105576081A CN 201610115909 A CN201610115909 A CN 201610115909A CN 105576081 A CN105576081 A CN 105576081A
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silicon
double
silicon chip
face
dioxide layer
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林振龙
杨晓琴
黄明
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Jiangxi Zhanyu New Energy Co Ltd
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Jiangxi Zhanyu New Energy Co Ltd
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Priority to CN201610115909.0A priority Critical patent/CN105576081A/en
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/18Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
    • H01L31/1876Particular processes or apparatus for batch treatment of the devices
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/02Details
    • H01L31/0236Special surface textures
    • H01L31/02363Special surface textures of the semiconductor body itself, e.g. textured active layers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/0248Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
    • H01L31/0256Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by the material
    • H01L31/0264Inorganic materials
    • H01L31/028Inorganic materials including, apart from doping material or other impurities, only elements of Group IV of the Periodic Table
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00Energy generation through renewable energy sources
    • Y02E10/50Photovoltaic [PV] energy
    • Y02E10/547Monocrystalline silicon PV cells
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02PCLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P70/00Climate change mitigation technologies in the production process for final industrial or consumer products
    • Y02P70/50Manufacturing or production processes characterised by the final manufactured product

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Chemical & Material Sciences (AREA)
  • Inorganic Chemistry (AREA)
  • Manufacturing & Machinery (AREA)
  • Photovoltaic Devices (AREA)

Abstract

The invention discloses a manufacturing method for a black silicon double-face cell. The method comprises steps that (1) double-face texturing for a silicon chip is carried out; (2), black silicon structures are made at two faces of the silicon chip by employing auxiliary metal chemical corrosion; (3), after KOH nanometer suede-like face restoration, metal ions are removed through utilizing acid; (4), PECVD deposition is employed for the first face to form a boron-contained silicon dioxide layer; (5), PECVD deposition is employed for the second face to form a phosphorus-contained silicon dioxide layer; (6), double-face co-diffusion is carried out, and double-face SiNx deposition is carried out; and (7), through double-face screen printing and sintering, the black silicon double-face solar cell is formed. According to the method, doping concentration of the cell surface after diffusion can be improved, and the open-circuit voltage, the short-circuit current and conversion efficiency can be further improved.

Description

A kind of manufacture method of black silicon double-side cell
Technical field
The present invention relates to a kind of manufacture method of black silicon double-side cell, belong to technical field of solar batteries.
Background technology
In the last few years, black silicon, as a kind of novel semi-conductor photoelectric material with nanometer light trapping structure, because it has reduce battery surface reflectivity, effectively can improve the transformation efficiency of cell piece, so receive extensive concern.The preparation method of black silicon mainly comprises femtosecond laser method, electrochemical erosion method, reactive ion etching method and metal Assisted Chemical Etching Process method, wherein, femtosecond laser method and reactive ion etching method are dry etchings, and electrochemical corrosion and metal Assisted Chemical Etching Process method belong to wet etching.In the middle of all multi-methods making black silicon, metal assistant chemical etch due to its cost low, equipment is simple, is more easily integrated in the middle of current solar battery process operation and is favored.Laxer by the black silicon face of metal Assisted Chemical Etching Process method, then with alkali, correction etching processing is carried out to nanostructure, by a large amount of tests, micro-nano structure matte can reduce the reflectivity of cell piece, and transformation efficiency comparatively produces line can improve more than 0.3%.
Current crystal-silicon battery slice market only has a sensitive surface usually, the i.e. solar cell part photon that front illuminated can only be utilized to come, sunlight for cell backside all can not utilize, can not utilize sunlight fully, this is a very large obstacle for improving solar cell actual power generation.Double-side cell " Panda " battery that Ying Li group produces also adopts double-side photic technology, but it adopts front to expand phosphorus, the method of boron is expanded at the back side, printed on both sides silver electrode prepares double-side photic battery, this kind of double-side cell relates to two-sided dissimilar diffusion and multiple loaded down with trivial details operation, brings certain obstruction to the progress of industrialization.
Summary of the invention
The object of this invention is to provide a kind of manufacture method of black silicon double-side cell, first form one deck nanometer suede by the method for metal auxiliary catalysis corrosion (MACE) at silicon chip surface, adopt PECVD to deposit again, spread, print, sinter, form black silicon double-side cell, can emissivity be reduced, improve the absorption to light.
A manufacture method for black silicon double-side cell, concrete steps are:
A. silicon chip is carried out two-sided making herbs into wool;
B. the corrosion of metal auxiliary catalysis is adopted to make black silicon structure
Silicon chip after making herbs into wool is put into AgNO 3with in the mixed solution of HF, AgNO 3concentration be the concentration of 0.001-0.2mol/L, HF be 0.01-0.1mol/L, react 10-100s at ambient temperature, after completion of the reaction silicon chip cleaned, then put into HF and H 2o 2mixed solution in, the concentration of HF is 1-5mol/L, H 2o 2concentration be 0.1-2mol/L, react 50-200s at ambient temperature;
C. acid is adopted to remove metal ion
Silicon chip b step obtained is cleaned, and first at 70 DEG C, reacts 50-200s by the KOH solution of 0.005-0.2mol/L, then uses the HNO of 0.005-0.2mol/L 3cleaning 3min, finally uses HCl, H 2o 2, H2O mixed solution under the condition of 80 DEG C, clean 5-15min, HCl, H 2o 2, H2O volume ratio be 1:1:6;
D. first surface adopts PECVD deposition to form boracic silicon dioxide layer;
Adopt trimethyl borine and CO 2the first surface PECVD of the silicon chip that step c obtains is deposited to the silicon dioxide layer forming boracic, the flow of trimethyl borine is the flow of 450-600sccm, CO2 is 300-350sccm, and the time of carrying out PECVD is 380s-440s, and reaction temperature is 200 DEG C-250 DEG C;
E. second adopts PECVD deposition to form phosphorous silicon dioxide layer;
Adopt phosphine and CO 2second to the silicon chip that Step d obtains forms phosphorous silicon dioxide layer by PECVD deposition, and the flow of phosphine is 10-100sccm, CO 2flow be 300-350sccm, the time of carrying out PECVD is 380s-440s, and reaction temperature is 200 DEG C-250 DEG C;
F. two-sided diffusion altogether, deposition SiNx
The silicon chip that step e is obtained carries out spreading and depositing, N 2flow is 21L/min, and the temperature in diffusion furnace is 800 DEG C-1000 DEG C, and temperature retention time is 30min-90min, then carries out deposition SiNx film respectively to the two sides of silicon chip;
G. black silicon double-side cell is formed.
The metallization that silk screen printing is carried out on silicon chip two sides, co-sintering completes double-side cell that f step obtains, prepare the black silicon double-side cell of finished product.
Following table is the unit for electrical property parameters of black silicon double-side cell of the present invention
Uoc(mV) Isc(A) Rs(mΩ) Rsh(Ω) FF(%) Eta
Front -0.646 -9.3 0.0041 148.34 79.67 19.67
Reverse side 0.633 9.0 0.0040 412.46 78.79 18.44
The invention has the advantages that: the method for being corroded by metal auxiliary catalysis forms one deck nanometer suede at silicon chip surface, it can reduce light reflectance, improves the absorption to light, adopts two sides light again, in conjunction with the advantage of black silicon and double-side cell, the electric energy being a significant increase cell piece exports.
Accompanying drawing explanation
Figure 1 shows that the execution mode schematic flow sheet according to the black silicon double-side cell of illustrated making.
Fig. 2 is the structural representation of black silicon double-side cell of the present invention.
Reference numeral: silicon chip 1, the silicon dioxide layer 2 of boracic, phosphorous silicon dioxide layer 3.
Embodiment
In order to make object of the present invention, technical scheme more clear, below in conjunction with accompanying drawing, the present invention is described in further detail.It is specifically intended that component diagram shown is in the accompanying drawings not necessarily according to certain scale.
Embodiment:
A manufacture method for black silicon double-side cell, concrete steps are:
The P-type silicon sheet adopted, 15.6cm × 15.6cm, but be not limited to this size; Resistivity is 1-3 Ω cm.
A. silicon chip is carried out two-sided making herbs into wool;
B. the corrosion of metal auxiliary catalysis is adopted to make black silicon structure
Silicon chip after making herbs into wool is put into AgNO 3with in the mixed solution of HF, AgNO 3concentration be the concentration of 0.001-0.2mol/L, HF be 0.01-0.1mol/L, react 10-100s at ambient temperature, after completion of the reaction silicon chip cleaned, then put into HF and H 2o 2mixed solution in, the concentration of HF is 1-5mol/L, H 2o 2concentration be 0.1-2mol/L, react 50-200s at ambient temperature;
C. acid is adopted to remove metal ion
Silicon chip b step obtained is cleaned, and first at 70 DEG C, reacts 50-200s by the KOH solution of 0.005-0.2mol/L, then uses the HNO of 0.005-0.2mol/L 3cleaning 3min, finally uses HCl, H 2o 2, H2O mixed solution under the condition of 80 DEG C, clean 5-15min, HCl, H 2o 2, H2O volume ratio be 1:1:6;
D. first surface adopts PECVD deposition to form boracic silicon dioxide layer;
Adopt trimethyl borine and CO 2the silicon dioxide layer forming boracic is deposited to the first surface PECVD of the silicon chip that step c obtains, the flow of trimethyl borine is 450-600sccm, the flow of CO2 is 300-350sccm, the time of carrying out PECVD is 380s-440s, reaction temperature is 200 DEG C-250 DEG C, and the first surface of silicon chip 1 forms boracic silicon dioxide layer 2;
E. second adopts PECVD deposition to form phosphorous silicon dioxide layer;
Adopt phosphine and CO 2second to the silicon chip that Step d obtains forms phosphorous silicon dioxide layer by PECVD deposition, and the flow of phosphine is 10-100sccm, CO 2flow be 300-350sccm, the time of carrying out PECVD is 380s-440s, and reaction temperature is 200 DEG C-250 DEG C, and the first surface of silicon chip 1 forms phosphorous silicon dioxide layer 3;
F. two-sided diffusion altogether, deposition SiNx
After depositing on the two sides of silicon chip 1 silicon dioxide layer 2 and phosphorous silicon dioxide layer 3 defining boracic respectively, carry out spreading and depositing, N 2flow is 21L/min, and the temperature in diffusion furnace is 800 DEG C-1000 DEG C, and temperature retention time is 30min-90min, then carries out deposition SiNx film respectively to the two sides of silicon chip;
G. black silicon double-side cell is formed.
The metallization that silk screen printing is carried out on silicon chip two sides, co-sintering completes double-side cell that f step obtains, prepare the black silicon double-side cell of finished product.
Although the step of inventing about this and advantage describe in detail, when being to be understood that the protection range limited in spirit and claims of not departing from this invention, this time invention can carry out various change, substitutions and modifications.For other examples, those of ordinary skill in the art should easy understand maintenance scope in while, the order of processing step can change.

Claims (2)

1. a manufacture method for black silicon double-side cell, is characterized by: concrete steps are:
A. silicon chip is carried out two-sided making herbs into wool;
B. the corrosion of metal auxiliary catalysis is adopted to make black silicon structure;
C. acid is adopted to remove metal ion;
D. first surface adopts PECVD deposition to form boracic silicon dioxide layer;
E. second adopts PECVD deposition to form phosphorous silicon dioxide layer;
F. two-sided diffusion altogether, deposition SiNx;
G. black silicon double-side cell is formed.
2. a manufacture method for black silicon double-side cell, is characterized by: concrete steps are:
A. silicon chip is carried out two-sided making herbs into wool;
B. the corrosion of metal auxiliary catalysis is adopted to make black silicon structure
Silicon chip after making herbs into wool is put into AgNO 3with in the mixed solution of HF, AgNO 3concentration be the concentration of 0.001-0.2mol/L, HF be 0.01-0.1mol/L, react 10-100s at ambient temperature, after completion of the reaction silicon chip cleaned, then put into HF and H 2o 2mixed solution in, the concentration of HF is 1-5mol/L, H 2o 2concentration be 0.1-2mol/L, react 50-200s at ambient temperature;
C. acid is adopted to remove metal ion
Silicon chip b step obtained is cleaned, and first at 70 DEG C, reacts 50-200s by the KOH solution of 0.005-0.2mol/L, then uses the HNO of 0.005-0.2mol/L 3cleaning 3min, finally uses HCl, H 2o 2, H2O mixed solution under the condition of 80 DEG C, clean 5-15min, HCl, H 2o 2, H2O volume ratio be 1:1:6;
D. first surface adopts PECVD deposition to form boracic silicon dioxide layer;
Adopt trimethyl borine and CO 2the first surface PECVD of the silicon chip that step c obtains is deposited to the silicon dioxide layer forming boracic, the flow of trimethyl borine is the flow of 450-600sccm, CO2 is 300-350sccm, and the time of carrying out PECVD is 380s-440s, and reaction temperature is 200 DEG C-250 DEG C;
E. second adopts PECVD deposition to form phosphorous silicon dioxide layer;
Adopt phosphine and CO 2second to the silicon chip that Step d obtains forms phosphorous silicon dioxide layer by PECVD deposition, and the flow of phosphine is 10-100sccm, CO 2flow be 300-350sccm, the time of carrying out PECVD is 380s-440s, and reaction temperature is 200 DEG C-250 DEG C;
F. two-sided diffusion altogether, deposition SiNx
The silicon chip that step e is obtained carries out spreading and depositing, N 2flow is 21L/min, and the temperature in diffusion furnace is 800 DEG C-1000 DEG C, and temperature retention time is 30min-90min, then carries out deposition SiNx film respectively to the two sides of silicon chip;
G. black silicon double-side cell is formed
The metallization that silk screen printing is carried out on silicon chip two sides, co-sintering completes double-side cell that f step obtains, prepare the black silicon double-side cell of finished product.
CN201610115909.0A 2016-03-02 2016-03-02 Manufacturing method for black silicon double-face cell Pending CN105576081A (en)

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Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105826432A (en) * 2016-05-17 2016-08-03 南昌大学 Method for preparing n-type crystalline silica double-side solar cell
CN106952974A (en) * 2017-03-31 2017-07-14 浙江晶科能源有限公司 A kind of preparation method of the black silicon double-side cell of p-type
WO2018000589A1 (en) * 2016-06-27 2018-01-04 苏州阿特斯阳光电力科技有限公司 Method for preparing textured structure of crystalline silicon solar cell
CN107742660A (en) * 2017-09-25 2018-02-27 江西展宇新能源股份有限公司 The process of difference between a kind of improvement black silicon solar cell crystal orientation of polycrystalline
CN108470781A (en) * 2018-02-28 2018-08-31 无锡尚德太阳能电力有限公司 The production method of the two-sided PERC crystal silicon solar energy batteries of the black silicon of selective emitter
CN114335237A (en) * 2020-09-29 2022-04-12 一道新能源科技(衢州)有限公司 Preparation method of crystalline silicon solar cell and crystalline silicon solar cell

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* Cited by examiner, † Cited by third party
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US20120153250A1 (en) * 2011-01-18 2012-06-21 Bandgap Engineering, Inc. Nanowire Device with Alumina Passivation Layer and Methods of Making Same
CN104538485A (en) * 2014-11-06 2015-04-22 浙江正泰太阳能科技有限公司 Preparation method of double-sided battery
CN105047758A (en) * 2015-08-18 2015-11-11 广东爱康太阳能科技有限公司 Black silicon solar cell and preparation method thereof

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20120153250A1 (en) * 2011-01-18 2012-06-21 Bandgap Engineering, Inc. Nanowire Device with Alumina Passivation Layer and Methods of Making Same
CN104538485A (en) * 2014-11-06 2015-04-22 浙江正泰太阳能科技有限公司 Preparation method of double-sided battery
CN105047758A (en) * 2015-08-18 2015-11-11 广东爱康太阳能科技有限公司 Black silicon solar cell and preparation method thereof

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105826432A (en) * 2016-05-17 2016-08-03 南昌大学 Method for preparing n-type crystalline silica double-side solar cell
WO2018000589A1 (en) * 2016-06-27 2018-01-04 苏州阿特斯阳光电力科技有限公司 Method for preparing textured structure of crystalline silicon solar cell
US10411145B2 (en) 2016-06-27 2019-09-10 Csi Cells Co., Ltd. Method for producing a textured structure of a crystalline silicon solar cell
CN106952974A (en) * 2017-03-31 2017-07-14 浙江晶科能源有限公司 A kind of preparation method of the black silicon double-side cell of p-type
CN106952974B (en) * 2017-03-31 2019-06-11 浙江晶科能源有限公司 A kind of preparation method of the black silicon double-side cell of p-type
CN107742660A (en) * 2017-09-25 2018-02-27 江西展宇新能源股份有限公司 The process of difference between a kind of improvement black silicon solar cell crystal orientation of polycrystalline
CN108470781A (en) * 2018-02-28 2018-08-31 无锡尚德太阳能电力有限公司 The production method of the two-sided PERC crystal silicon solar energy batteries of the black silicon of selective emitter
CN114335237A (en) * 2020-09-29 2022-04-12 一道新能源科技(衢州)有限公司 Preparation method of crystalline silicon solar cell and crystalline silicon solar cell
CN114335237B (en) * 2020-09-29 2024-09-17 一道新能源科技股份有限公司 Preparation method of crystalline silicon solar cell and crystalline silicon solar cell

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Application publication date: 20160511