CN105575303A - Liquid crystal driving chip test method and liquid crystal driving chip employing test method - Google Patents
Liquid crystal driving chip test method and liquid crystal driving chip employing test method Download PDFInfo
- Publication number
- CN105575303A CN105575303A CN201510982857.2A CN201510982857A CN105575303A CN 105575303 A CN105575303 A CN 105575303A CN 201510982857 A CN201510982857 A CN 201510982857A CN 105575303 A CN105575303 A CN 105575303A
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- pin
- probe
- lcd drive
- drive chip
- liquid crystal
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G2330/00—Aspects of power supply; Aspects of display protection and defect management
- G09G2330/12—Test circuits or failure detection circuits included in a display system, as permanent part thereof
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Liquid Crystal Display Device Control (AREA)
Abstract
The invention relates to a liquid crystal driving chip test method and a liquid crystal driving chip employing the test method. The liquid crystal driving chip comprises N driving circuits and N pins. The test method includes: a switching circuit is additionally provided between each M driving circuits and each M pins of the liquid crystal driving chip; a first pin in each M pins is connected to a probe of a probe card; the probe card is connected to a liquid crystal driving chip test machine bench; the switching circuit is controlled, and each of the M driving circuits is connected to the first pin of the M pins in sequence; wherein N and M are natural numbers, and N>=2; and 2<=M<=N.
Description
Technical field
The present invention relates to the measuring technology of liquid crystal chip, particularly relate to the method for testing of high-resolution liquid crystal driving chip and use the lcd drive chip of this method of testing.
Background technology
Showing Effectiveness On Screen depends on the quality of lcd drive chip to a great extent.In order to make lcd drive chip produce a desired effect, every a driving chip, before volume production, all through debugging repeatedly, to ensure that every setting meets the requirement of design, and can reach good display effect.
The test of current lcd drive chip needs the probe with probe the voltage signal of refuting driving circuit in chip to be delivered to the test channel of liquid crystal drive tester table via output pin.The probe that each pin of driving chip needs a probe corresponds.
Along with liquid crystal panel resolution improves constantly, the output driving circuit of lcd drive chip also gets more and more, and for the resolution of the 1280*800 of mobile phone, has at least 2400 to export and drive in driving chip.And the test channel quantity of existing most of tester table still can not reach this quantity.The model that such as advantest company provides is the tester table of T6372, only has 1536 test channel, can not meet the testing requirement of the driving chip of 1280*800 resolution.
Existing solution installs change-over switch additional on the probe card.Fig. 1 shows the probe and method of testing thereof that have installed change-over switch additional.As shown in Figure 1, probe 101, on the basis of an original probe S1A, increases a probe S1B, between the test channel D1 and two probe S1A and S1B of probe 101, increases a change-over switch X.Two probe S1A and S1B are connected respectively on pin one 02A and 102B of lcd drive chip IC1, and the output port D1 (test channel) of probe 101 is connected on lcd drive chip tester table 103.
The output of the driving circuit DrA be connected with pin one 02A in lcd drive chip outputs on probe S1A through pin one 02A; The output of the driving circuit DrB be connected with pin one 02B outputs on probe S1B through pin one 02B.
During test, first change-over switch X state is set to port D1 and the first probe S1A conducting, and the second probe S1B disconnects.Now, the output voltage of driving circuit DrA can be tested by the test channel of pin one 02A, the first probe S1A, port D1 arrival lcd drive chip tester table 103.After having tested, the state of change-over switch X is set to port D1 and the second probe S1B conducting, and the first probe S1A disconnects.Now, the output voltage of driving circuit DrB can be tested by the test channel of pin one 02B, the second probe S1B, port D1 arrival lcd drive chip tester table 103.Thus the output port (test channel) realizing 1 probe can realize the test of two driving circuits (pin).
But this method of testing and device display add the number of probes of probe, for adapting to the lcd drive chip that resolution improves constantly, probe makes complexity and also improves constantly, and manufacturing cost is difficult to control.
Summary of the invention
In view of the state of prior art, the object of the present invention is to provide a kind of method of testing being adapted to high-resolution lcd drive chip, the manufacture difficulty of probe can be reduced, the rising of effectively controlling cost.
Meanwhile, another object of the present invention is also to provide a kind of lcd drive chip using this method of testing.
According to above-mentioned purpose, in lcd drive chip method of testing of the present invention, lcd drive chip comprises N number of driving circuit and N number of pin, and described method comprises:
A commutation circuit is set up between every M the driving circuit and every M pin of described lcd drive chip;
The first pin in described every M pin is connected on the probe of a probe;
Described probe is connected on a lcd drive chip tester table; And
Control this commutation circuit, make on each first pin being connected to a described M pin according to the order of sequence of a described M driving circuit;
Wherein N and M is natural number, and N >=2; 2≤M≤N.
In above-mentioned lcd drive chip method of testing, described M=2.
In above-mentioned lcd drive chip method of testing, described commutation circuit comprises four switches, is connected between 2 defeated driving circuits and 2 pins with interleaved mode.
The lcd drive chip of the above-mentioned lcd drive chip method of testing of use provided by the invention, comprises N number of driving circuit and N number of pin, also comprises:
Multiple commutation circuit, is separately positioned between every M driving circuit of described lcd drive chip and every M pin; And
Control circuit, is connected with described commutation circuit, controls this commutation circuit, makes on each first pin being connected to a described M pin according to the order of sequence of a described M driving circuit;
Wherein N and M is natural number, and N >=2; 2≤M≤N.
In above-mentioned lcd drive chip, described M=2.
In above-mentioned lcd drive chip, described commutation circuit comprises four switches, is connected between 2 driving circuits and 2 pins with interleaved mode.
Accompanying drawing explanation
Fig. 1 show existing install change-over switch additional probe and method of testing.
Fig. 2 shows the structural representation of lcd drive chip of the present invention;
Fig. 3 shows the method for testing schematic diagram of lcd drive chip of the present invention.
Embodiment
Refer to Fig. 2, Fig. 2 shows the structural representation of lcd drive chip of the present invention.As shown in Figure 2, include multiple driving circuit in lcd drive chip IC2, the quantity of driving circuit is relevant with the resolution of the screen that need drive.In the embodiment shown in Figure 2, for convenience of description and understand, illustrate only the parts relevant with the present invention or unit, although other parts unrelated to the invention or unit illustrate.
Continue see Fig. 2, in the present embodiment, between every two driving circuit Dr1 and Dr2 and pin two 01 and 202 (for convenience of describing, to be called the first driving circuit and the second driving circuit and the first pin and the second pin), a commutation circuit 203 is set.This commutation circuit 203 comprises four K switch 1-K4, and four switches are connected to the first driving circuit Dr1 and the second driving circuit Dr2 with interleaved mode and between the first pin two 01 and the second pin two 02.Namely, K switch 1 is connected between the first driving circuit Dr1 and the first pin two 01, K switch 2 is connected between the first driving circuit Dr1 and the second pin two 02, K switch 3 is connected between the second driving circuit Dr2 and the first pin two 01, and K switch 4 is connected between the second driving circuit Dr2 and the second pin two 02.
In lcd drive chip, also comprise a control module 204.Control module 204 is for controlling the state of each switch in commutation circuit 203.
Please show the method for testing schematic diagram of lcd drive chip of the present invention see Fig. 3, Fig. 3 simultaneously.Below in conjunction with Fig. 3, method of testing of the present invention is described.First be connected on the probe in probe 205 by the first pin two 01 in lcd drive chip 200, probe 205 is connected with lcd drive chip tester table in the usual way.The closed and disconnected state of each switch in commutation circuit 203 is controlled by control module 204.Now, control module 204 makes the first K switch 1 and the 4th K switch 4 close, and second switch K2 and the 3rd K switch 3 disconnect.Be connected to the first pin two 01 by the first driving circuit Dr1, the second driving circuit Dr2 is connected on the second pin two 02.Lcd drive chip tester table 207 works, and tests the first driving circuit Dr1.After having tested, control module 204 makes second switch K2 and the 3rd K switch 3 close, and the first K switch 1 and the 4th K switch 4 disconnect.Be connected to the second pin two 02 by the first driving circuit Dr1, the second driving circuit Dr2 is connected on the first pin two 02.Lcd drive chip tester table 207 works, and tests the second driving circuit Dr1.
As can be seen from above-mentioned test process, a test channel of tester table 207 and a probe of probe 205 just can be tested the output driving circuit of two in lcd drive chip.For the resolution of panel 1280*800 in background technology, according to the conventional method, Advantest Corporation (advantest) T6372 lcd drive chip tester table is used to test its all output driving circuit, probe needs 2400 probes, probe needs 864 change-over switches simultaneously.
But after using method of the present invention, probe only needs 1200 probes, the number of probes of corresponding probe only has the half of aging method.Probe no longer needs change-over switch simultaneously.Greatly reduce manufacture difficulty and the cost of probe.
In the embodiment of fig. 2, be use a commutation circuit to be described for two driving circuits.But be appreciated that three driving circuits use a commutation circuit or more driving circuit to use a commutation circuit to be all the change expected of the present invention and embodiment.More driving circuit uses a commutation circuit can reduce the number of probes of probe more.Certain concrete how many driving circuits use a commutation circuit should depending on actual conditions.The effect of commutation circuit is that each of multiple driving circuit is connected on the first pin, according to the order of sequence so that tester table is tested.Commutation circuit specifically uses as the switch in Fig. 2 embodiment, and intend or other circuit form, such as switch matrix, the present invention is all not construed as limiting, as long as can realize above-mentioned linkage function according to the order of sequence.Those skilled in the art, according to this functional requirement, can design multiple different commutation circuit, all should be within the scope of the present invention.
The first K switch 1 in commutation circuit and the 4th K switch 4, when normally using, are led closed by control circuit 204 by lcd drive chip of the present invention, and second switch K2 and the 3rd K switch 3 break.The output voltage of driving circuit Dr1 just can normally deliver to pin two 01, and the output voltage of driving circuit Dr2 just can normally deliver to pin two 02.
Although embodiments of the invention are described above; but those embodiments are not used for limiting the present invention; the art has knows that the knowledgeable can impose change according to the content expressed or imply of the present invention to technical characteristic of the present invention usually; all this kind changes the patent protection category that all may belong to sought by the present invention; in other words, scope of patent protection of the present invention must define depending on the claim of this instructions and be as the criterion.
Claims (6)
1. a lcd drive chip method of testing, this lcd drive chip comprises N number of driving circuit and N number of pin, and described method comprises:
A commutation circuit is set up between every M the driving circuit and every M pin of described lcd drive chip;
The first pin in described every M pin is connected on the probe of a probe;
Described probe is connected on a lcd drive chip tester table; And
Control this commutation circuit, make on each first pin being connected to a described M pin according to the order of sequence of a described M driving circuit;
Wherein N and M is natural number, and N >=2; 2≤M≤N.
2. method according to claim 1, is characterized in that, described M=2.
3. method according to claim 2, is characterized in that, described commutation circuit comprises four switches, is connected between 2 defeated driving circuits and 2 pins with interleaved mode.
4. use a lcd drive chip for the method for testing as described in one of claims 1 to 3, comprise N number of driving circuit and N number of pin, it is characterized in that, also comprise:
Multiple commutation circuit, is separately positioned between every M driving circuit of described lcd drive chip and every M pin; And
Control circuit, is connected with described commutation circuit, controls this commutation circuit, makes on each first pin being connected to a described M pin according to the order of sequence of a described M driving circuit;
Wherein N and M is natural number, and N >=2; 2≤M≤N.
5. lcd drive chip according to claim 4, is characterized in that, described M=2.
6. lcd drive chip according to claim 5, is characterized in that, described commutation circuit comprises four switches, is connected between 2 defeated driving circuits and 2 pins with interleaved mode.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510982857.2A CN105575303A (en) | 2015-12-24 | 2015-12-24 | Liquid crystal driving chip test method and liquid crystal driving chip employing test method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510982857.2A CN105575303A (en) | 2015-12-24 | 2015-12-24 | Liquid crystal driving chip test method and liquid crystal driving chip employing test method |
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|---|---|
| CN105575303A true CN105575303A (en) | 2016-05-11 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN201510982857.2A Pending CN105575303A (en) | 2015-12-24 | 2015-12-24 | Liquid crystal driving chip test method and liquid crystal driving chip employing test method |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106990346A (en) * | 2016-01-20 | 2017-07-28 | 新特系统股份有限公司 | With the test circuit linked of switch switching single signal channel and multiple connection gaskets |
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| CN101162240A (en) * | 2006-10-13 | 2008-04-16 | 上海华虹Nec电子有限公司 | Detecting probe card testing system |
| CN102818923A (en) * | 2012-08-29 | 2012-12-12 | 上海宏力半导体制造有限公司 | System and method for measuring output voltage of internal power source of chip |
| CN103367326A (en) * | 2012-04-09 | 2013-10-23 | 中国科学院微电子研究所 | On-chip test switch matrix |
| US20140028341A1 (en) * | 2012-07-25 | 2014-01-30 | Kabushiki Kaisha Nihon Micronics | Probe card and testing apparatus |
| CN204361055U (en) * | 2015-01-21 | 2015-05-27 | 上海微世半导体有限公司 | Multiprobe timing sequence test system |
| CN105044586A (en) * | 2014-05-02 | 2015-11-11 | 慧萌高新科技有限公司 | Method for continuously inspecting electric properties of electronic chip component |
-
2015
- 2015-12-24 CN CN201510982857.2A patent/CN105575303A/en active Pending
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101162240A (en) * | 2006-10-13 | 2008-04-16 | 上海华虹Nec电子有限公司 | Detecting probe card testing system |
| CN103367326A (en) * | 2012-04-09 | 2013-10-23 | 中国科学院微电子研究所 | On-chip test switch matrix |
| US20140028341A1 (en) * | 2012-07-25 | 2014-01-30 | Kabushiki Kaisha Nihon Micronics | Probe card and testing apparatus |
| CN102818923A (en) * | 2012-08-29 | 2012-12-12 | 上海宏力半导体制造有限公司 | System and method for measuring output voltage of internal power source of chip |
| CN105044586A (en) * | 2014-05-02 | 2015-11-11 | 慧萌高新科技有限公司 | Method for continuously inspecting electric properties of electronic chip component |
| CN204361055U (en) * | 2015-01-21 | 2015-05-27 | 上海微世半导体有限公司 | Multiprobe timing sequence test system |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN106990346A (en) * | 2016-01-20 | 2017-07-28 | 新特系统股份有限公司 | With the test circuit linked of switch switching single signal channel and multiple connection gaskets |
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Effective date of registration: 20161228 Address after: 200335 Shanghai city Changning District Admiralty road 767 Lane 3 Building No. 1 Applicant after: CHIP WEALTH TECHNOLOGY LTD. Address before: 200335 Shanghai city Changning District Admiralty road 767 Lane 3 Applicant before: SINO WEALTH MICROELECTRONICS Co.,Ltd. |
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| WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20160511 |
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