CN103592477A - Aerospace level capacitor test switch channel - Google Patents

Aerospace level capacitor test switch channel Download PDF

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Publication number
CN103592477A
CN103592477A CN201310581143.1A CN201310581143A CN103592477A CN 103592477 A CN103592477 A CN 103592477A CN 201310581143 A CN201310581143 A CN 201310581143A CN 103592477 A CN103592477 A CN 103592477A
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China
Prior art keywords
switch
matrix
test
control module
module
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Pending
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CN201310581143.1A
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Chinese (zh)
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秦赞
薛沛祥
乔宏志
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CETC 41 Institute
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CETC 41 Institute
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Priority to CN201310581143.1A priority Critical patent/CN103592477A/en
Publication of CN103592477A publication Critical patent/CN103592477A/en
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Abstract

The invention discloses an aerospace level capacitor test switch channel. The aerospace level capacitor test switch channel comprises P switch matrixes and an array control module. Each switch matrix comprises a matrix array composed of M row relays and N column relays, and M*N capacitors connected into the matrix array, wherein the matrix array controls the capacitors to be sequentially connected into a capacitor test circuit in a time sharing mode. The matrix control module comprises a PXI interface unit, a CPLD control unit and P switch matrix change-over switches connected with the switch matrixes in a one-to-one corresponding mode, wherein the PXI interface unit is connected with the CPLD control unit, and the CPLD control unit receives signals from a master control computer through the PXI interface unit and controls the switch matrix change-over switches to select one switch matrix to be connected into the capacitor test circuit. According to the aerospace level capacitor test switch channel, the switch matrixes are formed by the relays, and thus the problem that hardware is redundant because of a one-to-one switch channel is solved.

Description

Aerospace level capacity measurement switch passage
Technical field
The present invention relates to a kind of aerospace level capacity measurement switch passage.
Background technology
In automatization test system, switch passage always is the key content of research.Switch passage, in test macro, is being born the vital task link of connecting test instrument or module and measured target.The performance of switch passage, directly has influence on performance and the practicality of test macro integral body.The robotization that switch passage switches is the important intermediate link that realizes system testing automatic performance.Along with the electronic devices and components quantity that current aerospace industry is used is increasing, quality is more and more higher, and the environment detecting becomes increasingly complex, detection index is more and more, in automatic testing process, often need many kinds of parameters and test signal to switch, the application of present technique has strengthened the universal performance of system, can be applied in various Auto-Test Systems.
As shown in Figure 1, it is man-to-man single channel construction of switch to existing switch channel architecture block diagram.Each measured target needs switch module of UNICOM, thereby test access of UNICOM is connected with testing tool.For realizing autorun, between switch passage and testing tool, generally have chip, industrial computer, by chip transmission command, is responsible for controlling the switch of selecting to need UNICOM, thus UNICOM's testing tool and measured piece.
Yet there is following shortcoming in existing switch passage:
(1) existing switch passage very flexible
Existing switch passage is switch passage one to one, in the time of in being applied to test macro, if the quantity of measured piece changes to some extent, the quantity of switch passage, the indices such as template all need to change thereupon, dirigibility extreme difference, and all need to redesign according to different design requirements wasting manpower and material resources's resource at every turn;
(2) existing switch passage needs more hardware resource in order to increase test function, and power consumption is large, cost is high
Existing switch passage cannot be applied in the device test system of large quantity, when the quantity of test target increases, switch module number also increases with test target quantity, when test function increase in demand is to a certain extent time, the existing switch of type one to one passage will consume too much hardware resource, increase power consumption and cost, and more likely cannot design and produce.
Summary of the invention
For in prior art one to one type switch passage make the miscellaneous drawback of hardware, the present invention proposes a kind of aerospace level capacity measurement switch passage, it adopts following technical scheme:
Aerospace level capacity measurement switch passage, comprises switch matrix and matrix control module, and switch matrix has P group;
Every group of switch matrix, comprises a matrix array being comprised of M row relay and N row relay and M * N the electric capacity that accesses described matrix array, and matrix array is controlled M * N electric capacity timesharing and accessed successively in capacitance test circuit;
Matrix control module, P the switch matrix change-over switch that comprises PXI interface unit, CPLD control module, connects one to one with described switch matrix, PXI interface unit is connected with CPLD control module, and CPLD control module receives from the signal of main control computer and selects in a certain group of switch matrix access capacitance test circuit by controlling described switch matrix change-over switch through PXI interface unit; Wherein, M, N, P are natural number, M, N >=2, P >=1.
Further, described row relay and row relay all adopt high insulation dry-reed relay.
Further, described matrix control module, also comprises that is selected the test change-over switch in capacitance test module or insulating resistance value test module access capacitance test circuit, and this test change-over switch is controlled by CPLD control module.
Further, described capacitance test module adopts LCR instrument to realize, and described insulating resistance value test module adopts program-controlled megger test PXI module to realize.
Advantage of the present invention is:
The present invention adopts relay to form switch matrix, greatly improved the hardware design of type switch passage one to one, saved cost of hardware design, and arrange and do not change any hardware by software flexible, thereby meet the device detection requirement of different parameters and varying number, saved the cabling of test macro; In switch matrix, select high insulation dry-reed relay, insulating property during this cut-off can reach 1 * 10 14Ω, and the friendship that can switch direct current 1500V high pressure and 50MHz signal frequently, meet the requirement of aerospace level capacity measurement completely; In addition, switch matrix of the present invention can also articulate a plurality of testing apparatuss, such as capacitance test module and insulating resistance value test module etc., the test of realization to aerospace level electric capacity many kinds of parameters, there is very strong Universal and scalability, for low cost, universalization and multiple channel test scheme provide a kind of new means of testing.
Accompanying drawing explanation
Fig. 1 is the structured flowchart of type switch passage one to one in prior art;
Fig. 2 is the structured flowchart of aerospace level capacity measurement switch passage in the present invention;
Fig. 3 is the structural representation of switch matrix in Fig. 2.
Embodiment
Below in conjunction with accompanying drawing and embodiment, the present invention is described in further detail:
Shown in Fig. 2, Fig. 3, aerospace level capacity measurement switch passage, comprises switch matrix and matrix control module, and switch matrix has P group.
Every group of switch matrix, comprise a matrix array being formed by M row relay and N row relay and M * N the electric capacity that accesses this matrix array, matrix array can be controlled M * N electric capacity timesharing and access successively in capacitance test circuit, adopt less relay just can reach the object of more electric capacity being patrolled to survey, thereby greatly reduce the consumption of hardware resource, saved the cost of hardware design.Preferably, row relay and row relay all adopt high insulation dry-reed relay, and insulating property during this cut-off can reach 1 * 10 14Ω, and the friendship that can switch direct current 1500V high pressure and 50MHz signal frequently, meet the requirement of aerospace level capacity measurement completely.
Matrix control module, P the switch matrix change-over switch that comprises PXI interface unit, CPLD control module, connects one to one with described switch matrix, PXI interface unit is connected with CPLD control module, and CPLD control module receives from the signal of main control computer and selects in a certain group of switch matrix access capacitance test circuit by controlling above-mentioned switch matrix change-over switch through PXI interface unit; Wherein, M, N, P are natural number, M, N >=2, P >=1.
Matrix control module, also comprise a test change-over switch, this test change-over switch preferably adopts double-point double-throw switch, selects in capacitance test module or insulating resistance value test module access capacitance test circuit, and this test change-over switch is controlled by CPLD control module.Certainly, capacitance test module herein and/or insulating resistance value test module can also change to other parameter value test modules of electric capacity, have strengthened the Universal and scalability of aerospace level capacity measurement switch passage.
In the present invention, insulating resistance value test module adopts program-controlled megger test PXI module to realize, and electric capacity is discharged and recharged and measured its insulating resistance value; Capacitance test module adopts LCR instrument to realize, and measures capacity and the loss of electric capacity.Because the test lead of capacitance test module and insulating resistance value test module is isolated, and control to switch by CPLD control module, thereby test macro can pass through the strict control operation sequential of software, avoid manual operation mistake.
In switch matrix, the concrete selection flow process of a certain path is: first test macro determines the initial turn-on path of switch according to the requirement of test, then according to initial turn-on path testing system, carrying out corresponding control arranges, by main control computer, by PXI interface unit, to CPLD control module, send control command, in CPLD control module, through data, latch, carry out the driving of switch after level conversion driving circuit, complete the setting work of the switching channel of switch.
Fig. 3 is the structured flowchart of switch matrix in the present invention.One of this switch matrix, by M row relay and N the matrix array that row relay forms, is controlled M * N electric capacity timesharing and is accessed in measuring circuit successively.
During test insulating resistance value, the high direct voltage of a termination power output of row relay contact, another termination capacitor, a termination capacitor of row relay, the sampling resistor circuit of another termination PXI module detecting unit forms loop; During testing capacitor value, a termination capacitor of row relay contact, the signal of another termination signal source output, a termination capacitor of row relay, another termination PXI module detecting unit calculates capacitance then.
Certainly; more than explanation is only preferred embodiment of the present invention; the present invention is not limited to enumerate above-described embodiment; should be noted that; any those of ordinary skill in the art are under the instruction of this instructions; that makes is allly equal to alternative, obvious form of distortion, within all dropping on the essential scope of this instructions, ought to be subject to protection of the present invention.

Claims (4)

1. aerospace level capacity measurement switch passage, is characterized in that, comprise switch matrix and matrix control module, switch matrix has P group;
Every group of switch matrix, comprises a matrix array being comprised of M row relay and N row relay and M * N the electric capacity that accesses described matrix array, and matrix array is controlled M * N electric capacity timesharing and accessed successively in capacitance test circuit;
Matrix control module, P the switch matrix change-over switch that comprises PXI interface unit, CPLD control module, connects one to one with described switch matrix, PXI interface unit is connected with CPLD control module, and CPLD control module receives from the signal of main control computer and selects in a certain group of switch matrix access capacitance test circuit by controlling described switch matrix change-over switch through PXI interface unit; Wherein, M, N, P are natural number, M, N >=2, P >=1.
2. aerospace level capacity measurement switch passage according to claim 1, is characterized in that, described row relay and row relay all adopt high insulation dry-reed relay.
3. aerospace level capacity measurement switch passage according to claim 1, it is characterized in that, described matrix control module, also comprise that is selected the test change-over switch in capacitance test module or insulating resistance value test module access capacitance test circuit, this test change-over switch is controlled by CPLD control module.
4. aerospace level capacity measurement switch passage according to claim 3, is characterized in that, described capacitance test module adopts LCR instrument to realize, and described insulating resistance value test module adopts program-controlled megger test PXI module to realize.
CN201310581143.1A 2013-11-19 2013-11-19 Aerospace level capacitor test switch channel Pending CN103592477A (en)

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CN104486177A (en) * 2014-12-26 2015-04-01 中国电子科技集团公司第五十四研究所 Large-scale reconfigurable radio-frequency switch network based on PXI bus
CN104808184A (en) * 2015-04-23 2015-07-29 中国电子科技集团公司第四十一研究所 Hierarchical switch network device for testing of multiple T/R (transmitting/receiving) modules and method for implementation of hierarchical switch network for testing of multiple T/R modules
CN104820177A (en) * 2015-04-09 2015-08-05 中国电子科技集团公司第四十五研究所 Probe switching control system for flying probe test and method thereof
CN105510736A (en) * 2015-11-26 2016-04-20 北京东方计量测试研究所 Testing system and method of spaceborne equipment
CN106597184A (en) * 2016-12-30 2017-04-26 陕西海泰电子有限责任公司 Automation test system based on hardware scanning technique, and test method thereof
CN107885119A (en) * 2017-11-10 2018-04-06 中国电子科技集团公司第四十研究所 A kind of universal parallel switch matrix system and method
CN108563213A (en) * 2018-04-11 2018-09-21 上海航天电子有限公司 A kind of telecommand automatic testing equipment
CN109375577A (en) * 2018-10-25 2019-02-22 陕西航空电气有限责任公司 A kind of testing stand multi-point output control system
CN109459616A (en) * 2018-11-26 2019-03-12 中广核核电运营有限公司 Test device and method are automatically switched in multichannel resistance and insulation measurement
CN112803936A (en) * 2020-12-23 2021-05-14 浙江中控技术股份有限公司 Touch control's binary channels output auto-change over device
CN112986625A (en) * 2021-02-09 2021-06-18 东莞讯滔电子有限公司 Multifunctional detection device
CN113655290A (en) * 2021-08-19 2021-11-16 北京他山科技有限公司 Analog signal router
CN114814365A (en) * 2022-06-24 2022-07-29 立臻精密智造(昆山)有限公司 Multi-channel test control equipment, automatic multi-channel test system and method

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Cited By (16)

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Publication number Priority date Publication date Assignee Title
CN104486177A (en) * 2014-12-26 2015-04-01 中国电子科技集团公司第五十四研究所 Large-scale reconfigurable radio-frequency switch network based on PXI bus
CN104486177B (en) * 2014-12-26 2018-03-02 中国电子科技集团公司第五十四研究所 A kind of extensive restructural RF switch network based on PXI buses
CN104820177A (en) * 2015-04-09 2015-08-05 中国电子科技集团公司第四十五研究所 Probe switching control system for flying probe test and method thereof
CN104820177B (en) * 2015-04-09 2018-01-23 中国电子科技集团公司第四十五研究所 Chaining pin handover control system and method for flying probe
CN104808184A (en) * 2015-04-23 2015-07-29 中国电子科技集团公司第四十一研究所 Hierarchical switch network device for testing of multiple T/R (transmitting/receiving) modules and method for implementation of hierarchical switch network for testing of multiple T/R modules
CN105510736A (en) * 2015-11-26 2016-04-20 北京东方计量测试研究所 Testing system and method of spaceborne equipment
CN106597184A (en) * 2016-12-30 2017-04-26 陕西海泰电子有限责任公司 Automation test system based on hardware scanning technique, and test method thereof
CN107885119A (en) * 2017-11-10 2018-04-06 中国电子科技集团公司第四十研究所 A kind of universal parallel switch matrix system and method
CN108563213A (en) * 2018-04-11 2018-09-21 上海航天电子有限公司 A kind of telecommand automatic testing equipment
CN108563213B (en) * 2018-04-11 2023-10-03 上海航天电子有限公司 Automatic testing device for remote control instruction
CN109375577A (en) * 2018-10-25 2019-02-22 陕西航空电气有限责任公司 A kind of testing stand multi-point output control system
CN109459616A (en) * 2018-11-26 2019-03-12 中广核核电运营有限公司 Test device and method are automatically switched in multichannel resistance and insulation measurement
CN112803936A (en) * 2020-12-23 2021-05-14 浙江中控技术股份有限公司 Touch control's binary channels output auto-change over device
CN112986625A (en) * 2021-02-09 2021-06-18 东莞讯滔电子有限公司 Multifunctional detection device
CN113655290A (en) * 2021-08-19 2021-11-16 北京他山科技有限公司 Analog signal router
CN114814365A (en) * 2022-06-24 2022-07-29 立臻精密智造(昆山)有限公司 Multi-channel test control equipment, automatic multi-channel test system and method

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Application publication date: 20140219