CN107065353A - The method of testing of display panel and display panel - Google Patents
The method of testing of display panel and display panel Download PDFInfo
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- CN107065353A CN107065353A CN201710282276.7A CN201710282276A CN107065353A CN 107065353 A CN107065353 A CN 107065353A CN 201710282276 A CN201710282276 A CN 201710282276A CN 107065353 A CN107065353 A CN 107065353A
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
- G02F1/1362—Active matrix addressed cells
- G02F1/136286—Wiring, e.g. gate line, drain line
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1306—Details
- G02F1/1309—Repairing; Testing
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
- G02F1/1362—Active matrix addressed cells
- G02F1/136254—Checking; Testing
Abstract
The embodiment of the present invention provides the method for testing of a kind of display panel and display panel.Display panel provided in an embodiment of the present invention, including：Viewing area and non-display area, the viewing area include multiple pixel cells, and the non-display area includes multiplexer circuit and signal input circuit；Wherein, the multiplexer circuit includes multiple first switch units and a plurality of data lines, one data wire of each first switch unit correspondence, every row pixel cell of data wire correspondence one；The signal input circuit includes signal input line and a plurality of short-circuit line, and the signal input line is used for a plurality of short-circuit line input test signal, and the short-circuit line is used for a plurality of data wire short circuit.Technical scheme provided in an embodiment of the present invention realizes original circuit in multiplexing MUX, needs to use exclusive circuit and related cabling without increasing screen test so that the effect that the frame of display device narrows.
Description
Technical field
The present invention relates to the test side of technical field of liquid crystal display, more particularly to a kind of display panel and display panel
Method.
Background technology
In debugging link of the display device in research and development, production test and before dispatching from the factory, it is necessary to by way of screen test come
Whether test display apparatus can normally use.Implement screen test operation and several results occur：As a result one, the successful point of screen
Bright, display device is shown normally；As a result two, screen can not be lighted, and display device breaks down.
Usual screen test needs to use exclusive circuit and related cabling to carry out, but display device is in point
After screen test, the circuit and the cabling of correlation used during screen test just will not be reused.
Because screen test needs to use the cabling of exclusive circuit and correlation, these all in a display device non-aobvious
Show in region, occupy larger space, cause the frame of display device wider.
The content of the invention
The embodiment of the present invention provides the method for testing of a kind of display panel and display panel, by being multiplexed MUX
In circuit carry out the test of display panel so that the frame of display device narrows.
On the one hand, the embodiments of the invention provide a kind of display panel, including viewing area and non-display area, the viewing area
Including multiple pixel cells, the non-display area includes multiplexer circuit and signal input circuit；Wherein,
The multiplexer circuit includes multiple first switch units and a plurality of data lines, each first switch unit
One data wire of correspondence, every row pixel cell of data wire correspondence one；
The signal input circuit includes signal input line and a plurality of short-circuit line, and the signal input line is used for a plurality of institute
Short-circuit line input test signal is stated, the short-circuit line is used for a plurality of data wire short circuit.
Aspect as described above and any possible implementation, it is further provided a kind of implementation, are normally showing
Stage, the multiplexer circuit is used to transmit data-signal to each pixel cell；
In test phase, the multiplexer circuit is used to transmit test signal to each pixel cell.
Aspect as described above and any possible implementation, it is further provided a kind of implementation, the multichannel choosing
Circuit is selected to be connected with outside source.
Aspect as described above and any possible implementation, it is further provided a kind of implementation, the signal is defeated
Entering circuit also includes controlling switch, and the controlling switch is located between the outside source and the signal input circuit.
Aspect as described above and any possible implementation, it is further provided a kind of implementation, it is described non-display
Area also includes cutting area, and the cutting area is used for the signal input circuit and the display panel point after test terminates
From.
Aspect as described above and any possible implementation, it is further provided a kind of implementation, the signal is defeated
Entering circuit also includes multiple second switch units, and each second switch unit corresponds to a first switch unit,
The second switch unit is used to after test terminates disconnect the signal input circuit and the multiplexer circuit.
Aspect as described above and any possible implementation, it is further provided a kind of implementation, described first opens
It is thin film transistor (TFT) to close unit and/or the second switch unit.
Aspect as described above and any possible implementation, it is further provided a kind of implementation, the viewing area
Edge is rounded, oval or polygon.
Aspect as described above and any possible implementation, it is further provided a kind of implementation, the signal is defeated
Enter circuit and/or the multiplexer circuit is located at the stepped region of the display panel.
The embodiment of the present invention also provides a kind of method of testing of display panel, applied to any one foregoing display panel,
Including：
Test signal is inputted by one or more of multiplexer circuit first switch unit to pixel cell；
If the pixel cell for receiving the test signal is all lighted, it is determined that the corresponding institute of the test signal
Pixel cell is stated to show normally.
Aspect as described above and any possible implementation, it is further provided a kind of implementation, methods described is also
Including：
If the pixel cell part for receiving the test signal is lighted or do not lighted, the test letter is determined
Number corresponding pixel cell breaks down.
Aspect as described above and any possible implementation, it is further provided a kind of implementation, methods described is also
Including：
Outside source is connected by signal input circuit with the multiplexer circuit, the outside source is used for
Export the test signal.
Aspect as described above and any possible implementation, it is further provided a kind of implementation, in the outside
Controlling switch is provided between signal source and the signal input circuit, methods described also includes：
Controlling switch is set to conducting state so that the outside source is turned on the signal input circuit.
Aspect as described above and any possible implementation, it is further provided a kind of implementation, methods described is also
Including：
The controlling switch is disconnected after test terminates.
Aspect as described above and any possible implementation, it is further provided a kind of implementation, it is described non-display
Area also includes cutting area, and methods described also includes：
The signal input circuit is separated with the display panel after test terminates.
Aspect as described above and any possible implementation, it is further provided a kind of implementation, the signal is defeated
Entering circuit also includes multiple second switch units, and each second switch unit corresponds to a first switch unit,
Methods described also includes：
Each second switch unit is disconnected after test terminates.
The method of testing of display panel and display panel provided in an embodiment of the present invention, by being set in non-display area
Multiplexer circuit and signal input circuit, wherein, multiplexer circuit includes multiple first switch units and a plurality of data lines,
And each first switch unit one data line of correspondence, the one row pixel cell of correspondence per data line, and signal input circuit
Include signal input line and a plurality of short-circuit line, short-circuit line is used for a plurality of data lines short circuit, the technical side provided in the present invention
In case, multiplexer circuit is original circuit in MUX, and can be multiplexed with pixel cell and tested, test
Process is to a plurality of short-circuit line input test signal, for testing pixel cell, if receiving by signal input line
Pixel cell to test signal is all lighted, it is determined that the corresponding pixel cell of test signal is shown normally, therefore, by multiple
With original circuit in MUX, exclusive circuit and related cabling are needed to use without increasing screen test, is subtracted
The small space for taking non-display area, and then the frame of display device is narrowed, improve because screen test is needed to use
Exclusive circuit and the cabling of correlation, occupy larger space, cause the problem of frame of display device is wider.
Brief description of the drawings
In order to illustrate more clearly about the embodiment of the present invention or technical scheme of the prior art, below will be to embodiment or existing
There is the accompanying drawing used required in technology description to be briefly described, it should be apparent that, drawings in the following description are this hairs
Some bright embodiments, for those of ordinary skill in the art, without having to pay creative labor, can be with
Other accompanying drawings are obtained according to these accompanying drawings.
Fig. 1 is the top view of display panel provided in an embodiment of the present invention；
The first enlarged diagram that Fig. 2 is region A in Fig. 1；
The second enlarged diagram that Fig. 3 is region A in Fig. 1；
The enlarged diagram that Fig. 4 is region B in Fig. 1；
The 3rd enlarged diagram that Fig. 5 is region A in Fig. 1；
Fig. 6 is the first pass schematic diagram of the method for testing of display panel provided in an embodiment of the present invention；
Fig. 7 is the second procedure schematic diagram of the method for testing of display panel provided in an embodiment of the present invention；
Fig. 8 is the 3rd schematic flow sheet of the method for testing of display panel provided in an embodiment of the present invention；
Fig. 9 is the 4th schematic flow sheet of the method for testing of display panel provided in an embodiment of the present invention；
Figure 10 is the 5th schematic flow sheet of the method for testing of display panel provided in an embodiment of the present invention；
Figure 11 is the 6th schematic flow sheet of the method for testing of display panel provided in an embodiment of the present invention；
Figure 12 is the 7th schematic flow sheet of the method for testing of display panel provided in an embodiment of the present invention.
Embodiment
To make the purpose, technical scheme and advantage of the embodiment of the present invention clearer, below in conjunction with the embodiment of the present invention
In accompanying drawing, the technical scheme in the embodiment of the present invention is clearly and completely described, it is clear that described embodiment is
A part of embodiment of the present invention, rather than whole embodiments.Based on the embodiment in the present invention, those of ordinary skill in the art
The every other embodiment obtained under the premise of creative work is not made, belongs to the scope of protection of the invention.
The term used in embodiments of the present invention is the purpose only merely for description specific embodiment, and is not intended to be limiting
The present invention." one kind ", " described " and "the" of singulative used in the embodiment of the present invention and appended claims
It is also intended to including most forms, unless context clearly shows that other implications.
Embodiment
Fig. 1 is the top view of display panel provided in an embodiment of the present invention, the first amplification signal that Fig. 2 is region A in Fig. 1
Figure, as shown in figure 1, the display panel in the embodiment of the present invention can include viewing area AA and non-display area BB, viewing area AA bags
Multiple pixel cells 11 are included, multiple pixel cells 11 are with row or to arrange as unit arrangement, and non-display area BB includes multi-path choice
Circuit 21 and signal input circuit 22.As shown in Fig. 2 multiplexer circuit 21 includes multiple first switch units 211 and a plurality of
Data wire 212, also, one data line 212 of correspondence of each first switch unit 211, the one row pixel of correspondence per data line 212
Unit 11.It is understood that in embodiments of the present invention, each first switch unit 211 after switch, for test with should
Whether the corresponding row pixel cell 11 of first switch unit 211 can be lighted.Signal input circuit 22 includes signal input line
221 and a plurality of short-circuit line 222, signal input line 221 is used for a plurality of input test signal of short-circuit line 222, and short-circuit line 222 is used for
By the short circuit of a plurality of data lines 212.During a concrete implementation, first switch unit 211 can be a film crystal
Pipe, including signal input part, control end and signal output part, signal output part are connected with corresponding row pixel cell, signal
Input is connected with data wire 212, and control end is connected with corresponding scan signal line, and display panel includes how many row pixel lists
Member 11 is with regard to how many first switch unit 211 of correspondence, and therefore, a plurality of short-circuit line 222 can manage the short circuit of a plurality of data lines 212
Xie Wei, one end of every shorting stub 222 connects a corresponding data line 212, and the other end of a plurality of shorting stub is all connected with same
Bars input line 221.
In embodiments of the present invention, multiplexer circuit 21 can be in display panel in MUX (demux)
Circuit, first switch unit 211 can be the switch in MUX.Therefore, in normally display stage, multiplexer circuit
21 are used to transmit data-signal to each pixel cell 11, and its principle is, each first switch list in multiplexer circuit 21
The row of the control of member 211 one or several row pixel cells 11, are conveyed not according to clock signal come selective to first switch unit 211
Same signal, and then pixel cell 11 corresponding with input signal is operated according to corresponding signal；In test phase,
Multiplexer circuit 21 is used to transmit test signal to each pixel cell 11, and its principle is, when needing to a certain row pixel
When unit 11 is tested, input and survey to the signal input part of first switch unit 211 corresponding with a certain row pixel cell 11
Trial signal, then inputs Continuity signal so that first opens to the corresponding scan signal line of control end of the first switch unit 211
Close unit 211 to turn on so that the test signal of signal input part input is inputted into pixel cell 11 from signal output part.
Because screen test needs to transmit signal, therefore, in embodiments of the present invention, multiplexer circuit 21 is believed with outside
Number source 23 is connected, as shown in Fig. 2 during a concrete implementation, the signal input line 221 in multiplexer circuit 21 with
Outside source 23 is connected.
It is understood that in embodiments of the present invention, screen test is used as by the circuit being multiplexed in MUX
Circuit, to realize the test to display panel, without manufacturing dedicated for the circuit used during screen test, not only save
The process and cost made has been saved, the effect for reducing border width is also achieved.
The second enlarged diagram that Fig. 3 is region A in Fig. 1, as shown in figure 3, also including control in signal input circuit 22
Switch 223, the present embodiment and the something in common of Fig. 2 embodiments will not be repeated here.The externally-located signal source 23 of controlling switch 223
Between signal input circuit 22, during a concrete implementation, controlling switch 223 can be a thin film transistor (TFT),
In the first end connection outside source 23 of controlling switch 223, the second end connection signal input circuit 22 of controlling switch 223
Signal input line 221, the corresponding control signal wire of three-terminal link of controlling switch 223.After with the addition of controlling switch 223,
In test process, controlling switch 223 is first turned on, is then inputted again by outside source 23 into signal input circuit 22
Test signal, and then corresponding first switch unit 211 is turned on by test signal, it is determined that the first switch unit with conducting
Whether 211 corresponding pixel cells 11 can normally be lighted.
It is understood that because in test phase, outside source can input different signals to signal input line, and
Different signals its corresponding voltage or electric current can be set according to different tests.In test process, display panel
Surrounding can also there are electrostatic, therefore, and meeting pair corresponding with signal voltage or electric current produce fluctuation in the presence of electrostatic, enter
And occur influence test effect the problem of.And because the circuit in MUX can produce certain leakage current, also can
The problem of there is the effect of influence test.Therefore, in embodiments of the present invention, in order to further improve test effect, in letter
Controlling switch is with the addition of in number input circuit, it is possible to achieve influence of the reduction leakage current to test, improve test result accuracy
Effect.
The enlarged diagram that Fig. 4 is region B in Fig. 1, as shown in figure 4, in embodiments of the present invention, in non-display area BB also
Including cutting area 24, cutting area 24 is separated for inputting a signal into circuit after test terminates with display panel.It is specific at one
Implementation process in, signal input line 221 can be connected with a plurality of short-circuit line 222 with cutting area 24, and cutting area 24 can be wrapped
A plurality of separate data wire 212 is included, and because data wire 212 is made of, using metallic object, to be easy to complete laggard in test
Row cutting.By being cut in cutting area so that non-display area BB area diminishes, and then the effect for reducing frame can be realized
Really.
The 3rd enlarged diagram that Fig. 5 is region A in Fig. 1, as shown in figure 5, in embodiments of the present invention, in order in test
After the completion of without cutting process, second switch unit can be set for each column pixel cell corresponding first switch unit 211
224, second switch unit 224 disconnects for inputting a signal into circuit 22 after test terminates with multiplexer circuit 21.One
During individual concrete implementation, signal input circuit 22 includes multiple second switch units 224, each second switch unit 224
Corresponding to a first switch unit 211, during a concrete implementation, second switch unit 224 can be one thin
Film transistor.
During a concrete implementation, viewing area AA edge is rounded, oval or polygon.
During a concrete implementation, signal input circuit 22 and/or multiplexer circuit 21 are located at display panel
Stepped region.
The embodiment of the present invention gives a kind of method of testing of display panel, refer to Fig. 6, it is carried for the embodiment of the present invention
The first pass schematic diagram of the method for testing of the display panel of confession, as illustrated, this method comprises the following steps：
101st, it is test signal is defeated to pixel cell by one or more of multiplexer circuit first switch unit
Enter.
The method of testing of display panel in the embodiment of the present invention, it can utilize the multi-path choice of the circuit in demux
Circuit, is tested display panel to realize, the principle of test is to work as to one or more of multiplexer circuit first
After switch element input test signal, pixel cell corresponding with the one or more first switch units can be lit, then
It is considered that the corresponding pixel cell of the one or more first switch units can normally be shown.
During a concrete implementation, first switch unit can be a thin film transistor (TFT), including signal input
End, control end and signal output part, signal output part are connected with corresponding row pixel cell, and signal input part connects with data wire
Connect, control end is connected with corresponding scan signal line, display panel include how many row pixel cells just correspond to how many
One switch element.Therefore, when needing to test a certain row pixel cell, to a certain row pixel cell corresponding first
The signal input part input test signal of switch element, then to the corresponding scan signal line of control end of the first switch unit
Input Continuity signal so that first switch unit is turned on so that the test signal of signal input part input is defeated from signal output part
Enter into pixel cell.
If the pixel cell for the 102, receiving test signal is all lighted, it is determined that the corresponding pixel cell of test signal shows
Show normal.
Based on the above, Fig. 7 is refer to, it is the second of the method for testing of display panel provided in an embodiment of the present invention
Schematic flow sheet, as shown in fig. 7, this method is after step 101, it is further comprising the steps of：
If the pixel cell part for the 103, receiving test signal is lighted or do not lighted, determine that test signal is corresponding
Pixel cell breaks down.
It is understood that in embodiments of the present invention, the pixel cell that screen test is used to test in display panel is
It is no all to light, when pixel cell is all lighted, determine the display panel be non-defective unit, pixel cell part light or
Do not light, then the display panel is substandard products.
Therefore, if the pixel cell for receiving test signal is all lighted, it is determined that the corresponding pixel cell of test signal
Display is normal, and then can be lighted after pixel cell whole in display panel is receiving test signal, it is determined that display
Panel can normally show that it is non-defective unit to determine the display panel.If the pixel cell part for receiving test signal light or
Do not light, determine that the corresponding pixel cell of test signal breaks down, it is determined that display panel cannot normally show, the face
Examination panel is substandard products.
Based on the above, Fig. 8 is refer to, it is the 3 of the method for testing of display panel provided in an embodiment of the present invention
Schematic flow sheet, as shown in figure 8, this method is before step 101, it is further comprising the steps of：
100th, outside source is connected by signal input circuit with multiplexer circuit, outside source is used to export
Test signal.
In embodiments of the present invention, signal input circuit is connected with multiplexer circuit, therefore, when outside source and letter
After the connection of number input circuit, test signal by signal input circuit can be transferred to multiplexer circuit, and then will test
Signal is inputted by one or more of multiplexer circuit first switch unit to pixel cell.
Based on the above, Fig. 9 is refer to, it is the 4 of the method for testing of display panel provided in an embodiment of the present invention
Schematic flow sheet, shown in Fig. 9, this method is further comprising the steps of before step 102：
104th, controlling switch is set to conducting state so that outside source is turned on signal input circuit.
In embodiments of the present invention, controlling switch is provided between outside source and signal input circuit, the control is opened
Close for solving in test process, electrostatic can be also there are around display panel, therefore, meeting pair and letter in the presence of electrostatic
Number corresponding voltage or electric current produce fluctuation, and then the problem of the effect of influence test occurs.
During a concrete implementation, controlling switch can be a thin film transistor (TFT), the first end of controlling switch
Connect the signal input line in outside source, the second end connection signal input circuit of controlling switch, the 3rd of controlling switch the
The corresponding control signal wire of end connection, therefore in test process, controlling switch is set to conducting state first, i.e., to control
The three-terminal link corresponding control signal wire input Continuity signal of switch, controlling switch conducting so that outside source can be with
Turned on signal input circuit.
Based on the above, refer to Figure 10, its for display panel provided in an embodiment of the present invention method of testing the
Five schematic flow sheets, as shown in Figure 10, this method are further comprising the steps of after step 102 or step 103：
105th, controlling switch is disconnected after test terminates.
It is understood that disconnecting controlling switch so that outside source disconnects with signal input circuit, even if outside letter
Number source is still in input test signal, because controlling switch is off, it is impossible to believe to signal input circuit input test
Number.
Based on the above, Figure 11 is refer to, the method for testing of its display panel provided by the embodiment of the present invention
6th schematic flow sheet, as shown in figure 11, this method are further comprising the steps of on the basis of foregoing teachings：
106th, circuit is input a signal into after test terminates to separate with display panel.
In embodiments of the present invention, signal input circuit can be arranged on cutting area, be easy to be cut after the completion of test
Cut.By being cut in cutting area so that non-display area BB area diminishes, and then the effect for reducing frame can be realized.
Based on the above, refer to Figure 12, its for display panel provided in an embodiment of the present invention method of testing the
Seven schematic flow sheets, as shown in figure 12, this method are further comprising the steps of on the basis of foregoing teachings：
107th, each second switch unit is disconnected after test terminates.
In order to prevent the signal of outside source from not cutting off in time, still suffer from signal and input to signal input line, can
Think that the corresponding first switch unit of each column pixel cell sets second switch unit, second switch unit is used to terminate in test
After input a signal into circuit and multiplexer circuit and disconnect.During a concrete implementation, signal input circuit includes many
Individual second switch unit, each second switch unit corresponds to a first switch unit.
Therefore, after test terminates, each second switch unit is disconnected, the signal of outside source can be further prevented
Do not cut off in time.
Finally it should be noted that：Various embodiments above is merely illustrative of the technical solution of the present invention, rather than its limitations；To the greatest extent
The present invention is described in detail with reference to foregoing embodiments for pipe, it will be understood by those within the art that：Its according to
The technical scheme described in foregoing embodiments can so be modified, or which part or all technical characteristic are entered
Row equivalent substitution；And these modifications or replacement, the essence of appropriate technical solution is departed from various embodiments of the present invention technology
The scope of scheme.
Claims (16)
1. a kind of display panel, it is characterised in that including viewing area and non-display area, the viewing area includes multiple pixel lists
Member, the non-display area includes multiplexer circuit and signal input circuit；Wherein,
The multiplexer circuit includes multiple first switch units and a plurality of data lines, each first switch unit correspondence
One data wire, every row pixel cell of data wire correspondence one；
The signal input circuit includes signal input line and a plurality of short-circuit line, and the signal input line is used for a plurality of described short
Route input test signal, the short-circuit line is used for a plurality of data wire short circuit.
2. display panel according to claim 1, it is characterised in that in normally display stage, the multiplexer circuit
For transmitting data-signal to each pixel cell；
In test phase, the multiplexer circuit is used to transmit test signal to each pixel cell.
3. display panel according to claim 1, it is characterised in that the multiplexer circuit connects with outside source
Connect.
4. display panel according to claim 3, it is characterised in that the signal input circuit also includes controlling switch,
The controlling switch is located between the outside source and the signal input circuit.
5. display panel according to claim 1, it is characterised in that the non-display area also includes cutting area, described to cut
Cutting area is used to separate the signal input circuit with the display panel after test terminates.
6. display panel according to claim 1, it is characterised in that the signal input circuit is also opened including multiple second
Unit is closed, each second switch unit corresponds to a first switch unit, and the second switch unit is used for
Test disconnects the signal input circuit and the multiplexer circuit after terminating.
7. display panel according to claim 6, it is characterised in that the first switch unit and/or described second open
Pass unit is thin film transistor (TFT).
8. display panel according to claim 1, it is characterised in that the edge of the viewing area it is rounded, oval or
Person's polygon.
9. display panel according to claim 1, it is characterised in that the signal input circuit and/or multichannel choosing
Select the stepped region that circuit is located at the display panel.
10. a kind of method of testing of display panel, applied to the display panel described in claim any one of 1-9, its feature exists
In, including：
Test signal is inputted by one or more of multiplexer circuit first switch unit to pixel cell；
If the pixel cell for receiving the test signal is all lighted, it is determined that the corresponding picture of the test signal
Plain unit is shown normally.
11. method according to claim 10, it is characterised in that methods described also includes：
If the pixel cell part for receiving the test signal is lighted or do not lighted, the test signal pair is determined
The pixel cell answered breaks down.
12. method according to claim 10, it is characterised in that methods described also includes：
Outside source is connected by signal input circuit with the multiplexer circuit, the outside source is used to export
The test signal.
13. method according to claim 12, it is characterised in that in the outside source and the signal input circuit
Between be provided with controlling switch, methods described also includes：
Controlling switch is set to conducting state so that the outside source is turned on the signal input circuit.
14. method according to claim 13, it is characterised in that methods described also includes：
The controlling switch is disconnected after test terminates.
15. method according to claim 10, it is characterised in that the non-display area also includes cutting area, methods described
Also include：
The signal input circuit is separated with the display panel after test terminates.
16. method according to claim 10, it is characterised in that the signal input circuit also includes multiple second switches
Unit, each second switch unit corresponds to a first switch unit, and methods described also includes：
Each second switch unit is disconnected after test terminates.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710282276.7A CN107065353A (en) | 2017-04-26 | 2017-04-26 | The method of testing of display panel and display panel |
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| CN107945721A (en) * | 2017-11-29 | 2018-04-20 | 武汉天马微电子有限公司 | A kind of display panel and its screen test method, display device |
| CN108646483A (en) * | 2018-04-26 | 2018-10-12 | 上海中航光电子有限公司 | Array substrate, display panel and display device |
| CN108957044A (en) * | 2018-08-03 | 2018-12-07 | 武汉精测电子集团股份有限公司 | Display panel full automatic point screen pulls out line detection wire body and its detection connection structure |
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| CN110232888A (en) * | 2019-06-05 | 2019-09-13 | 上海中航光电子有限公司 | A kind of driving method of display panel, display device and display device |
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| US11158221B2 (en) | 2017-11-29 | 2021-10-26 | Wuhan Tianma Micro-Electronics Co., Ltd. | Display panel, panel lighting test method of the same and display device |
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| CN109584717B (en) * | 2019-01-22 | 2021-03-09 | 上海天马有机发光显示技术有限公司 | Display panel and display device |
| CN109584717A (en) * | 2019-01-22 | 2019-04-05 | 上海天马有机发光显示技术有限公司 | Display panel and display device |
| CN110232888A (en) * | 2019-06-05 | 2019-09-13 | 上海中航光电子有限公司 | A kind of driving method of display panel, display device and display device |
| CN110379346A (en) * | 2019-07-19 | 2019-10-25 | 上海天马有机发光显示技术有限公司 | Display panel and preparation method thereof, test method and display device |
| CN111965891B (en) * | 2020-08-05 | 2021-04-27 | 武汉华星光电技术有限公司 | LED lamp panel, spliced LED lamp panel and display device |
| CN111965891A (en) * | 2020-08-05 | 2020-11-20 | 武汉华星光电技术有限公司 | LED lamp panel, spliced LED lamp panel and display device |
| CN112331118A (en) * | 2020-11-30 | 2021-02-05 | 上海天马有机发光显示技术有限公司 | Display panel and display device |
| CN112289243A (en) * | 2020-11-30 | 2021-01-29 | 上海天马有机发光显示技术有限公司 | Display panel, preparation method thereof and display device |
| CN112331118B (en) * | 2020-11-30 | 2023-09-26 | 武汉天马微电子有限公司 | Display panel and display device |
| CN112562554A (en) * | 2020-12-04 | 2021-03-26 | 昆山国显光电有限公司 | Display module and detection method thereof |
| CN114283689A (en) * | 2021-12-31 | 2022-04-05 | 厦门天马微电子有限公司 | Display module and driving method thereof |
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