CN106291216A - In-cell touch panel, test circuit and method of testing - Google Patents
In-cell touch panel, test circuit and method of testing Download PDFInfo
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- CN106291216A CN106291216A CN201610632454.XA CN201610632454A CN106291216A CN 106291216 A CN106291216 A CN 106291216A CN 201610632454 A CN201610632454 A CN 201610632454A CN 106291216 A CN106291216 A CN 106291216A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
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Abstract
The present invention provides a kind of In-cell touch panel test circuit, the first testing source of voltage signal, the second testing source is provided including for touch control electrode, for controlling the first testing source, the first film transistor AND gate second thin film transistor (TFT) of the second testing source conducting, and provide the switching signal source of switching signal for described the first film transistor AND gate the second thin film transistor (TFT)；Have the beneficial effect that the In-cell touch panel test circuit that the present invention provides, increase switching signal source and control thin film transistor (TFT) conducting, so that testing source provides different magnitude of voltage to touch electrode, touch electrode correspondence display brightness difference is made to detect abnormal luminous point and then judge whether touch electrode disconnected short-circuit state occurs, the stage casing Cell processing procedure of In-cell touch panel is connected with touch screen, touch screen is effectively touched measure of merit, it is to avoid bad touch screen causes unnecessary waste of material in flowing into other processing procedures.
Description
Technical field
The present invention relates to technical field of liquid crystal display, particularly relate to a kind of In-cell touch panel, test circuit and test side
Method.
Background technology
Display panels, is divided into three phases, the (film forming/gold-tinted/etching/stripping of leading portion Array processing procedure in overall process
From), stage casing Cell processing procedure (TFT glass with colored filter fit) and back segment module group assembling processing procedure (drive IC/ printed circuit board (PCB)
Pressing).
Contact panel is produced on liquid crystal layer top by stage casing Cell processing procedure, in this stage, and can be to the display of liquid crystal panel
Effect is tested, but will not test the touch-control effect of contact panel, when liquid crystal panel flows to next processing procedure, and can be right
Liquid crystal panel carries out chip and flexible circuit board binding, if detecting that touch-control is bad in this stage, the chip bound and can
The materials such as flexible electric circuit board are then wasted, and increase unnecessary production cost.
Therefore, it is necessary to provide a kind of effective In-cell touch panel test circuit, at stage casing Cell processing procedure i.e. to liquid crystal surface
The touch-control effect of plate is tested, to solve the problem existing for prior art.
Summary of the invention
The present invention provides a kind of In-cell touch panel test circuit, it is possible to carry out contact panel in the Cell processing procedure of stage casing
Touch-control measure of merit, goes out in late detection so that solution must not carry out touch-control measure of merit to contact panel in advance that touch-control is bad leads
Cause the technical problem of material waste.
For solving the problems referred to above, the technical scheme that the present invention provides is as follows:
The present invention provides a kind of In-cell touch panel test circuit, is arranged at outside contact panel, described contact panel bag
Include:
Touch control electrode array, described touch control electrode array includes separate some strange type touch control electrode and even type touch-control
Electrode；
Described test circuit includes:
First testing source, for providing test signal for described strange type touch control electrode；
Second testing source, for providing test signal for described even type touch control electrode；
Switching signal source, for providing switching signal for described first testing source and the second testing source；
Multiple the first film transistors, according to the switching signal on described switching signal source, by described first test signal
Test signal on source exports to the most corresponding described strange type touch control electrode；
Multiple second thin film transistor (TFT)s, according to the switching signal on described switching signal source, by described second test signal
Test signal on source exports to the most corresponding described even type touch control electrode.
According to a preferred embodiment of the present invention, described the first film transistor is N-type TFT, and its grid is even
Connecing described switching signal source, described the first film transistor source connects described first testing source, and described the first film is brilliant
The drain electrode of body pipe connects corresponding described strange type touch control electrode；Described second thin film transistor (TFT) is N-type TFT, its grid
Connecting described switching signal source, described second thin film transistor (TFT) source electrode connects described second testing source, described second thin film
Transistor drain connects corresponding described even type touch control electrode.
According to a preferred embodiment of the present invention, described strange type touch control electrode and even type touch control electrode are longitudinally with horizontal
On be alternately distributed successively.
According to a preferred embodiment of the present invention, described first testing source and the second testing source are respectively to very
Type touch control electrode provides different magnitudes of voltage from even type touch control electrode, so that described strange type touch control electrode is right with even type touch control electrode institute
The viewing area brightness answered is different.
According to a preferred embodiment of the present invention, described strange type touch control electrode is provided relatively by described first testing source
High-voltage value, described second testing source provides relatively low magnitude of voltage to described even type touch control electrode, or, described first
Testing source provides lower voltage value to described strange type touch control electrode, and described second testing source is to described even type touch-control electricity
Pole provides relatively low high-voltage value.
According to the above-mentioned purpose of the present invention, a kind of In-cell touch panel is proposed, including:
Upper substrate；
Infrabasal plate, is oppositely arranged with described upper substrate；
Touch control electrode array, is positioned at described infrabasal plate the most described upper substrate side；Described touch control electrode array includes phase
The most independent some strange type touch control electrode and even type touch control electrode；
Test circuit, connects described touch control electrode array, including:
First testing source, for providing test signal for described strange type touch control electrode；
Second testing source, for providing test signal for described even type touch control electrode；
Switching signal source, for providing switching signal for described first testing source and the second testing source；
Multiple the first film transistors, according to the switching signal on described switching signal source, by described first test signal
Test signal on source exports to the most corresponding described strange type touch control electrode；
Multiple second thin film transistor (TFT)s, according to the switching signal on described switching signal source, by described second test signal
Test signal on source exports to the most corresponding described even type touch control electrode.
According to a preferred embodiment of the present invention, described the first film transistor is N-type TFT, and its grid is even
Connecing described switching signal source, described the first film transistor source connects described first testing source, and described the first film is brilliant
The drain electrode of body pipe connects corresponding described strange type touch control electrode；Described second thin film transistor (TFT) is N-type TFT, its grid
Connecting described switching signal source, described second thin film transistor (TFT) source electrode connects described second testing source, described second thin film
Transistor drain connects corresponding described even type touch control electrode.
According to a preferred embodiment of the present invention, described strange type touch control electrode and even type touch control electrode are longitudinally with horizontal
On be alternately distributed successively.
According to a preferred embodiment of the present invention, described first testing source and the second testing source are respectively to very
Type touch control electrode provides different magnitudes of voltage from even type touch control electrode, so that described strange type touch control electrode is right with even type touch control electrode institute
The viewing area brightness answered is different.
According to a preferred embodiment of the present invention, described strange type touch control electrode is provided relatively by described first testing source
High-voltage value, described second testing source provides relatively low magnitude of voltage to described even type touch control electrode, or, described first
Testing source provides lower voltage value to described strange type touch control electrode, and described second testing source is to described even type touch-control electricity
Pole provides of a relatively high magnitude of voltage.
A kind of In-cell touch panel method of testing, comprises the following steps:
S101, is divided into touch control electrode two parts touch electrode, and provides not to two parts touch electrode the most simultaneously
Same magnitude of voltage, so that the viewing area brightness corresponding to two parts electrode is different；
S102, is detected viewing area by Systems for optical inspection or human eye；
S103, detects that dark viewing area occurs that bright spot can exist short circuit/disconnected by partial touch electrode corresponding to this region
Road fault；
S104, detects that brighter viewing area occurs that dim spot can exist short circuit/disconnected by partial touch electrode corresponding to this region
Road fault.
The invention have the benefit that the In-cell touch panel test circuit that the present invention provides, increase the control of switching signal source
Made membrane transistor turns, so that testing source provides different magnitude of voltage to touch electrode, makes touch electrode correspondence show
Brightness difference detects abnormal luminous point and then judges whether touch electrode disconnected short-circuit state occurs, in the stage casing of In-cell touch panel
Cell processing procedure is connected with touch screen, touch screen is touched effectively measure of merit, it is to avoid bad touch screen is flowing into it
He causes unnecessary waste of material in processing procedure.
Accompanying drawing explanation
In order to be illustrated more clearly that embodiment or technical scheme of the prior art, below will be to embodiment or prior art
In description, the required accompanying drawing used is briefly described, it should be apparent that, the accompanying drawing in describing below is only some of invention
Embodiment, for those of ordinary skill in the art, on the premise of not paying creative work, it is also possible to attached according to these
Figure obtains other accompanying drawing.
Fig. 1 is the circuit theory diagrams of In-cell touch panel of the present invention test circuit；
Fig. 2 is In-cell touch panel method of testing schematic diagram of the present invention.
Detailed description of the invention
The explanation of following embodiment is with reference to additional diagram, the particular implementation implemented in order to illustrate the present invention may be used to
Example.The direction term that the present invention is previously mentioned, such as [on], [under], [front], [afterwards], [left], [right], [interior], [outward], [side]
Deng, it is only the direction with reference to annexed drawings.Therefore, the direction term of use is to illustrate and understand the present invention, and is not used to
Limit the present invention.In the drawings, the unit that structure is similar is to represent in order to identical label.
The present invention is directed in existing touch panel production process, it is impossible at suitable processing procedure, it is touched effect and survey
Examination, the problem that detects after sequence processing procedure after entering then can cause the technical problem of unnecessary waste of material to provide a kind of test
Circuit.
With reference to Fig. 1, for the circuit theory diagrams of In-cell touch panel of the present invention test circuit.
As it is shown in figure 1, include the In-cell touch panel test circuit 105 of touch control electrode and present invention offer, in order to just
In explanation, described touch control electrode is divided into strange type touch control electrode 101 and even type touch control electrode 102；Described test circuit 105 wraps
Include switching signal source SW, the first testing source TP1, the second testing source TP2, multiple the first film transistor T1 and multiple
Second thin film transistor (TFT) T2, each described the first film transistor T1 correspondence connects a strange type touch control electrode, and each described the
Two thin film transistor (TFT) T2 correspondences connect an even type touch control electrode.
Such as, each described strange type touch control electrode 101 connects a described the first film crystalline substance by the first wire 103 is corresponding
Body pipe T1, each described even type touch control electrode 102 connects described second thin film transistor (TFT) by the second wire 104 is corresponding
T2；Described the first film transistor T1 grid connects described switching signal source SW, and described the first film transistor T1 source electrode connects
Described first testing source TP1, described the first film transistor T1 drain electrode connects corresponding described strange type touch control electrode
101；Described second thin film transistor (TFT) T2 grid connects described switching signal source SW, and described second thin film transistor (TFT) T2 source electrode connects
Described second testing source TP2, described second thin film transistor (TFT) T2 drain electrode connects corresponding described even type touch control electrode
102。
Described switching signal source SW controls described the first film transistor T1 and the opening and closing of the second thin film transistor (TFT) T2, needs
When testing touch screen, described switching signal source SW carries to described the first film transistor T1 and the second thin film transistor (TFT) T2
For high level signal, the most described the first film transistor T1 and the second thin film transistor (TFT) T2 opens, described first test signal
Source TP1 and the second testing source TP2 provides survey to corresponding strange type touch control electrode 101 with even type touch control electrode 102 respectively
Examination voltage is for test.
During test, described first testing source TP1 and the second testing source TP2 is respectively to corresponding the first film
Transistor T1 and the second thin film transistor (TFT) T2 provides different test voltage values for test；Such as, for described strange type touch control electrode
101 provide higher test voltage value, provide relatively low test voltage value, such as, theoretical electricity for described even type touch control electrode 102 simultaneously
To one high and one low in pressure value, magnitude of voltage selects between-5V～5V, in actual test process, adjusts the first testing source
TP1 and the first testing source TP1 voltage difference, till can substantially distinguishing light and shade region；Representative value is the first testing source
TP1 provides 1V magnitude of voltage, the second testing source TP2 to provide 5V magnitude of voltage；Owing to touch electrode is the common electrical of viewing area
Pole, imposes voltage and can change corresponding viewing area mesomorphic state and then change the light transmittance in this region, impose electricity touch electrode
The highest corresponding viewing area brightness of pressure value is the highest, imposes lower voltage value then contrary, thus respectively to described strange type touch control electrode
101 impose different magnitude of voltage from even type touch control electrode 102 is divided into distinct contrast dark by corresponding for touch control electrode viewing area
Viewing area and brighter viewing area are for detection.
When a strange type touch control electrode 101 and an even type touch control electrode 102 are short-circuited, there is touching of small voltage
Control its voltage of electrode, by identical for the voltage of the touch control electrode become and have bigger voltage or level off to identical, now has less
The brightness of viewing area corresponding to the touch control electrode of voltage by with there is viewing area phase corresponding to the touch control electrode of bigger voltage
Same or the most close；Thus, i.e. be can determine whether by the brightness flop of the viewing area at the touch control electrode place of observation small voltage
Go out whether to exist the touch control electrode being short-circuited, i.e. when detecting that having continuous print presents multiple viewing areas of brighter on state of
Time then illustrate to there is the touch control electrode being short-circuited.
Arranging test equipment on a production line, with the touch-control effect of test touch screen, this test equipment includes backlight, bat
According to device and analyze system, during test, described touch screen is placed in described backlight and comes between camera arrangement, described backlight to
Described viewing area transmission backlight, makes viewing area form bright, by imposing small one and large one magnitude of voltage, makes described whole aobvious
Whether showing that region forms bright, dark areas, is taken pictures in viewing area by described camera arrangement, by existing in analyzing identification light and shade region
Anti-Provincial Spotlight, the most dark viewing area occurs that dim spot occur in relatively bright spot or brighter areas, and these are circuit abnormality phenomenon, can evidence
This judges that the touch electrode of this touch screen exists short circuit/open circuit fault.
After having tested, can by this radium-shine excision of test circuit 105, or make described switching signal source SW be placed in suspended state or
Person gives described switching signal source SW low level, and the most described the first film transistor T1 and the second thin film transistor (TFT) T2 is in closedown
State thus do not affect the normal use of touch screen.
For the ease of the observation to viewing area, described strange type touch control electrode 101 can be carried out with even type touch control electrode 102
Arrange regularly, with prominent dark viewing area and the abnormal show point in brighter viewing area, and then be easier to judge touch-control
The abnormal work circuit of electrode；Such as, by described strange type touch control electrode 101 and even type touch control electrode 102 longitudinally with transversely
It is alternately distributed successively, so that described strange type touch control electrode 101 is mixed with the bright spot of even viewing area corresponding to type touch control electrode 102
Close uniformly, it is simple to distinguish the dim spot in bright and the bright spot in dark face, improve the accuracy judged.
The present invention also provides for a kind of In-cell touch panel, and the In-cell touch panel of this preferred embodiment includes:
Upper substrate；Infrabasal plate, is oppositely arranged with described upper substrate；Touch control electrode array, is positioned at described infrabasal plate relative to institute
State upper substrate side；Described touch control electrode array includes separate some strange type touch control electrode and even type touch control electrode；Survey
Examination circuit 105, connects described touch control electrode array, including: the first testing source, for providing for described strange type touch control electrode
Test signal；Second testing source, for providing test signal for described even type touch control electrode；Switching signal source, be used for be
Described first testing source and the second testing source provide switching signal；Multiple the first film transistors, open according to described
Switching signal on OFF signal source, touches the test signal output on described first testing source to corresponding described strange type
On control electrode；Multiple second thin film transistor (TFT)s, according to the switching signal on described switching signal source, by described second test signal
Test signal on source exports to the most corresponding described even type touch control electrode.
According to a preferred embodiment of the present invention, described the first film transistor is N-type TFT, and its grid is even
Connecing described switching signal source, described the first film transistor source connects described first testing source, and described the first film is brilliant
The drain electrode of body pipe connects corresponding described strange type touch control electrode；Described second thin film transistor (TFT) is N-type TFT, its grid
Connecting described switching signal source, described second thin film transistor (TFT) source electrode connects described second testing source, described second thin film
Transistor drain connects corresponding described even type touch control electrode.
According to a preferred embodiment of the present invention, described strange type touch control electrode and even type touch control electrode are longitudinally with horizontal
On be alternately distributed successively.
According to a preferred embodiment of the present invention, described first testing source and the second testing source are respectively to very
Type touch control electrode provides different magnitudes of voltage from even type touch control electrode, so that described strange type touch control electrode is right with even type touch control electrode institute
The viewing area brightness answered is different.
According to a preferred embodiment of the present invention, described strange type touch control electrode is provided relatively by described first testing source
High-voltage value, described second testing source provides relatively low magnitude of voltage to described even type touch control electrode, or, described first
Testing source provides lower voltage value to described strange type touch control electrode, and described second testing source is to described even type touch-control electricity
Pole provides of a relatively high magnitude of voltage.
The specific works principle of the In-cell touch panel of the present invention is preferred with above-mentioned In-cell touch panel test circuit
Description in embodiment is same or similar, specifically refers to the phase in the preferred embodiment of above-mentioned In-cell touch panel test circuit
Close and describe.
With reference to Fig. 2, for In-cell touch panel method of testing schematic diagram of the present invention.
As in figure 2 it is shown, the present invention provides a kind of In-cell touch panel method of testing, comprise the following steps: S101, by touch-control
Electrode divides two parts touch electrode into, and provides different magnitude of voltage to two parts touch electrode the most simultaneously, so that two parts
Viewing area brightness corresponding to electrode is different.
S102, is detected viewing area by Systems for optical inspection or human eye.
S103, detects that dark viewing area occurs that bright spot can exist short circuit/disconnected by partial touch electrode corresponding to this region
Road fault.
S104, detects that brighter viewing area occurs that dim spot can exist short circuit/disconnected by partial touch electrode corresponding to this region
Road fault.
The invention have the benefit that the In-cell touch panel test circuit that the present invention provides, increase the control of switching signal source
Made membrane transistor turns, so that testing source provides different magnitude of voltage to touch electrode, makes touch electrode correspondence show
Brightness difference detects abnormal luminous point and then judges whether touch electrode disconnected short-circuit state occurs, in the stage casing of In-cell touch panel
Cell processing procedure is connected with touch screen, touch screen is touched effectively measure of merit, it is to avoid bad touch screen is flowing into it
He causes unnecessary waste of material in processing procedure.
In sum, although the present invention is disclosed above with preferred embodiment, but above preferred embodiment and be not used to limit
The present invention processed, those of ordinary skill in the art, without departing from the spirit and scope of the present invention, all can make various change and profit
Decorations, therefore protection scope of the present invention defines in the range of standard with claim.
Claims (10)
1. an In-cell touch panel test circuit, it is characterised in that be arranged at outside contact panel, described contact panel bag
Include:
Touch control electrode array, described touch control electrode array includes separate some strange type touch control electrode and even type touch-control electricity
Pole；
Described test circuit includes:
First testing source, for providing test signal for described strange type touch control electrode；
Second testing source, for providing test signal for described even type touch control electrode；
Switching signal source, for providing switching signal for described first testing source and the second testing source；
Multiple the first film transistors, according to the switching signal on described switching signal source, by described first testing source
Test signal output in the most corresponding described strange type touch control electrode；
Multiple second thin film transistor (TFT)s, according to the switching signal on described switching signal source, by described second testing source
Test signal output in the most corresponding described even type touch control electrode.
In-cell touch panel the most according to claim 1 test circuit, it is characterised in that described the first film transistor gate
Pole connects described switching signal source, and described the first film transistor source connects described first testing source, described first thin
Film transistor drain electrode connects corresponding described strange type touch control electrode；
Described second thin-film transistor gate connects described switching signal source, and described second thin film transistor (TFT) source electrode connects described the
Two testing sources, described second thin film transistor (TFT) drain electrode connects corresponding described even type touch control electrode.
In-cell touch panel the most according to claim 1 test circuit, it is characterised in that described strange type touch control electrode and idol
Type touch control electrode longitudinally be alternately distributed the most successively.
In-cell touch panel the most according to claim 1 test circuit, it is characterised in that described first testing source with
Second testing source provides different magnitudes of voltage to strange type touch control electrode from even type touch control electrode respectively, so that described strange type touch-control
Electrode is different from the viewing area brightness corresponding to even type touch control electrode.
In-cell touch panel the most according to claim 4 test circuit, it is characterised in that described first testing source pair
Described strange type touch control electrode provides higher voltage value, and described even type touch control electrode is provided relatively by described second testing source
Low voltage value, or, described first testing source provides lower voltage value, described second test to described strange type touch control electrode
Signal source provides of a relatively high magnitude of voltage to described even type touch control electrode.
6. an In-cell touch panel, it is characterised in that including:
Upper substrate；
Infrabasal plate, is oppositely arranged with described upper substrate；
Touch control electrode array, is positioned at described infrabasal plate the most described upper substrate side；Described touch control electrode array includes the most solely
Vertical some strange type touch control electrode and even type touch control electrode；
Test circuit, connects described touch control electrode array, including:
First testing source, for providing test signal for described strange type touch control electrode；
Second testing source, for providing test signal for described even type touch control electrode；
Switching signal source, for providing switching signal for described first testing source and the second testing source；
Multiple the first film transistors, according to the switching signal on described switching signal source, by described first testing source
Test signal output in the most corresponding described strange type touch control electrode；
Multiple second thin film transistor (TFT)s, according to the switching signal on described switching signal source, by described second testing source
Test signal output in the most corresponding described even type touch control electrode.
In-cell touch panel the most according to claim 6, it is characterised in that described the first film transistor gate connects institute
Stating switching signal source, described the first film transistor source connects described first testing source, described the first film transistor
Drain electrode connects corresponding described strange type touch control electrode；
Described second thin-film transistor gate connects described switching signal source, and described second thin film transistor (TFT) source electrode connects described the
Two testing sources, described second thin film transistor (TFT) drain electrode connects corresponding described even type touch control electrode.
In-cell touch panel the most according to claim 6, it is characterised in that described strange type touch control electrode and even type touch-control electricity
Pole longitudinally be alternately distributed the most successively.
In-cell touch panel the most according to claim 6, it is characterised in that described first testing source and the second test
Signal source provides different magnitudes of voltage to strange type touch control electrode from even type touch control electrode respectively, so that described strange type touch control electrode and idol
Viewing area brightness corresponding to type touch control electrode is different.
10. an In-cell touch panel method of testing, it is characterised in that comprise the following steps:
S101, is divided into touch control electrode two parts touch electrode, and provides different electricity to two parts touch electrode the most simultaneously
Pressure value, so that the viewing area brightness corresponding to two parts electrode is different；
S102, is detected viewing area by Systems for optical inspection or human eye；
S103, detect dark viewing area occur bright spot can partial touch electrode corresponding to this region there is short circuit/open circuit therefore
Barrier；
S104, detect brighter viewing area occur dim spot can partial touch electrode corresponding to this region there is short circuit/open circuit therefore
Barrier.
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| CN201610632454.XA CN106291216A (en) | 2016-08-04 | 2016-08-04 | In-cell touch panel, test circuit and method of testing |
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| CN106908685A (en) * | 2017-02-23 | 2017-06-30 | 武汉华星光电技术有限公司 | A kind of test system and its method of testing of mutual capacitance type touch display unit |
| CN106908685B (en) * | 2017-02-23 | 2019-09-27 | 武汉华星光电技术有限公司 | A kind of test macro and its test method of mutual capacitance type touch display unit |
| CN107123387A (en) * | 2017-06-20 | 2017-09-01 | 厦门天马微电子有限公司 | A kind of display device, display panel and its driving method |
| WO2019000568A1 (en) * | 2017-06-30 | 2019-01-03 | 武汉华星光电技术有限公司 | Embedded touch screen testing circuit |
| CN108364598A (en) * | 2018-03-26 | 2018-08-03 | 京东方科技集团股份有限公司 | Display base plate and its method for detecting short circuit, display device |
| CN110187218A (en) * | 2019-01-23 | 2019-08-30 | 友达光电股份有限公司 | Integrated touch panel and test method |
| CN112086049A (en) * | 2020-09-16 | 2020-12-15 | 武汉华星光电技术有限公司 | Display panel and electronic device |
| US11636787B2 (en) | 2020-09-16 | 2023-04-25 | Wuhan China Star Optoelectronics Technology Co., Ltd. | Display panel and electronic apparatus |
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Application publication date: 20170104 |