CN207248927U - A kind of switch matrix - Google Patents
A kind of switch matrix Download PDFInfo
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- CN207248927U CN207248927U CN201721172185.XU CN201721172185U CN207248927U CN 207248927 U CN207248927 U CN 207248927U CN 201721172185 U CN201721172185 U CN 201721172185U CN 207248927 U CN207248927 U CN 207248927U
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Abstract
The utility model provides a kind of switch matrix, including row input signal group, row input signal group, relay matrix array, row relay array, row relay array, current source module, MCU module, communication module, ADC acquisition modules, display screen/upper seat in the plane interface module；The display screen/upper seat in the plane interface module, ADC acquisition modules, communication module are connected with the MCU module respectively；The ADC acquisition modules, communication module, the row relay array, row relay array are connected with the current source module respectively；Each relay of the row relay array connects one to one in the row input signal group and relay matrix array；Each relay of the row relay array connects one to one in row input signal group and relay matrix array.It can make the switch matrix that there is self-checking function using the utility model, quickly investigate problem.
Description
【Technical field】
It the utility model is related to a kind of switch matrix.
【Background technology】
In the test of current experiment room, measured object often changes, and gauge wiring takes time and effort very much again, therefore laboratory equipment connects
Line uses switch matrix.And existing switch matrix is complicated, scheduling and planning is not easy and investigation exception is not easy after going wrong.When opening
The problem component can not be detected by closing after matrix some element breaks down, and then cannot be overhauled for problem points and element
Replace, and whole switch matrix can only be replaced, cause to waste, while replacement cost is also expensive.In addition switch matrix after
Rear service life state, which is used for multiple times, in electric appliance to judge, whether can not predict needs more relay, it is impossible to accomplish because life problems are drawn
The fault pre-alarming risen, can cause the delay of experiment progress, waste time.
【Utility model content】
The technical problems to be solved in the utility model, is to provide a kind of switch matrix with self-checking function, realization is opened
Abnormal problem can quickly be investigated with self-examination by closing matrix, and then can be overhauled for problem points and element replacement.
The utility model is realized in this way：A kind of switch matrix, including row input signal group, row input signal group, after
Relay matrix array, row relay array, row relay array, current source module, MCU module, communication module, ADC collection moulds
Block, display screen/upper seat in the plane interface module；The display screen/upper seat in the plane interface module, ADC acquisition modules, communication module respectively and
The MCU module is connected；The ADC acquisition modules, communication module are connected with the current source module respectively；It is described row after
Electric appliance battle array column and row relay array is connected with the current source module respectively；Each relay of the row relay array
A line relay for choosing relay matrix array respectively is connected；Each relay of the row relay array is chosen respectively
One row relay of relay matrix array is connected；Each input signal of the row input signal group chooses the row respectively
A relay in relay array is connected, each input signal of the row input signal group choose respectively the row after
A relay in electric appliance array is connected.
Further, a kind of switch matrix, further includes I/O expansion module；The I/O expansion module and the MCU
Module is connected.
A kind of self checking method of switch matrix of the utility model, process of self-test, relay matrix comprising current source function
Process of self-test, process of self-test, the process of self-test in relay matrix service life of relay matrix open circuit of short circuit.
Further, the process of self-test of the current source function comprises the steps of：
Step S1, MCU module closes all relays in row relay array, relay matrix battle array columns and rows relay array
Device and current source module, host computer sends instruction, into Auto-Sensing Mode；
Step S2, to current source module on-load voltage U, electric current I, judge the output voltage of current source module is MCU module
It is no to be equal to U, if, on the contrary current source module exception normal equal to current source module if U, MCU module feedback display screen/upper seat in the plane
Interface, alarm current source module is abnormal, closes current source module, terminates self-test.
Further, the process of self-test of the relay matrix short circuit comprises the steps of：
Step S1, MCU module closes all relays in row relay array, relay matrix battle array columns and rows relay array
Device and current source module, host computer sends instruction, into Auto-Sensing Mode；
Step S2, a relay being attracted in the relay and row relay array in row relay array；
Step S3, current source module on-load voltage U, electric current I, judge whether the output voltage of current source module is equal to U, if
Equal to U, represent without short circuit；It is on the contrary then demarcate in relay and row relay array in the row relay array currently chosen
The connected at the same time relay matrix array of relay in relay short circuit, MCU module feedback display screen/upper seat in the plane interface,
Show relay short circuit；
Step S4, replace the relay in row relay array and/or row relay array, repeat step S2 and S3 until
All relay tests of relay matrix array are complete.
Further, the process of self-test of the relay matrix open circuit comprises the steps of：
Step S1, MCU module closes all relays in row relay array, relay matrix battle array columns and rows relay array
Device and current source module, host computer sends instruction, into Auto-Sensing Mode；
Step S2, be attracted row relay array in a relay, a relay in row relay array and on
State the relay in two relays while connected relay matrix array；
Step S3, current source module on-load voltage U and electric current I, judges whether the output voltage of current source module is less than U/
3, if being less than U/3, expression is not opened a way, and relay is normal；Conversely, then demarcate in the relay matrix array currently chosen after
Electric appliance is opened a way, MCU module feedback display screen/upper seat in the plane interface, shows the relay open circuit of above-mentioned calibration；
Step S4, row relay array and/or relay in row relay array are replaced and above-mentioned two relay is same
Relay in the relay matrix array of Shi Xianglian, repeat step S2 and S3 is until all relays of relay matrix array
Detect.
Further, the process of self-test in the relay matrix service life comprises the steps of：
Step S1, MCU module closes all relays in row relay array, relay matrix battle array columns and rows relay array
Device and current source module, host computer sends instruction, into Auto-Sensing Mode；
Step S2, be attracted row relay array in a relay, a relay in row relay array and on
State the relay in two relays while connected relay matrix array；
Step S3, current source module on-load voltage U and electric current I, ADC acquisition module collection output voltage U0, electric current I0, instead
It is fed to MCU module computing impedance Z=U0/I0；If Z<ZQualified, then the relay in the relay matrix array currently chosen is demarcated
Device is normal；If ZQualified≤Z≤ZInvalid, then it represents that the relay life in the relay matrix array currently chosen connects soon
Near critical, demarcates the relay and prepares to replace；If Z>ZInvalid, then it represents that the relay in the relay matrix array currently chosen
Device has damaged, and demarcates the relay damaged；MCU module feeds back display screen/host computer interface, shows that the relay is normal or accurate
It is standby to replace or damage；Note：ZQualifiedImpedance, Z are advised to closeInvalidFor invalid impedance, scope can be according to specific experimental circuit feelings
Condition is specifically set；
Step S4, row relay array and/or relay in row relay array are replaced and above-mentioned two relay is same
Relay in the relay matrix array of Shi Xianglian, repeat step S2 and S3 is until all relays of relay matrix array
Detect.
Further, the self checking method of a kind of switch matrix, further includes the process of self-test of relay matrix bypass,
The process of self-test of the relay matrix bypass comprises the steps of：
Step S1, MCU module closes all relays in row relay array, relay matrix battle array columns and rows relay array
Device and current source module, host computer sends instruction, into Auto-Sensing Mode；
Step S2, a relay in attracting electric relay matrix array, current source module on-load voltage U and electric current I；
Step S3, it is attracted in the row relay array being connected with the relay in the relay matrix array currently chosen
Relay, while the relay being attracted in the row relay array being connected with the relay in the relay matrix array currently chosen
The adjacent relay of device, judges whether the output voltage of current source module is equal to U, if being equal to U, represents the relay square currently chosen
Relay in a burst of row does not bypass short circuit, and relay is normal；Conversely, then demarcate in the relay matrix array currently chosen
Relay bypass short circuit, MCU feedback display screen/host computer interface, show the relay bypass short circuit；
Step S4, two relays that break step S3 is attracted, are attracted in the relay matrix array with currently choosing
Relay in the row relay array that relay is connected, while be attracted and the relay in the relay matrix array currently chosen
The adjacent relay of relay in the row relay array that device is connected, judges whether the output voltage of current source module is equal to U, if
Equal to U, the relay in the relay matrix array for representing currently to choose does not bypass short circuit, and relay is normal；Conversely, then mark
Relay bypass short circuit in the relay matrix array chosen before settled, MCU module feedback display screen/host computer interface, shows
Show relay bypass short circuit；
Step S5, the relay in relay matrix array is replaced, repeat step S2 to S4 is until relay matrix array
The bypasses of all relays all detected.
The utility model has the following advantages that：The utility model provides a kind of switch matrix, including row input signal group, row
Input signal group, relay matrix array, row relay array, row relay array, current source module, MCU module, communication mould
Block, ADC acquisition modules, display screen/upper seat in the plane interface module；The display screen/upper seat in the plane interface module, ADC acquisition modules, lead to
Letter module is connected with the MCU module respectively；The ADC acquisition modules, communication module respectively with the current source module phase
Connection；The row relay array, row relay array are connected with the current source module respectively；The row relay array
Each relay choose a line relay of relay matrix array respectively and be connected；The row relay array it is each after
The row relay that electric appliance chooses relay matrix array respectively is connected；Each input signal of the row input signal group point
The relay do not chosen in the row relay array is connected, each input signal difference of the row input signal group
The relay chosen in the row relay array is connected.The utility model can realize switch matrix short circuit,
The self-checking function of open circuit, service life and bypass short circuit, and the self-test of current source function, quickly investigate problem, and then to problem points
Overhauled.
【Brief description of the drawings】
The utility model is further described in conjunction with the embodiments with reference to the accompanying drawings.
Fig. 1 is a kind of schematic diagram of switch matrix.
Fig. 2 is a kind of flow chart of the current source process of self-test of switch matrix.
Fig. 3 is a kind of flow chart of the process of self-test of the relay matrix short circuit of switch matrix.
Fig. 4 is the flow chart for the process of self-test that a kind of relay matrix of switch matrix is opened a way.
Fig. 5 is a kind of flow chart of the process of self-test in the relay matrix service life of switch matrix.
Fig. 6 is the flow chart for the process of self-test that a kind of relay matrix of switch matrix bypasses.
【Embodiment】
Referring to Fig. 1, a kind of switch matrix, including row input signal group, row input signal group, relay matrix array,
Row relay array, row relay array, current source module, MCU module, communication module, ADC acquisition modules, display screen/upper machine
Position interface module；The display screen/upper seat in the plane interface module, ADC acquisition modules, communication module respectively with the MCU module phase
Connection；The ADC acquisition modules, communication module are connected with the current source module respectively；The row relay array, row after
Electric appliance array is connected with the current source module respectively；Each relay of the row relay array chooses relay respectively
A line relay of matrix array is connected；Each relay of the row relay array chooses relay matrix array respectively
A row relay be connected；Each input signal of the row input signal group is chosen in the row relay array respectively
One relay is connected, and each input signal of the row input signal group chooses one in the row relay array respectively
A relay is connected.
A kind of switch matrix, further includes I/O expansion module；The I/O expansion module is connected with the MCU module.
The I/O expansion module can increase connectivity port.
Refer to Fig. 2 to 6, a kind of self checking method of switch matrix of the utility model, the self-test comprising current source function
Journey, the process of self-test of relay matrix short circuit, the process of self-test of relay matrix open circuit, the self-test in relay matrix service life
Journey.
The process of self-test of the current source function comprises the steps of：
With specific embodiment MCU module to current source module on-load voltage U=3V, I=1A exemplified by：
Step S1, MCU module is closed in all row relay arrays, relay matrix battle array columns and rows relay array and owned
Relay and current source module, host computer sends instruction, into Auto-Sensing Mode；
Step S2, MCU module judges the output voltage of current source module to current source module on-load voltage 3V, electric current 1A
Whether 3V is equal to, current source module is normal if 3V is equal to, otherwise current source module is abnormal, MCU module feedback display screen/on
Seat in the plane interface, alarm current source module is abnormal, closes current source module, terminates self-test.
The process of self-test of the relay matrix short circuit comprises the steps of：
Current source module on-load voltage U=3V, I=1A are given with specific embodiment MCU module, is attracted row relay array
In relay 4.1 and row relay array in relay 5.1 exemplified by：
Step S1, MCU module is closed in all row relay arrays, relay matrix battle array columns and rows relay array and owned
Relay and current source module, host computer sends instruction, into Auto-Sensing Mode；
Step S2, the relay 5.1 being attracted in the relay 4.1 and row relay array in row relay array；
Step S3, current source module on-load voltage 3V, electric current 1A, judge whether the output voltage of current source module is equal to
3V, if being equal to 3V, represents without short circuit；On the contrary then in calibration relay matrix array relay 3.1.1 is short-circuit, MCU module
Feed back display screen/upper seat in the plane interface, the 3.1.1 short circuits of display relay；
Step S4, replace the relay in row relay array and/or row relay array, repeat step S2 and S3 until
All relay tests of relay matrix array are complete.
The process of self-test of the relay matrix open circuit comprises the steps of：
Current source module on-load voltage U=3V, I=1A are given with specific embodiment MCU module, is attracted row relay array
In relay 4.1, exemplified by the relay 3.1.1 in relay 5.1 and relay matrix array in row relay array：
Step S1, MCU module is closed in all row relay arrays, relay matrix battle array columns and rows relay array and owned
Relay and current source module, host computer sends instruction, into Auto-Sensing Mode；
Step S2, the relay 4.1 in row relay array, relay 5.1 and relay in row relay array are attracted
Relay 3.1.1 in device matrix array；
Step S3, current source module on-load voltage 3V and electric current 1A, judges whether the output voltage of current source module is less than
1V, if being less than 1V, expression is not opened a way, and relay is normal；Conversely, then demarcating relay 3.1.1 open circuits, MCU module feedback is aobvious
Display screen/upper seat in the plane interface, display relay 3.1.1 open circuits；
Step S4, replace in row relay array and/or relay and relay matrix array in row relay array
Relay, repeat step S2 and S3 until relay matrix array all relay tests it is complete.
The process of self-test in the relay matrix service life comprises the steps of：
With a specific embodiment:MCU module gives current source module on-load voltage U=3V, I=1A, ZQualified=100m
Ω, ZInvalid=200m Ω, be attracted row relay array in relay 4.1, the relay 5.1 in row relay array and after
Exemplified by relay 3.1.1 in relay matrix array；
Step S1, MCU module is closed in all row relay arrays, relay matrix battle array columns and rows relay array and owned
Relay and current source module, host computer sends instruction, into Auto-Sensing Mode；
Step S2, the relay 4.1 in row relay array, relay 5.1 and relay in row relay array are attracted
Relay 3.1.1 in device matrix array；
Step S3, current source module on-load voltage 3V and electric current 1A, ADC acquisition module collection output voltage U0, electric current I0,
Feed back to MCU module computing impedance Z=U0/I0；If Z<100m Ω, then demarcate in the relay matrix array currently chosen after
Electric appliance is normal；If 100m Ω≤Z≤200m Ω, then it represents that the relay life in the relay matrix array currently chosen connects soon
Near critical, demarcates the relay and prepares to replace；If Z>200m Ω, then it represents that the relay in the relay matrix array currently chosen
Device has damaged, and demarcates the relay damaged；MCU module feeds back display screen/host computer interface, shows that the relay is normal or accurate
It is standby to replace or damage；Note：ZQualifiedImpedance, Z are advised to closeInvalidFor invalid impedance, scope can be according to specific experimental circuit feelings
Condition is specifically set；
Step S4, replace in row relay array and/or relay and relay matrix array in row relay array
Relay, repeat step S2 and S3 until relay matrix array all relay tests it is complete.
A kind of self checking method of switch matrix, further includes the process of self-test of relay matrix bypass, the relay
The process of self-test of device matrix bypass comprises the steps of：
Current source module on-load voltage U=3V, I=1A, attracting electric relay matrix battle array are given with specific embodiment MCU module
Exemplified by relay 3.1.1 in row；
Step S1, MCU module is closed in all row relay arrays, relay matrix battle array columns and rows relay array and owned
Relay and current source module, host computer sends instruction, into Auto-Sensing Mode；
Step S2, a relay 3.1.1 in attracting electric relay matrix array, current source on-load voltage 3V and electric current
1A；
Step S3, the relay 4.1 being attracted in row relay array, while the relay being attracted in row relay array
5.1 adjacent relays 5.2, judge whether the output voltage of current source module is equal to 3V, if being equal to 3V, represent relay 3.1.1
Short circuit is not bypassed, relay is normal；Conversely, relay 3.1.1 bypass short circuits are then demarcated, MCU module feedback display screen/upper
Machine interface, the 3.1.1 bypass short circuits of display relay；
Step S4, relay 4.1 and relay 5.2 are disconnected, the relay 5.1 being attracted in row relay array, inhales at the same time
The adjacent relay 4.2 of relay 4.1 in row relay array is closed, judges whether the output voltage of current source module is equal to 3V,
If being equal to 3V, represent that the relay 3.1.1 in relay matrix array does not bypass short circuit, relay is normal；Conversely, then demarcate
Relay 3.1.1 bypass short circuits, MCU module feedback display screen/host computer interface, the 3.1.1 bypass short circuits of display relay；
Step S5, the relay in relay matrix array is replaced, repeat step S2 to S4 is until relay matrix array
The bypasses of all relays all detected.
Although the foregoing describing specific embodiment of the present utility model, those familiar with the art should
Working as understanding, we are merely exemplary described specific embodiment, rather than for the limit to the scope of the utility model
Equivalent modification and change fixed, that those skilled in the art are made in the spirit according to the utility model, all should
Cover in the scope of the claimed protection of the utility model.
Claims (2)
- A kind of 1. switch matrix, it is characterised in that：Including row input signal group, row input signal group, relay matrix array, row Relay array, row relay array, current source module, MCU module, communication module, ADC acquisition modules, display screen/upper seat in the plane Interface module；The display screen/upper seat in the plane interface module, ADC acquisition modules, communication module are connected with the MCU module respectively Connect；The ADC acquisition modules, communication module are connected with the current source module respectively；The row relay array, row relay Device array is connected with the current source module respectively；Each relay of the row relay array chooses relay square respectively A line relay of a burst of row is connected；Each relay of the row relay array chooses relay matrix array respectively One row relay is connected；Each input signal of the row input signal group chooses one in the row relay array respectively A relay is connected, and each input signal of the row input signal group chooses one in the row relay array respectively Relay is connected.
- A kind of 2. switch matrix according to claim 1, it is characterised in that：Further include I/O expansion module；The I/O expansion Module is connected with the MCU module.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201721172185.XU CN207248927U (en) | 2017-09-13 | 2017-09-13 | A kind of switch matrix |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201721172185.XU CN207248927U (en) | 2017-09-13 | 2017-09-13 | A kind of switch matrix |
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| Publication Number | Publication Date |
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| CN207248927U true CN207248927U (en) | 2018-04-17 |
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ID=61888481
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109946339A (en) * | 2019-03-25 | 2019-06-28 | 天津七所高科技有限公司 | A kind of matrix form far infrared electric current detecting method |
| CN117434439A (en) * | 2023-12-20 | 2024-01-23 | 天津航空机电有限公司 | Circuit and method for collecting state of large-scale device with auxiliary contact |
-
2017
- 2017-09-13 CN CN201721172185.XU patent/CN207248927U/en active Active
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109946339A (en) * | 2019-03-25 | 2019-06-28 | 天津七所高科技有限公司 | A kind of matrix form far infrared electric current detecting method |
| CN117434439A (en) * | 2023-12-20 | 2024-01-23 | 天津航空机电有限公司 | Circuit and method for collecting state of large-scale device with auxiliary contact |
| CN117434439B (en) * | 2023-12-20 | 2024-04-09 | 天津航空机电有限公司 | Circuit and method for collecting state of large-scale device with auxiliary contact |
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| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| PE01 | Entry into force of the registration of the contract for pledge of patent right |
Denomination of utility model: Switching matrix universalization control system and control method Effective date of registration: 20200703 Granted publication date: 20180417 Pledgee: China Exim Bank Fujian branch Pledgor: FUJIAN NEBULA ELECTRONICS Co.,Ltd. Registration number: Y2020980003784 |
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| PE01 | Entry into force of the registration of the contract for pledge of patent right |