CN103901289A - Test apparatus and test voltage generation method thereof - Google Patents
Test apparatus and test voltage generation method thereof Download PDFInfo
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- CN103901289A CN103901289A CN201210580148.8A CN201210580148A CN103901289A CN 103901289 A CN103901289 A CN 103901289A CN 201210580148 A CN201210580148 A CN 201210580148A CN 103901289 A CN103901289 A CN 103901289A
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Abstract
The invention discloses a test apparatus and a test voltage generation method thereof. According to pulse signals, starting signals and switching signals, multiple mutually independent sub control signals are generated so that the test cost is saved, and the product yield is improved.
Description
Technical field
The invention relates to a kind of proving installation and test voltage production method thereof, and relate to especially a kind of proving installation and test voltage production method thereof that increases control signal.
Background technology
Under flash memory is extensively used, how the element manufacturer of flash memory saves testing cost to increase profit as an important topic, increase parallel test number for the soonest and effective method, but cannot provide and be equal to the control signal of testing number and produce the required test voltage of each testing element with existing tester table.Tradition increases the mode of test voltage number can utilize power source diverter module (PowerSplit Module, PSM) have additional supply of power supply, for example will be divided into two groups of sub-control signals in order to two control signals of testing element under test, wherein sub-control signal on the same group has identical state, that is is subject to multiple element under tests that same group of sub-control signal controlled to be unlocked simultaneously or to close.Therefore, in the time only having minority element under test to break down in multiple element under tests, and cannot select the only element under test of closing fault, and then the element under test of fault is kept apart, likely have influence on other element under test if open the element under test of fault.Thereby how to increase state and independently supply separately power supply number, respectively multiple element under tests are tested, be a problem demanding prompt solution.
Summary of the invention
The invention provides a kind of proving installation and test voltage production method thereof, can make proving installation increase separate control signal, reach saving testing cost, improve the object of product yield.
The present invention proposes a kind of proving installation, is suitable for testing multiple element under tests.Proving installation comprises test control signal generation unit, switch control unit and power module.Test control signal generation unit is in order to produce pulse signal, start signal and switching signal, and wherein switching signal indication is to one or more element under test output test voltages.Switch control unit couples test control signal generation unit, and according to pulse signal and start signal sampling switching signal, to produce multiple sub-control signals, wherein start signal indicator cock control module starts according to pulse signal sampling switching signal.Power module, couples switch control unit, produces test voltage according to sub-control signal.
In one embodiment of this invention, wherein, in the time that start signal transfers high voltage logic current potential to, switch element starts to sample switching signal according to pulse signal, to produce sub-control signal.
In one embodiment of this invention, above-mentioned respectively this power module comprises multiple power-supply units and selects switch unit.Wherein select switch unit to couple switch control unit and power-supply unit, determine to make one or more power-supply units export test voltage to element under test according to sub-control signal.
In one embodiment of this invention, above-mentioned selection switch unit comprises multiple the first switches, and it is coupled between bias voltage and power-supply unit, and the conducting state of the first switch is controlled by respectively corresponding sub-control signal.
In one embodiment of this invention, above-mentioned respectively this power-supply unit comprises at least one second switch, it is coupled between testing power supply and the output terminal of power-supply unit, is controlled by the bias voltage that first switch corresponding with it provides, and testing power supply is exported as this test voltage.
In one embodiment of this invention, above-mentioned second switch is transistor, and transistorized source electrode and drain electrode couple respectively the output terminal of testing power supply and power-supply unit, and transistorized grid couples first switch corresponding with it.
The present invention also proposes a kind of test voltage production method of proving installation, is suitable for testing multiple element under tests, comprises the following steps.Produce a pulse signal, a start signal and a switching signal, wherein switching signal indication is to one or more element under test output test voltages.According to pulse signal and start signal sampling switching signal, to produce multiple sub-control signals, wherein when start signal indication starts to sample switching signal.Produce test voltage according to sub-control signal.
In one embodiment of this invention, wherein, in the time that start signal transfers high voltage logic current potential to, start to sample switching signal according to pulse signal, to produce sub-control signal.
In one embodiment of this invention, whether above-mentioned each element under test receives the test voltage sub-control signal corresponding with it of serving as reasons and determines.
Based on above-mentioned, the signal that the present invention has string type waveform according to pulse signal, start signal and switching signal etc. produces separate multiple sub-control signal, and then reaches saving testing cost, improves the object of product yield.
Accompanying drawing explanation
For above-mentioned feature and advantage of the present invention can be become apparent, special embodiment below, and coordinate accompanying drawing to be described in detail below, wherein:
Fig. 1 illustrates the schematic diagram into the proving installation of one embodiment of the invention.
Fig. 2 A illustrates the schematic diagram into the proving installation of another embodiment of the present invention.
Fig. 2 B illustrates the schematic diagram into the switch control unit of one embodiment of the invention.
Fig. 3 illustrates the schematic diagram into the pulse signal of one embodiment of the invention, start signal and switching signal.
Fig. 4 illustrates the test voltage production method into the proving installation of one embodiment of the invention.
Embodiment
Fig. 1 illustrates the schematic diagram into the proving installation of one embodiment of the invention.Please refer to Fig. 1.Proving installation 100 is in order to provide test voltage to carry out product test to multiple element under tests (not illustrating), proving installation 100 comprises test control signal generation unit 102, switch control unit 104 and power module 106, and wherein power module 106 couples test control signal generation unit 102 and switch control unit 104.Test control signal generation unit 102 is in order to produce the signal of the string type such as pulse signal SCLK, start signal SS and switching signal SDI, 104 of switch control units are in order to according to pulse signal SCLK and start signal SS sampling switching signal SDI, to produce multiple sub-control signal SC.Wherein switching signal SDI is in order to indication to one or more element under test output test voltages, and start signal SS indicator cock control module 104 starts according to pulse signal SCLK sampling switching signal SDI.
So produce multiple sub-control signal SC by the signal of the string types such as pulse signal SCLK, start signal SS and switching signal SDI, just can solve the problem of the control signal number deficiency of traditional test board (the V5400 tester table of the Versa tester series of for example Advantest), and then reduce testing cost.In addition, because whether each element under test receives the information that voltage to be measured can be carried under one's arms by switching signal SDI determine, therefore the state between each sub-control signal SC is separate, can must not there is just like sub-control signal on the same group as known technology the problem of identical state, and can freely stop providing test voltage for specific element under test, to avoid influencing each other between element under test and reduce the yield of product.
For instance, Fig. 2 A illustrates the schematic diagram into the proving installation of another embodiment of the present invention.Please refer to Fig. 2 A, proving installation 200 can for example be applied to the V5400 tester table of the Versa tester series of Advantest, and so not as limit, V5400 tester table originally can provide at most 16 control signals for element under test.In the present embodiment, switch control unit 104 produces 32 sub-control signal SC1-1, SC1-2, SC2-1 according to pulse signal SCLK, start signal SS and switching signal SDI ... SC16-2, power module 106 comprises selects switch unit 202 and multiple power-supply unit M1-M16, wherein select switch unit 202 to couple switch control unit 104 and power-supply unit M1-M16, select switch unit 202 to determine to make one or more power-supply unit output test voltages to element under test according to sub-control signal SC1-1-SC16-2.
Specifically, the switch control unit 104 of the present embodiment can be as shown in Figure 2 A, comprise 32 switch sw1-1, sw1-2, sw2-1 ... sw16-2, wherein one end of each switch is coupled to bias voltage Vbias, the other end couples the power-supply unit corresponding with it, and the conducting state of switch sw1-1-sw16-2 is controlled by respectively the sub-control signal SC1-1-SC16-2 corresponding with it.As shown in Figure 2 B, switch control unit 104 has 3 input ends and 32 output terminals, wherein 3 input end return pulse signal SCLK, start signal SS and switching signal SDI respectively, 32 output terminals are connected to respectively switch sw1-1-sw16-2, to export sub-control signal SC1-1-SC16-2 to switch sw1-1-sw16-2, control its conducting state.In addition, proving installation 200 comprises a capacitor C b, and it is coupled between bias voltage Vbias and ground connection.
Specifically, the schematic diagram of pulse signal SCLK, start signal SS and switching signal SDI can be as shown in Figure 3.In the time that start signal SS transfers high voltage logic current potential to, switch control unit 104 just starts according to pulse signal SCLK sampling switching signal SDI, sequentially to produce sub-control signal SC1-1-SC16-2.As shown in Figure 3, according to user's setting, switching signal SDI can sequentially convert the state of its voltage logic current potential, with the switch that indicates whether that conducting is corresponding.For example in the present embodiment, when the switching signal SDI that configuration switch control module 104 is sampled to according to pulse signal SCLK is low logic voltage current potential (L), its corresponding switch is closed condition.On the contrary, if when the switching signal SDI that switch control unit 104 is sampled to according to pulse signal SCLK is high voltage logic current potential (H), its corresponding switch is conducting state.As in the present embodiment, the 5th, 16,19,24,26,29,30 switching signal SDI that pulse is sampled to that switch control unit 104 only starts to count in the time transferring high voltage logic current potential to by start signal SS are high voltage logic current potential, and all the other are all low voltage potential.That is to say that only having the corresponding switch sw3-1 of sub-control signal SC3-1, SC8-2, SC10-1, SC12-2, SC13-2, SC15-1 and SC15-2, sw8-2, sw10-1, sw12-2, sw13-2, sw15-1 and sw15-2 is conducting state, all the other are all closed condition.
On the other hand, power-supply unit M1-M16, for forming in an identical manner, describes at this power-supply unit M1 that gives an example, and remaining power-supply unit M2-M16 describes no longer one by one.As shown in Figure 2 A, power-supply unit M1 comprises the switch being made up of transistor Q1, Q2, wherein transistor Q1 is coupled between the output terminal DPS1a of testing power supply PPS1 and power-supply unit M1, and transistor Q2 is coupled between the output terminal DPS1b of testing power supply PPS1 and power-supply unit M1.That is to say, the source electrode of transistor Q1 and drain electrode couple respectively the output terminal DPS1a of testing power supply PPS1 and power-supply unit M1, and the grid of transistor Q1, Q2 is coupled to respectively its corresponding switch sw1-1 and switch sw1-2.In addition, power-supply unit M1 more comprises resistance R 1, R2 and capacitor C 1a, C1b, wherein resistance R 1 is coupled between the grid and ground connection of transistor Q1, resistance R 2 is coupled between the grid and ground connection of transistor Q2, capacitor C 1a is coupled between output terminal DPS1a and ground connection, and capacitor C 1b is coupled between output terminal DPS1b and ground connection.
In the time that switch sw1-1-sw16-2 is controlled by sub-control signal SC1-1-SC16-2 and is switched on, bias voltage Vbias just can be sent to transistor Q1, the Q2 in power-supply unit M1-M16 by the sw1-1-sw16-2 of conducting, makes its conducting.Transistor Q1, the Q2 of conducting can export the test voltage as element under test using testing power supply PPS1-PPS16 from output terminal DPS1a-DPS16b further.As in the embodiments of figure 3, because switch sw3-1, sw8-2, sw10-1, sw12-2, sw13-2, sw15-1 and sw15-2 are conducting state, therefore its corresponding transistor will be switched on, and then make output terminal DPS3a, DPS8b, DPS10a, DPS12b, DPS13b, DPS15a and DPS16b export respectively the testing power supplies such as PPS3, PPS8, PPS10, PPS12, PPS13, PPS15, PPS15 as test voltage.
As mentioned above, sample switching signal SDI by switch control unit 104 according to pulse signal SCLK and start signal SS, can produce and reach 32 independently sub-control signal SC1-1-SC16-2, testing cost is reduced.And because sub-control signal SC1-1-SC16-2 is separate, therefore each power-supply unit all can select only to provide a voltage to be measured (as power-supply unit M3, M8, M10, M12, M13 only export voltage to be measured in its output terminal DPS3a, DPS8b, DPS10a, DPS12b, DPS13b respectively), or while two voltages to be measured are to element under test (as power-supply unit M15 exports voltage to be measured in its output terminal DPS15a and DSP15b), influence each other and do not have between element under test, or the problem of the yield of product reduction.
It should be noted that, though above-mentioned take produce 32 independently sub-control signal SC1-1-SC16-2 describe as example, so not as limit, in other embodiments, also can produce according to practical situation the sub-control signal of different numbers, accordingly, power-supply unit also can comprise the switch that the transistor of different numbers forms.
Fig. 4 illustrates the test voltage production method into the proving installation of one embodiment of the invention.The test voltage production method of concluding above-mentioned proving installation can comprise the following steps.First, produce a pulse signal, a start signal and a switching signal (step S402), wherein switching signal is exported test voltage in order to indication to which or which element under test.Then, according to pulse signal and start signal sampling switching signal, to produce multiple sub-control signals (step S404), wherein when start signal starts to sample switching signal in order to indication, for example can be in the time that start signal transfers high voltage logic current potential to, start to sample switching signal according to pulse signal, to produce sub-control signal.Finally, then according to sub-control signal produce test voltage (step S406).Wherein whether each element under test receives the test voltage sub-control signal corresponding with it of serving as reasons and determines.
In sum, the signal that the present invention has string type waveform according to pulse signal, start signal and switching signal etc. produces separate multiple sub-control signal, to solve the problem of traditional test board control signal number deficiency, and then reduces testing cost.And separate sub-control signal can freely stop providing test voltage for specific element under test, to avoid influencing each other between element under test and reduce the yield of product.
Although the present invention discloses as above with embodiment; so it is not in order to limit the present invention; under any, in technical field, have and conventionally know the knowledgeable; without departing from the spirit and scope of the present invention; when doing a little change and retouching, therefore protection scope of the present invention is when being as the criterion of defining depending on accompanying claim scope.
Claims (9)
1. a proving installation, is suitable for testing multiple element under tests, comprising:
One test control signal generation unit, produces a pulse signal, a start signal and a switching signal, and wherein this switching signal indication is to one or more element under test output test voltages;
One switch control unit, couple this test control signal generation unit, sample this switching signal according to this pulse signal and this start signal, to produce multiple sub-control signals, wherein this start signal indicates this switch control unit to start to sample this switching signal according to this pulse signal; And
One power module, couples this switch control unit, produces this test voltage according to described sub-control signal.
2. proving installation as claimed in claim 1, wherein, in the time that this start signal transfers high voltage logic current potential to, this switch element starts to sample this switching signal according to this pulse signal, to produce described sub-control signal.
3. proving installation as claimed in claim 1, wherein respectively this power module comprises:
Multiple power-supply units; And
One selects switch unit, couples this switch control unit and described power-supply unit, determines to make one or more power-supply units export this test voltage to described element under test according to described sub-control signal.
4. proving installation as claimed in claim 3, wherein this selection switch unit comprises:
Multiple the first switches, are coupled between a bias voltage and described power-supply unit, and the conducting state of described the first switch is controlled by respectively corresponding sub-control signal.
5. proving installation as claimed in claim 4, wherein respectively this power-supply unit comprises:
At least one second switch, is coupled between a testing power supply and the output terminal of this power-supply unit, is controlled by this bias voltage that first switch corresponding with it provides, and this testing power supply is exported as this test voltage.
6. proving installation as claimed in claim 5, wherein this second switch is a transistor, and this transistorized source electrode and drain electrode couple respectively the output terminal of this testing power supply and this power-supply unit, and this transistorized grid couples the first switch corresponding with it.
7. a test voltage production method for proving installation, is suitable for testing multiple element under tests, comprising:
Produce a pulse signal, a start signal and a switching signal, wherein this switching signal indication is to one or more element under test output test voltages;
Sample this switching signal according to this pulse signal and this start signal, to produce multiple sub-control signals, wherein when this start signal indication starts to sample this switching signal; And
Produce this test voltage according to described sub-control signal.
8. the test voltage production method of proving installation as claimed in claim 7, wherein, in the time that this start signal transfers high voltage logic current potential to, starts to sample this switching signal according to this pulse signal, to produce described sub-control signal.
9. the test voltage production method of proving installation as claimed in claim 7, wherein respectively whether this element under test receives this test voltage sub-control signal corresponding with it of serving as reasons and determines.
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| CN104407254A (en) * | 2014-12-04 | 2015-03-11 | 中国人民解放军海军工程大学 | Circuit board tester |
| CN110954842A (en) * | 2018-09-25 | 2020-04-03 | 财团法人工业技术研究院 | Test system, test method for test system and test carrier |
| CN112666452A (en) * | 2019-10-15 | 2021-04-16 | 成都欧珀移动通信有限公司 | Circuit board test structure and device |
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| CN103901289B (en) | 2016-12-28 |
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