CN104155887A - Multifunctional fault-signal simulating device - Google Patents
Multifunctional fault-signal simulating device Download PDFInfo
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- CN104155887A CN104155887A CN201410398152.1A CN201410398152A CN104155887A CN 104155887 A CN104155887 A CN 104155887A CN 201410398152 A CN201410398152 A CN 201410398152A CN 104155887 A CN104155887 A CN 104155887A
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Abstract
The present invention provides a multifunctional fault-signal simulating device. The multifunctional fault-signal simulating device comprises a fault simulation main circuit module, a control module used for controlling a fault simulation circuit and a power supply module. The power supply module supplies power to the main circuit module and a control circuit, and the main circuit module is divided into two parts of a general function module and a bad contact function module, according to the functions In a short circuit function module, the control module sends out a control instruction to control the open and closing of a relay, thereby selecting the different fault access signals. In the bad contact function module, a fault simulating device is accessed in a controlled system to control the closing of a MOS transistor by the PWM and generate a bad contact effect, thereby simulating a bad contact fault. The multifunctional fault-signal simulating device of the present invention enables the coverage rate that the fault simulating device simulates the faults to be increased, and can test a control system more comprehensively.
Description
Technical field
The present invention relates to signal simulation technical field, especially relate to a kind of device of multi-functional fault-signal simulation.
Background technology
Along with the development and improvement of modern control technology, fault detection capability has become the requisite part of control system, and the fault detection capability of function admirable and broad covered area becomes evaluates the important index of control system.Fault detection capability, when system breaks down, can detect in time fault and make corresponding measure to avoid causing great loss.In numerous system failures, electric fault be most important be also one of fault of the most easily causing heavy losses, for the measuring ability of test failure detection system for electric fault, need to simulate the electric fault of system, by in the fault injection control system of simulation, observe control system for the reaction of electric fault.
The method of now conventional simulated failure signal has a lot, wherein conventional method is access fault simulation equipment in the middle of controlled system, by the control module of control system or fault simulation equipment, control fault simulation equipment simulating and go out all kinds of fault-signals, analog machine can simulating signal over the ground, to faults such as power supplys, by observing the control signal of control system, detect the fault detection capability of control system.But along with everybody the more and more attention for security of system, the fault-signal of conventional fault simulation equipment simulating can not meet growing demand, for example publication number is that the patent documentation of CN 102508452 A discloses a kind of analog board that can simulate various faults, comprise: Gu high (to power supply short circuit), some conventional fault-signals such as low Gu (shorted to earths), but in this patent, do not comprise in electric fault short circuit and loose contact fault-signal between the normal signal occurring and signal, conventional fault type can not meet control of conditions system for the requirement of security performance, therefore need to develop a kind of fault simulation equipment that comprises short circuit between signal and signal and loose contact on the basis of conventional fault analog machine.
Summary of the invention
For above-mentioned technological deficiency, the present invention proposes a kind of device of multi-functional fault-signal simulation.
In order to solve the problems of the technologies described above, technical scheme of the present invention is as follows:
The present invention includes the main circuit module of fault simulation, for controlling control module and the power module of fault simulation circuit, described power module provides power supply for main circuit module and control circuit, described main circuit module is divided into two parts according to function, is respectively conventional func module and loose contact functional module.
In conventional func module, control module is sent steering order, the folding of pilot relay, thereby select different fault access signals, the fault-signal that can select by relay has: shorted to earth signal, and to power supply short circuit signal, to outside signal shorts signal and chopping signal.Wherein to outside signal shorts signal, can select to allow two different signals to same external signal short circuit by relay, and produce the function of short trouble between signal and signal.
In loose contact functional module, need simulating contact bad error signal, in the middle of fault simulation equipment access controlled system, by PWM, control mos pipe closed, produce the effect of loose contact, thereby reach loose contact fault simulation.
Beneficial effect of the present invention is: on the basis of original fault simulation equipment, added short circuit between signal and signal, and two fault-signals of loose contact signal, increased the coverage rate of fault simulation equipment simulating fault, more comprehensively test control system.
Accompanying drawing explanation
Fig. 1 fault simulation equipment overall structure figure;
Fig. 2 conventional func modular circuit schematic diagram;
Fig. 3 loose contact function module circuit schematic diagram.
Embodiment
Below in conjunction with accompanying drawing, the invention will be further described.
As shown in Figure 1, the present invention includes fault simulation circuit, for controlling control module and the power circuit of fault simulation circuit.Described power circuit provides power supply for fault simulation circuit and control circuit, and described fault simulation circuit is divided into two parts according to function, is respectively conventional func module and loose contact functional module.
In conventional func module as shown in Figure 2, the pin 6 of relay K 1 is connected with one end of pin 3 and the input pin of system under test (SUT), the other end is connected with output pin with 7 by pin 2, after K1 opens, pin 6 can be connected with 5 with pin 4 with 3, and pin 4 and 5 signals are unsettled, the pin 1 of relay K 1 connects power supply signal, pin 8 is connected to the ground by capacitor C 1 and mos pipe T1 respectively, the pin 3(source electrode of mos pipe T1) be connected to the ground, the pin 1(grid of mos pipe T1) be connected with resistance R 1, the other end of resistance R 1 is connected with control signal CH1_CTRL1, resistance R 2 is connected respectively with capacitor C 2 two ends pin 1 and the earth signal that mos manages T1, the pin 6 of relay K 2 is connected with one end of pin 3 and the input pin of system under test (SUT), the other end is connected with 3 with the pin 6 of relay K 3 with 7 by pin 2, after mos pipe T2 opens, pin 6 can be connected with 5 with pin 4 with 3, and pin 4 is connected with external signal EXT with 5 signals, relay K 2 pins 1 connect power supply signal, pin 8 is connected to the ground by C3 and mos pipe T2 respectively, the pin 3 of mos pipe T2 is connected to the ground, the pin 1 of mos pipe T2 is connected with resistance R 3, the other end of resistance R 3 is connected with control signal CH1_CTRL4, resistance R 4 is connected respectively with capacitor C 4 two ends pin 1 and the earth signal that mos manages T2, the pin 6 of relay K 3 is connected with 7 with the pin 2 of relay K 2 with one end of pin 3, the other end is by pin 2, 7 are connected with 3 with the pin 6 of relay K 4, after T3 opens, pin 6 can be connected with 5 with pin 4 with 3, and pin 4 is connected with power supply signal VBATT with 5 signals, relay K 3 pins 1 connect power supply signal, pin 8 is connected to the ground by capacitor C 5 and mos pipe T3 respectively, the pin 3 of mos pipe T3 is connected to the ground, the pin 1 of T3 is connected with resistance R 5 one end, the other end of resistance R 5 is connected with control signal CH1_CTRL2, resistance R 6 is connected respectively with capacitor C 6 two ends pin 1 and the earth signal that mos manages T3, the pin 6 of relay K 4 is connected with 7 with the pin 2 of relay K 3 with one end of pin 3, the other end is unsettled by pin 2 and 7, after T4 opens, pin 6 can be connected with 5 with pin 4 with 3, and pin 4 is connected with earth signal PGND with 5 signals, relay K 4 pins 1 connect power supply signal, pin 8 is connected to the ground by capacitor C 7 and mos pipe T4 respectively, the pin 3 of mos pipe T4 is connected to the ground, the pin 1 of mos pipe T4 is connected with one end of resistance R 7, the other end of resistance R 7 is connected with control signal CH1_CTRL3, resistance R 8 is connected respectively with capacitor C 8 two ends pin 1 and the earth signal that mos manages T4, in the circuit of control module by CH1_IN and CH1_OUT access system under test (SUT), wherein CH1_CTRL1 is open circuit fault control signal, CH1_CTRL2 is to power supply short circuit fault control system, CH1_CTRL3 is shorted to earth failure control signal, and CH1_CTRL4 is to outside signal shorts control signal.When CH1_CTRL1 output low level, relay K 1 is failure to actuate, and relay K 1 pin 3 is connected with pin 2, pin 6 is connected with pin 7, and system under test (SUT) is in normal mode of operation, when CH1_CTRL1 output high level, relay K 1 is opened, relay K 1 pin 3 and pin 4, and pin 6 is connected with pin 5, system under test (SUT), in off state, causes open circuit fault; When CH1_CTRL1 output low level, during CH1_CTRL4 output high level, relay T2 is opened, external signal EXT is access in system under test (SUT), when another signal of system under test (SUT) is also access in external signal EXT simultaneously, the signal of these two systems under test (SUT), by short circuit, causes the short trouble between system under test (SUT) signal and signal; When CH1_CTRL1 output low level, CH1_CTRL4 output low level, during CH1_CTRL2 output high level, relay K 3 is opened, and system under test (SUT) signal is connected with power supply signal VBATT signal, causes and power supply short circuit fault; When CH1_CTRL1 output low level, CH1_CTRL4 output low level, CH1_CTRL2 output low level, CH1_CTRL3 exports high level, and relay K 4 is opened, and system under test (SUT) signal is connected with earth signal, causes shorted to earth fault.
In as Fig. 3 loose contact functional module, need simulating contact bad error signal, in loose contact fault simulation, in the middle of loose contact fault simulation equipment access controlled system, the pin 1 of mos pipe T5 respectively with one end of resistance R 10, one end of resistance R 9 is connected with one end of capacitor C 9, another termination CH2_CTR1 control signal of resistance R 10, the other end ground connection of the other end of resistance R 9 and capacitor C 9, the pin 2 of mos pipe T5 meets the output CH2_OUT of system under test (SUT), the pin 3 of mos pipe T5 meets the output CH2_IN of system under test (SUT), by controlling CH2_CTR1 control signal, control the closure of mos pipe T5, control signal is PWM ripple, therefore can simulate the effect that produces loose contact, thereby reach loose contact fault simulation.
A loose contact failure simulation method, should be noted following some:
1) frequency of operation of common relay is lower, and is not suitable for the simulation as loose contact fault, need to use mos pipe as control element;
2), because the withstand voltage of N-type mos pipe is high, bear that current capacity is strong and price comparison is cheap, so select N-type mos as control element;
3) in the leakage level of mos pipe, connect the input end of controlled system, source class connects the output terminal of controlled system, gate leve connects the control signal of mos pipe, because the state of source class is unknown (may be that high level may be also low level), therefore by charge pump booster circuit, produce control signal, can under high level and low level two states, all realize the effect of controlling.
The above is only the preferred embodiment of the present invention; it should be pointed out that for those skilled in the art, without departing from the inventive concept of the premise; can also make some improvements and modifications, these improvements and modifications also should be considered as in protection domain of the present invention.
Claims (3)
1. multi-functional fault-signal analogue means, comprise the main circuit module of fault simulation, for controlling control module and the power module of fault simulation circuit, it is characterized in that: described power module provides power supply for main circuit module and control circuit, described main circuit module is divided into two parts according to function, is respectively conventional func module and loose contact functional module;
In conventional func module, control module is sent steering order, the folding of pilot relay, thereby select different fault access signals, the fault-signal that can select by relay has: shorted to earth signal, to power supply short circuit signal, to outside signal shorts signal and chopping signal; Wherein to outside signal shorts signal, can select to allow two different signals to same external signal short circuit by relay, and produce the function of short trouble between signal and signal;
In loose contact functional module, need simulating contact bad error signal, in the middle of fault simulation equipment access controlled system, by PWM, control mos pipe closed, produce the effect of loose contact, thereby reach loose contact fault simulation.
2. multi-functional fault-signal analogue means according to claim 1, it is characterized in that: in described conventional func module, the pin 6 of relay K 1 is connected with one end of pin 3 and the input pin of system under test (SUT), the other end is connected with output pin with 7 by pin 2, after K1 opens, pin 6 can be connected with 5 with pin 4 with 3, and pin 4 and 5 signals are unsettled, the pin 1 of relay K 1 connects power supply signal, pin 8 is connected to the ground by capacitor C 1 and mos pipe T1 respectively, the pin 3 of mos pipe T1 is connected to the ground, the pin 1 of mos pipe T1 is connected with resistance R 1, the other end of resistance R 1 is connected with control signal CH1_CTRL1, resistance R 2 is connected respectively with capacitor C 2 two ends pin 1 and the earth signal that mos manages T1, the pin 6 of relay K 2 is connected with one end of pin 3 and the input pin of system under test (SUT), the other end is connected with 3 with the pin 6 of relay K 3 with 7 by pin 2, after mos pipe T2 opens, pin 6 can be connected with 5 with pin 4 with 3, and pin 4 is connected with external signal EXT with 5 signals, relay K 2 pins 1 connect power supply signal, pin 8 is connected to the ground by C3 and mos pipe T2 respectively, the pin 3 of mos pipe T2 is connected to the ground, the pin 1 of mos pipe T2 is connected with resistance R 3, the other end of resistance R 3 is connected with control signal CH1_CTRL4, resistance R 4 is connected respectively with capacitor C 4 two ends pin 1 and the earth signal that mos manages T2, the pin 6 of relay K 3 is connected with 7 with the pin 2 of relay K 2 with one end of pin 3, the other end is by pin 2, 7 are connected with 3 with the pin 6 of relay K 4, after T3 opens, pin 6 can be connected with 5 with pin 4 with 3, and pin 4 is connected with power supply signal VBATT with 5 signals, relay K 3 pins 1 connect power supply signal, pin 8 is connected to the ground by capacitor C 5 and mos pipe T3 respectively, the pin 3 of mos pipe T3 is connected to the ground, the pin 1 of T3 is connected with resistance R 5 one end, the other end of resistance R 5 is connected with control signal CH1_CTRL2, resistance R 6 is connected respectively with capacitor C 6 two ends pin 1 and the earth signal that mos manages T3, the pin 6 of relay K 4 is connected with 7 with the pin 2 of relay K 3 with one end of pin 3, the other end is unsettled by pin 2 and 7, after T4 opens, pin 6 can be connected with 5 with pin 4 with 3, and pin 4 is connected with earth signal PGND with 5 signals, relay K 4 pins 1 connect power supply signal, pin 8 is connected to the ground by capacitor C 7 and mos pipe T4 respectively, the pin 3 of mos pipe T4 is connected to the ground, the pin 1 of mos pipe T4 is connected with one end of resistance R 7, the other end of resistance R 7 is connected with control signal CH1_CTRL3, resistance R 8 is connected respectively with capacitor C 8 two ends pin 1 and the earth signal that mos manages T4,
In the circuit of control module by CH1_IN and CH1_OUT access system under test (SUT), wherein CH1_CTRL1 is open circuit fault control signal, CH1_CTRL2 is to power supply short circuit fault control system, CH1_CTRL3 is shorted to earth failure control signal, and CH1_CTRL4 is to outside signal shorts control signal; When CH1_CTRL1 output low level, relay K 1 is failure to actuate, and relay K 1 pin 3 is connected with pin 2, pin 6 is connected with pin 7, and system under test (SUT) is in normal mode of operation, when CH1_CTRL1 output high level, relay K 1 is opened, relay K 1 pin 3 and pin 4, and pin 6 is connected with pin 5, system under test (SUT), in off state, causes open circuit fault; When CH1_CTRL1 output low level, during CH1_CTRL4 output high level, relay T2 is opened, external signal EXT is access in system under test (SUT), when another signal of system under test (SUT) is also access in external signal EXT simultaneously, the signal of these two systems under test (SUT), by short circuit, causes the short trouble between system under test (SUT) signal and signal; When CH1_CTRL1 output low level, CH1_CTRL4 output low level, during CH1_CTRL2 output high level, relay K 3 is opened, and system under test (SUT) signal is connected with power supply signal VBATT signal, causes and power supply short circuit fault; When CH1_CTRL1 output low level, CH1_CTRL4 output low level, CH1_CTRL2 output low level, CH1_CTRL3 exports high level, and relay K 4 is opened, and system under test (SUT) signal is connected with earth signal, causes shorted to earth fault.
3. multi-functional fault-signal analogue means according to claim 1, it is characterized in that: in described loose contact functional module, the pin 1 of mos pipe T5 respectively with one end of resistance R 10, one end of resistance R 9 is connected with one end of capacitor C 9, another termination CH2_CTR1 control signal of resistance R 10, the other end ground connection of the other end of resistance R 9 and capacitor C 9, the pin 2 of mos pipe T5 meets the output CH2_OUT of system under test (SUT), the pin 3 of mos pipe T5 meets the output CH2_IN of system under test (SUT), by CH2_CTR1 control signal, control the closure of mos pipe T5, control signal is PWM ripple, can simulate the effect that produces loose contact, thereby reach loose contact fault simulation.
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106839903A (en) * | 2017-02-17 | 2017-06-13 | 中国人民解放军军械工程学院 | Terminal-guided shell target seeker fault simulation circuit |
| CN107861005A (en) * | 2017-11-10 | 2018-03-30 | 北京润科通用技术有限公司 | A kind of power supply trouble analogue means and power supply trouble analogy method |
| CN109188295A (en) * | 2018-09-06 | 2019-01-11 | 广州锦红源电子科技有限公司 | Battery cell failure simulator |
| CN110764028A (en) * | 2019-10-10 | 2020-02-07 | 华东光电集成器件研究所 | Integrated circuit pin clamping abnormity detection and protection device |
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Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106839903A (en) * | 2017-02-17 | 2017-06-13 | 中国人民解放军军械工程学院 | Terminal-guided shell target seeker fault simulation circuit |
| CN107861005A (en) * | 2017-11-10 | 2018-03-30 | 北京润科通用技术有限公司 | A kind of power supply trouble analogue means and power supply trouble analogy method |
| CN109188295A (en) * | 2018-09-06 | 2019-01-11 | 广州锦红源电子科技有限公司 | Battery cell failure simulator |
| CN110764028A (en) * | 2019-10-10 | 2020-02-07 | 华东光电集成器件研究所 | Integrated circuit pin clamping abnormity detection and protection device |
| CN110764028B (en) * | 2019-10-10 | 2021-11-30 | 华东光电集成器件研究所 | Integrated circuit pin clamping abnormity detection and protection device |
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