CN105571612A - Automatic testing method for key parameters of MEMS gyroscope structure - Google Patents

Automatic testing method for key parameters of MEMS gyroscope structure Download PDF

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CN105571612A
CN105571612A CN201410554776.8A CN201410554776A CN105571612A CN 105571612 A CN105571612 A CN 105571612A CN 201410554776 A CN201410554776 A CN 201410554776A CN 105571612 A CN105571612 A CN 105571612A
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gyro
quality factor
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CN105571612B (en
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崔健
林梦娜
王晓磊
郭中洋
杨军
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Beijing Automation Control Equipment Institute BACEI
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Abstract

本发明是一种用于MEMS陀螺结构关键参数自动测试方法。所述方法包括如下步骤:步骤1)在MEMS陀螺驱动模态的驱动结构电极上施加白噪声电压激励产生驱动力;步骤2)将MEMS陀螺驱动模态的振动拾取结构电极连接前置读出电路;所述响应曲线采集到数字信号处理器中进行FFT处理,获得驱动模态的谐振频率fd;步骤3)以步骤2)得到的谐振频率fd构造正弦波,施加在驱动模态的驱动结构电极上,在确定陀螺起振后,采集驱动模态和检测模态前置读出电路的输出电压,获得耦合比;步骤4)撤除正弦波激励,由衰减曲线计算出驱动模态的品质因数Qd。可以自动测试谐振频率、品质因数和耦合电压比、位移比等结构关键参数。

The invention is an automatic testing method for the key parameters of the MEMS gyro structure. The method comprises the following steps: step 1) applying white noise voltage excitation on the drive structure electrode of the MEMS gyro drive mode to generate driving force; step 2) connecting the vibration pickup structure electrode of the MEMS gyro drive mode to the pre-readout circuit ; The response curve is collected in the digital signal processor and processed by FFT to obtain the resonant frequency f of the driving mode; step 3 ) constructs a sine wave with the resonant frequency f d obtained in step 2), and is applied to the driving mode of the driving mode On the structural electrodes, after the gyro is confirmed to vibrate, collect the output voltage of the drive mode and detection mode pre-readout circuit to obtain the coupling ratio; step 4) remove the sine wave excitation, and calculate the quality of the drive mode from the decay curve Factor Qd . Key structural parameters such as resonance frequency, quality factor, coupling voltage ratio, and displacement ratio can be automatically tested.

Description

A kind of MEMS gyro structural key automatically testing parameters method
Technical field
The present invention relates to a kind of automatic test approach, particularly about a kind of automatic test approach of MEMS gyro structural key parameter.
Technical background
MEMS gyro be by the characteristic dimension of microelectronic technique processing at the device of micron dimension, have that volume is little, cost is low, be suitable for batch machining and be easy to the advantage integrated with ASIC.MEMS gyro contains vibrational structure, and the structural key parameters such as its resonance frequency, quality factor q and coupling amount all can affect the overall performance of device.Before instrument assembly, need to screen MEMS gyro gauge outfit, key parameter test is carried out to structure, determines the key property of gyro gauge outfit.Except normal temperature is tested, also need under alternating temperature and change encapsulate the condition of air pressure, test to investigate gauge outfit to these structural key parameters temperature change and pressure change characteristic.MEMS gyro comprises two operation modes, i.e. driven-mode and sensed-mode, and each mode all needs test resonance frequency and quality factor q.
Common method of testing manually adopts each mode of dynamic signal analyzer to gyro gauge outfit to carry out frequency sweep respectively, obtains its amplitude-frequency and phase-frequency response curve, calculated resonance frequency and the quality factor q of each mode of gyro gauge outfit by response curve.The method is applicable to the lower gyro of quality factor, if gyro quality factor are higher, for reaching measuring accuracy, needing to increase frequency sweep and counting to guarantee that frequency resolution is enough high, and increase frequency sweep and count and greatly can extend the sweep check time, and requirements at the higher level are proposed to system hardware.Simultaneously the method also need to carry out in test process to debug, the operation such as thread-changing, the test duration is long and need manpower intervention.
Under temperature match curing conditions, as from-40 DEG C to+85 DEG C, Cooling rate is 1 DEG C/min, each temperature spot all needs to test structural key parameter, need to carry out debug data frequently, change test connection line, will huge workload be expended, need tester midway to monitor, otherwise can omit the test of a certain temperature spot, testing efficiency is not high.Automatical and efficient measurement can not be realized.
Summary of the invention
Goal of the invention
For the problems referred to above, the invention provides a kind of automatic test approach for MEMS gyro structural key parameter, on the basis ensureing measuring accuracy, artificial monitoring in real time can be broken away from, improve testing efficiency.
Technical scheme
The present invention is a kind of MEMS gyro structural key automatically testing parameters method, is applicable to the test of the structural key parameter comprising two operation mode structure MEMS gyro, and described two operation mode structures are driven-mode structure and sensed-mode structure; Described driven-mode structure comprises driven-mode drives structure, driven-mode vibrational structure and driven-mode vibration pickup structure; Described sensed-mode structure comprises sensed-mode drives structure, sensed-mode vibrational structure and sensed-mode vibration pickup structure; Described structural key parameter comprises: the resonance frequency f of driven-mode d, driven-mode quality factor q d, driven-mode and sensed-mode coupled voltages ratio;
Wherein, described method comprises the steps:
Step 1) on the drives structure electrode of MEMS gyro driven-mode, apply white noise voltage drive generation driving force;
Step 2) the vibration pickup structure electrode of MEMS gyro driven-mode is connected preposition sensing circuit; Sensing circuit reads the voltage variety that gyro exports, and obtains the response curve of gyro driven-mode; Carry out FFT process in described Response Waveform Acquisition to digital signal processor, obtain the resonance frequency f of driven-mode d;
Step 3) with step 2) the resonance frequency f that obtains dstructure is sinusoidal wave, is applied on the drives structure electrode of driven-mode, after determining gyro starting of oscillation, gathers the output voltage of driven-mode and the preposition sensing circuit of sensed-mode, obtains coupling ratio;
Step 4) remove sine-wave excitation, the quality factor q of driven-mode is calculated by die-away curve d;
At completing steps 3) after, remove sine-wave excitation, the preposition sensing circuit of driven-mode exports gyroscopic vibration die-away curve, is calculated the quality factor q of driven-mode by die-away curve d.
A kind of MEMS gyro structural key automatically testing parameters method as above, wherein: described structural key parameter also comprises: the resonance frequency f of sensed-mode s, sensed-mode quality factor q s; Described method also comprises the steps:
Step 5) on the drives structure electrode of MEMS gyro sensed-mode, apply white noise voltage drive generation driving force;
Step 6) the vibration pickup structure electrode of MEMS gyro sensed-mode is connected preposition sensing circuit; Sensing circuit reads the voltage variety that gyro exports, and obtains the response curve of gyroscope; Carry out FFT process in described Response Waveform Acquisition to digital signal processor, obtain the resonance frequency f of sensed-mode s;
Step 7) with step 6) the resonance frequency f that obtains sstructure is sinusoidal wave, is applied on the drives structure electrode of gyroscope, after determining gyro starting of oscillation, removes sine-wave excitation, and the preposition sensing circuit of sensed-mode exports gyroscopic vibration die-away curve, is calculated the quality factor q of sensed-mode by die-away curve s.
As above for an automatic test approach for MEMS gyro structural key parameter, wherein:
At the quality factor q of Test driver mode dand the quality factor q of sensed-mode stime, make with the following method:
If y1 be gyro starting of oscillation, then remove sine-wave excitation after, the gyro oscillatory extinction curve that preposition sensing circuit exports, then have:
y 1 = e - πf Q t sin ( 2 πft )
In formula, f is resonance frequency, carries out exponential fitting, obtains the quality factor q of gyro.
Beneficial effect
The present invention is owing to taking above technical scheme, it has the following advantages: owing to adopting automatic test approach, automatically the structural key parameters such as resonance frequency, quality factor and coupled voltages ratio, Displacement Ratio can be tested, and collecting test environment temperature or air pressure, be automatically stored in digital signal processor, test process is without the need to the frequently operation such as debugging, thread-changing, especially artificial monitoring has in real time been broken away from when temperature variation testing, significantly shorten original manual testing's method testing time, raise the efficiency, convenient and easy.The present invention is applicable to the micromachine resonant device architecture crucial parameter measurements such as resonant-type tiny cantilever beam, micro-resonator, micromechanical gyro and resonance type micro accelerometer.
Accompanying drawing explanation
Fig. 1 is the device block diagram for MEMS gyro structural key automatically testing parameters method;
Fig. 2 be the present invention the MEMS gyro gauge head structure schematic diagram that is suitable for;
Fig. 3 is Q value test curve of the present invention;
Fig. 4 is the process flow diagram for MEMS gyro driven-mode structural key automatically testing parameters method.
Embodiment
Below, by reference to the accompanying drawings and embodiment, the present invention is described further.
Fig. 1 is the device block diagram for realizing MEMS gyro structural key automatically testing parameters method of the present invention:
Mainly comprise gyro gauge outfit 1, test circuit 2, high-speed data acquisition card 3 and digital signal processor 4.Gyro gauge outfit 1 is connected to high-speed data acquisition card 3 by test circuit 2, the vibration detection signal of gyro driven-mode and sensed-mode enters digital signal processor 4 by high-speed data acquisition card 3 and carries out process acquisition desired parameters, and digital signal processor 4 can produce pumping signal by capture card 3 and drive gyro gauge outfit 1 simultaneously.
The MEMS gyro that the present invention is directed to is the MEMS gyro comprising two operation mode structures, i.e. driven-mode structure and sensed-mode structure; Described driven-mode structure comprises driven-mode drives structure, driven-mode vibrational structure and driven-mode vibration pickup structure; Described sensed-mode structure comprises sensed-mode drives structure, sensed-mode vibrational structure and sensed-mode vibration pickup structure;
Be illustrated in figure 2 the present invention the MEMS gyro gauge head structure 1 that is suitable for, comprise driven-mode structure 5 and sensed-mode structure 6.Driven-mode structure 5 comprises driven-mode drives structure 7, driven-mode vibrational structure 8 and a driven-mode vibration pickup structure 9, and sensed-mode structure 6 comprises sensed-mode drives structure 13, sensed-mode vibrational structure 14 and a sensed-mode vibration pickup structure 15.
Wherein, drives structure 7,13 can adopt condenser type electrostatic to drive or Piezoelectric Driving.Vibrational structure 8,14 is connected to fixed pivot place by elastic beam, thus formation can vibrational structure.Vibration pickup structure 9,15 can adopt capacitance type structure or piezoelectric type structure.Drives structure 7,13 has drive electrode 11,17, and vibration pickup structure 9,15 has detecting electrode 10,16.Drive electrode 11,17 applies driving voltage, and because drives structure 7,13 adopts electrostatic to drive or Piezoelectric Driving, drives structure 7,13 just produces a driving force 12,18 to movable vibrational structure 8,14.Under driving force 12,18 drives, vibrational structure 8,14 produces vibration, and its displacement variable is obtained by vibration pickup structure 9,15.Vibration pickup structure 9,15 changes the displacement variable got into charge variation amount, and is exported by vibration pickup structure electrode 10,16, and vibration pickup structure electrode 10,16 is connected the test circuit 2 in a Fig. 1.Charge variation amount is converted to voltage variety by test circuit 2, to obtain the vibration information of vibrational structure 8,14.
When gyro reaches resonant condition, its mechanical gain is maximum, so after applying white-noise excitation, the vibration curve of output of gyro is in resonance frequency place amplitude maximum, by gathering the vibration curve of output after white-noise excitation, carrying out FFT process, by detecting peak point, the resonance frequency f of gyro can be obtained.
Fig. 3 is Q value test curve of the present invention, and y1 is after gyro starting of oscillation, removes sine-wave excitation, the gyro oscillatory extinction curve that preposition sensing circuit exports, and y2 is vibration amplitude die-away curve, and curve is relevant with quality factor q with the resonance frequency f of gyro, namely
y 1 = e - πf Q t sin ( 2 πft )
By above-mentioned curve and the resonance frequency f that calculates, carry out exponential fitting, the quality factor q of gyro can be obtained.
Fig. 4 is the program flow diagram of the present invention for the automatic test approach embodiment of MEMS gyro driven-mode structural key parameter, and the auto test flow of sensed-mode structural key parameter is similar with it:
After program starts, first initialization is carried out to parameters in algorithm.White-noise excitation signal is produced in digital signal processor 4, gyro gauge outfit driven-mode structure is encouraged by high-speed data acquisition card 3, high-speed data acquisition card 3 gathers the output signal of gyro driven-mode test circuit 2, and in digital signal processor 4, process obtains the resonance frequency f of driven-mode d; Then construct with f in digital signal processor 4 dfor the sine wave signal of frequency, gyro gauge outfit driven-mode structure is encouraged by high-speed data acquisition card 3, high-speed data acquisition card 3 gathers the output signal of gyro driven-mode test circuit 2, the whether starting of oscillation of gyro driven-mode is judged in digital signal processor 4, after driven-mode starting of oscillation, gather the output signal of gyroscope test circuit 2, in digital signal processor 4, process obtains coupled voltages ratio, Displacement Ratio simultaneously; Remove sine-wave excitation by digital signal processor 3, collect the die-away curve of driven-mode, in digital signal processor 3, the Fitting Calculation obtains the quality factor q of driven-mode d; End program after reaching testing time requirement.
The method of the invention is a kind of automatic test approach for MEMS gyro structural key parameter, comprises the steps:
1) on the drives structure electrode of MEMS gyro driven-mode, white-noise excitation is applied;
The drives structure electrode of MEMS gyro driven-mode applies white noise voltage drive and produces driving force, by described drives structure, driving force is applied on described driven-mode vibrational structure, obtain displacement variable; Described driving force is the product of drive voltage signal and conversion coefficient; Described conversion coefficient for this drive voltage signal be applied to described drives structure time, by the scale-up factor of voltage transitions corresponding to power; Described white noise voltage is produced by digital signal processor, amplitude and noise power adjustable.
2) the vibration pickup structure electrode of MEMS gyro driven-mode is connected preposition sensing circuit, obtain the resonance frequency f of driven-mode d;
The vibration pickup structure electrode of MEMS gyro driven-mode is connected preposition sensing circuit; Be charge variation amount by described displacement variable by described vibration pickup Structure Transformation; Then, by preposition sensing circuit, this charge variation amount is converted to voltage variety, obtains the response curve of gyro driven-mode; Carry out FFT process in described Response Waveform Acquisition to digital signal processor, obtain frequency-amplitude curve, find out the frequency that maximum amplitude is corresponding, the resonance frequency f of driven-mode can be obtained d.
3) with step 2) the resonance frequency f that obtains dstructure is sinusoidal wave, is applied on the drives structure electrode of driven-mode, after determining gyro starting of oscillation, gathers the output voltage of driven-mode and the preposition sensing circuit of sensed-mode, obtains coupling ratio;
While sine-wave excitation gyro driven-mode resonant operational, gather the output voltage of driven-mode and the preposition sensing circuit of sensed-mode, obtain coupled voltages ratio, and then coupling Displacement Ratio can be calculated by conversion coefficient;
Described coupled voltages is than being gyroscope and the output voltage ratio of driven-mode front end circuit;
Described conversion coefficient is constant, relevant to the conversion coefficient of voltage variety to charge variation amount, charge variation amount with the displacement variable of driven-mode and sensed-mode, is constant value for appointment gyro.
4) remove sine-wave excitation, calculated the quality factor q of driven-mode by die-away curve d;
With step 2) the resonance frequency f that obtains dstructure is sinusoidal wave, is applied on the drives structure electrode of gyro driven-mode, after determining gyro starting of oscillation, removes sine-wave excitation, and the preposition sensing circuit of driven-mode exports gyroscopic vibration die-away curve, is calculated the quality factor q of driven-mode by die-away curve d; Described sine wave is produced by digital signal processor; The method of described judgement gyro starting of oscillation is the response curve gathering the output of preposition sensing circuit, detects its amplitude and whether reaches requirement; Described die-away curve collects in digital signal processor and processes.
After the test having carried out driven-mode, carry out as step 1 at MEMS gyro sensed-mode), 2), 3) shown in operation, obtain the resonance frequency f of sensed-mode sand quality factor q s, concrete steps are as follows:
5) on the drives structure electrode of MEMS gyro sensed-mode, apply white noise voltage drive produce driving force, by described drives structure, driving force is applied on described sensed-mode vibrational structure, obtain displacement variable; Described driving force is the product of drive voltage signal and conversion coefficient; Described conversion coefficient for this drive voltage signal be applied to described drives structure time, by the scale-up factor of voltage transitions corresponding to power; Described white noise is produced by digital signal processor, amplitude and noise power adjustable.
6) the vibration pickup structure electrode of MEMS gyro sensed-mode is connected preposition sensing circuit; Be charge variation amount by described displacement variable by described vibration pickup Structure Transformation; Then, by preposition sensing circuit, this charge variation amount is converted to voltage variety, obtains the response curve of gyroscope; Carry out FFT process in described Response Waveform Acquisition to digital signal processor, obtain frequency-amplitude curve, find out the frequency that maximum amplitude is corresponding, the resonance frequency f of sensed-mode can be obtained s.
7) with step 6) the resonance frequency f that obtains sstructure is sinusoidal wave, is applied on the drives structure electrode of gyroscope, after determining gyro starting of oscillation, removes sine-wave excitation, and the preposition sensing circuit of sensed-mode exports gyroscopic vibration die-away curve, is calculated the quality factor q of sensed-mode by die-away curve s; Described sine wave is produced by digital signal processor;
The method of described judgement gyro starting of oscillation is the response curve gathering the output of preposition sensing circuit, detects its amplitude and whether reaches designated value;
Described die-away curve collects in digital signal processor and processes.
8) temperature and the air pressure of temperature sensor and vacuum meter collecting test environment can as required, be used.
9) information such as the resonance frequency of MEMS gyro two mode recorded, quality factor and coupled voltages ratio/Displacement Ratio, temperature, air pressure are automatically stored in digital signal processor.
In above-mentioned method of testing, the die-away curve in described step 3,7 is relevant with quality factor with the resonance frequency of gyro, and is exponential damping, through exponential fitting, can obtain the quality factor of driven-mode and sensed-mode.
In above-mentioned method of testing, can the time interval between testing time and each test be set.
In addition, as required, can the temperature of collecting test environment and air pressure, and the information such as the resonance frequency of MEMS gyro two mode recorded, quality factor and coupling ratio, temperature, air pressure are automatically stored in digital signal processor.
The present invention is owing to adopting automatic test approach, automatically the structural key parameters such as resonance frequency, quality factor and coupled voltages ratio, Displacement Ratio can be tested, and collecting test environment temperature or air pressure, be automatically stored in digital signal processor, test process, without the need to operations such as frequently debugging, thread-changings, has especially broken away from artificial monitoring in real time when temperature variation testing, compared with original manual testing's method, the test duration that significantly shorten, convenient and easy, improve testing efficiency.The present invention is applicable to the micromachine resonant device architecture crucial parameter measurements such as resonant-type tiny cantilever beam, micro-resonator, micromechanical gyro and resonance type micro accelerometer.
Although be described in detail a kind of MEMS gyro structural key automatically testing parameters method of the present invention by above-described embodiment, but above-mentioned explanation is not limitation of the invention, without departing from the spirit and scope of the invention, various distortion and change can be carried out, such as, optimized method can be selected in the various methods of prior art.

Claims (3)

1.一种MEMS陀螺结构关键参数自动测试方法,适用于包含两个工作模态结构MEMS陀螺的结构关键参数的测试,所述两个工作模态结构为驱动模态结构和检测模态结构;所述驱动模态结构包括驱动模态驱动结构、驱动模态振动结构和驱动模态振动拾取结构;所述检测模态结构包括检测模态驱动结构、检测模态振动结构和检测模态振动拾取结构;所述结构关键参数包括:驱动模态的谐振频率fd、驱动模态的品质因数Qd、驱动模态和检测模态的耦合电压比;1. A MEMS gyroscope structure key parameter automatic test method is applicable to the test of the structural key parameters comprising two operating mode structure MEMS gyroscopes, and the two operating mode structures are driving mode structure and detection mode structure; The driving modal structure includes a driving modal driving structure, a driving modal vibration structure and a driving modal vibration pickup structure; the detection modal structure includes a detection modal driving structure, a detection modal vibration structure and a detection modal vibration pickup Structure; the key parameters of the structure include: the resonant frequency f d of the driving mode, the quality factor Q d of the driving mode, the coupling voltage ratio of the driving mode and the detection mode; 其特征在于,所述方法包括如下步骤:It is characterized in that the method comprises the steps of: 步骤1)在MEMS陀螺驱动模态的驱动结构电极上施加白噪声电压激励产生驱动力;Step 1) applying white noise voltage excitation on the driving structure electrode of the MEMS gyroscope driving mode to generate driving force; 步骤2)将MEMS陀螺驱动模态的振动拾取结构电极连接前置读出电路;读出电路读取陀螺输出的电压变化量,获得陀螺驱动模态的响应曲线;所述响应曲线采集到数字信号处理器中进行FFT处理,获得驱动模态的谐振频率fdStep 2) connect the vibration pickup structure electrode of the MEMS gyroscope drive mode to the pre-readout circuit; the readout circuit reads the voltage variation of the gyroscope output, and obtains the response curve of the gyroscope drive mode; the response curve collects digital signals FFT processing is performed in the processor to obtain the resonant frequency f d of the driving mode; 步骤3)以步骤2)得到的谐振频率fd构造正弦波,施加在驱动模态的驱动结构电极上,在确定陀螺起振后,采集驱动模态和检测模态前置读出电路的输出电压,获得耦合比;Step 3) Construct a sine wave with the resonant frequency f d obtained in step 2), apply it on the driving structure electrode of the driving mode, and collect the output of the pre-readout circuit of the driving mode and the detection mode after the gyroscope is determined to vibrate voltage to obtain the coupling ratio; 步骤4)撤除正弦波激励,由衰减曲线计算出驱动模态的品质因数QdStep 4) remove the sine wave excitation, and calculate the quality factor Q d of the driving mode from the decay curve; 在完成步骤3)后,撤除正弦波激励,驱动模态的前置读出电路输出陀螺振动衰减曲线,由衰减曲线计算出驱动模态的品质因数QdAfter step 3), the sine wave excitation is removed, and the pre-readout circuit of the driving mode outputs the gyro vibration attenuation curve, and the quality factor Q d of the driving mode is calculated from the attenuation curve. 2.如权利要求1所述的一种MEMS陀螺结构关键参数自动测试方法,其特征在于:所述结构关键参数还包括:检测模态的谐振频率fs、检测模态的品质因数Qs;所述方法还包括如下步骤:2. a kind of MEMS gyroscope structure key parameter automatic testing method as claimed in claim 1, is characterized in that: described structural key parameter also comprises: the resonant frequency f s of detection mode, the quality factor Q s of detection mode; The method also includes the steps of: 步骤5)在MEMS陀螺检测模态的驱动结构电极上施加白噪声电压激励产生驱动力;Step 5) applying white noise voltage excitation on the driving structure electrode of the MEMS gyroscope detection mode to generate driving force; 步骤6)将MEMS陀螺检测模态的振动拾取结构电极连接前置读出电路;读出电路读取陀螺输出的电压变化量,获得陀螺检测模态的响应曲线;所述响应曲线采集到数字信号处理器中进行FFT处理,获得检测模态的谐振频率fsStep 6) The vibration pick-up structure electrode of the MEMS gyro detection mode is connected to the pre-readout circuit; the readout circuit reads the voltage variation of the gyro output, and obtains the response curve of the gyro detection mode; the response curve collects digital signals FFT processing is performed in the processor to obtain the resonant frequency f s of the detected mode; 步骤7)以步骤6)得到的谐振频率fs构造正弦波,施加在陀螺检测模态的驱动结构电极上,在确定陀螺起振后,撤除正弦波激励,检测模态的前置读出电路输出陀螺振动衰减曲线,由衰减曲线计算出检测模态的品质因数QsStep 7) Construct a sine wave with the resonant frequency f s obtained in step 6), apply it on the driving structure electrode of the gyro detection mode, and remove the sine wave excitation after the gyro is determined to vibrate, and detect the pre-readout circuit of the modal Output the gyro vibration attenuation curve, and calculate the quality factor Q s of the detection mode from the attenuation curve. 3.如权利要求2所述的一种用于MEMS陀螺结构关键参数的自动测试方法,其特征在于:3. a kind of automatic testing method that is used for MEMS gyroscope structure key parameter as claimed in claim 2, is characterized in that: 在测试驱动模态的品质因数Qd以及检测模态的品质因数Qs时,使用如下方法:When testing the quality factor Q d of the driving mode and the quality factor Q s of the detection mode, the following methods are used: 设y1为陀螺起振、然后撤除正弦波激励之后,前置读出电路输出的陀螺振荡衰减曲线,则有:Let y1 be the gyro oscillation attenuation curve output by the pre-readout circuit after the gyro starts to oscillate and the sine wave excitation is removed, then: ythe y 11 == ee -- πfπf QQ tt sinsin (( 22 πftπft )) 式中f为谐振频率,进行指数拟合,得到陀螺的品质因数Q。In the formula, f is the resonant frequency, and exponential fitting is performed to obtain the quality factor Q of the gyroscope.
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CN109141473A (en) * 2018-08-17 2019-01-04 北方电子研究院安徽有限公司 A kind of variable damping MEMS gyro sensitive structure test device
CN109238308A (en) * 2018-10-31 2019-01-18 中国船舶重工集团公司第七0七研究所 A kind of the high-accuracy modal test system and test method of metal tubular resonant gyroscope
CN110440777A (en) * 2019-07-15 2019-11-12 北京自动化控制设备研究所 Tuning fork sensitive structure trims on-line testing method and angular rate sensor
CN110553666A (en) * 2019-09-02 2019-12-10 北京博达微科技有限公司 Method for acquiring quality factor Q value of sensitive structure of MEMS capacitive gyroscope
CN110567450A (en) * 2019-08-26 2019-12-13 北京自动化控制设备研究所 Parameter matching method between MEMS Coriolis vibrating gyroscope and ASIC circuit
CN111536994A (en) * 2020-04-29 2020-08-14 中国人民解放军国防科技大学 A resonant micro-gyroscope multi-mode cooperative control method, system and resonant micro-gyroscope
CN111964690A (en) * 2020-07-15 2020-11-20 北京自动化控制设备研究所 Quartz tuning fork gyroscope gauge outfit screening test device
CN112964242A (en) * 2021-02-22 2021-06-15 北京自动化控制设备研究所 System and method for testing mechanical coupling error of quartz tuning fork gyroscope gauge head
CN114689084A (en) * 2021-10-25 2022-07-01 北京航天时代光电科技有限公司 A Distortion-Free Test Method for Dynamic Error of Fiber Optic Gyroscope under Line Vibration and Angular Vibration
CN115047214A (en) * 2022-03-17 2022-09-13 中国科学院地质与地球物理研究所 Detection method and device for MEMS acceleration sensor chip
CN115628758A (en) * 2022-12-21 2023-01-20 四川图林科技有限责任公司 Method for detecting and correcting key process parameters under multi-physical-field coupling condition

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Cited By (16)

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Publication number Priority date Publication date Assignee Title
CN107607130B (en) * 2017-09-14 2019-07-26 中国电子科技集团公司第二十六研究所 A kind of no plated film quartz hemispherical resonator detection device and method
CN107607130A (en) * 2017-09-14 2018-01-19 中国电子科技集团公司第二十六研究所 One kind is without plated film quartz hemispherical resonator detection means and method
CN109141473A (en) * 2018-08-17 2019-01-04 北方电子研究院安徽有限公司 A kind of variable damping MEMS gyro sensitive structure test device
CN109238308A (en) * 2018-10-31 2019-01-18 中国船舶重工集团公司第七0七研究所 A kind of the high-accuracy modal test system and test method of metal tubular resonant gyroscope
CN110440777A (en) * 2019-07-15 2019-11-12 北京自动化控制设备研究所 Tuning fork sensitive structure trims on-line testing method and angular rate sensor
CN110567450A (en) * 2019-08-26 2019-12-13 北京自动化控制设备研究所 Parameter matching method between MEMS Coriolis vibrating gyroscope and ASIC circuit
CN110553666A (en) * 2019-09-02 2019-12-10 北京博达微科技有限公司 Method for acquiring quality factor Q value of sensitive structure of MEMS capacitive gyroscope
CN110553666B (en) * 2019-09-02 2020-12-18 北京博达微科技有限公司 Method for acquiring quality factor Q value of sensitive structure of MEMS capacitive gyroscope
CN111536994B (en) * 2020-04-29 2021-09-24 中国人民解放军国防科技大学 A resonant micro-gyroscope multi-mode cooperative control method, system and resonant micro-gyroscope
CN111536994A (en) * 2020-04-29 2020-08-14 中国人民解放军国防科技大学 A resonant micro-gyroscope multi-mode cooperative control method, system and resonant micro-gyroscope
CN111964690A (en) * 2020-07-15 2020-11-20 北京自动化控制设备研究所 Quartz tuning fork gyroscope gauge outfit screening test device
CN111964690B (en) * 2020-07-15 2022-09-20 北京自动化控制设备研究所 A quartz tuning fork gyro head screening test device
CN112964242A (en) * 2021-02-22 2021-06-15 北京自动化控制设备研究所 System and method for testing mechanical coupling error of quartz tuning fork gyroscope gauge head
CN114689084A (en) * 2021-10-25 2022-07-01 北京航天时代光电科技有限公司 A Distortion-Free Test Method for Dynamic Error of Fiber Optic Gyroscope under Line Vibration and Angular Vibration
CN115047214A (en) * 2022-03-17 2022-09-13 中国科学院地质与地球物理研究所 Detection method and device for MEMS acceleration sensor chip
CN115628758A (en) * 2022-12-21 2023-01-20 四川图林科技有限责任公司 Method for detecting and correcting key process parameters under multi-physical-field coupling condition

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