CN105510340B - 对琢石成像的方法 - Google Patents

对琢石成像的方法 Download PDF

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Publication number
CN105510340B
CN105510340B CN201510925316.6A CN201510925316A CN105510340B CN 105510340 B CN105510340 B CN 105510340B CN 201510925316 A CN201510925316 A CN 201510925316A CN 105510340 B CN105510340 B CN 105510340B
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China
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ashlar
image
images
volume
optionally
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Expired - Fee Related
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CN201510925316.6A
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English (en)
Chinese (zh)
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CN105510340A (zh
Inventor
塞·施尼泽尔
亚尼瓦·本-哈盖
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Sarine Color Technologies Ltd
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Sarine Color Technologies Ltd
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/389—Precious stones; Pearls
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/87—Investigating jewels
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T15/00—3D [Three Dimensional] image rendering
    • G06T15/08—Volume rendering
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/60—Analysis of geometric attributes
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/70—Determining position or orientation of objects or cameras
    • G06T7/73—Determining position or orientation of objects or cameras using feature-based methods
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/56—Cameras or camera modules comprising electronic image sensors; Control thereof provided with illuminating means
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/60—Control of cameras or camera modules
    • H04N23/62—Control of parameters via user interfaces
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/60—Control of cameras or camera modules
    • H04N23/667—Camera operation mode switching, e.g. between still and video, sport and normal or high- and low-resolution modes
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N5/00—Details of television systems
    • H04N5/222—Studio circuitry; Studio devices; Studio equipment
    • H04N5/262—Studio circuits, e.g. for mixing, switching-over, change of character of image, other special effects ; Cameras specially adapted for the electronic generation of special effects
    • H04N5/2628—Alteration of picture size, shape, position or orientation, e.g. zooming, rotation, rolling, perspective, translation
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Biochemistry (AREA)
  • Pathology (AREA)
  • Immunology (AREA)
  • General Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Food Science & Technology (AREA)
  • Medicinal Chemistry (AREA)
  • Quality & Reliability (AREA)
  • Geometry (AREA)
  • Computer Graphics (AREA)
  • Human Computer Interaction (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Adornments (AREA)
  • Image Analysis (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Image Processing (AREA)
CN201510925316.6A 2009-03-11 2010-03-11 对琢石成像的方法 Expired - Fee Related CN105510340B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US20253709P 2009-03-11 2009-03-11
US61/202,537 2009-03-11
CN201080020826.4A CN102422147B (zh) 2009-03-11 2010-03-11 对琢石成像的方法和系统

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
CN201080020826.4A Division CN102422147B (zh) 2009-03-11 2010-03-11 对琢石成像的方法和系统

Publications (2)

Publication Number Publication Date
CN105510340A CN105510340A (zh) 2016-04-20
CN105510340B true CN105510340B (zh) 2018-08-24

Family

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Family Applications (2)

Application Number Title Priority Date Filing Date
CN201510925316.6A Expired - Fee Related CN105510340B (zh) 2009-03-11 2010-03-11 对琢石成像的方法
CN201080020826.4A Expired - Fee Related CN102422147B (zh) 2009-03-11 2010-03-11 对琢石成像的方法和系统

Family Applications After (1)

Application Number Title Priority Date Filing Date
CN201080020826.4A Expired - Fee Related CN102422147B (zh) 2009-03-11 2010-03-11 对琢石成像的方法和系统

Country Status (11)

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US (2) US9151717B2 (enExample)
EP (1) EP2406617A1 (enExample)
JP (2) JP5705750B2 (enExample)
CN (2) CN105510340B (enExample)
AP (2) AP2015008589A0 (enExample)
AU (1) AU2010222274C1 (enExample)
BR (1) BRPI1006718A2 (enExample)
IL (1) IL245801B (enExample)
SG (2) SG10201503708VA (enExample)
WO (1) WO2010103526A1 (enExample)
ZA (1) ZA201107405B (enExample)

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AU2010222274C1 (en) 2009-03-11 2014-11-06 Sarin Color Technologies Ltd. Methods and systems of imaging cut stones
US9075015B2 (en) * 2012-06-04 2015-07-07 Frederick W. Shapiro Universal tool for automated gem and mineral identification and measurement
US9832453B2 (en) 2012-12-02 2017-11-28 Segoma Ltd. Devices and methods for generating a 3D imaging dataset of an object
IL285431B (en) * 2012-12-20 2022-08-01 Sarine Tech Ltd A system for precise three-dimensional modeling of gems
US12135202B2 (en) * 2012-12-20 2024-11-05 Sarine Technologies Ltd. System and method for determining the traceability of gemstones based on gemstone modeling
SG10201609555YA (en) * 2013-08-12 2017-01-27 Caratell Pte Ltd Method and system for certification and verification of gemstones
CN103472064B (zh) * 2013-10-12 2015-11-18 梧州学院 一种圆明亮琢型宝石切工鉴定的方法
CN103488849A (zh) * 2013-10-12 2014-01-01 梧州学院 利用图像处理技术还原圆明亮琢型宝石原始设计的方法
US9457949B1 (en) * 2013-10-18 2016-10-04 William S. Hathaway, III Personalized identification system for deceased bodies
WO2016092553A1 (en) * 2014-12-11 2016-06-16 Shirtal Diacam Ltd System and method for generating 360° interactive view of an object
US9678018B2 (en) * 2015-03-30 2017-06-13 Gemological Institute Of America Inc. (Gia) Apparatus and method for assessing optical quality of gemstones
US10107757B2 (en) * 2015-03-30 2018-10-23 Gemological Institute Of America Inc. (Gia) Apparatus and method for fluorescence grading of gemstones
US10387723B2 (en) 2015-05-21 2019-08-20 Sarine Color Technologies Ltd. System and method of unique identifying a gemstone
US10302639B2 (en) 2015-12-18 2019-05-28 Ricoh Company, Ltd. Thermal transfer medium for testing device, testing device and method for producing same, and testing kit
CA3058554A1 (en) 2017-03-29 2018-10-04 Engemma Oy Gemological object recognition
EP3388822B1 (en) 2017-04-14 2023-09-27 Inexto Sa Method for computing a unique identifier for a gemstone having facets
US10552950B2 (en) * 2017-05-25 2020-02-04 International Business Machines Corporation Mapping and encoding gemological features
JP6997593B2 (ja) * 2017-11-06 2022-01-17 大塚電子株式会社 光学特性測定方法および光学特性測定システム
CN108195802B (zh) * 2017-11-21 2020-09-15 广州标旗电子科技有限公司 一种钻石发光成像检测方法
CN107845145B (zh) * 2017-11-29 2020-12-01 电子科技大学 一种电子显微场景下的三维重构系统及方法
AU2018393444B2 (en) * 2017-12-29 2020-08-27 Goldway Technology Limited Colour grading process and system for diamonds
WO2019185993A1 (en) * 2018-03-28 2019-10-03 Engemma Oy Extended focal plane imaging by using a gemstone manipulator
WO2019185974A1 (en) * 2018-03-28 2019-10-03 Engemma Oy Holder arrangement for gemological object recognition system
WO2020016874A1 (en) 2018-07-15 2020-01-23 Sarine Technologies Ltd System and method for evaluating and determining color in gemstones
US11815465B2 (en) 2019-03-08 2023-11-14 Gemological Institute Of America, Inc. (Gia) Portable high-resolution gem imaging system
GB2582934B (en) * 2019-04-09 2021-11-17 Peng cheng lai Turntable and light box for ring photography
GB2584876A (en) * 2019-06-19 2020-12-23 Jubilee Diamond Instr S Pte Ltd Gemstone testing apparatus
US11326952B2 (en) * 2019-07-29 2022-05-10 Goldway Technology Limited Process and system for colour grading for diamonds
GB2590947B (en) 2020-01-08 2023-12-20 Opsydia Ltd Methods and devices for determining a location associated with a gemstone
CN111707666B (zh) * 2020-05-11 2024-02-23 武汉恒宇科教仪器设备研发有限公司 一种钻石腰线观测仪及观测方法
EP4443219A1 (en) * 2023-04-03 2024-10-09 Carl Zeiss Vision International GmbH Apparatus and method suitable for scanning a spectacle frame
US11874231B1 (en) * 2023-06-21 2024-01-16 Chow Sang Sang Jewellery Company Limited System and method for gemstone identification
US12436092B1 (en) 2024-10-10 2025-10-07 Hong Kong Applied Science and Technology Research Institute Company Limited Continuous line for automatic diamond color grading evaluation
CN120461194B (zh) * 2025-07-16 2025-11-07 浙江求是半导体设备有限公司 基于视觉系统的钻石磨削加工方法

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CA1192995A (en) * 1980-06-04 1985-09-03 John C. Lawrence Examining a gemstone

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US5615005A (en) * 1995-01-23 1997-03-25 Ugts, Inc. Gemstone evaluation system
JP3824116B2 (ja) * 1998-01-29 2006-09-20 日本電信電話株式会社 顕微鏡画像遠隔制御システム
JPH11255511A (ja) * 1998-03-12 1999-09-21 Hiroichi Ishida ダイヤモンドの鑑定方法
IL126809A (en) * 1998-10-29 2001-08-26 Sarin Technologies Ltd Apparatus and method of examining the shape of gemstones
IL134664A0 (en) * 1999-10-29 2001-04-30 Diamond And Jewelry 4 U Ltd System for trade in precious gemstones
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US20020048396A1 (en) * 2000-09-20 2002-04-25 Bewley Wilbur C. Apparatus and method for three-dimensional scanning of a subject, fabrication of a natural color model therefrom, and the model produced thereby
JP3620715B2 (ja) * 2001-01-25 2005-02-16 セイコーエプソン株式会社 ディジタルカメラ及び画像ファイル方法
AT410602B (de) * 2001-12-12 2003-06-25 Swarovski & Co Verfahren zur vermessung der oberfläche eines geschliffenen schmucksteines
US20030223054A1 (en) * 2002-05-29 2003-12-04 Natural Crystal Information Systems Method and apparatus for identifying gemstones
AU2003237459A1 (en) 2002-06-07 2003-12-22 William R. Bray Diamond cut scoring system and method
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Also Published As

Publication number Publication date
WO2010103526A1 (en) 2010-09-16
SG10201503708VA (en) 2015-06-29
JP2015143691A (ja) 2015-08-06
US9519961B2 (en) 2016-12-13
US9151717B2 (en) 2015-10-06
AP3454A (en) 2015-10-31
BRPI1006718A2 (pt) 2016-04-26
JP5989161B2 (ja) 2016-09-07
US20120007971A1 (en) 2012-01-12
AU2010222274B2 (en) 2014-04-24
AP2011005915A0 (en) 2011-10-31
US20160027166A1 (en) 2016-01-28
AU2010222274C1 (en) 2014-11-06
CN105510340A (zh) 2016-04-20
AU2010222274A1 (en) 2011-11-03
ZA201107405B (en) 2012-12-27
SG174304A1 (en) 2011-10-28
AP2015008589A0 (en) 2015-07-31
EP2406617A1 (en) 2012-01-18
CN102422147B (zh) 2016-01-20
JP5705750B2 (ja) 2015-04-22
CN102422147A (zh) 2012-04-18
JP2012520115A (ja) 2012-09-06
IL245801A0 (en) 2016-06-30
IL245801B (en) 2018-03-29

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Address after: Israel David Xia sellum

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