CN105486988B - A kind of pressure resistant testing device and method of electromagnetic oven IGBT - Google Patents
A kind of pressure resistant testing device and method of electromagnetic oven IGBT Download PDFInfo
- Publication number
- CN105486988B CN105486988B CN201410529546.6A CN201410529546A CN105486988B CN 105486988 B CN105486988 B CN 105486988B CN 201410529546 A CN201410529546 A CN 201410529546A CN 105486988 B CN105486988 B CN 105486988B
- Authority
- CN
- China
- Prior art keywords
- igbt
- voltage
- electromagnetic oven
- oscillograph
- tested
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Relating To Insulation (AREA)
Abstract
The invention discloses a kind of electromagnetic oven IGBT pressure resistant testing device and methods, the test device includes: voltage fluctuation device, the voltage fluctuation device includes: testing capacitor and control switch, first pole plate of the testing capacitor is connect by the control switch with an input electrode of electromagnetic oven to be tested, and the second pole plate of the testing capacitor is connect with another input electrode of the electromagnetic oven to be tested；Oscillograph, the first input end of the oscillograph connect the collector of the IGBT, and the second input terminal of the oscillograph connects the emitter of the IGBT, and the oscillograph is used for the voltage tested between the IGBT emitter and collector.Test device and method of the present invention can simulate the voltage fluctuation of power supply grid, provide pulse test voltage for the IGBT of electromagnetic oven to be tested, realize the voltage-withstand test of IGBT.
Description
Technical field
The present invention relates to semiconductor device the field of test technology, the pressure resistance more specifically to a kind of electromagnetic oven IGBT is surveyed
Try device and method.
Background technique
Insulated gate bipolar transistor (Insulated Gate Bipolar Transistor, abbreviation IGBT) is by double
The compound full-control type voltage driven type power semiconductor of polar form triode (BJT) and insulating gate type field effect tube (MOSFET) composition
The high-speed switch of device, the high input impedance and power transistor (i.e. huge transistor, abbreviation GTR) that have MOSFET element concurrently is special
Property the advantages of, therefore, IGBT is widely used in various switching circuit structures as a kind of important switching device.
IGBT mono- important application is as switching tube in the control circuit of electromagnetic oven.It is electricity with reference to Fig. 1, Fig. 1
The circuit diagram of the control circuit of magnetic furnace 1, comprising: the circuit LC, filter capacitor C2, switch transistor T and sustained diode.Wherein, institute
Stating the circuit LC includes: filter inductance L and resonant capacitance C1 in parallel；The switch transistor T is IGBT, and the IGBT includes: grid
Pole g, collector c and emitter e；A pole plate of the filter capacitor C2 is connected by the circuit LC and the collector c
It connects, another pole plate ground connection；The grid g and emitter e ground connection；Anode and the transmitting of the freewheeling diode
Pole e connection, cathode are connect with the collector c.
When providing operating voltage for two input terminals of electromagnetic oven for electromagnetic oven, IGBT is connected, and the control circuit is normal
Work.In the electromagnetic oven course of work, if voltage fluctuation occurs for power supply grid, it will lead to the circuit LC and shake, work as LC
It will lead to IGBT collector c when circuit is shaken and emitter e both end voltage moment increase, may result in IGBT breakdown damage
It is bad.
Since there are voltage fluctuations for power supply grid, and voltage fluctuation will will affect the performance of the IGBT of electromagnetic oven, therefore need to be
The IGBT of electromagnetic oven provides pulse voltage to test its pressure-resistant performance.Therefore, how for the IGBT of electromagnetic oven pulse voltage is provided
It is one urgent problem to be solved of electromagnetic oven testing field in order to carry out voltage-withstand test to IGBT.
Summary of the invention
In order to solve the above technical problems, the present invention provides a kind of electromagnetic oven IGBT pressure resistant testing device and method, Ke Yiwei
The IGBT of electromagnetic oven provides pulse test voltage, realizes the voltage-withstand test of IGBT.
To achieve the above object, the invention provides the following technical scheme:
A kind of electromagnetic oven IGBT pressure resistant testing device, the test device include:
Voltage fluctuation device, the voltage fluctuation device include: testing capacitor and control switch, the testing capacitor
First pole plate is connect by the control switch with an input electrode of electromagnetic oven to be tested, the second pole of the testing capacitor
Plate is connect with another input electrode of the electromagnetic oven to be tested；
Oscillograph, the first input end of the oscillograph connect the collector of the IGBT, and the second of the oscillograph is defeated
Enter the emitter that end connects the IGBT, the oscillograph is used for the voltage tested between the IGBT emitter and collector.
Preferably, in above-mentioned test device, the testing capacitor is CBB electric capacity.
Preferably, in above-mentioned test device, the control switch is air switch.
Preferably, in above-mentioned test device, the rated operational voltage of the oscillograph is greater than or equal to 1000V.
Preferably, in above-mentioned test device, the oscillograph includes high pressure differential probe；
Wherein, the anode probe of the high pressure differential probe is the first input end, and the high pressure differential probe is born
Pole probe is second input terminal.
Preferably, in above-mentioned test device, further includes: wiring board and first voltage fluctuation end and second voltage wave
Moved end；
Wherein, first voltage fluctuation end is connect with first pole plate, and the second voltage fluctuation end passes through described
Control switch is connect with second pole plate；The wiring board includes: the first socket and the second socket, first socket with
Second socket is used to connection working power；First socket and second socket one of those be used for it is described
Two input electrodes of electromagnetic oven to be tested connect, another is used to fluctuate end and the second voltage with the first voltage
Fluctuate end connection.
The present invention also provides a kind of electromagnetic oven IGBT voltage-withstand test methods, using described in any of the above-described kind of embodiment
Test device tests electromagnetic oven to be detected, and the test method includes:
Two input electrodes for the electromagnetic oven to be tested provide operating voltage；
Switch motion is carried out with the control switch that configuration switch frequency controls the test device；
The voltage between the IGBT collector and emitter is obtained by the oscillograph of the test device.
It can be seen from the above technical proposal that the voltage fluctuation device of herein described test device includes a test electricity
Appearance and control switch.The input that first pole plate of the testing capacitor passes through the control switch and electromagnetic oven to be tested
Electrode connection, the second pole plate of the testing capacitor are connect with another input electrode of the electromagnetic oven to be tested.In this way, working as
When connecting working power for two input electrodes of the electromagnetic oven to be tested, the voltage fluctuation device and the electricity to be tested
Magnetic furnace connects the working power simultaneously, and when the control switch disconnects, the control circuit of the electromagnetic oven to be tested is in institute
It states and is worked normally under the operating voltage of working power offer, the IGBT conducting of control circuit, when control switch closure, by
It needs to charge for the testing capacitor in the working power, the IGBT grid and emitter voltage reduce, and IGBT is caused to close
Disconnected, the filter inductance of the control circuit will generate a moment biggish voltage-drop loading in the emitter and collection of the IGBT
Electrode both ends can test the voltage that the both ends IGBT are born by the oscillograph at this time.
As it can be seen that the collector and hair for the IGBT can be realized by the switching frequency for controlling the control switch
Emitter-base bandgap grading both ends apply the pulse voltage of setpoint frequency, and the collector and emitter of the IGBT are obtained by the oscillograph
The voltage value that both ends are born, to test the pressure-resistant performance of IGBT.The voltage fluctuation device of the test device only needs a survey
Examination capacitor and a control switch can be realized, and structure is simple and cost of manufacture is lower.The test method uses the test
Device tests electromagnetic oven to be tested, easy to operate, can fast implement the resistance test of electromagnetic oven to be tested.
Detailed description of the invention
In order to more clearly explain the embodiment of the invention or the technical proposal in the existing technology, to embodiment or will show below
There is attached drawing needed in technical description to be briefly described, it should be apparent that, the accompanying drawings in the following description is only this
The embodiment of invention for those of ordinary skill in the art without creative efforts, can also basis
The attached drawing of offer obtains other attached drawings.
The circuit diagram of the control circuit of Fig. 1 electromagnetic oven；
Fig. 2 is a kind of structural schematic diagram of electromagnetic oven IGBT pressure resistant testing device provided by the embodiments of the present application；
Fig. 3 is a kind of flow diagram of electromagnetic oven IGBT voltage-withstand test method provided by the embodiments of the present application.
Specific embodiment
Following will be combined with the drawings in the embodiments of the present invention, and technical solution in the embodiment of the present invention carries out clear, complete
Site preparation description, it is clear that described embodiments are only a part of the embodiments of the present invention, instead of all the embodiments.It is based on
Embodiment in the present invention, it is obtained by those of ordinary skill in the art without making creative efforts every other
Embodiment shall fall within the protection scope of the present invention.
In order to test the pressure-resistant performance of electromagnetic oven IGBT to be tested, need to provide pulse voltage, existing survey for electromagnetic oven
Examination mode is to provide pulse voltage by surge test instrument for electromagnetic oven, and test the IGBT collector and hair by oscillograph
The voltage at emitter-base bandgap grading both ends, to detect the pressure-resistant performance of the IGBT.But surge test higher cost, and complicated for operation, test
Efficiency is lower.
As shown in Figure 1, the control circuit of electromagnetic oven to be tested includes: the circuit LC, filter capacitor C2, switch transistor T and continues
Flow diode D.Wherein, the circuit LC includes: filter inductance L and resonant capacitance C1 in parallel；The switch transistor T is
IGBT, the IGBT include: grid g, collector c and emitter e；A pole plate of the filter capacitor C2 passes through the LC
Circuit is connect with the collector c, another pole plate ground connection；The grid g and emitter e ground connection；The afterflow two
The anode of pole pipe is connect with the emitter e, and cathode is connect with the collector c.
Inventor is the study found that the circuit LC that can control electromagnetic oven inner control circuit by the charge and discharge of capacitor occurs
Concussion, provides pulse voltage with the concussion in the circuit LC for the IGBT, to realize the IGBT under voltage fluctuation
Resistance test.
Based on the studies above, the embodiment of the present application provides a kind of electromagnetic oven IGBT pressure resistant testing device, with reference to Fig. 2, institute
Stating test device includes: voltage fluctuation device and oscillograph M.The voltage fluctuation device includes: testing capacitor C3 and control
Make switch K.
The input electricity that the first pole plate of the testing capacitor C3 passes through the control switch K and electromagnetic oven 1 to be tested
Pole connection, the second pole plate of the testing capacitor C3 are connect with another input electrode of the electromagnetic oven 1 to be tested.
In the present embodiment, the testing capacitor uses CBB electric capacity (polypropylene capactive), and CBB electric capacity has nonpolarity, frequency
Rate excellent, the advantages that small in size, capacity is big, stability is good, due to nonpolarity, without considering that positive and negative anodes connection is suitable
Sequence is convenient for circuit connection；It is small in size due to having the advantages that, therefore can make voltage fluctuation device that there is lesser volume；By
In having the advantages that capacity is big, frequency characteristic is excellent, when the voltage fluctuation device can be made to carry out voltage fluctuation adjusting, make
Obtaining pulse voltage has biggish frequency fluctuation range；Due to having the advantages that stability is good, it is ensured that electric in test process
The stability of road performance.The control switch is air switch, and air switch has preferable circuit protection feature, can be right
The problems such as open circuit or overload for electrically setting after circuit, is protected, and equipment damage is prevented.
The electromagnetic oven to be tested 1 includes control circuit, and the circuit diagram of the control circuit is as shown in Figure 1, comprising: LC is returned
Road, filter capacitor C2, switch transistor T and sustained diode.Wherein, the circuit LC include: in parallel filter inductance L and
Resonant capacitance C1；The switch transistor T is the IGBT, and the IGBT includes: grid g, collector c and emitter e；The filter
A pole plate of wave capacitor C2 is connect by the circuit LC with the collector c, another pole plate ground connection；The grid g with
And the emitter e ground connection；The anode of the freewheeling diode is connect with the emitter e, and cathode and the collector c connect
It connects.
The first input end of the oscillograph M connects the collector c of the IGBT, the second input terminal of the oscillograph M
The emitter e of the IGBT is connected, the oscillograph M is used for the voltage tested between the IGBT emitter e and collector c,
To test the pressure resistance of the emitter e and collector c receiving.
Due to that can load one between the collector c and emitter e of the IGBT and arrive very much when the circuit LC is shaken
High pressure, the damage of oscillograph M in order to prevent needs the oscillograph using one with higher nominal operating voltage, and described
Oscillograph includes being capable of high voltage bearing high pressure differential probe.In the present embodiment, the rated operational voltage of the oscillograph M is greater than
Or it is equal to 1000V, and the oscillograph includes that can do high voltage bearing high pressure differential probe, the anode of the high pressure differential probe is visited
Head is the first input end, and the cathode probe of the high pressure differential probe is second input terminal.Need to guarantee described show
Two input terminals of wave device M with the emitter e of the IGBT and the connection correctness of collector c, prevent oscillograph from damaging.
The test device further include: wiring board 2 and first voltage fluctuation end and second voltage fluctuate end.Wherein,
First voltage fluctuation end is connect with first pole plate, the second voltage fluctuate end by the control switch with it is described
The connection of second pole plate；The wiring board includes: the first socket P1 and the second socket P2, the first socket P1 and described second
Socket P2 is used to connection working power, and in the present embodiment, the working power is that can provide the electricity of 220V AC voltage
Source；The first socket P1 and the second socket P2 one of those be used for two inputs with the electromagnetic oven 1 to be tested
Electrode connection, another is used to fluctuate end and second voltage fluctuation end with the first voltage and connect.
By two sockets of the wiring board, can be filled in order to the electromagnetic oven 1 to be tested and the voltage fluctuation
Set the connection with the working power.When on the electromagnetic oven 1 to be tested and the voltage fluctuation device and the wiring board 2
After corresponding socket connection, the two is while being connected to the working power.
When the control switch disconnects, work that the control circuit of the electromagnetic oven to be tested is provided in the working power
Make to work normally under voltage, the IGBT conducting of control circuit, when control switch closure, since the working power needs
For testing capacitor charging, the IGBT grid and emitter voltage are reduced, and cause IGBT to turn off, the filter of the control circuit
Wave inductance will generate emitter and collector both ends of the moment biggish voltage-drop loading in the IGBT, pass through institute at this time
The voltage that the both ends IGBT are born can be tested by stating oscillograph.As it can be seen that by the switching frequency for controlling the control switch, i.e.,
It can be achieved to apply the pulse voltage of setpoint frequency for the collector of the IGBT and emitter both ends, and pass through the oscillograph
The voltage value that the collector and emitter both ends for obtaining the IGBT are born, to test the pressure-resistant performance of IGBT.
The voltage fluctuation device of the test device only needs a testing capacitor and a control switch, structure it is simple and
Cost of manufacture is lower.By the testing capacitor and the control switch can simulating grid voltage fluctuation, for test electricity
Magnetic furnace provides a pulse voltage, by the adjustable IGBT emitter e of switching frequency and collection that adjust control switch
Voltage between electrode c can obtain the voltage between the IGBT emitter e and collector c by the oscillograph, from
And realize the voltage-withstand test to the IGBT.
Based on above-mentioned test device embodiment, another embodiment of the application additionally provides a kind of electromagnetic oven IGBT pressure resistance
Test method tests electromagnetic oven to be detected using test device described in above-described embodiment, and the test method includes:
Step S1: two input electrodes for the electromagnetic oven to be tested provide operating voltage.
The circuit connecting relation of the test device and the electromagnetic oven to be tested can be found in Fig. 2 and above-described embodiment
Corresponding description, details are not described herein.
Step S2: switch motion is carried out with the control switch that configuration switch frequency controls the test device.
When the test device and the electromagnetic oven to be tested are both connected to working power, filled by controlling the test
The switching frequency for the control switch set can make the circuit LC of the control circuit of the electromagnetic oven to be tested shake.Switch
Frequency is faster, i.e., the charging time of the described testing capacitor is shorter, and the turn-off time of the IGBT is shorter, then its collector c and hair
Voltage between emitter-base bandgap grading eWhen dt is smaller, got over by the inductive voltage value that the filter inductance L in the circuit LC is generated
Height will lead to the crest voltage V for occurring moment between collector c and emitter ece。
By adjusting the switching frequency of the control switch, can simulating grid voltage fluctuation, provide one for the IGBT
A pulse voltage, when switching frequency is faster, the power network fluctuation of simulation is bigger.
Step S3: the voltage between the IGBT collector and emitter is obtained by the oscillograph of the test device.
Controlled in above-mentioned steps the control switch carry out switch operation when, each switch periods, the oscillograph
The crest voltage between a collector c and emitter e can be obtained.
As can be seen from the above description, the electricity that the test method passes through the control voltage fluctuation unit simulation power supply grid
Pressure fluctuation obtains voltage of the current load between the IGBT collector c and emitter e by the oscillograph, so as to
It realizes and the pressure of the resistance to value of electromagnetic oven to be tested is tested, test method is simple, and testing efficiency is fast.
The foregoing description of the disclosed embodiments enables those skilled in the art to implement or use the present invention.
Various modifications to these embodiments will be readily apparent to those skilled in the art, as defined herein
General Principle can be realized in other embodiments without departing from the spirit or scope of the present invention.Therefore, of the invention
It is not intended to be limited to the embodiments shown herein, and is to fit to and the principles and novel features disclosed herein phase one
The widest scope of cause.
Claims (6)
1. a kind of electromagnetic oven IGBT pressure resistant testing device characterized by comprising
Voltage fluctuation device, the voltage fluctuation device include: testing capacitor and control switch, and the first of the testing capacitor
Pole plate is connect by the control switch with an input electrode of electromagnetic oven to be tested, the second pole plate of the testing capacitor with
Another input electrode of the electromagnetic oven to be tested connects；
Oscillograph, the first input end of the oscillograph connect the collector of the IGBT, the second input terminal of the oscillograph
The emitter of the IGBT is connected, the oscillograph is used for the voltage tested between the IGBT emitter and collector；
Further include: wiring board and first voltage fluctuation end and second voltage fluctuate end；
Wherein, first voltage fluctuation end is connect with first pole plate, and second voltage fluctuation end passes through the control
Switch is connect with second pole plate；The wiring board includes: the first socket and the second socket, first socket with it is described
Second socket is used to connection working power；First socket and second socket one of those be used for it is described to be measured
Two input electrodes connection of electromagnetic oven is tried, another is used to fluctuate end with the first voltage and the second voltage fluctuates
End connection；
When the control switch disconnects, the work that the control circuit of the electromagnetic oven to be tested is provided in the working power is electric
Pressure works normally, the IGBT conducting of control circuit, when control switch closure, since the working power needs for institute
Testing capacitor charging is stated, the IGBT grid and emitter voltage reduce, and IGBT is caused to turn off.
2. test device according to claim 1, which is characterized in that the testing capacitor is CBB electric capacity.
3. test device according to claim 1, which is characterized in that the control switch is air switch.
4. test device according to claim 1, which is characterized in that the rated operational voltage of the oscillograph is greater than or waits
In 1000V.
5. test device according to claim 1, which is characterized in that the oscillograph includes high pressure differential probe；
Wherein, the anode probe of the high pressure differential probe is the first input end, and the cathode of the high pressure differential probe is visited
Head is second input terminal.
6. a kind of electromagnetic oven IGBT voltage-withstand test method, which is characterized in that use test as described in any one in claim 1-5
Device tests electromagnetic oven to be detected, and the test method includes:
Two input electrodes for the electromagnetic oven to be tested provide operating voltage；
Switch motion is carried out with the control switch that configuration switch frequency controls the test device；
The voltage between the IGBT collector and emitter is obtained by the oscillograph of the test device.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410529546.6A CN105486988B (en) | 2014-10-09 | 2014-10-09 | A kind of pressure resistant testing device and method of electromagnetic oven IGBT |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410529546.6A CN105486988B (en) | 2014-10-09 | 2014-10-09 | A kind of pressure resistant testing device and method of electromagnetic oven IGBT |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN105486988A CN105486988A (en) | 2016-04-13 |
| CN105486988B true CN105486988B (en) | 2019-01-15 |
Family
ID=55674100
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201410529546.6A Active CN105486988B (en) | 2014-10-09 | 2014-10-09 | A kind of pressure resistant testing device and method of electromagnetic oven IGBT |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN105486988B (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106546895B (en) * | 2016-10-13 | 2021-08-20 | 全球能源互联网研究院 | Diode surge performance test circuit and control method thereof |
| CN118671545A (en) * | 2024-08-23 | 2024-09-20 | 成都高投芯未半导体有限公司 | IGBT withstand voltage test system and method |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101750575A (en) * | 2008-12-22 | 2010-06-23 | 贵州永跃科技有限责任公司 | Lightening strike simulating table |
| CN101902147A (en) * | 2010-07-21 | 2010-12-01 | 西安交通大学 | Impulse voltage generator with magnetic switches |
| CN202614834U (en) * | 2011-11-30 | 2012-12-19 | 中国北车股份有限公司大连电力牵引研发中心 | Insulated gate bipolar transistor (IGBT) over-current protection value test device and device used to test IGBT over-current protection value in electric locomotive traction circuit |
| CN103236801A (en) * | 2013-04-07 | 2013-08-07 | 广东鼎燊科技有限公司 | Surge impact device for detecting induction cooker |
| CN103856188A (en) * | 2012-11-30 | 2014-06-11 | 深圳市海洋王照明工程有限公司 | High-voltage-pulse circuit |
-
2014
- 2014-10-09 CN CN201410529546.6A patent/CN105486988B/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101750575A (en) * | 2008-12-22 | 2010-06-23 | 贵州永跃科技有限责任公司 | Lightening strike simulating table |
| CN101902147A (en) * | 2010-07-21 | 2010-12-01 | 西安交通大学 | Impulse voltage generator with magnetic switches |
| CN202614834U (en) * | 2011-11-30 | 2012-12-19 | 中国北车股份有限公司大连电力牵引研发中心 | Insulated gate bipolar transistor (IGBT) over-current protection value test device and device used to test IGBT over-current protection value in electric locomotive traction circuit |
| CN103856188A (en) * | 2012-11-30 | 2014-06-11 | 深圳市海洋王照明工程有限公司 | High-voltage-pulse circuit |
| CN103236801A (en) * | 2013-04-07 | 2013-08-07 | 广东鼎燊科技有限公司 | Surge impact device for detecting induction cooker |
Also Published As
| Publication number | Publication date |
|---|---|
| CN105486988A (en) | 2016-04-13 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN103969527A (en) | Charge-discharge service life detection device of high-voltage ceramic capacitor | |
| CN104021978B (en) | Permanent magnetic vacuum switch divide-shut brake capacitance galvanostatic charging switching device shifter and control method thereof | |
| CN204362337U (en) | Electromagnetic Heating control circuit and electromagnetic heating apparatus | |
| CN103368167A (en) | Single-phase earth fault fundamental current full compensation device and method | |
| CN105634441B (en) | High efficiency two fingers number electromagnetic pulse generating device | |
| CN102361319B (en) | IGBT (Insulated Gate Bipolar Translator) short circuit protection detection circuit based on driving chip | |
| CN105486988B (en) | A kind of pressure resistant testing device and method of electromagnetic oven IGBT | |
| CN105137136B (en) | A kind of high-voltage high-capacity impulse of low structure inductance | |
| CN104764912A (en) | Lightning surge generator based on SCR array switches | |
| CN102355156A (en) | Novel Marx pulse forming circuit | |
| CN105203938A (en) | High-power thyristor forward recovery characteristic detection device and detection method | |
| CN208156170U (en) | A kind of initiative alarming circuit of bus power source | |
| CN204068898U (en) | A kind of circuit using avalanche transistor to produce high-voltage nanosecond level pulse signal | |
| CN104764911A (en) | Ringing wave test signal generator based on electronic switches | |
| CN103905018A (en) | Dynamic current sharing circuit of IGBT module parallel unsymmetrical circuit | |
| CN206223830U (en) | A kind of novel energy-conserving feedback type electronic load based on frequency converter | |
| CN204131110U (en) | Based on the battery system anti-surge circuit of discrete elements | |
| CN104866656A (en) | Bridge arm equivalent circuit of modular multilevel converter with full-bridge structure | |
| CN203243230U (en) | High-voltage rotor frequency converter preventing chopper from being damaged during inversion overturn process | |
| CN210690740U (en) | IGBT (insulated Gate Bipolar transistor) forward recovery characteristic equivalent test circuit | |
| CN203674737U (en) | Discharge protection device and battery management system thereof | |
| CN103746567B (en) | A kind of wavefront continuously adjustable impact high voltage method for generation | |
| CN103606898B (en) | Overvoltage protection device of converter of wind turbine generator set and converter | |
| CN102573259A (en) | Method for suppressing filamentary discharge and electrode structure | |
| CN207233700U (en) | A kind of high pressure coupled pulse generator and time of-flight mass spectrometer |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |