CN105403892A - Semiconductor laser distance measuring device based on switched capacitor array sampling - Google Patents
Semiconductor laser distance measuring device based on switched capacitor array sampling Download PDFInfo
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- CN105403892A CN105403892A CN201510974672.7A CN201510974672A CN105403892A CN 105403892 A CN105403892 A CN 105403892A CN 201510974672 A CN201510974672 A CN 201510974672A CN 105403892 A CN105403892 A CN 105403892A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
- G01S17/02—Systems using the reflection of electromagnetic waves other than radio waves
- G01S17/06—Systems determining position data of a target
- G01S17/08—Systems determining position data of a target for measuring distance only
Abstract
The invention relates to a semiconductor laser distance measuring device based on switched capacitor array sampling. The distance measuring device comprises an emission end and a receiving end which are connected with a main control module. The emission end successively comprises an LD driving module, an LD module and an LD shape adjusting emission module. The receiving end successively comprises an echo receiving module, an APD amplifying module, an SCA sampling integration module and an ADC module. The SCA sampling integration module comprises N sampling units. Each of the sampling units comprises a sampling switch, an output switch and a sampling capacitor. Digital pulses are transmitted in order, so the sampling switches of the sampling units are successively closed. When the sampling switches are closed, input current signals will charge the sampling capacitors in the corresponding positions. Compared with the traditional AD sampling and storing method, requirements on power consumption of a system and operation speed of a processor are greatly reduced; and quite far acting distance and quite high distance measuring precision can be achieved via quite small size of the system and quite low power consumption.
Description
Technical field
The present invention relates to laser ranging field, be specifically related to a kind of semiconductor laser range finder based on switched capacitor array sampling.
Background technology
Laser ranging technique has a wide range of applications in the field such as national life, Military Application, has strong demand to small size, low cost, remote, low-power consumption, high-precision laser distance measuring system.But the factor restrictions such as Stimulated Light light source, detector sensitivity, above multiple demand is difficult to obtain usually simultaneously.The range finder using laser of based semiconductor laser instrument has less volume, power consumption, is a kind of common small-sized distance mearuring equipment, but is subject to the lower impact of semiconductor laser power, the usual only hundreds of rice of monopulse detection operating distance.
Summary of the invention
For improving measuring distance scope and the distance accuracy of semiconductor laser range finder, the invention provides a kind of semiconductor laser range finder based on switched capacitor array Sampling device.
In order to solve the problems of the technologies described above, technical scheme of the present invention is specific as follows:
Based on a semiconductor laser range finder for switched capacitor array sampling, comprise the transmitting terminal and receiving end that are connected with main control module;
Described transmitting terminal comprises successively: LD driver module, LD module, and LD shaping transmitter module;
Described receiving end comprises successively: echo reception module, APD amplification module, and SCA samples integration module and ADC module;
Comprise the sampling unit of quantification N in described SCA sampling integration module, each sampling unit comprises sampling switch, output switch and sampling capacitance;
Digit pulse is propagated in order, and the sampling switch of each sampling unit is closed successively, and when sampling switch closes, input current signal charges to the sampling capacitance of correspondence position.
In technique scheme, the quantity of the sampling unit that described SCA samples in integration module is greater than 2Rf/c, and wherein R is target range, and f is sample frequency, and c is the light velocity in vacuum.
In technique scheme, during input signal sampling, the open and close state of sampling switch is controlled by a delay chain, according to time order and function order, closes successively, opens; Described time delay chain is made up of 2N reverser, and each reverser can, by the delayed digital signal △ t/2 of input, through 2 reversers between every two capacitance switchs, make the signal lag between the adjacent two-stage sampling switch of arrival be △ t.
In technique scheme, when described SCA samples after integration module receives the signal of LD driver module, produce an extremely short digit pulse, be input in described time delay chain.
In technique scheme, described digit pulse is propagated in order in described time delay chain, the sampling switch of each sampling unit is closed successively, adjacent sampling units sampling switch closure time is spaced apart △ t, when sampling switch closes, input current signal charges to the sampling capacitance of correspondence position.
In technique scheme, the defining method of sampling number is: it is (S/N) that single signal to noise ratio (S/N ratio) is calculated in design
single=a, the signal to noise ratio (S/N ratio) needed for distance process process is (S/N)
object=b, then required sampling number can be taken as N>=(b/a)
2.
The present invention has following beneficial effect:
The present invention, to have the switched capacitor array of high speed sampling capabilities for core devices, coordinates peripheral circuit, realizes the high-speed sampling to laser echo signal, storage, integrating function.By repeatedly Emission Lasers pulse, by launching that rear received signal carries out sampling, stores at every turn, after integration, utilize the incoherence of noise between measuring for each time, improve the signal to noise ratio (S/N ratio) of final measuring-signal, thus improve the measuring distance scope of semiconductor laser range finder.
Sample circuit based on switched capacitor array has high sample rate, can reach more than 5GSPs/s.Therefore also obtain high temporal resolution and target range resolution.By the follow-up analysis and treament to sampled signal, higher range measurement accuracy can be obtained.
The present invention improves conventional semiconductors range finder using laser, utilize the signal sampling of switched capacitor array, storage, integration device, with tradition based on integral way of sampling laser ranging technique compared with, there is lower power consumption, faster processing speed, higher temporal resolution, to the power consumption reducing semiconductor laser range finder, raising distance accuracy and resolution have positive effect.
Except laser ranging field, the signal processing technology based on SCA sampling integration can also be applied to the field such as measurement, detection of other repeatable feeble signal, improves system looks signal to noise ratio (S/N ratio), has larger application prospect.
The present invention utilizes switched capacitor array Sampling techniques, realizes the sampling integration of feeble signal, utilizes the incoherence of noise, after multiple-pulse launch and accept, improves the measurement signal to noise ratio (S/N ratio) of system, thus significantly improves the measurement range of semiconductor laser range finder.The high frequency ability in sampling of Simultaneous Switching capacitor array, coordinates the follow-up signal process also concrete potentiality improving the target distance measurement precision of semiconductor laser range finder further.
Accompanying drawing explanation
Below in conjunction with the drawings and specific embodiments, the present invention is described in further detail.
Fig. 1 is the semiconductor range finder theory diagram based on SCA sampling integration.
Fig. 2 is switched capacitor array sampling integral principle schematic diagram.
Fig. 3 is Typical return signal and target range process schematic diagram.
Reference numeral in figure is expressed as:
1,4-sampling switch; 2,5-sampling capacitance; 3,6-output switch.
Embodiment
Invention thought of the present invention is: utilize the sampling integration of switched capacitor array SCA realization to feeble signal, be conducive to the signal detection ability improving range finder using laser, reduce system power dissipation, cost and system complexity simultaneously, realize the miniaturization of system, find range at a distance.
Below in conjunction with accompanying drawing, the present invention is described in detail.
With master control in the present embodiment, LD drives, LD, LD shaping is launched, echo reception, and APD amplifies, SCA samples integration and ADC, represents respectively: main control module, LD driver module, LD module, LD shaping transmitter module, echo reception module, APD amplification module, SCA samples integration module and ADC module.
Semiconductor laser range finder theory diagram involved in the present invention as shown in Figure 1.
Master control receives the order of host computer, starts range finding.Produce trigger pulse by master control, driven by laser diode LD and further Shape correction is carried out in pulse, drive LD to produce short-pulse laser, be generally between several nanosecond to few tens of nano-seconds.The Emission Lasers light beam of LD is carried out shaping by LD shaping emission coefficient, after the compression angle of divergence (being usually compressed to mrad magnitude), and illumination target.Echo reception system projects avalanche photodide APD detector photosurface, changes light signal into current signal by APD after being collected the laser signal that returned by target, and current signal is carried out high-pass filtering and after amplifying, input SCA samples integration.
SCA samples and comprises the sampling unit of quantification N in integration, and the quantity of sampling unit and the distance of target, sample frequency are relevant.Usually need to be greater than 2Rf/c, wherein R is target range, and f is sample frequency, and c is the light velocity in vacuum.Each sampling unit mainly comprises two speed-sensitive switches and a sampling capacitance.The open and close state of input position switch, determines sampling capacitance and whether receives current input signal.And the open and close Determines of output switch output signal by which sampling capacitance is produced.During input signal sampling, the open and close state of switch is controlled by a delay chain, according to time order and function order, closes successively, opens.Time delay chain is made up of 2N reverser, and each reverser by the delayed digital signal △ t/2 of input, through 2 reversers between every two capacitance switchs, can make the signal lag △ t between the adjacent two-stage sampling switch of arrival.When SCA samples after integration module receives the signal of LD driver module, produce an extremely short digit pulse, be input in time delay chain.This digit pulse is propagated in order in time delay chain, and the sampling switch of each sampling unit is closed successively, and adjacent sampling units switch-closed time is spaced apart △ t, and when switch closes, input current signal charges to the sampling capacitance of correspondence position.
Comprise the SCA array of 9 sampling units as shown in Figure 2.
For 9 sampling units, the first sampling unit is made up of sampling switch 1, sampling capacitance 2 and output switch 3.Second sampling unit is made up of sampling switch 4, sampling capacitance 5 and output switch 6.Sampling is by receiving trigger pip, and after △ t, the sampling switch 1 of the first sampling unit closes, and input current signal charges to the sampling capacitance 2 of the first sampling unit, and the electricity of capacitor memory storage is directly proportional to current input signal intensity.After the △ t time, the sampling switch 4 of the second sampling unit closes, and the sampling switch 1 of the first sampling unit closes, input current signal stops charging to the sampling capacitance 1 of the first sampling unit, then starts to charge to the sampling capacitance 5 of the second sampling unit.By that analogy, realize the once sampling to echoed signal, sampling time interval is △ t, and total sampling time is 9 △ t.If read immediately after signal sampling, then realize the unitary sampling to input signal.During multiple repairing weld, signal does not read, and the input signal of last sampling will be stored in sampling capacitance with form of electrical charges.After next trigger pulse arrives, continue same process, because the electric quantity signal in signal storage electric capacity is not read out, after current signal next time arrives, its electric current is converted to charge storage in sampling capacitance, realizes the integration of signal.
After reaching predetermined sampling number, stop Emission Lasers pulse, now SCA is converted to signal readout mode.In readout mode, shift register is driven to control the folding successively of read-out position switch by clock.When first clock arrives, the output switch 3 of the first sampling unit closes, and the output switch of other sampling units is opened, and the sampling capacitance 2 of the first sampling unit in the form of voltage, be converted to digital signal by the ADC of low frequency, realize the reading of the sampled result to the first sampling unit.Sampled voltage size is directly proportional to the electricity size stored in sampling capacitance.When second clock arrives, the output switch 6 of the second sampling unit closes, and the output switch of other sampling units is opened, and the sampling capacitance 5 of the second sampling unit in the form of voltage, be converted to digital signal by the ADC of low frequency, realize the reading of the sampled result to the second sampling unit.The like, the signal realizing all sampling units reads.
Concrete required sampling number, can determine in several ways.Can when system, estimating system minimum detectable signal amplitude, and utilize master control control SCA to carry out the sampling of several ground unrest, to determine noise signal level before measuring, according to the final required signal noise ratio level of detection, determine required sampling number.It is (S/N) that single signal to noise ratio (S/N ratio) is calculated in design
single=a, the signal to noise ratio (S/N ratio) needed for distance process process is (S/N)
object=b, then required sampling number can be taken as N>=(b/a)
2.
Also can, when measuring, adaptive approach be utilized to set.First carry out one-shot measurement, by signal noise ratio level, signal detected, if the target of discovery, then improve sampling number further, then detect, until exceed maximum can sampling number or stop after target being detected.
The extraction of target range is responsible for by master control, comprises the filtering of signal, the detection of signal, the process etc. of positional information.Typical return signal and target range acquisition of information are as shown in Figure 3.
After ADC analog to digital conversion, in echoed signal, still there is a large amount of noise signals, but due to after over-sampling integration, the signal to noise ratio (S/N ratio) of echoed signal will promote greatly.The distance signal of target obtains by multiple method, and the most succinct directly method is setting noise threshold, and the setting of usual threshold value needs according to false-alarm probability requirements set, is generally the 3-6 doubly left and right of noise mean square root value.When signal is greater than this threshold value, think to there is target, the waveform position that signal is greater than threshold value is target location, and its due in is proportional to its distance, and as namely comprised 1 target in Fig. 3, target location is in 6000 sampling point positions after x time.The time delays △ t=1ns of integral restrictor if SCA samples, then corresponding signal due in is 6000ns, and corresponding target range is R=ct/2=900m.
In order to improve range measurement accuracy further, can also adopt digitized constant fraction discriminator, shape center algorithm etc., specific algorithm can be selected according to required distance accuracy demand.For improving range measurement accuracy further, first the impact of various system delay in erasure signal process, should calibrate the signal lag of system.After obtaining echo due in, utilize simple R=2ct can obtain the range information of target.
Obviously, above-described embodiment is only for clearly example being described, and the restriction not to embodiment.For those of ordinary skill in the field, can also make other changes in different forms on the basis of the above description.Here exhaustive without the need to also giving all embodiments.And thus the apparent change of extending out or variation be still among the protection domain of the invention.
Claims (6)
1., based on a semiconductor laser range finder for switched capacitor array sampling, it is characterized in that, comprise the transmitting terminal and receiving end that are connected with main control module;
Described transmitting terminal comprises successively: LD driver module, LD module, and LD shaping transmitter module;
Described receiving end comprises successively: echo reception module, APD amplification module, and SCA samples integration module and ADC module;
Comprise the sampling unit of quantification N in described SCA sampling integration module, each sampling unit comprises sampling switch, output switch and sampling capacitance;
Digit pulse is propagated in order, and the sampling switch of each sampling unit is closed successively, and when sampling switch closes, input current signal charges to the sampling capacitance of correspondence position.
2. the semiconductor laser range finder based on switched capacitor array sampling according to claim 1, it is characterized in that, the quantity of the sampling unit that described SCA samples in integration module is greater than 2Rf/c, and wherein R is target range, f is sample frequency, and c is the light velocity in vacuum.
3. the semiconductor laser range finder based on switched capacitor array sampling according to claim 1, is characterized in that, during input signal sampling, the open and close state of sampling switch is controlled by a delay chain, according to time order and function order, closes successively, opens; Described time delay chain is made up of 2N reverser, and each reverser can, by the delayed digital signal Δ t/2 of input, through 2 reversers between every two capacitance switchs, make the signal lag between the adjacent two-stage sampling switch of arrival be Δ t.
4. the semiconductor laser range finder based on switched capacitor array sampling according to claim 3, it is characterized in that, when described SCA samples after integration module receives the signal of LD driver module, produce an extremely short digit pulse, be input in described time delay chain.
5. the semiconductor laser range finder based on switched capacitor array sampling according to claim 4, it is characterized in that, described digit pulse is propagated in order in described time delay chain, the sampling switch of each sampling unit is closed successively, adjacent sampling units sampling switch closure time is spaced apart Δ t, when sampling switch closes, input current signal charges to the sampling capacitance of correspondence position.
6. the semiconductor laser range finder based on switched capacitor array sampling according to claim 1, it is characterized in that, the defining method of sampling number is: it is (S/N) that single signal to noise ratio (S/N ratio) is calculated in design
single=a, the signal to noise ratio (S/N ratio) needed for distance process process is (S/N)
object=b, then required sampling number can be taken as N>=(b/a)
2.
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN109387819A (en) * | 2017-08-03 | 2019-02-26 | 北京北科天绘科技有限公司 | A kind of laser radar apparatus and its channel gating method |
| WO2019153303A1 (en) * | 2018-02-11 | 2019-08-15 | 深圳市大疆创新科技有限公司 | Integrated circuit and system for measuring distance |
| CN110806573A (en) * | 2019-12-13 | 2020-02-18 | 中国科学院长春光学精密机械与物理研究所 | Indoor distance measurement precision real-time measurement device for laser distance measuring machine |
| CN114034384A (en) * | 2021-11-19 | 2022-02-11 | 恒玄科技(上海)股份有限公司 | Photoelectric sampling assembly and wearable equipment |
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Application publication date: 20160316 |