CN105301023A - 一种基于x射线检测的ic料盘检测装置 - Google Patents
一种基于x射线检测的ic料盘检测装置 Download PDFInfo
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- CN105301023A CN105301023A CN201510741680.7A CN201510741680A CN105301023A CN 105301023 A CN105301023 A CN 105301023A CN 201510741680 A CN201510741680 A CN 201510741680A CN 105301023 A CN105301023 A CN 105301023A
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- plate
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
- G01N23/18—Investigating the presence of flaws defects or foreign matter
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
- G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
- G01N23/16—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the material being a moving sheet or film
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/30—Accessories, mechanical or electrical features
- G01N2223/321—Accessories, mechanical or electrical features manipulator for positioning a part
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/60—Specific applications or type of materials
- G01N2223/611—Specific applications or type of materials patterned objects; electronic devices
Abstract
Description
Claims (6)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201510741680.7A CN105301023B (zh) | 2015-11-04 | 2015-11-04 | 一种基于x射线检测的ic料盘检测装置 |
DE102016119895.1A DE102016119895A1 (de) | 2015-11-04 | 2016-10-19 | Auf Röntgen basierende IC-Materialtablett-Detektionsvorrichtung |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201510741680.7A CN105301023B (zh) | 2015-11-04 | 2015-11-04 | 一种基于x射线检测的ic料盘检测装置 |
Publications (2)
Publication Number | Publication Date |
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CN105301023A true CN105301023A (zh) | 2016-02-03 |
CN105301023B CN105301023B (zh) | 2019-01-01 |
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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CN201510741680.7A Active CN105301023B (zh) | 2015-11-04 | 2015-11-04 | 一种基于x射线检测的ic料盘检测装置 |
Country Status (2)
Country | Link |
---|---|
CN (1) | CN105301023B (zh) |
DE (1) | DE102016119895A1 (zh) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN108537727A (zh) * | 2017-03-06 | 2018-09-14 | 无锡日联科技股份有限公司 | 一种用于x射线数字成像系统的系统放大倍数高精确算法 |
CN109319460A (zh) * | 2018-10-22 | 2019-02-12 | 扬州升阳电子有限公司 | 一种电容素子铁条收料机 |
CN109697730A (zh) * | 2018-11-26 | 2019-04-30 | 深圳市德富莱智能科技股份有限公司 | 基于光学识别的ic芯片处理方法、系统及存储介质 |
Citations (16)
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CN101499430A (zh) * | 2009-02-27 | 2009-08-05 | 天津伍嘉联创科技发展有限公司 | 49s/smd晶体自动测试检测封装机 |
CN201293889Y (zh) * | 2008-11-06 | 2009-08-19 | 深圳市福和达电子设备有限公司 | 一种用于cog邦定机的移动龙门式ic拾取装置 |
CN202019002U (zh) * | 2011-03-07 | 2011-10-26 | 天津伍嘉联创科技发展有限公司 | 连续取收料盘机构 |
CN102706889A (zh) * | 2012-05-31 | 2012-10-03 | 东莞市新泽谷机械制造股份有限公司 | 料盘装卸方便的视觉检测设备 |
CN102773878A (zh) * | 2012-07-24 | 2012-11-14 | 格兰达技术(深圳)有限公司 | 一种全自动ic卷带的检测方法及其检测设备 |
CN202593898U (zh) * | 2012-05-18 | 2012-12-12 | 昆山诚业德精密模具有限公司 | 屏蔽罩平面度自动检测和载带包装一体机 |
CN202968722U (zh) * | 2013-01-03 | 2013-06-05 | 漳州市福世通电子有限公司 | 一种ic卡条带卷对卷式自动电镀镍金生产线 |
CN203077535U (zh) * | 2013-01-08 | 2013-07-24 | 刘有志 | 一种可自动放料、送料、收料的自动化设备 |
CN203281521U (zh) * | 2013-04-28 | 2013-11-13 | 嘉兴景焱智能装备技术有限公司 | Ic测试分类存储装置 |
CN203902958U (zh) * | 2014-05-28 | 2014-10-29 | 深圳华海达科技有限公司 | 一种tp/lcm模组粘贴模纸机 |
CN204045552U (zh) * | 2014-04-25 | 2014-12-24 | 苏州亿技佳机电科技有限公司 | Ic芯片自动检测封选装带机 |
CN104608015A (zh) * | 2014-12-30 | 2015-05-13 | 东莞理工学院 | 一种带机械手上下料的全自动数控外圆磨床 |
CN104858648A (zh) * | 2015-05-22 | 2015-08-26 | 广东广益科技实业有限公司 | 组装一体机 |
CN204604441U (zh) * | 2015-01-30 | 2015-09-02 | 宁波得益机电设备有限公司 | 全自动数控冲孔机 |
CN204639123U (zh) * | 2014-12-20 | 2015-09-16 | 扬州市海力精密机械制造有限公司 | 一种精整机上料装置 |
CN205139054U (zh) * | 2015-11-04 | 2016-04-06 | 无锡日联科技股份有限公司 | 一种基于x射线检测的ic料盘检测装置 |
-
2015
- 2015-11-04 CN CN201510741680.7A patent/CN105301023B/zh active Active
-
2016
- 2016-10-19 DE DE102016119895.1A patent/DE102016119895A1/de not_active Withdrawn
Patent Citations (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN201293889Y (zh) * | 2008-11-06 | 2009-08-19 | 深圳市福和达电子设备有限公司 | 一种用于cog邦定机的移动龙门式ic拾取装置 |
CN101499430A (zh) * | 2009-02-27 | 2009-08-05 | 天津伍嘉联创科技发展有限公司 | 49s/smd晶体自动测试检测封装机 |
CN202019002U (zh) * | 2011-03-07 | 2011-10-26 | 天津伍嘉联创科技发展有限公司 | 连续取收料盘机构 |
CN202593898U (zh) * | 2012-05-18 | 2012-12-12 | 昆山诚业德精密模具有限公司 | 屏蔽罩平面度自动检测和载带包装一体机 |
CN102706889A (zh) * | 2012-05-31 | 2012-10-03 | 东莞市新泽谷机械制造股份有限公司 | 料盘装卸方便的视觉检测设备 |
CN102773878A (zh) * | 2012-07-24 | 2012-11-14 | 格兰达技术(深圳)有限公司 | 一种全自动ic卷带的检测方法及其检测设备 |
CN202968722U (zh) * | 2013-01-03 | 2013-06-05 | 漳州市福世通电子有限公司 | 一种ic卡条带卷对卷式自动电镀镍金生产线 |
CN203077535U (zh) * | 2013-01-08 | 2013-07-24 | 刘有志 | 一种可自动放料、送料、收料的自动化设备 |
CN203281521U (zh) * | 2013-04-28 | 2013-11-13 | 嘉兴景焱智能装备技术有限公司 | Ic测试分类存储装置 |
CN204045552U (zh) * | 2014-04-25 | 2014-12-24 | 苏州亿技佳机电科技有限公司 | Ic芯片自动检测封选装带机 |
CN203902958U (zh) * | 2014-05-28 | 2014-10-29 | 深圳华海达科技有限公司 | 一种tp/lcm模组粘贴模纸机 |
CN204639123U (zh) * | 2014-12-20 | 2015-09-16 | 扬州市海力精密机械制造有限公司 | 一种精整机上料装置 |
CN104608015A (zh) * | 2014-12-30 | 2015-05-13 | 东莞理工学院 | 一种带机械手上下料的全自动数控外圆磨床 |
CN204604441U (zh) * | 2015-01-30 | 2015-09-02 | 宁波得益机电设备有限公司 | 全自动数控冲孔机 |
CN104858648A (zh) * | 2015-05-22 | 2015-08-26 | 广东广益科技实业有限公司 | 组装一体机 |
CN205139054U (zh) * | 2015-11-04 | 2016-04-06 | 无锡日联科技股份有限公司 | 一种基于x射线检测的ic料盘检测装置 |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN108537727A (zh) * | 2017-03-06 | 2018-09-14 | 无锡日联科技股份有限公司 | 一种用于x射线数字成像系统的系统放大倍数高精确算法 |
CN108537727B (zh) * | 2017-03-06 | 2020-07-24 | 无锡日联科技股份有限公司 | 一种用于x射线数字成像系统的系统放大倍数高精确算法 |
CN109319460A (zh) * | 2018-10-22 | 2019-02-12 | 扬州升阳电子有限公司 | 一种电容素子铁条收料机 |
CN109697730A (zh) * | 2018-11-26 | 2019-04-30 | 深圳市德富莱智能科技股份有限公司 | 基于光学识别的ic芯片处理方法、系统及存储介质 |
CN109697730B (zh) * | 2018-11-26 | 2021-02-09 | 深圳市德富莱智能科技股份有限公司 | 基于光学识别的ic芯片处理方法、系统及存储介质 |
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Publication number | Publication date |
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DE102016119895A1 (de) | 2017-05-04 |
CN105301023B (zh) | 2019-01-01 |
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PE01 | Entry into force of the registration of the contract for pledge of patent right |
Denomination of invention: IC material plate detection device based on X-ray detection Effective date of registration: 20191024 Granted publication date: 20190101 Pledgee: Agricultural Bank of China Limited by Share Ltd Wuxi science and Technology Branch Pledgor: WUXI UNICOMP TECHNOLOGY CO., LTD. Registration number: Y2019990000348 |
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Date of cancellation: 20210624 Granted publication date: 20190101 Pledgee: Agricultural Bank of China Limited by Share Ltd. Wuxi science and Technology Branch Pledgor: WUXI UNICOMP TECHNOLOGY Co.,Ltd. Registration number: Y2019990000348 |
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PC01 | Cancellation of the registration of the contract for pledge of patent right |