CN105223110B - A kind of microscope locating and tracking imaging method, device and urinal system - Google Patents
A kind of microscope locating and tracking imaging method, device and urinal system Download PDFInfo
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Abstract
The embodiment of the invention discloses a kind of microscope locating and tracking imaging methods, including step：Analysis sequentially carries out taking pictures by low power lens to the sample of focal plane obtains multiple low-power field pictures, determines wherein there is the low-power field picture of target particles；Each low-power field picture there are target particles is divided into multiple high power field of view regions, acquisition is all, and there are the high power field of view region of target particles, selected target high power field therein region and the location informations for obtaining each target high power field region；It according to the location information in each target high power field region, is taken pictures at the region of corresponding position on the sample of focal plane using high power lens, obtains high power field of view picture.The embodiment of the present invention further correspondingly discloses a kind of microscope locating and tracking imaging device.Implement the embodiment of the present invention, pattern detection speed can be improved, and ensures the accuracy of Sample result as possible.
Description
Technical field
The present invention relates to vitro diagnostic techniques field more particularly to a kind of microscope locating and tracking imaging method, device and
Urinal system.
Background technology
Extracorporeal diagnostic instrument（Such as full automatic urine sediment analytic system）Middle extensive use microscopic system is in count range
Focussing plane sample particle collection image, pass through low-powered microscope（Hereinafter referred to as low power lens）Target particles are determined
Position, and then in high-power microscope（Hereinafter referred to as high power lens）Under take pictures into line trace to target particles.
In existing technology, a kind of mode of image is acquired by high power lens is：To the region containing target particles all with
Track is taken pictures.But there are shortcomings for this mode, due to needing to all region progress Image Acquisition, therefore Sample
Longer time can be expended in the process, and the process of taking pictures of a usual sample can take tens of minutes, to influence Sample
Rate.
In existing technology, the another way of image mode is acquired by high power lens is：From the region containing target particles
It randomly selects fixed number tracking to take pictures, such acquisition image mode can save the time, but there are not for this mode
Foot place, due to being to randomly select path of taking pictures from the region containing target particles, can not determine the selection to target particles
Maximum statistic is reached, certain harmful effect can be generated to the accuracy of sample results.
Therefore be badly in need of being improved existing two ways, while ensureing the accuracy of Sample result, to carry
High pattern detection speed.
Invention content
The technical problem to be solved of the embodiment of the present invention is, provide a kind of microscope locating and tracking imaging method,
Device and urinal system can improve pattern detection speed, and ensure the accuracy of Sample result as possible.
In order to solve the above-mentioned technical problem, an embodiment of the present invention provides a kind of microscope locating and tracking imaging method, packets
Include following steps：
Analysis sequentially carries out taking pictures by low-powered microscope to the sample of focal plane obtains multiple low-power field pictures,
Determine wherein there is the low-power field picture of target particles, wherein the type and quantity of the analysis based on target particles
To realize；
Each low-power field picture there are target particles is divided into multiple high power field of view regions, obtains all deposit
In the high power field of view region of target particles, selected target high power field therein region simultaneously obtains each target high power field region
Location information；
According to the location information in each target high power field region, using high-power microscope on the sample of focal plane
It takes pictures at the region of corresponding position, obtains high power field of view picture.
It is wherein, described that each low-power field picture there are target particles is divided into multiple high power field of view regions,
Obtain all there are the high power field of view region of target particles, it is high that selected target high power field therein region simultaneously obtains each target
The step of location information of times area of visual field, further comprises：
According to the multiplying power relationship of the low-powered microscope and the high-power microscope, there are the low powers of target particles by each
Mirror visual field picture is divided into multiple high power field of view regions；
Identify the high power field of view region there are target particles in each low-power field picture there are target particles,
And obtain its location information；
The selected target high power field region from all high power field of view regions there are target particles, and obtain each mesh
The location information of absolute altitude times area of visual field.
Wherein, the selected target high power field region from all high power field of view regions there are target particles,
And the step of obtaining the location information in each target high power field region, further comprises：
All sums there are the high power field of view region of target particles are taken pictures with a preset high power lens maximum
Number is compared；
If the sum is taken pictures number less than or equal to the maximum, all there are the high powers of target particles by described
Mirror area of visual field is chosen to be target high power field region, and obtains the location information in each target high power field region；
If the sum is taken pictures number more than the maximum, there are the high power field of view regions of target particles to described
According to target the quantity of particle is ranked up from big to small, and the selected maximum in forefront is taken pictures, and there are the height of target particles for number
Times mirror area of visual field is target high power field region, and obtains the location information in each target high power field region.
Wherein, the maximum take pictures number less than the focal plane all high power field of view regions sum.
Wherein, the location information is the coordinates matrix information in each high power field of view region.
Correspondingly, the another aspect of the embodiment of the present invention additionally provides a kind of microscope locating and tracking imaging device, packet
It includes：
Low-power field picture analyzing unit sequentially carries out the sample of focal plane by low-powered microscope for analyzing
It takes pictures and obtains multiple low-power field pictures, determine wherein there is the low-power field picture of target particles, wherein described point
Type and quantity based on target particles are analysed to realize；
Target high power field area determination unit, for there are targets by each determined by the low power lens photographing unit
The low-power field picture of particle is divided into multiple high power field of view regions, and acquisition is all, and there are the high power field of view of target particles
Region, selected target high power field therein region and the location information for obtaining each target high power field region；
High power lens photographing unit, each target high power for having selected unit to determine according to target high power field region regard
The location information in wild region is taken pictures at the region of corresponding position on the sample of focal plane using high-power microscope, is obtained
Obtain high power field of view picture.
Wherein, the target high power field area determination unit further comprises：
Division unit, for there are the low-power fields of target particles by each determined by the low power lens photographing unit
Picture is divided into multiple high power field of view regions；
Recognition unit, goes out in each low-power field picture there are target particles that there are the height of target particles for identification
Times mirror area of visual field, and obtain its location information；
Sequencing unit, for it is described it is all there are the high power field of view region of target particles according to target particle quantity from
Small be ranked up is arrived greatly；
Selected unit, the selected target high power field region from all high power field of view regions there are target particles,
And obtain the location information in each target high power field region.
Wherein, the selected unit further comprises：
Comparing unit, by it is described it is all there are the high power field of view region of target particles sum with a preset high power lens
Maximum number of taking pictures is compared；
Comparison result processing unit is taken pictures number if the sum is less than or equal to the maximum, described will be owned
There are the high power field of view regions of target particles to be chosen to be target high power field region, and obtains each target high power field region
Location information；It takes pictures number, selectes after sequencing unit sequence, in forefront if the sum is more than the maximum
Take pictures number of maximum there are the high power field of view region of target particles be target high power field region, and it is high to obtain each target
The location information of times area of visual field.
Wherein, the maximum take pictures number less than the focal plane all high power field of view regions sum.
Wherein, the location information is the coordinates matrix information in each high power field of view region.
Correspondingly, the embodiment of the present invention in another aspect, also providing a kind of urinal system comprising have low power aobvious
Micro mirror and high-power microscope, and further comprise microscope locating and tracking imaging device above-mentioned.
Implement the embodiment of the present invention, has the advantages that：
In embodiments of the present invention, requirement that can be according to user to Check-Out Time pre-sets the maximum of high power lens and claps
According to number.By each high power field of view region number containing target particles to being navigated under low power lens number, determine need into
The high power field of view region taken pictures of row, then use high power lens in focal plane at these corresponding area of visual field into line trace
It takes pictures, this ensure that the most region of selection target numbers of particles carries out statistics of taking pictures within the limited time, is clapped saving
According to time while, the accuracy that ensure that Sample of maximum possible.
Description of the drawings
In order to more clearly explain the embodiment of the invention or the technical proposal in the existing technology, to embodiment or will show below
There is attached drawing needed in technology description to be briefly described, it should be apparent that, the accompanying drawings in the following description is only this
Some embodiments of invention, for those of ordinary skill in the art, without having to pay creative labor, according to
These attached drawings obtain other attached drawings and still fall within scope of the invention.
Fig. 1 is a kind of main flow signal of one embodiment of microscope locating and tracking imaging method provided by the invention
Figure；
Fig. 2 is a kind of structural schematic diagram of one embodiment of microscope locating and tracking imaging device provided by the invention；
Fig. 3 is the structural schematic diagram of target high power field area determination unit in Fig. 2；
Fig. 4 is the structural schematic diagram that unit is selected in Fig. 3；
Fig. 5 is the schematic diagram that a focussing plane is taken pictures by low power lens in one embodiment of the present of invention；
Fig. 6 is the schematic diagram for a low-power field picture being divided into Fig. 5 multiple high power field of view regions；
Fig. 7 is the high power field of view area schematic in all low-power field pictures in Fig. 5.
Specific implementation mode
In order to make the purpose , technical scheme and advantage of the present invention be clearer, with reference to the accompanying drawings and embodiments, right
The present invention is further elaborated.It should be appreciated that the specific embodiments described herein are merely illustrative of the present invention, and
It is not used in the restriction present invention.
As shown in Figure 1, showing a kind of master of microscope locating and tracking imaging method one embodiment provided by the invention
Flow chart.In this embodiment, this approach includes the following steps：
Step S10, analysis sequentially carries out taking pictures by low power lens to the sample of focal plane obtains multiple low-power fields
Picture determines wherein there is the low-power field picture of target particles；
It is understood that the analysis is generally based on type and the quantity of target particles to realize.When all
Target particles are not contained in low-power field picture, then the flow can terminate, that is, do not have to carry out subsequent high power lens with
Track is taken pictures, and photographic analysis process is completed.
Each low-power field picture there are target particles is divided into multiple high power field of view regions, obtained by step S12
Must be all there are the high power field of view region of target particles, selected target high power field therein region simultaneously obtains each target high power
The location information of area of visual field；
Specifically, step S12 further comprises：
According to the multiplying power relationship of low power lens and high power lens, each low-power field picture there are target particles is divided into
Multiple high power field of view regions；
Identify the high power field of view region there are target particles in each low-power field picture there are target particles,
And obtain its location information；
The selected target high power field region from all high power field of view regions there are target particles, and obtain each mesh
The location information of absolute altitude times area of visual field.
Step S14, according to the location information in each target high power field region, using high power lens on the sample of focal plane
It takes pictures at the region of corresponding position, obtains high power field of view picture.
Specifically, step S14 further comprises：
All sums there are the high power field of view region of target particles are taken pictures number with a preset high power lens maximums
It is compared；
If sum is taken pictures number less than or equal to maximum, there are the choosings of the high power field of view region of target particles by all
It is set to target high power field region, and obtains the location information in each target high power field region；
If sum is taken pictures number more than maximum, to there are the high power field of view region of target particles according to target particles
Quantity is ranked up from big to small, and the selected maximum in forefront is taken pictures, and there are the high power field of view regions of target particles for number
For target high power field region, and the location information in each target high power field region is obtained, for example, in one example, it is assumed that
Sum be 20, and maximum take pictures number be 15, then by 20 high power field of view regions according to target particle quantity from big to small into
Row sequence, selects stand out 15 high power field of view areas as target high power field region.
Wherein, maximum sum of the number less than all high power field of view regions of focal plane of taking pictures.
Wherein, location information is the coordinates matrix information in each high power field of view region, for example, each high power field of view area
The abscissa in domain and the value range of ordinate.It is understood that other modes can also be used in other examples
It is positioned.
As shown in Figures 2 to 4, a kind of microscope locating and tracking imaging device one embodiment provided by the invention is shown
Structural schematic diagram.In this embodiment, the microscope locating and tracking imaging device 1, including：
Low-power field picture analyzing unit 10 sequentially claps the sample of focal plane by low power lens for analyzing
According to multiple low-power field pictures are obtained, determine wherein there is the low-power field picture of target particles；
Target high power field area determination unit 12, for there are targets by each determined by low power lens photographing unit 10
The low-power field picture of particle is divided into multiple high power field of view regions, and acquisition is all, and there are the high power field of view of target particles
Region, selected target high power field therein region and the location information for obtaining each target high power field region；
High power lens photographing unit 14, each target high power for being determined according to target high power field area determination unit 12 regard
The location information in wild region is taken pictures on the sample of focal plane at the region of corresponding position using high power lens, is obtained high
Times mirror visual field picture.
Wherein, target high power field area determination unit 12 further comprises：
Division unit 120, for there are the low-power fields of target particles by each determined by low power lens photographing unit
Picture is divided into multiple high power field of view regions；
Recognition unit 122, goes out in each low-power field picture there are target particles that there are target particles for identification
High power field of view region, and obtain its location information；
Sequencing unit 124, for it is all there are the high power field of view region of target particles according to target particle quantity from
Small be ranked up is arrived greatly；
Selected unit 126, the selected target high power field area from all high power field of view regions there are target particles
Domain, and obtain the location information in each target high power field region.
Specifically, unit 126 is selected to further comprise：
Comparing unit 127, by it is all there are the high power field of view region of target particles sum with a preset high power lens
Maximum number of taking pictures is compared；
Comparison result processing unit 128, if sum is taken pictures number less than or equal to maximum, there are targets by all
The high power field of view region of grain is chosen to be target high power field region, and obtains the location information in each target high power field region；
It takes pictures number if sum is more than maximum, after selecting ranked unit sequence, the number of taking pictures of the maximum in forefront exists
The high power field of view region of target particles is target high power field region, and obtains the position letter in each target high power field region
Breath.
Wherein, maximum sum of the number less than all high power field of view regions of focal plane of taking pictures.
Wherein, location information is the coordinates matrix information in each high power field of view region.
Further, the embodiment of the present invention also provides a kind of urinal system comprising have low-powered microscope and
High-power microscope, and further comprise the aforementioned microscope locating and tracking imaging device such as Fig. 2 to Fig. 4 introductions, it is specific thin
Section can refer to the aforementioned introduction to Fig. 2 to Fig. 4, herein without repeating.
For the ease of to the present invention carry out deeper into understanding, an example in following combinations 5 to Fig. 6 is to the present invention's
Method illustrates.
Wherein, Fig. 5 shows a focussing plane schematic diagram.According to the multiplying power of low power endoscope objective lens, when low power lens is taken pictures model
It encloses when covering the entire focussing plane, then entire focussing plane includes L low-power field, and in Figure 5, which is 10.I.e.
It is sequentially taken pictures to the appearance of focal plane using low power lens, L can be obtained（I.e. 10）Low-power field picture；
Fig. 6 is shown, a low-power field picture is divided into the schematic diagram in multiple high power field of view regions.Wherein,
According to the multiplying power of high power endoscope objective lens, when high power lens take pictures range to cover a low power lens focus field when, then each low power lens
Area of visual field includes H high power field of view, and in Fig. 6, which is 12, i.e. a low-power field region, which can pass through, claps H and open high powers
Mirror visual field picture is completely covered, it is possible to understand that, correspond to the multiplying power of different high power lenses, which is different.
In Fig. 7, according to the differentiation to the high low-power field of focussing plane, when high power lens range of taking pictures will cover entire focusing
When plane, then whole region includes L*H high power field of view, i.e., in the present example, needs to use 120 high power field of view pictures
Entire focal plane can be covered.
And the method provided according to embodiments of the present invention, user can be arranged high power lens maximum before starting inspection and take pictures
Number N (0 < N≤L*H）, for example, number N that the maximum can be taken pictures in one example is set as 15, such high power lens
When tracking is taken pictures, can take pictures number as high power lens actual tracking according to the number of taking pictures of setting, it is ensured that when limited
The most target visual field of interior selection numbers of particles carries out statistics of taking pictures.Then the method applied in the present invention includes the following steps：
First, it is taken pictures to entire focussing plane using low power lens, then collected low-power field figure under low power lens
Piece is L（10）, after the completion of low power lens is taken pictures, by the analysis to low-power field picture, it can filter out in which picture
It containing target particles, can know from Fig. 7, there are target particles in 10 low-power field pictures.
Then, target particles are decomposed in all high power field of view of entire focussing plane, and calculates each high power lens
Target particles number included in the visual field.Specifically, the first, the 8th high power field of view area in first low visual field picture
Contain 6 and 7 target particles in domain respectively；Similarly contain 5 in the 8th high area of visual field in second low visual field picture
A target particles；Contain 6 and 8 mesh respectively in the first, the 8th high power field of view region in the low visual field picture of third
Mark particle.Successively, the information in all high power field of view regions comprising target particles can be obtained.It counts and shares 20 and include
There are the high power field of view region of target particles, and each particular number of the target particles contained by high power field of view region.
Entire focussing plane is included to the high power field of view sum of target particles number（20）With the high power lens of user setting
Maximum is taken pictures number N（15）It is compared.Since sum is taken pictures number more than pre-set high power lens maximum, then deposited to all
In the high power field of view region of target particles, according to target the quantity of particle is ranked up from big to small, is selected and is wherein in forefront
It is N number of（15）There are the high power field of view regions of target particles as target high power field of view region, and obtains corresponding position
Confidence ceases, wherein the location information can be the coordinates matrix information in each high power field of view region, and for example, each high power lens regards
The abscissa in wild region and the range of ordinate；Alternatively, each high power field of view region can be numbered in advance, and store
The coordinates matrix information in each high power field of view region then can be very as long as obtaining the number information in high power field of view region
It is readily available its corresponding coordinates matrix information.
Then, N number of according to this（15）The location information in target high power field region, using high power lens in focal plane
It takes pictures at the region of corresponding position on sample, obtains N（15）High power field of view picture.Then subsequent statistics is carried out
Processing work.
Implement the embodiment of the present invention, there is following advantageous effect：
In embodiments of the present invention, requirement that can be according to user to Check-Out Time pre-sets the maximum of high power lens and claps
According to number.By each high power field of view region number containing target particles to being navigated under low power lens number, determine need into
The high power field of view region taken pictures of row, then use high power lens in focal plane at these corresponding area of visual field into line trace
It takes pictures, this ensure that the most region of selection target numbers of particles carries out statistics of taking pictures within the limited time, is clapped saving
According to time while, the accuracy that ensure that Sample of maximum possible.
One of ordinary skill in the art will appreciate that implement the method for the above embodiments be can be with
Instruct relevant hardware to complete by program, program can be stored in a computer read/write memory medium, deposit
Storage media, such as ROM/RAM, disk, CD.
The above is merely preferred embodiments of the present invention, be not intended to limit the invention, it is all the present invention spirit and
All any modification, equivalent and improvement made by within principle etc., should all be included in the protection scope of the present invention.
Claims (7)
1. a kind of microscope locating and tracking imaging method, which is characterized in that include the following steps：
Analysis sequentially carries out taking pictures by low-powered microscope to the sample of focal plane obtains multiple low-power field pictures, determines
Wherein there is the low-power field picture of target particles, wherein type and quantity of the analysis based on target particles are come real
It is existing；
Each low-power field picture there are target particles is divided into multiple high power field of view regions, acquisition is all, and there are mesh
Mark the high power field of view region of particle, selected target high power field therein region and the position for obtaining each target high power field region
Confidence ceases；
It is corresponding on the sample of focal plane using high-power microscope according to the location information in each target high power field region
It takes pictures at the region of position, obtains high power field of view picture；
Wherein, described that each low-power field picture there are target particles is divided into multiple high power field of view regions, it obtains
It is all there are the high power field of view region of target particles, selected target high power field therein region simultaneously obtains each target high power and regards
The step of location information in wild region, further comprises：
According to the multiplying power relationship of the low-powered microscope and the high-power microscope, each low power lens there are target particles is regarded
Wild picture is divided into multiple high power field of view regions；
It identifies the high power field of view region there are target particles in each low-power field picture there are target particles, and obtains
Obtain its location information；
The selected target high power field region from all high power field of view regions there are target particles, and it is high to obtain each target
The location information of times area of visual field；Wherein, the selected target from all high power field of view regions there are target particles
High power field region, and the step of obtaining the location information in each target high power field region further comprises：
All sums there are the high power field of view region of target particles are taken pictures number with a preset high power lens maximum
It is compared；
If the sum is taken pictures number less than or equal to the maximum, all high power lenses there are target particles are regarded
Wild region is chosen to be target high power field region, and obtains the location information in each target high power field region；
If the sum is taken pictures number more than the maximum, mesh is pressed to the high power field of view region there are target particles
The quantity of mark particle is ranked up from big to small, and the selected maximum in forefront is taken pictures, and there are the high power lenses of target particles for number
Area of visual field is target high power field region, and obtains the location information in each target high power field region.
2. the method as described in right wants 1, which is characterized in that maximum number of taking pictures is all high less than the focal plane
The sum of times mirror area of visual field.
3. such as claim 1 to 2 any one of them method, which is characterized in that the location information is each high power field of view area
The coordinates matrix information in domain.
4. a kind of microscope locating and tracking imaging device, which is characterized in that including：
Low-power field picture analyzing unit sequentially takes pictures to the sample of focal plane by low-powered microscope for analyzing
Multiple low-power field pictures are obtained, determine wherein there is the low-power field picture of target particles, wherein the analysis base
It is realized in the type and quantity of target particles；
Target high power field area determination unit, for there are target particles by each determined by the low power lens photographing unit
Low-power field picture be divided into multiple high power field of view regions, obtain that all there are the high power field of view areas of target particles
Domain, selected target high power field therein region and the location information for obtaining each target high power field region；
High power lens photographing unit, for having selected each target high power field area that unit determines according to target high power field region
The location information in domain is taken pictures on the sample of focal plane at the region of corresponding position using high-power microscope, is obtained high
Times mirror visual field picture；
Wherein, the target high power field area determination unit further comprises：
Division unit, for there are the low-power field pictures of target particles by each determined by the low power lens photographing unit
It is divided into multiple high power field of view regions；
Recognition unit, goes out in each low-power field picture there are target particles that there are the high power lenses of target particles for identification
Area of visual field, and obtain its location information；
Sequencing unit, for it is described it is all there are the high power field of view region of target particles according to target particle quantity from greatly to
It is small to be ranked up；
Selected unit, the selected target high power field region from all high power field of view regions there are target particles, and obtain
Obtain the location information in each target high power field region；Wherein, the selected unit further comprises：
Comparing unit, all there are the sum in the high power field of view region of target particles and a preset high power lens are maximum by described
Number of taking pictures is compared；
Comparison result processing unit, if the sum is taken pictures number less than or equal to the maximum, by all presence
The high power field of view region of target particles is chosen to be target high power field region, and obtains the position in each target high power field region
Information；It takes pictures number if the sum is more than the maximum, selectes after sequencing unit sequence, be in forefront most
Big number of taking pictures is target high power field region there are the high power field of view region of target particles, and obtains each target high power and regard
The location information in wild region.
5. device as claimed in claim 4, which is characterized in that maximum number of taking pictures is all less than the focal plane
The sum in high power field of view region.
6. such as claim 4-5 any one of them devices, which is characterized in that the location information is each high power field of view region
Coordinates matrix information.
7. a kind of urinal system comprising have low-powered microscope and high-power microscope, which is characterized in that further packet
It includes such as claim 4-6 any one of them microscope locating and tracking imaging devices.
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| CN110836891A (en) * | 2018-08-17 | 2020-02-25 | 湖南爱威医疗科技有限公司 | Method, device and equipment for realizing rapid microscopic examination and computer readable storage medium |
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