CN110836891A - Method, device and equipment for realizing rapid microscopic examination and computer readable storage medium - Google Patents
Method, device and equipment for realizing rapid microscopic examination and computer readable storage medium Download PDFInfo
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Abstract
The invention discloses a method, a device and equipment for realizing rapid microscopic examination and a computer readable storage medium, wherein the method comprises the steps of scanning a sample to be detected through a low-power objective lens in a microscope lens and collecting a plurality of low-power images; identifying each low-power image, and screening out the low-power image including the target to be detected as a target image; determining target position information corresponding to a target to be detected in a target image; and controlling the microscope lens to move relative to the objective table according to the target position information in an X-Y-Z three-axis simultaneous movement mode, and focusing a high-power objective lens in the microscope lens at a target position corresponding to the target position information so as to perform high-power image acquisition on the corresponding target to be detected through the high-power objective lens. The high-power objective lens can be rapidly moved to the position of the target to be detected in the microscopic examination process, the moving time and the microscopic examination time are shortened, and the microscopic examination efficiency of the whole machine is improved.
Description
Technical Field
The embodiment of the invention relates to the technical field of microscopic examination, in particular to a method, a device and equipment for realizing rapid microscopic examination and a computer readable storage medium.
Background
Microscopic examination is short for microscopic examination, and is that a specimen to be detected is sampled and filmed, and is observed, analyzed and judged under a microscope. Human excreta, secretions, exfoliated cells or human tissues, animal tissues, and even plant cells can be used as objects for microscopic examination.
In the microscopic examination and identification process, a low-power objective lens is usually adopted to scan a sample, then a target to be detected in an image scanned by the low-power objective lens is tracked and identified through a high-power objective lens, and in the process of tracking the target to be detected, a microscope needs to be moved to the position of the target to be detected. In the prior art, the moving mode of the microscope is that the lens moves relative to the objective table in a mode of moving one by one in the X/Y/Z direction, namely, the objective table is moved to enable the target to be detected to move to the corresponding xy coordinate position one by one in the X/Y direction, and the lens is moved to enable the high-power objective lens to move to the corresponding Z coordinate position in the vertical direction to be marked.
In view of the above, how to provide a method, an apparatus, a device and a computer readable storage medium capable of implementing fast microscopy becomes a problem to be solved by those skilled in the art at present.
Disclosure of Invention
The embodiment of the invention aims to provide a method, a device, equipment and a computer readable storage medium for realizing rapid microscopic examination, which can rapidly move a high-power objective lens to the position of a target to be detected in the microscopic examination process, shorten the time consumed by movement and the microscopic examination time, and are beneficial to improving the microscopic examination efficiency of the whole machine.
In order to solve the above technical problem, an embodiment of the present invention provides a method for implementing quick microscopic examination, including:
scanning a sample to be detected through a low-power objective lens in a microscope lens, and collecting a plurality of low-power images;
identifying each low-power image, and screening out the low-power image comprising the target to be detected as a target image;
determining target position information corresponding to a target to be detected in the target image;
and controlling the microscope lens to move relative to the objective table according to the target position information in an X-Y-Z three-axis simultaneous movement mode, and focusing a high-power objective lens in the microscope lens at a target position corresponding to the target position information so as to perform high-power image acquisition on the corresponding target to be detected through the high-power objective lens.
Optionally, the step of controlling the microscope lens to move relative to the stage in an X-Y-Z three-axis simultaneous movement manner according to the target position information, and focusing the high power objective lens in the microscope lens on the target position corresponding to the target position information includes:
and controlling the microscope lens to move to a target position corresponding to the target position information in an X-Y-Z three-axis simultaneous movement mode relative to the objective table according to the target position information, and simultaneously controlling the microscope lens to be switched from the low-power objective lens to the high-power objective lens so that the high-power objective lens is focused at the target position corresponding to the target position information.
Optionally, the process of controlling the microscope lens to move to the target position corresponding to the target position information according to the target position information in an X-Y-Z three-axis simultaneous movement manner includes:
and controlling the microscope lens to move to an xy coordinate in the target position information along a straight line on an X-Y plane relative to the objective table according to the target position information, and controlling the microscope lens to move to a Z coordinate in the position information in the Z direction relative to the objective table.
Optionally, the sample to be detected is scanned by a low power objective lens in the microscope lens, and the process of collecting a plurality of low power images is as follows:
receiving an image acquisition instruction, wherein the image acquisition instruction comprises a preset scanning mode and scanning times;
and controlling a low-power objective lens in the microscope lens to scan the sample to be detected according to the preset scanning mode and the scanning times according to the image acquisition instruction so as to acquire a preset number of low-power images, wherein the preset number is equal to the preset times.
Optionally, after determining the target position information corresponding to the target to be detected in the target image, the method further includes:
establishing a corresponding relation table of the target to be detected and the target position information according to the target to be detected and the corresponding target position information thereof;
before the controlling the microscope lens to move relative to the object stage according to the target position information in an X-Y-Z three-axis simultaneous movement manner, the method further includes:
and acquiring the target position information from the corresponding relation table.
The embodiment of the invention correspondingly provides a device for realizing quick microscopic examination, which comprises:
the acquisition module is used for scanning a sample to be detected through a low-power objective lens in a microscope lens and acquiring a plurality of low-power images;
the identification module is used for identifying each low-power image and screening out the low-power image including the target to be detected as a target image;
the determining module is used for determining target position information corresponding to the target to be detected in the target image;
and the moving module is used for controlling the microscope lens to move relative to the objective table according to the target position information in an X-Y-Z three-axis simultaneous movement mode, and focusing a high-power objective lens in the microscope lens at a target position corresponding to the target position information so as to perform high-power image acquisition on the corresponding target to be detected through the high-power objective lens.
Optionally, the moving module is specifically configured to control the microscope lens to move to a target position corresponding to the target position information according to the target position information in an X-Y-Z three-axis simultaneous movement manner with respect to the stage, and control the microscope lens to be switched from the low-power objective lens to the high-power objective lens, so that the high-power objective lens is focused on the target position corresponding to the target position information.
Optionally, the collecting module includes:
the device comprises a receiving unit, a processing unit and a processing unit, wherein the receiving unit is used for receiving an image acquisition instruction, and the image acquisition instruction comprises a preset scanning mode and scanning times;
and the scanning unit is used for controlling the low-power objective lens in the microscope lens to scan the sample to be detected according to the preset scanning mode and the scanning times according to the image acquisition instruction so as to acquire a preset number of low-power images, wherein the preset number is equal to the preset times.
The embodiment of the invention also provides equipment for realizing the quick microscopic examination, which comprises:
a memory for storing a computer program;
and the processor is used for realizing the steps of the method for realizing the quick microscopic examination when the computer program is executed.
The embodiment of the present invention further provides a computer-readable storage medium, where a computer program is stored on the computer-readable storage medium, and when the computer program is executed by a processor, the steps of the method for implementing fast microscopic examination are implemented as described above.
The embodiment of the invention provides a method, a device, equipment and a computer readable storage medium for realizing rapid microscopic examination, wherein the method comprises the following steps: scanning a sample to be detected through a low-power objective lens in a microscope lens, and collecting a plurality of low-power images; identifying each low-power image, and screening out the low-power image including the target to be detected as a target image; determining target position information corresponding to a target to be detected in a target image; and controlling the microscope lens to move relative to the objective table according to the target position information in an X-Y-Z three-axis simultaneous movement mode, and focusing a high-power objective lens in the microscope lens at a target position corresponding to the target position information so as to perform high-power image acquisition on the corresponding target to be detected through the high-power objective lens.
Therefore, in the microscopic examination process, a plurality of low-power images are acquired after a sample to be detected is scanned through the low-power objective lens, a target image comprising a target to be detected is screened out from each low-power image, target position information of the target to be detected is identified from the target image, and when the target to be detected is tracked through the high-power objective lens, the microscope lens can be controlled to move relative to the objective table in an X-Y-Z three-axis simultaneous movement mode according to the target position information, and finally the high-power objective lens in the microscope lens is focused at a target position corresponding to the target position information. In the microscopic examination process, the high-power objective lens can be rapidly moved to the position of the target to be detected, the moving time and the microscopic examination time are shortened, and the microscopic examination efficiency of the whole machine is improved.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings needed in the prior art and the embodiments will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings without creative efforts.
Fig. 1 is a schematic flowchart of a method for implementing quick microscopic examination according to an embodiment of the present invention;
fig. 2 is a schematic flowchart of another method for implementing fast microscopic examination according to an embodiment of the present invention;
FIG. 3 is a schematic flow chart of S210 in FIG. 2;
fig. 4 is a schematic structural diagram of an apparatus for implementing quick microscopic examination according to an embodiment of the present invention;
fig. 5 is a schematic structural diagram of an apparatus for implementing quick microscopic examination according to an embodiment of the present invention.
Detailed Description
The embodiment of the invention provides a method, a device and equipment for realizing rapid microscopic examination and a computer readable storage medium, which can rapidly move a high-power objective to the position of a target to be detected in the microscopic examination process, shorten the time consumed by movement and the microscopic examination time, and are beneficial to improving the microscopic examination efficiency of the whole machine.
In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are some, but not all, embodiments of the present invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Referring to fig. 1, fig. 1 is a schematic flow chart illustrating a method for implementing quick microscopic examination according to an embodiment of the present invention. The method comprises the following steps:
s110: scanning a sample to be detected through a low-power objective lens in a microscope lens, and collecting a plurality of low-power images;
specifically, the method is applied to a microscopic examination recognition device, when a sample to be detected is detected and recognized, firstly, the sample to be detected needs to be subjected to low power amplification through a low power objective lens, scanning is performed after the low power amplification, and a plurality of low power images are acquired in the scanning process, namely, one low power image is acquired every time scanning is performed.
S120: identifying each low-power image, and screening out the low-power image including the target to be detected as a target image;
after acquiring a plurality of low-power images, identifying a low-power image including an object to be detected from each low-power image, and using the low-power image including the object to be detected as a target image, wherein the number of the identified low-power images including the object to be detected may be multiple, and the type of each object to be detected may be different. S130: determining target position information corresponding to a target to be detected in a target image;
after the target image including the target to be detected is recognized, the target position information (i.e., XYZ-axis coordinate information) of the target to be detected corresponding thereto is marked from the target image.
It should be noted that, when there are a plurality of target images, the position information of the target to be detected in each target image may be confirmed one by one, and the target position information corresponding to the target to be detected in each target image is recorded.
S140: and controlling the microscope lens to move relative to the objective table according to the target position information in an X-Y-Z three-axis simultaneous movement mode, and focusing a high-power objective lens in the microscope lens at a target position corresponding to the target position information so as to perform high-power image acquisition on the corresponding target to be detected through the high-power objective lens.
It should be noted that after the target position information of the target to be detected in the target image is determined, the target to be detected is tracked through the high-power objective lens, and high-power image acquisition is performed on the corresponding target to be detected, that is, the high-power image of the target to be detected is acquired, at this time, the high-power objective lens in the microscope lens needs to be moved to the position corresponding to the target position information, and the high-power objective lens is focused at the position.
Specifically, when the high power objective lens is moved to the position of the target to be detected, the microscope lens is moved relative to the objective table, and the movement mode is that the microscope lens is moved in a way of being in alignment with three axes X-Y-Z, that is, on one hand, the specimen on the objective table is controlled to move to the XY coordinate in the target position information corresponding to the target to be detected on the X-Y plane, on the other hand, the microscope lens is controlled to move to the Z coordinate in the target position information corresponding to the target to be detected on the Z axis in the vertical direction, and the movement of the XY plane and the movement in the Z direction are performed simultaneously, so that the microscope lens is rapidly moved to the position of the target to be detected.
It should be further noted that, when identifying the target to be detected, the objective lens needs to be low-power magnified and acquire the low-power image, and then the objective lens needs to be high-power tracked and identified to the target image including the target to be detected, so that when the microscope lens is controlled to move relative to the stage in the way of three-axis simultaneous movement of X-Y-Z, the microscope lens needs to be switched from the low-power objective lens to the high-power objective lens, so that the high-power objective lens is quickly focused on the target position corresponding to the target position information.
Specifically, when the microscope lens is switched from the low-power objective lens to the high-power objective lens, the switching from the low-power objective lens to the high-power objective lens can be realized by rotating the microscope lens, the microscope lens can be switched from the low-power objective lens to the high-power objective lens after being controlled to move to a position corresponding to target position information in an X-Y-Z three-axis flush manner relative to the objective table, or the microscope lens can be rotated to be switched from the low-power objective lens to the high-power objective lens while being controlled to move to a position corresponding to the target position information in an X-Y-Z three-axis flush manner relative to the objective table, the microscope lens can be switched from the low-power objective lens to the high-power objective lens when being controlled to move to a position corresponding to the target position information in an X-Y-Z three-axis flush manner relative to the objective table, or before the microscope lens moves to the position corresponding to the target position information relative to the objective table in an X-Y-Z three-axis simultaneous movement mode, the microscope lens rotates to the high power objective lens to complete lens switching, so that the high power objective lens is focused on the target position corresponding to the target position information.
Therefore, in the microscopic examination process, a plurality of low-power images are acquired after a sample to be detected is scanned through the low-power objective lens, a target image comprising a target to be detected is screened out from each low-power image, target position information of the target to be detected is identified from the target image, and when the target to be detected is tracked through the high-power objective lens, the microscope lens can be controlled to move relative to the objective table in an X-Y-Z three-axis simultaneous movement mode according to the target position information, and finally the high-power objective lens in the microscope lens is focused at a target position corresponding to the target position information. In the microscopic examination process, the high-power objective lens can be rapidly moved to the position of the target to be detected, the moving time and the microscopic examination time are shortened, and the microscopic examination efficiency of the whole machine is improved.
The embodiment of the invention discloses a method for realizing quick microscopic examination, and compared with the previous embodiment, the embodiment further explains and optimizes the technical scheme. Specifically, refer to fig. 2:
s210: scanning a sample to be detected through a low-power objective lens in a microscope lens, and collecting a plurality of low-power images;
s220: identifying each low-power image, and screening out the low-power image including the target to be detected as a target image;
s230: determining target position information corresponding to a target to be detected in a target image;
for the specific description of the above S210 to S230, refer to the above embodiments, which are not repeated herein.
S240: and controlling the microscope lens to move to a target position corresponding to the target position information in an X-Y-Z three-axis simultaneous movement mode relative to the objective table according to the target position information, and simultaneously controlling the microscope lens to be switched from the low-power objective lens to the high-power objective lens so as to focus the high-power objective lens at the target position corresponding to the target position information.
That is, in the above embodiment, the process of controlling the microscope lens to move in an X-Y-Z three-axis simultaneous movement manner relative to the stage according to the target position information and focusing the high power objective lens in the microscope lens on the target position corresponding to the target position information in S140 may be specifically the step described in S240.
Specifically, in order to further save time, the microscope lens can be controlled to rotate to switch the current low-power objective lens to the high-power objective lens while being controlled to move to the target position corresponding to the target position information in an X-Y-Z three-axis simultaneous movement manner relative to the objective table, when the microscope lens moves to the position corresponding to the target position information relative to the objective table in a way of three-axis simultaneous movement of X-Y-Z, the microscope lens is switched from the low power objective lens to the high power objective lens, or the microscope lens is rotated to the high power objective lens to complete the lens switching before the microscope lens moves to the position corresponding to the target position information relative to the objective table in an X-Y-Z three-axis simultaneous movement mode, thereby further shortening the time required to focus the high power objective lens at the target position corresponding to the target position information.
Further, the process of controlling the microscope lens to move to the target position corresponding to the target position information according to the target position information in a way of the three-axis simultaneous movement of the microscope lens relative to the objective table according to the X-Y-Z is as follows:
and controlling the microscope lens to move to the xy coordinate in the target position information along a straight line on an X-Y plane relative to the objective table according to the target position information, and controlling the microscope lens to move to the Z coordinate in the position information in the Z direction relative to the objective table.
It can be understood that, since the straight line between the two points is the shortest, under the condition that the moving speed is not changed, in order to further shorten the moving time, the specimen on the objective table can be controlled to move to the xy coordinate of the object to be detected along the straight line on the X-Y plane, and certainly, the microscope lens is controlled to move to the Z coordinate in the object position information corresponding to the object to be detected on the Z axis in the vertical direction. Certainly, the specimen on the objective table can be controlled to move to the xy coordinate of the target to be detected along the straight line on the X-Y plane, and the specimen can also be controlled to move to the xy coordinate of the target to be detected along the curve.
Further, as shown in fig. 3, in the step S210, the process of scanning the sample to be detected through the low-power objective lens in the microscope lens and acquiring a plurality of low-power images may specifically be:
s310: receiving an image acquisition instruction, wherein the image acquisition instruction comprises a preset scanning mode and scanning times;
s320: and controlling a low-power objective lens in the microscope lens to scan the sample to be detected according to a preset scanning mode and scanning times according to the image acquisition instruction so as to acquire a preset number of low-power images, wherein the preset number is equal to the preset times.
It should be noted that, at present, when a to-be-detected sample is scanned and a low-power image is acquired through a low-power objective lens in a microscope lens, image scanning and image acquisition are performed on a current area after a control instruction is received each time, and after the image acquisition is completed, information is fed back to complete the image acquisition, and then the current area is subjected to image scanning and image acquisition after the current area is moved according to a next control instruction.
Specifically, the image acquisition instruction in the present application includes a preset scanning manner and scanning times, the control end may control the low-power objective lens to scan and acquire an image of a sample to be detected according to the preset scanning manner and the scanning times according to the image acquisition instruction, that is, the low-power objective lens may be controlled to move according to the preset scanning manner, and the current corresponding region may be scanned once the low-power objective lens moves, and after the image acquisition is completed, a low-power image corresponding to the current region is obtained, and then the low-power objective lens is controlled to move to a next region according to the preset scanning manner, and the region is scanned to obtain a corresponding low-power image, and until the low-power image is controlled to move according to the preset scanning times, a number of low-power images equal to the scanning times is obtained. That is, can obtain the low power image of a plurality of different region departments according to an image acquisition instruction in this application, for current image acquisition mode, this application can shorten image acquisition time greatly to be favorable to improving complete machine microscopic examination efficiency.
Further, after determining the target position information corresponding to the target to be detected in the target image, the method further includes:
establishing a corresponding relation table of the target to be detected and the target position information according to the target to be detected and the corresponding target position information thereof;
before controlling the microscope lens to move relative to the stage in a manner of three-axis simultaneous movement according to the target position information, the method further comprises:
and acquiring target position information from the corresponding relation table.
It should be noted that, after determining the target position information of the target to be detected in the target image, the target to be detected may be numbered, and a correspondence table between the target to be detected and the target position information is established, where the correspondence table may also be a correspondence between each number and corresponding position information, and the numbers correspond to the target to be detected and the target image one to one. When a plurality of target images are available, the target to be detected and the corresponding target position information in each target image can be recorded in the corresponding relation table of the target to be detected and the target position information, and when the corresponding target to be detected is tracked by adopting a high-power target subsequently, the corresponding target position information can be obtained from the corresponding relation table, so that the target position information of the target to be detected in the corresponding target image can be quickly determined, and the microscopic examination efficiency of the whole machine is further improved.
On the basis of the foregoing embodiments, the present invention provides a device for implementing quick microscopic examination, which is specifically shown in fig. 4. The device includes:
the acquisition module 11 is used for scanning a sample to be detected through a low-power objective lens in a microscope lens and acquiring a plurality of low-power images;
the identification module 12 is configured to identify each low-power image, and screen out a low-power image including a target to be detected as a target image;
the determining module 13 is configured to determine target position information corresponding to a target to be detected in a target image;
and the moving module 14 is used for controlling the microscope lens to move relative to the objective table according to the target position information in an X-Y-Z three-axis simultaneous movement mode, and focusing the high-power objective lens in the microscope lens at a target position corresponding to the target position information so as to perform high-power image acquisition on the corresponding target to be detected through the high-power objective lens.
Optionally, the moving module 14 is specifically configured to control the microscope lens to move to the target position corresponding to the target position information according to the target position information in an X-Y-Z three-axis simultaneous movement manner with respect to the object stage, and control the microscope lens to be switched from the low-power objective lens to the high-power objective lens, so that the high-power objective lens is focused on the target position corresponding to the target position information.
Optionally, the collecting module 11 includes:
the receiving unit is used for receiving an image acquisition instruction, and the image acquisition instruction comprises a preset scanning mode and scanning times;
and the scanning unit is used for controlling the low-power objective lens in the microscope lens to scan the sample to be detected according to a preset scanning mode and scanning times according to the image acquisition instruction so as to acquire a preset number of low-power images, wherein the preset number is equal to the preset times.
It should be noted that the apparatus for implementing fast microscopy provided in the present embodiment has the same beneficial effects as the method for implementing fast microscopy in the above embodiment. In addition, for a specific description of the method for implementing quick microscopic examination according to the embodiment of the present invention, reference is made to the above method embodiment, and details of the method are not repeated herein.
On the basis of the foregoing embodiments, an embodiment of the present invention further provides an apparatus for implementing quick microscopic examination, and specifically referring to fig. 5, the apparatus includes:
a memory 21 for storing a computer program;
a processor 22 for implementing the steps of the method for performing fast microscopy as described above when executing the computer program.
On the basis of the foregoing embodiments, an embodiment of the present invention further provides a computer-readable storage medium, where a computer program is stored on the computer-readable storage medium, and when the computer program is executed by a processor, the steps of the method for implementing fast microscopy are implemented as described above.
The embodiments in the present description are described in a progressive manner, each embodiment focuses on differences from other embodiments, and the same and similar parts among the embodiments are referred to each other. The device disclosed by the embodiment corresponds to the method disclosed by the embodiment, so that the description is simple, and the relevant points can be referred to the method part for description.
It should also be noted that in this specification, terms such as "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other identical elements in a process, method, article, or apparatus that comprises the element.
The previous description of the disclosed embodiments is provided to enable any person skilled in the art to make or use the present invention. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other embodiments without departing from the spirit or scope of the invention. Thus, the present invention is not intended to be limited to the embodiments shown herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.
Claims (10)
1. A method for realizing rapid microscopic examination is characterized by comprising the following steps:
scanning a sample to be detected through a low-power objective lens in a microscope lens, and collecting a plurality of low-power images;
identifying each low-power image, and screening out the low-power image comprising the target to be detected as a target image;
determining target position information corresponding to a target to be detected in the target image;
and controlling the microscope lens to move relative to the objective table according to the target position information in an X-Y-Z three-axis simultaneous movement mode, and focusing a high-power objective lens in the microscope lens at a target position corresponding to the target position information so as to perform high-power image acquisition on the corresponding target to be detected through the high-power objective lens.
2. The method for implementing fast microscopy according to claim 1, wherein the step of controlling the microscope lens to move in an X-Y-Z three-axis simultaneous movement manner with respect to the stage according to the target position information and focusing the high power objective lens in the microscope lens at the target position corresponding to the target position information comprises:
and controlling the microscope lens to move to a target position corresponding to the target position information in an X-Y-Z three-axis simultaneous movement mode relative to the objective table according to the target position information, and simultaneously controlling the microscope lens to be switched from the low-power objective lens to the high-power objective lens so that the high-power objective lens is focused at the target position corresponding to the target position information.
3. The method for implementing quick microscopic examination according to claim 2, wherein the process of controlling the microscope lens to move to the target position corresponding to the target position information according to the target position information in an X-Y-Z three-axis simultaneous movement manner with respect to the stage comprises:
and controlling the microscope lens to move to an xy coordinate in the target position information along a straight line on an X-Y plane relative to the objective table according to the target position information, and controlling the microscope lens to move to a Z coordinate in the position information in the Z direction relative to the objective table.
4. The method for realizing rapid microscopy according to any one of claims 1-3, wherein the scanning of the sample to be detected through the macro objective in the microscope lens is performed by collecting a plurality of macro images as follows:
receiving an image acquisition instruction, wherein the image acquisition instruction comprises a preset scanning mode and scanning times;
and controlling a low-power objective lens in the microscope lens to scan the sample to be detected according to the preset scanning mode and the scanning times according to the image acquisition instruction so as to acquire a preset number of low-power images, wherein the preset number is equal to the preset times.
5. The method for implementing quick microscopic examination according to claim 4, wherein after determining the target position information corresponding to the target to be detected in the target image, the method further comprises:
establishing a corresponding relation table of the target to be detected and the target position information according to the target to be detected and the corresponding target position information thereof;
before the controlling the microscope lens to move relative to the object stage according to the target position information in an X-Y-Z three-axis simultaneous movement manner, the method further includes:
and acquiring the target position information from the corresponding relation table.
6. An apparatus for performing rapid microscopic examination, comprising:
the acquisition module is used for scanning a sample to be detected through a low-power objective lens in a microscope lens and acquiring a plurality of low-power images;
the identification module is used for identifying each low-power image and screening out the low-power image including the target to be detected as a target image;
the determining module is used for determining target position information corresponding to the target to be detected in the target image;
and the moving module is used for controlling the microscope lens to move relative to the objective table according to the target position information in an X-Y-Z three-axis simultaneous movement mode, and focusing a high-power objective lens in the microscope lens at a target position corresponding to the target position information so as to perform high-power image acquisition on the corresponding target to be detected through the high-power objective lens.
7. The apparatus according to claim 6, wherein the moving module is specifically configured to control the microscope lens to move to the target position corresponding to the target position information in an X-Y-Z three-axis simultaneous movement manner with respect to the stage according to the target position information, and control the microscope lens to be switched from the low-power objective lens to the high-power objective lens, so that the high-power objective lens is focused on the target position corresponding to the target position information.
8. The apparatus for realizing rapid microscopy according to claim 6 or 7, wherein the acquisition module comprises:
the device comprises a receiving unit, a processing unit and a processing unit, wherein the receiving unit is used for receiving an image acquisition instruction, and the image acquisition instruction comprises a preset scanning mode and scanning times;
and the scanning unit is used for controlling the low-power objective lens in the microscope lens to scan the sample to be detected according to the preset scanning mode and the scanning times according to the image acquisition instruction so as to acquire a preset number of low-power images, wherein the preset number is equal to the preset times.
9. An apparatus for performing rapid microscopic examination, comprising:
a memory for storing a computer program;
a processor for implementing the steps of the method for fast microscopy according to any one of claims 1 to 5 when executing the computer program.
10. A computer-readable storage medium, on which a computer program is stored, which, when being executed by a processor, carries out the steps of the method for performing fast microscopy according to any one of claims 1 to 5.
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