Summary of the invention
The technical matters to be solved of the embodiment of the present invention is, provides a kind of microscope locating and tracking formation method, device and urinal system, can improve pattern detection speed, and ensures the accuracy of Sample result as far as possible.
In order to solve the problems of the technologies described above, embodiments provide a kind of microscope locating and tracking formation method, comprising the following steps:
Analyze by low-power microscope to the sample of focal plane sequentially take pictures obtain multiple low-power field pictures, determine the low-power field picture that wherein there is target particles;
The low-power field picture each being existed target particles is divided into multiple high power lens area of visual field, obtains all high power lens area of visual field that there is target particles, and selected target high power field region wherein also obtains the positional information in each target high power field region;
According to the positional information in described each target high power field region, adopt high-power microscope to take pictures at the region place of correspondence position on the sample of focal plane, obtain high power lens visual field picture.
Wherein, the described low-power field picture each being existed target particles is divided into multiple high power lens area of visual field, obtain all high power lens area of visual field that there is target particles, selected target high power field region wherein the step obtaining the positional information in each target high power field region comprise further:
According to the multiplying power relation of described low-power microscope and described high-power microscope, the low-power field picture each being existed target particles is divided into multiple high power lens area of visual field;
Identify each and there is the high power lens area of visual field that there is target particles in the low-power field picture of target particles, and obtain its positional information;
There is selected target high power field region the high power lens area of visual field of target particles from all, and obtain the positional information in each target high power field region.
Wherein, described exist selected target high power field region the high power lens area of visual field of target particles from all, and the step obtaining the positional information in each target high power field region comprises further:
By described all there is the high power lens area of visual field of target particles sum and a maximum number of taking pictures of high power lens preset compare;
If described sum is less than or equal to described maximum number of taking pictures, then described all high power lens area of visual field that there is target particles is chosen to be target high power field region, and obtains the positional information in each target high power field region;
If described sum is greater than described maximum number of taking pictures, then the quantity of the described high power lens area of visual field that there is target particles according to target particle is sorted from big to small, the high power lens area of visual field that the selected maximum number of taking pictures being in prostatitis exists target particles is target high power field region, and obtains the positional information in each target high power field region.
Wherein, described maximum number of taking pictures is less than the sum of all high power lens area of visual field of described focal plane.
Wherein, described positional information is the coordinates matrix information of each high power lens area of visual field.
Correspondingly, the another aspect of the embodiment of the present invention, additionally provides a kind of microscope locating and tracking imaging device, comprising:
Low-power field picture analyzing unit, for analyze by low-power microscope to the sample of focal plane sequentially take pictures obtain multiple low-power field pictures, determine the low-power field picture that wherein there is target particles;
Target high power field area determination unit, for each low-power field picture that there is target particles determined for described low power lens photographing unit is divided into multiple high power lens area of visual field, obtain all high power lens area of visual field that there is target particles, selected target high power field region wherein also obtains the positional information in each target high power field region;
High power lens photographing unit, for the positional information in each target high power field region of having selected unit to determine according to described target high power field region, adopt high-power microscope to take pictures at the region place of correspondence position on the sample of focal plane, obtain high power lens visual field picture.
Wherein, described target high power field area determination unit comprises further:
Division unit, for being divided into multiple high power lens area of visual field by each low-power field picture that there is target particles determined for described low power lens photographing unit;
, there is for identifying each the high power lens area of visual field that there is target particles in the low-power field picture of target particles, and obtain its positional information in recognition unit;
Sequencing unit, for sorting from big to small to the quantity of described all high power lens area of visual field that there is target particles according to target particle;
, there is selected target high power field region the high power lens area of visual field of target particles from all, and obtain the positional information in each target high power field region in selected unit.
Wherein, described selected unit comprises further:
Comparing unit, by described all there is the high power lens area of visual field of target particles sum and a maximum number of taking pictures of high power lens preset compare;
Comparative result processing unit, if described sum is less than or equal to described maximum number of taking pictures, is then chosen to be target high power field region by described all high power lens area of visual field that there is target particles, and obtains the positional information in each target high power field region; If described sum is greater than described maximum number of taking pictures, then selected after described sequencing unit sequence, the high power lens area of visual field that the maximum number of taking pictures being in prostatitis exists target particles is target high power field region, and obtains the positional information in each target high power field region.
Wherein, described maximum number of taking pictures is less than the sum of all high power lens area of visual field of described focal plane.
Wherein, described positional information is the coordinates matrix information of each high power lens area of visual field.
Correspondingly, the one side again of the embodiment of the present invention, also provide a kind of urinal system, it includes low-power microscope and high-power microscope, and comprises aforesaid microscope locating and tracking imaging device further.
Implement the embodiment of the present invention, there is following beneficial effect:
In embodiments of the present invention, according to the requirement of user to proving time, the maximum number of taking pictures of high power lens can be pre-set.By to each high power lens area of visual field navigated under low power lens containing target particles number number, determine the high power lens area of visual field needing to carry out taking pictures, then adopt high power lens to carry out tracking to these corresponding area of visual field places in focal plane to take pictures, this ensure that statistics of taking pictures is carried out in the region that select target numbers of particles is maximum within the limited time, while saving the time of taking pictures, the accuracy that ensure that Sample of maximum possible.
Embodiment
In order to make object of the present invention, technical scheme and advantage clearly understand, below in conjunction with drawings and Examples, the present invention is further elaborated.Should be appreciated that specific embodiment described herein only in order to explain the present invention, be not intended to limit the present invention.
As shown in Figure 1, the main flow chart of a kind of microscope locating and tracking formation method provided by the invention embodiment is shown.In this embodiment, the method comprises the following steps:
Step S10, analyze by low power lens to the sample of focal plane sequentially take pictures obtain multiple low-power field pictures, determine the low-power field picture that wherein there is target particles;
Be understandable that, this analysis is generally that the type of based target particle and quantity realize.All not containing target particles in all low-power field pictures, then namely this flow process can terminate, and namely need not carry out follow-up high power lens tracking and take pictures, photographic analysis process completes.
Step S12, the low-power field picture each being existed target particles is divided into multiple high power lens area of visual field, obtain all high power lens area of visual field that there is target particles, selected target high power field region wherein also obtains the positional information in each target high power field region;
Particularly, this step S12 comprises further:
According to the multiplying power relation of low power lens and high power lens, the low-power field picture each being existed target particles is divided into multiple high power lens area of visual field;
Identify each and there is the high power lens area of visual field that there is target particles in the low-power field picture of target particles, and obtain its positional information;
There is selected target high power field region the high power lens area of visual field of target particles from all, and obtain the positional information in each target high power field region.
Step S14, according to the positional information in each target high power field region, adopts high power lens to take pictures at the region place of correspondence position on the sample of focal plane, obtains high power lens visual field picture.
Particularly, this step S14 comprises further:
The sum that there is the high power lens area of visual field of target particles by all and a maximum number of taking pictures of high power lens preset compare;
If sum is less than or equal to maximum number of taking pictures, then all high power lens area of visual field that there is target particles are chosen to be target high power field region, and obtain the positional information in each target high power field region;
If sum is greater than maximum number of taking pictures, then the quantity of the high power lens area of visual field that there is target particles according to target particle is sorted from big to small, the high power lens area of visual field that the selected maximum number of taking pictures being in prostatitis exists target particles is target high power field region, and obtain the positional information in each target high power field region, such as, in one example in which, suppose to add up to 20, and maximum number of taking pictures is 15, then the quantity of 20 high power lens area of visual field according to target particle is sorted from big to small, select 15 high power lens field of vision of standing out as target high power field region.
Wherein, maximum number of taking pictures is less than the sum of all high power lens area of visual field of focal plane.
Wherein, positional information is the coordinates matrix information of each high power lens area of visual field, such as, be the horizontal ordinate of each high power lens area of visual field and the value range of ordinate.Be understandable that, other mode also can be adopted in other examples to position.
As shown in Figures 2 to 4, the structural representation of a kind of microscope locating and tracking imaging device provided by the invention embodiment is shown.In this embodiment, this microscope locating and tracking imaging device 1, comprising:
Low-power field picture analyzing unit 10, for analyze by low power lens to the sample of focal plane sequentially take pictures obtain multiple low-power field pictures, determine the low-power field picture that wherein there is target particles;
Target high power field area determination unit 12, for each low-power field picture that there is target particles determined for low power lens photographing unit 10 is divided into multiple high power lens area of visual field, obtain all high power lens area of visual field that there is target particles, selected target high power field region wherein also obtains the positional information in each target high power field region;
High power lens photographing unit 14, for the positional information in each target high power field region determined according to target high power field area determination unit 12, adopts high power lens to take pictures at the region place of correspondence position on the sample of focal plane, obtains high power lens visual field picture.
Wherein, target high power field area determination unit 12 comprises further:
Division unit 120, for being divided into multiple high power lens area of visual field by each low-power field picture that there is target particles determined for low power lens photographing unit;
, there is for identifying each the high power lens area of visual field that there is target particles in the low-power field picture of target particles, and obtain its positional information in recognition unit 122;
Sequencing unit 124, for sorting from big to small to the quantity of all high power lens area of visual field that there is target particles according to target particle;
, there is selected target high power field region the high power lens area of visual field of target particles from all, and obtain the positional information in each target high power field region in selected unit 126.
Particularly, selected unit 126 comprises further:
Comparing unit 127, the sum that there is the high power lens area of visual field of target particles by all and a maximum number of taking pictures of high power lens preset compare;
Comparative result processing unit 128, if sum is less than or equal to maximum number of taking pictures, is then chosen to be target high power field region by all high power lens area of visual field that there is target particles, and obtains the positional information in each target high power field region; If sum is greater than maximum number of taking pictures, then selected after sequencing unit sequence, the high power lens area of visual field that the maximum number of taking pictures being in prostatitis exists target particles is target high power field region, and obtains the positional information in each target high power field region.
Wherein, maximum number of taking pictures is less than the sum of all high power lens area of visual field of focal plane.
Wherein, positional information is the coordinates matrix information of each high power lens area of visual field.
Further, the embodiment of the present invention, a kind of urinal system is also provided, it includes low-power microscope and high-power microscope, and comprise the aforementioned microscope locating and tracking imaging device introduced as Fig. 2 to Fig. 4 further, concrete details can refer to the aforementioned introduction to Fig. 2 to Fig. 4, does not repeat at this.
For the ease of carrying out more deep understanding to the present invention, followingly in conjunction with the example of in 5 to Fig. 6, method of the present invention to be described.
Wherein, Fig. 5 shows a focussing plane schematic diagram.According to the multiplying power of low power lens object lens, when the low power lens scope of taking pictures will cover this whole focussing plane, then whole focussing plane includes L low-power field, and in Figure 5, this L is 10.Namely adopt the appearance of low power lens to focal plane sequentially to take pictures, L can be obtained and open (namely 10) low-power field picture;
Fig. 6 shows, and a low-power field picture is divided into the schematic diagram of multiple high power lens area of visual field.Wherein, according to the multiplying power of high power lens object lens, when the high power lens scope of taking pictures will cover a low power lens focus field, then each low-power field region comprises H the high power lens visual field, and in Fig. 6, this H is 12, namely low-power field region can be opened high power lens visual field picture and covers completely by being clapped H, understandable, corresponding to the multiplying power of different high power lenses, this H value is different.
In Fig. 7, according to the differentiation to focussing plane height low-power field, when the high power lens scope of taking pictures will cover whole focussing plane, then whole region comprises L*H the high power lens visual field, namely in the present example, employing 120 high power lens visual field pictures are needed namely can to cover whole focal plane.
And according to the method that the embodiment of the present invention provides, user can arrange the maximum number N that takes pictures of high power lens (0 < N≤L*H) before startup inspection, such as, this maximum number N that takes pictures can be set to 15 in one example in which, such high power lens is when tracking is taken pictures, can to take pictures number as the actual tracking of high power lens according to the number of taking pictures arranged, can ensure that statistics of taking pictures is carried out in the target visual field selecting numbers of particles maximum within the limited time.Then the method applied in the present invention comprises the steps:
First, low power lens is adopted to take pictures to whole focussing plane, the low-power field picture then collected under low power lens is L(10), after low power lens has been taken pictures, by the analysis to low-power field picture, can filter out in which picture and contain target particles, can know all there is target particles from Fig. 7 in 10 low-power field pictures.
Then, target particles is decomposed in all high power lens visuals field of whole focussing plane, and calculates the target particles number comprised in each high power lens visual field.Particularly, in first low visual field picture first, 6 and 7 target particles are contained respectively in the 8th high power lens area of visual field; Containing 5 target particles in the 8th high area of visual field in like manner in second low visual field picture; In the 3rd low visual field picture first, 6 and 8 target particles are contained respectively in the 8th high power lens area of visual field.Successively, all information comprising the high power lens area of visual field of target particles can be obtained.Count and have the high power lens area of visual field that 20 include target particles, and the concrete quantity of target particles contained by each high power lens area of visual field.
The maximum number N(15 that takes pictures of high power lens that high power lens visual field sum (20) whole focussing plane being included target particles number is arranged with user) compare.Because sum is greater than the maximum number of taking pictures of the high power lens pre-set, then to all high power lens area of visual field that there is target particles, according to target the quantity of particle sorts from big to small, there is the high power lens area of visual field of target particles as target high power lens area of visual field in selected N number of (15) being wherein in prostatitis, and obtain corresponding positional information, wherein, this positional information can be the coordinates matrix information of each high power lens area of visual field, such as, be the horizontal ordinate of each high power lens area of visual field and the scope of ordinate; Or, can be numbered each high power lens area of visual field in advance, and store the coordinates matrix information of each high power lens area of visual field, as long as obtain the number information of high power lens area of visual field, then can obtain the coordinates matrix information of its correspondence easily.
Then, according to the positional information in this N number of (15) target high power field region, adopt high power lens to take pictures at the region place of correspondence position on the sample of focal plane, obtain N and open (15) high power lens visual field picture.Then follow-up statistical treatment work is carried out.
Implement the embodiment of the present invention, there is following beneficial effect:
In embodiments of the present invention, according to the requirement of user to proving time, the maximum number of taking pictures of high power lens can be pre-set.By to each high power lens area of visual field navigated under low power lens containing target particles number number, determine the high power lens area of visual field needing to carry out taking pictures, then adopt high power lens to carry out tracking to these corresponding area of visual field places in focal plane to take pictures, this ensure that statistics of taking pictures is carried out in the region that select target numbers of particles is maximum within the limited time, while saving the time of taking pictures, the accuracy that ensure that Sample of maximum possible.
One of ordinary skill in the art will appreciate that all or part of step realized in above-described embodiment method is that the hardware that can carry out instruction relevant by program has come, program can be stored in a computer read/write memory medium, storage medium, as ROM/RAM, disk, CD etc.
These are only preferred embodiment of the present invention, not in order to limit the present invention, all any amendments done within the spirit and principles in the present invention, equivalent replacement and improvement etc., all should be included within protection scope of the present invention.