CN105138472B - 闪存磨损优化方法及设备 - Google Patents
闪存磨损优化方法及设备 Download PDFInfo
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- CN105138472B CN105138472B CN201410250878.0A CN201410250878A CN105138472B CN 105138472 B CN105138472 B CN 105138472B CN 201410250878 A CN201410250878 A CN 201410250878A CN 105138472 B CN105138472 B CN 105138472B
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Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
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CN107436726B (zh) * | 2016-05-26 | 2020-09-08 | 华为技术有限公司 | 数据写入方法、存储控制器、计算设备以及存储装置 |
CN108932175B (zh) * | 2017-05-24 | 2022-01-11 | 建兴储存科技(广州)有限公司 | 固态储存装置的控制方法 |
CN107832012A (zh) * | 2017-11-03 | 2018-03-23 | 重庆大学 | 一种在线挖掘闪存制程差异现象优化刷新的方法 |
CN109032505A (zh) * | 2018-06-26 | 2018-12-18 | 深圳忆联信息系统有限公司 | 带时效的数据读写方法、装置、计算机设备及存储介质 |
CN114420182B (zh) * | 2022-03-29 | 2022-06-17 | 北京智芯微电子科技有限公司 | 非易失性存储单元的数据处理方法、装置及存储介质 |
Citations (3)
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CN101315811A (zh) * | 2008-07-22 | 2008-12-03 | 中国科学院上海微系统与信息技术研究所 | 动态相变存储器 |
CN101345088A (zh) * | 2007-05-14 | 2009-01-14 | 桑迪士克Il有限公司 | 使用综合特征来测量存储器中的阈值电压分布 |
CN102890621A (zh) * | 2011-07-22 | 2013-01-23 | 弗森-艾奥公司 | 确定固态存储介质配置参数的装置、系统和方法 |
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KR100506061B1 (ko) * | 2002-12-18 | 2005-08-03 | 주식회사 하이닉스반도체 | 특성 조정 장치를 부가한 메모리 장치 |
US8737141B2 (en) * | 2010-07-07 | 2014-05-27 | Stec, Inc. | Apparatus and method for determining an operating condition of a memory cell based on cycle information |
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CN101345088A (zh) * | 2007-05-14 | 2009-01-14 | 桑迪士克Il有限公司 | 使用综合特征来测量存储器中的阈值电压分布 |
CN101315811A (zh) * | 2008-07-22 | 2008-12-03 | 中国科学院上海微系统与信息技术研究所 | 动态相变存储器 |
CN102890621A (zh) * | 2011-07-22 | 2013-01-23 | 弗森-艾奥公司 | 确定固态存储介质配置参数的装置、系统和方法 |
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