CN105116184A - IGBT (Insulated Gate Bipolar Transistor) dynamic test latch protection circuit - Google Patents
IGBT (Insulated Gate Bipolar Transistor) dynamic test latch protection circuit Download PDFInfo
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- CN105116184A CN105116184A CN201510600812.4A CN201510600812A CN105116184A CN 105116184 A CN105116184 A CN 105116184A CN 201510600812 A CN201510600812 A CN 201510600812A CN 105116184 A CN105116184 A CN 105116184A
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Abstract
The invention relates to an IGBT (Insulated Gate Bipolar Transistor) dynamic test latch protection circuit. The emitter electrode end of a tested device IGBT2 is connected to the cathode of a power supply through a second current transformer U2. The gate electrode end of a protection device IGBT3 and the gate electrode end of the tested device IGBT2 are connected to the output end of a driving circuit. The output end of a first current transformer U1 is connected to a first detection and comparison circuit and the output end of the second current transformer U2 is connected to a second detection and comparison circuit. The output ends of the first detection and comparison circuit and the second detection and comparison circuit are connected to a driving and interlocking protection circuit; the output end of the driving and interlocking protection circuit is connected to the driving circuit. The protection circuit provided by the invention has a compact structure, is capable of effectively protecting a test circuit and a test device during an IGBT dynamic test to ensure the security and reliability of the test during the testing process.
Description
Technical field
The present invention relates to a kind of protection circuit, the dynamic test latch protection circuit of especially a kind of IGBT, belongs to the technical field of IGBT dynamic test.
Background technology
Current in applied power electronics fields such as frequency converter, reactive-load compensation, photovoltaics, power semiconductor IGBT device is widely used.In the application, IGBT, as the energy conversion unit in whole circuit, plays a part core, and IGBT can have an impact to the performance of IGBT in the various process such as design, transport, storage.
At present, at IGBT
devicebe assembled to before in complete machine, utilize half-bridge circuit IGBT to be carried out to the dynamic test of dipulse to verify its performance, concrete test circuit as shown in Figure 1.In FIG, the performance of dipulse test circuit is described by testing lower half-bridge IGBT, wherein U is voltage source, L is load inductance, T2 is the IGBT of lower half-bridge, VD1 is the fly-wheel diode of upper half-bridge, and in test process, utilize oscillograph, current/voltage to pop one's head in electric current I C, the voltage Vce of IGBT of half-bridge under test and driving voltage Vge, upper half-bridge igbt chip T1 is in negative pressure off state.For excellent IGBT device, this platform can verify the performance of IGBT, can not cause damage to device and driving circuit, but consider the factors such as device design itself defect, environmental impact, when utilizing this circuit to test igbt chip T2, breech lock can occur when turning off, result causes igbt chip T1, igbt chip T2 and driving power to damage, cause the damage of power supply and even equipment worse, to tester even company bring very large loss.
Summary of the invention
The object of the invention is to overcome the deficiencies in the prior art; the Dynamic latch protection circuit of a kind of IGBT is provided; its compact conformation, can carry out available protecting when breech lock appears in IGBT dynamic test to test circuit and testing apparatus, guarantee the safe and reliable of test process.
According to technical scheme provided by the invention, the dynamic test latch protection circuit of described IGBT, comprises test component IGBT2 and is in accompanying of negative pressure off state all the time and survey device IGBT1; Also comprise protection device IGBT3, describedly the collector surveying device IGBT1 is accompanied to be connected with the positive terminal of power supply and one end of load L connects, accompany the emitter terminal surveying device IGBT1 to be connected with the collector terminal of protection device IGBT3 by the first current transformer U1, the other end of load L is also connected with the collector terminal of protection device IGBT3; The emitter terminal of protection device IGBT3 and the collector terminal of test component IGBT2, the emitter terminal of test component IGBT2 is connected to the negative pole end of power supply by the second current transformer U2;
The gate pole end of protection device IGBT3, the gate pole end of test component IGBT2 are all connected with the output terminal of driving circuit, monopulse drive singal needed for driving circuit energy output protection device IGBT3, and driving circuit can export the dipulse drive singal needed for test component IGBT2 test; The output terminal and first of the first current transformer U1 detects comparator circuit and is connected, the output terminal and second of the second current transformer U2 detects comparator circuit and is connected, the output terminal that first output terminal, second detecting comparator circuit detects comparator circuit is all connected with driving interlock protection circuit, the output terminal of interlock protection circuit is driven to be connected with driving circuit, the output terminal that driving circuit is connected with test component IGBT2 gate pole end also detects comparator circuit with driving and is connected, and drives the output terminal detecting comparator circuit to be connected with driving the input end of interlock protection circuit;
First detects the first measuring current value that comparator circuit receives the first current transformer U1 detection, if when the first measuring current value and described first the first predetermined current detected in comparator circuit protects threshold value to mate, first detects comparator circuit can export the first interlocking cut-off signals to driving interlock protection circuit; Second detects the second measuring current value that comparator circuit receives the second current transformer U2 detection, if when the second measuring current value and described second the second predetermined current detected in comparator circuit protects threshold value to mate, second detects comparator circuit can export the second interlocking cut-off signals to driving interlock protection circuit; Drive detection comparator circuit can receive the dipulse drive singal that driving circuit is loaded into test component IGBT2 gate pole, if when dipulse drive singal protects threshold value to mate with driving the 3rd predetermined current detected in comparator circuit, drive detection comparator circuit can export the 3rd interlocking cut-off signals to driving interlock protection circuit;
Drive interlock protection circuit after receiving the first interlocking cut-off signals, the second interlocking cut-off signals or the 3rd interlocking cut-off signals; drive interlock protection circuit can export to driving circuit and drive cut-off signals, to turn off test component IGBT2 and protection device IGBT3 by driving circuit simultaneously.
Described protection device IGBT3 is greater than the service time of test component IGBT2 in the effect of dipulse drive singal in the service time of monopulse drive singal effect, and test component IGBT2 surveys device IGBT1 and adopts identical IGBT device with accompanying.
Described first detects comparator circuit comprises operational amplifier U3A, the in-phase end of operational amplifier U3 is connected with one end of resistance R9, the other end of resistance R9 and one end of resistance R8, one end of resistance R7, one end of resistance R6, one end of resistance R5, the cathode terminal of diode D3, the anode tap of diode D5 and the output terminal of the first current transformer U1 connect, the other end of resistance R5, the other end of resistance R6, the other end of resistance R7 and the equal ground connection of the other end of resistance R8, the anode tap of diode D3 is connected with-15V voltage, the cathode terminal of diode D5 is connected with+15V voltage, the end of oppisite phase of operational amplifier U3A is connected with the output terminal of operational amplifier U3,
The output terminal of operational amplifier U3A is connected with one end of resistance R13; the other end of resistance R13 is connected with the in-phase end of operational amplifier U4A; the end of oppisite phase of operational amplifier U4A is connected with one end of resistance R12; the other end of resistance R12 is connected with one end of one end of resistance R11 and resistance R10; the other end of resistance R11 connects; the other end of resistance R10 is connected with one end of-15V voltage and electric capacity C2; the other end ground connection of electric capacity C2, the output terminal of operational amplifier U4A is connected with driving interlock protection circuit.
Described second detects comparator circuit comprises operational amplifier U5A, the in-phase end of described operational amplifier U5A is connected with one end of resistance R18, the other end of resistance R18 and one end of resistance R17, one end of resistance R16, one end of resistance R15, one end of resistance R14, the cathode terminal of diode D4, the anode tap of diode D6 and the output terminal of the second current transformer U2 connect, the other end of resistance R14, the other end of resistance R15, the other end of resistance R16 and the equal ground connection of the other end of resistance R17, the anode tap of diode D4 is connected with-15V voltage, the cathode terminal of diode D6 is connected with+15V voltage, the input end of operational amplifier U5A is connected with the output terminal of operational amplifier U5A,
The output terminal of operational amplifier U5A is also connected with one end of resistance R22; the other end of resistance R22 is connected with the end of oppisite phase of operational amplifier U6A; the in-phase end of operational amplifier U6A is connected with one end of resistance R21; the other end of resistance R21 is connected with one end of one end of resistance R19 and resistance R20; the other end ground connection of resistance R20; the other end of resistance R19 is connected with+15V voltage; and the other end of resistance R19 is connected with one end of electric capacity C3; the other end ground connection of electric capacity C3, the output terminal of operational amplifier U6A is connected with driving interlock protection circuit.
Described driving detects comparator circuit and comprises operational amplifier U7A, the in-phase end ground connection of operational amplifier U7A, the end of oppisite phase of operational amplifier U7A is connected with one end of one end of electric capacity C4 and resistance R23, the other end of electric capacity C4 is connected with the cathode terminal of diode D7, the anode tap of diode D8 and the output terminal of driving circuit, the anode tap of diode D7 is connected with-15V voltage, the cathode terminal of diode D8 is connected with+15V voltage, and the other end of resistance R23 is connected with one end of the output terminal of operational amplifier U7A and resistance R24;
The other end of resistance R24 is connected with one end of one end of electric capacity C19 and resistance R25, the other end of resistance R25 is connected with one end of the in-phase end of operational amplifier U8B and electric capacity C5, the other end ground connection of electric capacity C5, the other end of electric capacity C19 is connected with the output terminal of operational amplifier U8B, the end of oppisite phase of operational amplifier U8B is connected with the output terminal of operational amplifier U8B, and the output terminal of operational amplifier U8B is also connected with one end of resistance R26;
The other end of resistance R26 is connected with the end of oppisite phase of one end of resistance R27 and operational amplifier U9B, the in-phase end ground connection of operational amplifier U9B, the other end of resistance R27 is connected with one end of the output terminal of operational amplifier U9B and resistance R31, the other end of resistance R31 is connected with the end of oppisite phase of operational amplifier U10A, the in-phase end of operational amplifier U10A is connected with one end of resistance R30, the other end of resistance R30 is connected with one end of one end of resistance R29 and resistance R28, the other end ground connection of resistance R29, the other end of resistance R28 is connected with+15V voltage, and the other end of resistance R28 is connected with one end of electric capacity C6, the other end ground connection of electric capacity C6, the output terminal of operational amplifier U10A is connected with driving interlock protection circuit.
The gate pole of described protection device IGBT3 is connected with one end of one end of resistance R1 and resistance R2; the other end of resistance R2 is connected with the cathode terminal of diode D1; the anode tap of diode D1 is connected with the other end of resistance R1, and the anode tap of diode D1 is connected for the output terminal exporting monopulse drive singal with driving circuit.
The gate pole end of described test component IGBT2 is connected with one end of one end of resistance R3 and resistance R4, and the other end of resistance R4 is connected with the cathode terminal of diode D2, and the anode tap of diode D2 is connected for the output terminal exporting dipulse drive singal with driving circuit.
Advantage of the present invention: utilize the first current transformer U1 to carry out detection to the first measuring current and compare, utilize the second current transformer U2 to carry out detection to the second test circuit to compare, utilize driving detection comparator circuit to carry out detection to dipulse drive singal to compare, drive interlock protection circuit can determine whether that phase driving circuit exports according to comparative result and drive cut-off signals, driving circuit can turn off test component IGBT2 and protection device IGBT3 after receiving driving cut-off signals simultaneously, reach, when breech lock appears in IGBT dynamic test, available protecting is carried out to test circuit and testing apparatus, guarantee the safe and reliable of test process.
Accompanying drawing explanation
Fig. 1 be existing to test component carry out dipulse test time circuit theory diagrams.
Fig. 2 is structured flowchart of the present invention.
Fig. 3 is the circuit theory diagrams that the present invention first detects comparator circuit.
Fig. 4 is the circuit theory diagrams that the present invention second detects comparator circuit.
Fig. 5 is that the present invention drives the circuit theory diagrams detecting comparator circuit.
Embodiment
Below in conjunction with concrete drawings and Examples, the invention will be further described.
As shown in Figure 2: in order to available protecting can be carried out when breech lock appears in IGBT dynamic test to test circuit and testing apparatus, guarantee the safe and reliable of test process, the dynamic test latch protection circuit of IGBT of the present invention, comprises test component IGBT2 and is in accompanying of negative pressure off state all the time and survey device IGBT1; Also comprise protection device IGBT3, describedly the collector surveying device IGBT1 is accompanied to be connected with the positive terminal of power supply and one end of load L connects, accompany the emitter terminal surveying device IGBT1 to be connected with the collector terminal of protection device IGBT3 by the first current transformer U1, the other end of load L is also connected with the collector terminal of protection device IGBT3; The emitter terminal of protection device IGBT3 and the collector terminal of test component IGBT2, the emitter terminal of test component IGBT2 is connected to the negative pole end of power supply by the second current transformer U2;
The gate pole end of protection device IGBT3, the gate pole end of test component IGBT2 are all connected with the output terminal of driving circuit, monopulse drive singal needed for driving circuit energy output protection device IGBT3, and driving circuit can export the dipulse drive singal needed for test component IGBT2 test; The output terminal and first of the first current transformer U1 detects comparator circuit and is connected, the output terminal and second of the second current transformer U2 detects comparator circuit and is connected, the output terminal that first output terminal, second detecting comparator circuit detects comparator circuit is all connected with driving interlock protection circuit, the output terminal of interlock protection circuit is driven to be connected with driving circuit, the output terminal that driving circuit is connected with test component IGBT2 gate pole end also detects comparator circuit with driving and is connected, and drives the output terminal detecting comparator circuit to be connected with driving the input end of interlock protection circuit;
First detects the first measuring current value that comparator circuit receives the first current transformer U1 detection, if when the first measuring current value and described first the first predetermined current detected in comparator circuit protects threshold value to mate, first detects comparator circuit can export the first interlocking cut-off signals to driving interlock protection circuit; Second detects the second measuring current value that comparator circuit receives the second current transformer U2 detection, if when the second measuring current value and described second the second predetermined current detected in comparator circuit protects threshold value to mate, second detects comparator circuit can export the second interlocking cut-off signals to driving interlock protection circuit; Drive detection comparator circuit can receive the dipulse drive singal that driving circuit is loaded into test component IGBT2 gate pole, if when dipulse drive singal protects threshold value to mate with driving the 3rd predetermined current detected in comparator circuit, drive detection comparator circuit can export the 3rd interlocking cut-off signals to driving interlock protection circuit;
Drive interlock protection circuit after receiving the first interlocking cut-off signals, the second interlocking cut-off signals or the 3rd interlocking cut-off signals; drive interlock protection circuit can export to driving circuit and drive cut-off signals, to turn off test component IGBT2 and protection device IGBT3 by driving circuit simultaneously.
Particularly, electric battery is accessed at the gate pole end and emitter terminal of accompanying survey device IGBT1, the gate pole end surveying device IGBT1 is wherein accompanied to be connected with the negative pole end of electric battery, the positive terminal of electric battery is connected with accompanying the emitter terminal surveying device IGBT1, to make to accompany survey device IGBT1 to be in negative pressure off state all the time.Accompany to survey on device IGBT1, protection device IGBT3 and test component IGBT2 and fly-wheel diode is set respectively.
Described first testing current value and the first predetermined current are protected threshold value to mate and are referred to that the first testing current value protects the scope at threshold value place more than the first predetermined current, or are greater than the first predetermined current protection threshold value.Second testing current value and the second predetermined current protect that threshold value is mated, dipulse drive singal and the concrete condition that the 3rd predetermined current protects threshold value to mate and above-mentioned first testing current value and the first predetermined current protect the situation of threshold value identical, repeat no longer one by one.
Described protection device IGBT3 is greater than the service time of test component IGBT2 in the effect of dipulse drive singal in the service time of monopulse drive singal effect, and test component IGBT2 surveys device IGBT1 and adopts identical IGBT device with accompanying.The current/voltage grade of protection device IGBT3 is larger than test component IGBT2.
The gate pole of described protection device IGBT3 is connected with one end of one end of resistance R1 and resistance R2; the other end of resistance R2 is connected with the cathode terminal of diode D1; the anode tap of diode D1 is connected with the other end of resistance R1, and the anode tap of diode D1 is connected for the output terminal exporting monopulse drive singal with driving circuit.During proper testing, driving circuit can export monopulse drive singal, described monopulse drive singal by being loaded on protection device IGBT3 after diode D1, resistance R1 and resistance R2 process, to drive protection device IGBT3 conducting.
The gate pole end of described test component IGBT2 is connected with one end of one end of resistance R3 and resistance R4, and the other end of resistance R4 is connected with the cathode terminal of diode D2, and the anode tap of diode D2 is connected for the output terminal exporting dipulse drive singal with driving circuit.During proper testing, driving circuit can export dipulse drive singal, described dipulse drive singal by the gate pole end of test component IGBT2 can be loaded into after diode D2, resistance R3 and resistance R4, to drive test component IGBT2 conducting.During proper testing, protection device IGBT3 is open-minded prior to test component IGBT2, and after turn off in test component IGBT2.
Driving circuit exports concrete monopulse drive singal, dipulse drive singal can be selected as required, driving circuit can adopt existing conventional integrated device electronics, the concrete enforcement of driving circuit is embodied as known by the art personnel, repeats no more herein.After driving circuit receives the driving cut-off signals driving interlock protection circuit; driving circuit stops exporting monopulse drive singal and dipulse drive singal; make protection device IGBT3 and test component IGBT2 be in off state simultaneously, reach the protection to test component IGBT2 and associated test devices.During concrete enforcement; first predetermined current protection threshold value, the second current protection threshold value and the 3rd current threshold can carry out selection according to the requirement of test component IGBT2 and associated test devices and determine; concrete selection deterministic process, known by the art personnel, repeats no more herein.
As shown in Figure 3, described first detects comparator circuit comprises operational amplifier U3A, the in-phase end of operational amplifier U3 is connected with one end of resistance R9, the other end of resistance R9 and one end of resistance R8, one end of resistance R7, one end of resistance R6, one end of resistance R5, the cathode terminal of diode D3, the anode tap of diode D5 and the output terminal of the first current transformer U1 connect, the other end of resistance R5, the other end of resistance R6, the other end of resistance R7 and the equal ground connection of the other end of resistance R8, the anode tap of diode D3 is connected with-15V voltage, the cathode terminal of diode D5 is connected with+15V voltage, the end of oppisite phase of operational amplifier U3A is connected with the output terminal of operational amplifier U3,
The output terminal of operational amplifier U3A is connected with one end of resistance R13; the other end of resistance R13 is connected with the in-phase end of operational amplifier U4A; the end of oppisite phase of operational amplifier U4A is connected with one end of resistance R12; the other end of resistance R12 is connected with one end of one end of resistance R11 and resistance R10; the other end of resistance R11 connects; the other end of resistance R10 is connected with one end of-15V voltage and electric capacity C2; the other end ground connection of electric capacity C2, the output terminal of operational amplifier U4A is connected with driving interlock protection circuit.
In the embodiment of the present invention, diode D3 coordinates with diode D5, can realize the effect of voltage stabilizing, and resistance R5, resistance R6, resistance R7, resistance R8 and resistance R9 form current regulating circuit, operational amplifier U3A coating-forming voltage follower.By the cooperation of resistance R10, resistance R11 and resistance R12; the first required predetermined current protection threshold value can be obtained; namely the electric current that the first current transformer U1 detects protects threshold value (being a magnitude of voltage) to compare herein after operational amplifier U3A with the first predetermined current of operational amplifier U4A end of oppisite phase; thus determine the output of operational amplifier U4A, namely determine whether the output terminal of operational amplifier U4A exports the first interlocking cut-off signals to driving interlock protection circuit.
As shown in Figure 4, described second detects comparator circuit comprises operational amplifier U5A, the in-phase end of described operational amplifier U5A is connected with one end of resistance R18, the other end of resistance R18 and one end of resistance R17, one end of resistance R16, one end of resistance R15, one end of resistance R14, the cathode terminal of diode D4, the anode tap of diode D6 and the output terminal of the second current transformer U2 connect, the other end of resistance R14, the other end of resistance R15, the other end of resistance R16 and the equal ground connection of the other end of resistance R17, the anode tap of diode D4 is connected with-15V voltage, the cathode terminal of diode D6 is connected with+15V voltage, the input end of operational amplifier U5A is connected with the output terminal of operational amplifier U5A,
The output terminal of operational amplifier U5A is also connected with one end of resistance R22; the other end of resistance R22 is connected with the end of oppisite phase of operational amplifier U6A; the in-phase end of operational amplifier U6A is connected with one end of resistance R21; the other end of resistance R21 is connected with one end of one end of resistance R19 and resistance R20; the other end ground connection of resistance R20; the other end of resistance R19 is connected with+15V voltage; and the other end of resistance R19 is connected with one end of electric capacity C3; the other end ground connection of electric capacity C3, the output terminal of operational amplifier U6A is connected with driving interlock protection circuit.
In the embodiment of the present invention; diode D4 and diode D6 is utilized to form mu balanced circuit; modulate circuit is formed by resistance R14, resistance R15, resistance R16, resistance R17 and resistance R18; operational amplifier U5A coating-forming voltage follower; obtain the second predetermined current protection threshold value by resistance R19, resistance R20 and resistance R21, the second predetermined current protection threshold value is herein magnitude of voltage.The second measuring current value that second current transformer U2 detects by operational amplifier U6A coating-forming voltage value after modulate circuit and operational amplifier U5A; threshold value is protected to compare described magnitude of voltage and the second predetermined current; to determine the output of operational amplifier U6A, namely determine whether operational amplifier U6A exports the second interlocking cut-off signals to driving interlock protection circuit.During concrete enforcement; first current transformer U1 is different with the second current transformer U2 current protection value in circuit; first the first predetermined current protection threshold value detected in comparator circuit is less than the second predetermined current protection threshold value in the second detection comparator circuit, and wherein the installation direction in circuit of the first current transformer U1 and the second current transformer U2 is contrary.
As shown in Figure 5, described driving detects comparator circuit and comprises operational amplifier U7A, the in-phase end ground connection of operational amplifier U7A, the end of oppisite phase of operational amplifier U7A is connected with one end of one end of electric capacity C4 and resistance R23, the other end of electric capacity C4 is connected with the cathode terminal of diode D7, the anode tap of diode D8 and the output terminal of driving circuit, the anode tap of diode D7 is connected with-15V voltage, the cathode terminal of diode D8 is connected with+15V voltage, and the other end of resistance R23 is connected with one end of the output terminal of operational amplifier U7A and resistance R24;
The other end of resistance R24 is connected with one end of one end of electric capacity C19 and resistance R25, the other end of resistance R25 is connected with one end of the in-phase end of operational amplifier U8B and electric capacity C5, the other end ground connection of electric capacity C5, the other end of electric capacity C19 is connected with the output terminal of operational amplifier U8B, the end of oppisite phase of operational amplifier U8B is connected with the output terminal of operational amplifier U8B, and the output terminal of operational amplifier U8B is also connected with one end of resistance R26;
The other end of resistance R26 is connected with the end of oppisite phase of one end of resistance R27 and operational amplifier U9B, the in-phase end ground connection of operational amplifier U9B, the other end of resistance R27 is connected with one end of the output terminal of operational amplifier U9B and resistance R31, the other end of resistance R31 is connected with the end of oppisite phase of operational amplifier U10A, the in-phase end of operational amplifier U10A is connected with one end of resistance R30, the other end of resistance R30 is connected with one end of one end of resistance R29 and resistance R28, the other end ground connection of resistance R29, the other end of resistance R28 is connected with+15V voltage, and the other end of resistance R28 is connected with one end of electric capacity C6, the other end ground connection of electric capacity C6, the output terminal of operational amplifier U10A is connected with driving interlock protection circuit.
In the embodiment of the present invention, mu balanced circuit is formed by diode D7 and diode D8, the dipulse drive singal that driving circuit exports is loaded into the end of oppisite phase of operational amplifier U7A by electric capacity C4, and described dipulse drive singal is compared with the 3rd predetermined current threshold, the 3rd predetermined current threshold can pass through resistance R28, resistance R29 and resistance R30 and realize.
During normal work, accompany survey device IGBT1 to be in negative pressure off state, protection device IGBT3 conducting under the effect of monopulse drive singal, then test component IGBT2 turns on and off under the effect of dipulse drive singal.By the second current transformer U2, collector emitter voltage Vce, the collector current Ic of test component IGBT2 and gate voltage Vge are detected, test component IGBT2 is when first time turns off and second time turns off, electric current flows through load L again to the first current transformer U1 from the positive terminal of power supply, finally flow through from fly-wheel diode, at this moment direction of current is just.When first time opens and second time opens; electric current flows through load L again to protection device IGBT3 from the positive pole of power supply; then finally flow through by test component IGBT2 the negative pole end that the second current transformer U2 gets back to power supply, the value that the second current transformer U2 detects just is.In the process convection current of turning on and off, the electric current of device IGBT2 and the dipulse drive singal that is recorded test component IGBT2 gate pole end detect after tested; respectively detection is carried out to the second measuring current and dipulse drive singal compare by the second detection comparator circuit, driving detection comparator circuit, determine whether to need to turn off test component IGBT2 and protection device IGBT3 by driving circuit according to comparative result simultaneously.
When testing; when test component IGBT2 turns off for the first time under the effect of dipulse drive singal; there is breech lock in test component IGBT2; the first measuring current that so the first current transformer U1 detects inherently is greater than the first predetermined current protection threshold value in the first detection comparator circuit; now the first detection comparator circuit can drive interlock protection circuit to export the first interlocking cut-off signals mutually; turn off test component IGBT2 and protection device IGBT3 by driving circuit simultaneously, reach the object of relay testing device IGBT2.If when test component IGBT2 turns off for the second time under the effect of dipulse drive singal; there is breech lock in test component IGBT2; the second measuring current that second current transformer U2 detects is greater than the second predetermined current protection threshold value; or drive the dipulse driving circuit detecting comparator circuit detection to be greater than the 3rd predetermined current protection threshold value; now; drive interlock protection circuit all to driving circuit output interlocking cut-off signals; turn off test component IGBT2 and protection device IGBT3 by driving circuit simultaneously, reach the object of relay testing device IGBT2.
The present invention utilizes the first current transformer U1 to carry out detection to the first measuring current to compare, utilize the second current transformer U2 to carry out detection to the second test circuit to compare, utilize driving detection comparator circuit to carry out detection to dipulse drive singal to compare, drive interlock protection circuit can determine whether that phase driving circuit exports according to comparative result and drive cut-off signals, driving circuit can turn off test component IGBT2 and protection device IGBT3 after receiving driving cut-off signals simultaneously, reach, when breech lock appears in IGBT dynamic test, available protecting is carried out to test circuit and testing apparatus, guarantee the safe and reliable of test process.
Claims (7)
1. a dynamic test latch protection circuit of IGBT, comprises test component IGBT2 and is in accompanying of negative pressure off state all the time and survey device IGBT1; It is characterized in that: also comprise protection device IGBT3, describedly the collector surveying device IGBT1 is accompanied to be connected with the positive terminal of power supply and one end of load L connects, accompany the emitter terminal surveying device IGBT1 to be connected with the collector terminal of protection device IGBT3 by the first current transformer U1, the other end of load L is also connected with the collector terminal of protection device IGBT3; The emitter terminal of protection device IGBT3 and the collector terminal of test component IGBT2, the emitter terminal of test component IGBT2 is connected to the negative pole end of power supply by the second current transformer U2;
The gate pole end of protection device IGBT3, the gate pole end of test component IGBT2 are all connected with the output terminal of driving circuit, monopulse drive singal needed for driving circuit energy output protection device IGBT3, and driving circuit can export the dipulse drive singal needed for test component IGBT2 test; The output terminal and first of the first current transformer U1 detects comparator circuit and is connected, the output terminal and second of the second current transformer U2 detects comparator circuit and is connected, the output terminal that first output terminal, second detecting comparator circuit detects comparator circuit is all connected with driving interlock protection circuit, the output terminal of interlock protection circuit is driven to be connected with driving circuit, the output terminal that driving circuit is connected with test component IGBT2 gate pole end also detects comparator circuit with driving and is connected, and drives the output terminal detecting comparator circuit to be connected with driving the input end of interlock protection circuit;
First detects the first measuring current value that comparator circuit receives the first current transformer U1 detection, if when the first measuring current value and described first the first predetermined current detected in comparator circuit protects threshold value to mate, first detects comparator circuit can export the first interlocking cut-off signals to driving interlock protection circuit; Second detects the second measuring current value that comparator circuit receives the second current transformer U2 detection, if when the second measuring current value and described second the second predetermined current detected in comparator circuit protects threshold value to mate, second detects comparator circuit can export the second interlocking cut-off signals to driving interlock protection circuit; Drive detection comparator circuit can receive the dipulse drive singal that driving circuit is loaded into test component IGBT2 gate pole, if when dipulse drive singal protects threshold value to mate with driving the 3rd predetermined current detected in comparator circuit, drive detection comparator circuit can export the 3rd interlocking cut-off signals to driving interlock protection circuit;
Drive interlock protection circuit after receiving the first interlocking cut-off signals, the second interlocking cut-off signals or the 3rd interlocking cut-off signals; drive interlock protection circuit can export to driving circuit and drive cut-off signals, to turn off test component IGBT2 and protection device IGBT3 by driving circuit simultaneously.
2. the dynamic test latch protection circuit of IGBT according to claim 1; it is characterized in that: described protection device IGBT3 is greater than the service time of test component IGBT2 in the effect of dipulse drive singal in the service time of monopulse drive singal effect, test component IGBT2 surveys device IGBT1 and adopts identical IGBT device with accompanying.
3. the dynamic test latch protection circuit of IGBT according to claim 1, it is characterized in that: described first detects comparator circuit comprises operational amplifier U3A, the in-phase end of operational amplifier U3 is connected with one end of resistance R9, the other end of resistance R9 and one end of resistance R8, one end of resistance R7, one end of resistance R6, one end of resistance R5, the cathode terminal of diode D3, the anode tap of diode D5 and the output terminal of the first current transformer U1 connect, the other end of resistance R5, the other end of resistance R6, the other end of resistance R7 and the equal ground connection of the other end of resistance R8, the anode tap of diode D3 is connected with-15V voltage, the cathode terminal of diode D5 is connected with+15V voltage, the end of oppisite phase of operational amplifier U3A is connected with the output terminal of operational amplifier U3,
The output terminal of operational amplifier U3A is connected with one end of resistance R13; the other end of resistance R13 is connected with the in-phase end of operational amplifier U4A; the end of oppisite phase of operational amplifier U4A is connected with one end of resistance R12; the other end of resistance R12 is connected with one end of one end of resistance R11 and resistance R10; the other end of resistance R11 connects; the other end of resistance R10 is connected with one end of-15V voltage and electric capacity C2; the other end ground connection of electric capacity C2, the output terminal of operational amplifier U4A is connected with driving interlock protection circuit.
4. the dynamic test latch protection circuit of IGBT according to claim 1, it is characterized in that: described second detects comparator circuit comprises operational amplifier U5A, the in-phase end of described operational amplifier U5A is connected with one end of resistance R18, the other end of resistance R18 and one end of resistance R17, one end of resistance R16, one end of resistance R15, one end of resistance R14, the cathode terminal of diode D4, the anode tap of diode D6 and the output terminal of the second current transformer U2 connect, the other end of resistance R14, the other end of resistance R15, the other end of resistance R16 and the equal ground connection of the other end of resistance R17, the anode tap of diode D4 is connected with-15V voltage, the cathode terminal of diode D6 is connected with+15V voltage, the input end of operational amplifier U5A is connected with the output terminal of operational amplifier U5A,
The output terminal of operational amplifier U5A is also connected with one end of resistance R22; the other end of resistance R22 is connected with the end of oppisite phase of operational amplifier U6A; the in-phase end of operational amplifier U6A is connected with one end of resistance R21; the other end of resistance R21 is connected with one end of one end of resistance R19 and resistance R20; the other end ground connection of resistance R20; the other end of resistance R19 is connected with+15V voltage; and the other end of resistance R19 is connected with one end of electric capacity C3; the other end ground connection of electric capacity C3, the output terminal of operational amplifier U6A is connected with driving interlock protection circuit.
5. the dynamic test latch protection circuit of IGBT according to claim 1, it is characterized in that: described driving detects comparator circuit and comprises operational amplifier U7A, the in-phase end ground connection of operational amplifier U7A, the end of oppisite phase of operational amplifier U7A is connected with one end of one end of electric capacity C4 and resistance R23, the other end of electric capacity C4 and the cathode terminal of diode D7, the anode tap of diode D8 and the output terminal of driving circuit connect, the anode tap of diode D7 is connected with-15V voltage, the cathode terminal of diode D8 is connected with+15V voltage, the other end of resistance R23 is connected with one end of the output terminal of operational amplifier U7A and resistance R24,
The other end of resistance R24 is connected with one end of one end of electric capacity C19 and resistance R25, the other end of resistance R25 is connected with one end of the in-phase end of operational amplifier U8B and electric capacity C5, the other end ground connection of electric capacity C5, the other end of electric capacity C19 is connected with the output terminal of operational amplifier U8B, the end of oppisite phase of operational amplifier U8B is connected with the output terminal of operational amplifier U8B, and the output terminal of operational amplifier U8B is also connected with one end of resistance R26;
The other end of resistance R26 is connected with the end of oppisite phase of one end of resistance R27 and operational amplifier U9B, the in-phase end ground connection of operational amplifier U9B, the other end of resistance R27 is connected with one end of the output terminal of operational amplifier U9B and resistance R31, the other end of resistance R31 is connected with the end of oppisite phase of operational amplifier U10A, the in-phase end of operational amplifier U10A is connected with one end of resistance R30, the other end of resistance R30 is connected with one end of one end of resistance R29 and resistance R28, the other end ground connection of resistance R29, the other end of resistance R28 is connected with+15V voltage, and the other end of resistance R28 is connected with one end of electric capacity C6, the other end ground connection of electric capacity C6, the output terminal of operational amplifier U10A is connected with driving interlock protection circuit.
6. the dynamic test latch protection circuit of IGBT according to claim 1; it is characterized in that: the gate pole of described protection device IGBT3 is connected with one end of one end of resistance R1 and resistance R2; the other end of resistance R2 is connected with the cathode terminal of diode D1; the anode tap of diode D1 is connected with the other end of resistance R1, and the anode tap of diode D1 is connected for the output terminal exporting monopulse drive singal with driving circuit.
7. the dynamic test latch protection circuit of IGBT according to claim 1; it is characterized in that: the gate pole end of described test component IGBT2 is connected with one end of one end of resistance R3 and resistance R4; the other end of resistance R4 is connected with the cathode terminal of diode D2, and the anode tap of diode D2 is connected for the output terminal exporting dipulse drive singal with driving circuit.
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