CN105116184B - IGBT dynamic test latch protection circuit - Google Patents
IGBT dynamic test latch protection circuit Download PDFInfo
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- CN105116184B CN105116184B CN201510600812.4A CN201510600812A CN105116184B CN 105116184 B CN105116184 B CN 105116184B CN 201510600812 A CN201510600812 A CN 201510600812A CN 105116184 B CN105116184 B CN 105116184B
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Abstract
The present invention relates to the dynamic test latch protection circuit of IGBT a kind of, its emitter terminal for testing device IGBT2 is connected to the negative pole end of power supply by the second current transformer U2；Protection device IGBT3 gate terminal, test device IGBT2 gate terminal is connected with the output end of drive circuit；First current transformer U1 output end is connected with the first detection comparison circuit; second current transformer U2 output end is connected with the second detection comparison circuit; the output end of first detection comparison circuit, the output end of the second detection comparison circuit are connected with driving interlock protection circuit, and the output end of driving interlock protection circuit is connected with drive circuit；Compact conformation of the present invention, can IGBT dynamically test there is breech lock when test circuit and test equipment are effectively protected, it is ensured that test process it is safe and reliable.
Description
Technical field
The present invention relates to a kind of protection circuit, especially a kind of IGBT dynamic test latch protection circuit belongs to IGBT
The technical field of dynamic test.
Background technology
Currently in the applied power electronics such as frequency converter, reactive-load compensation, photovoltaic field, power semiconductor IGBT device is obtained
It is widely applied.In the application, IGBT plays a part of core as the energy conversion unit in whole circuit, and IGBT is being set
In the various process such as meter, transport, storage can all influence be produced on IGBT performance.
At present, before IGBT device is assembled in complete machine, the dynamic that dipulse is carried out to IGBT using half-bridge circuit is tested
To verify its performance, specific test circuit is as shown in Figure 1.In Fig. 1, illustrate that dipulse is surveyed by the lower half-bridge IGBT of test
The performance of circuit is tried, wherein U is voltage source, and L is load inductance, and T2 is the IGBT of lower half-bridge, and VD1 is the pole of afterflow two of upper half-bridge
Pipe, utilizes electric current IC, voltage Vce and the driving of the IGBT of half-bridge under oscillograph, Current Voltage probe test in test process
Voltage Vge, upper half-bridge igbt chip T1 are in negative pressure off state.For excellent IGBT device, this platform can be verified
IGBT performance, will not cause damage to device and drive circuit, it is contemplated that device itself design defect, ambient influnence etc.
Factor, when being tested using this circuit igbt chip T2, can occur breech lock, as a result cause igbt chip when off
T1, igbt chip T2 and driving power supply are damaged, and worse cause the damage of power supply or even equipment, even public to tester
Department brings very big loss.
The content of the invention
The purpose of the present invention is to overcome the deficiencies in the prior art to protect electricity there is provided the Dynamic latch of IGBT a kind of
Road, its compact conformation can effectively be protected, really in IGBT when dynamically breech lock occurs in test to test circuit and test equipment
Protect the safe and reliable of test process.
The technical scheme provided according to the present invention, the dynamic test latch protection circuit of the IGBT, including test device
IGBT2 and in negative pressure off state accompanying survey device IGBT1 all the time；It is described to accompany survey device also including protection device IGBT3
The IGBT1 positive terminal connection of colelctor electrode and power supply and load L1 one end are connected, and accompany the emitter terminal for surveying device IGBT1 to lead to
The first current transformer U1 is crossed to be connected with protection device IGBT3 collector terminal, load L1 the other end also with protection device
IGBT3 collector terminal connection；The collector terminal of protection device IGBT3 emitter terminal and test device IGBT2, tests device
IGBT2 emitter terminal is connected to the negative pole end of power supply by the second current transformer U2；
Protection device IGBT3 gate terminal, test device IGBT2 gate terminal is connected with the output end of drive circuit,
Pulse drive signal needed for drive circuit energy output protection device IGBT3, and drive circuit can export test device IGBT2
Dipulse drive signal needed for test；First current transformer U1 output end is connected with the first detection comparison circuit, and second
Current transformer U2 output end is connected with the second detection comparison circuit, the output end of the first detection comparison circuit, the second detection
The output end of comparison circuit is connected with driving interlock protection circuit, and the output end and drive circuit for driving interlock protection circuit connect
Connect, the output end that drive circuit is connected with test device IGBT2 gate terminals is also connected with driving detection comparison circuit, driving detection
The output end of comparison circuit is with driving the input of interlock protection circuit to be connected；
First detection comparison circuit receives the first test current value of the first current transformer U1 detections, if the first test electricity
When flow valuve match with the first predetermined current rotection thresholds in the described first detection comparison circuit, first detects that comparison circuit can be to
Interlock protection circuit output first is driven to interlock cut-off signals；Second detection comparison circuit receives the second current transformer U2 detections
Second test current value, if second test current value with described second detection comparison circuit in the second predetermined current protection threshold
During value matching, the second detection comparison circuit can interlock cut-off signals to driving interlock protection circuit output second；Driving detection ratio
The dipulse drive signal that drive circuit is loaded into test device IGBT2 gate poles can be received compared with circuit, if dipulse drive signal
When being matched with the 3rd predetermined current rotection thresholds in driving detection comparison circuit, driving detection comparison circuit can be interlocked to driving
Protection circuit output the 3rd interlocks cut-off signals；
Driving interlock protection circuit is receiving the first interlocking cut-off signals, the second interlocking cut-off signals or the 3rd interlocking pass
After break signal, driving interlock protection circuit can be to drive circuit output driving cut-off signals, to be simultaneously turned off by drive circuit
Test device IGBT2 and protection device IGBT3.
The protection device IGBT3 is more than test device IGBT2 in the service time that pulse drive signal is acted on double
The service time of pulse drive signal effect, test device IGBT2 is with accompanying survey device IGBT1 to use identical IGBT devices
Part.
The first detection comparison circuit includes operational amplifier U3A, operational amplifier U3 A in-phase end and resistance R9
One end connection, the resistance R9 other end and resistance R8 one end, resistance R7 one end, resistance R6 one end, the one of resistance R5
The output end connection at end, diode D3 cathode terminal, diode D5 anode tap and the first current transformer U1, resistance R5's
The other end, the resistance R6 other end, the resistance R7 other end and resistance the R8 other end are grounded, diode D3 anode tap
It is connected with -15V voltages, diode D5 cathode terminal is connected with+15V voltages, operational amplifier U3A end of oppisite phase and operation amplifier
Device U3A output end connection；
Operational amplifier U3A output end is connected with resistance R13 one end, resistance the R13 other end and operational amplifier
U4A in-phase end connection, operational amplifier U4A end of oppisite phase is connected with resistance R12 one end, resistance the R12 other end and electricity
Hinder R11 one end and resistance R10 one end connection, resistance R11 other end ground connection, resistance the R10 other end and -15V electricity
Pressure and electric capacity C2 one end connection, electric capacity C2 other end ground connection, operational amplifier U4A output end and driving interlock protection
Circuit is connected.
The second detection comparison circuit includes operational amplifier U5A, the in-phase end and resistance of the operational amplifier U5A
R18 one end connection, the resistance R18 other end and resistance R17 one end, resistance R16 one end, resistance R15 one end, resistance
R14 one end, diode D4 cathode terminal, diode D6 anode tap and the second current transformer U2 output end connection,
The resistance R14 other end, the resistance R15 other end, the resistance R16 other end and resistance the R17 other end are grounded, two poles
Pipe D4 anode tap is connected with -15V voltages, and diode D6 cathode terminal is connected with+15V voltages, and operational amplifier U5A's is anti-phase
End is connected with operational amplifier U5A output end；
The one end of operational amplifier U5A output end also with resistance R22 is connected, resistance the R22 other end and operation amplifier
Device U6A end of oppisite phase connection, operational amplifier U6A in-phase end is connected with resistance R21 one end, the resistance R21 other end and
Resistance R19 one end and resistance R20 one end connection, resistance R20 other end ground connection, resistance the R19 other end and+15V
Voltage is connected, and the resistance R19 other end is connected with electric capacity C3 one end, electric capacity C3 other end ground connection, operational amplifier U6A
Output end with driving interlock protection circuit be connected.
The driving detection comparison circuit includes operational amplifier U7A, and operational amplifier U7A in-phase end is grounded, computing
Amplifier U7A end of oppisite phase is connected with electric capacity C4 one end and resistance R23 one end, electric capacity the C4 other end and diode D7
Cathode terminal, the output end connection of diode D8 anode tap and drive circuit, diode D7 anode tap and -15V voltages
Connection, diode D8 cathode terminal is connected with+15V voltages, the resistance R23 other end and operational amplifier U7A output end with
And resistance R24 one end connection；
The resistance R24 other end is connected with electric capacity C19 one end and resistance R25 one end, the resistance R25 other end with
One end connection of operational amplifier U8B in-phase end and electric capacity C5, electric capacity C5 other end ground connection, the electric capacity C19 other end
It is connected with operational amplifier U8B output end, operational amplifier U8B end of oppisite phase is connected with operational amplifier U8B output end,
The one end of operational amplifier U8B output end also with resistance R26 is connected；
The resistance R26 other end is connected with resistance R27 one end and operational amplifier U9B end of oppisite phase, operation amplifier
Device U9B in-phase end ground connection, one end of the resistance R27 other end and operational amplifier U9B output end and resistance R31 connects
Connect, the resistance R31 other end is connected with operational amplifier U10A end of oppisite phase, operational amplifier U10A in-phase end and resistance
R30 one end connection, the resistance R30 other end is connected with one end of resistance R29 one end and resistance R28, and resistance R29's is another
One end is grounded, the resistance R28 other end is connected with+15V voltages, and the resistance R28 other end is connected with electric capacity C6 one end,
Electric capacity C6 other end ground connection, operational amplifier U10A output end is connected with driving interlock protection circuit.
The gate pole of the protection device IGBT3 is connected with one end of resistance R1 one end and resistance R2, and resistance R2's is another
One end is connected with diode D1 cathode terminal, and diode D1 anode tap is connected with the resistance R1 other end, and diode D1
The output end that anode tap is used to export pulse drive signal with drive circuit is connected.
The gate terminal of the test device IGBT2 is connected with resistance R3 one end and resistance R4 one end, resistance R4's
The other end is connected with diode D2 cathode terminal, and diode D2 anode tap and drive circuit are used to export dipulse drive signal
Output end connection.
Advantages of the present invention：Detection comparison is carried out to the first test electric current using the first current transformer U1, second is utilized
Current transformer U2 carries out detection comparison to the second test circuit, and dipulse drive signal is entered using driving detection comparison circuit
Row detection is compared, and driving interlock protection circuit is capable of determining whether phase drive circuit output driving cut-off signals according to comparative result,
Drive circuit can simultaneously turn off test device IGBT2 and protection device IGBT3 after driving cut-off signals are received, and reach
IGBT is effectively protected when dynamically breech lock occurs in test to test circuit and test equipment, it is ensured that the safety of test process can
Lean on.
Brief description of the drawings
Circuit theory diagrams when Fig. 1 is the existing device progress dipulse test to test.
Fig. 2 is structured flowchart of the invention.
Fig. 3 detects the circuit theory diagrams of comparison circuit for the present invention first.
Fig. 4 detects the circuit theory diagrams of comparison circuit for the present invention second.
Fig. 5 detects the circuit theory diagrams of comparison circuit for present invention driving.
Embodiment
With reference to specific drawings and examples, the invention will be further described.
As shown in Figure 2：In order to be able to have in IGBT when dynamically breech lock occurs in test to test circuit and test equipment
Effect protection, it is ensured that safe and reliable, the IGBT of the present invention dynamic test latch protection circuit of test process, including tester
Part IGBT2 and in negative pressure off state accompanying survey device IGBT1 all the time；It is described to accompany survey device also including protection device IGBT3
The part IGBT1 positive terminal connection of colelctor electrode and power supply and load L1 one end are connected, and accompany the emitter terminal for surveying device IGBT1
Be connected by the first current transformer U1 with protection device IGBT3 collector terminal, load L1 the other end also with protection device
IGBT3 collector terminal connection；The collector terminal of protection device IGBT3 emitter terminal and test device IGBT2, tests device
IGBT2 emitter terminal is connected to the negative pole end of power supply by the second current transformer U2；
Protection device IGBT3 gate terminal, test device IGBT2 gate terminal is connected with the output end of drive circuit,
Pulse drive signal needed for drive circuit energy output protection device IGBT3, and drive circuit can export test device IGBT2
Dipulse drive signal needed for test；First current transformer U1 output end is connected with the first detection comparison circuit, and second
Current transformer U2 output end is connected with the second detection comparison circuit, the output end of the first detection comparison circuit, the second detection
The output end of comparison circuit is connected with driving interlock protection circuit, and the output end and drive circuit for driving interlock protection circuit connect
Connect, the output end that drive circuit is connected with test device IGBT2 gate terminals is also connected with driving detection comparison circuit, driving detection
The output end of comparison circuit is with driving the input of interlock protection circuit to be connected；
First detection comparison circuit receives the first test current value of the first current transformer U1 detections, if the first test electricity
When flow valuve match with the first predetermined current rotection thresholds in the described first detection comparison circuit, first detects that comparison circuit can be to
Interlock protection circuit output first is driven to interlock cut-off signals；Second detection comparison circuit receives the second current transformer U2 detections
Second test current value, if second test current value with described second detection comparison circuit in the second predetermined current protection threshold
During value matching, the second detection comparison circuit can interlock cut-off signals to driving interlock protection circuit output second；Driving detection ratio
The dipulse drive signal that drive circuit is loaded into test device IGBT2 gate poles can be received compared with circuit, if dipulse drive signal
When being matched with the 3rd predetermined current rotection thresholds in driving detection comparison circuit, driving detection comparison circuit can be interlocked to driving
Protection circuit output the 3rd interlocks cut-off signals；
Driving interlock protection circuit is receiving the first interlocking cut-off signals, the second interlocking cut-off signals or the 3rd interlocking pass
After break signal, driving interlock protection circuit can be to drive circuit output driving cut-off signals, to be simultaneously turned off by drive circuit
Test device IGBT2 and protection device IGBT3.
Specifically, the gate terminal for surveying device IGBT1 and emitter terminal access battery pack are being accompanied, wherein accompanying survey device IGBT1
Gate terminal and the negative pole end of battery pack connect, the positive terminal of battery pack and accompany survey device IGBT1 emitter terminal to be connected so that
Survey device IGBT1 must be accompanied to be in negative pressure off state all the time.Accompany survey device IGBT1, protection device IGBT3 and test device
Fly-wheel diode is set respectively on IGBT2.
The first testing current value is matched with the first predetermined current rotection thresholds refers to the first testing current value more than
Scope where one predetermined current rotection thresholds, or more than the first predetermined current rotection thresholds.Second testing current value and second
The matching of predetermined current rotection thresholds, the concrete condition that is matched with the 3rd predetermined current rotection thresholds of dipulse drive signal with it is above-mentioned
First testing current value is identical with the situation of the first predetermined current rotection thresholds, no longer repeats one by one.
The protection device IGBT3 is more than test device IGBT2 in the service time that pulse drive signal is acted on double
The service time of pulse drive signal effect, test device IGBT2 is with accompanying survey device IGBT1 to use identical IGBT devices
Part.Protection device IGBT3 Current Voltage grade is bigger than test device IGBT2.
The gate pole of the protection device IGBT3 is connected with one end of resistance R1 one end and resistance R2, and resistance R2's is another
One end is connected with diode D1 cathode terminal, and diode D1 anode tap is connected with the resistance R1 other end, and diode D1
The output end that anode tap is used to export pulse drive signal with drive circuit is connected.During proper testing, drive circuit can be exported
Pulse drive signal, the pulse drive signal is loaded into after being handled by diode D1, resistance R1 and resistance R2
On protection device IGBT3, to drive protection device IGBT3 to turn on.
The gate terminal of the test device IGBT2 is connected with resistance R3 one end and resistance R4 one end, resistance R4's
The other end is connected with diode D2 cathode terminal, and diode D2 anode tap and drive circuit are used to export dipulse drive signal
Output end connection.During proper testing, drive circuit can export dipulse drive signal, and the dipulse drive signal passes through two
Test device IGBT2 gate terminal can be loaded into after pole pipe D2, resistance R3 and resistance R4, to drive test device IGBT2 to lead
It is logical.During proper testing, protection device IGBT3 is open-minded prior to test device IGBT2, and after test device IGBT2 shut-offs.
Drive circuit exports specific pulse drive signal, dipulse drive signal and can selected as needed,
Drive circuit can use existing conventional IDE, and the specific implementation of drive circuit is embodied as those skilled in the art
Known, here is omitted.After drive circuit receives the driving cut-off signals of driving interlock protection circuit, drive circuit
Stop output pulse drive signal and dipulse drive signal so that protection device IGBT3 and test device IGBT2 are same
When be off state, reach to test device IGBT2 and associated test devices protection.When it is implemented, first is default
Current protection threshold value, the second current protection threshold value and the 3rd current threshold can be according to test device IGBT2 and correlative measurements
The requirement for trying equipment carries out selection determination, and specifically chosen determination process is that here is omitted known to those skilled in the art.
As shown in figure 3, the first detection comparison circuit includes operational amplifier U3A, operational amplifier U3A in-phase end
It is connected with resistance R9 one end, the resistance R9 other end and resistance R8 one end, resistance R7 one end, resistance R6 one end, electricity
R5 one end, diode D3 cathode terminal, diode D5 anode tap and the first current transformer U1 output end connection are hindered,
The resistance R5 other end, the resistance R6 other end, the resistance R7 other end and resistance the R8 other end are grounded, diode D3
Anode tap be connected with -15V voltages, diode D5 cathode terminal is connected with+15V voltages, operational amplifier U3A end of oppisite phase with
Operational amplifier U3A output end connection；
Operational amplifier U3A output end is connected with resistance R13 one end, resistance the R13 other end and operational amplifier
U4A in-phase end connection, operational amplifier U4A end of oppisite phase is connected with resistance R12 one end, resistance the R12 other end and electricity
Hinder R11 one end and resistance R10 one end connection, resistance R11 other end ground connection, resistance the R10 other end and -15V electricity
Pressure and electric capacity C2 one end connection, electric capacity C2 other end ground connection, operational amplifier U4A output end and driving interlock protection
Circuit is connected.
In the embodiment of the present invention, diode D3 and diode D5 coordinate, and can realize the effect of voltage stabilizing, resistance R5, resistance R6,
Resistance R7, resistance R8 and resistance R9 composition current regulating circuits, operational amplifier U3A formation voltage followers.Pass through resistance
R10, resistance R11 and resistance R12 cooperation, can obtain the first required predetermined current rotection thresholds, i.e. the first Current Mutual Inductance
First predetermined current rotection thresholds of the electric current of device U1 detections after operational amplifier U3A with operational amplifier U4A end of oppisite phase
（It is a magnitude of voltage herein）It is compared, so that it is determined that operational amplifier U4A output, that is, determine operational amplifier U4A's
Whether output end interlocks cut-off signals to driving interlock protection circuit output first.
As shown in figure 4, the second detection comparison circuit includes operational amplifier U5A, the operational amplifier U5A's is same
Phase end is connected with resistance R18 one end, the resistance R18 other end and resistance R17 one end, resistance R16 one end, resistance R15
One end, resistance R14 one end, diode D4 cathode terminal, diode D6 anode tap and the second current transformer U2
Output end is connected, the resistance R14 other end, the resistance R15 other end, the resistance R16 other end and resistance the R17 other end
It is grounded, diode D4 anode tap is connected with -15V voltages, diode D6 cathode terminal is connected with+15V voltages, operation amplifier
Device U5A end of oppisite phase is connected with operational amplifier U5A output end；
The one end of operational amplifier U5A output end also with resistance R22 is connected, resistance the R22 other end and operation amplifier
Device U6A end of oppisite phase connection, operational amplifier U6A in-phase end is connected with resistance R21 one end, the resistance R21 other end and
Resistance R19 one end and resistance R20 one end connection, resistance R20 other end ground connection, resistance the R19 other end and+15V
Voltage is connected, and the resistance R19 other end is connected with electric capacity C3 one end, electric capacity C3 other end ground connection, operational amplifier U6A
Output end with driving interlock protection circuit be connected.
In the embodiment of the present invention, mu balanced circuit can be formed using diode D4 and diode D6, passes through resistance R14, electricity
R15, resistance R16, resistance R17 and resistance R18 formation modulate circuits are hindered, operational amplifier U5A formation voltage followers pass through
Resistance R19, resistance R20 and resistance R21 obtain the second predetermined current rotection thresholds, the second predetermined current rotection thresholds herein
For magnitude of voltage.The second test conditioned circuit of current value and fortune that operational amplifier U6A detects the second current transformer U2
Magnitude of voltage is formed after calculating amplifier U5A, the magnitude of voltage is compared with the second predetermined current rotection thresholds, to determine operation amplifier
Device U6A output, that is, determine whether operational amplifier U6A interlocks cut-off signals to driving interlock protection circuit output second.Tool
When body is implemented, the current protection value of the first current transformer U1 and the second current transformer U2 in circuit is different, the first detection
The first predetermined current rotection thresholds in comparison circuit are less than the second predetermined current rotection thresholds in the second detection comparison circuit,
Wherein the first current transformer U1 and the second current transformer U2 installation direction in circuit are opposite.
As shown in figure 5, the driving detection comparison circuit includes operational amplifier U7A, operational amplifier U7A in-phase end
Ground connection, operational amplifier U7A end of oppisite phase is connected with one end of electric capacity C4 one end and resistance R23, the electric capacity C4 other end
Cathode terminal, diode D8 anode tap and the output end of drive circuit with diode D7 are connected, diode D7 anode tap
It is connected with -15V voltages, diode D8 cathode terminal is connected with+15V voltages, resistance the R23 other end and operational amplifier U7A
Output end and resistance R24 one end connection；
The resistance R24 other end is connected with electric capacity C19 one end and resistance R25 one end, the resistance R25 other end with
One end connection of operational amplifier U8B in-phase end and electric capacity C5, electric capacity C5 other end ground connection, the electric capacity C19 other end
It is connected with operational amplifier U8B output end, operational amplifier U8B end of oppisite phase is connected with operational amplifier U8B output end,
The one end of operational amplifier U8B output end also with resistance R26 is connected；
The resistance R26 other end is connected with resistance R27 one end and operational amplifier U9B end of oppisite phase, operation amplifier
Device U9B in-phase end ground connection, one end of the resistance R27 other end and operational amplifier U9B output end and resistance R31 connects
Connect, the resistance R31 other end is connected with operational amplifier U10A end of oppisite phase, operational amplifier U10A in-phase end and resistance
R30 one end connection, the resistance R30 other end is connected with one end of resistance R29 one end and resistance R28, and resistance R29's is another
One end is grounded, the resistance R28 other end is connected with+15V voltages, and the resistance R28 other end is connected with electric capacity C6 one end,
Electric capacity C6 other end ground connection, operational amplifier U10A output end is connected with driving interlock protection circuit.
In the embodiment of the present invention, pass through diode D7 and diode D8 formation mu balanced circuits, pair of drive circuit output
Pulse drive signal is loaded into operational amplifier U7A end of oppisite phase by electric capacity C4, and by the dipulse drive signal and
Three predetermined current thresholds compare, and the 3rd predetermined current threshold can be realized by resistance R28, resistance R29 and resistance R30.
During normal work, survey device IGBT1 is accompanied to be in negative pressure off state, protection device IGBT3 drives in pulse to be believed
Number effect is lower turns on, and then tests device IGBT2 and is turned on and off under the effect of dipulse drive signal.It is mutual by the second electric current
Sensor U2 is examined to the collector emitter voltage Vce, collector current Ic and the gate voltage Vge that test device IGBT2
Survey, test device IGBT2 is when first time shut-off and second are turned off, and electric current flows through load L1 again to the from the positive terminal of power supply
One current transformer U1, finally flows through from fly-wheel diode, and at this moment the sense of current is just.Opened in first time and second open-minded
When, electric current flows through load L1 again to protection device IGBT3 from the positive pole of power supply, is then finally flowed through by testing device IGBT2
Second current transformer U2 returns to the negative pole end of power supply, and the value of the second current transformer U2 detections is just.Turning on and off
Device IGBT2 electric current and the dipulse drive signal for being recorded test device IGBT2 gate terminals are examined after tested for journey convection current
Survey, by the second detection comparison circuit, driving detection comparison circuit respectively to the second test electric current and dipulse drive signal
Detection comparison is carried out, is determined the need for simultaneously turning off test device IGBT2 and guarantor by drive circuit according to comparative result
Protect device IGBT3.
In test, when test device IGBT2 is turned off for the first time under the effect of dipulse drive signal, device is tested
There is breech lock in IGBT2, then it is more electric that the first test electric current of the first current transformer U1 detections is inherently more than the first detection
The first predetermined current rotection thresholds in road, now first detect that comparison circuit can mutually drive interlock protection circuit output first mutual
Cut-off signals are locked, test device IGBT2 and protection device IGBT3 is simultaneously turned off by drive circuit, protection tester is reached
Part IGBT2 purpose.If testing device IGBT2 during second of shut-off, device IGBT2 is tested under the effect of dipulse drive signal
There is breech lock, the second test electric current of the second current transformer U2 detections is more than the second predetermined current rotection thresholds, or driving inspection
The dipulse drive circuit for surveying comparison circuit detection is more than the 3rd predetermined current rotection thresholds, now, drives interlock protection circuit
To drive circuit output interlocking cut-off signals, test device IGBT2 and protection device are simultaneously turned off by drive circuit
IGBT3, reaches protection test device IGBT2 purpose.
The present invention carries out detection comparison using the first current transformer U1 to the first test electric current, utilizes the second Current Mutual Inductance
Device U2 carries out detection comparison to the second test circuit, and detection ratio is carried out to dipulse drive signal using driving detection comparison circuit
Compared with driving interlock protection circuit is capable of determining whether phase drive circuit output driving cut-off signals, drive circuit according to comparative result
Test device IGBT2 and protection device IGBT3 can be simultaneously turned off after driving cut-off signals are received, is reached in IGBT dynamics
Test is effectively protected to test circuit and test equipment when there is breech lock, it is ensured that test process it is safe and reliable.
Claims (7)
1. the dynamic test latch protection circuit of IGBT a kind of, including test device IGBT2 and be in negative pressure shut-off shape all the time
Device IGBT1 is surveyed in accompanying for state；It is characterized in that：It is described to accompany the colelctor electrode and electricity for surveying device IGBT1 also including protection device IGBT3
The positive terminal connection in source and load L1 one end connection, accompany the emitter terminal for surveying device IGBT1 to pass through the first current transformer
U1 is connected with protection device IGBT3 collector terminal, is loaded collector terminal of the L1 other end also with protection device IGBT3 and is connected
Connect；The collector terminal of protection device IGBT3 emitter terminal and test device IGBT2, test device IGBT2 emitter terminal leads to
Cross the negative pole end that the second current transformer U2 is connected to power supply；
Protection device IGBT3 gate terminal, test device IGBT2 gate terminal is connected with the output end of drive circuit, is driven
Pulse drive signal needed for circuit energy output protection device IGBT3, and drive circuit can export the IGBT2 tests of test device
Required dipulse drive signal；First current transformer U1 output end is connected with the first detection comparison circuit, the second electric current
Transformer U2 output end is connected with the second detection comparison circuit, and the output end of the first detection comparison circuit, the second detection are compared
The output end of circuit is connected with driving interlock protection circuit, and the output end of driving interlock protection circuit is connected with drive circuit,
The output end that drive circuit is connected with test device IGBT2 gate terminals is also connected with driving detection comparison circuit, driving detection ratio
Output end compared with circuit is connected with the input of driving interlock protection circuit；
First detection comparison circuit receives the first test current value of the first current transformer U1 detections, if the first test current value
When being matched with the first predetermined current rotection thresholds in the described first detection comparison circuit, the first detection comparison circuit can be to driving
Interlock protection circuit output first interlocks cut-off signals；Second detection comparison circuit receives the of the second current transformer U2 detections
Two test current values, if the second test current value and the second predetermined current rotection thresholds in the described second detection comparison circuit
Timing, the second detection comparison circuit can interlock cut-off signals to driving interlock protection circuit output second；Driving detection is more electric
Road can receive the dipulse drive signal that drive circuit is loaded into test device IGBT2 gate poles, if dipulse drive signal is with driving
When the 3rd predetermined current rotection thresholds in dynamic detection comparison circuit are matched, driving detection comparison circuit can be to driving interlock protection
Circuit output the 3rd interlocks cut-off signals；
Driving interlock protection circuit is receiving the first interlocking cut-off signals, the second interlocking cut-off signals or the 3rd interlocking shut-off letter
After number, driving interlock protection circuit can be to drive circuit output driving cut-off signals, to simultaneously turn off test by drive circuit
Device IGBT2 and protection device IGBT3.
2. IGBT according to claim 1 dynamic test latch protection circuit, it is characterized in that：The protection device
IGBT3 is more than test device IGBT2 in the service time that pulse drive signal is acted in opening that dipulse drive signal is acted on
The logical time, test device IGBT2 is with accompanying survey device IGBT1 to use identical IGBT device.
3. IGBT according to claim 1 dynamic test latch protection circuit, it is characterized in that：First detection is compared
Circuit includes operational amplifier U3A, and operational amplifier U3A in-phase end is connected with resistance R9 one end, the resistance R9 other end
One end, resistance R7 one end with resistance R8, resistance R6 one end, resistance R5 one end, diode D3 cathode terminal, diode
D5 anode tap and the first current transformer U1 output end connection, resistance the R5 other end, the resistance R6 other end, resistance
The R7 other end and the resistance R8 other end are grounded, and diode D3 anode tap is connected with -15V voltages, diode D5's
Cathode terminal is connected with+15V voltages, and operational amplifier U3A end of oppisite phase is connected with operational amplifier U3A output end；
Operational amplifier U3A output end is connected with resistance R13 one end, and the resistance R13 other end is with operational amplifier U4A's
In-phase end is connected, and operational amplifier U4A end of oppisite phase is connected with resistance R12 one end, resistance the R12 other end and resistance R11
One end and resistance R10 one end connection, resistance R11 other end ground connection, the resistance R10 other end and -15V voltages and
Electric capacity C2 one end connection, electric capacity C2 other end ground connection, operational amplifier U4A output end and driving interlock protection circuit connect
Connect.
4. IGBT according to claim 1 dynamic test latch protection circuit, it is characterized in that：Second detection is compared
Circuit includes operational amplifier U5A, and the in-phase end of the operational amplifier U5A is connected with resistance R18 one end, resistance R18's
The other end and resistance R17 one end, resistance R16 one end, resistance R15 one end, resistance R14 one end, diode D4 the moon
Extremely, diode D6 anode tap and the second current transformer U2 output end connection, resistance the R14 other end, resistance R15
The other end, the resistance R16 other end and resistance the R17 other end be grounded, diode D4 anode tap and -15V voltages
Connection, diode D6 cathode terminal is connected with+15V voltages, and operational amplifier U5A end of oppisite phase is defeated with operational amplifier U5A's
Go out end connection；
The one end of operational amplifier U5A output end also with resistance R22 is connected, resistance the R22 other end and operational amplifier U6A
End of oppisite phase connection, operational amplifier U6A in-phase end is connected with resistance R21 one end, resistance the R21 other end and resistance
R19 one end and resistance R20 one end connection, resistance R20 other end ground connection, resistance the R19 other end and+15V voltages
Connect, and the resistance R19 other end is connected with electric capacity C3 one end, electric capacity C3 other end ground connection, operational amplifier U6A's is defeated
Go out end to be connected with driving interlock protection circuit.
5. IGBT according to claim 1 dynamic test latch protection circuit, it is characterized in that：The driving detection is compared
Circuit includes operational amplifier U7A, and operational amplifier U7A in-phase end is grounded, operational amplifier U7A end of oppisite phase and electric capacity C4
One end and resistance R23 one end connection, the electric capacity C4 other end and diode D7 cathode terminal, diode D8 anode tap
And the output end connection of drive circuit, diode D7 anode tap is connected with -15V voltages, diode D8 cathode terminal and+
15V voltages are connected, and the resistance R23 other end is connected with one end of operational amplifier U7A output end and resistance R24；
The resistance R24 other end is connected with electric capacity C19 one end and resistance R25 one end, the resistance R25 other end and computing
One end connection of amplifier U8B in-phase end and electric capacity C5, electric capacity C5 other end ground connection, electric capacity the C19 other end and fortune
Amplifier U8B output end connection is calculated, operational amplifier U8B end of oppisite phase is connected with operational amplifier U8B output end, computing
The one end of amplifier U8B output end also with resistance R26 is connected；
The resistance R26 other end is connected with resistance R27 one end and operational amplifier U9B end of oppisite phase, operational amplifier U9B
In-phase end ground connection, the resistance R27 other end is connected with one end of operational amplifier U9B output end and resistance R31, resistance
The R31 other end is connected with operational amplifier U10A end of oppisite phase, operational amplifier U10A in-phase end and resistance R30 one end
Connection, the resistance R30 other end is connected with one end of resistance R29 one end and resistance R28, resistance R29 other end ground connection,
The resistance R28 other end is connected with+15V voltages, and the resistance R28 other end is connected with electric capacity C6 one end, electric capacity C6's
The other end is grounded, and operational amplifier U10A output end is connected with driving interlock protection circuit.
6. IGBT according to claim 1 dynamic test latch protection circuit, it is characterized in that：The protection device
IGBT3 gate pole is connected with resistance R1 one end and resistance R2 one end, the resistance R2 other end and diode D1 negative electrode
End connection, diode D1 anode tap is connected with the resistance R1 other end, and diode D1 anode tap is used for drive circuit
Export the output end connection of pulse drive signal.
7. IGBT according to claim 1 dynamic test latch protection circuit, it is characterized in that：The test device
IGBT2 gate terminal is connected with resistance R3 one end and resistance R4 one end, the resistance R4 other end and diode D2 the moon
Extreme connection, diode D2 anode tap and drive circuit are connected for exporting the output end of dipulse drive signal.
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| CN201510600812.4A CN105116184B (en) | 2015-09-18 | 2015-09-18 | IGBT dynamic test latch protection circuit |
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| CN105116184A (en) | 2015-12-02 |
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