CN105080861B - Testing, sorting machine and utilize this electronic unit test method - Google Patents

Testing, sorting machine and utilize this electronic unit test method Download PDF

Info

Publication number
CN105080861B
CN105080861B CN201510219748.5A CN201510219748A CN105080861B CN 105080861 B CN105080861 B CN 105080861B CN 201510219748 A CN201510219748 A CN 201510219748A CN 105080861 B CN105080861 B CN 105080861B
Authority
CN
China
Prior art keywords
electronic unit
batch
loaded
test
loading
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN201510219748.5A
Other languages
Chinese (zh)
Other versions
CN105080861A (en
Inventor
金昌来
李英淑
朴成南
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Techwing Co Ltd
Original Assignee
Techwing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Techwing Co Ltd filed Critical Techwing Co Ltd
Publication of CN105080861A publication Critical patent/CN105080861A/en
Application granted granted Critical
Publication of CN105080861B publication Critical patent/CN105080861B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2865—Holding devices, e.g. chucks; Handlers or transport devices
    • G01R31/2867—Handlers or transport devices, e.g. loaders, carriers, trays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2601—Apparatus or methods therefor
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H01L22/20—Sequence of activities consisting of a plurality of measurements, corrections, marking or sorting steps

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Environmental & Geological Engineering (AREA)
  • General Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Power Engineering (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

The present invention discloses a kind of testing, sorting machine and utilizes this electronic unit test method.According to the testing, sorting machine of one embodiment, for making electronic unit circulate and be tested successively on the predefined paths comprising " loaded " position, test position and unloading position, so as to which the electronic unit be classified by grade according to test result, which includes：Loading part, for loading the electronic unit；Support sector is tested, the electronic unit for finishing loading is tested；Uninstalling portion, the electronic unit for making to be completed are classified and are unloaded by grade；Control unit, for controlling the loading part, the test support sector and the uninstalling portion, and discharged the electronic unit of unloading, the control unit can be when the electronic unit corresponding to the first batch tested in advance be loaded and finishes, and at least a portion in the electronic unit corresponding to the second batch for making to be later than described first in batches and being tested is loaded.

Description

Testing, sorting machine and utilize this electronic unit test method
Technical field
A kind of electronic unit test method the present invention relates to testing, sorting machine and using the testing, sorting machine.
Background technology
Manufacture the electronic unit (for example, semiconductor element) finished and testing, sorting machine (test handler) is known as by one kind Inspection equipment tested.Testing, sorting machine, can be according to test result and by the ministry of electronics industry after test is performed to electronic unit Part is classified by grade.
Fig. 1 is the figure for representing common testing, sorting machine 10.As shown in the figure, testing, sorting machine 10 may include：Loading part 11, Electronic unit for making once to be loaded into client's pallet (customer tray) is loaded onto test pallet in " loaded " position (test tray)；Equal hot cell 12, various environmental condition is adapted it to by electronic unit preheating or precooling；Test support sector 13, support electronic unit to be tested test-run a machine 20 and tested；Equal hot cell 14 is moved back, the electronic unit being completed is reduced phlegm and internal heat or gone is cold And it is set to revert to room temperature；Uninstalling portion 15, the electronic unit for making to be completed are unloaded at unloading position from test pallet It is downloaded to client's pallet.Electronic unit can be classified by grade in such uninstall process.
The both sides of test support sector 13 are respectively equipped with test wait portion 13a and test output section 13c, and these tests etc. Treat that between portion 13a and test output section 13c testing station 13b can be equipped with.Test pallet is close to being docked at rear in the 13b of testing station 20 side of test machine so that the electronic unit for being loaded into test pallet is electrically connected to the socket of test machine 20 and realizes test.
Here, as shown in the figure, electronic unit can be moved along path a, test pallet can be moved along path b.Specifically, fill The client's pallet for being loaded with the electronic unit of non-test mode is put into the loading part 11 of testing, sorting machine 10 by operating personnel, loads The test pallet in the circulation of the inside of testing, sorting machine 10 can be loaded in the electronic unit of client's pallet.Hereafter, with survey The movement of pallet is tried, test-run a machine can be tested at the test position of test support sector 13 by being loaded into the electronic unit of the test pallet 20 are tested.The electronic unit being completed can be arranged after the unloading position of uninstalling portion 15 is unloaded at client's pallet Go out.Test pallet can be moved to loading part 11 to load new non-testing electronic parts again.Such construction is because in electronics Component should not carry out what test just proposed in the state of being loaded on client's pallet.That is, it is close in client's pallet for efficiency of loading Collection is mounted with the electronic unit of quantity as much as possible, and the spacing between electronic unit will become unsuitable for test-strips at this time Part.Therefore, electronic unit can be separately loaded as being suitable for test condition (spacing between suitable electronic unit) with one kind Test pallet.
In addition, electronic unit is by predetermined object amount (batch；LOT, hereinafter referred to as " batch ") managed and tested, this It is derived from the necessity such as the difference of production line, the difference of demander.If for example, corresponding to particular batch electronic unit not Yield is high, then is easy to the production line for the electronic unit that tracking is produced corresponding to particular batch, and easily by the electricity of identical type Subassembly is supplied to different demanders in batches.Therefore, electronic unit is supplied to testing, sorting by being distinguished in batches Machine, if the test corresponding to the electronic unit in relation to batch terminates, the electronic unit that will correspond to next batch is supplied to Testing, sorting machine.
In addition, when testing a batch, can be to first being carried out corresponding to all electronic units in relation to batch Non-defective unit and bad suspicion product are categorized as according to its result after once testing.Then, can be to being classified as bad suspicion product Electronic unit is once tested (resurveyed again；retest).This is because even if some electronic units is initially once The standard of non-defective unit is not met in test, its reason may also be not as electronic unit bad in itself.For example, for not For undesirable electronic product itself, if the socket with test machine is not combined as suitable in, good survey can not possibly be obtained Test result, and then possibly can not be classified as non-defective unit.In general, the object amount initially once tested is known as preliminary survey (PRIME) batch, The object amount for needing once to be tested again is referred to as to resurvey (RETEST) batch.
It is complete in the test for the electronic unit corresponding to preliminary survey batch for testing, sorting machine of the prior art After portion finishes, according to test result it is good whether and electronic unit is classified, then just perform for resurvey batch Test support.According to such test support method, as shown in Fig. 2, from the end electronic unit for being mounted with preliminary survey batch Test pallet depart from test support sector test position Tp and after the unloading position Up of uninstalling portion obtains unloading, until dress The test pallet for being loaded with the initial electronic unit for resurveying batch comes the time of test position Tp from the " loaded " position Lp of loading part Untill point (a+b), test machine, which possesses, to be resurveyed the stand-by period (idle period of test machine).From the aspect of loading, even in corresponding After the electronic unit of preliminary survey batch all obtains loading, also until the electronic unit corresponding to preliminary survey batch is all tested Finish and completion of discharge and to untill when being loaded corresponding to the electronic unit for resurveying batch, and there is no load recently Electronic unit, therefore loading blank time will occur.Resurveying the stand-by period and loading blank time for such test machine is returned Root knot bottom makes a batch complete the time increase needed for test, and may reduce the operational efficiency of test machine.
In order to solve such technical problem, following scheme was attempted：It is complete even in the test for preliminary survey batch Before end, if meeting specific initial conditions, it is classified as resurvey batch in the preliminary survey batch for being also pre-loaded with being completed Electronic unit.Batch is resurveyed however, being difficult to prediction in advance before being fully completed for the test of preliminary survey batch and corresponding to The quantity of electronic unit, and even if prediction is resurveyed batch and is loaded in advance, it is also difficult to test machine is eliminated to the queen's taste Resurvey the stand-by period and load blank time.
In addition, as shown in figure 3, the testing, sorting machine 10 of vertical lamination layer structure is widely used.That is, a pair of of test support is made Disk 1 is arranged in upper and lower part relative to other side, and make these a pair of of test pallets 1 and meanwhile enter testing station 13b and once Property the electronic units of numerous quantity is tested.
Specifically, a pair of of test pallet 1 can be shifted into from equal hot cell 12 successively by process 1. and 2. respectively Test the test wait portion 13a of support sector 13.Then, a pair of of test pallet 1 is shifted into testing station by process 3. 13b, and can realize the test to electronic unit.If be completed, a pair of of test pallet 1 is transferred by process 4. To test output section 13c, then equal hot cell 14 can be moved back to be shifted into successively by process 5. and 6. respectively.
Wherein, it is understood that there may be following problem：A pair of of the test pallet 1 for performing test at the same time is shifted into survey from equal hot cell 12 Try the order of support sector 13 and the pair of test pallet 1 is shifted into the order possibility for moving back equal hot cell 14 from test support sector 13 It is reverse.Specifically, test wait portion 13a can be first shifted into by process 1. by loading the test pallet 1 finished in advance And the top of test wait portion 13a is arranged in, on the contrary, can be by process 2. and subsequent followed by the test pallet 1 finished It is shifted into test wait portion 13a and is arranged in the lower part of test wait portion 13a.However, in uninstall process, and positioned at top Test pallet 1 compare, the test pallet 1 positioned at lower part, which is first shifted into, moves back equal hot cell 14 (5. prior to 6. performing), as a result The electronic unit that may make to load in the test pallet 1 of lower part is first unloaded.
As shown in figure 4, boundary between mutually different batch and be mounted with preceding batch (preceding respectively LOT) and the test pallet 1a of the electronic unit of rear batch (succeeding LOT), test pallet 1b are (for example, forward A batches Measure the first test pallet 1b of the end test pallet 1a and follow-up B batches (rear batch) of (preceding batch)) may be with order Reverse state is shifted into uninstalling portion.
As described above, electronic unit is not only produced with batch unit, but also demander is different also according to batch, if gone out The now situation of the reversed order of batch as described above, then may cause problem various in terms of.
In the prior art, although distinguishing two batches by the way that hollow testing pallet is inserted between preceding batch and rear batch Amount, there is the problem of reducing testing efficiency in it, although and also attempting in equal hot cell or moving back in equal hot cell that change is located at by force Position between a pair of of test pallet of the boundary of two batches, but due to needing special mechanical realization, cause space The problems such as limitation and cost increase.
[prior art literature]
Patent document 1：Korean granted patent publication the 10-0792488th
Patent document 2：Korean granted patent publication the 10-0894082nd
The content of the invention
The purpose of following embodiment is to provide a kind of when to being tested corresponding to the electronic unit of multiple batches Eliminate the loading blank time for resurveying stand-by period and loading part of test machine and improve the test of the testing efficiency of electronic unit Sorting machine and electronic unit test method.
In addition, the vertical lamination layer structure that can improve testing efficiency the present invention also aims to provide a kind of use is same When can be limited again to avoid space and can simultaneously prevent the unloading of the electronic unit corresponding to different batches the problem of cost increase The testing, sorting machine and electronic unit test method of reversed order.
According to a kind of testing, sorting machine of one embodiment, for making electronic unit comprising " loaded " position, test position And circulate and tested successively on the predefined paths of unloading position, so that pressed the electronic unit according to test result etc. Level is classified, wherein, the testing, sorting machine includes：Loading part, for loading the electronic unit；Support sector is tested, is used Tested in the electronic unit for finishing loading；Uninstalling portion, for the electronic unit that makes to be completed by grade Classified and be unloaded；And control unit, for controlling the loading part, the test support sector and the uninstalling portion, The control unit can make to be later than described in the case where the electronic unit corresponding to the first batch tested in advance is loaded and finishes First batch and at least a portion in the electronic unit corresponding to the second batch tested is loaded.
Also, the uninstalling portion may include：Non-defective unit resettlement section, for housing the electronic unit corresponding to first batch In non-defective unit or corresponding to the non-defective unit in the electronic unit of second batch；First resurveys resettlement section, is corresponded to for housing What the needs in the electronic unit of first batch retested first resurveys object product；And second resurvey resettlement section, use Second object product are resurveyed in house that the needs in the electronic unit corresponding to second batch retest.
In addition, the control unit can make in the case of the completion of discharge corresponding to the electronic unit of first batch Interrupted corresponding to the loading of the electronic unit of second batch, and make to be contained in described first resurvey resettlement section described first Object product are resurveyed to be loaded, and in the case where first loading for resurveying object product finishes, it can make corresponding to described The remainder being not yet loaded in the electronic unit of second batch is loaded.
In addition, the control unit can make in the case where being unloaded and finishing corresponding to the electronic unit of first batch The non-defective unit being contained in the electronic unit corresponding to first batch in the non-defective unit resettlement section is discharged, and is made corresponding Non-defective unit in the electronic unit of second batch is accommodated in the non-defective unit resettlement section.
In addition, the uninstalling portion can also include：Non-defective unit resettlement section is resurveyed, for housing retested described first Resurvey the non-defective unit in object product；Defective products resettlement section is resurveyed, defective products in object product is resurveyed for housing described first.
In addition, the control unit can when described first resurveys the completion of discharge of object product, make to be contained in it is described resurvey it is good Described first in product resettlement section resurvey non-defective unit in object product and be contained in it is described resurvey in defective products resettlement section described the One defective products resurveyed in object product is discharged, and can described second resurvey object product retest finish when, make institute State the second non-defective unit resurveyed in object product be accommodated in it is described resurvey non-defective unit resettlement section, and make described second to resurvey in object product Defective products resurveys defective products resettlement section described in being accommodated in.
A kind of electronic unit test method according to another embodiment, using testing, sorting machine, which is used for Electronic unit is set to circulate and be tested successively on the predefined paths comprising " loaded " position, test position and unloading position, So as to which the electronic unit be classified by grade according to test result, wherein, the method may include following steps：Will be first The electronic unit corresponding to the first batch of row test is loaded；In the loading of the electronic unit corresponding to first batch In the case of finishing, at least one in the electronic unit corresponding to the second batch that first batch will be later than and tested Part is loaded；By the electronic unit corresponding to first batch being completed be categorized as non-defective unit and resurvey object product and Complete unloading；At least a portion in the electronic unit corresponding to second batch being completed is categorized as non-defective unit and again Survey object product and unloaded；In the completion of discharge of the electronic unit corresponding to first batch, interrupt corresponding to described The loading of the electronic unit of second batch, and will correspond in the electronic unit of first batch resurvey object product into luggage Carry；Object product of resurveying in the electronic unit corresponding to first batch are loaded when finishing, and will correspond to described second The remainder being not yet loaded in the electronic unit of batch is loaded；By retest finish correspond to described first Object product of resurveying in the electronic unit of batch are categorized as non-defective unit and defective products and complete to unload；Institute is corresponded to by what is be completed The remainder in the electronic unit of the second batch is stated to be categorized as non-defective unit and resurvey object product and unloaded；Corresponding to described The electronic unit of second batch is unloaded when finishing, will correspond in the electronic unit of second batch resurvey object product into Luggage carries；And by retest in the electronic unit corresponding to second batch that finishes resurvey object product be categorized as it is good Product and defective products and unloaded.
A kind of testing, sorting machine according to another embodiment, for making electronic unit comprising " loaded " position, test position And circulate and tested successively on the predefined paths of unloading position, so that pressed the electronic unit according to test result etc. Level is classified, and a pair of of test pallet is respectively relative to other side in test position and is arranged in upper and lower part, so that loading Tested at the same time in the electronic unit of the pair of test pallet, wherein, the testing, sorting machine includes：Loading part, is used for Load the electronic unit；Support sector is tested, the electronic unit for finishing loading is tested；Uninstalling portion, is used for The electronic unit for making to be completed is classified and is unloaded by grade；And control unit, for control the loading part, The test support sector and the uninstalling portion, what the control unit can be in the electronic unit corresponding to the first batch is in dress The quantity of the electronic unit of wait state is carried in the case of below the maximum loading of test pallet, to make to correspond to second At least a portion in the electronic unit of batch is first loaded on preamble test pallet, and makes the electricity corresponding to first batch In subassembly postorder test pallet is loaded in the electronic unit for loading wait state.
In addition, the control unit can be first loaded in the part in making the electronic unit corresponding to second batch Before the preamble test pallet, judge whether the preamble test pallet is arranged in the postorder at the test position and surveys Try the top of pallet.
In addition, electricity in loading wait state of the control unit in the electronic unit corresponding to first batch In the case of maximum loading of the subassembly less than a test pallet, the electronic unit corresponding to second batch can be made In at least other a part be also loaded on the postorder test pallet.
According to a kind of testing, sorting machine of other another embodiment, for making electronic unit comprising " loaded " position, test Circulate and tested successively on the predefined paths of position and unloading position, so that according to test result by the electronic unit Classify by grade, and a pair of of test pallet is respectively relative to other side in test position and is arranged in upper and lower part, so that The electronic unit for being loaded into the pair of test pallet is tested at the same time, wherein, the testing, sorting machine includes：Loading part, For loading the electronic unit；Support sector is tested, the electronic unit for finishing loading is tested；Uninstalling portion, The electronic unit for making to be completed is classified and is unloaded by grade；And control unit, for controlling the dress Load portion, the test support sector and the uninstalling portion, the control unit can be unloaded in the electronic unit corresponding to the first batch Load is afterwards loaded the object product of resurveying for first batch, and when described resurvey in object product is in loading etc. When the quantity of the electronic unit of state is below the maximum loading of a test pallet, it can make corresponding to the second batch At least a portion in electronic unit is first loaded on preamble test pallet, and described resurvey in object product is in loading etc. Treat that the electronic unit of state is loaded on postorder test pallet.
According to a kind of electronic unit test method of other another embodiment, testing, sorting machine, the testing, sorting are utilized Machine is used to make electronic unit circulate and obtain successively on the predefined paths comprising " loaded " position, test position and unloading position Test, so that the electronic unit is classified by grade according to test result, and a pair of of test pallet is in test position point Upper and lower part is not arranged in relative to other side, so that the electronic unit for being loaded into the pair of test pallet is surveyed at the same time Examination, wherein, the method may include following steps：Load the electronic unit corresponding to the first batch；Unloading corresponds to first The electronic unit of amount；Load and resurvey object product for first batch；Being in object product is resurveyed described in judgement to load Whether the quantity of the electronic unit of wait state is below the maximum loading of a test pallet；If described resurvey object product In in load wait state electronic unit quantity it is equal with the maximum loading of a test pallet, then make to correspond to At least a portion in the electronic unit of second batch is loaded on preamble test pallet, and makes the place resurveyed in object product Postorder test pallet is loaded in the electronic unit for loading wait state；If described resurvey in object product is in loading etc. Treat that the quantity of the electronic unit of state is less than the maximum loading of a test pallet, then make the ministry of electronics industry corresponding to the second batch At least a portion in part is loaded on preamble test pallet, and make it is described resurvey in object product in loading wait state Electronic unit and it is loaded on postorder test pallet corresponding at least other parts in the electronic unit of second batch； Load the excess electron component being not yet loaded in the electronic unit corresponding to second batch；Object is resurveyed described in completion The unloading of product；And complete the unloading of the electronic unit corresponding to second batch.
According to the above embodiments, it is possible to provide a kind of to pass through when to being tested corresponding to the electronic unit of multiple batches Eliminate the loading blank time for resurveying stand-by period and loading part of test machine and improve the test of the testing efficiency of electronic unit Sorting machine and electronic unit test method.
Moreover it also provides again can be to avoid while a kind of use can improve the vertical lamination layer structure of testing efficiency The increase problem of space limitation and cost can simultaneously prevent the survey that the sequence of unloading corresponding to the electronic unit of different batches overturns Try sorting machine and electronic unit test method.
Brief description of the drawings
Fig. 1 is the figure for representing general test handler.
Fig. 2 is the figure for resurveying the stand-by period for illustrating test machine.
Fig. 3 is the figure for the testing, sorting machine for representing vertical lamination layer structure.
Fig. 4 is for illustrating unloading for electronic unit when using the testing, sorting machine of Fig. 3 corresponding to batch different from each other Carry the figure of the process of reversed order.
Fig. 5 is the figure for the unitary construction for representing the testing, sorting machine according to one embodiment.
Fig. 6 is the figure of the loading operation situation of the testing, sorting machine for explanatory drawin 5.
Fig. 7 a to Fig. 7 f are the loading of the testing, sorting machine for explanatory drawin 5 and the figure of unloading operation situation.
Fig. 8 is the precedence diagram according to the electronic unit test method of one embodiment.
Fig. 9 is the figure for the unitary construction for representing testing, sorting machine according to another embodiment.
Figure 10 is the loading of the testing, sorting machine for explanatory drawin 9 and unloads the figure of an example of operation situation.
Figure 11 is the loading of the testing, sorting machine for explanatory drawin 9 and the figure of another of unloading operation situation.
Figure 12 is the precedence diagram according to the electronic unit test method of another embodiment.
Figure 13 is the precedence diagram according to the electronic unit test method of another embodiment.
Symbol description
100：Testing, sorting machine 110：Loading part
120：Test support sector 130：Uninstalling portion
131：Non-defective unit resettlement section 132：First resurveys resettlement section
133：Second resurveys resettlement section 134：Resurvey non-defective unit resettlement section
135：Resurvey defective products resettlement section 140：Control unit
141：Mnemon 142：Judging unit
143：Control unit 150：Input unit
Embodiment
Hereinafter, the specific embodiment for being used for realization the thought of the present invention is described in detail with reference to the accompanying drawings.
Moreover, when illustrating the present invention, if it is determined that can to associated known construction or having illustrated for function Can make the present invention purport it is unclear, then description is omitted.
Fig. 5 is the figure for the unitary construction for representing the testing, sorting machine 100 according to one embodiment.As shown in the figure, according to this The testing, sorting machine 100 of embodiment may include loading part 110, test support sector 120, uninstalling portion 130, control unit 140 and defeated Enter portion 150.
The electronic unit for the non-test mode for being loaded into client's pallet can be loaded into survey by loading part 110 in " loaded " position Lp Try pallet.
Test pallet can be butted up against test pusher side by test support sector 120 in test position Tp, so that being loaded into test The electronic unit of pallet can be snapped at the socket of test machine and be tested.
Uninstalling portion 130 can unloading position Up according to test result it is good whether by the electronic unit being completed carry out Classify and be unloaded to client's pallet.
Control unit 140 can control loading part 110 and load electronic unit, and controllable testing support sector 120 and support survey Industry is studied, and uninstalling portion 130 can be controlled and unload electronic unit.
Control unit 140 specifically may include mnemon 141, judging unit 142 and control unit 143.Mnemon 141 Following information can be remembered：By the quantity of the electronic unit of batch；The electronics of a test pallet and/or client's pallet can be loaded into The quantity (maximum loading) of component；(maximum houses the quantity for the electronic unit that various resettlement sections described later can at most house Amount)；Type and quantity of the various resettlement sections etc..Judging unit 142 can determine whether Whether no whole is loaded and is all unloaded.Moreover, it is judged that unit 142 can determine whether fc-specific test FC pallet, particular customer support Electronic unit whether is filled up in disk and/or specific resettlement section and what degree has been loaded into if not filling up.Control is single Member 143 can be controlled based on the information from mnemon 141 and judging unit 142 loading part 110, test support sector 120 with And uninstalling portion 130.For example, control unit 143 can control loading part 110 to allow the electronic unit corresponding to particular batch to obtain Load, and test support sector 120 can be controlled to allow the electronic unit to be tested, and uninstalling portion 130 can be controlled and be The electronic unit is allowed to be unloaded.Further, it is also possible to uninstalling portion 130 is controlled to allow the electronic unit that is contained in resettlement section Discharged from the resettlement section.
Input unit 150 can receive the input of following information at user：By batch electronic unit quantity information；Fc-specific test FC Quantity information of electronic unit that can be at most loaded in pallet, particular customer pallet and/or specific resettlement section etc., so inputs Information can be utilized as the operation basis of the control unit 140.Also, user can be by input unit 150 and to control Assign required order (operation or order out of service) in portion 140.
As described above according in the testing, sorting machine 100 of the present embodiment, test pallet can comprising " loaded " position Lp, Test position Tp, unloading position Up predefined paths C on circulate successively.In the process that test pallet circulates on predefined paths C In, when test pallet is located at " loaded " position Lp, control unit 140 controls loading part 110 and electronic unit is loaded on test Pallet, when test pallet is located at test position Tp, the control of control unit 140 tests support sector 120 and is surveyed electronic unit Examination, when test pallet is located at unloading position Up, control unit 140 controls uninstalling portion 130 electronic unit is classified by grade And it is unloaded.As described above, control unit 140 as needed can control uninstalling portion 130 for by the electronic unit of completion of discharge Discharge.
Fig. 6 is the figure of the loading operation situation of the testing, sorting machine 100 for explanatory drawin 5.As shown in the figure, loading part 110 In can load electronic unit corresponding to batch different from each other successively.In figure 6, A, B, C and D represent mutually different batch Amount, the batch so marked with single English alphabet represent preliminary survey (prime) batch, i.e. represent to be used to make to correspond to associated lot The object amount that the electronic unit of amount is once tested.In addition, as marked the batch of R to represent to resurvey behind AR in the lump (retest) batch, i.e. represent to need to retest after the electronic unit corresponding to related batch is once tested Resurvey object product.Therefore, AR batches represent to need to retest in the electronic unit corresponding to the A batches initially once tested Electronic unit (first resurveys object product), BR batches represent to need corresponding in the electronic unit of B batches initially once tested The electronic unit to be retested (second resurveys object product).In addition, the arrow of lower end represents loading sequence.
For the present embodiment, if as shown in fig. 6, corresponding to A batches electronic unit load finish, can be straight Connect and start to load at least a portion in the electronic unit corresponding to B batches.Then, if electronic unit corresponding to A batches Test and uninstall process finish, then interrupt at least one of loading in the electronic unit corresponding to B batches, and can load AR batches, AR batches first resurvey object product.If the loading of AR batches finishes, can load again corresponding to B batches The remainder not yet loaded in the electronic unit of amount., can if finished corresponding to the electronic unit whole loading of B batches Directly to start to load at least a portion in the electronic unit corresponding to C batches.Then, if electronics corresponding to B batches The test of component and uninstall process finish, then interrupt at least one of loading in the electronic unit corresponding to C batches, and can BR batches are loaded, BR batches second resurvey object product.If the loading of BR batches finishes, can be corresponded to again to load The remainder not yet loaded in the electronic unit of C batches.If finished corresponding to the electronic unit whole loading of C batches, It then can directly start to load at least a portion in the electronic unit corresponding to D batches.
In this way, according to the testing, sorting machine 100 based on the present embodiment, both can be right when testing multiple batches Each batch carries out resurveying process, and can eliminate blank time.It is only whole in the electronic unit of related batch to resurvey process Unloading after determine need retest resurvey object product when can start, will have to this aftermentioned.In connection with this, Prediction in advance resurveys object product and will resurvey the measure that object product are pre-loaded with and be difficult to ensure accuracy rate, even if using that measure Also it is difficult to eliminate blank time to the queen's taste, this is above being illustrated.For the present embodiment, until determining particular lot Untill that measures resurveys object product, it can first load corresponding to the electronic unit of next batch and eliminate loading blank time.Accordingly, The stand-by period of resurveying of test machine can also eliminate, this will significantly improve the overall operation efficiency of test machine, and then can show Write the overall operation efficiency for improving testing, sorting machine 100.
Fig. 7 a to Fig. 7 f are the loading of the testing, sorting machine 100 for explanatory drawin 5 and the figure of unloading operation situation.Here, The loading of Fig. 6 operation situation will be illustrated, and then unloading operation situation is also explained.Accordingly, it will illustrate, even if Load blank time in order to eliminate and load phase before completion of discharge in particular batch (that is, before determining to resurvey object product) In the case of the electronic unit of next batch, the mutual blending of these batches should can be also avoided and in the premise clearly classified Under unloaded.
However, in Fig. 7 a to Fig. 7 f, loading part 110 is spatially separated with uninstalling portion 130, and in view of electronic unit Time needed for quantity and test etc., it is illustrated that the respective loading/unloading of loading part 110 and uninstalling portion 130 in a width figure Process not may ideally be started simultaneously at or terminated at the same time.
In addition, when being illustrated by taking A batches and B batches as an example, uninstalling portion 130 may include：Non-defective unit resettlement section 131, is used In house corresponding to A batches electronic unit in non-defective unit or corresponding to the non-defective unit in the electronic unit of B batches；First resurveys receipts Appearance portion 132, object product AR is resurveyed for housing need to retest in the electronic unit corresponding to A batches first；Second weight Resettlement section 133 is surveyed, object product BR is resurveyed for housing need to retest in the electronic unit corresponding to B batches second；Weight Non-defective unit resettlement section 134 is surveyed, the non-defective unit in object product AR is resurveyed for collecting retests first；Resurvey defective products resettlement section 135, the defective products in object product AR is resurveyed for collecting first.Housed using a non-defective unit resettlement section 131 corresponding to mutual Non-defective unit in the electronic unit of different batch, and resurvey non-defective unit resettlement section 134 using each independent and resurvey bad Product resettlement section 135 and the non-defective unit resurveyed in object product retested is classified with defective products and is housed.
Fig. 7 a are represented after being finished corresponding to the loading of the electronic unit of A batches corresponding in the electronic unit of B batches The situation that at least a portion is loaded.When herein, the electronic unit prior to B batches corresponding to the A batches that are loaded It can start to be unloaded by test process successively.Specifically, in the electronic unit corresponding to A batches, non-defective unit can be received Non-defective unit resettlement section 131 is dissolved in, it is necessary to which first retested resurveys object product AR and can be accommodated in first and resurvey resettlement section 132.
Fig. 7 b represent all to finish corresponding to the unloading of the electronic unit of A batches and determine that first resurveys object product AR's Situation.If it is determined that first resurveys object product AR, then corresponding at least one of loading in the electronic unit of B batches It is disconnected, and can start for the first loading for resurveying object product AR.First, which resurveys object product AR, to be shifted into from uninstalling portion 130 After loading part 110, loaded in " loaded " position.When herein, in the electronic unit corresponding to B batches that had previously loaded It is at least one of be completed, then these off-loadable electronic units.Before B batches are unloaded, corresponding to the electricity of A batches Non-defective unit in subassembly can be discharged from non-defective unit resettlement section 131, and can will correspond at least one in the electronic unit of B batches Divide the non-defective unit resettlement section 131 for being contained in and emptying.In addition, needed in the middle corresponding at least a portion in the electronic unit of B batches Second retested, which resurveys object product BR and can be accommodated in second, resurveys resettlement section 133.
In addition, the testing, sorting machine 100 of the present embodiment can be that (multiple test pallets are in vertical cloth for vertical lamination layer structure In the case of putting while test) testing, sorting machine.In the case, the test pallet loaded first can be first into test Support sector 120 and be arranged in top, followed by test pallet then can enter test support sector 120 and be arranged in down Portion.However, since the test pallet that lower part is arranged in unloading is unloaded first, so if the two test pallets load Have the electronic unit corresponding to different batches, then between batch different from each other sequence of unloading be exchanged, may exist The problem of electronic unit of unloading mutually blends.
Illustrated by taking Fig. 7 b as an example, can all be accommodated in non-defective unit in the non-defective unit in the electronic unit corresponding to A batches The unloading corresponding to the electronic unit of B batches is proceeded by after resettlement section 131 and non-defective unit therein is contained in non-defective unit and is housed Portion 131 (discharge of A non-defective units can also be carried out at the same time with the unloading and collecting of B non-defective units), but if the unloading of A batches and B batches The no time difference and be carried out continuously, then the above problem may occur.Specifically, corresponding to non-defective unit in the electronic unit of A batches Major part is accommodated in non-defective unit resettlement section 131, starts to be accommodated in non-defective unit resettlement section corresponding to non-defective unit in the electronic unit of B batches 131, may be because being later than one corresponding to the remaining object amount (that is, the end object amount of A batches non-defective unit) of non-defective unit in the electronic unit of A batches Part B batches electronic unit unloads and is accommodated in non-defective unit resettlement section 131, therefore may corresponding to the electronic unit of two batches Can mutually it blend.In this case, it is possible to the end object amount of the A batches non-defective unit is accommodated in unloading resurveys non-defective unit receipts Appearance portion 134, rather than it is accommodated in non-defective unit resettlement section 131.It is for housing retest first to resurvey non-defective unit resettlement section 134 Resurvey the non-defective unit (that is, the electronic product for being exactly judged as non-defective unit in A batches electronic product after all) in object product AR Space, therefore non-defective unit resettlement section 134 is resurveyed even if the end object amount of A batch non-defective units is contained in, variety classes will not occur Electronic product blending the problem of.
In addition, it is associated to resurvey object product AR with first, resurveys object product AR and second and resurvey object product BR due to first Mutually different receiving space 132,133 is accommodated in unloading, it is thus possible to the problem of will not occurring mutually to blend.Only It is, as it was previously stated, the first loading for resurveying object product AR can start after the first object amount for resurveying object product AR obtain determining, In the testing, sorting machine of vertical lamination layer structure, the first object amount for resurveying object product AR obtains definite time point and its loading Sart point in time can become different.For example, the first major part for resurveying object product AR can be accommodated in first and resurvey resettlement section 132, then second part for resurveying object product BR, which starts to be accommodated in second, resurveys resettlement section 133, and first resurveys object The remainder of product AR, that is, end object amount, which can be later than described a part of second, resurveys object product BR and is unloaded and be accommodated in First resurveys resettlement section 132.Here, even if second resurveys the unloading of object product BR and collecting has begun to, can not thus break Fixed first object amount for resurveying object product AR has been determined.As previously described, because the first end object amount for resurveying object product AR may It is later than second to resurvey object product BR and unloaded, it is therefore desirable to the second unloading for resurveying object product BR and collecting independently sentence Disconnected first resurveys whether object product AR is all unloaded and housed, and only in the feelings for being judged as all being unloaded and being housed It can just start to the first loading for resurveying object product AR under condition.
Fig. 7 c represent to finish and perform for the electronic unit corresponding to B batches for the first loading for resurveying object product AR In the situation of the loading of remainder that not yet loads.Since first resurveys object product AR and all loaded, first resurveys Resettlement section 132 can be the state emptied.Moreover, the electronic unit of the B batches corresponding to unloading illustrated in Fig. 7 b can quilt Non-defective unit and second is categorized as to resurvey object product BR and resurvey resettlement section 133 respectively to be contained in non-defective unit resettlement section 131 and second State waits.When herein, first, which resurveys retesting for object product AR, to finish, then first resurvey object product AR can quilt Unloading.These can be classified as non-defective unit and defective products according to the result retested, and can be accommodated in respectively resurvey it is good Product resettlement section 134 and resurvey defective products resettlement section 135.
Fig. 7 d represent all to finish corresponding to the loading of the electronic unit of B batches and load the ministry of electronics industry corresponding to C batches At least one of situation in part.When herein, the electronic unit of the remainder of B batches can start to be unloaded Carry, and non-defective unit and second can be classified as and resurvey object product BR and be accommodated in non-defective unit resettlement section 131 and second respectively and resurvey receipts Appearance portion 133.As described above, at least a portion electronic unit of B batches loaded first after A batches load just can be with Non-defective unit resettlement section 131 and second is contained in the state being classified to resurvey in resettlement section 133.Resurveyed in addition, being contained in respectively Non-defective unit resettlement section 134 can be discharged with the A batches electronic unit for resurveying defective products resettlement section 135.Accordingly, corresponding to A batches The test process of electronic unit can terminate.
Fig. 7 e represent all to finish corresponding to the unloading of the electronic unit of B batches and determine the second feelings for resurveying object product BR Shape.If it is determined that second resurveys object product BR, then the loading of C batches interrupts, and is accommodated in second and resurveys resettlement section 133 Second, which resurveys object product BR, can be shifted into loading part 110 and be loaded.When herein, non-defective unit resettlement section 131 is accommodated in The electronic unit corresponding to B batches in non-defective unit can be discharged, and previously loaded and be completed a part of C batch Electronic unit is unloaded, and non-defective unit can be contained in non-defective unit resettlement section 131 therewith, and will be resurveyed object product CR and be contained in first and resurvey Resettlement section 132.
Fig. 7 f represent that the second loading for resurveying object product BR all finishes and starts again at and load the remaining C batches ministry of electronics industry The situation of part.It can be classified as prior to a part of C batches electronic unit that the remaining C batches electronic unit is loaded good Product are waited with object product are resurveyed with being contained in non-defective unit resettlement section 131 and the first state for resurveying resettlement section 132.In addition, herein When, load second finished and resurvey retesting for object product BR and finish and can be unloaded.Second resurveys in object product BR Non-defective unit can be accommodated in and resurvey non-defective unit resettlement section 134 and defective products can be accommodated in and resurvey defective products resettlement section 135.Hereafter, If the second unloading for resurveying object product BR all finishes, it is contained in and resurveys non-defective unit resettlement section 134 and resurvey defective products collecting The electronic unit corresponding to B batches in portion 135 can be all discharged.Accordingly, corresponding to B batches electronic unit test Journey can terminate.
In this way, due to being equipped with multiple resettlement sections, even if resurveying wait to eliminate loading blank time and test machine Time and partly change the electronic unit corresponding to different batches loading sequence (for example, a part of B batch prior to AR batch And loaded), the phenomenon that is blended between different batches can also be avoided in uninstalling portion and clearly by each batch to electronics Component is classified.
Moreover, completion of discharge or unloading and the electronic unit for resurveying the state for finishing and terminating in test process are given With discharge, so as to then house next electronic unit in the space for once containing the electronic unit, therefore sky can be broken away from Between limit and relatively freely.
Moreover, although electronic unit only is categorized as non-defective unit above and resurveys object product and non-defective unit and defective products (that is, two species) and housed, but the species of more than three can also be categorized as.For example, also setting is thin in non-defective unit The grade of change and assign certain quality value (bin), and electronic unit of thus classifying by each grade.At this time, the quantity of resettlement section Can increase, and in order to using space and can by resettlement section in a vertical manner arranged stacked in the front lower of testing, sorting machine 100 Side.Certainly, space allow limit in, can also be horizontally extending and arrange resettlement section.
Fig. 8 is the precedence diagram according to the electronic unit test method of one embodiment.Since loading part and uninstalling portion are in sky Between on be separated from each other, therefore illustrate respectively.In addition, here it is assumed that only two batches (the first batch and the second batch) are test Object and illustrate.
First, can be loaded (S100) corresponding to the electronic unit of the first batch (for example, A batches).If corresponding to the The electronic unit of batch, which is loaded, to be finished, then can directly start to load the electronics corresponding to the second batch (for example, B batches) At least a portion (S110) in component.
Then, the electronic unit corresponding to the first batch that the first batch testing finishes can be classified as non-defective unit and resurvey pair Completion of discharge (S120) as product.The unloading of first batch electronic unit can start prior to the step S110, can also evening In the step S110 and, and can also start simultaneously at.
In addition, at least a portion in the electronic unit corresponding to the second batch being completed can also be classified as it is good Product and resurvey object product and unloaded (S130).Though it is not illustrated, it is a part of electronic unit quilt in the second batch Before unloading, the non-defective unit in the first batch electronic unit unloaded in the step S120 can be discharged.Then, the second batch At least a portion electronic unit in be classified as non-defective unit electronic unit can be unloaded at once be used for unload the first batch electronics The space of non-defective unit in component.
If being classified as non-defective unit corresponding to the electronic unit of the first batch and resurveying object product and completion of discharge, first The object product of resurveying of batch determine with regard to this, and can load such first batch resurveys object product (S140).For this reason, can in The loading (S140) of at least a portion electronic unit in the disconnected electronic unit corresponding to the second batch.
, can immediately then if all finished corresponding to the loading for resurveying object product in the electronic unit of the first batch The operation and load the remainder (S150) not yet loaded in the electronic unit corresponding to the second batch.
Then, resurveying object product and being classified as non-defective unit and defective products and unload for the first batch for finishing is retested Finish (S160).Here, the unloading for resurveying object product of the first batch can both start prior to the step S150, can also evening In the step S150 and, and can also start simultaneously at.
If the first batch resurveys the completion of discharge of object product, the electronic unit corresponding to the second batch that is completed In remainder can be unloaded.These remainders can be classified as non-defective unit and resurvey object product and be unloaded (S170).
If the unloading corresponding to the electronic unit of the second batch all finishes, the second batch resurveys object product with regard to this Determine, identified second batch is resurveyed object product and can be loaded to be retested (S180).
In addition, if the retesting for object product of resurveying of the second batch finishes, then non-defective unit and bad can be classified as Product and unloaded (S190).Though it is not illustrated, started to unload before the second batch resurveys object product, can be described The first batch unloaded is discharged in step S160 and resurveys object product.Then, the second batch finished is retested to resurvey pair As product can be unloaded at the space for once resurveying object product for unloading first batch.
Fig. 9 is the figure for the unitary construction for representing testing, sorting machine 200 according to another embodiment.As shown in the figure, according to this The testing, sorting machine 200 of embodiment may include loading part 210, test support sector 220, uninstalling portion 230, control unit 240 and defeated Enter portion 250.Control unit 240 may include mnemon 241, judging unit 242 and control unit 243.Due to these constructions It is illustrated with reference to Fig. 5, therefore the repetitive description thereof will be omitted herein.
Simply, in the present embodiment, judging unit 242 can be calculated during particular batch is loaded corresponding to described The quantity of the last electronic unit (end object amount) for being loaded into test pallet in the electronic unit of particular batch.For example, judge The maximum loading information for the test pallet that unit 242 can be remembered based on mnemon 241, corresponding to the particular lot Electronic unit total number information of amount etc. and calculate the quantity of the end object amount.In addition it is also possible to direct monitoring electronic unit Loading process and grasp the end object amount.As a result, judging unit 242 (that is, is in the electronic unit not yet loaded Load the electronic unit of wait state) quantity in the case of below the maximum loading of test pallet, can be by these It is judged as end object amount in the electronic unit for loading wait state.
In addition, in the testing, sorting machine 200 of the present embodiment, a pair of of testing, sorting machine can be arranged with respect to one another in upper Test is carried out at the same time in the state of portion and lower part, this is improved to be tested in a short time more electronic units Testing efficiency.Judging unit 242 can determine whether which test pallet exists at test position positioned at top and which test pallet It is located at lower part at test position.
There are (the multiple tests of vertical lamination layer structure as described previously for the testing, sorting machine 200 such as the present embodiment Pallet is carried out at the same time test with the state arranged vertically) testing, sorting machine for, the test pallet loaded first can first advance Enter to test support sector 220 and be arranged in top, followed by test pallet then can enter test support sector 220 and cloth It is placed in lower part.However, since the test pallet that lower part is arranged in unloading unloads in advance, so if the two test pallets Be mounted with the electronic unit corresponding to different batches, then may band with sequence of unloading is overturned between batch different from each other The problem of electronic unit to unload mutually blends.The purpose of the present embodiment be maintain testing, sorting machine 200 efficiency and Above-mentioned technical problem is solved on the premise of not additional special mechanical structure.
Figure 10 be for explanatory drawin 9 testing, sorting machine 100 loading and unloading operation situation an example figure.Wherein institute An example stated is corresponding to the quantity and a survey that the electronic unit for loading wait state is in the electronic unit of the first batch Try the equal situation of the maximum loading of pallet.That is, this is that the end object amount of the first batch fills up the situation of a test pallet. In addition, for convenience of description, the first batch is denoted as A batches and the second batch is denoted as B batches and illustrates.
As shown in the figure, a pair of of test pallet 30,40 can circulate on the predefined paths C inside testing, sorting machine 200.When one When being located at loading part 210 to test pallet 30,40, electronic unit can first be loaded into preamble test pallet 30, and electronic unit can Followed by postorder test pallet 40.In addition, can also be with loading sequence phase to the entering order of test support sector 220 Together.That is, the test pallet 30 first loaded can enter in advance test support sector 220, and can in support sector 220 is tested cloth It is placed in top.Followed by test pallet 40 then can enter test support sector 220, and the cloth in support sector 220 is tested It is placed in lower part.
In the present embodiment, when needs load mutually different A batches and B batches in above-mentioned a pair of of test pallet 30,40 During the electronic unit of amount, the first object amount in B batch electronic units first can be loaded into preamble test pallet 30.Then, may be used The end object amount that A batches are loaded in postorder test pallet 40 is in the electronic unit for loading wait state.When these are a pair of When test pallet 30,40 is unloaded, the postorder test pallet 40 for being arranged in lower part is preferentially unloaded, therefore is once loaded into postorder The end object amount of the A batches of test pallet 40 can be unloaded preferentially, be once loaded into preamble test pallet 30 B batches it is first Object amount then can be unloaded.In this way, according to the testing, sorting machine 200 according to the present embodiment, can prevent by simple method The phenomenon only mutually blended caused by being overturned corresponding to the sequence of unloading of the electronic unit of batch different from each other.
Figure 11 is the loading of testing, sorting machine 200 and the figure of another of unloading operation situation for explanatory drawin 9.Herein An example of explanation is to be less than one corresponding to the quantity that the electronic unit for loading wait state is in the electronic unit of the first batch The situation of the maximum loading of a test pallet.That is, this is can not to be filled up with the end object amount in the electronic unit of the first batch The situation of one test pallet.In addition, for convenience of description, the first batch is denoted as A batches and the second batch is denoted as B batches And illustrate.In addition, the maximum loading of a test pallet is assumed to 100, and by the end object amount of the first batch It is assumed that 50.
Illustrated with reference to figure 11, can be first by least a portion (being 100 in this example) dress in B batch electronic units It is loaded in preamble test pallet 30.Then, can be in the electronic unit (this example for loading wait state by the end object amount of A batches In be 50) be loaded into postorder test pallet 40.Also, due to only can not but fill up postorder with the end object amount of the A batches Test pallet 40, therefore at least other a part of (this example in B batch electronic units can be loaded in postorder test pallet 40 in the lump In be 50).
When these a pair of test pallets 30,40 are unloaded, since the postorder test pallet 40 for being arranged in lower part first obtains Unloading, therefore once it was loaded into 50 end object amounts of the A batches of postorder test pallet 40 and the electronic units of 50 B batches can be first It is unloaded, being once loaded into 100 first object amounts of the B batches of preamble test pallet 30 then can be unloaded.In this way, according to basis The testing, sorting machine 200 of the present embodiment, can prevent unloading because of the electronic unit corresponding to different batches by simple method Carry the phenomenon that mutually blends caused by reversed order, moreover, when only with the electronic unit corresponding to a batch but without When method fills up a test pallet, the electronics corresponding to batch different from each other can be loaded in the lump in one test pallet Component, so as to maximize the efficiency of testing, sorting machine 200.
Although moreover, without separately illustrating, identical principle can also be applied in the case where theory is resurveyed in addition. For example, determine to obtain really for the object product of resurveying of the first batch after being unloaded in the electronic unit corresponding to the first batch When determining and being loaded, for the electronics for resurveying object product and the second batch corresponding to next time loading of first batch Above-mentioned condition may occur for the boundary between component.At this time it is also possible to first at least a portion of the second batch electronic unit is filled Preamble test pallet is loaded in, and postorder test pallet will be loaded into for the end object amount for resurveying object product of the first batch.And And when the end object amount for resurveying object product for the first batch is less than the maximum loading of test pallet, can also At least a portion of the second batch electronic unit is first loaded into preamble test pallet, and object will be resurveyed for the first batch The end object amount of product and at least other parts of the second batch electronic product are loaded into postorder test pallet in the lump.
In addition, as it was previously stated, control unit 240 (being specially judging unit 242) can determine whether out across between different batches Boundary a pair of of test pallet in which test pallet preferentially loaded and positioned at test support sector top, and which survey Examination pallet is then loaded and is located at the lower part of test support sector.
Figure 12 is the precedence diagram according to the electronic unit test method of another embodiment.TT (Test Tray) represents test Pallet.
First, can be loaded (S200) corresponding to the electronic unit of the first batch.Next, it is determined that unit can determine whether at present still Whether the quantity for the electronic unit (that is, in the first batch electronic unit for loading wait state) not loaded is a survey Try below the maximum loading of pallet (S210).If the quantity in the first batch electronic unit for loading wait state is more than The maximum loading of one test pallet, then the first batch electronic unit in the loading wait state cannot still be considered as the The end object amount of batch, therefore the loading step of the first batch electronic unit can continue.
If on the contrary, maximum of the quantity in the first batch electronic unit for loading wait state for a test pallet Below useful load, then the first batch electronic unit in the loading wait state can be judged as the first batch by judging unit End object amount.In the case, judging unit can judge in the first batch electronic unit for loading wait state again Quantity is equal with the maximum loading of a test pallet to be also less than the maximum loading (S220).
The former quantity i.e. in the first batch electronic unit for loading wait state is equal to the maximum of a test pallet The situation of useful load is as shown in Figure 10.At this time, at least a portion that can be will correspond in the electronic unit of the second batch is loaded into Preamble test pallet, and the end object amount of the first batch is loaded into postorder test pallet (S230).
The latter is the maximum that the quantity in the first batch electronic unit for loading wait state is less than a test pallet The situation of useful load is as shown in figure 11.At this time, at least a portion that can be will correspond in the electronic unit of the second batch is loaded into Preamble test pallet, and by the end object amount of the first batch and corresponding at least other in the electronic unit of the second batch Divide and be loaded into postorder test pallet (S231) in the lump.
If completing the loading of electronic unit in the preamble test pallet and postorder test pallet, can then load The the second batch electronic unit (S240) not yet loaded.
Then, the unloading (S250) of the first batch electronic unit is completed, and the unloading of the second batch electronic unit can be completed (S260)。
Figure 13 is the precedence diagram according to the electronic unit test method of another embodiment.According to the electronic unit of the present embodiment Test method may include the theory of resurveying.In addition, TT represents test pallet.
First, the electronic unit (S300) corresponding to the first batch can be loaded.Then, corresponding to the first batch loaded Electronic unit can be unloaded (S310) after testing.If the first batch electronic unit is unloaded, resurvey pair As product are just determined, (S320) can will be loaded for the object product of resurveying of first batch.
Next, it is determined that unit can determine whether not yet to be loaded at present resurvey object product (that is, in loading wait state Resurvey object product for the first batch) quantity whether be (S330) below the maximum loading of a test pallet.If The quantity for resurveying object product in the first batch for loading wait state is then in more than the maximum loading of a test pallet First batch for loading wait state, which resurveys object product, cannot still be considered as the end object amount that the first batch resurveys object product, because The loading step that this first batch resurveys object product can continue.
If on the contrary, resurvey the quantity of object product as a test pallet most in the first batch for loading wait state Below big useful load, then judging unit can be judged as first by resurvey object product in first batch for loading wait state Batch resurveys the end object amount of object product.In the case, judging unit can judge first in loading wait state again The quantity that batch resurveys object product is equal with the maximum loading of a test pallet to be also less than the maximum loading (S340)。
At the former the quantity of object product is resurveyed in the first batch for loading wait state with a test pallet most In the case that big useful load is equal, at least a portion that can be will correspond in the electronic unit of the second batch is loaded into preamble test Pallet, and the end object amount that the first batch can be resurveyed to object product is loaded into postorder test pallet (S350).
It is that the quantity that object product are resurveyed in the first batch for loading wait state is less than a test pallet in the latter In the case of maximum loading, at least a portion that can be will correspond in the electronic unit of the second batch is loaded into preamble test support Disk, and the first batch can be resurveyed object product end object amount and corresponding in the electronic unit of the second batch at least other one Part is loaded into postorder test pallet (S351) in the lump.
, then can will still if completing the loading of electronic unit in the preamble test pallet and postorder test pallet The the second batch electronic unit not loaded is loaded (S360).
Then, complete the first batch and resurvey the unloading (S370) of object product, and unloading for the second batch electronic unit can be completed Carry (S380).
Although not illustrating in fig. 13, being corresponding to the electronic unit of second batch amount initially can also once test it After retested.At this time, if additional test can then perform repeatedly corresponding to the situation of the electronic unit of the 3rd batch Foregoing step.
Embodiments illustrated above is that a part of example of the present invention is illustrated, and interest field of the invention is simultaneously The embodiment described is not limited to, those skilled in the art can be real in the range of the technological thought or claims of the present invention Various change, deformation or displacement are applied, it will be understood that such implementation is belonged in the scope of the present invention.

Claims (13)

  1. A kind of 1. testing, sorting machine, for making electronic unit predetermined comprising " loaded " position, test position and unloading position Circulate and tested successively on path, so that the electronic unit is classified by grade according to test result, wherein, institute Stating testing, sorting machine includes：
    Loading part, for loading the electronic unit；
    Support sector is tested, the electronic unit for enabling loading to finish is tested；
    Uninstalling portion, the electronic unit for making to be completed are classified and are unloaded by grade；And
    Control unit, for controlling the loading part, the test support sector and the uninstalling portion,
    The control unit makes to be later than described first when the electronic unit corresponding to the first batch tested in advance is loaded and finishes At least a portion in the electronic unit corresponding to the second batch tested in batches is loaded,
    Wherein, the uninstalling portion includes：
    Non-defective unit resettlement section, for collecting corresponding to the non-defective unit in the electronic unit of first batch or corresponding to the second batch Non-defective unit in the electronic unit of amount；
    First resurveys resettlement section, first retested for housing the needs in the electronic unit corresponding to first batch Resurvey object product；And
    Second resurveys resettlement section, second retested for housing the needs in the electronic unit corresponding to second batch Resurvey object product.
  2. A kind of 2. testing, sorting machine, for making electronic unit predetermined comprising " loaded " position, test position and unloading position Circulate and tested successively on path, so that the electronic unit is classified by grade according to test result, wherein, institute Stating testing, sorting machine includes：
    Loading part, for loading the electronic unit；
    Support sector is tested, the electronic unit for enabling loading to finish is tested；
    Uninstalling portion, the electronic unit for making to be completed are classified and are unloaded by grade；And
    Control unit, for controlling the loading part, the test support sector and the uninstalling portion,
    The control unit makes to be later than described first when the electronic unit corresponding to the first batch tested in advance is loaded and finishes At least a portion in the electronic unit corresponding to the second batch tested in batches is loaded,
    Wherein, the electronic unit corresponding to first batch being completed is categorized as non-defective unit and resurveys object product by control unit And unloading is completed,
    Wherein, the control unit is in the completion of discharge of the electronic unit corresponding to first batch, makes corresponding to described the The loading of the electronic unit of two batches interrupts, and makes what the needs in the electronic unit corresponding to first batch retested First, which resurveys object product, is loaded, and when first loading for resurveying object product finishes, make to correspond to the second batch The remainder being not yet loaded in the electronic unit of amount is loaded.
  3. A kind of 3. testing, sorting machine, for making electronic unit predetermined comprising " loaded " position, test position and unloading position Circulate and tested successively on path, so that the electronic unit is classified by grade according to test result, wherein, institute Stating testing, sorting machine includes：
    Loading part, for loading the electronic unit；
    Support sector is tested, the electronic unit for enabling loading to finish is tested；
    Uninstalling portion, the electronic unit for making to be completed are classified and are unloaded by grade；And
    Control unit, for controlling the loading part, the test support sector and the uninstalling portion,
    The control unit makes to be later than described first when the electronic unit corresponding to the first batch tested in advance is loaded and finishes At least a portion in the electronic unit corresponding to the second batch tested in batches is loaded,
    Wherein, the electronic unit corresponding to first batch being completed is categorized as non-defective unit and resurveys object product by control unit And unloading is completed,
    Wherein, the control unit is in the completion of discharge of the electronic unit corresponding to first batch, makes corresponding to described the The loading of the electronic unit of two batches interrupts, and makes what the needs in the electronic unit corresponding to first batch retested First, which resurveys object product, is loaded, and when first loading for resurveying object product finishes, make to correspond to the second batch The remainder being not yet loaded in the electronic unit of amount is loaded,
    Wherein, the uninstalling portion includes：
    Non-defective unit resettlement section, for collecting corresponding to the non-defective unit in the electronic unit of first batch or corresponding to the second batch Non-defective unit in the electronic unit of amount；
    First resurveys resettlement section, first retested for housing the needs in the electronic unit corresponding to first batch Resurvey object product；And
    Second resurveys resettlement section, second retested for housing the needs in the electronic unit corresponding to second batch Resurvey object product.
  4. 4. the testing, sorting machine as described in claim 1 or 3, wherein, the control unit is in the electricity corresponding to first batch During the completion of discharge of subassembly, the loading corresponding to the electronic unit of second batch is interrupted, and make to be contained in described the One, which resurveys described the first of resettlement section, resurveys object product and is loaded, and when first loading for resurveying object product finishes, Loaded the remainder being not yet loaded in the electronic unit corresponding to second batch.
  5. 5. the testing, sorting machine as described in claim 1 or 3, wherein, the control unit is in the electricity corresponding to first batch Subassembly is unloaded when finishing, and makes to be contained in the electronic unit corresponding to first batch in the non-defective unit resettlement section Non-defective unit is discharged, and the non-defective unit in the electronic unit corresponding to second batch is accommodated in the non-defective unit resettlement section.
  6. 6. the testing, sorting machine as described in claim 1 or 3, wherein, the uninstalling portion further includes：
    Non-defective unit resettlement section is resurveyed, the non-defective unit in object product is resurveyed for collecting has retested described first；
    Defective products resettlement section is resurveyed, defective products in object product is resurveyed for housing described first.
  7. 7. testing, sorting machine as claimed in claim 6, wherein, the unloading that the control unit resurveys object product described first is complete Bi Shi, makes to resurvey described first in non-defective unit resettlement section described in being contained in and resurveys the non-defective unit in object product and be contained in described resurvey First defective products resurveyed in object product in defective products resettlement section is discharged, and resurveys object product described second Retest when finishing, make second non-defective unit resurveyed in object product be accommodated in it is described resurvey non-defective unit resettlement section, and make institute State the second defective products resurveyed in object product and be accommodated in and described resurvey defective products resettlement section.
  8. 8. a kind of electronic unit test method, using testing, sorting machine, which is used to make electronic unit comprising dress Carry and circulate and tested successively on the predefined paths of position, test position and unloading position, so that will according to test result The electronic unit is classified by grade, wherein, described method includes following steps：
    The electronic unit corresponding to the first batch tested in advance is loaded；
    When the loading of the electronic unit corresponding to first batch finishes, by what is be later than first batch and tested It is loaded corresponding at least a portion in the electronic unit of the second batch；
    The electronic unit corresponding to first batch being completed is categorized as non-defective unit to complete to unload with object product are resurveyed；
    At least a portion in the electronic unit corresponding to second batch being completed is categorized as non-defective unit and is resurveyed pair Unloaded as product；
    In the completion of discharge of the electronic unit corresponding to first batch, the ministry of electronics industry corresponding to second batch is interrupted The loading of part, and the object product of resurveying that will correspond in the electronic unit of first batch are loaded；
    Object product of resurveying in the electronic unit corresponding to first batch are loaded when finishing, and will correspond to described second The remainder being not yet loaded in the electronic unit of batch is loaded；
    The object product of resurveying retested in the electronic unit corresponding to first batch that finishes are categorized as non-defective unit and not Non-defective unit and complete to unload；
    Remainder in the electronic unit corresponding to second batch being completed is categorized as non-defective unit and resurveys object Product and unloaded；
    When the electronic unit corresponding to second batch is unloaded and finishes, the electronic unit of second batch will correspond to In object product of resurveying be loaded；And
    The object product of resurveying retested in the electronic unit corresponding to second batch that finishes are categorized as non-defective unit and not Non-defective unit and unloaded.
  9. A kind of 9. testing, sorting machine, for making electronic unit predetermined comprising " loaded " position, test position and unloading position Circulate and tested successively on path, so that the electronic unit is classified by grade according to test result, and it is a pair of Test pallet is respectively relative to other side in test position and is arranged in upper and lower part, so that being loaded into the pair of test pallet Electronic unit tested at the same time, wherein, the testing, sorting machine includes：
    Loading part, for loading the electronic unit；
    Support sector is tested, the electronic unit for enabling loading to finish is tested；
    Uninstalling portion, the electronic unit for making to be completed are classified and are unloaded by grade；And
    Control unit, for controlling the loading part, the test support sector and the uninstalling portion,
    Quantity in the electronic unit that loads wait state of the control unit in the electronic unit corresponding to the first batch During for below the maximum loading of a test pallet, make at least a portion elder generation quilt in the electronic unit corresponding to the second batch Preamble test pallet is loaded into, and makes the electronics in loading wait state in the electronic unit corresponding to first batch Component is loaded on postorder test pallet.
  10. 10. testing, sorting machine as claimed in claim 9, wherein, the control unit makes the electricity corresponding to second batch Whether the part in subassembly is first loaded on before the preamble test pallet, judge the preamble test pallet described The top of the postorder test pallet is arranged at test position.
  11. 11. testing, sorting machine as claimed in claim 9, wherein, the control unit is in the electronics corresponding to first batch In component in load the electronic unit of wait state less than test pallet maximum loading when, make corresponding to described At least other parts in the electronic unit of second batch are also loaded on the postorder test pallet.
  12. A kind of 12. testing, sorting machine, for making electronic unit predetermined comprising " loaded " position, test position and unloading position Circulate and tested successively on path, so that the electronic unit is classified by grade according to test result, and it is a pair of Test pallet is respectively relative to other side in test position and is arranged in upper and lower part, so that being loaded into the pair of test pallet Electronic unit tested at the same time, wherein, the testing, sorting machine includes：
    Loading part, for loading the electronic unit；
    Support sector is tested, the electronic unit for finishing loading is tested；
    Uninstalling portion, the electronic unit for making to be completed are classified and are unloaded by grade；And
    Control unit, for controlling the loading part, the test support sector and the uninstalling portion,
    The control unit makes resurveying pair for first batch after the electronic unit corresponding to the first batch is unloaded As product are loaded, and when the quantity in the electronic unit for loading wait state resurveyed in object product is a test When below the maximum loading of pallet, at least a portion in the electronic unit corresponding to the second batch is set first to be loaded on preamble Test pallet, and described resurvey in object product is loaded on postorder test support in the electronic unit for loading wait state Disk.
  13. 13. a kind of electronic unit test method, using testing, sorting machine, which is used to make electronic unit comprising dress Carry and circulate and tested successively on the predefined paths of position, test position and unloading position, so that will according to test result The electronic unit is classified by grade, and a pair of of test pallet test position be respectively relative to other side be arranged in top and Lower part, so that the electronic unit for being loaded into the pair of test pallet is tested at the same time, wherein, the described method includes as follows Step：
    Load the electronic unit corresponding to the first batch；
    Electronic unit of the unloading corresponding to the first batch；
    Load and resurvey object product for first batch；
    Whether the quantity in the electronic unit for loading wait state resurveyed described in judgement in object product is a test pallet Maximum loading below；
    If the quantity for resurveying the electronic unit in loading wait state in object product and a test pallet are most Big useful load is equal, then at least a portion in the electronic unit corresponding to the second batch is loaded on preamble test pallet, And described resurvey in object product is set to be loaded on postorder test pallet in the electronic unit for loading wait state；
    If the quantity in the electronic unit for loading wait state resurveyed in object product is less than test pallet Maximum loading, then make at least a portion in the electronic unit corresponding to the second batch be loaded on preamble test pallet, and Described resurvey in object product is set to be in the electronic unit for loading wait state and the electronic unit corresponding to second batch In at least other parts be loaded on postorder test pallet；
    Load the excess electron component being not yet loaded in the electronic unit corresponding to second batch；
    The unloading of object product is resurveyed described in completion；And
    Complete the unloading of the electronic unit corresponding to second batch.
CN201510219748.5A 2014-05-12 2015-04-30 Testing, sorting machine and utilize this electronic unit test method Active CN105080861B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR10-2014-0056456 2014-05-12
KR1020140056456A KR102128545B1 (en) 2014-05-12 2014-05-12 Test handler and electronic device test method using the same

Publications (2)

Publication Number Publication Date
CN105080861A CN105080861A (en) 2015-11-25
CN105080861B true CN105080861B (en) 2018-04-20

Family

ID=54562718

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201510219748.5A Active CN105080861B (en) 2014-05-12 2015-04-30 Testing, sorting machine and utilize this electronic unit test method

Country Status (3)

Country Link
KR (1) KR102128545B1 (en)
CN (1) CN105080861B (en)
TW (1) TWI599784B (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102359420B1 (en) * 2017-04-25 2022-02-09 (주)테크윙 Handler for testing electronic components
KR102249305B1 (en) * 2019-04-15 2021-05-07 주식회사 아테코 Electronic device test handler
KR102358771B1 (en) * 2020-07-03 2022-02-07 주식회사 네오셈 SSD test apparatus and test device applying them
CN112317366B (en) * 2020-09-17 2023-05-12 杭州长川科技股份有限公司 Product retest device
CN115156069B (en) * 2022-07-07 2023-04-07 深圳创维－Rgb电子有限公司 Material testing method, device, equipment and computer readable storage medium

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54146581A (en) * 1978-05-09 1979-11-15 Mitsubishi Electric Corp Electric chracteristic measuring device for semiconductor chip
US4506213A (en) * 1983-07-18 1985-03-19 Sym-Tek Systems, Inc. Electronic device handler
TW201026403A (en) * 2008-07-24 2010-07-16 Dtg Int Gmbh Apparatus and method for transferring electronic devices to and from a test position
CN102240644A (en) * 2010-05-11 2011-11-16 中山天贸电池有限公司 Test sorting machine for battery product and sorting method for test sorting machine
CN202305747U (en) * 2011-08-08 2012-07-04 深圳麦逊电子有限公司 Feeding and discharging devices of multi-test-fixture printed circuit board (PCB) grating test system
CN103372544A (en) * 2012-04-12 2013-10-30 未来产业株式会社 Sorting system for semiconductor element

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19680913C2 (en) * 1995-09-04 1999-06-17 Advantest Corp Semiconductor device transport and handling device
US6043101A (en) * 1997-01-15 2000-03-28 Texas Instruments Incorporated In-situ multiprobe retest method with recovery recognition
US5927512A (en) * 1997-01-17 1999-07-27 Micron Technology, Inc. Method for sorting integrated circuit devices
KR100800312B1 (en) * 2006-01-25 2008-02-04 (주)테크윙 Test handler and loading method of test handler
KR100809918B1 (en) * 2006-09-07 2008-03-06 (주)테크윙 Test support method of test handler and test handler
KR100792488B1 (en) 2006-09-07 2008-01-10 (주)테크윙 Test support method of test handler and test handler
KR100894082B1 (en) * 2007-07-31 2009-04-21 (주)테크윙 Method for transferring test trays in a test handler
KR100934034B1 (en) * 2007-12-14 2009-12-28 (주)테크윙 Test handler test support method

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54146581A (en) * 1978-05-09 1979-11-15 Mitsubishi Electric Corp Electric chracteristic measuring device for semiconductor chip
US4506213A (en) * 1983-07-18 1985-03-19 Sym-Tek Systems, Inc. Electronic device handler
TW201026403A (en) * 2008-07-24 2010-07-16 Dtg Int Gmbh Apparatus and method for transferring electronic devices to and from a test position
CN102240644A (en) * 2010-05-11 2011-11-16 中山天贸电池有限公司 Test sorting machine for battery product and sorting method for test sorting machine
CN202305747U (en) * 2011-08-08 2012-07-04 深圳麦逊电子有限公司 Feeding and discharging devices of multi-test-fixture printed circuit board (PCB) grating test system
CN103372544A (en) * 2012-04-12 2013-10-30 未来产业株式会社 Sorting system for semiconductor element

Also Published As

Publication number Publication date
TW201546465A (en) 2015-12-16
KR20150129904A (en) 2015-11-23
CN105080861A (en) 2015-11-25
TWI599784B (en) 2017-09-21
KR102128545B1 (en) 2020-07-01

Similar Documents

Publication Publication Date Title
CN105080861B (en) Testing, sorting machine and utilize this electronic unit test method
US7042243B2 (en) Device test apparatus and test method including control unit(s) between controller and test units
US7633288B2 (en) Method of testing semiconductor devices and handler used for testing semiconductor devices
KR100270652B1 (en) Semiconductor device transferring apparatus
US9000789B2 (en) Method and equipment for testing semiconductor apparatuses simultaneously and continuously
TW484013B (en) A method for testing electronic device and electronic testing device
CN102565653B (en) A kind of crystal round test approach
CN101515479B (en) Method for increasing test coverage of scan chain and device thereof
CN104889077A (en) Sorting machine for test of semiconductor member and testing support method of the sorting machine
CN107533102A (en) Element processor
CN107703318A (en) The method of testing and device of sample, computer-readable recording medium
CN101932947B (en) Method of sharing a test resource at a plurality of test sites, automated test equipment, and test system
CN108806761A (en) A kind of SSD function test methods, system and computer storage media
US10120016B2 (en) Semiconductor test apparatus
US6922050B2 (en) Method for testing a remnant batch of semiconductor devices
KR102170713B1 (en) Test handler and electronic device test method using the same
CN103713219A (en) Electronic component detection equipment and detection method thereof
CN104834301B (en) The life testing method and system of automobile electronic controller
TWI763794B (en) Wafer inspection apparatus and diagnostic method of wafer inspection apparatus
KR102172747B1 (en) Method of testing semiconductor devices
US6911815B2 (en) Semiconductor test system and method of operating the same
US20040216537A1 (en) Continuous test flow method and apparatus
JPH10260225A (en) Ic test method and device executing the same
KR100809919B1 (en) Test handler, lot card assortment method of lot card assortment apparatus for test handler and test support method of test handler
JP2018087735A (en) Electronic component conveying device and electronic component inspection device

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant