CN104977438A - Circuit breaker double-ended vacuum suction test mechanism and method thereof - Google Patents
Circuit breaker double-ended vacuum suction test mechanism and method thereof Download PDFInfo
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- CN104977438A CN104977438A CN201510428040.0A CN201510428040A CN104977438A CN 104977438 A CN104977438 A CN 104977438A CN 201510428040 A CN201510428040 A CN 201510428040A CN 104977438 A CN104977438 A CN 104977438A
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Abstract
The present invention discloses a circuit breaker double-ended vacuum suction test mechanism and a method thereof. The circuit breaker double-ended vacuum suction test mechanism mainly comprises a testing base. The upper surface of the testing base is provided with a square-shaped first testing area, a strip-shaped second testing area which presses against one edge of the first testing area, a plate to be tested arranged on the upper surfaces of the first testing area and the second testing area, a plurality of data transmission terminals which are adjacent to the plate to be tested and are uniformly arranged on the upper surface of the first testing area and an air cylinder arranged under the second testing area. The air cylinder drags the second testing area to move up and down to achieve the testing requirements of testing breaking, short circuit, and impedance. According to the circuit breaker double-ended vacuum suction test mechanism and the method, test point pressing, high fixture cost and difficult thin line alignment are overcome, and the test mechanism and the method have the advantages of low fixture cost and fast testing speed.
Description
Technical field
The present invention relates to a kind of method of testing of measurement jig, be specifically related to a kind of disconnected short circuit two ends formula vacuum attraction mechanism for testing and method thereof.
Background technology
At present, traditional method of testing uses test probe, but it has: the 1) doubt that weighs wounded of test point; 2) problem of tool high cost; 3) run into fine rule road cannot test or contraposition difficulty, need to do two sections of tests with conducting resinl, work efficiency is lower.
Summary of the invention
For solving the problems of the technologies described above, we have proposed one and can overcome above problem and lower-cost disconnected short circuit two ends formula vacuum attraction mechanism for testing and method thereof.
For achieving the above object, technical scheme of the present invention is as follows:
A kind of disconnected short circuit two ends formula vacuum attraction mechanism for testing, it comprises Test bench, the upper surface of described Test bench is provided with the first square test section, bar shaped second test section leant with one edge in the first test section, be located at the board under test on described first test section and the second test section upper surface, be disposed adjacent with described board under test and several data transfer terminals be evenly located on described first test section upper surface and the cylinder be located at below described second test section, described cylinder drags the second test section and moves up and down, described first test section comprises the first vacuum suction room and the pcb plate be located on the first top, vacuum suction room or flexible circuit board, described second test section comprises the second vacuum suction room and the metal be located on the second top, vacuum suction room or non-metal board, the periphery of described pcb plate or flexible circuit board and metal or non-metal board all offer uniform some through holes, described board under test is positioned at the determinand being provided with bar shaped above described second test section and carefully goes out pin terminal, described board under test and pcb plate or flexible circuit board are equipped with identical test point, and carefully go out pin terminal physical property with described determinand and be connected.
Preferably, described board under test is flexible circuit board or contact panel or blood sugar nude film.
Preferably, described test point is gold point, silver point, copper point, charcoal point or non-metal conductor.
Preferably, also comprise the board under test alignment device be disposed adjacent with other three edges of described first test section, described alignment device comprise be located at the first both sides, test section and with the second orthogonal vertical dragging track in test section and the sliding horizontal track be located on described vertical dragging track, described sliding horizontal track is also evenly provided with two CCD or electron microscope, and described CCD or electron microscope can move left and right.
Preferably, described second district to be measured is metal or nonmetal dead-short-circuit district.
A kind of disconnected short circuit two ends formula vacuum attraction method of testing, it adopts as above arbitrary disconnected short circuit two ends formula vacuum attraction mechanism for testing, and described method of testing concrete steps are as follows:
A. flexible circuit board or contact panel are placed in the pcb plate laying corresponding test point or flexible circuit board, first carry out test point contraposition, by CCD or the accurate contraposition of electron microscope auxiliary para functional realiey;
B. after contraposition correctly, second district to be measured metal or nonmetal dead-short-circuit device can pass through the drop-down action of cylinder the second test section lower than the first district to be measured, allow determinand go out pin hold the place contacted with the second district to be measured metal or non-metal board to depart from not contact, now pcb plate or flexible circuit board district are still the situations of absorption, by Test Host test the insulation of wired, can measure and whether have short circuit or micro-short circuit situation;
C. after above action completes, second district to be measured can reach same plane by go up action and the first test section of cylinder, by vacuumizing mode, determinand is tightly adsorbed again, the test point of determinand is allowed to carry out every bar circuit end to end via pcb plate or flexible circuit board district and metal or nonmetal dead-short-circuit district by open/short test machine: a. resistance value measures, the measurement action whether b. breaks.
Pass through technique scheme, disconnected short circuit two ends formula vacuum attraction mechanism for testing of the present invention and method thereof, test point with gold point, silver point, copper point, charcoal point or non-metal conductor as contact point, plane to plane without weighing problem wounded, and a point two-part vacuum attraction mode can survey general point-to-point engaged test, also can survey fine rule road dead-short-circuit and measure open circuit and resistance measurement, there is test speed fast, fine rule road is perplexed without in contraposition, and measurement jig cost comparatively conventional probe formula is low.
Accompanying drawing explanation
In order to be illustrated more clearly in the embodiment of the present invention or technical scheme of the prior art, be briefly described to the accompanying drawing used required in embodiment or description of the prior art below, apparently, accompanying drawing in the following describes is only some embodiments of the present invention, for those of ordinary skill in the art, under the prerequisite not paying creative work, other accompanying drawing can also be obtained according to these accompanying drawings.
Fig. 1 is the structural representation of a kind of disconnected short circuit two ends formula vacuum attraction mechanism for testing disclosed in the embodiment of the present invention 1;
Fig. 2 is the decomposing schematic representation of the first test section in a kind of disconnected short circuit two ends formula vacuum attraction mechanism for testing disclosed in the embodiment of the present invention 1.
Embodiment
Below in conjunction with the accompanying drawing in the embodiment of the present invention, be clearly and completely described the technical scheme in the embodiment of the present invention, obviously, described embodiment is only the present invention's part embodiment, instead of whole embodiments.Based on the embodiment in the present invention, those of ordinary skill in the art, not making the every other embodiment obtained under creative work prerequisite, belong to the scope of protection of the invention.
Below in conjunction with schematic diagram, the specific embodiment of the present invention is described in further detail.
Embodiment 1.
As Fig. 1, shown in Fig. 2, a kind of disconnected short circuit two ends formula vacuum attraction mechanism for testing, it comprises Test bench 1, the upper surface of described Test bench 1 is provided with the first square test section, bar shaped second test section leant with one edge in the first test section, be located at the board under test 2 on described first test section and the second test section upper surface, be disposed adjacent with described board under test 2 and several data transfer terminals 3 be evenly located on described first test section upper surface and the cylinder 4 be located at below described second test section, described cylinder 4 drags the second test section and moves up and down, reach the disconnected short circuit of test, the test request of impedance, data transfer terminal 3 matches with test machine, described first test section comprises the first vacuum suction room 5 and the pcb plate be located on the first top, vacuum suction room 5 or flexible circuit board 6, described second test section comprises the second vacuum suction room 7 and the metal be located on the second top, vacuum suction room 7 or non-metal board 8, the periphery of described pcb plate or flexible circuit board 6 and metal or non-metal board 8 all offer uniform some through hole a, described board under test 2 is positioned at the determinand being provided with bar shaped above described second test section and carefully goes out pin terminal 9, described board under test 2 and pcb plate or flexible circuit board 6 are equipped with identical test point b, and carefully go out pin terminal 9 physical property with described determinand and be connected.This disconnected short circuit two ends formula vacuum attraction mechanism for testing, can survey general point-to-point engaged test, also can survey fine rule road dead-short-circuit and measure open circuit and resistance measurement.
Continue as shown in Figure 1 and Figure 2, described board under test 2 is flexible circuit board or contact panel or blood sugar nude film.
Continue as shown in Figure 2, described test point b is gold point, silver point, copper point, charcoal point or non-metal conductor, plane to plane without weighing problem wounded.
Continue as shown in Figure 1 and Figure 2, also comprise the board under test alignment device be disposed adjacent with other three edges of described first test section, described alignment device comprise be located at the first both sides, test section and with the second orthogonal vertical dragging track 10 in test section and the sliding horizontal track 11 be located on described vertical dragging track 10, described sliding horizontal track 11 is also evenly provided with two CCD or electron microscope, and described CCD or electron microscope can move left and right 12.
Continue as shown in Figure 1 and Figure 2, described second district to be measured is metal or nonmetal dead-short-circuit district.
A kind of disconnected short circuit two ends formula vacuum attraction method of testing, it adopts as above arbitrary disconnected short circuit two ends formula vacuum attraction mechanism for testing, and described method of testing concrete steps are as follows:
A. board under test and flexible circuit board or contact panel are placed on the pcb plate or flexible circuit board laying corresponding test point, first carry out test point (as X1.X2.X3 in Fig. 2 ... Y1.Y2.Y3 ...) contraposition (confirming that whether contraposition correct by top CCD or electron microscope);
B. after contraposition correctly, first district to be measured and the second district to be measured can according to the successively segmentations of actual testing requirement, allow the test point of determinand via after the test point coincidence in pcb plate or flexible circuit board also adsorbed close, (the second district to be measured metal or nonmetal dead-short-circuit device can comply with test needs, judge whether voluntarily to inhale vacuum and entire lowering), again by Test Host test the insulation of wired, can measure and whether have short circuit or micro-short circuit situation (as X1.X2.X3 in Fig. 2 ... Y1.Y2.Y3 ...);
C. after above action completes, second district to be measured metal or nonmetal dead-short-circuit device can keep horizontality by the action of cylinder the second district to be measured, test section first, by vacuumizing mode, determinand is tightly adsorbed again, the test point of determinand is allowed to carry out every bar circuit end to end via pcb plate or flexible circuit board district and metal or nonmetal dead-short-circuit district by open/short test machine: a. resistance value measures, the measurement action whether b. breaks.
Determinand Open/Short/Resistance/Insulation can be tested via B and C.
Above-described is only the preferred embodiment of the present invention, it should be pointed out that for the person of ordinary skill of the art, and without departing from the concept of the premise of the invention, can also make some distortion and improvement, these all belong to protection scope of the present invention.
Claims (6)
1. a disconnected short circuit two ends formula vacuum attraction mechanism for testing, it is characterized in that, it comprises Test bench, the upper surface of described Test bench is provided with the first square test section, bar shaped second test section leant with one edge in the first test section, be located at the board under test on described first test section and the second test section upper surface, be disposed adjacent with described board under test and several data transfer terminals be evenly located on described first test section upper surface and the cylinder be located at below described second test section, described cylinder drags the second test section and moves up and down, described first test section comprises the first vacuum suction room and the pcb plate be located on the first top, vacuum suction room or flexible circuit board, described second test section comprises the second vacuum suction room and the metal be located on the second top, vacuum suction room or non-metal board, the periphery of described pcb plate or flexible circuit board and metal or non-metal board all offer uniform some air holes, described board under test is positioned at the determinand being provided with bar shaped above described second test section and carefully goes out pin terminal, described board under test and pcb plate or flexible circuit board are equipped with identical test point, and carefully go out pin terminal physical property with described determinand and be connected.
2. one according to claim 1 is broken short circuit two ends formula vacuum attraction mechanism for testing, it is characterized in that, described board under test is flexible circuit board or contact panel or blood sugar nude film.
3. one according to claim 1 is broken short circuit two ends formula vacuum attraction mechanism for testing, and it is characterized in that, described test point is gold point, silver point, copper point, charcoal point or non-metal conductor.
4. one according to claim 1 is broken short circuit two ends formula vacuum attraction mechanism for testing, it is characterized in that, also comprise the board under test alignment device be disposed adjacent with other three edges of described first test section, described alignment device comprise be located at the first both sides, test section and with the second orthogonal vertical dragging track in test section and the sliding horizontal track be located on described vertical dragging track, described sliding horizontal track is also evenly provided with two CCD or electron microscope, and described CCD or electron microscope can move left and right.
5. one according to claim 1 is broken short circuit two ends formula vacuum attraction mechanism for testing, and it is characterized in that, described second district to be measured is metal or nonmetal dead-short-circuit district.
6. a disconnected short circuit two ends formula vacuum attraction method of testing, is characterized in that, it adopts disconnected short circuit two ends as arbitrary in claim 1-5 formula vacuum attraction mechanism for testing, and described method of testing concrete steps are as follows:
A. flexible circuit board or contact panel are placed in the pcb plate laying corresponding test point or flexible circuit board, first carry out test point contraposition;
B. after contraposition correctly, second district to be measured metal or nonmetal dead-short-circuit device can pass through the drop-down action of cylinder the second test section lower than the first district to be measured, allow determinand go out pin hold the place contacted with the second district to be measured metal or non-metal board to depart from not contact, now pcb plate or flexible circuit board district are still the situations of absorption, by Test Host test the insulation of wired, can measure and whether have short circuit or micro-short circuit situation;
C. after above action completes, second district to be measured can reach same plane by go up action and the first test section of cylinder, by vacuumizing mode, determinand is tightly adsorbed again, the test point of determinand is allowed to carry out every bar circuit end to end via pcb plate or flexible circuit board district and metal or nonmetal dead-short-circuit district by open/short test machine: a. resistance value measures, the measurement action whether b. breaks.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510428040.0A CN104977438A (en) | 2015-07-21 | 2015-07-21 | Circuit breaker double-ended vacuum suction test mechanism and method thereof |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510428040.0A CN104977438A (en) | 2015-07-21 | 2015-07-21 | Circuit breaker double-ended vacuum suction test mechanism and method thereof |
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| CN104977438A true CN104977438A (en) | 2015-10-14 |
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| CN201510428040.0A Pending CN104977438A (en) | 2015-07-21 | 2015-07-21 | Circuit breaker double-ended vacuum suction test mechanism and method thereof |
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Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6087839A (en) * | 1997-03-13 | 2000-07-11 | Samsung Electronics Co., Ltd. | Apparatus for testing printed circuit board |
| CN202770460U (en) * | 2012-07-12 | 2013-03-06 | 湖南凯杰科技有限责任公司 | Online detection jig |
| CN203191515U (en) * | 2013-04-03 | 2013-09-11 | 深圳市森力普电子有限公司 | Testing tool |
| CN203658538U (en) * | 2014-01-14 | 2014-06-18 | 厦门爱谱生电子科技有限公司 | Capacitive screen type flexible circuit board test fixture |
| CN104035022A (en) * | 2014-06-06 | 2014-09-10 | 胜宏科技（惠州）股份有限公司 | Method for automatically testing circuit boards |
| CN203849296U (en) * | 2014-05-29 | 2014-09-24 | 温州深科检测设备有限公司 | Miniature circuit breaker short-circuit characteristic automatic test clamp |
| CN204807591U (en) * | 2015-07-21 | 2015-11-25 | 柴英豪 | Disconnected short circuit both ends formula vacuum attracts accredited testing organization |
-
2015
- 2015-07-21 CN CN201510428040.0A patent/CN104977438A/en active Pending
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6087839A (en) * | 1997-03-13 | 2000-07-11 | Samsung Electronics Co., Ltd. | Apparatus for testing printed circuit board |
| CN202770460U (en) * | 2012-07-12 | 2013-03-06 | 湖南凯杰科技有限责任公司 | Online detection jig |
| CN203191515U (en) * | 2013-04-03 | 2013-09-11 | 深圳市森力普电子有限公司 | Testing tool |
| CN203658538U (en) * | 2014-01-14 | 2014-06-18 | 厦门爱谱生电子科技有限公司 | Capacitive screen type flexible circuit board test fixture |
| CN203849296U (en) * | 2014-05-29 | 2014-09-24 | 温州深科检测设备有限公司 | Miniature circuit breaker short-circuit characteristic automatic test clamp |
| CN104035022A (en) * | 2014-06-06 | 2014-09-10 | 胜宏科技（惠州）股份有限公司 | Method for automatically testing circuit boards |
| CN204807591U (en) * | 2015-07-21 | 2015-11-25 | 柴英豪 | Disconnected short circuit both ends formula vacuum attracts accredited testing organization |
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Application publication date: 20151014 |