CN105790712A - Metal electrode plate for resistance test - Google Patents
Metal electrode plate for resistance test Download PDFInfo
- Publication number
- CN105790712A CN105790712A CN201610202214.6A CN201610202214A CN105790712A CN 105790712 A CN105790712 A CN 105790712A CN 201610202214 A CN201610202214 A CN 201610202214A CN 105790712 A CN105790712 A CN 105790712A
- Authority
- CN
- China
- Prior art keywords
- thin
- test
- metal electrode
- resistance
- electrode board
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 85
- 239000002184 metal Substances 0.000 title claims abstract description 25
- 239000000758 substrate Substances 0.000 claims abstract description 19
- 239000000523 sample Substances 0.000 claims abstract description 15
- 238000000034 method Methods 0.000 description 7
- 238000001514 detection method Methods 0.000 description 5
- 238000003698 laser cutting Methods 0.000 description 5
- 230000006378 damage Effects 0.000 description 4
- 239000000463 material Substances 0.000 description 4
- 239000002002 slurry Substances 0.000 description 4
- 238000010276 construction Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 238000013083 solar photovoltaic technology Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02S—GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRARED RADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, e.g. USING PHOTOVOLTAIC [PV] MODULES
- H02S50/00—Monitoring or testing of PV systems, e.g. load balancing or fault identification
- H02S50/10—Testing of PV devices, e.g. of PV modules or single PV cells
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
Abstract
The invention discloses a metal electrode plate for resistance test. The metal electrode plate comprises a substrate and one or more test grid components arranged on the substrate. Each test grid component comprises a long thin grid used for testing line resistance and multiple parallel short thin grids used for testing contact resistance. The metal electrode plate for resistance test is simple in structure and low in cost. The line resistance and contact resistance can be tested directly by a probe, and the test results are accurate.
Description
Technical field
The present invention relates to solar-photovoltaic technology field, be specifically related to a kind of metal electrode board for resistance test.
Background technology
Transmission-line modeling method can be used for the contact resistance of electrode of solar battery and the test of line resistance, thus electrode performance is made quantitatively and qualitative evaluation.Realize the method, it is necessary to separated with main grid by the thin grid of existing battery, use laser cutting machine to be parallel to main gate line and battery is cut out.But, there is following defect in it:
First, adopt laser cutting machine, add testing cost, the labor intensity of operator increases.
Second, adopt laser cutting machine that cell piece is cut, it is possible to cell piece can be reached the standard grade and cause damage, cause detection not accurate.
3rd, the overall structure of cell piece is caused destruction.
Therefore one simple in construction, low cost, it is possible to effectively adopt the metal electrode board that contact resistance and the line resistance of electrode of solar battery are tested by transmission-line modeling method urgently to propose.
Summary of the invention
In order to solve above-mentioned technical problem, the present invention proposes a kind of metal electrode board for resistance test, this metal electrode board simple in construction, and cost is low, it is possible to directly utilizes probe and carries out the detection of contact resistance and line resistance, and testing result is accurate.
In order to achieve the above object, technical scheme is as follows:
A kind of metal electrode board for resistance test includes: substrate and be arranged at one or more groups test suite on substrate, and often group test suite includes: the length for p-wire resistance thin and for many of testing contact resistance be arranged in parallel short carefully.
A kind of metal electrode board for resistance test of the present invention adopts the test suite being arranged on substrate to carry out the test of line resistance and contact resistance, owing to the material of substrate of the present invention is identical with the material of solaode plate base, and length on substrate of the present invention is thin identical with the slurry of short thin adopted slurry Yu solar battery sheet, therefore the result that the test suite in the present invention is tested is consistent with the direct result that solar battery sheet is tested maintenance.Solar battery sheet, without adopting extra laser cutting machine, will not be caused damage by the present invention, reduces cost, and detection efficiency is high, more precisely.
On the basis of technique scheme, also can do following improvement:
As preferred scheme, multiple short thin length of same test suite are identical, and many short thin two ends alignment.
Adopting above-mentioned preferred scheme, detection is more accurate, and Justified short probe of being carefully more convenient for is tested.
As preferred scheme, many of same test suite are short carefully to be arranged in parallel along short thin width, adjacent short thin between spacing be arithmetic progression along short thin width.
Adopt above-mentioned preferred scheme, adopt the short thin contact resistance on transmission-line modeling method test substrate and long thin line resistance.
As preferred scheme, short thin length and/or the width of different test suites are different.
Adopt above-mentioned preferred scheme, different length and/or width, be more convenient for being verified, improve the precision of test.
As preferred scheme, different test suites adjacent short thin between the difference of spacing different.
Adopt above-mentioned preferred scheme, be more convenient for being verified, improve the precision of test.
As preferred scheme, length is thin and short carefully to be arranged in parallel.
Adopt above-mentioned preferred scheme, it is simple to probe carries out resistance test.
As preferred scheme, being provided with the first test point for probe in detecting at long thin two ends, the diameter of the first test point is 0.1～10mm.
Adopting above-mentioned preferred scheme, the first test point of setting is easy to probe contact, detects.
As preferred scheme, being provided with the second test point for probe in detecting in short thin centre, the diameter of the second test point is 0.1～10mm.
Adopting above-mentioned preferred scheme, the second test point of setting is easy to probe contact, detects.
As preferred scheme, short thin and/or long thin length value is 10～150mm.
Adopt above-mentioned preferred scheme, it is simple to probe detects.
As preferred scheme, short thin and/or long thin width value is 20～500um.
Adopt above-mentioned preferred scheme, it is simple to probe detects.
Accompanying drawing explanation
The front view of a kind of metal electrode board for resistance test that Fig. 1 provides for the embodiment of the present invention.
Wherein: 1 substrate, 2 test suites, 21 left test suites, 22 right test suites, 23 long thin, 24 short thin, 3 first test points, 4 second test points.
Detailed description of the invention
The preferred embodiment of the present invention is described in detail below in conjunction with accompanying drawing.
In order to reach the purpose of the present invention, in the some of them embodiment of a kind of metal electrode board for resistance test,
As it is shown in figure 1, a kind of metal electrode board for resistance test includes: substrate 1 and be arranged at two groups of test suites 2 on substrate 1, respectively left test suite 21 and right test suite 22.Often group test suite includes: for p-wire resistance length thin 23 and for many of testing contact resistance be arranged in parallel short thin by 24.
The multiple short length of thin 24 of same test suite are identical, and the many short two ends of thin 24 alignment.
The many short length and widths of thin 24 in left test suite 21 are all identical, and length value is 50mm, and width value is 100um, and the length value of long thin 23 is 120cm, and width value is 100um, is arranged at the upper end of substrate 1.And many short thin 24 be arranged in parallel along the short width of thin 24, and two ends alignment.Spacing between adjacent short thin 24 is 2.5,5.0,7.5,10.0,12.5,15.0,17.5,20.0,22.5,25.0mm be arithmetic progression along the short width of thin 24.
The many short length and widths of thin 24 in right test suite 22 are all identical, and length value is 30mm, and width value is 150um, and the length value of long thin 23 is 120cm, and width value is 100um, is arranged at the lower end of substrate 1.And many short thin 24 be arranged in parallel along the short width of thin 24, and two ends alignment.Spacing between adjacent short thin 24 is 3,9,12,15,18,21,24,27mm be arithmetic progression along the short width of thin 24.
Being provided with the first test point 3 for probe in detecting at the two ends of long thin 23, the diameter of the first test point 3 is 0.2mm.
Be provided with the second test point 4 for probe in detecting in the short centre of thin 24, the diameter of the second test point 4 is 0.2mm.
Having the beneficial effect that of a kind of metal electrode board for resistance test of the present invention:
First, employing transmission-line modeling method tests the contact resistance of short thin 24 on substrate 1 and the line resistance of long thin 24.Owing to the material of substrate 1 of the present invention is identical with the material of solaode plate base, and length thin 23 on substrate of the present invention is identical with the slurry of short thin 24 adopted slurries Yu solar battery sheet, therefore the result that the test suite in the present invention is tested keeps consistent with the result directly solar battery sheet tested.Solar battery sheet, without adopting extra laser cutting machine, will not be caused damage by the present invention, reduces cost, and detection efficiency is high, more precisely.
Second, substrate is provided with two groups of different in width, length, pitch difference short thin by 24, be more convenient for test checking, it is ensured that the effectiveness of data.
3rd, it is provided with on the second test point 4 and long thin 23 on short thin 24 and is provided with the first test point 3, it is simple in test process, probe contacts with short thin 24 and long thin 23, it is ensured that resistance test is accurate.
Novel preferred implementation, it is noted that for the person of ordinary skill of the art, without departing from the concept of the premise of the invention, it is also possible to making some deformation and improvement, these broadly fall into protection scope of the present invention.
Claims (10)
1. the metal electrode board for resistance test, it is characterized in that, including: substrate and be arranged at one or more groups test suite on described substrate, often organize described test suite and include: the length for p-wire resistance thin and for many of testing contact resistance be arranged in parallel short carefully.
2. the metal electrode board for resistance test according to claim 1, it is characterised in that multiple described short thin length of same test suite are identical, and many described short thin two ends alignment.
3. the metal electrode board for resistance test according to claim 2, it is characterized in that, many of same test suite are short carefully to be arranged in parallel along described short thin width, adjacent described short thin between spacing be arithmetic progression along described short thin width.
4. the metal electrode board for resistance test according to claim 3, it is characterised in that short thin length and/or the width of different test suites are different.
5. the metal electrode board for resistance test according to claim 4, it is characterised in that different test suites adjacent described short thin between the difference of spacing different.
6. according to any one of claim 1-5 for the metal electrode board of resistance test, it is characterised in that described length is thin and described short carefully be arranged in parallel.
7. the metal electrode board for resistance test according to claim 6, it is characterised in that be provided with the first test point for probe in detecting at the two ends that described length is thin, the diameter of described first test point is 0.1～10mm.
8. the metal electrode board for resistance test according to claim 7, it is characterised in that being provided with the second test point for probe in detecting in described short thin centre, the diameter of described second test point is 0.1～10mm.
9. the metal electrode board for resistance test according to claim 8, it is characterised in that the thin length value of described short thin and/or described length is 10～150mm.
10. the metal electrode board for resistance test according to claim 9, it is characterised in that the thin width value of described short thin and/or described length is 20～500um.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610202214.6A CN105790712A (en) | 2016-04-01 | 2016-04-01 | Metal electrode plate for resistance test |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610202214.6A CN105790712A (en) | 2016-04-01 | 2016-04-01 | Metal electrode plate for resistance test |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN105790712A true CN105790712A (en) | 2016-07-20 |
Family
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201610202214.6A Pending CN105790712A (en) | 2016-04-01 | 2016-04-01 | Metal electrode plate for resistance test |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN105790712A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107871792A (en) * | 2017-12-12 | 2018-04-03 | 苏州阿特斯阳光电力科技有限公司 | Photovoltaic cell and corresponding half tone and sheet resistance and/or the measuring method of contact resistivity |
| CN109540971A (en) * | 2018-12-29 | 2019-03-29 | 宁波石墨烯创新中心有限公司 | Conductive film uniformity detection, system and method |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4205423B2 (en) * | 2002-12-27 | 2009-01-07 | 日新製鋼株式会社 | Solar cell substrate with excellent adhesion |
| CN102555445A (en) * | 2012-01-05 | 2012-07-11 | 天长吉阳新能源有限公司 | Screen printing measurement method for crystalline silicon solar cell |
| CN103085452A (en) * | 2013-02-04 | 2013-05-08 | 无锡帝科电子材料科技有限公司 | Screen printing plate for silicon solar cell silver paste printing experiment |
| CN103197147A (en) * | 2013-03-28 | 2013-07-10 | 顺德中山大学太阳能研究院 | Solar cell multifunctional contact resistance automatic measuring instrument and measuring system thereof |
| CN104332423A (en) * | 2014-10-24 | 2015-02-04 | 无锡帝科电子材料科技有限公司 | Multifunctional comprehensive detection screen printing plate |
| CN205566220U (en) * | 2016-04-01 | 2016-09-07 | 中利腾晖光伏科技有限公司 | A metal electrode board for resistance test |
-
2016
- 2016-04-01 CN CN201610202214.6A patent/CN105790712A/en active Pending
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4205423B2 (en) * | 2002-12-27 | 2009-01-07 | 日新製鋼株式会社 | Solar cell substrate with excellent adhesion |
| CN102555445A (en) * | 2012-01-05 | 2012-07-11 | 天长吉阳新能源有限公司 | Screen printing measurement method for crystalline silicon solar cell |
| CN103085452A (en) * | 2013-02-04 | 2013-05-08 | 无锡帝科电子材料科技有限公司 | Screen printing plate for silicon solar cell silver paste printing experiment |
| CN103197147A (en) * | 2013-03-28 | 2013-07-10 | 顺德中山大学太阳能研究院 | Solar cell multifunctional contact resistance automatic measuring instrument and measuring system thereof |
| CN104332423A (en) * | 2014-10-24 | 2015-02-04 | 无锡帝科电子材料科技有限公司 | Multifunctional comprehensive detection screen printing plate |
| CN205566220U (en) * | 2016-04-01 | 2016-09-07 | 中利腾晖光伏科技有限公司 | A metal electrode board for resistance test |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107871792A (en) * | 2017-12-12 | 2018-04-03 | 苏州阿特斯阳光电力科技有限公司 | Photovoltaic cell and corresponding half tone and sheet resistance and/or the measuring method of contact resistivity |
| CN107871792B (en) * | 2017-12-12 | 2023-11-17 | 苏州阿特斯阳光电力科技有限公司 | Photovoltaic cell and corresponding method for measuring screen printing plate, sheet resistance and/or contact resistivity |
| CN109540971A (en) * | 2018-12-29 | 2019-03-29 | 宁波石墨烯创新中心有限公司 | Conductive film uniformity detection, system and method |
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| Date | Code | Title | Description |
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| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| CB02 | Change of applicant information |
Address after: No. 1, Tenghui Road, Chang Kun Industrial Park, Suzhou, Changshou City, Jiangsu Applicant after: Suzhou Tenghui Photovoltaic Technology Co., Ltd. Address before: No. 1, Tenghui Road, Chang Kun Industrial Park, Suzhou, Changshou City, Jiangsu Applicant before: Zhongli Talesun Solar Technology Co., Ltd. |
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| CB02 | Change of applicant information | ||
| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20160720 |
|
| RJ01 | Rejection of invention patent application after publication |