CN203102256U - Signal test fixture of server DDR3 memory slot - Google Patents
Signal test fixture of server DDR3 memory slot Download PDFInfo
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- CN203102256U CN203102256U CN 201320105881 CN201320105881U CN203102256U CN 203102256 U CN203102256 U CN 203102256U CN 201320105881 CN201320105881 CN 201320105881 CN 201320105881 U CN201320105881 U CN 201320105881U CN 203102256 U CN203102256 U CN 203102256U
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- ddr3 memory
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- test card
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- 238000012360 testing method Methods 0.000 title claims abstract description 98
- 238000009434 installation Methods 0.000 abstract 2
- 238000012423 maintenance Methods 0.000 description 5
- 238000005259 measurement Methods 0.000 description 5
- 238000005516 engineering process Methods 0.000 description 3
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
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Abstract
The utility model discloses a signal test fixture of a server DDR3 memory slot. The signal test fixture comprises a test card which is of a DDR3 memory bar structure, wherein an installation hole and a clamping buckle used for installation are arranged at each of two ends of the test card, a goldfinger is arranged at the lower end of the test card, the length of the goldfinger is equal to that of the DDR3 memory bar, and the width of the goldfinger is not greater than that of the DDR3 memory bar. The test card is provided with an address wire test area, a current supply test through hole, a plurality of data wire test areas and a plurality of clock test points, and meanwhile a system management bus test area is arranged at one end of the test card. When the test fixture is used, output conditions of mainboard memory signals can be tested conveniently, the signal problems of the memory slot can be checked out rapidly, a fault circuit can be judged rapidly, and maintaining work can be conducted conveniently and easily.
Description
Technical field
The utility model relates to the computer testing technology field, specifically a kind of signal testing tool of server DDR3 memory bank.
Background technology
In the maintenance computer process, need measure the voltage and the resistance of each test point on the mainboard with multimeter, but the distribution of these test points disperses very, and be not easy to remember.Often needing looks through a great amount of information seeks various crucial test points, and the cost plenty of time remember each test point, operating so relatively wastes time and energy, test job is very loaded down with trivial details.
The utility model content
The utility model discloses a kind of signal testing tool of server DDR3 memory bank at the weak point that prior art exists.
The signal testing tool of server DDR3 memory bank disclosed in the utility model, can detect the output situation of server master board internal memory signal easily, its technical scheme is as follows: comprise a test card, described test card adopts the structure of DDR3 memory bar, two ends are provided with installs used mounting hole and buckle, the lower end is provided with golden finger, and the length same widths of its length and DDR3 RAM (random access memory) card is not more than the width of DDR3, described test card is provided with the address wire test zone simultaneously, power supply test via hole, plurality of data line test zone and some clock tests point also are provided with the System Management Bus test zone at an end of test card.
Further, all test zones on the described test card and clock test point all comprise some via holes.
The beneficial effect that the signal testing tool of the disclosed server DDR3 of the utility model memory bank has is: use this measurement jig, can detect the output situation of server master board internal memory signal easily, investigate out the memory slot signal problem apace, and then judge faulty circuit fast, make maintenance job convenient and easy.
Description of drawings
Accompanying drawing 1 is the front plan view of the utility model embodiment;
Accompanying drawing 2 is the back side vertical view of the utility model embodiment;
Accompanying drawing marking explanation: 1, test card; 2, mounting hole; 3, buckle; 4, golden finger; 5, clock test point; 6, power supply test via hole; 7, data line test zone; 8, address wire test zone; 9, System Management Bus test zone.
Embodiment
Below in conjunction with drawings and Examples, the signal testing tool of server DDR3 memory bank disclosed in the utility model is described in further details.
Embodiment:
The DDR3 of server described in present embodiment memory bank signal testing tool, its structure as depicted in figs. 1 and 2.This signal testing tool is a test card 1, the contour structures of the contour structures of described test card 1 and DDR3 memory bar coincide, two ends are provided with mounting hole 2 and buckle 3, the lower end is provided with golden finger 4, the length of described in addition test card 1 is identical with the length of DDR3 RAM (random access memory) card, and width is less than the width of DDR3 RAM (random access memory) card.In the present embodiment, described test card 1 is provided with three clock test points 5, two power supply test via holes 6, two data line test zones 7 and address wire test zones 8, and an end of described test card 1 also is provided with a System Management Bus test zone 9.Further, all test zones and the clock test point on the described test card 1 all comprises some via holes.In the present embodiment simultaneously, described three clock test points 5 and two power supply test via holes 6 are arranged on same horizontal level, described two data line test zones 7 and an address wire test zone 8 are arranged on same horizontal level, and address wire test zone 8 is arranged between two data line test zones 7.And the more described clock test point 5 in described in the present embodiment data line test zone 7 positions is near lower end golden finger 4, and the connection distance has been shortened in this design.Except that the described situation of present embodiment, the individual number average of described clock test zone, power supply test zone, data line test zone and address wire test zone can change according to the actual requirements, also can there be other set-up mode the position of each test zone simultaneously, as long as can satisfy the demand of DDR3 memory bank signal testing.
DDR3 memory bank signal testing tool disclosed in the utility model is a aid at the maintenance of mainboard chip-scale.During use, the mounting means of this measurement jig analog D DR3 memory bar assigns in the memory bank, the signal on the slot can be extended out; And by this measurement jig, on pcb board, the signal of interest of slot can be sorted out, make different test zones with the form of via hole then.In this measurement jig, the clock test point is used to obtain clock signal, power supply test via hole is used to obtain signals such as supply voltage, resistance, the data line test zone is used to obtain data line signal, the address wire test zone is used to obtain the address wire signal, and the System Management Bus test zone is used to obtain reset signal.Measure test zone and test point signal on the measurement jig fast by instruments such as multimeters like this, can judge faulty circuit fast, make maintenance job convenient and easy, do not remember the test point of those difficult notes and need not lose time, be not required to be yet and look for various test points inspection information everywhere, make maintenance job convenient and easy.
Except that technical characterictic described in the utility model, be the known technology of those skilled in the art.
Claims (2)
1. the signal testing tool of a server DDR3 memory bank, it is characterized in that, comprise a test card, described test card adopts the structure of DDR3 memory bar, two ends are provided with installs used mounting hole and buckle, the lower end is provided with golden finger, and the length same widths of its length and DDR3 memory bar is not more than the width of DDR3 memory bar, simultaneously described test card is provided with address wire test zone, power supply test via hole, plurality of data line test zone and some clock tests point, also is provided with the System Management Bus test zone at an end of test card.
2. signal testing tool according to claim 1 is characterized in that, all test zones and clock test point on the described test card all comprise some via holes.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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CN 201320105881 CN203102256U (en) | 2013-03-08 | 2013-03-08 | Signal test fixture of server DDR3 memory slot |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
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CN 201320105881 CN203102256U (en) | 2013-03-08 | 2013-03-08 | Signal test fixture of server DDR3 memory slot |
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CN203102256U true CN203102256U (en) | 2013-07-31 |
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CN 201320105881 Expired - Fee Related CN203102256U (en) | 2013-03-08 | 2013-03-08 | Signal test fixture of server DDR3 memory slot |
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Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN105067991A (en) * | 2015-08-10 | 2015-11-18 | 宁波华远电子科技有限公司 | Circuit board detection device and detection method |
CN105489249A (en) * | 2015-12-09 | 2016-04-13 | 浪潮电子信息产业股份有限公司 | Fast DDR3 measurement method |
CN106502812A (en) * | 2016-10-14 | 2017-03-15 | 郑州云海信息技术有限公司 | A kind of pcb board of fast monitored storage hard disk groove position failure and its method |
CN106776162A (en) * | 2016-11-28 | 2017-05-31 | 郑州云海信息技术有限公司 | A kind of method of signal supervisory instrument and its detection internal memory signal |
TWI769715B (en) * | 2020-08-31 | 2022-07-01 | 日商鎧俠股份有限公司 | memory system |
-
2013
- 2013-03-08 CN CN 201320105881 patent/CN203102256U/en not_active Expired - Fee Related
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN105067991A (en) * | 2015-08-10 | 2015-11-18 | 宁波华远电子科技有限公司 | Circuit board detection device and detection method |
CN105489249A (en) * | 2015-12-09 | 2016-04-13 | 浪潮电子信息产业股份有限公司 | Fast DDR3 measurement method |
CN106502812A (en) * | 2016-10-14 | 2017-03-15 | 郑州云海信息技术有限公司 | A kind of pcb board of fast monitored storage hard disk groove position failure and its method |
CN106776162A (en) * | 2016-11-28 | 2017-05-31 | 郑州云海信息技术有限公司 | A kind of method of signal supervisory instrument and its detection internal memory signal |
TWI769715B (en) * | 2020-08-31 | 2022-07-01 | 日商鎧俠股份有限公司 | memory system |
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Legal Events
Date | Code | Title | Description |
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C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
CF01 | Termination of patent right due to non-payment of annual fee | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20130731 Termination date: 20160308 |