CN203102256U - Signal test fixture of server DDR3 memory slot - Google Patents

Signal test fixture of server DDR3 memory slot Download PDF

Info

Publication number
CN203102256U
CN203102256U CN 201320105881 CN201320105881U CN203102256U CN 203102256 U CN203102256 U CN 203102256U CN 201320105881 CN201320105881 CN 201320105881 CN 201320105881 U CN201320105881 U CN 201320105881U CN 203102256 U CN203102256 U CN 203102256U
Authority
CN
China
Prior art keywords
test
ddr3 memory
card
test card
ddr3
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN 201320105881
Other languages
Chinese (zh)
Inventor
任华进
魏广兰
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Inspur Electronic Information Industry Co Ltd
Original Assignee
Inspur Electronic Information Industry Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Inspur Electronic Information Industry Co Ltd filed Critical Inspur Electronic Information Industry Co Ltd
Priority to CN 201320105881 priority Critical patent/CN203102256U/en
Application granted granted Critical
Publication of CN203102256U publication Critical patent/CN203102256U/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Images

Abstract

The utility model discloses a signal test fixture of a server DDR3 memory slot. The signal test fixture comprises a test card which is of a DDR3 memory bar structure, wherein an installation hole and a clamping buckle used for installation are arranged at each of two ends of the test card, a goldfinger is arranged at the lower end of the test card, the length of the goldfinger is equal to that of the DDR3 memory bar, and the width of the goldfinger is not greater than that of the DDR3 memory bar. The test card is provided with an address wire test area, a current supply test through hole, a plurality of data wire test areas and a plurality of clock test points, and meanwhile a system management bus test area is arranged at one end of the test card. When the test fixture is used, output conditions of mainboard memory signals can be tested conveniently, the signal problems of the memory slot can be checked out rapidly, a fault circuit can be judged rapidly, and maintaining work can be conducted conveniently and easily.

Description

A kind of signal testing tool of server DDR3 memory bank
Technical field
The utility model relates to the computer testing technology field, specifically a kind of signal testing tool of server DDR3 memory bank.
Background technology
In the maintenance computer process, need measure the voltage and the resistance of each test point on the mainboard with multimeter, but the distribution of these test points disperses very, and be not easy to remember.Often needing looks through a great amount of information seeks various crucial test points, and the cost plenty of time remember each test point, operating so relatively wastes time and energy, test job is very loaded down with trivial details.
The utility model content
The utility model discloses a kind of signal testing tool of server DDR3 memory bank at the weak point that prior art exists.
The signal testing tool of server DDR3 memory bank disclosed in the utility model, can detect the output situation of server master board internal memory signal easily, its technical scheme is as follows: comprise a test card, described test card adopts the structure of DDR3 memory bar, two ends are provided with installs used mounting hole and buckle, the lower end is provided with golden finger, and the length same widths of its length and DDR3 RAM (random access memory) card is not more than the width of DDR3, described test card is provided with the address wire test zone simultaneously, power supply test via hole, plurality of data line test zone and some clock tests point also are provided with the System Management Bus test zone at an end of test card.
Further, all test zones on the described test card and clock test point all comprise some via holes.
The beneficial effect that the signal testing tool of the disclosed server DDR3 of the utility model memory bank has is: use this measurement jig, can detect the output situation of server master board internal memory signal easily, investigate out the memory slot signal problem apace, and then judge faulty circuit fast, make maintenance job convenient and easy.
Description of drawings
Accompanying drawing 1 is the front plan view of the utility model embodiment;
Accompanying drawing 2 is the back side vertical view of the utility model embodiment;
Accompanying drawing marking explanation: 1, test card; 2, mounting hole; 3, buckle; 4, golden finger; 5, clock test point; 6, power supply test via hole; 7, data line test zone; 8, address wire test zone; 9, System Management Bus test zone.
Embodiment
Below in conjunction with drawings and Examples, the signal testing tool of server DDR3 memory bank disclosed in the utility model is described in further details.
Embodiment:
The DDR3 of server described in present embodiment memory bank signal testing tool, its structure as depicted in figs. 1 and 2.This signal testing tool is a test card 1, the contour structures of the contour structures of described test card 1 and DDR3 memory bar coincide, two ends are provided with mounting hole 2 and buckle 3, the lower end is provided with golden finger 4, the length of described in addition test card 1 is identical with the length of DDR3 RAM (random access memory) card, and width is less than the width of DDR3 RAM (random access memory) card.In the present embodiment, described test card 1 is provided with three clock test points 5, two power supply test via holes 6, two data line test zones 7 and address wire test zones 8, and an end of described test card 1 also is provided with a System Management Bus test zone 9.Further, all test zones and the clock test point on the described test card 1 all comprises some via holes.In the present embodiment simultaneously, described three clock test points 5 and two power supply test via holes 6 are arranged on same horizontal level, described two data line test zones 7 and an address wire test zone 8 are arranged on same horizontal level, and address wire test zone 8 is arranged between two data line test zones 7.And the more described clock test point 5 in described in the present embodiment data line test zone 7 positions is near lower end golden finger 4, and the connection distance has been shortened in this design.Except that the described situation of present embodiment, the individual number average of described clock test zone, power supply test zone, data line test zone and address wire test zone can change according to the actual requirements, also can there be other set-up mode the position of each test zone simultaneously, as long as can satisfy the demand of DDR3 memory bank signal testing.
DDR3 memory bank signal testing tool disclosed in the utility model is a aid at the maintenance of mainboard chip-scale.During use, the mounting means of this measurement jig analog D DR3 memory bar assigns in the memory bank, the signal on the slot can be extended out; And by this measurement jig, on pcb board, the signal of interest of slot can be sorted out, make different test zones with the form of via hole then.In this measurement jig, the clock test point is used to obtain clock signal, power supply test via hole is used to obtain signals such as supply voltage, resistance, the data line test zone is used to obtain data line signal, the address wire test zone is used to obtain the address wire signal, and the System Management Bus test zone is used to obtain reset signal.Measure test zone and test point signal on the measurement jig fast by instruments such as multimeters like this, can judge faulty circuit fast, make maintenance job convenient and easy, do not remember the test point of those difficult notes and need not lose time, be not required to be yet and look for various test points inspection information everywhere, make maintenance job convenient and easy.
Except that technical characterictic described in the utility model, be the known technology of those skilled in the art.

Claims (2)

1. the signal testing tool of a server DDR3 memory bank, it is characterized in that, comprise a test card, described test card adopts the structure of DDR3 memory bar, two ends are provided with installs used mounting hole and buckle, the lower end is provided with golden finger, and the length same widths of its length and DDR3 memory bar is not more than the width of DDR3 memory bar, simultaneously described test card is provided with address wire test zone, power supply test via hole, plurality of data line test zone and some clock tests point, also is provided with the System Management Bus test zone at an end of test card.
2. signal testing tool according to claim 1 is characterized in that, all test zones and clock test point on the described test card all comprise some via holes.
CN 201320105881 2013-03-08 2013-03-08 Signal test fixture of server DDR3 memory slot Expired - Fee Related CN203102256U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN 201320105881 CN203102256U (en) 2013-03-08 2013-03-08 Signal test fixture of server DDR3 memory slot

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN 201320105881 CN203102256U (en) 2013-03-08 2013-03-08 Signal test fixture of server DDR3 memory slot

Publications (1)

Publication Number Publication Date
CN203102256U true CN203102256U (en) 2013-07-31

Family

ID=48853641

Family Applications (1)

Application Number Title Priority Date Filing Date
CN 201320105881 Expired - Fee Related CN203102256U (en) 2013-03-08 2013-03-08 Signal test fixture of server DDR3 memory slot

Country Status (1)

Country Link
CN (1) CN203102256U (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105067991A (en) * 2015-08-10 2015-11-18 宁波华远电子科技有限公司 Circuit board detection device and detection method
CN105489249A (en) * 2015-12-09 2016-04-13 浪潮电子信息产业股份有限公司 Fast DDR3 measurement method
CN106502812A (en) * 2016-10-14 2017-03-15 郑州云海信息技术有限公司 A kind of pcb board of fast monitored storage hard disk groove position failure and its method
CN106776162A (en) * 2016-11-28 2017-05-31 郑州云海信息技术有限公司 A kind of method of signal supervisory instrument and its detection internal memory signal
TWI769715B (en) * 2020-08-31 2022-07-01 日商鎧俠股份有限公司 memory system

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105067991A (en) * 2015-08-10 2015-11-18 宁波华远电子科技有限公司 Circuit board detection device and detection method
CN105489249A (en) * 2015-12-09 2016-04-13 浪潮电子信息产业股份有限公司 Fast DDR3 measurement method
CN106502812A (en) * 2016-10-14 2017-03-15 郑州云海信息技术有限公司 A kind of pcb board of fast monitored storage hard disk groove position failure and its method
CN106776162A (en) * 2016-11-28 2017-05-31 郑州云海信息技术有限公司 A kind of method of signal supervisory instrument and its detection internal memory signal
TWI769715B (en) * 2020-08-31 2022-07-01 日商鎧俠股份有限公司 memory system

Similar Documents

Publication Publication Date Title
CN203102256U (en) Signal test fixture of server DDR3 memory slot
CN202362409U (en) Device for automatically testing cables of aircraft engine
CN103743974A (en) Reliability test board and CAF resistance performance test method of printed circuit board
CN101858954B (en) Circuit board testing device
CN202994857U (en) Probe card capable of testing high voltage chip by low voltage test channel
CN203397348U (en) Novel memory-chip testing jig
CN211826336U (en) Automatic PCB detection platform system
CN202916307U (en) Signal switching device for debugging and detection of electrical equipment
CN203658413U (en) ICT needle bed
CN103137210A (en) DDR signal testing auxiliary tool
CN202362017U (en) Test device
CN204964660U (en) Circuit board online test platform that walks abreast
CN203519782U (en) Electronic device
CN205067680U (en) Bga chip testing system
CN204008723U (en) A kind of switching circuit board for circuit board testing
CN202975264U (en) Test fixture for performing on-line testing on notebook computer
CN203787061U (en) General electric testing board for LCD
CN203148335U (en) Electric generator support comprehensive testing tool
CN105572568A (en) ICT online testing system
CN203178433U (en) Dummy load test device
CN202255806U (en) Vibration fixture for electronic components
CN206775829U (en) A kind of accurate pcb board composing structure for carrying out resistance test
CN101833028B (en) Device convenient for testing output voltage of power supply
CN203054152U (en) Switch card of 6.5-time density general tester
CN204963733U (en) Aperture caliber suitable for multiple model printing plate

Legal Events

Date Code Title Description
C14 Grant of patent or utility model
GR01 Patent grant
CF01 Termination of patent right due to non-payment of annual fee
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20130731

Termination date: 20160308