CN204807591U - Disconnected short circuit both ends formula vacuum attracts accredited testing organization - Google Patents
Disconnected short circuit both ends formula vacuum attracts accredited testing organization Download PDFInfo
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- CN204807591U CN204807591U CN201520528093.5U CN201520528093U CN204807591U CN 204807591 U CN204807591 U CN 204807591U CN 201520528093 U CN201520528093 U CN 201520528093U CN 204807591 U CN204807591 U CN 204807591U
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Abstract
The utility model discloses a disconnected short circuit both ends formula vacuum attracts accredited testing organization, it mainly includes tests the base, be equipped with on the upper surface of test base square first test section, with first test section in the one of which marginal facies support the bar second test section leaned on, locate the board that awaits measuring on first test section and the second test section upper surface, with the adjacent setting of the board that awaits measuring is just evenly located a plurality of data transmission terminal on the upper surface of first test section with locate the cylinder of second test section below, this cylinder drags second test section up -and -down motion, reaches the test requirement who tests disconnected short circuit, impedance. Through the utility model discloses a disconnected short circuit both ends formula vacuum attracts accredited testing organization and method have overcome that the test point weighs wounded, the tool cost is too high and fine rule way counterpoint difficulty etc. And it is with low costs to have a tool, advantage that testing speed is fast.
Description
Technical field
The utility model relates to a kind of mechanism for testing of measurement jig, is specifically related to a kind of disconnected short circuit two ends formula vacuum attraction mechanism for testing.
Background technology
At present, traditional method of testing uses test probe, but it has: the 1) doubt that weighs wounded of test point; 2) problem of tool high cost; 3) run into fine rule road cannot test or contraposition difficulty, need to do two sections of tests with conducting resinl, work efficiency is lower.
Utility model content
For solving the problems of the technologies described above, we have proposed one and can overcome above problem and lower-cost disconnected short circuit two ends formula vacuum attraction mechanism for testing.
For achieving the above object, the technical solution of the utility model is as follows:
A kind of disconnected short circuit two ends formula vacuum attraction mechanism for testing, it comprises Test bench, the upper surface of described Test bench is provided with the first square test section, bar shaped second test section leant with one edge in the first test section, be located at the board under test on described first test section and the second test section upper surface, be disposed adjacent with described board under test and several data transfer terminals be evenly located on described first test section upper surface and the cylinder be located at below described second test section, described cylinder drags the second test section and moves up and down, described first test section comprises the first vacuum suction room and the pcb plate be located on the first top, vacuum suction room or flexible circuit board, described second test section comprises the second vacuum suction room and the metal be located on the second top, vacuum suction room or non-metal board, the periphery of described pcb plate or flexible circuit board and metal or non-metal board all offer uniform some through holes, described board under test is positioned at the determinand being provided with bar shaped above described second test section and carefully goes out pin terminal, described board under test and pcb plate or flexible circuit board are equipped with identical test point, and carefully go out pin terminal physical property with described determinand and be connected.
Preferably, described board under test is flexible circuit board or contact panel or blood sugar nude film.
Preferably, described test point is gold point, silver point, copper point, charcoal point or non-metal conductor.
Preferably, also comprise the board under test alignment device be disposed adjacent with other three edges of described first test section, described alignment device comprise be located at the first both sides, test section and with the second orthogonal vertical dragging track in test section and the sliding horizontal track be located on described vertical dragging track, described sliding horizontal track is also evenly provided with two CCD or electron microscope, and described CCD or electron microscope can move left and right.
Preferably, described second district to be measured is metal or nonmetal dead-short-circuit district.
Pass through technique scheme, disconnected short circuit two ends of the present utility model formula vacuum attraction mechanism for testing, test point with soft silver slurry or pcb circuit board copper point as contact point, plane to plane without weighing problem wounded, and a point two-part vacuum attraction mode can survey general point-to-point engaged test, also can survey fine rule road dead-short-circuit and measure open circuit and resistance measurement, there is test speed fast, fine rule road is perplexed without in contraposition, and measurement jig cost comparatively conventional probe formula is low.
Accompanying drawing explanation
In order to be illustrated more clearly in the utility model embodiment or technical scheme of the prior art, be briefly described to the accompanying drawing used required in embodiment or description of the prior art below, apparently, accompanying drawing in the following describes is only embodiments more of the present utility model, for those of ordinary skill in the art, under the prerequisite not paying creative work, other accompanying drawing can also be obtained according to these accompanying drawings.
Fig. 1 is the structural representation of a kind of disconnected short circuit two ends formula vacuum attraction mechanism for testing disclosed in the utility model embodiment 1;
Fig. 2 is the decomposing schematic representation of the first test section in a kind of disconnected short circuit two ends formula vacuum attraction mechanism for testing disclosed in the utility model embodiment 1.
Embodiment
Below in conjunction with the accompanying drawing in the utility model embodiment, be clearly and completely described the technical scheme in the utility model embodiment, obviously, described embodiment is only the utility model part embodiment, instead of whole embodiments.Based on the embodiment in the utility model, those of ordinary skill in the art are not making the every other embodiment obtained under creative work prerequisite, all belong to the scope of the utility model protection.
Below in conjunction with schematic diagram, embodiment of the present utility model is described in further detail.
Embodiment 1.
As Fig. 1, shown in Fig. 2, a kind of disconnected short circuit two ends formula vacuum attraction mechanism for testing, it comprises Test bench 1, the upper surface of described Test bench 1 is provided with the first square test section, bar shaped second test section leant with one edge in the first test section, be located at the board under test 2 on described first test section and the second test section upper surface, be disposed adjacent with described board under test 2 and several data transfer terminals 3 be evenly located on described first test section upper surface and the cylinder 4 be located at below described second test section, described cylinder 4 drags the second test section and moves up and down, reach the disconnected short circuit of test, the test request of impedance, data transfer terminal 3 matches with test machine, described first test section comprises the first vacuum suction room 5 and the pcb plate be located on the first top, vacuum suction room 5 or flexible circuit board 6, described second test section comprises the second vacuum suction room 7 and the metal be located on the second top, vacuum suction room 7 or non-metal board 8, the periphery of described pcb plate or flexible circuit board 6 and metal or non-metal board 8 all offer uniform some through hole a, described board under test 2 is positioned at the determinand being provided with bar shaped above described second test section and carefully goes out pin terminal 9, described board under test 2 and pcb plate or flexible circuit board 6 are equipped with identical test point b, and carefully go out pin terminal 9 physical property with described determinand and be connected.This disconnected short circuit two ends formula vacuum attraction mechanism for testing, can survey general point-to-point engaged test, also can survey fine rule road dead-short-circuit and measure open circuit and resistance measurement.
Continue as shown in Figure 1 and Figure 2, described board under test 2 is flexible circuit board or contact panel or blood sugar nude film.
Continue as shown in Figure 2, described test point b is gold point, silver point, copper point, charcoal point or non-metal conductor, plane to plane without weighing problem wounded.
Continue as shown in Figure 1 and Figure 2, also comprise the board under test alignment device be disposed adjacent with other three edges of described first test section, described alignment device comprise be located at the first both sides, test section and with the second orthogonal vertical dragging track 10 in test section and the sliding horizontal track 11 be located on described vertical dragging track 10, described sliding horizontal track 11 is also evenly provided with two CCD or electron microscope, and described CCD or electron microscope can move left and right 12.
Continue as shown in Figure 1 and Figure 2, described second district to be measured is metal or nonmetal dead-short-circuit district.
A kind of disconnected short circuit two ends formula vacuum attraction method of testing, it adopts as above arbitrary disconnected short circuit two ends formula vacuum attraction mechanism for testing, and described method of testing concrete steps are as follows:
A. board under test and flexible circuit board or contact panel are placed on the pcb plate or flexible circuit board laying corresponding test point, first carry out test point (as X1.X2.X3 in Fig. 2 ... Y1.Y2.Y3 ...) contraposition (confirming that whether contraposition correct by top CCD or electron microscope);
B. after contraposition correctly, first district to be measured and the second district to be measured can according to the successively segmentations of actual testing requirement, allow the test point of determinand via after the test point coincidence in pcb plate or flexible circuit board also adsorbed close, (the second district to be measured metal or nonmetal dead-short-circuit device can comply with test needs, judge whether voluntarily to inhale vacuum and entire lowering), again by Test Host test the insulation of wired, can measure and whether have short circuit or micro-short circuit situation (as X1.X2.X3 in Fig. 2 ... Y1.Y2.Y3 ...);
C. after above action completes, second district to be measured metal or nonmetal dead-short-circuit device can keep horizontality by the action of cylinder the second district to be measured, test section first, by vacuumizing mode, determinand is tightly adsorbed again, the test point of determinand is allowed to carry out every bar circuit end to end via pcb plate or flexible circuit board district and metal or nonmetal dead-short-circuit district by open/short test machine: a. resistance value measures, the measurement action whether b. breaks.
Determinand Open/Short/Resistance/Insulation can be tested via B and C.
Above-described is only preferred implementation of the present utility model; it should be pointed out that for the person of ordinary skill of the art, under the prerequisite not departing from the utility model creation design; can also make some distortion and improvement, these all belong to protection domain of the present utility model.
Claims (5)
1. a disconnected short circuit two ends formula vacuum attraction mechanism for testing, it is characterized in that, it comprises Test bench, the upper surface of described Test bench is provided with the first square test section, bar shaped second test section leant with one edge in the first test section, be located at the board under test on described first test section and the second test section upper surface, be disposed adjacent with described board under test and several data transfer terminals be evenly located on described first test section upper surface and the cylinder be located at below described second test section, described cylinder drags the second test section and moves up and down, described first test section comprises the first vacuum suction room and the pcb plate be located on the first top, vacuum suction room or flexible circuit board, described second test section comprises the second vacuum suction room and the metal be located on the second top, vacuum suction room or non-metal board, the periphery of described pcb plate or flexible circuit board and metal or non-metal board all offer uniform some air holes, described board under test is positioned at the determinand being provided with bar shaped above described second test section and carefully goes out pin terminal, described board under test and pcb plate or flexible circuit board are equipped with identical test point, and carefully go out pin terminal physical property with described determinand and be connected.
2. one according to claim 1 is broken short circuit two ends formula vacuum attraction mechanism for testing, it is characterized in that, described board under test is flexible circuit board or contact panel or blood sugar nude film.
3. one according to claim 1 is broken short circuit two ends formula vacuum attraction mechanism for testing, and it is characterized in that, described test point is gold point, silver point, copper point, charcoal point or non-metal conductor.
4. one according to claim 1 is broken short circuit two ends formula vacuum attraction mechanism for testing, it is characterized in that, also comprise the board under test alignment device be disposed adjacent with other three edges of described first test section, described alignment device comprise be located at the first both sides, test section and with the second orthogonal vertical dragging track in test section and the sliding horizontal track be located on described vertical dragging track, described sliding horizontal track is also evenly provided with two CCD or electron microscope, and described CCD or electron microscope can move left and right.
5. one according to claim 1 is broken short circuit two ends formula vacuum attraction mechanism for testing, and it is characterized in that, described second district to be measured is metal or nonmetal dead-short-circuit district.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201520528093.5U CN204807591U (en) | 2015-07-21 | 2015-07-21 | Disconnected short circuit both ends formula vacuum attracts accredited testing organization |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201520528093.5U CN204807591U (en) | 2015-07-21 | 2015-07-21 | Disconnected short circuit both ends formula vacuum attracts accredited testing organization |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN204807591U true CN204807591U (en) | 2015-11-25 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201520528093.5U Expired - Fee Related CN204807591U (en) | 2015-07-21 | 2015-07-21 | Disconnected short circuit both ends formula vacuum attracts accredited testing organization |
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| Country | Link |
|---|---|
| CN (1) | CN204807591U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104977438A (en) * | 2015-07-21 | 2015-10-14 | 柴英豪 | Circuit breaker double-ended vacuum suction test mechanism and method thereof |
-
2015
- 2015-07-21 CN CN201520528093.5U patent/CN204807591U/en not_active Expired - Fee Related
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104977438A (en) * | 2015-07-21 | 2015-10-14 | 柴英豪 | Circuit breaker double-ended vacuum suction test mechanism and method thereof |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20151125 Termination date: 20160721 |