CN104931805A - Testing device - Google Patents
Testing device Download PDFInfo
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- CN104931805A CN104931805A CN201410109703.8A CN201410109703A CN104931805A CN 104931805 A CN104931805 A CN 104931805A CN 201410109703 A CN201410109703 A CN 201410109703A CN 104931805 A CN104931805 A CN 104931805A
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- Prior art keywords
- diode
- gauge tap
- measured capacitance
- circuit
- proving installation
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- 238000012360 testing method Methods 0.000 title claims abstract description 25
- 238000009434 installation Methods 0.000 claims description 15
- 239000003990 capacitor Substances 0.000 abstract description 13
- 238000000034 method Methods 0.000 abstract description 9
- 230000015556 catabolic process Effects 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- 230000002159 abnormal effect Effects 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 1
- 230000002452 interceptive effect Effects 0.000 description 1
- 230000007257 malfunction Effects 0.000 description 1
- 239000007769 metal material Substances 0.000 description 1
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- Measurement Of Resistance Or Impedance (AREA)
Abstract
The invention discloses a testing device, which is used for testing the durability of a capacitor and comprises a first branch circuit, wherein the first branch circuit comprises a control switch and a diode, the control switch, the diode and a capacitor to be tested are sequentially connected in series in a circuit, the first end of the control switch is connected with the anode or the cathode of a power supply, the second end of the control switch is sequentially connected in series with the diode and the capacitor to be tested and then connected to the cathode or the anode of the power supply, and the corresponding common ends of the diode and the capacitor to be tested are connected to the third end of the control switch; when the first end and the second end of the control switch are conducted, the capacitor to be detected is charged; and when the first end and the third end of the control switch are conducted, the capacitor to be detected discharges. The method and the device prevent mutual interference among the tested capacitors, avoid misjudgment of the fault capacitor and ensure the accuracy and the effectiveness of the test result.
Description
Technical field
The present invention relates to the durability test of electric capacity, particularly relate to a kind of proving installation improving electrochemical capacitor durability test result correctness and validity.
Background technology
When carrying out the common durability test of electric capacity at present, usually electric capacity identical for rated voltage being tested according to accessing direct supply after different manufacturer's parallel connections, therefore, having that same power supply connects multiple producer, the electric capacity of multiple specification is tested.Fig. 1 is the circuit diagram of traditional test device, accesses VCC power supply after the Capacitance parallel connection of A producer, B producer and C manufacturer production.In test process, when abnormal conditions occur, assuming that the electric capacity of A producer is short-circuited during breakdown inefficacy, the B producer of not losing efficacy and the electric capacity of C producer are all by the capacitor discharge of the A producer of short circuit, larger electric current can be produced during short circuit dischange, this electric current can retroaction on the electric capacity of B producer and C producer, now very easily cause the electric capacity generation chain of rings of B producer and C producer to puncture and cause losing efficacy.In these cases, be difficult to the electric capacity of localizing faults, easily cause misjudgment, reduce accuracy and the validity of test findings.
Summary of the invention
Based on the problems referred to above, the invention provides one and prevent from mutually interfering between measured capacitance, avoid erroneous judgement, improve the electric capacity device for testing endurance of test accuracy and validity.
For reaching technical purpose, the present invention adopts following technical scheme:
A kind of proving installation, for the test of electric capacity permanance, comprise the first branch road, described first branch road comprises gauge tap and diode, described gauge tap, diode and measured capacitance are connected in circuit successively, the first end of described gauge tap connects the negative or positive electrode of power supply, second end of described gauge tap is connected successively and is connected to negative pole or the positive pole of power supply after described diode and measured capacitance, and the corresponding common port of described diode and measured capacitance is connected to the 3rd end of described gauge tap;
When the first end of described gauge tap and the second end conducting, described measured capacitance charging; When the first end of described gauge tap and the 3rd end conducting, described measured capacitance electric discharge.
Wherein in an embodiment, described gauge tap is single-pole double-throw switch (SPDT).
Wherein in an embodiment, the quantity of described diode is two or more, and diodes in parallel described in two or more is arranged.
Wherein in an embodiment, the corresponding common port resistance in series of described diode and measured capacitance is connected to the second end of described gauge tap.
Wherein in an embodiment, the quantity of described first branch road is multiple, and multiple first branch circuit parallel connection is arranged in circuit, the corresponding measured capacitance of each described first branch road.
Wherein in an embodiment, described power supply is also connected with impedance circuit.
Proving installation of the present invention, diode is connected with measured capacitance, due to the unilateral conduction of diode, when forward bias, resistance is very little, then has very large resistance during reverse bias, even if a certain electric capacity breaks down and causes short circuit in test process, also other electric capacity can not be had influence on, this proving installation prevents the mutual interference between measured capacitance, avoids the false judgment to fault capacitance, ensure that accuracy and the validity of test result.
Accompanying drawing explanation
Fig. 1 is the circuit diagram of traditional test device;
Fig. 2 is the circuit diagram of proving installation one embodiment of the present invention.
Embodiment
The present invention is described in detail below in conjunction with embodiment.It should be noted that, when not conflicting, the embodiment in the application and the feature in embodiment can combine mutually.
The invention provides a kind of proving installation, for the test of electric capacity permanance, be particularly useful for the test of the identical electrochemical capacitor permanance of rated voltage, this device effectively prevent the mutual interference between measured capacitance, ensure that the accurate and effective of test result.
See Fig. 2, the electric capacity of A, B, C tri-manufacturer production is tested.Proving installation of the present invention comprises the first branch road 100, and preferably, as a kind of embodiment, the quantity of the first branch road 100 is multiple, and multiple first branch road 100 is arranged in parallel in circuit, all corresponding measured capacitance of each first branch road 100.Wherein, the first branch road 100 comprises gauge tap and diode.Gauge tap, diode and measured capacitance are connected in circuit successively, and the first end K1 of gauge tap connects the negative or positive electrode of power supply, and the second end K2 of gauge tap is connected to negative pole or the positive pole of power supply successively after series diode and measured capacitance; The corresponding common port of diode and measured capacitance is connected to the 3rd end K3 of gauge tap.
It should be noted that, in the present invention, diode is forward bias relative to power supply, and namely the positive pole of diode connects the positive pole of power supply, and the negative pole of diode connects the negative pole of power supply, and in the process of measured capacitance charging, diode resistance is very little, is almost 0.Because the shell of electric capacity is generally metal material, easily gather induced charge, therefore, in test process, by one end ground connection of electric capacity, to increase the security of test process.
When first end K1 and the second end K2 conducting of gauge tap, current flowing is had in circuit, measured capacitance two ends obtain the equal opposite charges of quantity respectively, now capacitor charging, the potential difference (PD) at its two ends increases gradually, increase to equal with supply voltage once electric capacity both end voltage, capacitor charging is complete, does not have current flowing in circuit; When first end K1 and the 3rd end K3 conducting of gauge tap, measured capacitance is discharged, and the voltage at its two ends can drop to 0 gradually.
In the test process of permanance, due to the unilateral conduction of diode, when abnormal conditions occur, when measured capacitance as A producer is short-circuited and punctures inefficacy, due to the unilateral conduction of diode, its resistance when reverse bias is very large, generally regard open circuit as, thus, the measured capacitance of B producer and C producer is not discharged by the fault capacitance of A producer, separate between the electric capacity of each manufacturer production, avoid the generation of a chain of punch-through, ensure that accuracy and the validity of test result.
As a kind of embodiment, the corresponding common port resistance in series (not shown) of diode and measured capacitance is connected to the second end K2 of gauge tap.After measured capacitance charging, the voltage at its two ends is comparatively large, if resistance is too small in circuit, can produces larger current, thus cause damage to circuit in discharge process, by resistance in series, and electric current when can effectively reduce electric discharge in circuit, thus protect circuit.More preferably, power supply is also connected with impedance circuit (not shown), and impedance circuit reduces the velocity of discharge of measured capacitance, further reduces discharge current, adds the safe reliability of test.
More preferably, as a kind of embodiment, gauge tap is single-pole double-throw switch (SPDT).In the charging process of measured capacitance, the first end K1 of gauge tap is current input terminal, hilted broadsword is thrown the second end K2 to gauge tap, circuit turn-on, electric current flows to measured capacitance through diode, the positive pole of current from power source flows to measured capacitance through diode, and electric charge gathers in measured capacitance, and measured capacitance is charged; After being completed, hilted broadsword is thrown the 3rd end K3 to single-pole double-throw switch (SPDT), now measured capacitance and power supply disconnect, and discharge in circuit.In addition, gauge tap also can select double-point double-throw switch, and two regular taps also can be selected to control, and by comparison, cost saved by single-pole double-throw switch (SPDT), simplifies connecting circuit, controls convenient simultaneously.
More preferably, as a kind of embodiment, the quantity of diode is two or more (comprising two), and plural diodes in parallel is arranged.As shown in Figure 2, be the parallel connection of two diodes, when one of them diode fails, electric current still can be transferred to measured capacitance from another diode, ensure that effective connection of circuit.
In above-mentioned proving installation, diode is preferably silicon diode, and it has lower price and excellent unilateral conduction; More preferably, the voltage breakdown of silicon diode is greater than the rated voltage of measured capacitance.When which obviating measured capacitance electric discharge due to operating mistake breakdown diode, and then cause the problem of circuit malfunction.
It should be noted that, in Fig. 2, the measured capacitance of same producer can be one, also can be multiple, and multiple measured capacitance is in parallel, and all corresponding first branch road 100 of each measured capacitance; And manufacturer is not limited to A, B, C tri-factory, can the electric capacity of more manufacturer production in parallel.
The above embodiment only have expressed several embodiment of the present invention, and it describes comparatively concrete and detailed, but therefore can not be interpreted as the restriction to the scope of the claims of the present invention.It should be pointed out that for the person of ordinary skill of the art, without departing from the inventive concept of the premise, can also make some distortion and improvement, these all belong to protection scope of the present invention.Therefore, the protection domain of patent of the present invention should be as the criterion with claims.
Claims (6)
1. a proving installation, for the test of electric capacity permanance, is characterized in that:
Comprise the first branch road, described first branch road comprises gauge tap and diode, described gauge tap, diode and measured capacitance are connected in circuit successively, the first end of described gauge tap connects the negative or positive electrode of power supply, second end of described gauge tap is connected successively and is connected to negative pole or the positive pole of power supply after described diode and measured capacitance, and the corresponding common port of described diode and measured capacitance is connected to the 3rd end of described gauge tap;
When the first end of described gauge tap and the second end conducting, described measured capacitance charging; When the first end of described gauge tap and the 3rd end conducting, described measured capacitance electric discharge.
2. proving installation according to claim 1, is characterized in that:
Described gauge tap is single-pole double-throw switch (SPDT).
3. proving installation according to claim 1, is characterized in that:
The quantity of described diode is two or more, and diodes in parallel described in two or more is arranged.
4. proving installation according to claim 3, is characterized in that:
The corresponding common port resistance in series of described diode and measured capacitance is connected to the second end of described gauge tap.
5. the proving installation according to any one of claim 1-4, is characterized in that:
The quantity of described first branch road is multiple, and multiple first branch circuit parallel connection is arranged in circuit, the corresponding measured capacitance of each described first branch road.
6. proving installation according to claim 5, is characterized in that:
Described power supply is also connected with impedance circuit.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410109703.8A CN104931805A (en) | 2014-03-21 | 2014-03-21 | Testing device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410109703.8A CN104931805A (en) | 2014-03-21 | 2014-03-21 | Testing device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN104931805A true CN104931805A (en) | 2015-09-23 |
Family
ID=54119064
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201410109703.8A Pending CN104931805A (en) | 2014-03-21 | 2014-03-21 | Testing device |
Country Status (1)
| Country | Link |
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| CN (1) | CN104931805A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106959411A (en) * | 2017-03-29 | 2017-07-18 | 安徽云塔电子科技有限公司 | A kind of method of testing of integrated circuit and integrated circuit |
| CN111337858A (en) * | 2020-03-18 | 2020-06-26 | 普联技术有限公司 | Capacitance detection device and system |
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| JP4014112B1 (en) * | 2006-09-20 | 2007-11-28 | 株式会社パワーシステム | Capacitor module characteristic inspection device |
| CN201107379Y (en) * | 2007-12-03 | 2008-08-27 | 西安理工大学 | Chip type capacitor surge and aging test device |
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| CN202631658U (en) * | 2012-05-24 | 2012-12-26 | 航天科工防御技术研究试验中心 | Discharging device for aging test of high-voltage and high-capacity aluminum electrolytic capacitor |
| CN203103927U (en) * | 2012-12-11 | 2013-07-31 | 国网智能电网研究院 | Anti-explosion protection system of DC shunt capacitor bank used for damping discharge |
| CN203811706U (en) * | 2014-03-21 | 2014-09-03 | 珠海格力电器股份有限公司 | Testing device |
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2014
- 2014-03-21 CN CN201410109703.8A patent/CN104931805A/en active Pending
Patent Citations (6)
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|---|---|---|---|---|
| JP4014112B1 (en) * | 2006-09-20 | 2007-11-28 | 株式会社パワーシステム | Capacitor module characteristic inspection device |
| CN201107379Y (en) * | 2007-12-03 | 2008-08-27 | 西安理工大学 | Chip type capacitor surge and aging test device |
| CN201886093U (en) * | 2010-08-20 | 2011-06-29 | 中国西电电气股份有限公司 | Low-voltage analog device for synthesis test loop |
| CN202631658U (en) * | 2012-05-24 | 2012-12-26 | 航天科工防御技术研究试验中心 | Discharging device for aging test of high-voltage and high-capacity aluminum electrolytic capacitor |
| CN203103927U (en) * | 2012-12-11 | 2013-07-31 | 国网智能电网研究院 | Anti-explosion protection system of DC shunt capacitor bank used for damping discharge |
| CN203811706U (en) * | 2014-03-21 | 2014-09-03 | 珠海格力电器股份有限公司 | Testing device |
Non-Patent Citations (1)
| Title |
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| 马宝甫等: "《微机应用系统可靠性设计理论与实践》", 28 February 1999 * |
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106959411A (en) * | 2017-03-29 | 2017-07-18 | 安徽云塔电子科技有限公司 | A kind of method of testing of integrated circuit and integrated circuit |
| WO2018176735A1 (en) * | 2017-03-29 | 2018-10-04 | 安徽云塔电子科技有限公司 | Integrated circuit, and testing method of integrated circuit |
| KR20180132877A (en) * | 2017-03-29 | 2018-12-12 | 안휘 윈타 일렉트로닉 테크놀로지스 컴퍼니 리미티드 | Test methods for integrated circuits and integrated circuits |
| JP2019515316A (en) * | 2017-03-29 | 2019-06-06 | 安徽▲雲▼塔▲電▼子科技有限公司 | Integrated circuit and method of testing integrated circuit |
| KR102078251B1 (en) * | 2017-03-29 | 2020-02-17 | 안휘 윈타 일렉트로닉 테크놀로지스 컴퍼니 리미티드 | Integrated circuits and test methods of integrated circuits |
| US11221362B2 (en) * | 2017-03-29 | 2022-01-11 | Anhui Yunta Electronic Technologies CO., LTD | Integrated circuit and test method for integrated circuit |
| CN111337858A (en) * | 2020-03-18 | 2020-06-26 | 普联技术有限公司 | Capacitance detection device and system |
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Application publication date: 20150923 |
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| RJ01 | Rejection of invention patent application after publication |