CN104880618B - A kind of compound parallel test system and method - Google Patents

A kind of compound parallel test system and method Download PDF

Info

Publication number
CN104880618B
CN104880618B CN201410072092.4A CN201410072092A CN104880618B CN 104880618 B CN104880618 B CN 104880618B CN 201410072092 A CN201410072092 A CN 201410072092A CN 104880618 B CN104880618 B CN 104880618B
Authority
CN
China
Prior art keywords
measured
test
product
module
intermediate region
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN201410072092.4A
Other languages
Chinese (zh)
Other versions
CN104880618A (en
Inventor
黄儒平
林振国
黄建强
王金华
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Huizhou Desay SV Automotive Co Ltd
Original Assignee
Huizhou Desay SV Automotive Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Huizhou Desay SV Automotive Co Ltd filed Critical Huizhou Desay SV Automotive Co Ltd
Priority to CN201410072092.4A priority Critical patent/CN104880618B/en
Publication of CN104880618A publication Critical patent/CN104880618A/en
Application granted granted Critical
Publication of CN104880618B publication Critical patent/CN104880618B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Landscapes

  • Testing Or Calibration Of Command Recording Devices (AREA)

Abstract

The present invention relates to a kind of compound parallel test system and methods.The system includes: multiple products to be measured disposed in parallel in the horizontal direction;Parallel motion mechanism for moving back and forth multiple products to be measured in the horizontal direction;The main control module of multiple product functionality indexs to be measured can be tested simultaneously;And the optic test module for testing the product appearance index to be measured.Compound parallel test system of the invention and method, product appearance test and function test system are integrated in one, using simultaneously and concurrently and asynchronous parallel measuring technology and the compound parallel test method deposited, the existing shared resource module on hardware, there is mutually independent resource module again, can make full use of system resource, so that the multinomial test content of multiple products to be measured can be tested by realizing the same test platform of same time once, the testing time is shortened, the stability of test is improved.

Description

A kind of compound parallel test system and method
Technical field
The present invention relates to automobile electronics test correlative technology field, in particular to a kind of compound parallel test system and Method.
Background technique
With the rapid development of electronic technology, the technology content of automobile electronics increasingly increases, so that its test content Constantly expand with test item, while client requires product quality more and more tighter, does not only require product function, full in performance singly Sufficient design requirement, it is also very strict to the appearance requirement of product surface silk-screen, light, color.The existing automatic test system of tradition System by the way of sequential testing, at least needs two sets of completely self-contained test macros in each test macro using dispersion test: Appearance optic testing system and function test system, at the same time, a test macro station are once only capable of one quilt of test Survey a kind of content of object.Existing test system throughput is low, limits the raising of production efficiency, cannot keep up with handling capacity It needing, and disperses test macro station, need to put at least two sets of soft and hardware test macros, cost is big, furthermore, this side Formula needs to occupy bigger producing line space, needs more testers.
Summary of the invention
It can be achieved in the same time the purpose of the present invention is to provide a kind of while measuring the compound of multiple trial products to be measured Parallel test system and test method.
A kind of compound parallel test system, the system include: multiple products to be measured disposed in parallel in the horizontal direction;For The parallel motion mechanism for moving back and forth the multiple product to be measured in the horizontal direction;The multiple product to be measured can be tested simultaneously The main control module of functional attributes;And be arranged in it is above the product to be measured, refer to for testing the product appearance to be measured Target optic test module.
In a preferred embodiment, the main control module include: it is multiple be independently arranged and respectively with each production to be measured The communication module of the corresponding electrical connection of product, the communication module include that the signal generation mould of test simulation signal is provided for product to be measured Block and for product handshake communication to be measured and controlling the bus communication module of output of products state to be measured;And for adopting simultaneously Collect the data acquisition module of the fuction output signal of the multiple product to be measured;
In a preferred embodiment, the optic test module is electrically connected with the main control module, the optic test mould Block includes: the image acquisition mechanism being electrically connected with the main control module, is used to acquire the figure of product appearance image to be measured in real time As data;And it is fixedly connected and can be held along the three-axis moving that X, Y, Z axis direction moves with described image collecting mechanism Row mechanism is electrically connected with the main control module.
In a preferred embodiment, the parallel motion mechanism includes flat for carrying the test of the multiple product to be measured Platform and multiple fixture control modules for being used to fix and discharge product to be measured being arranged in above platform parallel, the fixture Control module move back and forth multiple products to be measured can along test platform direction or so;Test section is formed above the test platform Domain, the test zone include left area, intermediate region and right area, the intermediate region and the optic test module pair It should be arranged, when the product to be measured is moved to the intermediate region, the starting of optic test module self.
In a preferred embodiment, it corresponds on the test platform and is also respectively provided at the position of each product to be measured: It communication interface for being electrically connected with the bus communication module and is used for and the signal generating module and data acquisition module The function input/output interface of block electrical connection;The main control module further includes that multiple corresponding with the fixture control module can be electrically connected The DIO module connect.
In a preferred embodiment, described image collecting mechanism is the industrial camera with camera function, and camera lens is vertical The downwardly product to be measured.
A kind of compound parallel test method, which is characterized in that this method includes at least:
Step 01 establishes the hardware connection with the product to be measured of at least two thread, and is the production to be measured of the two threads Product distribute corresponding interface;
2 sub threads are respectively created in step 02, per thread, respectively correspond functional test thread and optic test thread; And
Step 03, the test zone that product to be measured is established between main control module and optic test module, the not test Left area, intermediate region and right area is arranged in region, and wherein the underface of optic test module is arranged in intermediate region, to Survey product can be moved back and forth between left area, intermediate region and right area, product to be measured all areas Shi Junneng into Enter functional test thread, only when product to be measured moves into intermediate region, optic test thread can be started.
Product appearance test and function test system are integrated in one by compound parallel test system of the invention and method Body, using simultaneously and concurrently and asynchronous parallel measuring technology and the compound parallel test method deposited, the existing shared money on hardware Source module, and have mutually independent resource module, it can make full use of system resource, to realize the same test of same time Platform can once test the multinomial test content of multiple products to be measured, shorten the testing time, improve the stability of test.
Detailed description of the invention
Fig. 1 is the structure principle chart of compound parallel test system in one embodiment of the invention.
Fig. 2 is the flow chart of compound parallel test method in one embodiment of the invention.
Specific embodiment
Compound parallel test system of the invention and method are made below in conjunction with specific embodiments and drawings further detailed Thin description.
Referring to Figure 1, a kind of compound parallel test system mainly includes multiple disposed in parallel to be measured in the horizontal direction Product, the parallel motion mechanism for moving back and forth multiple product to be measured in the horizontal direction, can test simultaneously it is multiple to be measured The main control module of product functionality index and the light for being used to test product appearance index to be measured being arranged in above product to be measured Learn test module.
Main control module include: it is multiple be independently arranged and the communication module of electrical connection corresponding with each product to be measured respectively, In each communication module include signal generating module and bus communication module, signal generating module provides test for product to be measured Analog signal, bus communication module are used for product handshake communication to be measured and control the output state of product to be measured;Main control module It inside further include the data acquisition module for being used for while acquiring the fuction output signal of multiple products to be measured.
Optic test module includes that an image acquisition mechanism and one are used to enable image acquisition mechanism along X, Y, Z The three-axis moving executing agency of axis direction movement, which is electrically connected with main control module, also, image acquisition mechanism For the industrial camera with camera function, camera lens observes the outer of product to be measured to implement vertically downward towards product to be measured It sees;According to the length, width and height size of product to be measured and the variation of placement position, image can be changed by three-axis moving executing agency and adopted The position of collecting mechanism allows it to corresponding with the product to be measured of underface.
Parallel motion mechanism includes that a test platform for carrying multiple products to be measured and multiple parallel settings exist Fixture control module above platform, fixture control module is for product to be measured fixed and that release is current, with current fixture It is illustrated for control module, after discharging, current product to be measured moves to rear fixture control module, the control of front fixture automatically Product to be measured in module is then moved to automatically in current fixture control module, and so on, multiple products to be measured can take advantage of a situation by Multiple fixture control modules are fixed on, so that multiple products to be measured can be moved back and forth along direction of test platform or so.
It corresponds on test platform and is also respectively provided at the position of each product to be measured: for being electrically connected with bus communication module The communication interface connect and the function input/output interface for being electrically connected with signal generating module and data acquisition module.
Further include in main control module multiple difference can electrical connection corresponding with fixture control module DIO module.
Preferably, test zone is formed in the top of test platform, which sequentially includes left area, middle area Domain and right area, product to be measured are then moved back and forth along left area, intermediate region and right area;Wherein, intermediate region with Optic test module is correspondingly arranged, and when product to be measured moves to intermediate region, and makes optic test module, intermediate region and to be measured When product is in a straight line, the starting of optic test module self, and start the appearance for the product to be measured that acquisition is in intermediate region Index.
When actual test, no matter product to be measured is in any one test zone, due to being independently arranged in main control module The communication module of electrical connection corresponding with each product to be measured, therefore multiple product to be measured can be completed at the same time the survey of functional attributes Examination.
Based on above-mentioned compound parallel test system, test method is included at least:
Step 01 establishes the hardware connection with the product to be measured of at least two thread, and is the production to be measured of the two threads Product distribute corresponding interface;
2 sub threads are respectively created in step 02, per thread, respectively correspond functional test thread and optic test thread; And
Step 03, the test zone that product to be measured is established between main control module and optic test module, and be the test Left area, intermediate region and right area is arranged in region, and wherein the underface of optic test module is arranged in intermediate region, to Survey product can be moved back and forth between left area, intermediate region and right area, product to be measured all areas Shi Junneng into Enter functional test thread, only when product to be measured moves into intermediate region, optic test thread can be started.
Please referring also to Fig. 2, for convenient for illustrating the testing process, this case by taking quantity is 2 product to be measured as an example, the two Product to be measured is respectively product A and product B, therefore has been correspondingly formed communication module A, communication module B, DIO modules A and DIO mould Block B etc..
In conjunction with the flow chart of attached drawing 2, now specific implementation process of the present invention is described as follows:
(1) system is initialized, including data acquisition module initialization block, the initialization of signal generating module A, B, bus The initialization of communication module A, B, DIO modules A, B initialization, Image Acquisition structure initialization, the initialization of three-axis moving executing agency;
(2) 2 threads are created, respectively correspond product A, product B, and distribute corresponding hardware resource for the two threads, As product A corresponds to DIO modules A, bus communication modules A, signal generating module A etc.;
The initialization of two above step and creation thread, only execute in first scan period, then successively execute:
(3) signal generating module A, signal generating module B power on power supply signal to product A, product B offer respectively simultaneously;
(4) 2 sub threads are respectively created in thread product A, thread product B, respectively correspond optic test thread, functional test Thread;
(5) thread product A, thread product B enter optic test, functional test sub thread simultaneously respectively, since optics is surveyed The hardware resource of examination: image capture module, motion-control module, Image Acquisition execution module, Motor execution module belong to altogether Hardware resource, the optic test sub thread of thread product A and the optic test sub thread of thread product B are enjoyed, there are resource contentions Conflict, here by judging who is introduced into intermediate region by product A and product B, to determine which sub thread line preferentially executes.Have Two kinds of situations:
Situation one: product A is introduced into intermediate region, then product B optic test sub-process, which is hung up, waits, and product A optics is surveyed Examination, functional test, product B functional test are performed simultaneously;
Situation two: product B is introduced into intermediate region, then product A optic test sub-process, which is hung up, waits, and product A function is surveyed Examination, product B optic test, functional test are performed simultaneously;
(6) product A functional test then successively execute functional test step 1, functional test step 2, functional test step 3, Product A optic test is waited to complete;Product A optic test to be measured is it is first determined whether into intermediate region, if it is not, then waiting To if it is successively execute optic test step 1, optic test step 2, product A optic test and complete, during product A leaves Between region, product B enter 17 intermediate regions, wait product A functional test complete;Product A optic test is completed and product A function After the completion of test all, into next measurement period.Two product A optic test, product A functional test sub threads are a mistakes Asynchronous parallel in journey, at the end of synchronous batch process.
(7) product B functional test then successively execute functional test step 1, functional test step 2, functional test step 3, Product B optic test is waited to complete;Product B optic test first determine whether it is no enter intermediate region, if it is not, then wait, if It is successively to execute optic test step 1, optic test step 2, product B optic test to complete, product B leaves 17 middle areas Domain, product A enter 17 intermediate regions, and product B functional test is waited to complete;Product B optic test is completed and product A functional test After the completion of all, into next measurement period.Two product B optic test, product B functional test sub threads are during one Asynchronous parallel, at the end of synchronous batch process.
(8) two threads of product A and product B are to the batch testing for carrying out identical content to different products simultaneously, completely Independent, product A takes out at once after being measured and changes next product, at the same product B still in test among, completely not by dry It disturbs, even, product A exits test, and product B continues to test.When product A and product B exit test, whole system terminates to survey Examination.
To sum up, compound parallel test system of the invention and method integrate product appearance test and function test system It is existing shared on hardware using simultaneously and concurrently and asynchronous parallel measuring technology and the compound parallel test method deposited in one Resource module, and have mutually independent resource module, can make full use of system resource, to realize that the same time is same Test platform can once test the multinomial test content of multiple products to be measured, shorten the testing time, improve the stabilization of test Property.
Although description of this invention combination embodiments above carries out, those skilled in the art Member can carry out many replacements based on the above contents, modifications and variations, be obvious.Therefore, all such substitutions, Improvements and changes are included in the spirit and scope of appended claims.

Claims (7)

1. a kind of compound parallel test system, which is characterized in that the system includes:
Multiple products to be measured disposed in parallel in the horizontal direction;
Parallel motion mechanism for moving back and forth multiple products to be measured in the horizontal direction;
The main control module of the multiple product functionality index to be measured can be tested simultaneously;And
Optic test module above the product to be measured, for testing the product appearance index to be measured is set;
The test zone of product to be measured is established between main control module and optic test module, and the left side is set for the test zone Region, intermediate region and right area, wherein the underface of optic test module is arranged in intermediate region, and product to be measured can be on a left side It is moved back and forth between border region, intermediate region and right area, product to be measured can enter functional test line in all areas Journey can start optic test thread only when product to be measured moves into intermediate region.
2. compound parallel test system according to claim 1, which is characterized in that the main control module includes:
It is multiple to be independently arranged and the communication module of electrical connection corresponding with each product to be measured, the communication module include respectively For product to be measured provide test simulation signal signal generating module and for product handshake communication to be measured and control production to be measured The bus communication module of product output state;And
For acquiring the data acquisition module of the fuction output signal of the multiple product to be measured simultaneously.
3. compound parallel test system according to claim 1, which is characterized in that the optic test module and the master Module electrical connection is controlled, the optic test module includes:
The image acquisition mechanism being electrically connected with the main control module is used to acquire the picture number of product appearance image to be measured in real time According to;And
Be fixedly connected with described image collecting mechanism and can along the three-axis moving executing agency that X, Y, Z axis direction moves, It is electrically connected with the main control module.
4. compound parallel test system according to claim 2, which is characterized in that the parallel motion mechanism includes being used for The test platform and multiple be arranged in above platform parallel for carrying the multiple product to be measured are used to fix and discharge to be measured The fixture control module of product, the fixture control module move multiple products to be measured can along test platform direction or so back and forth It is dynamic;Test zone is formed above the test platform, which includes left area, intermediate region and right area, institute It states intermediate region to be correspondingly arranged with the optic test module, when the product to be measured is moved to the intermediate region, optics is surveyed Try module self starting.
5. compound parallel test system according to claim 4, which is characterized in that on the test platform it is corresponding each to Survey at the position of product and be also respectively provided with: communication interface for be electrically connected with the bus communication module and be used for The function input/output interface of the signal generating module and data acquisition module electrical connection;The main control module further includes multiple Can electrical connection corresponding with the fixture control module DIO module.
6. compound parallel test system according to claim 3, which is characterized in that described image collecting mechanism is with taking the photograph As the industrial camera of function, camera lens is vertically downward towards the product to be measured.
7. compound parallel test method of the one kind based on compound parallel test system described in any one of claim 1 ~ 6, special Sign is that this method includes at least:
Step 01 establishes the hardware connection with the product to be measured of at least two thread, and is the product to be measured of the two threads point With corresponding interface;
2 sub threads are respectively created in step 02, per thread, respectively correspond functional test thread and optic test thread;And
Step 03, the test zone that product to be measured is established between main control module and optic test module, and be the test zone Left area, intermediate region and right area are set, and wherein the underface of optic test module, production to be measured is arranged in intermediate region Product can move back and forth between left area, intermediate region and right area, and product to be measured can enter function in all areas Thread can be tested, only when product to be measured moves into intermediate region, optic test thread can be started.
CN201410072092.4A 2014-02-28 2014-02-28 A kind of compound parallel test system and method Active CN104880618B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201410072092.4A CN104880618B (en) 2014-02-28 2014-02-28 A kind of compound parallel test system and method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201410072092.4A CN104880618B (en) 2014-02-28 2014-02-28 A kind of compound parallel test system and method

Publications (2)

Publication Number Publication Date
CN104880618A CN104880618A (en) 2015-09-02
CN104880618B true CN104880618B (en) 2019-06-07

Family

ID=53948185

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201410072092.4A Active CN104880618B (en) 2014-02-28 2014-02-28 A kind of compound parallel test system and method

Country Status (1)

Country Link
CN (1) CN104880618B (en)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105547725A (en) * 2015-12-19 2016-05-04 南昌欧菲生物识别技术有限公司 Control method for multipath test
US11061077B2 (en) * 2017-03-09 2021-07-13 Keithley Instruments, Llc Parallel trigger model for test and measurement instruments
CN109104682B (en) * 2017-06-21 2020-08-25 惠州市德赛西威汽车电子股份有限公司 Multithreading test method and test system for car audio
CN108037441A (en) * 2017-11-07 2018-05-15 上海霍富汽车锁具有限公司 The online concurrent testing equipment of automobile intelligent key PCBA and its application method
CN108007607B (en) * 2017-12-28 2020-06-05 惠州市德赛西威汽车电子股份有限公司 In-car temperature sensor testing device
CN112147482B (en) * 2019-06-26 2023-06-13 杭州广立微电子股份有限公司 Parallel test system and test method thereof
CN111579552A (en) * 2020-04-17 2020-08-25 惠州市德赛西威汽车电子股份有限公司 Integrated test equipment
CN112925298A (en) * 2021-01-29 2021-06-08 湖北三江航天红峰控制有限公司 Integrated multi-channel automatic test system and test method
CN113484630A (en) * 2021-05-31 2021-10-08 深圳市航盛电子股份有限公司 Unmanned parallel automatic test system and method for Internet of vehicles products
CN114690025B (en) * 2022-05-31 2022-10-11 浙江瑞测科技有限公司 Multi-station parallel test method

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101176007A (en) * 2005-07-13 2008-05-07 株式会社爱德万测试 Electronic component test device
CN202869986U (en) * 2012-08-31 2013-04-10 深圳麦逊电子有限公司 Four-working-position parallel testing device
CN203191489U (en) * 2013-04-29 2013-09-11 惠州市德赛西威汽车电子有限公司 Parallel testing system

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5121052A (en) * 1991-01-18 1992-06-09 Motorola Inc. Automated handler for semiconductor devices
US5642054A (en) * 1995-08-08 1997-06-24 Hughes Aircraft Company Active circuit multi-port membrane probe for full wafer testing
CN103162940B (en) * 2013-02-22 2016-01-06 宁波舜宇光电信息有限公司 A kind of cell-phone camera module automatic test machine

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101176007A (en) * 2005-07-13 2008-05-07 株式会社爱德万测试 Electronic component test device
CN202869986U (en) * 2012-08-31 2013-04-10 深圳麦逊电子有限公司 Four-working-position parallel testing device
CN203191489U (en) * 2013-04-29 2013-09-11 惠州市德赛西威汽车电子有限公司 Parallel testing system

Also Published As

Publication number Publication date
CN104880618A (en) 2015-09-02

Similar Documents

Publication Publication Date Title
CN104880618B (en) A kind of compound parallel test system and method
CN104081192B (en) Apparatus and method for photographing glass defects in multiple layers
CN104568873B (en) A kind of laser scanning co-focusing microscope being imaged to fluorescent material
Ferrand GPScan. VI: A general-purpose LabVIEW program for scanning imaging or any application requiring synchronous analog voltage generation and data acquisition
CN102628669A (en) Dimension measuring apparatus, dimension measuring method, and program for dimension measuring apparatus
CN103134756B (en) Polarization state chromatography microscopic imaging device and method
WO2015026211A1 (en) Substrate inspection apparatus
Martins et al. R2OBBIE-3D, a fast robotic high-resolution system for quantitative phenotyping of surface geometry and colour-texture
CN106782237A (en) The test device of lcd panel test plate and television set
CN202649127U (en) Automatic optical detection system
CN107111124A (en) The apparatus and method of focus image are generated using parallel imaging in microscopic system
CN103941032B (en) A kind of biological sample automatic detecting instrument
CN103308279A (en) Testing device and method thereof
CN206114254U (en) Vehicle combined detection system
CN110361382A (en) A kind of chromosome scanning imaging system
CN104062099A (en) Testing device and method for LED light strips with side luminance
CN104516170B (en) Three-dimensional focusing method and system thereof
CN104502829B (en) A kind of flip LED chips online test method
CN102159957B (en) Test table with solar cells for light-emitting components and test method thereof
WO2013022528A1 (en) Optofluidic microscope system-on-chip
CN202486053U (en) Multifunctional coal and coke microscopic analysis system
CN106568505A (en) Arc spectrum synchronous real-time scanning linear multichannel acquisition device
CN203824920U (en) Simple and easy shell fabric identification instrument
CN109256074A (en) A kind of brightness of display screen homogeneity test device and its test method
CN104853178B (en) One-stop image measurement device

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
EXSB Decision made by sipo to initiate substantive examination
SE01 Entry into force of request for substantive examination
CB02 Change of applicant information

Address after: 516006 Guangdong province Huizhou City Zhongkai high tech Zone and five West Road No. 103

Applicant after: HUIZHOU DESAY SV AUTOMOTIVE CO., LTD.

Address before: 516006 Guangdong province Huizhou City Zhongkai high tech Zone and five West Road No. 103

Applicant before: Huizhou Desay SV Auto. Electronics Co., Ltd.

COR Change of bibliographic data
GR01 Patent grant
GR01 Patent grant