CN106782237A - The test device of lcd panel test plate and television set - Google Patents
The test device of lcd panel test plate and television set Download PDFInfo
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- CN106782237A CN106782237A CN201611157121.2A CN201611157121A CN106782237A CN 106782237 A CN106782237 A CN 106782237A CN 201611157121 A CN201611157121 A CN 201611157121A CN 106782237 A CN106782237 A CN 106782237A
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
Abstract
The invention discloses a kind of lcd panel test plate and the test device of television set, the lcd panel test plate includes power input, voltage conversion circuit, contact pin circuit, backlight control circuit, control signal output and burn-in test connector；The voltage conversion of power input is the test trigger voltage and supply voltage for being tested TFT liquid crystal displays by voltage conversion circuit；Contact pin circuit is exported trigger voltage is tested to burn-in test connector；Backlight control circuit is used for the brightness control signal of the tested TFT liquid crystal display brightness of output control to control signal output, to control tested TFT liquid crystal displays that most bright state is constantly in during burn-in test；The burn-in test interface of the tested TFT liquid crystal displays of burn-in test connector connection, supply voltage and test trigger voltage are exported the respective pins of the burn-in test interface to tested TFT liquid crystal displays.Present invention reduces the burn-in test cost of TFT liquid crystal displays, the burn-in test process of TFT liquid crystal displays is simplified.
Description
Technical field
The present invention relates to field of television, more particularly to a kind of lcd panel test plate and television set test device.
Background technology
Television set in module production link, it is necessary to carry out burn-in test to the TFT liquid crystal displays of television set, to find in advance
The display defect of its TFT liquid crystal display and the reliability of detection TFT liquid crystal displays.In the prior art, to the TFT liquid crystal displays of television set
Ageing testing method be to go to light TFT liquid crystal displays by the machine core board of television set to carry out burn-in test with to it, television set
Machine core board carries the aging pictures of W/R/G/B of TFT liquid crystal displays.The ageing testing method of the TFT liquid crystal displays of the prior art, surveys
Examination is relatively costly, occupies the resource of machine core board, have impact on other functions of machine core board.Also, different vendor is (such as magnificent starlight
Electricity, Samsung, LG, group's wound and Youda etc.) production TFT liquid crystal displays burn-in test triggering mode and burn-in test interface all not to the utmost
It is identical, therefore, when needing to carry out burn-in test to the TFT liquid crystal displays of different vendor's production, then need a variety of wire rods to go to take
With corresponding burn-in test interface, wire rod species is more and bad management, and test process is also more complicated.For example, right respectively when needing
When the UD screens (resolution ratio is 3840*2160) of Samsung, LG, group's wound, Youda and magnificent starlight power plant business production carry out burn-in test, then
Five kinds of wire rods are needed to go to arrange in pairs or groups the burn-in test interface of each tested UD screens.
The content of the invention
It is a primary object of the present invention to provide a kind of lcd panel test plate, it is intended to reduce the burn-in test of TFT liquid crystal displays
The burn-in test process of cost and simplified TFT liquid crystal displays.
To achieve these goals, the present invention provides a kind of lcd panel test plate, and the lcd panel test plate includes power supply
Input, voltage conversion circuit, contact pin circuit, backlight control circuit, control signal output and burn-in test connector；Its
In：
The voltage conversion circuit, it is old for the supply voltage of the power input to be converted into tested TFT liquid crystal displays
Change the test trigger voltage of test and the supply voltage of tested TFT liquid crystal displays；
The contact pin circuit, for the test trigger voltage to be exported into accordingly drawing into the burn-in test connector
Pin；
The backlight control circuit, for the tested TFT liquid crystal display brightness of output control brightness control signal to the control
Signal output part processed, to control tested TFT liquid crystal displays that most bright state is constantly in during burn-in test；
The burn-in test connector, the burn-in test interface for connecting tested TFT liquid crystal displays, by the supply voltage
Output is exported to quilt to the energization pins in the burn-in test interface of tested TFT liquid crystal displays, and by the test trigger voltage
The corresponding triggering pin surveyed in the burn-in test interface of TFT liquid crystal displays, to trigger the ageing testing function of tested TFT liquid crystal displays,
Burn-in test is carried out to tested TFT liquid crystal displays.
Preferably, the input of the voltage conversion circuit is connected with the power input, the voltage conversion circuit
The first output end be connected with the input of the contact pin circuit, the second output end of the voltage conversion circuit is aging with described
Test connector is connected；Output end of the burn-in test connector also with the contact pin circuit is connected；The backlight control electricity
The input on road is connected with the first output end of the voltage conversion circuit, the output end of the backlight control circuit and the control
Signal output part connection processed.
Preferably, the power input includes first voltage input and second voltage input, the first voltage
Input and the second voltage input are connected with the voltage conversion circuit.
Preferably, the voltage of the first voltage input is 24V, and the voltage of the second voltage input is 12V.
Preferably, the voltage conversion circuit includes the first DC-DC circuit, the second DC-DC circuit and the 3rd DC-DC electricity
Road；Wherein：
First DC-DC circuit, the 24V voltage conversions for the first voltage input to be input into are 12V voltages；
Second DC-DC circuit, the 12V voltage conversions for first DC-DC circuit to be exported are 3.3V
Voltage, the 3.3V voltages are used for the corresponding triggering pin being supplied in the burn-in test interface of tested TFT liquid crystal displays, to trigger
The ageing testing function of tested TFT liquid crystal displays；
3rd DC-DC circuit, for the 24V voltages for being input into the first voltage input and the second voltage
The 12V voltages of input input are converted into 5V voltages.
Preferably, the lcd panel test plate also includes tested screen power supply selection circuit, and the tested screen is powered and selects electricity
Road is used to select the supply voltage for being tested TFT liquid crystal displays.
Preferably, the input of first DC-DC circuit is connected with the first voltage input, a DC-
The output end of DC circuits is connected with the input of second DC-DC circuit；The output end of second DC-DC circuit with it is described
The input connection of contact pin circuit；The first input end of the 3rd DC-DC circuit is connected with the first voltage input, institute
The second input for stating the 3rd DC-DC circuit is connected with the second voltage input, the output end of the 3rd DC-DC circuit
It is connected with the power first input end of selection circuit of the tested screen；The tested screen is powered second input point of selection circuit
Output end not with the second voltage input and first DC-DC circuit is connected；The tested screen is powered selection circuit
Output end be connected with the respective pins of the burn-in test connector.
Preferably, the burn-in test connector includes the first burn-in test connector and the second burn-in test connector,
The output end of the first burn-in test connector and the second burn-in test connector with the contact pin circuit is connected.
Preferably, the first burn-in test connector includes a terminal for 30 pins, and second burn-in test connects
Connecing device includes a terminal for 51 pins.
Additionally, to achieve these goals, the present invention also provides a kind of test device of television set, the survey of the television set
Trial assembly is put including lcd panel test plate as described above.
The present invention provides a kind of lcd panel test plate, the lcd panel test plate include power input, voltage conversion circuit,
Contact pin circuit, backlight control circuit, control signal output and burn-in test connector；The voltage conversion circuit, for inciting somebody to action
The supply voltage of the power input is converted to the test trigger voltage and tested TFT of tested TFT liquid crystal displays burn-in test
The supply voltage of liquid crystal display；The contact pin circuit, for the test trigger voltage to be exported to the burn-in test connector
In respective pins；The backlight control circuit, for the tested TFT liquid crystal display brightness of output control brightness control signal to institute
Control signal output is stated, to control tested TFT liquid crystal displays that most bright state is constantly in during burn-in test；It is described old
Change test connector, the burn-in test interface for connecting tested TFT liquid crystal displays exports to tested TFT the supply voltage
Energization pins in the burn-in test interface of liquid crystal display, and the test trigger voltage is exported to tested TFT liquid crystal displays
Corresponding triggering pin in burn-in test interface, to trigger the ageing testing function of tested TFT liquid crystal displays, to tested TFT liquid crystal
Screen carries out burn-in test.Lcd panel test plate of the present invention reduces the burn-in test cost of TFT liquid crystal displays, greatly simplifies
The burn-in test process of TFT liquid crystal displays；Also, the present invention can also be to the different types of TFT liquid crystal displays of different vendor's production
Carry out burn-in test.
Brief description of the drawings
In order to illustrate more clearly about the embodiment of the present invention or technical scheme of the prior art, below will be to embodiment or existing
The accompanying drawing to be used needed for having technology description is briefly described, it should be apparent that, drawings in the following description are only this
Some embodiments of invention, for those of ordinary skill in the art, on the premise of not paying creative work, can be with
Structure according to these accompanying drawings obtains other accompanying drawings.
Fig. 1 is the circuit modular structure schematic diagram of lcd panel test plate first embodiment of the present invention；
Fig. 2 is the circuit modular structure schematic diagram of lcd panel test plate second embodiment of the present invention.
The realization of the object of the invention, functional characteristics and advantage will be described further referring to the drawings in conjunction with the embodiments.
Specific embodiment
It should be appreciated that the specific embodiments described herein are merely illustrative of the present invention, it is not intended to limit the present invention.
The present invention provides a kind of lcd panel test plate, reference picture 1, and Fig. 1 is lcd panel test plate first embodiment of the present invention
Electrical block diagram, in the present embodiment, the lcd panel test plate include power input 101, voltage conversion circuit 102,
Contact pin circuit 103, burn-in test connector 104, backlight control circuit 105 and control signal output 106.
Specifically, in the present embodiment, the power input 101, for being the lcd panel test plate input test
Supply voltage；
The voltage conversion circuit 102, it is tested for the supply voltage that the power input 101 is input into be converted to
The test trigger voltage of TFT liquid crystal display (not shown) burn-in tests and the supply voltage of tested TFT liquid crystal displays；
The contact pin circuit 103, the test trigger voltage for the voltage conversion circuit 102 to be exported export to
Respective pins in the burn-in test connector 104；
The burn-in test connector 104, the burn-in test interface for connecting tested TFT liquid crystal displays, by the voltage
The supply voltage of the output of change-over circuit 102 exports the energization pins into the burn-in test interface of tested TFT liquid crystal displays, with
And the test trigger voltage for exporting the voltage conversion circuit 102 is exported to the burn-in test of tested TFT liquid crystal displays and connect
Corresponding triggering pin in mouthful, to trigger the ageing testing function of tested TFT liquid crystal displays, is carried out aging to tested TFT liquid crystal displays
Test；
The backlight control circuit 105, for the tested TFT liquid crystal display brightness of output control brightness control signal to described
Control signal output 106, to control tested TFT liquid crystal displays that most bright state is constantly in during burn-in test.
In the present embodiment, the input of the voltage conversion circuit 102 is connected with the power input 101, the electricity
First output end E of voltage conversion circuit 102 is connected with the input of the contact pin circuit 103, the voltage conversion circuit 102
Second output end F is connected with the burn-in test connector 104；The burn-in test connector 104 also with the contact pin circuit
103 output end connection；First output end of the input of the backlight control circuit 105 and the voltage conversion circuit 102
Connection, the output end of the backlight control circuit 105 is connected with the control signal output 106.In the present embodiment, the electricity
The test trigger voltage of the tested TFT liquid crystal display burn-in tests of the first output end E outputs of voltage conversion circuit 102, the voltage
The supply voltage of the tested TFT liquid crystal displays of the second output end F outputs of change-over circuit 102.
Further, reference picture 2, based on the first embodiment of lcd panel test plate of the present invention, survey in liquid crystal display of the present invention
In the second embodiment of test plate (panel), the power input 101 includes first voltage input A and second voltage input B, described
The voltage of first voltage input A is 24V, and the voltage of the second voltage input B is 12V.When the confession of tested TFT liquid crystal displays
When piezoelectric voltage is 12V, the 12V voltages of the second voltage input B of the power input 101 be able to can be supplied to
Energization pins in the burn-in test interface of tested TFT liquid crystal display (not shown), are powered to tested TFT liquid crystal displays.
In the present embodiment, the voltage conversion circuit 102 includes the first DC-DC circuit 1021, the second DC-DC circuit 1022
And the 3rd DC-DC circuit 1023.
Specifically, first DC-DC circuit 1021, the 24V voltages for the first voltage input A to be input into turn
It is changed to 12V voltages.When the supply voltage of tested TFT liquid crystal displays is 12V, first DC-DC circuit 1021 can be exported
The 12V voltages be supplied to energization pins in the burn-in test interface of tested TFT liquid crystal displays, tested TFT liquid crystal displays are carried out
Power supply.
Second DC-DC circuit 1022, the 12V voltages for first DC-DC circuit 1021 to be exported turn
3.3V voltages are changed to, the 3.3V voltages are used for the corresponding triggering pin of the burn-in test interface for being supplied to tested TFT liquid crystal displays,
To trigger the ageing testing function of tested TFT liquid crystal displays, burn-in test is carried out to tested TFT liquid crystal displays.I.e. in the present embodiment,
3.3V is the test trigger voltage of tested TFT liquid crystal display burn-in tests.
3rd DC-DC circuit 1023, for by the first voltage input A in the power input 101
The 24V voltages of input and the 12V voltages of second voltage input B inputs are converted into 5V voltages.When tested TFT liquid crystal displays
Supply voltage be 5V when, the 5V voltages that the 3rd DC-DC circuit 1023 is exported can be supplied to tested TFT liquid crystal displays
Burn-in test interface in energization pins, tested TFT liquid crystal displays are powered.
Further, the present embodiment lcd panel test plate also includes tested screen power supply selection circuit 107, and the tested screen is supplied
Electric selection circuit 107 is used to select the supply voltage for being tested TFT liquid crystal displays, and the present embodiment lcd panel test plate passes through institute
State tested screen power supply selection circuit 107 to select the supply voltage of tested TFT liquid crystal displays, be tested the supply voltage of TFT liquid crystal displays
It is 12V or 5V.Specifically, the present embodiment lcd panel test plate in actual test application, power and select electricity by the tested screen
Road 107 is a jumper cap, i.e., select to select the supply voltage of tested TFT liquid crystal displays by jumper cap.
Specifically, in the present embodiment, input and the power input 101 of first DC-DC circuit 1021
The first voltage input A connections, the output end of first DC-DC circuit 1021 and second DC-DC circuit 1022
Input connection；The output end of second DC-DC circuit 1022 is connected with the input of the contact pin circuit 103；It is described
The first input end of the 3rd DC-DC circuit 1023 is connected with the first voltage input A of the power input 101, institute
The second input of the 3rd DC-DC circuit 1023 is stated to be connected with the second voltage input B of the power input 101,
The power first input end of selection circuit 107 of the output end of the 3rd DC-DC circuit 1023 and the tested screen is connected；It is described
Second input of tested screen power supply selection circuit 107 respectively with the second voltage input B of the power input 101
And the output end connection of first DC-DC circuit 1021；The tested screen power selection circuit 107 output end it is old with described
Change the respective pins connection of test connector 104.In the present embodiment, the input of the backlight control circuit 105 and described
The output end connection of two DC-DC circuits 1022, i.e., the supply voltage of described backlight control circuit 105 is 3.3V.
In the present embodiment, the burn-in test connector 104 includes the first burn-in test connector (not shown) and second
Burn-in test connector (not shown), the first burn-in test connector and the second burn-in test connector with it is described
The output end connection of contact pin circuit.In the present embodiment, the first burn-in test connector includes a terminal for 30 pins, institute
Stating the second burn-in test connector includes a terminal for 51 pins.
The aging survey of the burn-in test connector 104 on the present embodiment lcd panel test plate and tested TFT liquid crystal displays
Mouth of trying is connected, and using the ageing testing function of tested TFT liquid crystal displays itself, the present embodiment is tested TFT liquid per money by triggering
The ageing testing function of crystalline substance screen, allows tested TFT liquid crystal displays itself to carry out burn-in test.With reference to table 1, table 1 is that TFT liquid crystal displays are aging
The triggering mode statistical form of test function, the TFT liquid crystal displays of each manufacturer production include that (resolution ratio is 3840* to UD screens
2160), FHD screens (resolution ratio is 1920*1080) and HD screens (resolution ratio is 1366*768), it is same a that different vendor produces
TFT liquid crystal displays, the triggering mode of its ageing testing function is all different.
The triggering mode statistical form of table 1TFT liquid crystal display ageing testing functions
As shown in table 1, the burn-in test triggering mode of the TFT liquid crystal displays of magnificent starlight electricity is：HD screens and FHD screens only need by
Its burn-in test interface meets GND and accesses the supply voltage of 12V；UD to have got rid of and meet GND by its burn-in test interface and access 12V
Supply voltage outside, in addition it is also necessary to the 23rd pin of its burn-in test interface is drawn high into 3.3v.
The burn-in test triggering mode of the TFT liquid crystal displays of Samsung is：HD screens, FHD screens and UD screens only need to be by its aging surveys
Mouth of trying meets GND and accesses the supply voltage of 12V.
The burn-in test triggering mode of the TFT liquid crystal displays of LG is：Its burn-in test interface need to be connect GND and access by HD screens
The supply voltage of 12V, and need for the 30th pin of its burn-in test interface to draw high 3.3v；FHD screens need to be by its burn-in test
Interface meets GND and accesses the supply voltage of 12V, and needs for the 44th pin of its burn-in test interface to draw high 3.3v；UD screens
Its burn-in test interface need to be connect the supply voltage of GND and access 12V, and need to draw the 23rd pin of its burn-in test interface
Height arrives 3.3v.
The burn-in test triggering mode of TFT liquid crystal displays of group's wound is：Its burn-in test interface is connect GND and access by HD screens
The supply voltage of 12V, and need for the 10th pin of its burn-in test interface to draw high 3.3v, it is also desirable to give its aging
10th pin of test interface provides LVDS CLOCK signals；Its burn-in test interface need to be connect GND's and access 12V by FHD screens
Supply voltage, and need for the 1st pin of its burn-in test interface to draw high 3.3v, it is also desirable to be connect to its burn-in test
1st pin of mouth provides LVDS CLOCK signals；Its burn-in test interface need to be connect UD screens the supply voltage of GND and access 12V,
And need for the 23rd pin of its burn-in test interface to draw high 3.3v, meanwhile, if by the 22nd pin of its burn-in test interface
3.3v is drawn high, then the aging picture of the UD screens will suspend.
The burn-in test triggering mode of Youda's TFT liquid crystal displays is：Its burn-in test interface need to be connect GND and access by HD screens
The supply voltage of 12V, and need for the 27th pin of its burn-in test interface to draw high 3.3v；FHD screens need to be by its burn-in test
Interface meets GND and accesses the supply voltage of 12V, and needs for its 4th pin to draw high 3.3v；UD screens are by its burn-in test interface
Meet GND and access the supply voltage of 12V, and need for the 23rd pin of its burn-in test interface to draw high 3.3v.
When the corresponding TFT liquid crystal displays during the present embodiment lcd panel test plate needs to table 1 carry out burn-in test, it is necessary to will
The burn-in test connector 104 on the present embodiment lcd panel test plate enters with the burn-in test interface of tested TFT liquid crystal displays
Row connection, according to the difference of tested TFT liquid crystal displays, connects in the first burn-in test connector and second burn-in test
One of burn-in test connector is selected to be attached with the burn-in test interface of tested TFT liquid crystal displays in device, then basis
The triggering mode of the ageing testing function of the HD screens, FHD screens and UD screens of the different vendor's production shown in table 1, by the contact pin
The triggering mode of the ageing testing function of the tested TFT liquid crystal displays of 103 pairs of differences of circuit carries out debugging selection.Specifically, due to certain
Tested TFT liquid crystal displays need to use the test trigger voltage of 3.3V in burn-in test a bit, therefore, the present embodiment is inserted by described
The test trigger voltage of the 3.3V that pin circuit 103 is exported second DC-DC circuit 1022 is exported to the burn-in test
The respective pins of connector 104, then by the burn-in test connector 104 by the test trigger voltage of the 3.3V export to
Corresponding triggering pin in the burn-in test interface of tested TFT liquid crystal displays, to trigger the burn-in test work(of tested TFT liquid crystal displays
Can, burn-in test is carried out to tested TFT liquid crystal displays.
The present embodiment lcd panel test plate in actual test application, the HD of the different vendor's production according to table 1
The triggering mode of the ageing testing function of screen, FHD screens and UD screens, will by way of jumper cap on the contact pin circuit 104
The respective pins of the burn-in test connector 104 draw high 3.3V, meanwhile, by the burn-in test by way of jumper cap
The respective pins of connector 104 are connected to 12V or 5V (supply voltage according to tested TFT liquid crystal displays is selected), and then will
Corresponding triggering pin in the burn-in test interface of tested TFT liquid crystal displays draws high 3.3V and by the old of tested TFT liquid crystal displays
The energization pins changed in test interface are connected to 12V or 5V, so as to trigger the ageing testing function of tested TFT liquid crystal displays, realize
Burn-in test to being tested TFT liquid crystal displays.Further, since being tested TFT liquid crystal displays during burn-in test, it is necessary to control to be tested
The brightness of TFT liquid crystal displays is most bright state, and the present embodiment lcd panel test plate is by the output control of the backlight control circuit 105
The brightness control signal of tested TFT liquid crystal display brightness is to the control signal output 106, in actual applications, the brightness
Control signal is exported to the backlight module of television set from after the output of the control signal output 106 through the power panel of television set,
To control tested TFT liquid crystal displays that most bright state is constantly in during burn-in test.
The present embodiment lcd panel test plate is the old of HD screens, FHD screens and the UD screens of the different vendor's production according to table 1
Change the triggering mode of test function, for the triggering mode of the ageing testing function of every money TFT liquid crystal displays, in the contact pin circuit
The respective pins of the burn-in test connector 104 are drawn high into 3.3V by way of jumper cap on 104, meanwhile, by jumping
The respective pins of the burn-in test connector 104 are connected to 12V or 5V (according to tested TFT liquid crystal displays by the mode of line cap
Supply voltage is selected), and then the corresponding triggering pin in the burn-in test interface of tested TFT liquid crystal displays is drawn high into 3.3V
And the energization pins in the burn-in test interface of tested TFT liquid crystal displays are connected to 12V or 5V, so as to trigger tested TFT liquid
The ageing testing function of crystalline substance screen, realizes the burn-in test to being tested TFT liquid crystal displays.The present embodiment can be to different vendor's production
Different types of TFT liquid crystal displays carry out burn-in test, for example, can starlight electricity to China, Samsung, LG, group's wound and the production of company of Youda
UD screens, FHD screens and HD screens carry out burn-in test；Also, the present embodiment also saves the resources of production of television set, reduces
The burn-in test cost of TFT liquid crystal displays；Meanwhile, the present embodiment also greatly simplifies the burn-in test process of TFT liquid crystal displays.
The present invention also provides a kind of test device of television set, and the test device of the television set includes lcd panel test plate,
The structure of the lcd panel test plate can refer to above-described embodiment, will not be repeated here.Naturally, due to the electricity of the present embodiment
Test device depending on machine employs the technical scheme of above-mentioned lcd panel test plate, thus the television set test device have it is above-mentioned
The all of beneficial effect of lcd panel test plate.
The preferred embodiments of the present invention are these are only, the scope of the claims of the invention is not thereby limited, it is every to utilize this hair
Equivalent structure or equivalent flow conversion that bright specification and accompanying drawing content are made, or directly or indirectly it is used in other related skills
Art field, is included within the scope of the present invention.
Claims (10)
1. a kind of lcd panel test plate, it is characterised in that the lcd panel test plate includes power input, voltage conversion electricity
Road, contact pin circuit, backlight control circuit, control signal output and burn-in test connector；Wherein：
The voltage conversion circuit, for the supply voltage of the power input to be converted into the tested aging survey of TFT liquid crystal displays
Test trigger voltage on probation and the supply voltage of tested TFT liquid crystal displays；
The contact pin circuit, for the test trigger voltage to be exported into the respective pins into the burn-in test connector；
The backlight control circuit, brightness control signal to the control for the tested TFT liquid crystal display brightness of output control is believed
Number output end, to control tested TFT liquid crystal displays that most bright state is constantly in during burn-in test；
The burn-in test connector, the burn-in test interface for connecting tested TFT liquid crystal displays, by supply voltage output
Energization pins into the burn-in test interface of tested TFT liquid crystal displays, and the test trigger voltage is exported to tested TFT
Corresponding triggering pin in the burn-in test interface of liquid crystal display, to trigger the ageing testing function of tested TFT liquid crystal displays, to tested
TFT liquid crystal displays carry out burn-in test.
2. lcd panel test plate as claimed in claim 1, it is characterised in that the input of the voltage conversion circuit with it is described
Power input is connected, and the first output end of the voltage conversion circuit is connected with the input of the contact pin circuit, the electricity
Second output end of voltage conversion circuit is connected with the burn-in test connector；The burn-in test connector also with the contact pin
The output end connection of circuit；The input of the backlight control circuit is connected with the first output end of the voltage conversion circuit,
The output end of the backlight control circuit is connected with the control signal output.
3. lcd panel test plate as claimed in claim 1, it is characterised in that the power input includes first voltage input
End and second voltage input, the first voltage input and the second voltage input with the voltage conversion circuit
Connection.
4. lcd panel test plate as claimed in claim 3, it is characterised in that the voltage of the first voltage input is 24V,
The voltage of the second voltage input is 12V.
5. lcd panel test plate as claimed in claim 4, it is characterised in that the voltage conversion circuit includes a DC-DC
Circuit, the second DC-DC circuit and the 3rd DC-DC circuit；Wherein：
First DC-DC circuit, the 24V voltage conversions for the first voltage input to be input into are 12V voltages；
Second DC-DC circuit, the 12V voltage conversions for first DC-DC circuit to be exported are 3.3V voltages,
The 3.3V voltages are used for the corresponding triggering pin being supplied in the burn-in test interface of tested TFT liquid crystal displays, tested to trigger
The ageing testing function of TFT liquid crystal displays；
3rd DC-DC circuit, is input into for the 24V voltages for being input into the first voltage input and the second voltage
The 12V voltages of input are held to be converted into 5V voltages.
6. lcd panel test plate as claimed in claim 5, it is characterised in that the lcd panel test plate also includes that tested screen is supplied
Electric selection circuit, the tested screen powers selection circuit for selecting the supply voltage for being tested TFT liquid crystal displays.
7. lcd panel test plate as claimed in claim 6, it is characterised in that the input of first DC-DC circuit and institute
The connection of first voltage input is stated, the output end of first DC-DC circuit connects with the input of second DC-DC circuit
Connect；The output end of second DC-DC circuit is connected with the input of the contact pin circuit；The of 3rd DC-DC circuit
One input is connected with the first voltage input, second input and the second voltage of the 3rd DC-DC circuit
Input is connected, and the power first input end of selection circuit of output end and the tested screen of the 3rd DC-DC circuit is connected；
The tested screen power selection circuit the second input respectively with the second voltage input and first DC-DC circuit
Output end connection；The tested screen power selection circuit output end and the burn-in test connector respective pins connect
Connect.
8. the lcd panel test plate as any one of claim 1 to 7, it is characterised in that the burn-in test connector
Including the first burn-in test connector and the second burn-in test connector, the first burn-in test connector and described second old
Change output end of the test connector with the contact pin circuit to be connected.
9. lcd panel test plate as claimed in claim 8, it is characterised in that the first burn-in test connector includes
The terminal of 30 pins, the second burn-in test connector includes a terminal for 51 pins.
10. a kind of test device of television set, it is characterised in that the test device of the television set is included in claim 1 to 9
Lcd panel test plate described in any one.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201611157121.2A CN106782237A (en) | 2016-12-14 | 2016-12-14 | The test device of lcd panel test plate and television set |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201611157121.2A CN106782237A (en) | 2016-12-14 | 2016-12-14 | The test device of lcd panel test plate and television set |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN106782237A true CN106782237A (en) | 2017-05-31 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201611157121.2A Pending CN106782237A (en) | 2016-12-14 | 2016-12-14 | The test device of lcd panel test plate and television set |
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Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
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| CN108983678A (en) * | 2018-08-21 | 2018-12-11 | 中新科技集团股份有限公司 | A kind of control method and system of TV aging process |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN107610658A (en) * | 2017-08-23 | 2018-01-19 | 惠科股份有限公司 | The drive device and driving method of display device |
| CN107610658B (en) * | 2017-08-23 | 2020-06-26 | 惠科股份有限公司 | Driving device and driving method for display device |
| CN107635108A (en) * | 2017-11-02 | 2018-01-26 | 深圳Tcl新技术有限公司 | Picture frame TV |
| CN107635108B (en) * | 2017-11-02 | 2021-02-23 | 深圳Tcl新技术有限公司 | Picture frame television |
| CN108615490A (en) * | 2018-03-16 | 2018-10-02 | 昆山龙腾光电有限公司 | test circuit |
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| CN108983678A (en) * | 2018-08-21 | 2018-12-11 | 中新科技集团股份有限公司 | A kind of control method and system of TV aging process |
| CN109342863A (en) * | 2018-10-25 | 2019-02-15 | Tcl王牌电器(惠州)有限公司 | Test device |
| CN109342863B (en) * | 2018-10-25 | 2022-03-11 | Tcl王牌电器(惠州)有限公司 | Testing device |
| CN110211520A (en) * | 2019-06-10 | 2019-09-06 | 惠科股份有限公司 | Display panel debug circuit |
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Application publication date: 20170531 |