CN104880573B - MEMS sensing chips - Google Patents

MEMS sensing chips Download PDF

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Publication number
CN104880573B
CN104880573B CN201510249774.2A CN201510249774A CN104880573B CN 104880573 B CN104880573 B CN 104880573B CN 201510249774 A CN201510249774 A CN 201510249774A CN 104880573 B CN104880573 B CN 104880573B
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Prior art keywords
axis acceleration
induction area
acceleration induction
substrate
piece
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CN201510249774.2A
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CN104880573A (en
Inventor
陈学峰
钟利强
杨小平
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Miramems Sensing Technology Co ltd
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Suzhou Good Ark Electronics Co Ltd
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01PMEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
    • G01P15/00Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
    • G01P15/02Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses
    • G01P15/08Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values
    • G01P15/125Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values by capacitive pick-up
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01PMEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
    • G01P15/00Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
    • G01P15/18Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration in two or more dimensions
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01PMEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
    • G01P15/00Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
    • G01P15/02Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses
    • G01P15/08Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values
    • G01P2015/0805Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values being provided with a particular type of spring-mass-system for defining the displacement of a seismic mass due to an external acceleration
    • G01P2015/0822Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values being provided with a particular type of spring-mass-system for defining the displacement of a seismic mass due to an external acceleration for defining out-of-plane movement of the mass
    • G01P2015/0825Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values being provided with a particular type of spring-mass-system for defining the displacement of a seismic mass due to an external acceleration for defining out-of-plane movement of the mass for one single degree of freedom of movement of the mass
    • G01P2015/0831Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values being provided with a particular type of spring-mass-system for defining the displacement of a seismic mass due to an external acceleration for defining out-of-plane movement of the mass for one single degree of freedom of movement of the mass the mass being of the paddle type having the pivot axis between the longitudinal ends of the mass, e.g. see-saw configuration

Abstract

The present invention discloses a kind of MEMS sensing chips, including MEMS acceleration chip, signal processing chip and substrate, MEMS acceleration chip includes lid, micro mechanical system and circuit substrate, the micro mechanical system by X-axis acceleration induction area, Y-axis acceleration induction area and Z axis acceleration induction district's groups into;Y-axis acceleration induction area includes Y-direction " H " shape movement piece, 2 Y-direction moving electrodes and 2 Y-directions with 2 through holes and fixes electrode;Z axis acceleration induction area includes quality stick and the support shaft for being used to support quality stick center;Substrate pad opens up circuit substrate upper surface and is located at lid side, and the through hole is square, and the X moves piece upper and lower end to " H " shape and is equipped with the first convex block, which is located between 2 the first limiting sections of the circuit substrate.MEMS sensing chips of the present invention effectively prevent product from avoiding X-axis, the damage of Y-axis acceleration induction area internal structure under the action of acceleration, effectively reduce stress damage of the external force to chip.

Description

MEMS sensing chips
Technical field
The present invention relates to acceleration transducer technical field, and in particular to a kind of MEMS sensing chips.
Background technology
The research of acceleration transducer is quickly grown in recent years, various performances, range high-range acceleration transducer oneself Through report in succession.But acceleration transducer is very high to anti high overload ability and intrinsic frequency requirement, resists exceed under normal conditions Loading capability requirement can bear hundreds of thousands range shock loading, and intrinsic frequency requirement is up to tens kHz, or even kHz up to a hundred.Cause This, MEMS high-range acceleration transducers usually cause structural failure since anti high overload ability is poor in the application.To protect Reliability of the MEMS high-range acceleration transducers in application is demonstrate,proved, the encapsulation of MEMS high-range acceleration transducers just seems outstanding To be important.Practice have shown that existing sensor packaging techniques generally existing anti high overload energy force difference, intrinsic frequency are low and encapsulate The problem of poor reliability, i.e., running into evil using the MEMS high-range acceleration transducers after the encapsulation of existing sensor packaging techniques During bad application environment, often there is shell rupture, the problems such as cover board depression, chip come off from shell substrate, wire breaking.Base In this, it is necessary to a kind of MEMS sensing chips are invented, to ensure reliability of the acceleration transducer in application.
The content of the invention
It is an object of the present invention to provide a kind of MEMS sensing chips, this MEMS sensing chip improves the reliability of device and has Effect reduces stress damage of the external force to chip.
To reach above-mentioned purpose, the technical solution adopted by the present invention is:A kind of MEMS sensing chips, including MEMS acceleration Chip, for filtering interference signal and handling the signal processing chip and substrate of inductive signal, the MEMS acceleration chip by Lid, micro mechanical system and the circuit substrate for producing inductive signal, the micro mechanical system is by X-axis acceleration induction area, Y-axis Acceleration induction area with for sensing the Z axis acceleration induction district's groups of extraneous Z axis movement into the lid and circuit substrate surrounding Edge is bonded by sealant layer so as to form an annular seal space, and the micro mechanical system is located in annular seal space and on circuit substrate Surface, the height of the annular seal space is 45 ~ 55 μm;
The X-axis acceleration induction area includes the X with 2 through holes and moves piece, 2 X to moving electrodes and 2 to " H " shape A X is to electrode is fixed, and each one end is respectively installed to the left and right end that X moves piece to " H " shape for the first spring and second spring, the Each the other end is respectively installed on the circuit substrate for one spring and second spring, and 2 X are located at respectively to moving electrodes X is moved in 2 through holes of piece and can move piece to " H " shape with the X and move to " H " shape, the X to fixation electrode and X to Moving electrodes set face-to-face and its in X to the underface of moving electrodes;
The Y-axis acceleration induction area includes Y-direction " H " shape movement piece, 2 Y-direction moving electrodes and 2 with 2 through holes A Y-direction fixes electrode, and each one end is respectively installed to Y-direction " H " shape movement piece upper and lower end for the 3rd spring and the 4th spring, and the 3rd Each the other end is respectively installed on the circuit substrate for spring and the 4th spring, and 2 Y-direction moving electrodes are located at Y respectively Move in the through hole of piece and can move piece with Y-direction " H " shape and move to " H " shape, Y-direction fixes electrode and Y-direction moving electrodes Set face-to-face and it is in the underface of Y-direction moving electrodes;Y-direction " H " shape movement piece, the 3rd in the Y-axis acceleration induction area Spring and the 4th spring orientation and X in X-axis acceleration induction area are to moving electrodes, the first spring and second spring arrangement side To vertical;The Z axis acceleration induction area includes quality stick and the support shaft for being used to support quality stick center, the quality Z axis induction electrode is equipped with immediately below stick both ends, limited block is equipped with directly over the quality stick both ends;
The circuit substrate lower surface is Nian Jie with signal processing chip upper surface part subregion by the first insulation adhesive layer, This signal processing chip lower surface is Nian Jie with substrate portion region by the second insulation adhesive layer, circuit substrate and substrate each on Surface has several chip pads and the substrate pad in several distribution substrate both sides of the edge areas, signal processing core Piece upper surface has several signals input pad and signal output pad, this signal output pad is located at second In insulation adhesive layer and signal processing chip both sides of the edge area is distributed in, the first metal wire is connected across the chip pad and letter Number input pad between, be distributed in both sides the second metal wire be connected across the signal output pad and substrate pad it Between;
The substrate pad opens up circuit substrate upper surface and is located at lid side, the through hole to be square, the X to " H " shape movement piece upper and lower end be equipped with the first convex block, first convex block be located at the circuit substrate 2 the first limiting sections it Between.
Further improved scheme is as follows in above-mentioned technical proposal:
In such scheme, the X-axis acceleration induction area and Y-axis acceleration induction area are located at a row, the Z axis acceleration Induction zone is arranged in parallel with X-axis acceleration induction area and Y-axis acceleration induction area.
Since above-mentioned technical proposal is used, the present invention has following advantages and effect compared with prior art:
1. MEMS sensing chips of the present invention, its circuit substrate lower surface passes through the first insulation adhesive layer and signal processing core Piece upper surface portion region is bonded, this signal processing chip lower surface is glued by the second insulation adhesive layer with substrate portion region Connect, each upper surface has several chip pads and several distribution substrate both sides of the edge areas for circuit substrate and substrate Substrate pad, signal processing chip upper surface has several signals input pad and signal output pad, This signal output pad is interior positioned at the second insulation adhesive layer and is distributed in signal processing chip both sides of the edge area, the first metal wire It is connected across between chip pad and signal the input pad, the second metal wire for being distributed in both sides is connected across the signal Export between pad and substrate pad, package reliability is high, and external force is effectively reduced to chip by the welding for the glue-line that insulate Stress damage, the position arrangement design of pad can carry out the welding of line in minimum encapsulated space, and first makes company The shorter cost of gold thread of line is lower, secondly uses the technique threaded in insulating cement to solve the routing bank of the high step difference opposite sex not The problem of steady, improve the feasibility of product volume production.
2. MEMS sensing chips of the present invention, its X moves piece upper and lower end to " H " shape and is equipped with the first convex block, this is first convex Block is located between 2 the first limiting sections of the circuit substrate, and Y-direction " H " shape movement piece upper and lower end is equipped with the second convex block, should Second convex block is located between 2 the second limiting sections of the circuit substrate, effectively prevents product from being kept away under the action of acceleration Exempt from X-axis, the damage of Y-axis acceleration induction area internal structure.
3. MEMS sensing chips of the present invention, its Z axis acceleration induction area includes quality stick and is used to support quality stick The support shaft at center, the quality stick both ends underface are equipped with Z axis induction electrode, and the quality stick both ends surface is Equipped with limited block, can effectively protect the mechanicalness of internal structure to damage, simultaneously for sensing sensitivity in terms of have it is very big Improve.
4. MEMS sensing chips of the present invention, its X-axis acceleration induction area and Y-axis acceleration induction area are located at a row, described Z axis acceleration induction area is arranged in parallel with X-axis acceleration induction area and Y-axis acceleration induction area, and the effective induction zone that reduces exists Shared position in chip circuit, in terms of cost and the feasibility of encapsulation advantageously;Secondly, substrate pad opens up circuit Substrate upper surface and it is located at lid side, is conducive to chip array and reduces the difficulty of cutting and routing in encapsulation process.
Brief description of the drawings
Fig. 1 is MEMS sensing chips structure diagram of the present invention;
Fig. 2 is the left view structural representation of attached drawing 1;
Fig. 3 is the present invention looks up structural representation of attached drawing 1;
Fig. 4 is MEMS sensing chips structure diagram of the present invention;
Fig. 5 is micro mechanical system structure diagram of the present invention;
Fig. 6 is X-axis acceleration induction plot structure schematic diagram in MEMS sensing chips of the present invention;
Fig. 7 is X-axis acceleration induction area partial structural diagram of the present invention;
Fig. 8 is Y-axis acceleration induction plot structure schematic diagram in MEMS sensing chips of the present invention;
Fig. 9 is Z axis acceleration induction plot structure schematic diagram in MEMS sensing chips of the present invention;
Figure 10 is the present invention looks up structural representation of attached drawing 9.
In the figures above:1st, MEMS acceleration chip;2nd, signal processing chip;3rd, substrate;4th, lid;5th, micromechanics system System;6th, circuit substrate;7th, X-axis acceleration induction area;71st, X moves piece to " H " shape;72nd, X is to moving electrodes;73rd, X is electric to fixing Pole;74th, the first spring;75th, second spring;8th, Y-axis acceleration induction area;81st, Y-direction " H " shape movement piece;82nd, Y-direction movement electricity Pole;83rd, Y-direction fixes electrode;84th, the 3rd spring;85th, the 4th spring;9th, Z axis acceleration induction area;10th, sealant layer;11st, it is close Seal chamber;12nd, the first insulation adhesive layer;13rd, the second insulation adhesive layer;14th, chip pad;15th, substrate pad;16th, signal Input pad;17th, signal output pad;18th, the first metal wire;19th, the second metal wire;20th, the first convex block;21st, first Limiting section;22nd, the second convex block;23rd, the second limiting section;24th, quality stick;25th, support shaft;26th, Z axis induction electrode;27th, it is spacing Block.
Embodiment
With reference to embodiment, the invention will be further described:
Embodiment:A kind of MEMS sensing chips, including MEMS acceleration chip 1, for filtering interference signal and handling sense The signal processing chip 2 and substrate 3 of induction signal, the MEMS acceleration chip 1 is by lid 4, micro mechanical system 5 and for producing The circuit substrate 6 of inductive signal, the micro mechanical system 5 is by X-axis acceleration induction area 7, Y-axis acceleration induction area 8 and for feeling The Z axis acceleration induction area 9 of extraneous Z axis movement is answered to form, the lid 4 passes through sealant layer with 6 edge of circuit substrate So as to form an annular seal space 11, the micro mechanical system 5 be located in annular seal space 11 and in 6 upper surface of circuit substrate 10 bondings, this The height of annular seal space 11 is 45 ~ 55 μm;
The X-axis acceleration induction area 7 includes the X with 2 through holes and moves 71,2 X of piece to moving electrodes to " H " shape To fixed electrode 73, the first spring 74 and 75 respective one end of second spring are respectively installed to X and move piece 71 to " H " shape 72 and 2 X Left and right end, the first spring 74 and the 75 respective other end of second spring be respectively installed on the circuit substrate 6,2 X Moved respectively positioned at X to " H " shape to moving electrodes 72 in 2 through holes of piece 71 and piece 71 1 can be moved to " H " shape with the X and started shipment It is dynamic, the X set face-to-face to fixed electrode 73 and X to moving electrodes 72 and its in X to the underface of moving electrodes 72;
The Y-axis acceleration induction area 8 includes Y-direction " H " shape movement 81,2 Y-direction moving electrodes of piece with 2 through holes 82 and 2 Y-directions fix electrode 83, and the 3rd spring 84 and 85 respective one end of the 4th spring are respectively installed to Y-direction " H " shape movement piece 81 Upper and lower end, the 3rd spring 84 and the 85 respective other end of the 4th spring are respectively installed on the circuit substrate 6,2 Y-directions Moving electrodes 82 can move in the through hole of Y-direction " H " shape movement piece 81 and with Y-direction " H " shape movement piece 81, Y respectively Set face-to-face with Y-direction moving electrodes 82 to fixed electrode 83 and it is in the underface of Y-direction moving electrodes 82;The Y-axis accelerates Spend Y-direction " H " shape movement piece 81, the 3rd spring 84 and 85 orientation of the 4th spring and X-axis acceleration induction area 7 in induction zone 8 Middle X is vertical with 75 orientation of second spring to moving electrodes 72, the first spring 74;The Z axis acceleration induction area 9 includes matter Amount stick 24 and the support shaft 25 for being used to support 24 center of quality stick, 24 both ends of the quality stick underface are equipped with Z axis Induction electrode 26,24 both ends of the quality stick surface are equipped with limited block 27;
6 lower surface of circuit substrate passes through the first insulation adhesive layer 12 and 2 upper surface part subregion of signal processing chip Bonding, this 2 lower surface of signal processing chip is Nian Jie with 3 subregion of substrate by the second insulation adhesive layer 13,6 He of circuit substrate 3 respective upper surface of substrate has several chip pads 14 and the substrate weldering in several 3 both sides of the edge areas of distribution substrate Contact 15,2 upper surface of signal processing chip have several signals input pad 16 and signal output pad 17, this Signal output pad 17 is interior positioned at the second insulation adhesive layer 13 and is distributed in 2 both sides of the edge area of signal processing chip, the first gold medal Belong to line 18 to be connected across between the chip pad 14 and signal input pad 16, be distributed in the second metal wire 19 of both sides across It is connected between the signal output pad 17 and substrate pad 15.
Above-mentioned X moves 71 upper and lower end of piece to " H " shape and is equipped with the first convex block 20, which is located at the circuit Between 2 the first limiting sections 21 of substrate 6.
Above-mentioned Y-direction " H " shape movement 81 upper and lower end of piece is equipped with the second convex block 22, which is located at the circuit Between 2 the second limiting sections 23 of substrate 6.
The height of above-mentioned annular seal space 11 is 50 μm.
Above-mentioned X-axis acceleration induction area 7 and Y-axis acceleration induction area 8 are located at a row, the Z axis acceleration induction area 9 with X-axis acceleration induction area 7 and Y-axis acceleration induction area 8 are arranged in parallel.
Aforesaid substrate pad 15 opens up 6 upper surface of circuit substrate and is located at 4 side of lid;Above-mentioned through hole is square.
The above embodiments merely illustrate the technical concept and features of the present invention, and its object is to allow person skilled in the art Scholar can understand present disclosure and implement according to this, and it is not intended to limit the scope of the present invention.It is all according to the present invention The equivalent change or modification that Spirit Essence is made, should be covered by the protection scope of the present invention.

Claims (2)

  1. A kind of 1. MEMS sensing chips, it is characterised in that:Including MEMS acceleration chips(1), for filtering interference signal and locating Manage the signal processing chip of inductive signal(2)And substrate(3), the MEMS acceleration chip(1)By lid(4), micromechanics system System(5)With the circuit substrate for producing inductive signal(6)Composition, the micro mechanical system(5)By X-axis acceleration induction area(7)、 Y-axis acceleration induction area(8)With the Z axis acceleration induction area for sensing extraneous Z axis movement(9)Composition, the lid(4)With Circuit substrate(6)Edge passes through sealant layer(10)Bonding is so as to form an annular seal space(11), the micro mechanical system(5) Positioned at annular seal space(11)It is interior and in circuit substrate(6)Upper surface, the annular seal space(11)Height be 45 ~ 55 μm;
    The X-axis acceleration induction area(7)Including the X with 2 through holes piece is moved to " H " shape(71), 2 X are to moving electrodes (72)With 2 X to fixed electrode(73), the first spring(74)And second spring(75)Respective one end is respectively installed to X to " H " shape Move piece(71)Left and right end, the first spring(74)And second spring(75)The respective other end is respectively installed to the circuit base Piece(6)On, 2 X are to moving electrodes(72)Respectively piece is moved to " H " shape positioned at X(71)2 through holes in and can be with the X Piece is moved to " H " shape(71)Move together, the X is to fixed electrode(73)With X to moving electrodes(72)Face-to-face set and its In X to moving electrodes(72)Underface;
    The Y-axis acceleration induction area(8)Piece is moved including Y-direction " H " shape with 2 through holes(81), 2 Y-direction moving electrodes (82)Electrode is fixed with 2 Y-directions(83), the 3rd spring(84)With the 4th spring(85)Respective one end is respectively installed to Y-direction " H " shape Move piece(81)Upper and lower end, the 3rd spring(84)With the 4th spring(85)The respective other end is respectively installed to the circuit substrate (6)On, 2 Y-direction moving electrodes(82)Respectively positioned at Y-direction " H " shape movement piece(81)Through hole in and can be with the Y-direction " H " Shape moves piece(81)Move together, Y-direction fixes electrode(83)With Y-direction moving electrodes(82)Set face-to-face and it is moved in Y-direction Electrode(82)Underface;The Y-axis acceleration induction area(8)Middle Y-direction " H " shape moves piece(81), the 3rd spring(84)With Four springs(85)Orientation and X-axis acceleration induction area(7)Middle X is to moving electrodes(72), the first spring(74)With the second bullet Spring(75)Orientation is vertical;The Z axis acceleration induction area(9)Including quality stick(24)Be used to support quality stick (24)The support shaft at center(25), the quality stick(24)Z axis induction electrode is equipped with immediately below both ends(26), the quality Stick(24)Limited block is equipped with directly over both ends(27);
    The circuit substrate(6)Lower surface passes through the first insulation adhesive layer(12)With signal processing chip(2)Upper surface part subregion Domain is bonded, this signal processing chip(2)Lower surface passes through the second insulation adhesive layer(13)With substrate(3)Subregion is bonded, electricity Roadbed piece(6)And substrate(3)Respective upper surface has several chip pads(14)Substrate is distributed in several(3) The substrate pad in both sides of the edge area(15), signal processing chip(2)Upper surface has several signals input pad (16)With signal output pad(17), this signal output pad(17)Positioned at the second insulation adhesive layer(13)It is interior and be distributed in Signal processing chip(2)Both sides of the edge area, the first metal wire(18)It is connected across the chip pad(14)Input and weld with signal Contact(16)Between, it is distributed in the second metal wire of both sides(19)It is connected across the signal output pad(17)Welded with substrate Point(15)Between;
    The substrate pad(15)It is opened in circuit substrate(6)Upper surface and it is located at lid(4)Side, the through hole are side Shape, the X move piece to " H " shape(71)Upper and lower end is equipped with the first convex block(20), first convex block(20)Positioned at the circuit Substrate(6)2 the first limiting sections(21)Between.
  2. 2. MEMS sensing chips according to claim 1, it is characterised in that:The X-axis acceleration induction area(7)And Y-axis Acceleration induction area(8)Positioned at a row, the Z axis acceleration induction area(9)With X-axis acceleration induction area(7)With Y-axis acceleration Induction zone(8)It is arranged in parallel.
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CN103412146B (en) * 2013-07-30 2015-05-20 苏州固锝电子股份有限公司 Capacitive MEMS acceleration sensor
CN105371845A (en) * 2015-12-17 2016-03-02 安徽寰智信息科技股份有限公司 Inertia tracking module
IT201900009651A1 (en) * 2019-06-20 2020-12-20 St Microelectronics Srl MEMS INERTIAL SENSOR WITH HIGH RESISTANCE TO THE PHENOMENON OF ADHESION

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CN102401842A (en) * 2011-07-08 2012-04-04 上海亚尚电子科技有限公司 Non-equal height comb teeth capacitive triaxial acceleration transducer and method for manufacturing same
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CN103412146B (en) 2015-05-20
CN104880573A (en) 2015-09-02

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