CN104807491A - 部件检查装置 - Google Patents
部件检查装置 Download PDFInfo
- Publication number
- CN104807491A CN104807491A CN201410366763.8A CN201410366763A CN104807491A CN 104807491 A CN104807491 A CN 104807491A CN 201410366763 A CN201410366763 A CN 201410366763A CN 104807491 A CN104807491 A CN 104807491A
- Authority
- CN
- China
- Prior art keywords
- light
- prismatic lens
- polarization
- transmittance plate
- testing fixture
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000010287 polarization Effects 0.000 claims abstract description 70
- 238000005286 illumination Methods 0.000 claims abstract description 14
- 238000002834 transmittance Methods 0.000 claims description 56
- 238000000034 method Methods 0.000 claims description 6
- 230000011514 reflex Effects 0.000 claims description 5
- 238000009792 diffusion process Methods 0.000 claims description 4
- 230000004446 light reflex Effects 0.000 claims description 2
- 238000007689 inspection Methods 0.000 abstract description 5
- 239000011521 glass Substances 0.000 description 6
- 230000000694 effects Effects 0.000 description 4
- 230000015572 biosynthetic process Effects 0.000 description 3
- 230000005540 biological transmission Effects 0.000 description 2
- 230000000295 complement effect Effects 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 238000009434 installation Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 229910044991 metal oxide Inorganic materials 0.000 description 2
- 150000004706 metal oxides Chemical class 0.000 description 2
- 239000000203 mixture Substances 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 239000003990 capacitor Substances 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 238000009795 derivation Methods 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 239000012780 transparent material Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
- G01N2021/8848—Polarisation of light
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Abstract
Description
Claims (10)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020140011619A KR20150090699A (ko) | 2014-01-29 | 2014-01-29 | 부품 검사 장치 |
KR10-2014-0011619 | 2014-01-29 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN104807491A true CN104807491A (zh) | 2015-07-29 |
CN104807491B CN104807491B (zh) | 2018-05-29 |
Family
ID=53692524
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201410366763.8A Active CN104807491B (zh) | 2014-01-29 | 2014-07-29 | 部件检查装置 |
Country Status (2)
Country | Link |
---|---|
KR (1) | KR20150090699A (zh) |
CN (1) | CN104807491B (zh) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110530870A (zh) * | 2018-05-24 | 2019-12-03 | 塞米西斯科株式会社 | 在腔体检查缺陷的系统及其方法 |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4648053A (en) * | 1984-10-30 | 1987-03-03 | Kollmorgen Technologies, Corp. | High speed optical inspection system |
JPS63124943A (ja) * | 1986-11-14 | 1988-05-28 | Omron Tateisi Electronics Co | 実装基板検査装置 |
JPS6474676A (en) * | 1987-09-16 | 1989-03-20 | Matsushita Electric Ind Co Ltd | Pattern recognizing device |
KR20040003151A (ko) * | 2002-06-29 | 2004-01-13 | 삼성테크윈 주식회사 | 부품 검사 장치 및, 방법 |
CN1151359C (zh) * | 1997-08-07 | 2004-05-26 | 西门子公司 | 用于元件的接线点的位置识别和/或共面性检查和/或间距检查的方法和设备 |
CN1564937A (zh) * | 2001-10-04 | 2005-01-12 | 阿森姆布里昂股份有限公司 | 在差的对比背景下金属物体的计算机视觉识别 |
CN101952774A (zh) * | 2008-03-06 | 2011-01-19 | Nec显示器解决方案株式会社 | 投影光学系统和使用投影光学系统的投影显示单元 |
-
2014
- 2014-01-29 KR KR1020140011619A patent/KR20150090699A/ko not_active Application Discontinuation
- 2014-07-29 CN CN201410366763.8A patent/CN104807491B/zh active Active
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4648053A (en) * | 1984-10-30 | 1987-03-03 | Kollmorgen Technologies, Corp. | High speed optical inspection system |
JPS63124943A (ja) * | 1986-11-14 | 1988-05-28 | Omron Tateisi Electronics Co | 実装基板検査装置 |
JPS6474676A (en) * | 1987-09-16 | 1989-03-20 | Matsushita Electric Ind Co Ltd | Pattern recognizing device |
CN1151359C (zh) * | 1997-08-07 | 2004-05-26 | 西门子公司 | 用于元件的接线点的位置识别和/或共面性检查和/或间距检查的方法和设备 |
CN1564937A (zh) * | 2001-10-04 | 2005-01-12 | 阿森姆布里昂股份有限公司 | 在差的对比背景下金属物体的计算机视觉识别 |
KR20040003151A (ko) * | 2002-06-29 | 2004-01-13 | 삼성테크윈 주식회사 | 부품 검사 장치 및, 방법 |
CN101952774A (zh) * | 2008-03-06 | 2011-01-19 | Nec显示器解决方案株式会社 | 投影光学系统和使用投影光学系统的投影显示单元 |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110530870A (zh) * | 2018-05-24 | 2019-12-03 | 塞米西斯科株式会社 | 在腔体检查缺陷的系统及其方法 |
Also Published As
Publication number | Publication date |
---|---|
KR20150090699A (ko) | 2015-08-06 |
CN104807491B (zh) | 2018-05-29 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
EXSB | Decision made by sipo to initiate substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C53 | Correction of patent of invention or patent application | ||
CB02 | Change of applicant information |
Address after: Gyeongnam Changwon City, South Korea Applicant after: HANWHA TECHWIN Co.,Ltd. Address before: Gyeongnam Changwon City, South Korea Applicant before: Samsung Techwin Co.,Ltd. |
|
COR | Change of bibliographic data |
Free format text: CORRECT: ADDRESS; FROM: Free format text: CORRECT: APPLICANT; FROM: SAMSUNG TAI KEWEI CO., LTD. TO: HANWHA TECHWIN CO., LTD. |
|
GR01 | Patent grant | ||
GR01 | Patent grant | ||
CP01 | Change in the name or title of a patent holder | ||
CP01 | Change in the name or title of a patent holder |
Address after: Gyeongnam Changwon City, South Korea Patentee after: HANWHA AEROSPACE Co.,Ltd. Address before: Gyeongnam Changwon City, South Korea Patentee before: HANWHA TECHWIN Co.,Ltd. |
|
TR01 | Transfer of patent right | ||
TR01 | Transfer of patent right |
Effective date of registration: 20190411 Address after: Gyeongnam Changwon City, South Korea Patentee after: Hanwha Precision Machinery Co.,Ltd. Address before: Gyeongnam Changwon City, South Korea Patentee before: HANWHA AEROSPACE Co.,Ltd. |