CN104737033A - 互补金属氧化物半导体x射线检测器 - Google Patents

互补金属氧化物半导体x射线检测器 Download PDF

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Publication number
CN104737033A
CN104737033A CN201380042145.1A CN201380042145A CN104737033A CN 104737033 A CN104737033 A CN 104737033A CN 201380042145 A CN201380042145 A CN 201380042145A CN 104737033 A CN104737033 A CN 104737033A
Authority
CN
China
Prior art keywords
cmos
detecting device
digital
scintillator layers
ray detector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201380042145.1A
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English (en)
Chinese (zh)
Inventor
J·Z·刘
D·E·巴克
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
General Electric Co
Original Assignee
General Electric Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by General Electric Co filed Critical General Electric Co
Publication of CN104737033A publication Critical patent/CN104737033A/zh
Pending legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2018—Scintillation-photodiode combinations
    • G01T1/20188—Auxiliary details, e.g. casings or cooling
    • G01T1/20189—Damping or insulation against damage, e.g. caused by heat or pressure
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2002—Optical details, e.g. reflecting or diffusing layers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G01T1/244—Auxiliary details, e.g. casings, cooling, damping or insulation against damage by, e.g. heat, pressure or the like

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Measurement Of Radiation (AREA)
CN201380042145.1A 2012-08-08 2013-08-08 互补金属氧化物半导体x射线检测器 Pending CN104737033A (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US13/569890 2012-08-08
US13/569,890 US9063238B2 (en) 2012-08-08 2012-08-08 Complementary metal-oxide-semiconductor X-ray detector
PCT/US2013/054074 WO2014025967A2 (en) 2012-08-08 2013-08-08 A complementary metal-oxide-semiconductor x-ray detector

Publications (1)

Publication Number Publication Date
CN104737033A true CN104737033A (zh) 2015-06-24

Family

ID=50065482

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201380042145.1A Pending CN104737033A (zh) 2012-08-08 2013-08-08 互补金属氧化物半导体x射线检测器

Country Status (5)

Country Link
US (1) US9063238B2 (https=)
JP (1) JP6554726B2 (https=)
CN (1) CN104737033A (https=)
DE (1) DE112013003951T5 (https=)
WO (1) WO2014025967A2 (https=)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110178052A (zh) * 2016-11-17 2019-08-27 通用电气公司 用于固态x射线检测器的闪烁体密封
CN111220632A (zh) * 2018-11-23 2020-06-02 西门子医疗有限公司 X射线探测器、成像装置和用于操作x射线探测器的方法

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WO2017106496A1 (en) * 2015-12-15 2017-06-22 Saint-Gobain Ceramics & Plastics, Inc. Scintillation device with moisture barrier
US20210048543A1 (en) * 2019-08-13 2021-02-18 Vieworks Co., Ltd. X-ray detector cover and x-ray detector having same

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EP1645891A1 (en) * 2004-10-08 2006-04-12 Services Petroliers Schlumberger Covering of a scintillation detector with a reflective coating
JP3858933B1 (ja) * 2005-08-31 2006-12-20 株式会社日立製作所 放射線検出回路およびそれを用いた核医学診断装置
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JP2009008403A (ja) * 2007-06-26 2009-01-15 Fujifilm Corp 放射線画像検出器
JP5018889B2 (ja) * 2007-10-26 2012-09-05 コニカミノルタエムジー株式会社 カセッテ型放射線画像固体検出器
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JP5317675B2 (ja) * 2008-12-22 2013-10-16 株式会社東芝 放射線検出器およびその製造方法
US7745797B1 (en) * 2009-03-03 2010-06-29 General Electric Co. Digital x-ray detector assembly
CN102870007A (zh) * 2010-04-26 2013-01-09 皇家飞利浦电子股份有限公司 具有改进的空间增益均匀性和分辨率的x射线探测器以及制造这种x射线探测器的方法
WO2012024512A2 (en) * 2010-08-18 2012-02-23 Array Optronix, Inc. Semiconductor photodetectors with integrated electronic control
JP2014009991A (ja) * 2012-06-28 2014-01-20 Fujifilm Corp 放射線画像検出装置及びその製造方法

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4220025B2 (ja) * 1998-09-02 2009-02-04 浜松ホトニクス株式会社 放射線イメージセンサ及びその製造方法
US6744052B1 (en) * 1999-01-21 2004-06-01 Sture Petersson X-ray pixel detector device and fabrication method
US6404854B1 (en) * 2000-06-26 2002-06-11 Afp Imaging Corporation Dental x-ray imaging system
CN101142497A (zh) * 2005-03-16 2008-03-12 皇家飞利浦电子股份有限公司 具有像素内处理电路的x射线检测器
US20090181491A1 (en) * 2006-11-24 2009-07-16 Tower Semiconductor Ltd. High-Resolution Integrated X-Ray CMOS Image Sensor

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110178052A (zh) * 2016-11-17 2019-08-27 通用电气公司 用于固态x射线检测器的闪烁体密封
CN110178052B (zh) * 2016-11-17 2023-09-05 通用电气公司 用于固态x射线检测器的闪烁体密封
CN111220632A (zh) * 2018-11-23 2020-06-02 西门子医疗有限公司 X射线探测器、成像装置和用于操作x射线探测器的方法

Also Published As

Publication number Publication date
DE112013003951T5 (de) 2015-05-07
JP6554726B2 (ja) 2019-08-07
WO2014025967A2 (en) 2014-02-13
US20140042328A1 (en) 2014-02-13
US9063238B2 (en) 2015-06-23
JP2015529816A (ja) 2015-10-08
WO2014025967A3 (en) 2014-04-03

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Application publication date: 20150624