CN104737033A - 互补金属氧化物半导体x射线检测器 - Google Patents

互补金属氧化物半导体x射线检测器 Download PDF

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Publication number
CN104737033A
CN104737033A CN201380042145.1A CN201380042145A CN104737033A CN 104737033 A CN104737033 A CN 104737033A CN 201380042145 A CN201380042145 A CN 201380042145A CN 104737033 A CN104737033 A CN 104737033A
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CN
China
Prior art keywords
detecting device
cmos
digital
scintillator layers
ray detector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
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CN201380042145.1A
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English (en)
Chinese (zh)
Inventor
J·Z·刘
D·E·巴克
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General Electric Co
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General Electric Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Application filed by General Electric Co filed Critical General Electric Co
Publication of CN104737033A publication Critical patent/CN104737033A/zh
Pending legal-status Critical Current

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16Measuring radiation intensity
    • G01T1/20Measuring radiation intensity with scintillation detectors
    • G01T1/2018Scintillation-photodiode combinations
    • G01T1/20188Auxiliary details, e.g. casings or cooling
    • G01T1/20189Damping or insulation against damage, e.g. caused by heat or pressure
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16Measuring radiation intensity
    • G01T1/20Measuring radiation intensity with scintillation detectors
    • G01T1/2002Optical details, e.g. reflecting or diffusing layers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16Measuring radiation intensity
    • G01T1/24Measuring radiation intensity with semiconductor detectors
    • G01T1/244Auxiliary details, e.g. casings, cooling, damping or insulation against damage by, e.g. heat, pressure or the like

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Measurement Of Radiation (AREA)
CN201380042145.1A 2012-08-08 2013-08-08 互补金属氧化物半导体x射线检测器 Pending CN104737033A (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US13/569890 2012-08-08
US13/569,890 US9063238B2 (en) 2012-08-08 2012-08-08 Complementary metal-oxide-semiconductor X-ray detector
PCT/US2013/054074 WO2014025967A2 (en) 2012-08-08 2013-08-08 A complementary metal-oxide-semiconductor x-ray detector

Publications (1)

Publication Number Publication Date
CN104737033A true CN104737033A (zh) 2015-06-24

Family

ID=50065482

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201380042145.1A Pending CN104737033A (zh) 2012-08-08 2013-08-08 互补金属氧化物半导体x射线检测器

Country Status (5)

Country Link
US (1) US9063238B2 (enExample)
JP (1) JP6554726B2 (enExample)
CN (1) CN104737033A (enExample)
DE (1) DE112013003951T5 (enExample)
WO (1) WO2014025967A2 (enExample)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110178052A (zh) * 2016-11-17 2019-08-27 通用电气公司 用于固态x射线检测器的闪烁体密封
CN111220632A (zh) * 2018-11-23 2020-06-02 西门子医疗有限公司 X射线探测器、成像装置和用于操作x射线探测器的方法

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EP3391089A4 (en) * 2015-12-15 2019-07-10 Saint-Gobain Ceramics&Plastics, Inc. SCREENING DEVICE WITH MOISTURIZING BARRIER
US20210048543A1 (en) * 2019-08-13 2021-02-18 Vieworks Co., Ltd. X-ray detector cover and x-ray detector having same

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RU2561756C2 (ru) * 2010-04-26 2015-09-10 Конинклейке Филипс Электроникс Н.В. Детектор рентгеновского излучения с повышенными пространственной однородностью усиления и разрешением и способ изготовления детектора рентгеновского излучения
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JP4220025B2 (ja) * 1998-09-02 2009-02-04 浜松ホトニクス株式会社 放射線イメージセンサ及びその製造方法
US6744052B1 (en) * 1999-01-21 2004-06-01 Sture Petersson X-ray pixel detector device and fabrication method
US6404854B1 (en) * 2000-06-26 2002-06-11 Afp Imaging Corporation Dental x-ray imaging system
CN101142497A (zh) * 2005-03-16 2008-03-12 皇家飞利浦电子股份有限公司 具有像素内处理电路的x射线检测器
US20090181491A1 (en) * 2006-11-24 2009-07-16 Tower Semiconductor Ltd. High-Resolution Integrated X-Ray CMOS Image Sensor

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110178052A (zh) * 2016-11-17 2019-08-27 通用电气公司 用于固态x射线检测器的闪烁体密封
CN110178052B (zh) * 2016-11-17 2023-09-05 通用电气公司 用于固态x射线检测器的闪烁体密封
CN111220632A (zh) * 2018-11-23 2020-06-02 西门子医疗有限公司 X射线探测器、成像装置和用于操作x射线探测器的方法

Also Published As

Publication number Publication date
DE112013003951T5 (de) 2015-05-07
JP2015529816A (ja) 2015-10-08
US20140042328A1 (en) 2014-02-13
US9063238B2 (en) 2015-06-23
WO2014025967A3 (en) 2014-04-03
WO2014025967A2 (en) 2014-02-13
JP6554726B2 (ja) 2019-08-07

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Application publication date: 20150624

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