CN104603931A - FinFET电容器及其制造方法 - Google Patents

FinFET电容器及其制造方法 Download PDF

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CN104603931A
CN104603931A CN201380045754.2A CN201380045754A CN104603931A CN 104603931 A CN104603931 A CN 104603931A CN 201380045754 A CN201380045754 A CN 201380045754A CN 104603931 A CN104603931 A CN 104603931A
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capacitor
terminal
grid
semiconductor substrate
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R·张
L·G·舒亚-伊恩
S·顾
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Qualcomm Inc
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Abstract

公开了可以用与FinFET兼容的工艺制造的电容器。该电容器包括在基板上形成的鳍(506,508),其中该鳍由电容器介电材料彼此分隔开。有相同的极性的鳍通过盖连接(510,512)互相连接。

Description

FinFET电容器及其制造方法
技术领域
本公开一般涉及鳍式无源组件。更具体地,本公开涉及与FinFET工艺技术兼容的电容器。
背景技术
在移动通信和移动计算系统中,对集成系统中的数字和非数字功能性的组合需求正在促使系统级集成中的两个趋势。
系统级集成中的一个趋势为片上系统(SOC)的概念。在片上系统中,功能(例如,数字功能)被集成在芯片上。在这些系统中,可在芯片上集成的数字功能的数目随着芯片上可用的晶体管的数目的增加而继续增加。系统级集成中的另一趋势为基于半导体的器件的功能多样化。取代在一块芯片上实现诸器件,这些器件被实现在多个芯片上并且集成到一个封装中,这被称为系统级封装(SiP)。
在片上系统以及系统级封装中,用金属层来构造用于提供数字功能的嵌入式电容器。此外,在典型系统中,常规的电容器不紧邻有源器件。这导致较大的面积消耗和较多的寄生关系。常规的电容器工艺技术还与二维(2D)工艺相关联。FinFET工艺技术与三维(3D)工艺相关联。
概述
根据本公开的一方面,给出了一种电容器。该电容器包括半导体基板。该电容器还包括第一端子,该第一端子具有布置在半导体基板的表面上的鳍。该电容器进一步包括布置在鳍上的介电层。该电容器还进一步包括第二端子,该第二端子具有与鳍紧邻且毗邻地布置的与FinFET兼容的高K金属栅极。
根据本公开的另一方面,一种电容器包括半导体基板。该电容器还包括第一端子,该第一端子包括布置在半导体基板的表面上的第一组栅极。该电容器进一步包括第二端子,该第二端子包括布置在半导体基板的表面上的第二组栅极。该电容器还进一步包括布置在半导体基板的表面上的、位于第一组栅极与第二组栅极之间的鳍。这些鳍可以用介电薄膜来涂敷。
根据又一方面,一种电容器包括半导体基板。该电容器还包括第一端子,该第一端子具有布置在半导体基板的表面上的第一组鳍。该电容器进一步包括第二端子,该第二端子具有布置在半导体基板的表面上的第二组鳍。该电容器还进一步包括布置在第一组鳍与第二组鳍之间的介电层。
根据又一方面,给出了一种用于制造FinFET电容器的方法。该方法包括制造第一端子,该第一端子包括半导体基板的表面上的鳍。该方法还包括在鳍上沉积介电层。该方法进一步包括沉积与鳍紧邻且毗邻的与FinFET兼容的高K金属栅极。
根据另一方面,给出了一种用于制造FinFET电容器的方法。该方法包括制造第一端子,该第一端子具有布置在半导体基板的表面上的第一组栅极。该方法还包括制造第二端子,该第二端子具有布置在半导体基板的表面上的第二组栅极。该方法进一步包括制造布置在半导体基板的表面上的、位于第一组栅极与第二组栅极之间的鳍。该方法还包括用介电薄膜来涂敷这些鳍。
根据又一方面,给出了一种用于制造FinFET电容器的方法。该方法包括制造第一端子,该第一端子包括布置在半导体基板的表面上的第一组鳍。该方法还包括制造第二端子,该第二端子包括布置在半导体基板的表面上的第二组鳍。该方法还包括制造布置在第一组鳍与第二组鳍之间的介电层。
根据又一方面,给出了一种电容器。该电容器包括用于支撑至少一个鳍的装置。该电容器还包括布置在支撑装置的表面上的端子。该端子可以包括鳍。该电容器进一步包括布置在该端子上的用于绝缘的装置。该电容器还具有与该端子紧邻且毗邻地布置的导电栅极。
根据又一方面,给出了一种电容器。该电容器包括用于支撑鳍的装置。该电容器还包括第一端子,该第一端子包括布置在支撑装置的表面上的鳍。该电容器进一步包括第二端子,该第二端子也可包括布置在支撑装置的表面上的鳍。该电容器还具有布置在第一组鳍与第二组鳍之间的用于绝缘的装置。
这已较宽泛地勾勒出本公开的特征和技术优势以便下面的详细描述可以被更好地理解。本发明的其他特征和优点将在下文描述。本领域技术人员应该领会,本发明可容易地被用作改动或设计用于实施与本发明相同的目的的其他结构的基础。本领域技术人员还应认识到,这样的等效构造并不脱离所附权利要求中所阐述的本发明的教导。被认为是本发明的特性的新颖特征在其组织和操作方法两方面连同进一步的目的和优点在结合附图来考虑以下描述时将被更好地理解。然而要清楚理解的是,提供每一幅附图均仅用于解说和描述目的,且无意作为对本发明的限定的定义。
附图简述
本公开的特征、本质和优点将因以下结合附图阐述的具体描述而变得更加明显。
图1解说了根据本公开的一方面的FinFET工艺流程。
图2解说了从FinFET工艺流程制造的典型的电容器。
图3解说了根据本公开的一方面的从FinFET工艺流程制造的栅极-多晶(gate-poly)电容器。
图4解说了从FinFET工艺流程制造的典型的电容器。
图5解说了根据本公开的一方面的从FinFET工艺流程制造的栅极-栅极(gate-gate)电容器。
图6解说了根据本公开的一方面的从FinFET工艺流程制造的多晶-多晶(poly-poly)电容器。
图7-9解说了根据本公开的各个方面的用于制造FinFET电容器的方法。
图10解说了其中可有利地采用本公开的配置的示例性无线通信系统。
图11是解说根据本公开一方面的用于半导体组件的电路、布局以及逻辑设计的设计工作站的框图。
详细描述
以下结合附图阐述的详细描述旨在作为各种配置的描述,而无意表示可实践本文中所描述的概念的仅有的配置。本详细描述包括具体细节以便提供对各种概念的透彻理解。然而,对于本领域技术人员将显而易见的是,没有这些具体细节也可实践这些概念。在一些实例中,以框图形式示出众所周知的结构和组件以避免湮没此类概念。
本公开的一个方面涉及鳍式无源组件,诸如与FinFET工艺技术兼容的电容器。此外,本公开的一个方面提供一种FinFET电容器,该FinFET电容器具有比金属-绝缘体-金属(MiM)或金属-氧化物-金属(MoM)电容器的介电常数显著更高的介电常数(K)。较高的介电常数可以是由于与较低K互连技术相比的高K金属栅极工艺而导致的。另外,FinFET电容器的一种配置呈现阳极与阴极之间较小的距离。具体地,在这种配置中,阳极与阴极之间的间距受到间隔物厚度的限制。此外,本公开的一个方面的FinFET电容器可被放置成与有源器件紧邻并且是可缩放的。即,根据本公开的一个方面,鳍式无源组件的较小高度可被放大,并且2D几何形状可被缩小以增加FinFET电容器的电容值。例如,FinFET无源组件(诸如FinFET电容器)的所提及方面与如图1中解说的FinFET工艺流程兼容。
图1解说了FinFET工艺流程100的示例。该工艺流程始于绝缘体上覆硅(SOI)基板101。在SOI基板101上对半导体(例如,硅(Si))鳍103进行图案化。在半导体鳍103被图案化之后,该工艺执行多晶硅栅极沉积/光刻104以在SOI基板101上沉积多晶硅105和电阻器106。接下来,该工艺执行栅极蚀刻和间隔物形成107以蚀刻栅极并且创建氮化硅(Si3N4)间隔物108。最后,该工艺执行源极-漏极注入和快速热退火硅化109,以使得在各个表面上沉积硅化物(例如,硅化镍(NiSi))110。
图2解说了从工艺流程(诸如图1中所解说的工艺流程)制造的常规的FinFET栅极-多晶(gate-poly)电容器200。如图2中所解说的,常规的FinFET栅极-多晶电容器200包括基板204、栅极206和鳍202。
图3解说了根据本公开的一个方面的FinFET栅极-多晶电容器300。代表性地,FinFET栅极-多晶电容器300包括半导体基板302、布置在半导体基板302的表面上的鳍304、以及栅极306。如图3中所解说的,栅极306布置在半导体基板302的表面上并且与鳍304紧邻且毗邻地限定。图3进一步解说了在鳍304和栅极306的表面上限定的盖308,以完成FinFET栅极-多晶电容器300。
在图3的配置中,鳍304可以提供FinFET栅极-多晶电容器300的第一端子并且栅极306可以提供FinFET栅极-多晶电容器300的第二端子。根据一些方面,盖308可以是介电层。此外,可以在鳍304周围布置氧化物。此外,栅极306可以是与FinFET兼容的高介电常数(K)金属栅极。最后,沟道基板可被掺杂以降低灵敏度。
图4解说了从工艺流程(诸如图1中所解说的工艺流程)制造的常规的FinFET栅极-栅极电容器400。如图4中所解说的,常规的FinFET栅极-栅极电容器400包括半导体基板402、鳍404和栅极406。如图4中进一步解说的,常规的FinFET栅极-栅极电容器400包括连接所有栅极406的顶部栅极连接。应当注意,常规的FinFET栅极-栅极电容器400还可以与图2的常规的FinFET栅极-多晶电容器200类似。
图5解说了根据本公开的一方面的FinFET栅极-栅极电容器500。如图5中所解说的,FinFET栅极-栅极电容器500包括半导体基板502、布置在半导体基板502的表面上的鳍504、第一组栅极506和第二组栅极508。根据图5的配置,FinFET栅极-栅极电容器500被蚀刻以为单独的栅极控制而移除顶部栅极连接;此外,第一盖连接512布置在第一组栅极506的末端处并且第二盖连接510布置在第二组栅极508的末端处。在这种配置中,分别在栅极506和508的末端处的第一盖连接512和第二盖连接514可以充当FinFET栅极-栅极电容器500的电容器端子。根据一些方面,可以在鳍504周围布置氧化物。另外,栅极506和508可以是高K金属栅极。
图6解说了根据本公开的另一方面的FinFET多晶-多晶电容器600。如图6中解说的,FinFET多晶-多晶电容器600包括半导体基板602、第一组鳍604和第二组鳍606。还可提供第三组鳍608和栅极610以制造FinFET晶体管。代表性地,介电层616分别布置在第一组鳍604与第二组鳍606之间。在一种配置中,第一盖连接612布置在第一组鳍604的末端处并且第二盖连接614布置在第二组鳍606的末端处。在这种配置中,第一组鳍604和第二组鳍606的末端分别充当FinFET多晶-多晶电容器600的电容器端子。根据一些方面,可以在鳍604、606和608周围布置氧化物。此外,介电层可以是氮化硅。在这种配置中,栅极610不是电容器的一部分。确切而言,常规的包括栅极610和第三组鳍608的FinFET晶体管是在与该电容器相同的基板602上用相同的工艺流程来制造的。
应当注意,各个方面不限于解说各个方面的栅极和鳍的数目。栅极和鳍的数目可被恰当地调整。
图7解说了根据本公开的一方面的用于制造FinFET电容器的方法700。在框702,在基板的表面上制造具有至少一个鳍的第一端子。在框704,在鳍上沉积介电层。在框706,与鳍紧邻且毗邻地沉积FinFET兼容的高K金属栅极。例如,图3示出了栅极306布置在半导体基板302的表面上并且与鳍304紧邻且毗邻地限定。另外,在鳍304和栅极306的表面上限定盖308,以完成FiFET栅极-多晶电容器300。在这种配置中,鳍304提供FinFET栅极-多晶电容器300的第一端子并且栅极306可以提供FinFET栅极-多晶电容器300的第二端子。
图8解说了根据本公开的另一方面的用于制造FinFET电容器的方法800。在框802,在基板的表面上制造第一端子。例如,如图5中所示,第一端子包括布置在半导体基板502的表面上的第一组栅极506。在框804,在基板的表面上制造第二端子。如图5中所示,第二端子包括布置在半导体基板502的表面上的第二组栅极508。在框806,在半导体基板上制造鳍。如图5中所示,在半导体基板502的表面上、在第一组栅极506与第二组栅极508之间布置鳍504。如图5中进一步示出的,在第二组栅极508的末端处布置第二盖连接510。在这种配置中,分别在栅极506和508的末端处的第一盖连接512和第二盖连接514可以充当FinFET栅极-栅极电容器500的电容器端子。在框808,用介电薄膜(诸如氧化物)来涂敷鳍。
图9解说了根据本公开的又一方面的用于制造FinFET电容器的方法900。在框902,在半导体基板的表面上制造第一端子。例如,如图6中所示,第一端子包括布置在半导体基板602的表面上的第一组鳍604。在框904,在半导体基板的表面上制造第二端子。如图6中所示,第二端子包括布置在半导体基板602的表面上的第二组鳍606。在框906,制造介电层(例如,氧化物)。
例如,如图6中所示,在第一组鳍604与第二组鳍606之间布置介电层616。在这种配置中,第一盖连接612布置在第一组鳍604的末端处并且第二盖连接614布置在第二组鳍606的末端处。在这种配置中,第一组鳍604和第二组鳍606的末端分别充当FinFET多晶-多晶电容器600的电容器端子。
图10示出其中可有利地采用本公开的一方面的示例性无线通信系统1000。出于解说目的,图10示出了三个远程单元1020、1030和1050以及两个基站1040。将认识到,无线通信系统可具有多得多的远程单元和基站。远程单元1020、1030和1050包括FinFET电容器1025A、1025B、1025C。图10示出从基站1040到远程单元1020、1030、和1050的前向链路信号1080,以及从远程单元1020、1030、和1050到基站1040的反向链路信号1090。
在图10中,远程单元1020被示为移动电话,远程单元1030被示为便携式计算机,而远程单元1050被示为无线本地环路系统中的位置固定的远程单元。例如,远程单元可以是蜂窝电话、手持式个人通信系统(PCS)单元、机顶盒、音乐播放器、视频播放器、娱乐单元、导航设备、便携式数据单元(诸如个人数据助理)或者位置固定的数据单元(诸如仪表读数装备)。尽管图10解说了可采用根据本公开的教导的FinFET电容器1025A、1025B、1025C,但本公开并不限于所解说的这些示例性单元。例如,根据本公开的诸方面的FinFET电容器可被合适地用在任何设备中。
图11是解说用于半导体组件(诸如以上公开的FinFET电容器)的电路、布局以及逻辑设计的设计工作站的框图。设计工作站1100包括硬盘1101,该硬盘1101包含操作系统软件、支持文件以及设计软件,诸如Cadence或OrCAD。设计工作站1100还包括促成对电路1111或半导体组件1112(诸如FinFET电容器)的设计的显示器1102。提供存储介质1104以用于有形地存储电路设计1111或半导体组件1112。电路设计1111或半导体组件1112可以文件格式(诸如GDSII或GERBER)存储在存储介质1104上。存储介质1104可以是CD-ROM、DVD、硬盘、闪存、或其他合适的设备。此外,设计工作站1100包括用于从存储介质1104接受输入或将输出写入存储介质1104的驱动装置1103。
存储介质1104上记录的数据可指定逻辑电路配置、用于光刻掩模的图案数据、或者用于串写工具(诸如电子束光刻)的掩模图案数据。该数据可进一步包括与逻辑仿真相关联的逻辑验证数据,诸如时序图或网电路。在存储介质1104上提供数据通过减少了用于设计半导体晶片的工艺数目来促成对电路设计1111或半导体组件1112的设计。
在一种配置中,电容器包括支撑装置。在一个方面,该支撑装置可以是配置成执行由前述传导装置叙述的功能的基板302、502和602。该电容器还被配置成包括用于绝缘的装置。在一个方面,该绝缘装置可以是被配置成执行由绝缘装置所述的功能的介电层。在另一方面,前述装置可以是被配置成执行由前述装置所述的功能的任何模块或任何设备。
在另一配置中,前述装置可以是被配置成执行由前述装置所叙述的功能的任何模块或任何设备。尽管已阐述了特定装置,但是本领域技术人员将可领会,并非所有所公开的装置都是实践所公开的配置所必需的。此外,某些众所周知的装置未被描述,以便保持专注于本公开。
本文中所描述的方法体系取决于应用可藉由各种手段来实现。例如,这些方法体系可在硬件、固件、软件或其任何组合中实现。对于硬件实现,这些处理单元可以在一个或多个专用集成电路(ASIC)、数字信号处理器(DSP)、数字信号处理器件(DSPD)、可编程逻辑器件(PLD)、现场可编程门阵列(FPGA)、处理器、控制器、微控制器、微处理器、电子器件、设计成执行本文中所描述功能的其他电子单元或其组合内实现。
对于固件和/或软件实现,这些方法体系可以用执行本文所描述功能的模块(例如,规程、函数等等)来实现。有形地体现指令的任何机器或计算机可读介质可用于实现本文中所描述的方法体系。例如,软件代码可被存储在存储器中并由处理器执行。当由处理器执行时,执行中的软件代码生成实现本文所呈现的教导的不同方面的各种方法体系和功能性的操作环境。存储器可以实现在处理器内部或处理器外部。如本文所使用的,术语“存储器”是指任何类型的长期、短期、易失性、非易失性、或其他存储器,且并不限于任何特定类型的存储器或特定数目的存储器、或记忆存储在其上的介质类型。
存储有定义本文所述方法体系和功能的软件代码的机器或计算机可读介质包括物理计算机存储介质。存储介质可以是能被计算机访问的任何可用介质。作为示例而非限制,这些计算机可读介质可包括RAM、ROM、EEPROM、CD-ROM或其它光盘存储、磁盘存储或其它磁存储设备、或可被用来存储指令或数据结构形式的期望程序代码且可被计算机访问的任何其它介质。如本文所使用的,盘(disk)和/或碟(disc)包括压缩碟(CD)、激光碟、光碟、数字多用碟(DVD)、软盘和蓝光碟,其中盘常常磁性地再现数据而碟用激光来光学地再现数据。上述的组合也应被包括在计算机可读介质的范围内。
除了存储在计算机可读介质上,指令和/或数据还可作为包括在通信装置中的传输介质上的信号来提供。例如,通信装置可包括具有指示指令和数据的信号的收发机。这些指令和数据被配置成使一个或多个处理器实现权利要求中叙述的功能。
尽管已详细描述了本教导及其优点,但是应当理解,能在本文中作出各种改变、替代和变更而不会脱离如由所附权利要求所定义的本教导的技术。而且,本申请的范围并非旨在被限定于说明书中所描述的过程、机器、制造、物质组成、装置、方法和步骤的特定方面。因为本领域普通技术人员将容易地从本公开领会到,根据本教导,可以利用现存或今后开发的与本文所描述的相应方面执行基本相同的功能或达成基本相同的结果的过程、机器、制造、物质组成、装置、方法或步骤。因此,所附权利要求旨在将这样的过程、机器、制造、物质组成、装置、方法或步骤包括在其范围内。

Claims (25)

1.一种电容器,包括:
半导体基板;
第一端子,包括布置在所述半导体基板的表面上的至少一个鳍;
布置在所述至少一个鳍上的介电层;以及
第二端子,包括与所述至少一个鳍紧邻且毗邻地布置的FinFET兼容的高K金属栅极。
2.如权利要求1所述的电容器,其特征在于,所述至少一个鳍被掺杂。
3.如权利要求1所述的电容器,其特征在于,所述电容器被集成到移动电话、机顶盒、音乐播放器、视频播放器、娱乐单元、导航设备、计算机、手持式个人通信系统(PCS)单元、便携式数据单元和/或固定位置数据单元中。
4.一种电容器,包括:
半导体基板;
第一端子,包括布置在所述半导体基板的表面上的第一多个栅极;
第二端子,包括布置在所述半导体基板的所述表面上的第二多个栅极;以及
布置在所述半导体基板的所述表面上的、位于所述第一多个栅极与所述第二多个栅极之间的多个鳍,所述多个鳍涂敷有介电薄膜。
5.如权利要求4所述的电容器,其特征在于,所述电容器被集成到移动电话、机顶盒、音乐播放器、视频播放器、娱乐单元、导航设备、计算机、手持式个人通信系统(PCS)单元、便携式数据单元和/或固定位置数据单元中。
6.一种电容器,包括:
半导体基板;
第一端子,包括布置在所述半导体基板的表面上的第一多个鳍;
第二端子,包括布置在所述半导体基板的所述表面上的第二多个鳍;以及
布置在所述第一多个鳍与所述第二多个鳍之间的介电层。
7.如权利要求6所述的电容器,其特征在于,所述介电层包括氮化硅。
8.如权利要求6所述的电容器,其特征在于,所述电容器被集成到移动电话、机顶盒、音乐播放器、视频播放器、娱乐单元、导航设备、计算机、手持式个人通信系统(PCS)单元、便携式数据单元和/或固定位置数据单元中。
9.一种制造FinFET电容器的方法,所述方法包括:
在半导体基板的表面上制造包括至少一个鳍的第一端子;
在所述至少一个鳍上沉积介电层;以及
与所述至少一个鳍紧邻且毗邻地沉积FinFET兼容的高K金属栅极。
10.如权利要求9所述的方法,其特征在于,进一步包括掺杂所述至少一个鳍。
11.如权利要求9所述的方法,其特征在于,进一步包括将所述FinFET电容器集成到移动电话、机顶盒、音乐播放器、视频播放器、娱乐单元、导航设备、计算机、手持式个人通信系统(PCS)单元、便携式数据单元、和/或位置固定的数据单元中。
12.一种制造FinFET电容器的方法,所述方法包括:
制造第一端子,所述第一端子包括布置在半导体基板的表面上的第一多个栅极;
制造第二端子,所述第二端子包括布置在所述半导体基板的所述表面上的第二多个栅极;
制造布置在所述半导体基板的所述表面上的、位于所述第一组栅极与所述第二组栅极之间的多个鳍;以及
用介电薄膜来涂敷所述多个鳍。
13.如权利要求12所述的方法,其特征在于,进一步包括:
在所述第一多个栅极的末端处制造第一盖;以及
在所述第二多个栅极的末端处、在所述第一盖的远端制造第二盖。
14.如权利要求12所述的方法,其特征在于,进一步包括将所述FinFET电容器集成到移动电话、机顶盒、音乐播放器、视频播放器、娱乐单元、导航设备、计算机、手持式个人通信系统(PCS)单元、便携式数据单元、和/或位置固定的数据单元中。
15.一种制造FinFET电容器的方法,所述方法包括:
制造第一端子,所述第一端子包括布置在半导体基板的表面上的第一多个鳍;
制造第二端子,所述第二端子包括布置在所述半导体基板的所述表面上的第二多个鳍;以及
制造布置在所述第一多个鳍与所述第二多个鳍之间的介电层。
16.如权利要求15所述的方法,其特征在于,进一步包括将所述FinFET电容器集成到移动电话、机顶盒、音乐播放器、视频播放器、娱乐单元、导航设备、计算机、手持式个人通信系统(PCS)单元、便携式数据单元、和/或位置固定的数据单元中。
17.一种电容器,包括:
用于支撑至少一个鳍的装置;
布置在所述支撑装置的表面上的端子,所述端子包括所述至少一个鳍;
布置在所述端子上的用于绝缘的装置;以及
与所述端子紧邻且毗邻地布置的导电栅极。
18.如权利要求17所述的电容器,其特征在于,所述电容器被集成到移动电话、机顶盒、音乐播放器、视频播放器、娱乐单元、导航设备、计算机、手持式个人通信系统(PCS)单元、便携式数据单元和/或固定位置数据单元中。
19.一种电容器,包括:
用于支撑多个鳍的装置;
第一端子,包括布置在所述支撑装置的表面上的第一多个鳍;
第二端子,包括布置在所述支撑装置的所述表面上的第二多个鳍;以及
布置在所述第一多个鳍与所述第二多个鳍之间的用于绝缘的装置。
20.如权利要求19所述的电容器,其特征在于,所述用于绝缘的装置包括氮化硅。
21.如权利要求19所述的电容器,其特征在于,所述电容器被集成到移动电话、机顶盒、音乐播放器、视频播放器、娱乐单元、导航设备、计算机、手持式个人通信系统(PCS)单元、便携式数据单元和/或固定位置数据单元中。
22.一种制造FinFET电容器的方法,所述方法包括:
在半导体基板的表面上制造包括至少一个鳍的第一端子的步骤;
在所述至少一个鳍上沉积介电层的步骤;以及
与所述至少一个鳍紧邻且毗邻地沉积FinFET兼容的高K金属栅极的步骤。
23.如权利要求22所述的方法,其特征在于,进一步包括将所述FinFET电容器集成到移动电话、机顶盒、音乐播放器、视频播放器、娱乐单元、导航设备、计算机、手持式个人通信系统(PCS)单元、便携式数据单元、和/或位置固定的数据单元中的步骤。
24.一种制造FinFET电容器的方法,所述方法包括:
制造第一端子的步骤,所述第一端子包括布置在半导体基板的表面上的第一多个栅极;
制造第二端子的步骤,所述第二端子包括布置在所述半导体基板的所述表面上的第二多个栅极;
制造布置在所述半导体基板的所述表面上的、位于所述第一组栅极与所述第二组栅极之间的多个鳍的步骤;以及
用介电薄膜来涂敷所述多个鳍的步骤。
25.如权利要求24所述的方法,其特征在于,进一步包括将所述FinFET电容器集成到移动电话、机顶盒、音乐播放器、视频播放器、娱乐单元、导航设备、计算机、手持式个人通信系统(PCS)单元、便携式数据单元、和/或位置固定的数据单元中的步骤。
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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106972016A (zh) * 2015-10-02 2017-07-21 三星电子株式会社 半导体器件
CN107683528A (zh) * 2015-05-08 2018-02-09 思睿逻辑国际半导体有限公司 由诸如finfet的薄垂直半导体结构形成的高密度电容器

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9142548B2 (en) 2012-09-04 2015-09-22 Qualcomm Incorporated FinFET compatible capacitor circuit
US9373618B1 (en) 2015-09-04 2016-06-21 International Business Machines Corporation Integrated FinFET capacitor
US9748226B1 (en) 2016-02-27 2017-08-29 Taiwan Semiconductor Manufacturing Co., Ltd. Decoupling capacitor
US9633996B1 (en) 2016-03-25 2017-04-25 Qualcomm Incorporated High density area efficient thin-oxide decoupling capacitor using conductive gate resistor
US9985097B2 (en) 2016-06-30 2018-05-29 International Business Machines Corporation Integrated capacitors with nanosheet transistors
US9653480B1 (en) 2016-09-22 2017-05-16 International Business Machines Corporation Nanosheet capacitor
US10056503B2 (en) 2016-10-25 2018-08-21 International Business Machines Corporation MIS capacitor for finned semiconductor structure
US10497794B1 (en) * 2018-10-09 2019-12-03 Nxp Usa, Inc. Fin field-effect transistor (FinFet) capacitor structure for use in integrated circuits
US10727224B1 (en) 2019-04-10 2020-07-28 Nxp Usa, Inc. Decoupling capacitors using regularity finFET structures and methods for making same

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6094335A (en) * 1998-10-09 2000-07-25 Advanced Micro Devices, Inc. Vertical parallel plate capacitor
US20040262698A1 (en) * 2003-06-25 2004-12-30 International Business Machines Corporation High-density finfet integration scheme
CN1770471A (zh) * 2004-11-05 2006-05-10 国际商业机器公司 鳍型场效应晶体管及其制造方法
US20070200161A1 (en) * 2006-02-27 2007-08-30 Nowak Edward J High performance tapered varactor
US20080029821A1 (en) * 2004-07-12 2008-02-07 Nec Corporation Semiconductor Device and Method for Production Thereof
US20080173913A1 (en) * 2007-01-12 2008-07-24 Kabushiki Kaisha Toshiba Semiconductor device
CN101661932A (zh) * 2008-08-25 2010-03-03 联发科技股份有限公司 集成电容
CA2806689A1 (en) * 2010-08-04 2012-02-09 Harris Corporation Vertical capacitors formed on semiconducting substrates

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6995412B2 (en) 2002-04-12 2006-02-07 International Business Machines Corporation Integrated circuit with capacitors having a fin structure
US7115947B2 (en) * 2004-03-18 2006-10-03 International Business Machines Corporation Multiple dielectric finfet structure and method
US20070117311A1 (en) 2005-11-23 2007-05-24 Advanced Technology Development Facility, Inc. Three-dimensional single transistor semiconductor memory device and methods for making same
US7696040B2 (en) 2007-05-30 2010-04-13 International Business Machines Corporation Method for fabrication of fin memory structure
JP2010040630A (ja) * 2008-08-01 2010-02-18 Toshiba Corp 半導体装置
US8679960B2 (en) * 2009-10-14 2014-03-25 Varian Semiconductor Equipment Associates, Inc. Technique for processing a substrate having a non-planar surface
US8519481B2 (en) * 2009-10-14 2013-08-27 Taiwan Semiconductor Manufacturing Company, Ltd. Voids in STI regions for forming bulk FinFETs
US8420476B2 (en) 2010-05-27 2013-04-16 International Business Machines Corporation Integrated circuit with finFETs and MIM fin capacitor
US8860107B2 (en) 2010-06-03 2014-10-14 International Business Machines Corporation FinFET-compatible metal-insulator-metal capacitor
DE102011003232B4 (de) * 2011-01-27 2013-03-28 GLOBALFOUNDRIES Dresden Module One Ltd. Liability Company & Co. KG Herstellverfahren für Metallgateelektrodenstrukturen mit großem ε, die durch ein Austauschgateverfahren auf der Grundlage einer verbesserten Ebenheit von Platzhaltermaterialien hergestellt sind
US9893163B2 (en) * 2011-11-04 2018-02-13 Taiwan Semiconductor Manufacturing Company, Ltd. 3D capacitor and method of manufacturing same
US8860148B2 (en) * 2012-04-11 2014-10-14 Taiwan Semiconductor Manufacturing Company, Ltd. Structure and method for FinFET integrated with capacitor
US9142548B2 (en) 2012-09-04 2015-09-22 Qualcomm Incorporated FinFET compatible capacitor circuit

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6094335A (en) * 1998-10-09 2000-07-25 Advanced Micro Devices, Inc. Vertical parallel plate capacitor
US20040262698A1 (en) * 2003-06-25 2004-12-30 International Business Machines Corporation High-density finfet integration scheme
US20080029821A1 (en) * 2004-07-12 2008-02-07 Nec Corporation Semiconductor Device and Method for Production Thereof
CN1770471A (zh) * 2004-11-05 2006-05-10 国际商业机器公司 鳍型场效应晶体管及其制造方法
US20070200161A1 (en) * 2006-02-27 2007-08-30 Nowak Edward J High performance tapered varactor
US20080173913A1 (en) * 2007-01-12 2008-07-24 Kabushiki Kaisha Toshiba Semiconductor device
CN101661932A (zh) * 2008-08-25 2010-03-03 联发科技股份有限公司 集成电容
CA2806689A1 (en) * 2010-08-04 2012-02-09 Harris Corporation Vertical capacitors formed on semiconducting substrates

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107683528A (zh) * 2015-05-08 2018-02-09 思睿逻辑国际半导体有限公司 由诸如finfet的薄垂直半导体结构形成的高密度电容器
CN107683528B (zh) * 2015-05-08 2021-04-27 思睿逻辑国际半导体有限公司 由诸如finfet的薄垂直半导体结构形成的高密度电容器
CN106972016A (zh) * 2015-10-02 2017-07-21 三星电子株式会社 半导体器件

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