CN104568164A - Temperature uniformity measurement and control system for low-temperature vacuum microwave radiation source - Google Patents
Temperature uniformity measurement and control system for low-temperature vacuum microwave radiation source Download PDFInfo
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- CN104568164A CN104568164A CN201410740096.5A CN201410740096A CN104568164A CN 104568164 A CN104568164 A CN 104568164A CN 201410740096 A CN201410740096 A CN 201410740096A CN 104568164 A CN104568164 A CN 104568164A
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Abstract
The invention provides a temperature measurement and control system for a microwave radiation source used under low-temperature vacuum conditions. The temperature measurement and control system comprises a non-contact temperature measurement unit, a two-dimensional scanning unit and a peripheral data acquisition control unit, wherein the non-contact temperature measurement unit comprises a measurement unit mounting shell and a light path system; the light path system comprises a stray light elimination diaphragm, an aperture diaphragm, a plane mirror, an off-axis parabolic mirror, a frequency modulator, a light splitting sheet, a light beam collector, an MTC detector, a light beam collector and a medium wave infrared InSb detector. The temperature measurement and control system has the functions of simple structure, high generality, high temperature measurement accuracy, online real-time monitoring and the like, the radiation accuracy and the uniformity of the microwave radiation source can be effectively improved, and the system has great significance for improvement of the calibration accuracy of aerospace microwave loads.
Description
Technical field
The present invention relates to optical radiation thermometric and control field, specifically in low-temperature vacuum environment for the TT&C system of the temperature of microwave radiation source and homogeneity and temperature feedback control.
Background technology
The common method of calibration microwave source temperature installs contact platinum-resistance thermometer by many places such as the backs at radiating surface, the measuring method of this contact destroys the original equalized temperature of radiation source, and owing to there is the reason such as thermograde, platinum-resistance thermometer error, microwave radiation source temperature survey is caused to there is certain error, and the measuring error of temperature directly will affect the precision of microwave, microwave value is caused to produce deviation.Therefore be necessary in the use procedure of reality, to utilize more high-precision temperature monitoring means to measure to microwave radiation source, do not destroy the original equalized temperature of system simultaneously.
Summary of the invention
The object of the invention is exactly the defect in order to overcome prior art, a kind of system that can improve microwave source temperature and uniformity measurement precision under cryogenic vacuum condition is provided, the functions such as structure is simple, highly versatile, temperature measurement accuracy are high, energy on-line real time monitoring, effectively can improve Electrodynamic radiation and the homogeneity of microwave radiation source, the raising of space flight microwave class load calibration precision is had a very big significance.
The present invention is achieved by the following technical solutions:
A kind of low-temperature vacuum microwave source temperature uniformity measurement and control system, comprise contact-free measurement of temperature unit, two-dimensional scan unit and peripheral data gather control module and, described contact-free measurement of temperature unit comprises measuring unit mounting casing and light path system, described light path system comprises diaphragm for eliminating stray light, aperture diaphragm, plane mirror, off axis paraboloidal mirror, frequency modulator, light splitting piece, optical beam dump, MTC detector, optical beam dump and medium-wave infrared InSb detector, described mounting casing lower end is fixed with off axis paraboloidal mirror, plane mirror is fixed with above described off axis paraboloidal mirror, diaphragm for eliminating stray light is fixed with successively on the right side of described plane mirror, aperture diaphragm, described diaphragm for eliminating stray light, aperture diaphragm is fixed in described mounting casing, medium-wave infrared InSb detector is fixed with above the right side of described plane mirror 10, described medium-wave infrared InSb detector upper end is provided with optical beam dump, described optical beam dump upper end is provided with light splitting piece, optical beam dump is provided with successively on the right side of described light splitting piece, MTC detector, described LONG WAVE INFRARED MCT detector and medium-wave infrared InSb detector all adopt liquid nitrogen refrigerating mode, described peripheral data gathers control module and includes detector data acquisition control module, two-dimensional scan unit control module and temperature feedback control unit, the input end that described peripheral data gathers control module is connected with medium-wave infrared InSb detector with LONG WAVE INFRARED MCT detector.
Wherein, it is pitch-dark that the inside surface of described measurement mounting casing scribbles high-absorbility eliminate stray light.
Wherein, the Photomechanical equipment in described contact-free measurement of temperature unit all adopts liquid nitrogen refrigerating mode to eliminate background stray light.
Wherein, the Photomechanical equipment in described contact-free measurement of temperature unit all posts temperature sensor.
Wherein, described contact-free measurement of temperature unit carrys out the temperature of real time inversion microwave radiation source by the method measuring infrared radiation.
Wherein, described two-dimensional scan unit comprises X, Y diaxon scanning direction function, can complete the scanning in microwave radiation source total radiation face in 10 minutes.
Wherein, described peripheral data gathers control module can by the radiation temperature of FEEDBACK CONTROL microwave radiation source
Degree.
Wherein, described contact-free measurement of temperature unit and two-dimensional scan unit are in vacuum tightness 10
-3normally use under the environment of Pa, heat sink temperature 100K.
The present invention has following beneficial effect:
Under low-temperature vacuum environment, have employed temperature and the homogeneity thereof of non-contacting Radiation Measurements Inversion of Microwave radiation source, this method can significantly improve temperature measurement accuracy, be simultaneously provided in line real time temperature measurement and feedback function, revise the temperature of microwave radiation source, thus arrive the object improving microwave radiation source Electrodynamic radiation.
Accompanying drawing explanation
By reading the detailed description done non-limiting example with reference to the following drawings, other features, objects and advantages of the present invention will become more obvious:
Fig. 1 is the schematic diagram of the present invention's a kind of low-temperature vacuum microwave source temperature uniformity measurement and control system;
Fig. 2 is the principle schematic of contact-free measurement of temperature unit of the present invention;
Fig. 3 is that a kind of low-temperature vacuum microwave source temperature uniformity measurement of the present invention and control system calibrate schematic diagram.
Embodiment
Below in conjunction with specific embodiment, the present invention is described in detail.Following examples will contribute to those skilled in the art and understand the present invention further, but not limit the present invention in any form.It should be pointed out that to those skilled in the art, without departing from the inventive concept of the premise, some distortion and improvement can also be made.These all belong to protection scope of the present invention.
As Figure 1-3, embodiments provide and comprise contact-free measurement of temperature unit 2, two-dimensional scan unit 3 and peripheral data gather control module 4 and 5, described contact-free measurement of temperature unit 2 comprises measuring unit mounting casing 7 and light path system, described light path system comprises diaphragm for eliminating stray light 8, aperture diaphragm 9, plane mirror 10, off axis paraboloidal mirror 11, frequency modulator 12, light splitting piece 13, optical beam dump 14, MTC detector 15, optical beam dump 16 and medium-wave infrared InSb detector 17, described mounting casing 7 lower end is fixed with off axis paraboloidal mirror 11, plane mirror 10 is fixed with above described off axis paraboloidal mirror 11, diaphragm for eliminating stray light 8 is fixed with successively on the right side of described plane mirror 10, aperture diaphragm 9, described diaphragm for eliminating stray light 8, aperture diaphragm 9 is fixed in described mounting casing 7, medium-wave infrared InSb detector 17 is fixed with above the right side of described plane mirror 10, described medium-wave infrared InSb detector 17 upper end is provided with optical beam dump 16, described optical beam dump 16 upper end is provided with light splitting piece 13, optical beam dump 14 is provided with successively on the right side of described light splitting piece 13, MTC detector 15, described LONG WAVE INFRARED MCT detector 15 and medium-wave infrared InSb detector 17 all adopt liquid nitrogen refrigerating mode, described peripheral data gathers control module 4 and includes detector data acquisition control module, two-dimensional scan unit control module and temperature feedback control unit, the input end that described peripheral data gathers control module 4 is connected with medium-wave infrared InSb detector 17 with LONG WAVE INFRARED MCT detector 15, described LONG WAVE INFRARED MCT detector 15 and medium-wave infrared InSb detector 17 all adopt liquid nitrogen refrigerating mode.It is pitch-dark that the inside surface of described measurement mounting casing 7 scribbles high-absorbility eliminate stray light.Photomechanical equipment in described contact-free measurement of temperature unit 2 all adopts liquid nitrogen refrigerating mode to eliminate background stray light.Photomechanical equipment in described contact-free measurement of temperature unit 2 all posts temperature sensor.Described contact-free measurement of temperature unit 2 carrys out the temperature of real time inversion microwave radiation source by the method measuring infrared radiation.Described two-dimensional scan unit 3 comprises X, Y diaxon scanning direction function.Described two-dimensional scan unit 3 can complete the scanning in microwave radiation source total radiation face in 10 minutes.Described peripheral data gathers control module 4 and 5 can by the radiation temperature of FEEDBACK CONTROL microwave radiation source.Described contact-free measurement of temperature unit 2 and two-dimensional scan unit 3 are in vacuum tightness 10
-3normally use under the environment of Pa, heat sink temperature 100K.
This concrete principle implementing contact-free measurement of temperature unit 2 is: light path arrives the plane mirror 10 of electroplate after diaphragm for eliminating stray light 8 and aperture diaphragm 9, plane mirror by light reflection to off axis paraboloidal mirror 11, first arrival rate modulator 12 after convergence of rays is reflected by off axis paraboloidal mirror, when frequency modulator blade opens, light is through frequency modulator, when frequency modulator blade closes, light is blocked, thus gives tested light beam with fixed frequency.Light beam through frequency modulator arrives light splitting piece 13, LONG WAVE INFRARED light beam is split after sheet transmission and arrives optical beam dump 14, light beam is collected into LONG WAVE INFRARED MTC detector 15 and receives measurement by optical beam dump, medium-wave infrared light beam is split, and sheet reflection is rear arrives optical beam dump 16, and light beam is collected into medium-wave infrared InSb detector 17 by optical beam dump.
This is concrete implements contact-free measurement of temperature unit 2 measures microwave radiation source infrared radiation by an infrared MCT detector 15, is then obtained the radiation temperature of microwave radiation source by Planck formula; Two-dimensional scan unit 3 for carrying contact-free measurement of temperature unit 2, thus realizes the total radiation Surface scan to tested microwave radiation source, obtains the surface uniformity of microwave radiation source; Control unit and mainly comprise the control section of two-dimensional scan unit and the temprature control unit of microwave radiation source, the former coordinates contact-free measurement of temperature unit to realize total radiation surface scanning and measuring function, and the deviation between the radiation temperature of the microwave radiation source that the latter obtains according to non-cpntact measurement unit and design temperature carries out detection real-time online and correction to the temperature of microwave radiation source.
The implementing procedure that system is detailed is:
The first step, under low-temperature vacuum environment, contactless temperature temperature measuring unit 2 calibrated in the high precision variable temperature black matrix 18 utilizing China National Measuring Science Research Inst. to keep.Detector signal value and the infrared radiation value of non-contact temperature measuring unit have following relation:
S(T)＝aF(T)+b (1)
Wherein S (T) is the output signal value of two detectors of contactless temperature temperature measuring unit 2, and F (T) is the radiation value of high precision variable temperature blackbody radiation source 18, a and b is calibration coefficient.Multiple temperature value is set by temperature-changeable black matrix, matching can obtains the value of calibration coefficient a and b.Thus the temperature of black matrix or microwave radiation source just can be carried out inverting by the signal value of detector and obtains, its expression formula is as follows:
T(S)＝M(S，a，b) (2)
Wherein T (S) source temperature value, S is the signal value of detector.
Second step, under low-temperature vacuum environment, utilize contactless temperature temperature measuring unit 2 to measure the radiation value of microwave radiation source more than 1 temperature spot, carry out scanning survey and average, obtain signal value S, S value is brought into the true temperature value T that (2) formula just obtains microwave radiation source more than 1 temperature spot.
3rd step, peripheral data gathers control module 4 and 5, true temperature value compares with set temperature value by computing machine 6, if design temperature just gathers control module by peripheral data higher than true temperature and the temperature of microwave radiation source is turned down, equally, if design temperature just gathers control module by peripheral data lower than true temperature and the temperature of microwave radiation source is heightened, thus reaches the object accurately controlling microwave source temperature.
Originally under being embodied in low-temperature vacuum environment, have employed temperature and the homogeneity thereof of non-contacting Radiation Measurements Inversion of Microwave radiation source, this method can significantly improve temperature measurement accuracy, be simultaneously provided in line real time temperature measurement and feedback function, revise the temperature of microwave radiation source, thus arrive the object improving microwave radiation source Electrodynamic radiation.
Above specific embodiments of the invention are described.It is to be appreciated that the present invention is not limited to above-mentioned particular implementation, those skilled in the art can make various distortion or amendment within the scope of the claims, and this does not affect flesh and blood of the present invention.
Claims (8)
1. a low-temperature vacuum microwave source temperature uniformity measurement and control device, it is characterized in that, comprise contact-free measurement of temperature unit, two-dimensional scan unit and peripheral data gather control module and, described contact-free measurement of temperature unit comprises measuring unit mounting casing and light path system, described light path system comprises diaphragm for eliminating stray light, aperture diaphragm, plane mirror, off axis paraboloidal mirror, frequency modulator, light splitting piece, optical beam dump, MTC detector, optical beam dump and medium-wave infrared InSb detector, described mounting casing lower end is fixed with off axis paraboloidal mirror, plane mirror is fixed with above described off axis paraboloidal mirror, diaphragm for eliminating stray light is fixed with successively on the right side of described plane mirror, aperture diaphragm, described diaphragm for eliminating stray light, aperture diaphragm is fixed in described mounting casing, medium-wave infrared InSb detector is fixed with above the right side of described plane mirror 10, described medium-wave infrared InSb detector upper end is provided with optical beam dump, described optical beam dump upper end is provided with light splitting piece, optical beam dump is provided with successively on the right side of described light splitting piece, MTC detector, described LONG WAVE INFRARED MCT detector and medium-wave infrared InSb detector all adopt liquid nitrogen refrigerating mode, described peripheral data gathers control module and includes detector data acquisition control module, two-dimensional scan unit control module and temperature feedback control unit, the input end that described peripheral data gathers control module is connected with medium-wave infrared InSb detector with LONG WAVE INFRARED MCT detector.
2. a kind of low-temperature vacuum microwave source temperature uniformity measurement according to claim 1 and control system, is characterized in that, it is pitch-dark that the inside surface of described measurement mounting casing scribbles high-absorbility eliminate stray light.
3. a kind of low-temperature vacuum microwave source temperature uniformity measurement according to claim 1 and control system, is characterized in that, the Photomechanical equipment in described contact-free measurement of temperature unit all adopts liquid nitrogen refrigerating mode to eliminate background stray light.
4. a kind of low-temperature vacuum microwave source temperature uniformity measurement according to claim 1 and control system, is characterized in that, the Photomechanical equipment in described contact-free measurement of temperature unit all posts temperature sensor.
5. a kind of low-temperature vacuum microwave source temperature uniformity measurement according to claim 1 and control system, is characterized in that, described contact-free measurement of temperature unit carrys out the temperature of real time inversion microwave radiation source by the method measuring infrared radiation.
6. a kind of low-temperature vacuum microwave source temperature uniformity measurement according to claim 1 and control system, it is characterized in that, described two-dimensional scan unit comprises X, Y diaxon scanning direction function, can complete the scanning in microwave radiation source total radiation face in 10 minutes.
7. a kind of low-temperature vacuum microwave source temperature uniformity measurement according to claim 1 and control system, is characterized in that, described peripheral data gathers control module can by the radiation temperature of FEEDBACK CONTROL microwave radiation source.
8. a kind of low-temperature vacuum microwave source temperature uniformity measurement according to claim 1 and control system, is characterized in that, described contact-free measurement of temperature unit and two-dimensional scan unit are in vacuum tightness 10
-3normally use under the environment of Pa, heat sink temperature 100K.
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| CN105136314A (en) * | 2015-08-24 | 2015-12-09 | 北京环境特性研究所 | Infrared thermal imaging system realization method under vacuum low temperature environment and device |
| CN106197674A (en) * | 2016-07-11 | 2016-12-07 | 上海卫星装备研究所 | A kind of novel facial heat sink temperature measuring equipment and scaling method |
| CN108318522A (en) * | 2018-01-09 | 2018-07-24 | 北京航天长征飞行器研究所 | A kind of quartz lamp heater radiation thermal field heat flux distribution homogeneity test device |
| CN109060125A (en) * | 2018-08-14 | 2018-12-21 | 上海卫星装备研究所 | Solar simulator uniformity of radiation detection device under a kind of space environment |
| CN114281123A (en) * | 2021-11-15 | 2022-04-05 | 北京无线电计量测试研究所 | Automatic temperature control device for microwave radiometer calibration source |
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| CN109060125A (en) * | 2018-08-14 | 2018-12-21 | 上海卫星装备研究所 | Solar simulator uniformity of radiation detection device under a kind of space environment |
| CN114281123A (en) * | 2021-11-15 | 2022-04-05 | 北京无线电计量测试研究所 | Automatic temperature control device for microwave radiometer calibration source |
| CN114281123B (en) * | 2021-11-15 | 2022-09-27 | 北京无线电计量测试研究所 | Automatic temperature control device for microwave radiometer calibration source |
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Application publication date: 20150429 |