CN104483613A - LED test method - Google Patents
LED test method Download PDFInfo
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- CN104483613A CN104483613A CN201410775443.8A CN201410775443A CN104483613A CN 104483613 A CN104483613 A CN 104483613A CN 201410775443 A CN201410775443 A CN 201410775443A CN 104483613 A CN104483613 A CN 104483613A
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Abstract
The invention discloses an LED test method and belongs to the field of LED illumination. The LED test method comprises the following steps: putting an LED sample in the environment with illuminance of 46-50 lux at the normal temperature, lightening the LED and recording parameter data; respectively carrying out electrostatic discharge on the LED sample in the environment of normal temperature, the environment of between -15 DEG C and 0 DEG C, the environment of between 55 DEG C-60 DEG C and the environment of between 8 DEG C and 16 DEG C and recording the parameter data; comparing the parameter data of the LED sample before testing with the parameter data of the LED sample after testing, and determining the antistatic performance of the LED sample in the environment with different temperatures. By simulating the test of the antistatic performance of the LED in different temperature environments and static levels and in particular circularly testing at the low temperature, the high temperature and the low temperature, the anti-static capability of the LED in different environments can be accurately evaluated; important data is provided for the improvement and innovation of the technology.
Description
Technical field
The present invention relates to a kind of LED method of testing, be specifically a kind of method of testing detecting LED antistatic property, belong to field of LED illumination.
Background technology
LED is acknowledged as 21 century " green illumination ", has the features such as " high energy-conservation " " life-span is long " " changeable " " sharp environmental protection " " high-new point ", thus becomes the industrial hot spot of most market potential.But in the whole industrial chain of LED, due to technical difference, the LED quality causing different manufacturers to be produced is uneven.LED antistatic property is the important performance index of LED.
Current LED antistatic property is the normal antistatic effect adopting batch method on probation to judge LED generally, but this method cycle is long, cost is high, error is large; Also have some method of testings LED to be thrown into polybag air blowing, rub or survey the methods such as the back resistance of LED to judge the antistatic effect of LED, but these methods all do not have standard foundation, can only rely on experience to judge, lack of standardization.These methods above-mentioned cannot be all accurately test LED antistatic property, seriously constrain the development of LED industry.In addition, also have part manufacturing enterprise to adopt relevant device to carry out the antistatic test of LED, but its test process is complicated, test result cannot reach expection.
Summary of the invention
Technical matters to be solved by this invention is to overcome prior art defect, provides a kind of method comprehensively accurately testing LED antistatic property.
In order to solve the problems of the technologies described above, LED method of testing provided by the invention, comprises the steps:
1) being placed on illumination, at normal temperatures by LED sample is light LED in the environment of 46-50lux, checks that the luminescence of described LED sample is whether abnormal, records the supplemental characteristic of described LED by integrating sphere measurement;
2), at normal temperatures LED sample energising light 1h after, utilize LED coulostatic analysis test macro to LED sample carry out respectively 250-500V static discharge, 1500-3000V static discharge and 4500-7000V static discharge and record test after LED sample parameters data;
3), under-15 DEG C of-0 DEG C of environment by LED sample energising light 3h after, utilize LED coulostatic analysis test macro to LED sample carry out respectively 250-500V static discharge, 1500-3000V static discharge and 4500-7000V static discharge and record test after LED sample parameters data;
4), under 55 DEG C of-60 DEG C of environment by LED sample energising light 20min after, utilize LED coulostatic analysis test macro to LED sample carry out respectively 250-500V static discharge, 1500-3000V static discharge and 4500-7000V static discharge and record test after LED sample parameters data;
5), under 8 DEG C of-16 DEG C of environment by LED sample energising light 2h after, utilize LED coulostatic analysis test macro to LED sample carry out respectively 250-500V static discharge, 1500-3000V static discharge and 4500-7000V static discharge and record test after LED sample parameters data;
6), to contrast before described test LED sample parameters data after LED sample parameters data and described test, judge the antistatic property of described LED sample under described different temperature environment.
In the present invention, described 250-500V static discharge number of times is 40-50 time, and 1500-3000V static discharge number of times is 30-40 time, and 4500-7000V static discharge number of times is 20-30 time.
Beneficial effect of the present invention is: the present invention is tested LED antistatic property under different temperature environments and electrostatic grade by simulation, especially by the loop test of low, high and low temperature, LED antistatic effect under assessment varying environment exactly, for the improvement and bring new ideas of technology provides significant data, it can improve LED product quality greatly, promotes the development of LED industry.
Embodiment
Below in conjunction with specific embodiment, the present invention is described in further detail.
Various embodiments of the present invention all adopt distant place LED coulostatic analysis test macro to carry out the test of LED antistatic property, LED coulostatic analysis test macro is made up of EMS61000-2 series electro-static discharging generator, ETP-2 electrostatic test platform and LED Special precision testing power supply able to programme, is custom-designed automatic analysis test macro for LED electrostatic sensitive grade judgement requirement and feature.
embodiment 1
1), to be placed on illumination at normal temperatures by 2-3 group LED sample be light LED in the environment of 46-50lux, checks that whether the luminescence of described LED sample is abnormal, records the supplemental characteristic of described LED by integrating sphere measurement;
2), after LED sample energising at normal temperatures lights 1h, utilize LED coulostatic analysis test macro to LED sample carry out 250-500V static discharge respectively 45 times, 1500-3000V static discharge 35 times and 4500-7000V static discharge 20 times LED sample parameters data after record test;
3), under-15 DEG C of environment, 3h is lighted in the energising of LED sample after, utilize LED coulostatic analysis test macro to LED sample carry out 250-500V static discharge respectively 40 times, 1500-3000V static discharge 30 times and 4500-7000V static discharge 30 times LED sample parameters data after record test;
4), under 57 DEG C of environment, 20min is lighted in the energising of LED sample after, utilize LED coulostatic analysis test macro to LED sample carry out 250-500V static discharge respectively 50 times, 1500-3000V static discharge 40 times and 4500-7000V static discharge 25 times LED sample parameters data after record test;
5), under 8 DEG C of environment, 2h is lighted in the energising of LED sample after, utilize LED coulostatic analysis test macro to LED sample carry out 250-500V static discharge respectively 43 times, 1500-3000V static discharge 30 times and 4500-7000V static discharge 24 times LED sample parameters data after record test;
6), to contrast before described test LED sample parameters data after LED sample parameters data and described test, judge the antistatic property of described LED sample under described different temperature environment.
embodiment 2
1), to be placed on illumination at normal temperatures by 2-3 group LED sample be light LED in the environment of 46-50lux, checks that whether the luminescence of described LED sample is abnormal, records the supplemental characteristic of described LED by integrating sphere measurement;
2), after LED sample energising at normal temperatures lights 1h, utilize LED coulostatic analysis test macro to LED sample carry out 250-500V static discharge respectively 50 times, 1500-3000V static discharge 30 times and 4500-7000V static discharge 30 times LED sample parameters data after record test;
3), under 0 DEG C of environment, 3h is lighted in the energising of LED sample after, utilize LED coulostatic analysis test macro to LED sample carry out 250-500V static discharge respectively 44 times, 1500-3000V static discharge 40 times and 4500-7000V static discharge 23 times LED sample parameters data after record test;
4), under 58 DEG C of environment, 20min is lighted in the energising of LED sample after, utilize LED coulostatic analysis test macro to LED sample carry out 250-500V static discharge respectively 41 times, 1500-3000V static discharge 33 times and 4500-7000V static discharge 28 times LED sample parameters data after record test;
5), under 16 DEG C of environment, 2h is lighted in the energising of LED sample after, utilize LED coulostatic analysis test macro to LED sample carry out 250-500V static discharge respectively 50 times, 1500-3000V static discharge 37 times and 4500-7000V static discharge 30 times LED sample parameters data after record test;
6), to contrast before described test LED sample parameters data after LED sample parameters data and described test, judge the antistatic property of described LED sample under described different temperature environment.
embodiment 3
1), to be placed on illumination at normal temperatures by 2-3 group LED sample be light LED in the environment of 46-50lux, checks that whether the luminescence of described LED sample is abnormal, records the supplemental characteristic of described LED by integrating sphere measurement;
2), after LED sample energising at normal temperatures lights 1h, utilize LED coulostatic analysis test macro to LED sample carry out 250-500V static discharge respectively 40 times, 1500-3000V static discharge 32 times and 4500-7000V static discharge 25 times LED sample parameters data after record test;
3), under-10 DEG C of environment, 3h is lighted in the energising of LED sample after, utilize LED coulostatic analysis test macro to LED sample carry out 250-500V static discharge respectively 50 times, 1500-3000V static discharge 32 times and 4500-7000V static discharge 20 times LED sample parameters data after record test;
4), under 55 DEG C of environment, 20min is lighted in the energising of LED sample after, utilize LED coulostatic analysis test macro to LED sample carry out 250-500V static discharge respectively 40 times, 1500-3000V static discharge 30 times and 4500-7000V static discharge 20 times LED sample parameters data after record test;
5), under 12 DEG C of environment, 2h is lighted in the energising of LED sample after, utilize LED coulostatic analysis test macro to LED sample carry out 250-500V static discharge respectively 40 times, 1500-3000V static discharge 33 times and 4500-7000V static discharge 27 times LED sample parameters data after record test;
6), to contrast before described test LED sample parameters data after LED sample parameters data and described test, judge the antistatic property of described LED sample under described different temperature environment.
embodiment 4
1), to be placed on illumination at normal temperatures by 2-3 group LED sample be light LED in the environment of 46-50lux, checks that whether the luminescence of described LED sample is abnormal, records the supplemental characteristic of described LED by integrating sphere measurement;
2), after LED sample energising at normal temperatures lights 1h, utilize LED coulostatic analysis test macro to LED sample carry out 250-500V static discharge respectively 48 times, 1500-3000V static discharge 40 times and 4500-7000V static discharge 27 times LED sample parameters data after record test;
3), under-7 DEG C of environment, 3h is lighted in the energising of LED sample after, utilize LED coulostatic analysis test macro to LED sample carry out 250-500V static discharge respectively 47 times, 1500-3000V static discharge 38 times and 4500-7000V static discharge 26 times LED sample parameters data after record test;
4), under 60 DEG C of environment, 20min is lighted in the energising of LED sample after, utilize LED coulostatic analysis test macro to LED sample carry out 250-500V static discharge respectively 43 times, 1500-3000V static discharge 36 times and 4500-7000V static discharge 30 times LED sample parameters data after record test;
5), under 11 DEG C of environment, 2h is lighted in the energising of LED sample after, utilize LED coulostatic analysis test macro to LED sample carry out 250-500V static discharge respectively 48 times, 1500-3000V static discharge 40 times and 4500-7000V static discharge 20 times LED sample parameters data after record test;
6), to contrast before described test LED sample parameters data after LED sample parameters data and described test, judge the antistatic property of described LED sample under described different temperature environment.
The above is only the preferred embodiment of the present invention, it should be pointed out that for those skilled in the art, can also make some improvement under the premise without departing from the principles of the invention, and these improvement also should be considered as protection scope of the present invention.
Claims (2)
1. a LED method of testing, is characterized in that comprising the steps:
1) being placed on illumination, at normal temperatures by LED sample is light LED in the environment of 46-50lux, checks that the luminescence of described LED sample is whether abnormal, records the supplemental characteristic of described LED by integrating sphere measurement;
2), at normal temperatures LED sample energising light 1h after, utilize LED coulostatic analysis test macro to LED sample carry out respectively 250-500V static discharge, 1500-3000V static discharge and 4500-7000V static discharge and record test after LED sample parameters data;
3), under-15 DEG C of-0 DEG C of environment by LED sample energising light 3h after, utilize LED coulostatic analysis test macro to LED sample carry out respectively 250-500V static discharge, 1500-3000V static discharge and 4500-7000V static discharge and record test after LED sample parameters data;
4), under 55 DEG C of-60 DEG C of environment by LED sample energising light 20min after, utilize LED coulostatic analysis test macro to LED sample carry out respectively 250-500V static discharge, 1500-3000V static discharge and 4500-7000V static discharge and record test after LED sample parameters data;
5), under 8 DEG C of-16 DEG C of environment by LED sample energising light 2h after, utilize LED coulostatic analysis test macro to LED sample carry out respectively 250-500V static discharge, 1500-3000V static discharge and 4500-7000V static discharge and record test after LED sample parameters data;
6), to contrast before described test LED sample parameters data after LED sample parameters data and described test, judge the antistatic property of described LED sample under described different temperature environment.
2. the antistatic method of testing of LED according to claim 1, is characterized in that: described 250-500V static discharge number of times is 40-50 time, and 1500-3000V static discharge number of times is 30-40 time, and 4500-7000V static discharge number of times is 20-30 time.
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104808129A (en) * | 2015-03-31 | 2015-07-29 | 山西南烨立碁光电有限公司 | Fully new LED (Light Emitting Diode) crystal grain detection technology |
| CN107314879A (en) * | 2017-07-18 | 2017-11-03 | 中国核电工程有限公司 | A kind of shock test method of antidetonation lighting apparatus suitable for three generations's nuclear power station |
| CN109342859A (en) * | 2018-12-03 | 2019-02-15 | 晶晨半导体(上海)股份有限公司 | ESD test method and device |
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| CN103048605A (en) * | 2012-12-22 | 2013-04-17 | 三峡电力职业学院 | Detecting and screening method for LED (Light Emitting Diode) aging |
| CN103776616A (en) * | 2012-10-19 | 2014-05-07 | 海洋王（东莞）照明科技有限公司 | LED performance test method |
| CN103884975A (en) * | 2012-12-21 | 2014-06-25 | 海洋王（东莞）照明科技有限公司 | LED antistatic test method |
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| KR101049310B1 (en) * | 2010-02-05 | 2011-07-13 | (주)티에스이 | Method for testing led devices and system for testing led devices |
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| CN104808129A (en) * | 2015-03-31 | 2015-07-29 | 山西南烨立碁光电有限公司 | Fully new LED (Light Emitting Diode) crystal grain detection technology |
| CN104808129B (en) * | 2015-03-31 | 2018-11-20 | 山西南烨立碁光电有限公司 | A kind of completely new LED grain detection technique |
| CN107314879A (en) * | 2017-07-18 | 2017-11-03 | 中国核电工程有限公司 | A kind of shock test method of antidetonation lighting apparatus suitable for three generations's nuclear power station |
| CN109342859A (en) * | 2018-12-03 | 2019-02-15 | 晶晨半导体(上海)股份有限公司 | ESD test method and device |
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