CN103048605A - Detecting and screening method for LED (Light Emitting Diode) aging - Google Patents
Detecting and screening method for LED (Light Emitting Diode) aging Download PDFInfo
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- CN103048605A CN103048605A CN2012105616595A CN201210561659A CN103048605A CN 103048605 A CN103048605 A CN 103048605A CN 2012105616595 A CN2012105616595 A CN 2012105616595A CN 201210561659 A CN201210561659 A CN 201210561659A CN 103048605 A CN103048605 A CN 103048605A
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Abstract
The invention relates to a detecting and screening method for LED (Light Emitting Diode) aging. The method comprises the steps of: periodically adjusting current and voltage input to each LED through computer numerical control equipment; detecting temperature data of each LED through a thermocouple thermodetector; drawing a voltage and temperature functional curve in linear relation and displaying the curve on a computer display by the computer numerical control equipment according to the received temperature data of each LED and corresponding voltage and/or current values; comparing detected data with a predetermined threshold value to find out unqualified LEDs and displaying the unqualified LEDs on the display; and marking and screening the unqualified LEDs by operators according to identifiers displayed on the computer to finish detection and screening of LED aging. According to the method provided by the invention, detection and screening of LED aging can be realized well, so that the safety and reliability of equipment can be improved.
Description
Technical field
The present invention relates to the aging detection screening technique of a kind of LED, relate in particular to a kind of detection screening technique by LED is worn out and exists the LED of hidden danger to get rid of electrical and technique.
Background technology
In the high-power LED street lamp illumination, three large key problem in technology are: heat management, driving power and LED performance quality.Front two existing many improvement results, exclusive the 3rd is still and is following the forefathers old course and waddle, its present situation is: in the light source that is comprised of many high-power LED arrays or high-power polycrystalline integrated (IC), reject the LED device of early stage and inferior initial failure, it always is loaded down with trivial details and problem headache, the LED device is after the normality condition test passes, make a final check has been general aging test, yet the great power LED that conventional aging test can only be rejected part initial failure, great power LED to inferior initial failure is helpless, this method is also very limited for the short-term effect of the great power LED of rejecting initial failure simultaneously, thereby people expect to prolong digestion time and reach re-set target, that have even digestion time extended to 240 hours, but It dones't help the situation at last, and (miscellaneous part lost efficacy and inquires in a separate paper) still constantly appears in the LED of the early stage and inferior initial failure of high-power illumination, and this is for the high-power LED street lamp of costliness, also be difficult to hide with regard to flaw, the difficult attached long-life is real.
At present, effectively predict and detect also no existence of equipment of the performance failure of LED, and general detection all is to use conventional methods to process.In general, LED is aging to be exactly to adopt high voltage tolerance driving method, and the driving voltage higher than normal drive voltage acted on LED, the method be with than the required a plurality of voltages of driving LED all high voltage act on LED, and provide the tolerance test to LED.The test of high voltage tolerance driving method can improve the ability that line defct that voltage level that order applies can exist the LED of open circuit detects that detects.The throughput rate that high voltage tolerance driving method can reduce significantly the burn-in test time and LED is provided.But there is not also not to be fit to the aging special arrangement equipment that detects of LED now, traditional method is to adopt manual testing's mode, utilize staff that each LED is carried out burn-in test, to have the efficient of great injury but also its detection for the eyes that detect the workman very low and this mode detects not only, to work every day 8 hours, each workman detects maximum 5,000 LED every day, and manual detection, the easy bending of the pin of its both positive and negative polarity is ceased to be faithful when extracting for LED, affects the quality of product.
For a change this present situation then need look for another way, other Case road.The applicant has worked out this method analyze, studied high-power LED illuminating device thrashing mechanism and LED component failure mechanism from long-term working practice and inspection information after, taked the compensation process outside a series of conventionally tests, in order to rejecting the great power LED of early stage and inferior initial failure, thereby improve the reliability of great power LED.
Summary of the invention
Technical matters to be solved by this invention is to overcome the deficiencies in the prior art, and the aging detection screening technique of a kind of LED is provided, and the method may further comprise the steps:
A. with led array alignment to be detected, make LED negative pole pin and cathode contact sheet good contact, and each contact of computer numerical control equipment output terminal is connected with the anodal pin of each corresponding LED, the power connection that keeps anodal contact and negative pole contact, each contact of thermocouple temperature measurement instrument is contacted with each LED respectively, make that each LED wears out on the led array energising pair array;
Wherein the rated voltage of output is that 24V, rated current are output as 50mA, the LED digestion time is 70 minutes, described computer numerical control equipment can be adjusted electric current and the voltage that is input to each LED as required, and can demonstrate at graphoscope voltage and/or the current value of each output contact, the voltage and current value that the periodic update displayed of computer numerical control equipment goes out, and the voltage and current value stored, can carry out highlighted demonstration at display for voltage and/or the unusual LED unit of current value;
The input end of described computer numerical control equipment is connected with the thermocouple temperature measurement instrument, reception is from the temperature data of described thermocouple temperature measurement instrument, described computer numerical control equipment is according to temperature data and corresponding voltage and/or the current value of each LED that receives, is depicted as the voltage, temperature funtion curve of linear relationship and shows at graphoscope;
B. described computer numerical control equipment periodically detects line by line to described led array, in described computer numerical control equipment, preset LED and start threshold values and shut-off valve value parameter, in detecting line by line, when detecting that LED does not reach described startup threshold values and when closing threshold values, explicit identification on graphoscope, and the positional information that identifies corresponding LED stored;
C. under rated voltage and electric current operating condition, when detecting LED pressure drop appears when unusual, explicit identification on graphoscope, and the positional information that identifies corresponding LED stored;
D. in the operation of rated voltage and electric current more than 1 hour and behind the temperature stabilization, when the magnitude of voltage that detects LED when difference surpasses the threshold value of setting before and after 1 hour, explicit identification on graphoscope, and the positional information that identifies corresponding LED stored;
E. after the burn-in test time arrives, positional information according to storage shows being identified on the display of all underproof LED operating personnel are according to the sign that shows on the computing machine, underproof LED is carried out label screening, finish LED aging detection and screening.
It more than is the core content of the aging detection screening technique of this LED, it only is a kind of non-aging method of rejecting the early stage and inferior initial failure of great power LED that its meaning is far from, in the same way, analyse in depth, study the generality of failure mechanism, revise by different characteristics, also can be used for selecting of other devices, such as equipment of military use etc.Little it, substitute agingly, save aging human and material resources and time, large it, the safety and reliability of equipment is fundamentally explored in attempt.Certainly, at work, even select certain applications by physical condition benifit is arranged also.The applicant is in designing and producing the LED light fixture; except foregoing; adopt the good composite graphite temperature-uniforming plate of an optics moulding, heat conduction, heat pipe and air channel in conjunction with or the air blast cooling cooling system, the protection tube etc. that the common-mode noise that antistatic, anti-distribution system is introduced and transition spike disturb and incorporate LED into.This method once part is used for the LED street lamp product of hanging net operation, goes through examination in 2 to 3 years, and is all right.
Description of drawings
Fig. 1 is the system architecture diagram of using the aging detection screening technique of a kind of LED of the present invention.
Embodiment
For making the purpose, technical solutions and advantages of the present invention clearer, the present invention is described in further detail below in conjunction with accompanying drawing.
Referring to Fig. 1, the present invention is the aging detection screening technique of a kind of LED, and the system that uses the method mainly is comprised of computer numerical control equipment and thermocouple temperature measurement instrument, and the method comprises the following steps:
A. with led array alignment to be detected, make LED negative pole pin and cathode contact sheet good contact, and each contact of computer numerical control equipment output terminal is connected with the anodal pin of each corresponding LED, the power connection that keeps anodal contact and negative pole contact, each contact of thermocouple temperature measurement instrument is contacted with each LED respectively, make that each LED wears out on the led array energising pair array;
Wherein the rated voltage of output is that 24V, rated current are output as 50mA, the LED digestion time is 70 minutes, described computer numerical control equipment can be adjusted electric current and the voltage that is input to each LED as required, and can demonstrate at graphoscope voltage and/or the current value of each output contact, the voltage and current value that the periodic update displayed of computer numerical control equipment goes out, and the voltage and current value stored, can carry out highlighted demonstration at display for voltage and/or the unusual LED unit of current value;
The input end of described computer numerical control equipment is connected with the thermocouple temperature measurement instrument, reception is from the temperature data of described thermocouple temperature measurement instrument, described computer numerical control equipment is according to temperature data and corresponding voltage and/or the current value of each LED that receives, is depicted as the voltage, temperature funtion curve of linear relationship and shows at graphoscope;
B. described computer numerical control equipment periodically detects line by line to described led array, in described computer numerical control equipment, preset LED and start threshold values and shut-off valve value parameter, in detecting line by line, when detecting that LED does not reach described startup threshold values and when closing threshold values, explicit identification on graphoscope, and the positional information that identifies corresponding LED stored;
The unlatching threshold values of LED modules with different colors and close threshold values with different vendor and difference batch is all arranged is to all should give rejecting above the LED device of average more than 20%.
C. under rated voltage and electric current operating condition, when detecting LED pressure drop appears when unusual, explicit identification on graphoscope, and the positional information that identifies corresponding LED stored;
After LED energising work, pressing the same time interval adopts the operating voltage of measuring the LED device and adopts the thermocouple temperature measurement instrument to measure temperature, can be depicted as voltage, the temperature funtion curve of linear relationship, to the deflection curve error reach 20% and above LED device rejected.
D. in the operation of rated voltage and electric current more than 1 hour and behind the temperature stabilization, when the magnitude of voltage that detects LED when difference surpasses the threshold value of setting before and after 1 hour, explicit identification on graphoscope, and the positional information that identifies corresponding LED stored;
Led light source energising work is measured each LED operating voltage more than 1 hour and behind temperature stabilization or rate of temperature change＜5%, to being rejected above average working voltage value 20% and above LED device.
E. after the burn-in test time arrives, positional information according to storage shows being identified on the display of all underproof LED operating personnel are according to the sign that shows on the computing machine, underproof LED is carried out label screening, finish LED aging detection and screening.
The applicant carries out also can adopting following these methods to screen the aging detection screening of LED except adopting said method in designing and producing the LED light fixture, equally also can well guarantee the safety and reliability of product.
The LED device is placed fluorine carbon inert fluid, its advantage is that test product can not stay the contaminative vestige), under the high low temperature that standard allows, carry out the thermal shock test, heat to assigned temperature and fixed time, repeatedly circulate, repeatedly store, to the stress that utilizes LED encapsulating material expansion coefficient and shrinkage ratio difference to produce, make bonding point displacement increase, in advance fatigue breakdown of gold thread (or aluminum steel), to reject the ID phase LED device of the bad easy open circuit of gold thread bonding.LED device production manufacturer is in the LED technical parameter standard that it is provided, provided the operating temperature range of LED, under the boundary value of its scope, carry out 2 hours the thermal shock test of every interval, 3 the rear rejectings that circulate have damaged and the conventional sense parameter, mainly be reverse leakage current 〉=5 μ a, underproof LED device.
Be LED to be placed heat in the silicone oil to 130 ℃ in above-mentioned condition method not enough or that further replenish, whenever fall 2 ℃-10 ℃ and under pulse voltage, survey its forward voltage drops, obtaining this batch LED vf/TJ model curve, thereby reject the flying spot defective products.
In addition, can also utilize the amphicheirality of the luminous and photovoltaic effect of LED, under the normal adverse condition that uses, detect, reject the defective products that LED device PN junction is subject to Organic Pollution; But very difficult because in strong external electromagnetic field signal, extracting faint photogenerated current.Therefore adopt anti-aliasing filtering, phase lock amplifying technology, can from strong neighbourhood noise, separate faint photogenerated current, to judge and the rejecting defective products.Adopt anti-aliasing filtering and phase-locked amplifying circuit to detect the photovoltage of LED under the 500lx light intensity, reject the LED that is lower than average photoproduction magnitude of voltage 20%.
Because the discreteness of LED V-A characteristic is very large, the current density on the PN junction often is non-homogeneous distribution, and this phenomenon adopts face thermometric mode to test under the service condition of setting again because of the current difference random variation, rejects high device.Employing face temperature measurer is arranged light source to the LED matrix of identical working current and is carried out thermometric, because the random difference of PN junction structure, electric current is the line shape, current density raises, and the LED device that will produce local anomaly (surpassing mean value 20%) temperature rise is rejected.
In the light source of same batch of LED assembling, the device of rejecting red shift of wavelength.Adopt the spectral wavelength tester that the LED after processing through thermal oscillation among same batch of LED and the 4th is tested, to wavelength increase by 20% and above LED rejected.
The above is the preferred embodiments of the present invention only, is not limited to the present invention, and for a person skilled in the art, the present invention can have various modifications and variations.Within the spirit and principles in the present invention all, any modification of doing, be equal to replacement, improvement etc., all should be included within protection scope of the present invention.
Claims (1)
1. the detection screening technique that LED is aging is characterized in that comprising the following steps:
A. with led array alignment to be detected, make LED negative pole pin and cathode contact sheet good contact, and each contact of computer numerical control equipment output terminal is connected with the anodal pin of each corresponding LED, the power connection that keeps anodal contact and negative pole contact, each contact of thermocouple temperature measurement instrument is contacted with each LED respectively, make that each LED wears out on the led array energising pair array;
Wherein the rated voltage of output is that 24V, rated current are output as 50mA, the LED digestion time is 70 minutes, described computer numerical control equipment can be adjusted electric current and the voltage that is input to each LED as required, and can demonstrate at graphoscope voltage and/or the current value of each output contact, the voltage and current value that the periodic update displayed of computer numerical control equipment goes out, and the voltage and current value stored, can carry out highlighted demonstration at display for voltage and/or the unusual LED unit of current value;
The input end of described computer numerical control equipment is connected with the thermocouple temperature measurement instrument, reception is from the temperature data of described thermocouple temperature measurement instrument, described computer numerical control equipment is according to temperature data and corresponding voltage and/or the current value of each LED that receives, is depicted as the voltage, temperature funtion curve of linear relationship and shows at graphoscope;
B. described computer numerical control equipment periodically detects line by line to described led array, in described computer numerical control equipment, preset LED and start threshold values and shut-off valve value parameter, in detecting line by line, when detecting that LED does not reach described startup threshold values and when closing threshold values, explicit identification on graphoscope, and the positional information that identifies corresponding LED stored;
C. under rated voltage and electric current operating condition, when detecting LED pressure drop appears when unusual, explicit identification on graphoscope, and the positional information that identifies corresponding LED stored;
D. in the operation of rated voltage and electric current more than 1 hour and behind the temperature stabilization, when the magnitude of voltage that detects LED when difference surpasses the threshold value of setting before and after 1 hour, explicit identification on graphoscope, and the positional information that identifies corresponding LED stored;
E. after the burn-in test time arrives, positional information according to storage shows being identified on the display of all underproof LED operating personnel are according to the sign that shows on the computing machine, underproof LED is carried out label screening, finish LED aging detection and screening.
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| CN103454595A (en) * | 2013-08-08 | 2013-12-18 | 晨怡（浙江）电子实业有限公司 | Lamp power detecting system |
| CN103792477A (en) * | 2014-02-20 | 2014-05-14 | 四川虹视显示技术有限公司 | OLED parallel detection sorting system |
| CN104007340A (en) * | 2014-05-21 | 2014-08-27 | 杭州互诚控制技术有限公司 | Electronic product aging test system and aging test method |
| CN104483613A (en) * | 2014-12-16 | 2015-04-01 | 常熟卓辉光电科技股份有限公司 | LED test method |
| CN105137368A (en) * | 2015-08-25 | 2015-12-09 | 苏州欧可罗电子科技有限公司 | LED light strip aging monitoring method |
| CN105406311A (en) * | 2015-12-14 | 2016-03-16 | 江阴乐圩光电股份有限公司 | Socket for LED ageing tester |
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| CN104007340A (en) * | 2014-05-21 | 2014-08-27 | 杭州互诚控制技术有限公司 | Electronic product aging test system and aging test method |
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| CN105137368A (en) * | 2015-08-25 | 2015-12-09 | 苏州欧可罗电子科技有限公司 | LED light strip aging monitoring method |
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| CN108732514A (en) * | 2017-04-17 | 2018-11-02 | 浙江机电职业技术学院 | Portable LED lamp aging tester and its application method |
| CN108732514B (en) * | 2017-04-17 | 2024-01-02 | 浙江机电职业技术学院 | Portable LED lamp aging tester and use method thereof |
| CN107144799A (en) * | 2017-04-26 | 2017-09-08 | 贵州省广播电视信息网络股份有限公司 | A kind of method of forced aging |
| CN108120915A (en) * | 2017-12-15 | 2018-06-05 | 京东方科技集团股份有限公司 | Applied to the ageing method of display panel and burin-in process system |
| CN108120915B (en) * | 2017-12-15 | 2020-05-05 | 京东方科技集团股份有限公司 | Aging processing method and aging processing system applied to display panel |
| CN108333494A (en) * | 2018-01-31 | 2018-07-27 | 常州志得电子有限公司 | Cohoront machine control system |
| CN110600401A (en) * | 2019-08-26 | 2019-12-20 | 格力电器（合肥）有限公司 | Screening method for early failure of light-emitting diode |
| CN110596563A (en) * | 2019-09-20 | 2019-12-20 | 阳光电源股份有限公司 | Power conversion device and self-checking method for health state of power semiconductor device thereof |
| CN110596563B (en) * | 2019-09-20 | 2021-11-02 | 阳光电源股份有限公司 | Power conversion device and self-checking method for health state of power semiconductor device thereof |
| CN111474438A (en) * | 2020-05-11 | 2020-07-31 | 苏州信义大时代网络科技有限公司 | Reliability failure analysis and detection method for electronic product |
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