CN103776616A - LED performance test method - Google Patents
LED performance test method Download PDFInfo
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- CN103776616A CN103776616A CN201210399322.9A CN201210399322A CN103776616A CN 103776616 A CN103776616 A CN 103776616A CN 201210399322 A CN201210399322 A CN 201210399322A CN 103776616 A CN103776616 A CN 103776616A
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Abstract
The invention discloses an LED performance test method. The method comprises the following test steps: at first, an LED sample is installed on a heat dissipation plate, and the initial luminous flux value and the normal-temperature working junction temperature value of the LED sample are measured and calculated at the normal-temperature condition; then the LED sample is placed into a high-temperature cabinet to work, wherein the temperature of the high-temperature cabinet is set to be the difference between the maximum junction temperature value of the LED and the normal-temperature working junction temperature value; then the high-temperature working junction temperature value of the LED sample at this time is measured and calculated, if the high-temperature working junction temperature value is less than the maximum junction temperature value, then the temperature of the high-temperature cabinet needs to be increased, and if the high-temperature working junction temperature value is greater than the maximum junction temperature value, then the temperature of the high-temperature cabinet needs to be reduced; and finally, luminous flux values of the LED sample are measured at different time points separately, and the measured luminous flux values are combined with the initial luminous flux value to perform calculation so as to obtain the luminous decay degree values of the LED sample at different time points. According to the test method, the LED sample works in the maximum junction temperature state, and the luminous decay degree test is performed in the state, so the whole test process has the advantage of less time consumption, so that the test cost can be greatly reduced, and the market cycle of LED application products can be quickened.
Description
Technical field
The present invention relates to a kind of method of testing, relate in particular to a kind of LED performance test methods.
Background technology
LED is acknowledged as 21 century " green illumination ", has the features such as " high energy-conservation " " life-span is long " " changeable " " sharp environmental protection " " high-new point ", thereby becomes the industrial hot spot of tool market potential.But in the whole industrial chain of LED, due to technical difference, the LED quality that causes different manufacturers to be produced is uneven.A kind of great power LED particularly using in light fixture, because the environment that light fixture uses is more severe, add in addition the existence of heat dissipation problem, cause the problem in ubiquity light decay and life-span, therefore its light decay performance of LED sample test that need to select Duo Jia producer to provide at new product designs initial stage of development, finally contrasts the test result of the sample of each producer to judge the quality of product.Traditional method of testing is: in normal temperature environment, by LED sample continuous working under rated operational current of different manufacturers, point different time sections is carried out luminous flux measurement to it, calculates its light decay degree according to test data values, and then relatively draws the quality of the LED that different manufacturers produces again.But, above-mentionedly LED is carried out under rated operational current to work in normal temperature environment, the method for then testing, needs the light decay degree that just can measure for a long time LED to change, such mode consuming time long, experimentation cost is higher, has had a strong impact on the listing cycle of product simultaneously.
Summary of the invention
Fundamental purpose of the present invention is the light decay degree variation that the existing need of LED performance test methods in order to solve prior art just can be measured each light fixture for a long time, so consuming time long, experimentation cost is higher, has had a strong impact on the technical matters in the listing cycle of product simultaneously.
In order to solve the problems of the technologies described above, the invention provides a kind of LED performance test methods, comprise following testing procedure: step 1, the LED sample of known maximum junction temperature value, power, thermal resistance value and load current value is arranged on heat sink, at normal temperatures LED sample is passed into the electric current of size for load current value, then calculate initial luminous flux value and the normal temperature working junction temperature value of LED sample; Step 2, LED sample is put into high-temperature cabinet, the temperature setting of high-temperature cabinet is set to the maximum junction temperature value of LED and the difference of described normal temperature working junction temperature value, and LED sample is passed into the electric current that size is load current value; Step 3, after the LED sample energising work schedule time, calculate the now hot operation junction temperature value of LED sample, described hot operation junction temperature value and described maximum junction temperature value are compared, if described hot operation junction temperature value is less than described maximum junction temperature value, heighten the temperature of high-temperature cabinet, otherwise turn down the temperature of high-temperature cabinet, so adjust the temperature of high-temperature cabinet until measuring and calculating hot operation junction temperature value is out substantially equal to maximum junction temperature value in the error range allowing; Step 4, measure respectively the light flux values of described LED sample at each different time point, each light flux values of measuring is combined and calculated with initial luminous flux value, thereby obtain the light decay degree value of LED sample in each different time point.
Described LED performance test methods, wherein, in step 1, the normal temperature working junction temperature value of LED sample is to calculate out by following method: first the junction temperature value specified measurement point on the aluminium base of LED sample connects a thermopair, thereby directly measure the LED normal temperature aluminium base temperature value in when work, and then add the aluminium base temperature value of described LED normal temperature while working and can obtain the normal temperature working junction temperature value of LED sample with the multiply each other product that obtains of the power of LED and the thermal resistance value of LED.
Described LED performance test methods, wherein, while LED sample being put into high-temperature cabinet in step 2, the wire being connected after stretching out case, the areole of high-temperature cabinet need be connected with constant-current supply, so that described LED sample is passed into the electric current of size as load current value with described LED sample.
Described LED performance test methods, wherein, in step 3, the hot operation junction temperature value of LED sample is to calculate out by following method: first directly measure the aluminium base temperature value of the LED sample that is arranged in high-temperature cabinet, and then can obtain the hot operation junction temperature value of LED sample with multiply each other aluminium base temperature value that the product that obtains adds the LED sample in described high-temperature cabinet of the power of LED and the thermal resistance value of LED.
Described LED performance test methods, wherein, what test was used while being arranged in the aluminium base temperature value of LED sample of high-temperature cabinet is digital display thermometer.
Described LED performance test methods, wherein, the light flux values of measuring respectively described LED sample at each different time point in step 4 is carried out in the following way: in the time arriving the time point that need measure, described LED sample is quit work, and from high-temperature cabinet, take out LED sample and make it restore to normal temperature, in LED sample, pass into the electric current of size for load current value again, measure at normal temperatures the now light flux values of LED sample.
Described LED performance test methods, wherein, multiple LED samples of same model of selecting different manufacturers to produce when test are divided into and do not carry out on the same group the every test of step 1 to step 4, LED sample in every group is same manufacturer production, and each LED sample is together in series and is passed into electric current by heatproof wire.
Described LED performance test methods, wherein, the quantity of LED sample is 2 to 3 in every group.
Described LED performance test methods, wherein, after the work of completing steps four, compares the light decay degree value of each group of LED sample, and that group LED sample that same time point light decay degree value is less is more excellent product.
The present invention has following beneficial effect, LED performance test methods of the present invention carries out work by LED sample is placed in high-temperature cabinet, thereby make its approximate maximum junction temperature state that is operated in also carry out in this state the test of light decay degree, because the variation meeting that the LED sample light decay degree of hot operation within the identical time interval occurs is obviously more many than the LED sample of normal temperature work, so only need the shorter time can test out the light decay degree variation tendency of LED sample, whole test process is consuming time less, the listing cycle that greatly reduces experimentation cost and accelerated LED application product.
Embodiment
In order to further illustrate principle of the present invention and structure, below will be to a preferred embodiment of the present invention will be described in detail.
Before test, need to prepare some and test equipment used, specifically can comprise: high temperature resistant wire, constant-current supply, thermopair, digital display thermometer, heat sink, integrating sphere and high-temperature cabinet etc.
LED performance test methods of the present invention comprises following several steps.
Step 1, the LED sample of known maximum junction temperature value, power, thermal resistance value and load current value is arranged on heat sink, at normal temperatures LED sample is passed into the electric current of size for load current value, then calculate initial luminous flux value and the normal temperature working junction temperature value of LED sample.In the time measuring the normal temperature working junction temperature value of LED, first the junction temperature value specified measurement point on the aluminium base of LED sample connects a thermopair, the positive limit that this junction temperature value specified measurement point can be LED also can be other concrete measurement point of specifying, directly measure the LED normal temperature aluminium base temperature value in when work by this thermopair, and then add the aluminium base temperature value of described LED normal temperature while working and can obtain the normal temperature working junction temperature value of LED sample with the multiply each other product that obtains of the power of LED and the thermal resistance value of LED.
Step 2, LED sample is put into high-temperature cabinet, the wire being connected with described LED sample after stretching out case, the areole of high-temperature cabinet can be connected with constant-current supply, the temperature setting of high-temperature cabinet is set to the maximum junction temperature value of LED and the difference of described normal temperature working junction temperature value, and can passes into the electric current of size for load current value to LED sample by described constant-current supply.
Step 3, after LED sample energising work a period of time, calculate the now hot operation junction temperature value of LED sample, when measuring and calculating, can first directly measure the aluminium base temperature value of the LED sample that is arranged in high-temperature cabinet, measure when temperature and can use digital display thermometer, and then can obtain the hot operation junction temperature value of LED sample with multiply each other aluminium base temperature value that the product that obtains adds the LED sample in described high-temperature cabinet of the power of LED and the thermal resistance value of LED; Then described hot operation junction temperature value and described maximum junction temperature value are compared, if described hot operation junction temperature value is less than described maximum junction temperature value, need to heighten the temperature of high-temperature cabinet, otherwise need to turn down the temperature of high-temperature cabinet; So adjust the temperature of high-temperature cabinet until measuring and calculating hot operation junction temperature value is out substantially equal to maximum junction temperature value.
Step 4, measure respectively the light flux values of described LED sample at each different time point, when measurement due to normally used luminous flux measurement instrument non-refractory, so in the time arriving the time point that need measure, described LED sample need be quit work, and from high-temperature cabinet, take out LED sample and make it restore to normal temperature, in LED sample, pass into the electric current of size for load current value again, measure at normal temperatures the now light flux values of LED sample; Then each light flux values of measuring is combined and calculated with initial luminous flux value, thereby obtain the light decay degree value of LED sample in each different time point.
In addition, what also have supplementary notes is, the multiple LED samples of same model that can select different manufacturers to produce while carrying out above-mentioned test are divided into and do not carry out on the same group the every test of step 1 to step 4 simultaneously, LED sample in every group is same manufacturer production, quantity can be selected 2 to 3, and each LED sample is together in series and is passed into electric current by heatproof wire.After the test job of each group of LED sample completing steps four, the light decay degree value of the each group of LED sample calculating is compared, that group LED sample that same time point light decay degree value is less can be judged to be more excellent product.
LED performance test methods of the present invention, by first three step, LED sample is placed in high-temperature cabinet and is carried out work operation a period of time, its contingent performance change is solidified in sample interior, and then carry out the measurement of light decay degree, thereby make it can be similar in the LED characteristic of carrying out light decay degree when test the operation characteristic that is equivalent to LED sample and is operated in maximum junction temperature state, because the variation meeting that the LED sample light decay degree of hot operation within the identical time interval occurs is obviously more many than the LED sample of normal temperature work, so only need the shorter time can test out the light decay degree variation tendency of LED sample, whole test process is consuming time less, the listing cycle that greatly reduces experimentation cost and accelerated LED application product.
But, the foregoing is only better possible embodiments of the present invention, not limit the scope of the invention, therefore the equivalent structure that all utilizations instructions of the present invention and accompanying drawing content have been done changes, be all included in protection scope of the present invention.
Claims (9)
1. a LED performance test methods, it is characterized in that, comprise following testing procedure: step 1, the LED sample of known maximum junction temperature value, power, thermal resistance value and load current value is arranged on heat sink, at normal temperatures LED sample is passed into the electric current of size for load current value, then calculate initial luminous flux value and the normal temperature working junction temperature value of LED sample; Step 2, LED sample is put into high-temperature cabinet, the temperature setting of high-temperature cabinet is set to the maximum junction temperature value of LED and the difference of described normal temperature working junction temperature value, and LED sample is passed into the electric current that size is load current value; Step 3, after the LED sample energising work schedule time, calculate the now hot operation junction temperature value of LED sample, described hot operation junction temperature value and described maximum junction temperature value are compared, if described hot operation junction temperature value is less than described maximum junction temperature value, heighten the temperature of high-temperature cabinet, otherwise turn down the temperature of high-temperature cabinet, so adjust the temperature of high-temperature cabinet until measuring and calculating hot operation junction temperature value is out substantially equal to maximum junction temperature value in the error range allowing; Step 4, measure respectively the light flux values of described LED sample at each different time point, each light flux values of measuring is combined and calculated with initial luminous flux value, thereby obtain the light decay degree value of LED sample in each different time point.
2. LED performance test methods according to claim 1, it is characterized in that, in step 1, the normal temperature working junction temperature value of LED sample is to calculate out by following method: first the junction temperature value specified measurement point on the aluminium base of LED sample connects a thermopair, thereby directly measure the LED normal temperature aluminium base temperature value in when work, and then add the aluminium base temperature value of described LED normal temperature while working and can obtain the normal temperature working junction temperature value of LED sample with the multiply each other product that obtains of the power of LED and the thermal resistance value of LED.
3. LED performance test methods according to claim 1, it is characterized in that, while LED sample being put into high-temperature cabinet in step 2, the wire being connected with described LED sample after stretching out case, the areole of high-temperature cabinet need be connected with constant-current supply, so that described LED sample is passed into the electric current of size as load current value.
4. LED performance test methods according to claim 1, it is characterized in that, in step 3, the hot operation junction temperature value of LED sample is to calculate out by following method: first directly measure the aluminium base temperature value of the LED sample that is arranged in high-temperature cabinet, and then can obtain the hot operation junction temperature value of LED sample with multiply each other aluminium base temperature value that the product that obtains adds the LED sample in described high-temperature cabinet of the power of LED and the thermal resistance value of LED.
5. LED performance test methods according to claim 4, is characterized in that, what test was used while being arranged in the aluminium base temperature value of LED sample of high-temperature cabinet is digital display thermometer.
6. LED performance test methods according to claim 1, it is characterized in that, the light flux values of measuring respectively described LED sample at each different time point in step 4 is carried out in the following way: in the time arriving the time point that need measure, described LED sample is quit work, and from high-temperature cabinet, take out LED sample and make it restore to normal temperature, in LED sample, pass into the electric current of size for load current value again, measure at normal temperatures the now light flux values of LED sample.
7. LED performance test methods according to claim 1, it is characterized in that, multiple LED samples of same model of selecting different manufacturers to produce when test are divided into and do not carry out on the same group the every test of step 1 to step 4, LED sample in every group is same manufacturer production, and each LED sample is together in series and is passed into electric current by heatproof wire.
8. LED performance test methods according to claim 7, is characterized in that, the quantity of LED sample is 2 to 3 in every group.
9. LED performance test methods according to claim 7, is characterized in that, after the work of completing steps four, the light decay degree value of each group of LED sample is compared, and that group LED sample that same time point light decay degree value is less is more excellent product.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201210399322.9A CN103776616A (en) | 2012-10-19 | 2012-10-19 | LED performance test method |
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| CN201210399322.9A CN103776616A (en) | 2012-10-19 | 2012-10-19 | LED performance test method |
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104483613A (en) * | 2014-12-16 | 2015-04-01 | 常熟卓辉光电科技股份有限公司 | LED test method |
| CN106290137A (en) * | 2016-08-31 | 2017-01-04 | 安徽芯瑞达电子科技有限公司 | A kind of sulfuration test method for verifying the anti-sulfuration process of LED lamp bead |
| CN107271927A (en) * | 2017-05-18 | 2017-10-20 | 中国科学院长春光学精密机械与物理研究所 | On-line testing method in LED temperature accelerated ageing conditions |
| CN110146131A (en) * | 2019-06-12 | 2019-08-20 | 佛山市南海区联合广东新光源产业创新中心 | A kind of LED lamp product evaluation test method |
-
2012
- 2012-10-19 CN CN201210399322.9A patent/CN103776616A/en active Pending
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104483613A (en) * | 2014-12-16 | 2015-04-01 | 常熟卓辉光电科技股份有限公司 | LED test method |
| CN106290137A (en) * | 2016-08-31 | 2017-01-04 | 安徽芯瑞达电子科技有限公司 | A kind of sulfuration test method for verifying the anti-sulfuration process of LED lamp bead |
| CN106290137B (en) * | 2016-08-31 | 2019-01-04 | 安徽芯瑞达科技股份有限公司 | It is a kind of for verifying the vulcanization test method of the anti-sulfuration process of LED lamp bead |
| CN107271927A (en) * | 2017-05-18 | 2017-10-20 | 中国科学院长春光学精密机械与物理研究所 | On-line testing method in LED temperature accelerated ageing conditions |
| CN110146131A (en) * | 2019-06-12 | 2019-08-20 | 佛山市南海区联合广东新光源产业创新中心 | A kind of LED lamp product evaluation test method |
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Application publication date: 20140507 |