CN105607013A - Method for testing LED signal lamp - Google Patents

Method for testing LED signal lamp Download PDF

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Publication number
CN105607013A
CN105607013A CN201510969151.2A CN201510969151A CN105607013A CN 105607013 A CN105607013 A CN 105607013A CN 201510969151 A CN201510969151 A CN 201510969151A CN 105607013 A CN105607013 A CN 105607013A
Authority
CN
China
Prior art keywords
signal lamp
led signal
luminous plaque
target
qualified
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201510969151.2A
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Chinese (zh)
Inventor
汪立品
陆启蒙
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
HEFEI ESK OPTICAL-ELECTRICAL TECHNOLOGY Co Ltd
Original Assignee
HEFEI ESK OPTICAL-ELECTRICAL TECHNOLOGY Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by HEFEI ESK OPTICAL-ELECTRICAL TECHNOLOGY Co Ltd filed Critical HEFEI ESK OPTICAL-ELECTRICAL TECHNOLOGY Co Ltd
Priority to CN201510969151.2A priority Critical patent/CN105607013A/en
Publication of CN105607013A publication Critical patent/CN105607013A/en
Pending legal-status Critical Current

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/44Testing lamps

Abstract

The invention relates to a method for testing an LED signal lamp. The method comprises the steps: the electrical parameter of an LED light-emitting plate is tested through arranging a test target under a heat balance testing environment; the obtained electrical parameter of the target LED signal lamp light-emitting plate is compared with a corresponding preset qualified electrical parameter, if the parameters match, the next step of the test is performed, if the parameters do not match, the target LED signal lamp is unqualified; under a nominal voltage, the output end of the LED signal lamp light-emitting plate is shorted, the current value during the short circuit is tested, and if the target LED signal lamp light-emitting plate is abnormal is judged through the current value; the target LED signal lamp light-emitting plate is arranged in high temperature, low temperature and wet environment separately for 20 hours, and the electrical parameter of the light-emitting plate is tested to judge if the LED signal lamp is qualified. According to the invention, if the LED signal lamp is qualified is judged through the LED signal lamp light-emitting plate, and the reliability of the LED signal lamp is improved.

Description

A kind of method of testing of LED signal lamp
Technical field
The present invention relates to LED technical field, be specifically related to a kind of method of testing of LED signal lamp.
Background technology
Signal lamp transmits traffic directing tool as information, in industry, life, is widely used. LED signal lamp is to adopt the signal lamp made as light source of LED, have low in energy consumption, the advantage of saving the energy, LED signal lamp, is exactly the signal lamp of making of the LED of different colours; Mainly contain the different colours such as red, yellow, blue, green, different color transfers different information. The core of LED signal lamp is the LED signal lamp luminous plaque in lamp, LED signal lamp luminous plaque is a kind of Small Scale Integration plate that integrates control and light source, its light source can be made up of the LED of identical or different glow colors, integrated IC controls, control signal lamp is exported permanent light or flash state, pass out visual information accurately, make observer very clear, carry out relevant action or action. Also can be used as a kind of instruction, allow the observer can be high-visible, luminous plaque be as the important component part of LED signal lamp, and its quality has determined the quality of a signal lamp to a great extent.
At present, after LED signal lamp luminous plaque supplied materials, be conventionally directly assembled into LED signal lamp, in advance LED signal lamp luminous plaque is not tested, cause because the latent defect that design or the manufacturing process of LED signal lamp luminous plaque are brought is not found in time, underproof LED signal lamp can badly influence the use of signal lamp, has reduced the signal lamp life-span.
Summary of the invention
The object of the present invention is to provide a kind of method of testing of LED signal lamp, by the test of LED signal lamp luminous plaque so that the quality of LED signal lamp is screened.
For achieving the above object, the present invention has adopted following technical scheme:
A method of testing for LED signal lamp, is characterized in that, comprises the following steps:
(1) test target is placed in to the electrical quantity of testing LED luminous plaque under thermal balance test environment;
(2) electrical quantity of target LED signal lamp luminous plaque test being obtained compares with corresponding preset qualified electrical quantity, if coupling is carried out lower pacing examination, if do not mate, target LED signal lamp is defective;
(3) under rated voltage, by the output short circuit of target LED signal lamp luminous plaque, current value while measuring short circuit, if current value when short circuit is less than or equal to running current, do not carry out long-term short circuit, if electric current when short circuit is greater than running current, within the default time, target LED signal lamp luminous plaque is carried out to short circuit processing, while detecting short circuit, test target LED signal lamp luminous plaque has or not extremely;
(4) target LED signal luminous plaque is placed in 20 hours under the environment as for high temperature, low temperature and humidity respectively, then measure the electrical quantity of luminous plaque, and this electrical quantity is compared with corresponding preset qualified electrical quantity, if coupling, LED signal lamp is qualified, if do not mate, target LED signal lamp is defective;
Step (1) is further comprising the steps of before: LED signal lamp luminous plaque to be measured is carried out to preliminary survey, LED signal lamp luminous plaque qualified preliminary survey is labeled as to target LED signal lamp luminous plaque; Described preliminary survey comprises: whether the size that checks LED signal lamp luminous plaque to be measured qualified, check that whether the mark of components and parts title and polarity is qualified, whether the welding that checks components and parts is qualified, and the LED signal lamp luminous plaque that preliminary survey is passed through is target LED signal lamp luminous plaque.
As shown from the above technical solution, the present invention can test LED signal lamp luminous plaque in advance, underproof LED signal lamp luminous plaque can be found in time, filter out in advance defective products, can improve LED signal lamp luminous plaque and be assembled into the reliability of product after LED signal lamp.
Detailed description of the invention
The method of testing of the LED signal lamp of the present embodiment, comprises the following steps:
S1: LED signal lamp luminous plaque to be measured is carried out to preliminary survey, LED signal lamp luminous plaque qualified preliminary survey is labeled as to target LED signal lamp luminous plaque; Described preliminary survey comprises: whether the size that checks LED signal lamp luminous plaque to be measured qualified, check that whether the mark of components and parts title and polarity is qualified, whether the welding that checks components and parts is qualified, and the LED signal lamp luminous plaque that preliminary survey is passed through is target LED signal lamp luminous plaque;
S2: test target is placed in to the electrical quantity of testing LED luminous plaque under thermal balance test environment;
S3: the electrical quantity of the target LED signal lamp luminous plaque that test is obtained compares with corresponding preset qualified electrical quantity, if coupling is carried out lower pacing examination, if do not mate, target LED signal lamp is defective;
S4: under rated voltage, by the output short circuit of target LED signal lamp luminous plaque, current value while measuring short circuit, if current value when short circuit is less than or equal to running current, do not carry out long-term short circuit, if electric current when short circuit is greater than running current, within the default time, target LED signal lamp luminous plaque is carried out to short circuit processing, while detecting short circuit, test target LED signal lamp luminous plaque has or not extremely;
S5: target LED signal luminous plaque is placed in 20 hours under the environment as for high temperature, low temperature and humidity respectively, then measure the electrical quantity of luminous plaque, and this electrical quantity is compared with corresponding preset qualified electrical quantity, if coupling, LED signal lamp is qualified, if do not mate, target LED signal lamp is defective.
Above-described embodiment is described the preferred embodiment of the present invention; not scope of the present invention is limited; design under the prerequisite of spirit not departing from the present invention; various distortion and improvement that those of ordinary skill in the art make technical scheme of the present invention, all should fall in the definite protection domain of the claims in the present invention book.

Claims (2)

1. a method of testing for LED signal lamp, is characterized in that, comprises the following steps:
(1) test target is placed in to the electrical quantity of testing LED luminous plaque under thermal balance test environment;
(2) electrical quantity of target LED signal lamp luminous plaque test being obtained compares with corresponding preset qualified electrical quantity, if coupling is carried out lower pacing examination, if do not mate, target LED signal lamp is defective;
(3) under rated voltage, by the output short circuit of target LED signal lamp luminous plaque, current value while measuring short circuit, if current value when short circuit is less than or equal to running current, do not carry out long-term short circuit, if electric current when short circuit is greater than running current, within the default time, target LED signal lamp luminous plaque is carried out to short circuit processing, while detecting short circuit, test target LED signal lamp luminous plaque has or not extremely;
(4) target LED signal luminous plaque is placed in 20 hours under the environment as for high temperature, low temperature and humidity respectively, then measure the electrical quantity of luminous plaque, and this electrical quantity is compared with corresponding preset qualified electrical quantity, if coupling, LED signal lamp is qualified, if do not mate, target LED signal lamp is defective.
2. the method for testing of LED signal lamp according to claim 1, it is characterized in that: step (1) is further comprising the steps of before: LED signal lamp luminous plaque to be measured is carried out to preliminary survey, LED signal lamp luminous plaque qualified preliminary survey is labeled as to target LED signal lamp luminous plaque; Described preliminary survey comprises: whether the size that checks LED signal lamp luminous plaque to be measured qualified, check that whether the mark of components and parts title and polarity is qualified, whether the welding that checks components and parts is qualified, and the LED signal lamp luminous plaque that preliminary survey is passed through is target LED signal lamp luminous plaque.
CN201510969151.2A 2015-12-20 2015-12-20 Method for testing LED signal lamp Pending CN105607013A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201510969151.2A CN105607013A (en) 2015-12-20 2015-12-20 Method for testing LED signal lamp

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201510969151.2A CN105607013A (en) 2015-12-20 2015-12-20 Method for testing LED signal lamp

Publications (1)

Publication Number Publication Date
CN105607013A true CN105607013A (en) 2016-05-25

Family

ID=55987095

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201510969151.2A Pending CN105607013A (en) 2015-12-20 2015-12-20 Method for testing LED signal lamp

Country Status (1)

Country Link
CN (1) CN105607013A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107671015A (en) * 2017-08-26 2018-02-09 江苏爱可信电气有限公司 The method of work of the semi-automatic detecting tool of signal lamp

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104076296A (en) * 2013-03-29 2014-10-01 深圳市海洋王照明工程有限公司 Testing method and device for LED signal lamp light-emitting board
US8901936B2 (en) * 2012-03-14 2014-12-02 Samsung Display Co., Ltd. Array test device, method for testing an organic light emitting display device, and method for manufacturing the organic light emitting display device
CN104330750A (en) * 2014-11-20 2015-02-04 肖旭华 Method and system for testing twinkling characteristics of LED (light emitting diode) light source and drive power source thereof
CN104698400A (en) * 2015-03-16 2015-06-10 厦门先机光电设备有限公司 Testing equipment for performance parameters of LED lamp

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8901936B2 (en) * 2012-03-14 2014-12-02 Samsung Display Co., Ltd. Array test device, method for testing an organic light emitting display device, and method for manufacturing the organic light emitting display device
CN104076296A (en) * 2013-03-29 2014-10-01 深圳市海洋王照明工程有限公司 Testing method and device for LED signal lamp light-emitting board
CN104330750A (en) * 2014-11-20 2015-02-04 肖旭华 Method and system for testing twinkling characteristics of LED (light emitting diode) light source and drive power source thereof
CN104698400A (en) * 2015-03-16 2015-06-10 厦门先机光电设备有限公司 Testing equipment for performance parameters of LED lamp

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107671015A (en) * 2017-08-26 2018-02-09 江苏爱可信电气有限公司 The method of work of the semi-automatic detecting tool of signal lamp

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Application publication date: 20160525

RJ01 Rejection of invention patent application after publication