CN105607013A - Method for testing LED signal lamp - Google Patents
Method for testing LED signal lamp Download PDFInfo
- Publication number
- CN105607013A CN105607013A CN201510969151.2A CN201510969151A CN105607013A CN 105607013 A CN105607013 A CN 105607013A CN 201510969151 A CN201510969151 A CN 201510969151A CN 105607013 A CN105607013 A CN 105607013A
- Authority
- CN
- China
- Prior art keywords
- signal lamp
- led signal
- luminous plaque
- target
- qualified
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/44—Testing lamps
Abstract
The invention relates to a method for testing an LED signal lamp. The method comprises the steps: the electrical parameter of an LED light-emitting plate is tested through arranging a test target under a heat balance testing environment; the obtained electrical parameter of the target LED signal lamp light-emitting plate is compared with a corresponding preset qualified electrical parameter, if the parameters match, the next step of the test is performed, if the parameters do not match, the target LED signal lamp is unqualified; under a nominal voltage, the output end of the LED signal lamp light-emitting plate is shorted, the current value during the short circuit is tested, and if the target LED signal lamp light-emitting plate is abnormal is judged through the current value; the target LED signal lamp light-emitting plate is arranged in high temperature, low temperature and wet environment separately for 20 hours, and the electrical parameter of the light-emitting plate is tested to judge if the LED signal lamp is qualified. According to the invention, if the LED signal lamp is qualified is judged through the LED signal lamp light-emitting plate, and the reliability of the LED signal lamp is improved.
Description
Technical field
The present invention relates to LED technical field, be specifically related to a kind of method of testing of LED signal lamp.
Background technology
Signal lamp transmits traffic directing tool as information, in industry, life, is widely used. LED signal lamp is to adopt the signal lamp made as light source of LED, have low in energy consumption, the advantage of saving the energy, LED signal lamp, is exactly the signal lamp of making of the LED of different colours; Mainly contain the different colours such as red, yellow, blue, green, different color transfers different information. The core of LED signal lamp is the LED signal lamp luminous plaque in lamp, LED signal lamp luminous plaque is a kind of Small Scale Integration plate that integrates control and light source, its light source can be made up of the LED of identical or different glow colors, integrated IC controls, control signal lamp is exported permanent light or flash state, pass out visual information accurately, make observer very clear, carry out relevant action or action. Also can be used as a kind of instruction, allow the observer can be high-visible, luminous plaque be as the important component part of LED signal lamp, and its quality has determined the quality of a signal lamp to a great extent.
At present, after LED signal lamp luminous plaque supplied materials, be conventionally directly assembled into LED signal lamp, in advance LED signal lamp luminous plaque is not tested, cause because the latent defect that design or the manufacturing process of LED signal lamp luminous plaque are brought is not found in time, underproof LED signal lamp can badly influence the use of signal lamp, has reduced the signal lamp life-span.
Summary of the invention
The object of the present invention is to provide a kind of method of testing of LED signal lamp, by the test of LED signal lamp luminous plaque so that the quality of LED signal lamp is screened.
For achieving the above object, the present invention has adopted following technical scheme:
A method of testing for LED signal lamp, is characterized in that, comprises the following steps:
(1) test target is placed in to the electrical quantity of testing LED luminous plaque under thermal balance test environment;
(2) electrical quantity of target LED signal lamp luminous plaque test being obtained compares with corresponding preset qualified electrical quantity, if coupling is carried out lower pacing examination, if do not mate, target LED signal lamp is defective;
(3) under rated voltage, by the output short circuit of target LED signal lamp luminous plaque, current value while measuring short circuit, if current value when short circuit is less than or equal to running current, do not carry out long-term short circuit, if electric current when short circuit is greater than running current, within the default time, target LED signal lamp luminous plaque is carried out to short circuit processing, while detecting short circuit, test target LED signal lamp luminous plaque has or not extremely;
(4) target LED signal luminous plaque is placed in 20 hours under the environment as for high temperature, low temperature and humidity respectively, then measure the electrical quantity of luminous plaque, and this electrical quantity is compared with corresponding preset qualified electrical quantity, if coupling, LED signal lamp is qualified, if do not mate, target LED signal lamp is defective;
Step (1) is further comprising the steps of before: LED signal lamp luminous plaque to be measured is carried out to preliminary survey, LED signal lamp luminous plaque qualified preliminary survey is labeled as to target LED signal lamp luminous plaque; Described preliminary survey comprises: whether the size that checks LED signal lamp luminous plaque to be measured qualified, check that whether the mark of components and parts title and polarity is qualified, whether the welding that checks components and parts is qualified, and the LED signal lamp luminous plaque that preliminary survey is passed through is target LED signal lamp luminous plaque.
As shown from the above technical solution, the present invention can test LED signal lamp luminous plaque in advance, underproof LED signal lamp luminous plaque can be found in time, filter out in advance defective products, can improve LED signal lamp luminous plaque and be assembled into the reliability of product after LED signal lamp.
Detailed description of the invention
The method of testing of the LED signal lamp of the present embodiment, comprises the following steps:
S1: LED signal lamp luminous plaque to be measured is carried out to preliminary survey, LED signal lamp luminous plaque qualified preliminary survey is labeled as to target LED signal lamp luminous plaque; Described preliminary survey comprises: whether the size that checks LED signal lamp luminous plaque to be measured qualified, check that whether the mark of components and parts title and polarity is qualified, whether the welding that checks components and parts is qualified, and the LED signal lamp luminous plaque that preliminary survey is passed through is target LED signal lamp luminous plaque;
S2: test target is placed in to the electrical quantity of testing LED luminous plaque under thermal balance test environment;
S3: the electrical quantity of the target LED signal lamp luminous plaque that test is obtained compares with corresponding preset qualified electrical quantity, if coupling is carried out lower pacing examination, if do not mate, target LED signal lamp is defective;
S4: under rated voltage, by the output short circuit of target LED signal lamp luminous plaque, current value while measuring short circuit, if current value when short circuit is less than or equal to running current, do not carry out long-term short circuit, if electric current when short circuit is greater than running current, within the default time, target LED signal lamp luminous plaque is carried out to short circuit processing, while detecting short circuit, test target LED signal lamp luminous plaque has or not extremely;
S5: target LED signal luminous plaque is placed in 20 hours under the environment as for high temperature, low temperature and humidity respectively, then measure the electrical quantity of luminous plaque, and this electrical quantity is compared with corresponding preset qualified electrical quantity, if coupling, LED signal lamp is qualified, if do not mate, target LED signal lamp is defective.
Above-described embodiment is described the preferred embodiment of the present invention; not scope of the present invention is limited; design under the prerequisite of spirit not departing from the present invention; various distortion and improvement that those of ordinary skill in the art make technical scheme of the present invention, all should fall in the definite protection domain of the claims in the present invention book.
Claims (2)
1. a method of testing for LED signal lamp, is characterized in that, comprises the following steps:
(1) test target is placed in to the electrical quantity of testing LED luminous plaque under thermal balance test environment;
(2) electrical quantity of target LED signal lamp luminous plaque test being obtained compares with corresponding preset qualified electrical quantity, if coupling is carried out lower pacing examination, if do not mate, target LED signal lamp is defective;
(3) under rated voltage, by the output short circuit of target LED signal lamp luminous plaque, current value while measuring short circuit, if current value when short circuit is less than or equal to running current, do not carry out long-term short circuit, if electric current when short circuit is greater than running current, within the default time, target LED signal lamp luminous plaque is carried out to short circuit processing, while detecting short circuit, test target LED signal lamp luminous plaque has or not extremely;
(4) target LED signal luminous plaque is placed in 20 hours under the environment as for high temperature, low temperature and humidity respectively, then measure the electrical quantity of luminous plaque, and this electrical quantity is compared with corresponding preset qualified electrical quantity, if coupling, LED signal lamp is qualified, if do not mate, target LED signal lamp is defective.
2. the method for testing of LED signal lamp according to claim 1, it is characterized in that: step (1) is further comprising the steps of before: LED signal lamp luminous plaque to be measured is carried out to preliminary survey, LED signal lamp luminous plaque qualified preliminary survey is labeled as to target LED signal lamp luminous plaque; Described preliminary survey comprises: whether the size that checks LED signal lamp luminous plaque to be measured qualified, check that whether the mark of components and parts title and polarity is qualified, whether the welding that checks components and parts is qualified, and the LED signal lamp luminous plaque that preliminary survey is passed through is target LED signal lamp luminous plaque.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201510969151.2A CN105607013A (en) | 2015-12-20 | 2015-12-20 | Method for testing LED signal lamp |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201510969151.2A CN105607013A (en) | 2015-12-20 | 2015-12-20 | Method for testing LED signal lamp |
Publications (1)
Publication Number | Publication Date |
---|---|
CN105607013A true CN105607013A (en) | 2016-05-25 |
Family
ID=55987095
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201510969151.2A Pending CN105607013A (en) | 2015-12-20 | 2015-12-20 | Method for testing LED signal lamp |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN105607013A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107671015A (en) * | 2017-08-26 | 2018-02-09 | 江苏爱可信电气有限公司 | The method of work of the semi-automatic detecting tool of signal lamp |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104076296A (en) * | 2013-03-29 | 2014-10-01 | 深圳市海洋王照明工程有限公司 | Testing method and device for LED signal lamp light-emitting board |
US8901936B2 (en) * | 2012-03-14 | 2014-12-02 | Samsung Display Co., Ltd. | Array test device, method for testing an organic light emitting display device, and method for manufacturing the organic light emitting display device |
CN104330750A (en) * | 2014-11-20 | 2015-02-04 | 肖旭华 | Method and system for testing twinkling characteristics of LED (light emitting diode) light source and drive power source thereof |
CN104698400A (en) * | 2015-03-16 | 2015-06-10 | 厦门先机光电设备有限公司 | Testing equipment for performance parameters of LED lamp |
-
2015
- 2015-12-20 CN CN201510969151.2A patent/CN105607013A/en active Pending
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8901936B2 (en) * | 2012-03-14 | 2014-12-02 | Samsung Display Co., Ltd. | Array test device, method for testing an organic light emitting display device, and method for manufacturing the organic light emitting display device |
CN104076296A (en) * | 2013-03-29 | 2014-10-01 | 深圳市海洋王照明工程有限公司 | Testing method and device for LED signal lamp light-emitting board |
CN104330750A (en) * | 2014-11-20 | 2015-02-04 | 肖旭华 | Method and system for testing twinkling characteristics of LED (light emitting diode) light source and drive power source thereof |
CN104698400A (en) * | 2015-03-16 | 2015-06-10 | 厦门先机光电设备有限公司 | Testing equipment for performance parameters of LED lamp |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107671015A (en) * | 2017-08-26 | 2018-02-09 | 江苏爱可信电气有限公司 | The method of work of the semi-automatic detecting tool of signal lamp |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN104076296B (en) | A kind of method of testing and test device of LED signal lamp luminescent screen | |
CN103398738B (en) | Electric light source accelerated deterioration real-time monitoring system and method | |
CN203414106U (en) | Electric light source accelerated aging real-time monitoring system | |
CN103713253A (en) | System and method for online detection of illumination, chrominance and junction temperature decay characteristics of LED | |
CN104459507A (en) | Multi-channel detecting system for detecting optical performance of LED chip | |
CN104280693A (en) | Life curve testing device for LED lamp and testing method thereof | |
CN101153888B (en) | Testing method for luminous parallel path of flexible printing circuit board | |
CN105607013A (en) | Method for testing LED signal lamp | |
WO2012171531A1 (en) | Led fault diagnostic method and system | |
CN204535961U (en) | A kind of deep ultraviolet LED component light-dividing device | |
CN204649942U (en) | A kind of LED lamp proving installation | |
CN202951639U (en) | Automatic chip on board (COB)-light emitting diode (LED) light-separating and color-separating detection separation system | |
CN104459568A (en) | LED chip detection and analysis system | |
CN204228906U (en) | A kind of Multi-path detecting system detecting LED chip optical property | |
CN206609956U (en) | A kind of LED lamp aging equipment | |
CN103698717B (en) | Aging testing device for detecting driving performance stability of LED (light-emitting diode) power supply | |
CN205620437U (en) | Experimental universal fixturing of laoization of diode power, reverse biased | |
CN204228934U (en) | A kind of LED chip testing and analysis system | |
WO2022222833A1 (en) | Circuit component recognition method | |
CN204228907U (en) | A kind of Multi-path detecting system of LED chip | |
CN102854435A (en) | High-temperature electric leakage testing system for diodes | |
CN105258924A (en) | Comprehensive tester for LED light | |
CN105842578A (en) | Indicator capable of rapidly determining coaxial cable BNC radio frequency head fault types | |
CN113075525B (en) | Voltage correction method for LED light splitting station | |
CN204168240U (en) | Hi-pot Tester spot check fixture |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
RJ01 | Rejection of invention patent application after publication |
Application publication date: 20160525 |
|
RJ01 | Rejection of invention patent application after publication |